CN107922708A - Resin combination, photosensitive polymer combination, resin film and electronic device - Google Patents
Resin combination, photosensitive polymer combination, resin film and electronic device Download PDFInfo
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- CN107922708A CN107922708A CN201680048062.7A CN201680048062A CN107922708A CN 107922708 A CN107922708 A CN 107922708A CN 201680048062 A CN201680048062 A CN 201680048062A CN 107922708 A CN107922708 A CN 107922708A
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- resin
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- 229920000642 polymer Polymers 0.000 title claims abstract description 118
- 229920005989 resin Polymers 0.000 title claims abstract description 103
- 239000011347 resin Substances 0.000 title claims abstract description 103
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 claims abstract description 42
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 42
- 239000001257 hydrogen Substances 0.000 claims abstract description 42
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 42
- 239000005011 phenolic resin Substances 0.000 claims abstract description 42
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 41
- 229920001568 phenolic resin Polymers 0.000 claims abstract description 41
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 40
- 125000000962 organic group Chemical group 0.000 claims abstract description 40
- 230000003252 repetitive effect Effects 0.000 claims abstract description 30
- 239000000178 monomer Substances 0.000 claims description 51
- -1 ester compounds Chemical class 0.000 claims description 42
- 150000001875 compounds Chemical class 0.000 claims description 24
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 19
- 239000000839 emulsion Substances 0.000 claims description 16
- 150000008065 acid anhydrides Chemical group 0.000 claims description 13
- PEEHTFAAVSWFBL-UHFFFAOYSA-N Maleimide Chemical compound O=C1NC(=O)C=C1 PEEHTFAAVSWFBL-UHFFFAOYSA-N 0.000 claims description 12
- YBYIRNPNPLQARY-UHFFFAOYSA-N 1H-indene Chemical compound C1=CC=C2CC=CC2=C1 YBYIRNPNPLQARY-UHFFFAOYSA-N 0.000 claims description 9
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 9
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical group C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims description 7
- 239000012954 diazonium Substances 0.000 claims description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-O diazynium Chemical compound [NH+]#N IJGRMHOSHXDMSA-UHFFFAOYSA-O 0.000 claims description 7
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 48
- 235000013824 polyphenols Nutrition 0.000 description 34
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 25
- 239000000203 mixture Substances 0.000 description 25
- 229920003986 novolac Polymers 0.000 description 23
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 18
- 239000010410 layer Substances 0.000 description 18
- 238000009826 distribution Methods 0.000 description 17
- 239000000243 solution Substances 0.000 description 17
- 229920001577 copolymer Polymers 0.000 description 16
- 239000002904 solvent Substances 0.000 description 16
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 14
- 150000001244 carboxylic acid anhydrides Chemical class 0.000 description 12
- 150000002989 phenols Chemical class 0.000 description 12
- 239000002585 base Substances 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 11
- 125000004122 cyclic group Chemical group 0.000 description 11
- KQNPFQTWMSNSAP-UHFFFAOYSA-N isobutyric acid Chemical class CC(C)C(O)=O KQNPFQTWMSNSAP-UHFFFAOYSA-N 0.000 description 11
- JFNLZVQOOSMTJK-KNVOCYPGSA-N norbornene Chemical compound C1[C@@H]2CC[C@H]1C=C2 JFNLZVQOOSMTJK-KNVOCYPGSA-N 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- 125000000217 alkyl group Chemical group 0.000 description 10
- 150000002469 indenes Chemical class 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 10
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 9
- 239000002253 acid Substances 0.000 description 9
- 150000002148 esters Chemical class 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 9
- 230000035945 sensitivity Effects 0.000 description 9
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 8
- 125000003342 alkenyl group Chemical group 0.000 description 8
- 125000000304 alkynyl group Chemical group 0.000 description 8
- 239000003795 chemical substances by application Substances 0.000 description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 8
- 229910052760 oxygen Inorganic materials 0.000 description 8
- 238000010276 construction Methods 0.000 description 7
- 125000000753 cycloalkyl group Chemical group 0.000 description 7
- 238000006116 polymerization reaction Methods 0.000 description 7
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 7
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 6
- 239000006166 lysate Substances 0.000 description 6
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 6
- 150000001299 aldehydes Chemical class 0.000 description 5
- 125000001118 alkylidene group Chemical group 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 230000005587 bubbling Effects 0.000 description 5
- 239000003054 catalyst Substances 0.000 description 5
- 238000001816 cooling Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 5
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229960003742 phenol Drugs 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000003756 stirring Methods 0.000 description 5
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 5
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 4
- AYKYXWQEBUNJCN-UHFFFAOYSA-N 3-methylfuran-2,5-dione Chemical compound CC1=CC(=O)OC1=O AYKYXWQEBUNJCN-UHFFFAOYSA-N 0.000 description 4
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 4
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 4
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 4
- 125000003710 aryl alkyl group Chemical group 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 4
- WNAHIZMDSQCWRP-UHFFFAOYSA-N dodecane-1-thiol Chemical compound CCCCCCCCCCCCS WNAHIZMDSQCWRP-UHFFFAOYSA-N 0.000 description 4
- 229910052731 fluorine Inorganic materials 0.000 description 4
- 239000011737 fluorine Substances 0.000 description 4
- 125000005843 halogen group Chemical group 0.000 description 4
- 239000011229 interlayer Substances 0.000 description 4
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 4
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 4
- 239000011976 maleic acid Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 4
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 4
- 229920002554 vinyl polymer Polymers 0.000 description 4
- DKIDEFUBRARXTE-UHFFFAOYSA-N 3-mercaptopropanoic acid Chemical compound OC(=O)CCS DKIDEFUBRARXTE-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 3
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- TZRXHJWUDPFEEY-UHFFFAOYSA-N Pentaerythritol Tetranitrate Chemical compound [O-][N+](=O)OCC(CO[N+]([O-])=O)(CO[N+]([O-])=O)CO[N+]([O-])=O TZRXHJWUDPFEEY-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 3
- 150000001336 alkenes Chemical class 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 125000003118 aryl group Chemical group 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 125000003700 epoxy group Chemical group 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 3
- 150000003949 imides Chemical class 0.000 description 3
- 229940100630 metacresol Drugs 0.000 description 3
- 125000001434 methanylylidene group Chemical group [H]C#[*] 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 3
- AZQWKYJCGOJGHM-UHFFFAOYSA-N para-benzoquinone Natural products O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 3
- 229910052698 phosphorus Inorganic materials 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 239000003505 polymerization initiator Substances 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- 239000007870 radical polymerization initiator Substances 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 239000004094 surface-active agent Substances 0.000 description 3
- 239000002966 varnish Substances 0.000 description 3
- PUPZLCDOIYMWBV-UHFFFAOYSA-N (+/-)-1,3-Butanediol Chemical compound CC(O)CCO PUPZLCDOIYMWBV-UHFFFAOYSA-N 0.000 description 2
- 150000000181 1,2-naphthoquinones Chemical class 0.000 description 2
- PMBXCGGQNSVESQ-UHFFFAOYSA-N 1-Hexanethiol Chemical compound CCCCCCS PMBXCGGQNSVESQ-UHFFFAOYSA-N 0.000 description 2
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 2
- 125000006055 1-methyl-4-pentenyl group Chemical group 0.000 description 2
- WFUGQJXVXHBTEM-UHFFFAOYSA-N 2-hydroperoxy-2-(2-hydroperoxybutan-2-ylperoxy)butane Chemical compound CCC(C)(OO)OOC(C)(CC)OO WFUGQJXVXHBTEM-UHFFFAOYSA-N 0.000 description 2
- WVCHIGAIXREVNS-UHFFFAOYSA-N 2-hydroxy-1,4-naphthoquinone Chemical compound C1=CC=C2C(O)=CC(=O)C(=O)C2=C1 WVCHIGAIXREVNS-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- UDOJACSDSIHAAT-UHFFFAOYSA-N 5-benzylbicyclo[2.2.1]hept-2-ene Chemical compound C1C(C=C2)CC2C1CC1=CC=CC=C1 UDOJACSDSIHAAT-UHFFFAOYSA-N 0.000 description 2
- YSWATWCBYRBYBO-UHFFFAOYSA-N 5-butylbicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(CCCC)CC1C=C2 YSWATWCBYRBYBO-UHFFFAOYSA-N 0.000 description 2
- VTWPBVSOSWNXAX-UHFFFAOYSA-N 5-decylbicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(CCCCCCCCCC)CC1C=C2 VTWPBVSOSWNXAX-UHFFFAOYSA-N 0.000 description 2
- PCBPVYHMZBWMAZ-UHFFFAOYSA-N 5-methylbicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(C)CC1C=C2 PCBPVYHMZBWMAZ-UHFFFAOYSA-N 0.000 description 2
- XVMSFILGAMDHEY-UHFFFAOYSA-N 6-(4-aminophenyl)sulfonylpyridin-3-amine Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=N1 XVMSFILGAMDHEY-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 239000004342 Benzoyl peroxide Substances 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- 208000005156 Dehydration Diseases 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 238000001157 Fourier transform infrared spectrum Methods 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- MOYAFQVGZZPNRA-UHFFFAOYSA-N Terpinolene Chemical compound CC(C)=C1CCC(C)=CC1 MOYAFQVGZZPNRA-UHFFFAOYSA-N 0.000 description 2
- TUVYSBJZBYRDHP-UHFFFAOYSA-N acetic acid;methoxymethane Chemical compound COC.CC(O)=O TUVYSBJZBYRDHP-UHFFFAOYSA-N 0.000 description 2
- 239000003377 acid catalyst Substances 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 238000012644 addition polymerization Methods 0.000 description 2
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- 230000000996 additive effect Effects 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- 150000001335 aliphatic alkanes Chemical group 0.000 description 2
- XXROGKLTLUQVRX-UHFFFAOYSA-N allyl alcohol Chemical compound OCC=C XXROGKLTLUQVRX-UHFFFAOYSA-N 0.000 description 2
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- 239000007864 aqueous solution Substances 0.000 description 2
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 2
- 235000019400 benzoyl peroxide Nutrition 0.000 description 2
- 238000011088 calibration curve Methods 0.000 description 2
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- 238000007334 copolymerization reaction Methods 0.000 description 2
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 2
- FUGIIBWTNARRSF-UHFFFAOYSA-N decane-5,6-diol Chemical compound CCCCC(O)C(O)CCCC FUGIIBWTNARRSF-UHFFFAOYSA-N 0.000 description 2
- 230000006837 decompression Effects 0.000 description 2
- 230000018044 dehydration Effects 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- LSXWFXONGKSEMY-UHFFFAOYSA-N di-tert-butyl peroxide Chemical compound CC(C)(C)OOC(C)(C)C LSXWFXONGKSEMY-UHFFFAOYSA-N 0.000 description 2
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 2
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 2
- WQOXQRCZOLPYPM-UHFFFAOYSA-N dimethyl disulfide Chemical compound CSSC WQOXQRCZOLPYPM-UHFFFAOYSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 125000001188 haloalkyl group Chemical group 0.000 description 2
- CSFWPUWCSPOLJW-UHFFFAOYSA-N hydroxynaphthoquinone Natural products C1=CC=C2C(=O)C(O)=CC(=O)C2=C1 CSFWPUWCSPOLJW-UHFFFAOYSA-N 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 2
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- IWDCLRJOBJJRNH-UHFFFAOYSA-N p-cresol Chemical compound CC1=CC=C(O)C=C1 IWDCLRJOBJJRNH-UHFFFAOYSA-N 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 238000001556 precipitation Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- ULWHHBHJGPPBCO-UHFFFAOYSA-N propane-1,1-diol Chemical class CCC(O)O ULWHHBHJGPPBCO-UHFFFAOYSA-N 0.000 description 2
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- 150000000191 1,4-naphthoquinones Chemical class 0.000 description 1
- SXTILEHINBCKSS-UHFFFAOYSA-N 1-chloro-3-phenylpyrrole-2,5-dione Chemical class O=C1N(Cl)C(=O)C=C1C1=CC=CC=C1 SXTILEHINBCKSS-UHFFFAOYSA-N 0.000 description 1
- YEAIIFHWFHOYMQ-UHFFFAOYSA-N 1-cyclopentylpyrrole-2,5-dione Chemical class O=C1C=CC(=O)N1C1CCCC1 YEAIIFHWFHOYMQ-UHFFFAOYSA-N 0.000 description 1
- HHVCCCZZVQMAMT-UHFFFAOYSA-N 1-hydroxy-3-phenylpyrrole-2,5-dione Chemical class O=C1N(O)C(=O)C=C1C1=CC=CC=C1 HHVCCCZZVQMAMT-UHFFFAOYSA-N 0.000 description 1
- BUXKULRFRATXSI-UHFFFAOYSA-N 1-hydroxypyrrole-2,5-dione Chemical class ON1C(=O)C=CC1=O BUXKULRFRATXSI-UHFFFAOYSA-N 0.000 description 1
- QCOLXFOZKYRROA-UHFFFAOYSA-N 1-methoxy-3-phenylpyrrole-2,5-dione Chemical class O=C1N(OC)C(=O)C=C1C1=CC=CC=C1 QCOLXFOZKYRROA-UHFFFAOYSA-N 0.000 description 1
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 1
- HIDBROSJWZYGSZ-UHFFFAOYSA-N 1-phenylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1=CC=CC=C1 HIDBROSJWZYGSZ-UHFFFAOYSA-N 0.000 description 1
- NQDOCLXQTQYUDH-UHFFFAOYSA-N 1-propan-2-ylpyrrole-2,5-dione Chemical class CC(C)N1C(=O)C=CC1=O NQDOCLXQTQYUDH-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G81/00—Macromolecular compounds obtained by interreacting polymers in the absence of monomers, e.g. block polymers
- C08G81/02—Macromolecular compounds obtained by interreacting polymers in the absence of monomers, e.g. block polymers at least one of the polymers being obtained by reactions involving only carbon-to-carbon unsaturated bonds
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L25/00—Compositions of, homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Compositions of derivatives of such polymers
- C08L25/02—Homopolymers or copolymers of hydrocarbons
- C08L25/04—Homopolymers or copolymers of styrene
- C08L25/08—Copolymers of styrene
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L35/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical, and containing at least one other carboxyl radical in the molecule, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L45/00—Compositions of homopolymers or copolymers of compounds having no unsaturated aliphatic radicals in side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic or in a heterocyclic ring system; Compositions of derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L61/00—Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
- C08L61/04—Condensation polymers of aldehydes or ketones with phenols only
- C08L61/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L61/00—Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
- C08L61/04—Condensation polymers of aldehydes or ketones with phenols only
- C08L61/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
- C08L61/14—Modified phenol-aldehyde condensates
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Other Resins Obtained By Reactions Not Involving Carbon-To-Carbon Unsaturated Bonds (AREA)
- Phenolic Resins Or Amino Resins (AREA)
Abstract
The resin combination of the present invention includes phenolic resin and containing with the polymer of the repetitive unit shown in following formula (1).In formula (1), RX、RYIt is separately hydrogen or the organic group of carbon number 1~3.
Description
Technical field
The present invention relates to resin combination, photosensitive polymer combination, resin film and electronic device.
Background technology
Phenolic resin is due to excellent in resolution and has high-fire resistance and mechanical strength, studies various in composition
Application in the resin film of electronic device.
For example, Patent Document 1 discloses the superstructure technologies used in the manufacture that can act as the elements such as IC, LSI
With the positive light anti-etching agent of resist.More specifically, disclose comprising by metacresol novolac resin and adjacent first
The resin compound and the composition of 1,2- quinone di-azido compounds that phenol novolac resin is formed.
Also, according to the document, by using such composition, using the teaching of the invention it is possible to provide a kind of sensitivity, film residual rate and with branch
The positive light anti-etching agent of the excellent adhesion of support body.
Also, in recent years it has been proposed that containing making to have the phenolic compounds of specific structure and aliphatic aldehyde compound condensation and
Obtained novolak phenolics as required component positive light anti-etching agent composition (for example, referenced patent document
2)。
Prior art literature
Patent document
Patent document 1:Japanese Unexamined Patent Publication 2-55359 publications
Patent document 2:Japanese Unexamined Patent Publication 2013-174702 publications
The content of the invention
The invention technical task to be solved
However, needing the level of higher as the required heat resistance of resin film for forming electronic device, presently, there are
Resin combination comprising phenolic resin can not meet the demand.
Also, also there is the research and development hysteresis for the photosensitive polymer combination comprising phenolic resin there are this background
Actual conditions.
In light of this situation, the present invention provides a kind of excellent heat resistance, such as energy when photosensitive polymer combination is made
Enough balances show the resin combination of excellent sensitivity and high-fire resistance well.
For solving the means of technical task
According to the present invention, there is provided a kind of resin combination, it includes phenolic resin and contains the repetition shown in following formula (1)
The polymer of unit.
(in formula (1), RX、RYIt is separately hydrogen or the organic group of carbon number 1~3.)
Also, according to the present invention, there is provided one kind includes the acid anhydrides of the polymer containing the repetitive unit shown in following formula (1)
Position forms the resin combination of the ester compounds of ester bond with the phenolic hydroxyl group that phenolic resin possesses.
(in formula (1), RX、RYSeparately represent the organic group of hydrogen or carbon number 1~3.)
Also, according to the present invention, there is provided a kind of photosensitive polymer combination comprising above-mentioned resin combination and emulsion.
Also, according to the present invention, there is provided a kind of resin film for including above-mentioned resin combination.
Also, according to the present invention, there is provided a kind of resin film for including above-mentioned photosensitive polymer combination.
Also, according to the present invention, there is provided a kind of electronic device for possessing above-mentioned resin film.
Invention effect
In accordance with the invention it is possible to a kind of excellent heat resistance is provided, can for example be put down when photosensitive polymer combination is made
Weighing apparatus property shows the resin combination of excellent sensitivity and heat resistance well, and has used the resin film of the resin combination
And electronic device.
Brief description of the drawings
Above-mentioned purpose and other objects, features and advantages by preferred embodiment set forth below and its it is subsidiary with
Lower attached drawing is further clear and definite.
Fig. 1 is the profile of an example for the electronic device for representing present embodiment.
The infrared absorpting light spectra of composition obtained from Fig. 2 is polymer 2 used in embodiment and makes its modification.
Embodiment
Hereinafter, suitably embodiment is illustrated using attached drawing.Wherein, in all of the figs, will to same composition
Part marks identical symbol, suitably omits the description.Also, unless otherwise noted, "~" is represented with up to following.
[resin combination]
First, the resin combination of present embodiment is illustrated.
The resin combination of present embodiment is as follows.
A kind of resin combination, it includes phenolic resin and containing with the polymer of the repetitive unit shown in following formula (1).
(in formula (1), RX、RYIt is separately hydrogen or the organic group of carbon number 1~3.)
The resin combination of present embodiment is compared with the resin combination comprising phenolic resin that presently, there are, Neng Goubiao
Reveal the heat resistance of higher.
It is although the detailed mechanism is not yet clear, such as it is considered that as follows:Although comprising phenolic resin and containing above-mentioned
The polymer of repetitive unit shown in formula (1), but construction unit phase of the phenolic hydroxyl group that possesses of phenolic resin shown in formula (1)
Effect, as a result, polymer forms close connecting structure with phenolic resin.
The resin combination of this present embodiment is suitable for photosensitive polymer combination.The photosensitive polymer combination
Resin combination and emulsion can be included.
Hereinafter, each component of the resin combination to forming present embodiment illustrates.
(phenolic resin)
First, the phenolic resin included to the resin combination of present embodiment illustrates.
The phenolic resin of present embodiment can use conventionally known phenolic resin.As above-mentioned phenolic resin, have no
It is particularly limited to, such as novolak phenolics, resol type phenol resin, aryl alkene fundamental mode phenolic resin etc. can be enumerated.
As phenolic resin, a kind in them is can be used alone, two or more with different weight average molecular weight can also be used in combination,
The one kind or two or more prepolymer with them can also be used in combination.Wherein, preferably using novolak phenolics.
As long as novolak phenolics make phenols and aldehydes in the presence of no catalyst or acidic catalyst into
The resin that row is reacted and obtained, can suitably select according to purposes.For example, random phenolic varnish type or height can also be used
The phenolic resin of ortho position phenolic varnish type.
Wherein, which usually passes through the molar ratio (aldehydes/phenols) in aldehydes relative to phenols
Control is reacted and obtained on the basis of 0.5~1.0.
As the concrete example of used phenols when preparing the novolak phenolics, such as phenol, neighbour can be enumerated
Cresols, metacresol, paracresol, xylenols, induced by alkyl hydroxybenzene, catechol, resorcinol etc..Also, those phenols can be independent
It is used in mixed way using or by two or more.
In addition, as used aldehydes when preparing novolak phenolics, such as can use:Formaldehyde, poly
The aldehyde compounds such as formaldehyde, benzaldehyde;Material as the generating source of these aldehyde compounds;Or solution of these aldehyde compounds etc..
Wherein, these aldehydes can be used alone or be used in mixed way two or more.
It is preferably more than 300 as the molecular weight of the phenolic resin of present embodiment, such as in terms of weight average molecular weight (Mw),
More preferably more than 1000, more preferably more than 2000, particularly preferably more than 3000.It is by weight average molecular weight (Mw)
More than above-mentioned lower limit, the mechanical strength and heat resistance that can make resin combination and the resin film obtained by resin combination carry
It is high.
It is preferably less than 20000 as the molecular weight of the phenolic resin, such as in terms of weight average molecular weight (Mw), more preferably
Less than 18000, more preferably less than 15000.It is below above-mentioned upper limit value by weight average molecular weight (Mw), can realizes system
Operational raising during molding resins composition, the raising of mouldability when obtaining by resin combination resin film.
Further, it is possible to realize the raising and not of the sensitivity of resin combination and the resin film obtained by resin combination
The amount of precipitation of solvent components is reduced.
Also, the weight average molecular weight can be based on making with following polymer likewise by gel permeation chromatograph (GPC)
Calculated with the calibration curve that polystyrene standards matter is made.
(polymer)
The polymer of present embodiment contains the repetitive unit shown in above-mentioned formula (1).That is, the polymer of present embodiment is
The polymer of unit containing the unsaturated carboxylic acid anhydrides from intramolecular with cyclic structure, is, for example, unsaturated carboxylic acid anhydrides and its
The copolymer of his monomer.In the present embodiment, intramolecular have cyclic structure unsaturated carboxylic acid anhydrides may be selected from maleic anhydride,
Citraconic anhydride, dimethyl maleic anhydride or their derivative, are also selected from maleic anhydride, citraconic anhydride, dimethyl Malaysia
Acid anhydrides.They may be used alone, or two or more kinds may be used in combination.
As the unsaturated carboxylic acid anhydrides from intramolecular possessed by the polymer of present embodiment with cyclic structure
Unit, such as the unit for being derived from intramolecular and there are the unsaturated carboxylic acid anhydrides of cyclic structure shown in following formula (1) can be used, also
The unit from maleic anhydride shown in following formula (6) can be used.
(in formula (1), RX、RYIt is separately hydrogen or the organic group of carbon number 1~3)
In the present embodiment, in above-mentioned formula (1), RXAnd RYSuch as preferably it is separately hydrogen or carbon number 1~3
Organic group, be separately more preferably the organic group of hydrogen or carbon number 1, further preferred RXFor hydrogen and RYFor hydrogen
Or the organic group of carbon number 1, still more preferably RXAnd RYFor hydrogen.
In the present embodiment, in above-mentioned formula (1), as composition RXAnd RYOrganic group, such as alkyl, alkene can be enumerated
Base, alkynyl, alkylidene, cycloalkyl and heterocyclic radical.
As alkyl, such as methyl, ethyl, n-propyl can be enumerated.As alkenyl, such as pi-allyl and ethene can be enumerated
Base.As alkynyl, acetenyl can be enumerated.As alkylidene, such as methine and ethylidine can be enumerated.As cycloalkyl, such as
Cyclopropyl can be enumerated.As heterocyclic radical, such as epoxy group and oxetanylmethoxy can be enumerated.
The other monomers for having the unsaturated carboxylic acid anhydrides copolymerization of cyclic structure with the intramolecular can be according to using resin group
The purposes of compound and suitably select.
As more specifically example, can enumerate:Norbornene, norbornadiene, two rings [2.2.1]-hept-2-ene" are (usual
Name:2- norbornene), 5- methyl -2- norbornene, 5- ethyl -2- norbornene, 5- butyl -2- norbornene, 5- hexyls -
2- norbornene, 5- decyl -2- norbornene, 5- pi-allyl -2- norbornene, 5- (2- acrylic) -2- norbornene, 5-
(1- methyl -4- pentenyls) -2- norbornene, 5- acetenyl -2- norbornene, 5- benzyl -2- norbornene, 5- phenethyls -
The Norbornene derivatives such as 2- norbornene;The indene monomers such as indenes, 2- methyl indenes, 3- methyl indenes;1,5,9- cyclodoecatrienes,
Cis- trans- 1,5,9- cyclodoecatrienes, trans- trans- 1,5,9- cyclodoecatrienes, trans- cis- 1,5,9- rings 12
The alicyclic ring class monomers such as carbon triolefin, cis- cis- 1,5,9- cyclodoecatrienes;Styrene, vinyltoluene, α-methylstyrene
Deng styrene monomer;The vinyl monomers such as vinyl chloride, vinylidene chloride;The fluorine-containing second such as perfluoroethylene, perfluoropropene, vinylidene
Vinyl monomer;The siliceous vinyl monomer such as vinyltrimethoxysilane, vinyltriethoxysilane;Acrylonitrile, methyl-prop
The vinyl monomer of the nitrile group-containings such as alkene nitrile;The vinyl monomer of the amide-containings such as acrylamide, Methacrylamide;Vinyl acetate
The vinyl esters such as ester, vinyl propionate, new vinyl acetate acid, vinyl benzoate, cassia bark vinyl acetate;The alkene such as ethene, propylene
Hydro carbons;Butadiene, isoprene equiconjugate dienes;The allylic monomers such as allyl chloride, allyl alcohol;Maleimide, N-
Methylmaleimido, n-ethylmaleimide, N- propylmaleimides, N- isopropylmaleimides, N- butyl horses
Carry out the N- alkyl maleimides such as acid imide, N- isobutyl groups maleimide, N- tert-butylmaleimides;N- cyclohexyl Malaysia
Acid imide, N- cyclopentylmaleimides, N- norbornies maleimide, N- cyclohexyl methyls maleimide, N- rings penta
The N- cycloalkylmaleimides such as ylmethyl maleimide;N-phenylmaleimide, N- chlorophenylmaleimides, N- first
Base phenyl maleimide, N- naphthyls maleimide, N- hydroxyphenyl-maleimides, N- methoxyphenyl maleimides
The N- aryl maleimides such as amine, N- carboxyl phenyls maleimide, N- nitrobenzophenone maleimides;Except N- alkyl Malaysia acyl
Beyond imines, N- cycloalkylmaleimides, N- aryl maleimides, the Malaysia of N- hydroxy maleimides etc. can be also enumerated
Acid imide monomer etc..They can be used alone a kind, can also be used in combination two or more different.
As above-mentioned other monomers, preferably using the norbornene-type monomers in alicyclic ring class monomer, styrene monomer, indenes
Class monomer, maleimide monomer.That is, the polymer of present embodiment preferably also contains and is dropped selected from being derived from shown in formula (2)
The unit from styrene monomer shown in the unit of norbornene type monomer, formula (3), be derived from indene monomer shown in formula (7)
Unit and formula (8) shown at least one of the unit from maleimide monomer unit.They can individually contain 1
Kind, different units of more than two kinds can also be contained.
These units are contained by polymer, the resin combination of present embodiment can be made and obtained by resin combination
Resin film heat resistance improve.
(in formula (2), R1、R2、R3And R4It is separately hydrogen or the organic group of carbon number 1~30;N for 0,1 or
2。)
(in formula (3), Ra is separately the organic group of carbon number 1~30;M is less than more than 05 integer.)
(in formula (7), R5To R11It is separately hydrogen or the organic group of carbon number 1~3.)
(in formula (8), R12It independently is the organic group of hydrogen or carbon number 1~10.)
In the present embodiment, in above-mentioned formula (2), R1~R4Such as separately having for hydrogen or carbon number 1~30
Machine group, is preferably separately hydrogen or the organic group of carbon number 1~10, more preferably separately former for hydrogen or carbon
The organic group of subnumber 1~3, is separately further preferably hydrogen or the organic group of carbon number 1.Also, above-mentioned formula
(2) in, n is, for example, 0,1 or 2, is preferably 0 or 1, and more preferably 0.
In the present embodiment, in above-mentioned formula (3), Ra is separately for example the organic of hydrogen or carbon number 1~30
Group, is preferably separately hydrogen or the organic group of carbon number 1~10, is more preferably separately hydrogen or carbon atom
The organic group of number 1~3, is separately further preferably hydrogen or the organic group of carbon number 1.Also, above-mentioned formula (3)
In, m is, for example, less than more than 05 integer, is preferably the integer of less than more than 03 integer, more preferably less than more than 01.
In the present embodiment, in above-mentioned formula (7), R5~R11Such as separately having for hydrogen or carbon number 1~3
Machine group, is preferably separately hydrogen or the organic group of carbon number 1, is further preferably separately hydrogen.
In the present embodiment, in above-mentioned formula (8), R12Such as the organic group of hydrogen or carbon number 1~10 independently is,
It is preferably independently hydrogen or the organic group of carbon number 1~5, independently more preferably is the organic group of hydrogen or carbon number 1~3
Group, independently further preferably is the organic group of hydrogen or carbon number 1.
Form R1~R4, Ra carbon number 1~30 organic group can contain in its structure selected from O, N, S, P and
More than a kind of atom in Si.Also, form R5~R11The organic group of carbon number 1~3 can contain in its structure
More than a kind of the atom in O, N, S, P and Si.Also, form R12The organic group of carbon number 1~10 can be at it
Contain more than a kind of the atom in O, N, S, P and Si in structure.Also, form R1~R4、Ra、R5~R11And R12Have
Machine group all can be not have the group of acidic functionality.Thereby, it is possible to easily control the acid number of polymer.
In the present embodiment, as composition R1~R4, Ra organic group, such as alkyl, alkenyl, alkynyl, secondary can be enumerated
Alkyl, aryl, aralkyl, alkaryl, cycloalkyl and heterocyclic radical.
As alkyl, such as methyl, ethyl, n-propyl, isopropyl, normal-butyl, isobutyl group, sec-butyl, tertiary fourth can be enumerated
Base, amyl group, neopentyl, hexyl, heptyl, octyl group, nonyl and decyl.As alkenyl, such as pi-allyl, pentenyl and second can be enumerated
Alkenyl.As alkynyl, acetenyl can be enumerated.As alkylidene, such as methine and ethylidine can be enumerated.As aryl, such as
Tolyl, xylyl, phenyl, naphthyl and anthryl can be enumerated.As aralkyl, such as benzyl and phenethyl can be enumerated.As
Cycloalkyl, such as adamantyl, cyclopenta, cyclohexyl and cyclooctyl can be enumerated.As heterocyclic radical, for example, can enumerate epoxy group and
Oxetanylmethoxy.
In the present embodiment, as composition R5~R11Organic group, such as alkyl, alkenyl, alkynyl, secondary alkane can be enumerated
Base, cycloalkyl and heterocyclic radical.
As alkyl, such as methyl, ethyl, n-propyl can be enumerated.As alkenyl, such as pi-allyl and ethene can be enumerated
Base.As alkynyl, acetenyl can be enumerated.As alkylidene, such as methine and ethylidene can be enumerated.As cycloalkyl, such as
Cyclopropyl can be enumerated.As heterocyclic radical, such as epoxy group and oxetanylmethoxy can be enumerated.
In the present embodiment, as composition R12Organic group, such as hydrogen or above-mentioned R can be used1~R4, Ra institutes
The organic group of carbon number 1~10 in the organic group of illustration.
In addition, form R1~R4、Ra、R5~R11And R12Alkyl, alkenyl, alkynyl, alkylidene, aryl, aralkyl, alkane virtue
The hydrogen atom of more than 1 of base, cycloalkyl and heterocyclic radical can be substituted by halogen atom.As halogen atom, can enumerate fluorine, chlorine, bromine and
Iodine.Wherein, the hydrogen atom of more than 1 of optimizing alkyl is substituted by the haloalkyl of halogen atom.By making R1~R4、Ra、R5~
R11、R12In at least any one be haloalkyl, can reduce the dielectric of the cured film when forming cured film using polymer
Constant.Also, by forming haloalkyl alcohol radical, the dissolubility for alkaline-based developer can not only be moderately adjusted, and
Resistance to thermochromism can be improved.
In addition, from the viewpoint of the translucency for improving the film formed comprising polymer, preferably R1~R4、Ra、R5~R11
And R12In any one be hydrogen, such as using formula (2) construction unit in the case of, preferably R1~R4It is hydrogen.Such as
In the case of construction unit using formula (3), preferably Ra is hydrogen.Such as in the case of using the construction unit of formula (7), preferably
R5~R11For hydrogen.Such as in the case of using the construction unit of formula (8), preferably R12For hydrogen.
In order to adjust the molecular weight of polymer, chain-transferring agent can be suitably used.As chain-transferring agent, such as can enumerate:
3- mercaptopropionic acid octadecanes ester, pentaerythrite four (3-thiopropionate), β-mercaptopropionic acid, 3- mercaptopropionic acids methoxybutyl,
3- mercaptopropionic acid octadecanes ester, trimethylolpropane tris (3-thiopropionate), three-[(3- mercaptopropionyls epoxide)-ethyl] are different
The β-mercaptopropionic acid class such as cyanurate;The naphthoquinones classes such as 2 hydroxy 1,4 naphthoquinone (lawsone), 1,4- naphthoquinones;N-hexyl mercaptan, n-octyl sulphur
The thio-alcohols such as alcohol, n-dodecyl mercaptan, tert-dodecylmercaotan, thioacetic acid, mercaptopropionic acid;Dimethyl disulfide xanthic acid
The xanthan acids such as ester, dithiodiisopropyl xanthate;And triethoxysilane, terpinolene, α-methylstyrene two
Polymers etc..
Polymer before being reacted with the phenolic resin in present embodiment is utilizing such as GPC (gel infiltration colors
Spectrometry, Gel Permeation Chromatography) obtained from molecular weight distribution curve, molecular weight is below 1000
Peak area can be overall less than 3%, can also be less than 2%.
In this way, the ratio of the peak area by the molecular weight of molecular weight distribution curve that will be obtained using GPC below 1000
Above range is set to, the pattern form of film that is made of the resin combination comprising polymer can be made good.Therefore, it is possible to carry
Height possesses Reliability of Microprocessor of the film as electronic devices such as the liquid crystal display device of permanent film, solid-state imagers.
In addition, the lower limit of the amount of low molecular weight compositions in polymer is not particularly limited.However, in present embodiment
Polymer allows the peak area in the molecular weight distribution curve middle-molecular-weihydroxyethyl obtained by GPC below 1000 to be overall 0.01%
Situation above.
Polymer such as Mw (weight average molecular weight)/Mn (numbers before being reacted with the phenolic resin in present embodiment
Average molecular weight) it is less than more than 1.5 2.5.Wherein, Mw/Mn is the dispersion degree for the width for representing molecular weight distribution.
It was found by the inventors of the present invention that by controlling the molecular weight distribution of polymer in certain scope, for by
The film that the polymer is formed, the deformation of pattern when can suppress to cure.Therefore, by the way that the Mw/Mn of polymer is set to above-mentioned model
Enclose, the shape of film that is made of the resin combination comprising polymer can be made good.In addition, this effect as above institute at the same time
Show especially pronounced in the case of reduce polymer low molecular weight compositions with stating.
Also, the molecular weight Mw (weight average molecular weight) of polymer is, for example, 1, more than 500 30, less than 000.
Wherein, weight average molecular weight (Mw), number-average molecular weight (Mn) and molecular weight distribution (MW/Mn) for example using according to by
The polystyrene scaled value that the calibration curve for the polystyrene standard (PS) that GPC is measured is obtained.Determination condition is for example as follows
It is shown.
The gel permeation chromatograph device HLC-8320GPC of TOSOH CORPORATION productions
Column:The TSK-GEL Supermultipore HZ-M of TOSOH CORPORATION productions
Detector:Phase chromatography-use RI detectors
Measuring temperature:40℃
Solvent:THF
Sample solution concentration:2.0mg/ milliliter
In addition, low molecular weight compositions amount in polymer is for example based on the relevant data of molecular weight measured by GPC,
Calculated according to the area summation of the component equivalent to molecular weight below 1000 ratio shared in molecular weight distribution entire area
Go out.
(manufacture method of polymer)
The polymer of present embodiment can be by making intramolecular have the unsaturated carboxylic acid anhydrides and other lists of cyclic structure
Body is copolymerized and is obtained.The manufacture method can use conventionally known method.Hereinafter, enumerate comprising above-mentioned formula (2) Suo Shi
Repetitive unit polymer manufacture method exemplified by, it is described below.
(polymerization procedure (processing S1))
First, prepare using the norbornene-type monomers shown in following formula (2a) and the maleic anhydride as monomer.At formula (2a)
In shown norbornene-type monomers, n, R1~R4Can be identical with above-mentioned formula (2).
As the norbornene-type monomers shown in formula (2a), specific enumerable two ring [2.2.1]-hept-2-ene" (trivial name:
2- norbornene).The norbornene-type monomers with alkyl are further used as, 5- methyl -2- norbornene, 5- second can be enumerated
Base -2- norbornene, 5- butyl -2- norbornene, 5- hexyl -2- norbornene, 5- decyl -2- norbornene etc.;As tool
There are the norbornene-type monomers of alkenyl, 5- pi-allyl -2- norbornene, 5- (2- acrylic) -2- norbornene, 5- can be enumerated
(1- methyl -4- pentenyls) -2- norbornene etc.;As the norbornene-type monomers with alkynyl, 5- acetenyls -2- can be enumerated
Norbornene etc.;As the norbornene-type monomers with aralkyl, 5- benzyl -2- norbornene, 5- phenethyls -2- can be enumerated
Norbornene etc..
In addition, as norbornene-type monomers, the R in formula (2a) can be used1、R2、R3、R4Included in the structure of group
The norbornene-type monomers of the functional group such as the group with bridging property or the group containing halogen atoms such as fluorine.
As norbornene-type monomers, can use more than either of which kind.Wherein, from the heat resistance of polymer with
From the viewpoint of the balance of translucency, preferably using two rings [2.2.1]-hept-2-ene" (trivial name:2- norbornene).
Then, the norbornene-type monomers shown in formula (2a) carry out addition polymerization with maleic anhydride.Here, pass through radical polymerization
Close, form the copolymer (copolymer 1) of the norbornene-type monomers and maleic anhydride shown in formula (2a).
Molar ratio (mole of the compound shown in formula (2a) of norbornene-type monomers and maleic anhydride shown in formula (2a)
Number:The molal quantity of maleic anhydride) it is preferably 0.5:1~1:0.5.Wherein, from the viewpoint of control molecular structure, preferred formula
The molal quantity of norbornene-type monomers shown in (2a):Molal quantity=0.8 of maleic anhydride:1~1:0.8.
In addition, in the addition polymerization, in addition to above-mentioned norbornene-type monomers and maleic anhydride, can also add to carry out
The monomer of copolymerization.As this monomer, the compound that intramolecular includes the group with olefinic double bond can be enumerated.Here, conduct
The concrete example of group with olefinic double bond, can enumerate pi-allyl, acryloyl group, methylacryloyl, dimaleoyl imino or
Aromatic ethenyl such as styryl or indenyl etc..
Furthermore it is also possible to replace above-mentioned maleic acid using unsaturated carboxylic acid anhydrides of other intramoleculars with cyclic structure
Acid anhydride.
It is polymerize as polymerization, such as preferably using radical polymerization initiator and chain-transferring agent as needed
Method.In this case, the methods of suspension polymerisation, polymerisation in solution, dispersin polymerization, emulsion polymerization can be used.Wherein, preferably
Polymerisation in solution.In polymerisation in solution, each monomer can disposably be added to whole amount to carry out, can also be by a part added to instead
Container is answered, then remaining monomer is added dropwise to carry out.
For example, by the way that norbornene-type monomers, maleic anhydride and the polymerization initiator shown in formula (2a) are dissolved in solvent
In, heat afterwards the stipulated time, thus the norbornene-type monomers shown in formula (2a) carry out polymerisation in solution with maleic anhydride.Add
Hot temperature is, for example, 50~80 DEG C, when heating time is 10~20 small.
As solvent used in polymerization, such as diethyl ether, tetrahydrofuran, toluene, methyl ethyl ketone, acetic acid can be used
It is more than any of ethyl ester etc..
As radical polymerization initiator, can use more than any of azo-compound and organic peroxide.
As azo-compound, such as double (2 Methylpropionic acids) two of azobis isobutyronitrile (AIBN), 2,2'- azos can be enumerated
Methyl esters, 1,1'- azos are double (cyclohexane carbonitrile) (ABCN), can use more than either of which kind.
In addition, as organic peroxide, such as hydrogen peroxide, di-t-butyl peroxide (DTBP), peroxidating can be enumerated
Benzoyl (benzoyl peroxide, BPO) and methyl ethyl ketone peroxide (MEKP), can use either of which kind with
On.
The amount (molal quantity) of radical polymerization initiator is preferably norbornene-type monomers and maleic acid shown in formula (2a)
The 1%~10% of total molal quantity of acid anhydride.By the way that the amount of polymerization initiator is suitably set within the above range, and suitably set
Determine reaction temperature, reaction time, the amount of chain-transferring agent, the weight average molecular weight (Mw) of the polymer obtained can be adjusted suitable
When scope.
By the polymerization process (processing S1), will can have shown in repetitive unit and the formula (2) shown in above-mentioned formula (1)
The copolymer 1 polymerization of repetitive unit.
Wherein, in copolymer 1, the R of the structure of formula (2)1It is preferred that be common in each repetitive unit, but can also be
It is different in each repetitive unit.In R2~R4In similarly.
Copolymer 1 can be that the repetitive unit shown in formula (1) is randomly configured with the repetitive unit shown in formula (2)
Structure, can also be the structure alternately configured.Also, it can also be the norbornene-type monomers shown in formula (2a) and horse
Carry out acid anhydrides and carry out the structure that block copolymerization forms.Wherein, from the resin group ensured using the polymer manufactured by present embodiment
From the viewpoint of the deliquescent uniformity of compound, the repetitive unit shown in preferred formula (1) is handed over the repetitive unit shown in formula (2)
The structure alternately configured.That is, copolymer 1 is for example in the case of norbornene-type monomers and maleic anhydride, preferably
For with the structure of the repetitive unit shown in following formula (4).
(in formula (4), n, R1~R4It is identical with above-mentioned formula (2).That is, n is any one in 0,1,2.R1~R4For hydrogen or carbon
The organic group of atomicity 1~30.R1~R4It can be the same or different.Also, the integer that a is less than more than 10 200.)
Here, the R of the structure of formula (4)1It is preferred that be common in each repetitive unit, but can also be in each repetitive unit
In it is different.In R2~R4In it is also identical.
(low molecular weight compositions removing step (processing S2))
Then, as needed in the organic layer comprising the low molecular weight compositions such as copolymer 1 and residual monomer and oligomer,
A large amount of poor solvents, such as hexane or methanol are added, makes the polymer solidification precipitation comprising copolymer 1.Here, as low molecule
Component is measured, includes residual monomer, oligomer and polymerization initiator etc..Then, filtered, do obtained coagulum
It is dry.Thus, polymer after removing low molecular weight compositions, using copolymer 1 as main component (mainly generating thing) can be obtained.
In the resin combination of present embodiment, the content of polymer is excellent relative to above-mentioned 100 mass parts of phenolic resin
Elect as more than 5 mass parts, more preferably more than 10 mass parts, more preferably more than 15 mass parts, particularly preferably 20 matter
Measure more than part.
Also, in the resin combination of present embodiment, the content of polymer is relative to above-mentioned 100 mass of phenolic resin
Part is preferably 100 below mass part, and more preferably 70 is below mass part, and more preferably 50 is below mass part, particularly preferably
It is below mass part for 35.
By being set as such scope, the appropriate interaction with above-mentioned phenolic resin can be brought, is more conducive to
Improve heat resistance.
Even if for example, above-mentioned polymer include above-mentioned formula (7) shown in repetitive unit in the case of, can also be by making
With the indene monomer shown in following formula (7a), the same method of the monomer and polymer phase with the repetitive unit comprising formula (2) is utilized
Manufactured.
(in formula (7a), R5~R11It is identical with formula (7).)
The resin combination of present embodiment includes above-mentioned phenolic resin and polymer, preferably comprises the formula in polymer
(6) what the construction unit (i.e. maleic anhydride units) shown in was bonded with the phenolic hydroxyl group that phenolic resin possesses via ester bond
Compound (ester compounds).
It is considered that in the resin combination of present embodiment, pass through the phenolic hydroxyl group and maleic anhydride addition, there is provided
With the half ester shown in following formula (5).Due to the ester bond in the formula (5), resin combination, the resin film of present embodiment can show
Go out high-fire resistance.
And it can consider that the half ester in formula (5) contains carboxyl, thus can realize when preparing photosensitive polymer combination
The raising of sensitivity.
Furthermore it is also possible to replace above-mentioned maleic acid using the unsaturated carboxylic acid anhydrides that other intramoleculars have cyclic structure
Acid anhydride.
(in formula (5), R is the atomic group from phenolic resin.)
Furthermore it is possible to think that the resin combination of present embodiment provides the half ester shown in formula (5) as described above.Thus table
Reveal the effect of heat resistance etc., therefore by being heated etc. before various uses is supplied in resin combination, Neng Gouzeng
Plus the containing ratio for stating half ester.
Scope as the condition of the heating, for example, 50~100 DEG C.
Also, such as in the case of the purposes in for technique by heating process etc., additionally it is possible to by above-mentioned phenolic aldehyde tree
Fat is used in mixed way without being supplied in heating at normal temperatures with polymer.
In the heating, from the viewpoint of reaction is promoted, catalyst can be properly added, such as base catalysis can be added
Agent or acid catalyst.
As base catalyst, the hydroxy compounds such as sodium hydroxide, potassium hydroxide, the alkyl such as pyridine or triethylamine can be used
The metal salts, ammonia etc. such as the amine compounds such as amine, dimethylaniline, methenamine, dimethyl aminopyridine, sodium acetate.They can be single
Solely using one kind, in order to further improve reactivity, two or more base catalysts can also be combined.
In addition, as acid catalyst, the organic acids such as inorganic acid, the p-methyl benzenesulfonic acid such as sulfuric acid or hydrochloric acid, fluorination can be used
Lewis acids such as borate ether etc..
Furthermore it is also possible to replace above-mentioned maleic acid using the unsaturated carboxylic acid anhydrides that other intramoleculars have cyclic structure
Acid anhydride.
Also, the resin combination of present embodiment can include the polymerization containing the repetitive unit shown in above-mentioned formula (1)
The acid anhydrides position of thing forms the ester compounds of ester bond with the phenolic hydroxyl group that phenolic resin possesses.In this case, this embodiment party
In the resin combination of formula, the acid anhydrides (such as maleic anhydride) of the polymer can whole open loops, and/or phenolic resin possessed
Phenolic hydroxyl group can have ester bond.Thereby, it is possible to further improve heat resistance.
[photosensitive polymer combination]
As the more specifically purposes on above-mentioned resin combination, conduct photoresist as follows can be enumerated
The purposes of composition.
The photosensitive polymer combination of present embodiment can include above-mentioned phenolic resin, containing shown in above-mentioned formula (1)
The polymer and emulsion of repetitive unit.That is, the photosensitive polymer combination of present embodiment can include above-mentioned resin combination
Thing and emulsion.
Here, on the phenolic resin and polymer that are used in the photosensitive polymer combination of present embodiment, can
Using material same as described above.Hereinafter, component in addition is illustrated.
(emulsion)
The photosensitive polymer combination of present embodiment includes emulsion.
As the emulsion, such as diazonium naphtoquinone compounds, diaryl group iodized salt, triarylsulfonium salt or sulfonium-boron can be used
The salt such as hydrochlorate, 2- nitrobenzyls ester compounds, N- iminosulfonates compound, acid imide sulfonate compound, 2,6- are double
(trichloromethyl) -1,3,5- triaizine compounds or dihydropyridine compound.Wherein, particularly preferably dissolved using sensitivity and solvent
The excellent diazonium naphtoquinone compounds of property.As diazonium naphtoquinone compounds, such as compound shown below can be used.
(n2 is less than more than 15 integer.)
In each compound more than, Q is any one or hydrogen atom in the structure shown in following (a)~(c).Its
In, at least one structure for shown in following (a)~(c) in the Q of each compound any one.
In the present embodiment, as diazonium naphtoquinone compounds, such as phenolic compounds and 1,2- naphthoquinones -2- two are more preferably used
The ester of two nitrine -4- sulfonic acid of nitrine -5- sulfonic acid or 1,2- naphthoquinones -2-.
The photosensitive polymer combination of present embodiment can be so-called eurymeric, it is believed that residue in unexposed portion
Heat of emulsion when curing in relief pattern produces acid decomposing, which also plays as reaction promoter
Important function.As the diazonium naphtoquinone compounds with such effect, particularly preferably using 1, the 2- naphthalenes for being easier to be thermally decomposed
The ester of two nitrine -4- sulfonic acid of quinone -2-.
The content of emulsion in the photosensitive polymer combination of present embodiment is not particularly limited, relative to phenolic aldehyde tree
100 mass parts of fat are preferably more than 5 mass parts, more preferably more than 8 mass parts.Also, the sense in photosensitive polymer combination
The content of photo etching is preferably 80 below mass part relative to 100 mass parts of phenolic resin, and more preferably 60 is below mass part.Pass through
The content of emulsion within the above range, can play good patterning performance.
(solvent)
Resin combination and photosensitive polymer combination described in present embodiment can be by molten by above-mentioned each component
Solution is used with varnish shape in a solvent.
As the example of this solvent, N- methyl -2- Pyrrolizidines ketone, gamma-butyrolacton, N, N- dimethylacetamides can be enumerated
Amine, dimethyl sulfoxide (DMSO), diethylene glycol dimethyl ether, diethylene glycol diethyl ether, dibutyl ethylene glycol ether, propylene glycol monomethyl ether, dipropyl
Glycol monomethyl ether, propylene glycol methyl ether acetate, methyl lactate, ethyl lactate, butyl lactate, methyl isophthalic acid, 3- butanediol acetic acid
Ester, 1,3 butylene glycol -3- monomethyl ethers, methyl pyruvate, ethyl pyruvate and methyl -3- methoxy propyl acid esters etc..
In addition, from significantly inhibit resin film produce cracking from the viewpoint of, in these compounds, preferably using selected from
Gamma-butyrolacton, dimethyl sulfoxide (DMSO), diethylene glycol dimethyl ether, diethylene glycol diethyl ether, dibutyl ethylene glycol ether, propane diols list first
Compound in ether, dipropylene glycol monomethyl ether, propylene glycol methyl ether acetate.
The content of solvent in the resin combination and photosensitive polymer combination of present embodiment is not particularly limited, phase
It is preferably more than 100 mass parts, more preferably more than 150 mass parts for 100 mass parts of phenolic resin.
Also, the content of the solvent in the resin combination and photosensitive polymer combination of present embodiment is relative to phenolic aldehyde
100 mass parts of resin are preferably 1000 below mass part, and more preferably 800 is below mass part.The content of solvent is in above range
When interior, appropriate operability can be brought.
(other compositions)
The resin combination and photosensitive polymer combination of present embodiment are in addition to coordinating mentioned component, additionally it is possible to root
Coordinate various composition according to purposes.
For example, as alkali soluble resin, it can in addition coordinate phenolic resin, phenol aralkyl resin, hydroxy styrenes
The acrylic resins such as resin, methacrylic resin, methacrylate resin, cyclic olefin resinoid etc..
Further, it is also possible to be added as needed on antioxidant, filler, silane coupling agent, surfactant, closely sealed auxiliary agent,
The additive such as end-capping reagent and sensitizer.
In addition, their additive amount is arbitrary.
(purposes)
The resin combination and photosensitive polymer combination of present embodiment can be used in forming resist or permanent film etc.
Resin film.From the viewpoint of heat resistance, preferably such purposes.
Also, above-mentioned resist is coated with for example by using the methods of spin coating, roller coat, flow coat, dip-coating, spraying, blade coating
Photosensitive polymer combination and the resin film composition that solvent is removed and is obtained.
Above-mentioned permanent film is by by the way that above-mentioned resin film is exposed and is developed, after patterned required shape, utilizing heat
The cured film that processing etc. cures it and obtains is formed.Permanent film is such as available for protective film, interlayer film or padded coaming.
Then, to applying the resin combination of present embodiment or the electronic device 100 of photosensitive polymer combination
An example illustrates.
The electronic device 100 of present embodiment can possess above-mentioned resin film.
Electronic device 100 shown in Fig. 1 is, for example, semiconductor chip.In this case, such as by by electronic device 100
It is mounted in via convex block 52 on wiring substrate, obtains semiconductor package body.Electronic device 100, which possesses, to be provided with transistor etc. and partly leads
The semiconductor substrate of volume elements part and the multilayer wired layer (not shown) set on a semiconductor substrate.In multilayer wired layer most
The superiors' distribution 34 that upper strata is provided with interlayer dielectric 30 and is set on interlayer dielectric 30.The superiors' distribution 34 for example by
Aluminium is formed.Also, on interlayer dielectric 30 and it is provided with passivating film 32 on the superiors' distribution 34.In a part for passivating film 32
It is provided with the opening that the superiors' distribution 34 exposes.
Wiring layer 40 again are provided with passivating film 32.Wiring layer 40 has the insulating layer being arranged on passivating film 32 again
42nd, the distribution again 46 that is arranged on insulating layer 42 and it is arranged on insulating layer 42 and the insulating layer 44 on distribution 46 again.Insulation
Layer 42 is formed with the opening being connected with the superiors distribution 34.Again distribution 46 be formed on insulating layer 42 and insulating layer 42 set by
In opening, it is connected with the superiors distribution 34.The opening that insulating layer 44 is provided with distribution 46 is connected again.
In the present embodiment, can be by by being solidified to form above-mentioned resin combination or photosensitive polymer combination
Resin film form more than one in passivating film 32, insulating layer 42 and insulating layer 44.In this case, such as to by photonasty
The coated film that resin combination is formed exposes ultraviolet and is developed and patterned, and afterwards, is heating and curing to it, thus
Form passivating film 32, insulating layer 42 or insulating layer 44.
In the opening set by insulating layer 44, such as across UBM (Under Bump Metallurgy:It is golden under convex block
Belong to) the formation convex block 52 of layer 50.Electronic device 100 is connected such as via convex block 52 with wiring substrate.
In addition, the present invention is not limited to the above embodiment, it can realize the deformation in the range of the object of the invention, change
It is good etc. to be included in the invention.
Hereinafter, it is attached the example of reference mode.
1. a kind of resin combination, it includes novolak phenolics and contain the repetition list shown in following formula (6)
The polymer of member.
2. the resin combination according to 1., wherein, the weight average molecular weight of above-mentioned novolak phenolics is 300
Below the above 20000.
3. according to the resin combination described in 1. or 2., it includes the acid anhydrides for possessing the repetitive unit shown in above-mentioned formula (6)
The compound that position is bonded with the phenolic hydroxyl group that above-mentioned novolak phenolics possess via ester bond.
4. the resin combination according to any one of 1. to 3., wherein, above-mentioned polymer also contains with following formula (2) institute
The repetitive unit or the repetitive unit shown in following formula (3) shown.
(in formula (2), R1、R2、R3And R4It is separately hydrogen or the organic group of carbon number 1~30;N for 0,1 or
2。)
(in formula (3), Ra is separately the organic group of carbon number 1~30.M is less than more than 05 integer.)
5. a kind of photosensitive polymer combination, it includes novolak phenolics, contain the weight shown in following formula (6)
The polymer and emulsion of multiple unit.
6. the photosensitive polymer combination according to 5., wherein, above-mentioned emulsion is diazonium naphtoquinone compounds.
7. according to the photosensitive polymer combination described in 5. or 6., wherein, the weight of above-mentioned novolak phenolics is equal
Molecular weight is less than more than 300 20000.
8. the photosensitive polymer combination according to any one of 5. to 7., it includes possess shown in above-mentioned formula (6)
What the acid anhydrides position of repetitive unit was bonded with the phenolic hydroxyl group that above-mentioned novolak phenolics possess via ester bond
Compound.
9. the photosensitive polymer combination according to any one of 5. to 8., wherein, above-mentioned polymer is also containing following
Repetitive unit shown in formula (2) or the repetitive unit shown in following formula (3).
(in formula (2), R1、R2、R3And R4It is separately hydrogen or the organic group of carbon number 1~30.N for 0,1 or
2。)
(in formula (3), Ra is separately the organic group of carbon number 1~30.M is less than more than 05 integer.)
10. the resin film that a kind of solidfied material of photosensitive polymer combination by any one of 5. to 9. is formed.
A kind of 11. electronic device for possessing the resin film described in 10..
Embodiment
Then, the embodiment of the present invention is illustrated.
First, on each material used in embodiment, preparation is proceeded as described below.
(novolak phenolics 1)
Possess agitating device, thermometer, heat exchanger 3L four-hole boiling flask in, relative to metacresol and paracresol with
Molar ratio (metacresol:Paracresol)=5:1000 parts of the phenols that 5 ratio mixes, adds 37% formlinata aquae concentratac
526 parts (molar ratio=0.70 of formaldehyde/phenol), 10 parts of oxalic acid, react when progress 6 is small under reflux.Afterwards, carry out under normal pressure
Dehydration is warming up to 230 DEG C of progress decompression dehydrations up to interior 170 DEG C of temperature under the decompression of 8.0kPa, obtains weight average molecular weight 11,
000th, 1050 parts of the novolak phenolics of dispersion degree 9.0, unreacted phenols 0.5%.
(polymer 1)
Possess mixer, cooling tube appropriate size reaction vessel in, weigh maleic anhydride (735g, 7.5mol),
2- norbornene (706g, 7.5mol) and double (2 Methylpropionic acid) dimethyl esters (69g, 0.3mol) of 2,2'- azo, and it is dissolved in first
In base ethyl ketone and toluene.To the lysate, after by nitrogen bubbling, the dissolved oxygen in system is removed, stir while 60
DEG C, 15 it is small when under conditions of implement heat treatment.Thus, the copolymer of 2- norbornene and maleic anhydride is obtained.Then, using big
After amount methanol makes the above-mentioned lysate reprecipitation that is cooled to room temperature, precipitate is filtered, makes its drying using vacuum drier, obtains
The white solid of 1100g.
The weight average molecular weight (Mw) of the polymer obtained in this way is 10,000, and dispersion degree (Mw/Mn) is 2.1.
(polymer 2)
Prepare the copolymer SMA-1000-P (production of Cray Valley USA, LLC companies) of phenylethylene/maleic anhydride.It is poly-
The weight average molecular weight (Mw) of compound is 3,600, and dispersion degree (Mw/Mn) is 2.3.
(polymer 3)
Possess mixer, cooling tube appropriate size reaction vessel in, weigh indenes (870g, 7.5mol) and 2,2'-
Double (2 Methylpropionic acid) dimethyl esters (11.5g, 0.05mol) of azo, and be dissolved in methyl ethyl ketone.To the lysate, pass through
After nitrogen bubbling removes the dissolved oxygen in system, stir on one side, while reach after 70 DEG C lasted from each mouth 5 it is small when progressively add
Add maleic anhydride (735g, 7.5mol) methyl ethyl ketone solution, n-dodecyl mercaptan (20.2g, 0.10mol) methyl ethyl ketone
Solution, is heat-treated when further implementation 2 is small afterwards.Thus, the copolymer of indenes and maleic anhydride is obtained.
(polymer 4)
Possess mixer, cooling tube appropriate size reaction vessel in, weigh indenes (870g, 7.5mol) and 2,2'-
Double (2 Methylpropionic acid) dimethyl esters (23.0g, 0.1mol) of azo, and be dissolved in methyl ethyl ketone.To the lysate, pass through nitrogen
Bubbling by system dissolved oxygen remove after, on one side stir, while reach lasted after 75 DEG C 6 it is small when progressively add citraconic anhydride
(840g, 7.5mol) methyl ethyl ketone solution, is heat-treated when further implementation 3 is small afterwards.Thus, indenes and citraconic anhydride are obtained
Copolymer.
(polymer 5)
Possess mixer, cooling tube appropriate size reaction vessel in, weigh indenes (870g, 7.5mol) and 2,2'-
Double (2 Methylpropionic acid) dimethyl esters (11.5g, 0.05mol) of azo, and be dissolved in methyl ethyl ketone.To the lysate, pass through
After nitrogen bubbling removes the dissolved oxygen in system, stir on one side, while reach after 70 DEG C lasted from each mouth 5 it is small when progressively add
Add the methyl ethyl ketone solution, just for being mixed with maleic anhydride (662g, 6.75mol) and maleimide (72.8g, 0.75mol)
Lauryl mercaptan (20.2g, 0.10mol) methyl ethyl ketone solution, is heat-treated when further implementation 2 is small afterwards.Thus, obtain
Indenes and maleic anhydride, the copolymer of maleimide.
(polymer 6)
Possess mixer, cooling tube appropriate size reaction vessel in, weigh indenes (696g, 6.0mol), 2- drop ice
Piece alkene (141g, 1.5mol) and double (2 Methylpropionic acid) dimethyl esters (11.5g, 0.05mol) of 2,2'- azo, and it is dissolved in methyl
In ethyl ketone.To the lysate, after by nitrogen bubbling, the dissolved oxygen in system is removed, while stirring, while reaching 70 DEG C
Lasted afterwards from each mouth 7 it is small when progressively add maleic anhydride (735g, 7.5mol) methyl ethyl ketone solution, n-dodecyl mercaptan
(20.2g, 0.10mol) methyl ethyl ketone solution, is heat-treated when further implementation 5 is small afterwards.Thus, indenes, norbornene are obtained
With the copolymer of maleic anhydride.
(phenolic compounds 1)
Prepare with phenolic compounds shown in following formula (Honshu Chemical Co., Ltd. produces, product name TrisP-PA).
(emulsion 1)
Prepare with the emulsion shown in following formula (B-1) (DAITO CHEMIX Co., Ltd.s produce, product name PA-28).
Wherein, the Q in formula (B-1) represents that 90% is above-mentioned formula (B- in whole Q for hydrogen atom or by above-mentioned formula (B-2)
2)。
(surfactant 1)
Prepare fluorine system surfactant MEGAFACE F-556 (Dainippon Ink Chemicals's production).
[preparation of photosensitive polymer combination]
On each embodiment and each comparative example, prepare each raw material of the amount shown in Tables 1 and 2, be dissolved in PGMEA (the third two
Alcohol methyl ether acetate) in, afterwards, filtered using the fluororesin filter that aperture is 0.2 μm, obtain photoresist
Composition.
In addition, when preparing the photosensitive polymer combination of each embodiment and each comparative example, PGMEA (propane diols lists are adjusted
Methyl ether acetate) so that the content (summations of novolak phenolics and polymer or phenolic compounds) of resin component reaches
25%.
In addition, in embodiments, on Examples 1 and 2, in novolak phenolics and the methyl of polymer 1
Further addition methyl ethyl ketone, then add 5 mass parts of pyridine in ethyl ketone solution, after being heated 2 days with 70 DEG C, removal solvent,
After pyridine, prepared using filter filtering.
It is also, molten in the methyl ethyl ketone of novolak phenolics and 3 solution of polymer on embodiment 6~11
Methyl ethyl ketone, 5 mass parts of pyridine are further added in liquid, after being reacted 3 days with 70 DEG C, remove reaction dissolvent, pyridine.
On embodiment 13,14,15, novolak phenolics and polymer solution 4 corresponding with each embodiment,
5th, in 6, methyl ethyl ketone, 5 mass parts of pyridine are further added, after being reacted 3 days with 70 DEG C, remove reaction dissolvent, pyridine.
In addition, on embodiment 3~5,12, comparative example 1~2, it is different from above-described embodiment 1~2,6~11,13~15,
Each dissolution of raw material is set not make novolak phenolics and polymer reaction before PGMEA.
The photosensitive polymer combination obtained as described above is evaluated according to following items.
(sensitivity)
Photosensitive polymer combination obtained above is respectively coated on 4 inches of silicon wafer using spin coater, afterwards,
Using heating plate with 110 DEG C of prebake conditions 2 minutes, the coat film of about 2 μm of thickness is obtained.To the coat film, pass through letterpress strain
Mask (the test chart No.1 of formula commercial firm production:Describing has the residual pattern and pierced pattern of 0.88~50 μm of width), use i lines
Exposure machine (Nikon Corp. produces, NSR-4425i) changes light exposure and is irradiated.
Then, the tetramethylammonium hydroxide aqueous solution using 2.38% causes prebake conditions as developer solution, adjusting developing time
The difference of thickness after rear thickness and development reaches 1.0 μm, carries out immersion development twice, thus dissolves exposure portion and removes, it
Pure water rinsing is utilized afterwards 10 seconds.The value of lowest exposure amount formed with 100 μm of square through-hole pattern is evaluated as feeling
Luminosity.The results are shown in Tables 1 and 2.
(Evaluation of Heat Tolerance)
Photosensitive polymer combination obtained above is respectively coated on 4 inches of silicon wafer using spin coater, afterwards,
Using heating plate with 110 DEG C of prebake conditions 2 minutes, the coat film of about 2 μm of thickness is obtained.To the coat film, pass through letterpress strain
The mask (residual pattern of 1mm) of formula commercial firm production, the Mask Aligner produced using SUSS MicroTec companies
MA8, will be fixed as being exposed for 40 seconds the time for exposure.Then, by being immersed in 2.38% tetramethylammonium hydroxide aqueous solution,
Exposure portion is dissolved and is removed, utilizes pure water rinsing 30 seconds afterwards.At this time, the film decrement in unexposed portion is about 0.02 μm.Close
Unexposed portion after above-mentioned carry out pattern processing, is dried with the condition of 100 DEG C, 1 minute, obtains resin film.
On the resin film, heated with the condition of 140 DEG C, 3 minutes, using metallurgical microscopes, observe resin
Whether the shape of film changes.In addition, the metewand in this experiment is as follows.The results are shown in Tables 1 and 2.
◎:Not it was observed that the change in shape of pattern.
○:Although deformation slightly, the level having no problem in practical application are able to observe that in the corner of pattern.
×:It was observed that the change in shape of pattern.
[table 1]
[table 2]
As shown in Table 1 and Table 2, in embodiments, the resin film of high temperature has been obtained being resistant to.Also, each embodiment
In obtained various photosensitive polymer combinations sensitivity it is also high, be identified that the serviceability as photoresist is high.
In addition, in each embodiment, on embodiment 1 and embodiment 4, even if confirming the condition of heat-resistance test being changed to
150 DEG C, the condition of 3 minutes, also can fully keep pattern form.
In addition, the photosensitive polymer combination on the present embodiment shows high heat resistance, it is believed that it is resistance to show this
One of the reason for hot, is novolak phenolics with having the unsaturated carboxylic acid anhydrides list of cyclic structure containing intramolecular
The specific polymer of member is crosslinked securely by ester bond.
The FT-IR spectrums (Fig. 2 (a)) of above-mentioned polymer 2 and the FT-IR spectrums (Fig. 2 (b)) of following composition are represented in fig. 2,
Said composition is with 25 by polymer 2 and novolak phenolics:75 ratio solvent is in methyl ethyl ketone, in pyridine
In the presence of reacted 1 day with 70 DEG C, remove solvent, the composition obtained after pyridine afterwards.From Fig. 2 (a) compared with Fig. 2 (b),
In Fig. 2 (b), in 1700cm specific to ester bond- 1Nearby observe absworption peak.
I.e., in the present invention, prompted this phenolic resin that there is the unsaturated carboxylic acid anhydrides list of cyclic structure with intramolecular
The key of member contributes to heat resistance.
Industrial applicability
Interaction of the resin combination of the present invention based on phenolic resin with the polymer with specific construction unit,
Can show high-fire resistance, such as when photosensitive polymer combination is made, can balance show well it is excellent
Sensitivity and high-fire resistance.
Also, the resin combination of the present invention is in the purposes in addition to this photosensitive polymer combination, additionally it is possible to
It is suitably applied to require the purposes of heat resistance.
This application claims the priority based on the Japanese Patent Application 2015-163438 proposed in Japan on the 21st of August in 2015,
And its entire disclosure is incorporated in this.
Claims (10)
- A kind of 1. resin combination, it is characterised in that:Comprising phenolic resin and containing with the polymer of the repetitive unit shown in following formula (1),In formula (1), RX、RYSeparately represent the organic group of hydrogen or carbon number 1~3.
- 2. resin combination according to claim 1, it is characterised in that:The weight average molecular weight of the phenolic resin is less than more than 300 20000.
- 3. resin combination according to claim 1 or 2, it is characterised in that:Passed through comprising the acid anhydrides position for possessing the repetitive unit shown in the formula (1) and the phenolic hydroxyl group that the phenolic resin possesses The compound formed by ester bond bonding.
- 4. resin combination according to any one of claim 1 to 3, it is characterised in that:The polymer, which also contains, to be selected from the unit from norbornene-type monomers shown in following formula (2), the source shown in formula (3) Maleimide is derived from shown in unit from indene monomer and formula (8) shown in unit, formula (7) from styrene monomer At least one unit in the unit of class monomer,In formula (2), R1、R2、R3And R4It is separately hydrogen or the organic group of carbon number 1~30, n 0,1 or 2,In formula (3), Ra is separately the organic group of carbon number 1~30, and m is less than more than 05 integer,In formula (7), R5To R11It is separately hydrogen or the organic group of carbon number 1~3,In formula (8), R12It independently is the organic group of hydrogen or carbon number 1~10.
- A kind of 5. resin combination, it is characterised in that:The phenol hydroxyl that acid anhydrides position comprising the polymer containing the repetitive unit shown in following formula (1) possesses with phenolic resin Base forms the ester compounds of ester bond,In formula (1), RX、RYSeparately represent the organic group of hydrogen or carbon number 1~3.
- A kind of 6. photosensitive polymer combination, it is characterised in that:Include the resin combination and emulsion any one of claim 1 to 5.
- 7. photosensitive polymer combination according to claim 6, it is characterised in that:The emulsion is diazonium naphtoquinone compounds.
- A kind of 8. resin film of the resin combination including any one of claim 1 to 5.
- A kind of 9. resin film of the photosensitive polymer combination including described in claim 6 or 7.
- A kind of 10. electronic device for possessing the resin film described in claim 8 or 9.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015163438 | 2015-08-21 | ||
JP2015-163438 | 2015-08-21 | ||
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Cited By (2)
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CN113811556A (en) * | 2019-05-08 | 2021-12-17 | 住友电木株式会社 | Photosensitive resin composition, resin film, and electronic device |
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JP7020018B2 (en) * | 2017-09-15 | 2022-02-16 | 住友ベークライト株式会社 | Rubber composition |
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6416925B1 (en) * | 1997-02-18 | 2002-07-09 | Fuji Photo Film Co., Ltd. | Positive working photosensitive composition |
US6534235B1 (en) * | 2000-10-31 | 2003-03-18 | Kansai Research Institute, Inc. | Photosensitive resin composition and process for forming pattern |
CN1500119A (en) * | 2001-02-26 | 2004-05-26 | 音思万有限公司 | Positive photodefinable compsn. of polycarboxylic acid, phenolic and thermocurable resins |
CN103370347A (en) * | 2010-11-24 | 2013-10-23 | 普罗米鲁斯有限责任公司 | A self-imageable film forming polymer, compositions thereof and devices and structures made therefrom |
CN104216222A (en) * | 2013-05-29 | 2014-12-17 | 住友电木株式会社 | Photosensitive resin composition and electronic device |
CN104216228A (en) * | 2013-05-29 | 2014-12-17 | 住友电木株式会社 | Negative photosensitive resin composition, electronic device and polymer |
JP5672403B1 (en) * | 2014-05-26 | 2015-02-18 | 住友ベークライト株式会社 | Photosensitive resin composition and electronic device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS595243A (en) * | 1982-07-02 | 1984-01-12 | Hitachi Ltd | Radiation sensitive composition and formation of pattern |
US5110700A (en) * | 1990-12-28 | 1992-05-05 | Xerox Corporation | Electrophotographic imaging member |
JPH06305076A (en) * | 1993-04-26 | 1994-11-01 | Hitachi Chem Co Ltd | Production of metal base melamine resin decorative panel |
JP3429852B2 (en) * | 1993-06-04 | 2003-07-28 | シップレーカンパニー エル エル シー | Negative photosensitive composition |
EP0805825B1 (en) * | 1995-01-27 | 2000-08-23 | TYCO Electronics Corporation | Gels from anhydride-containing polymers |
JP3944966B2 (en) * | 1996-09-30 | 2007-07-18 | 日本ゼオン株式会社 | Modified norbornene polymer and method for producing the same |
JP2000122278A (en) * | 1998-10-21 | 2000-04-28 | Okamoto Kagaku Kogyo Kk | Photosensitive composition and photosensitive planographic printing plate |
JP3615981B2 (en) * | 1999-11-24 | 2005-02-02 | クラリアント インターナショナル リミテッド | Photosensitive resin composition |
US6449918B1 (en) | 1999-11-08 | 2002-09-17 | Premark Rwp Holdings, Inc. | Multipanel floor system panel connector with seal |
CN1717630A (en) * | 2003-06-30 | 2006-01-04 | 株式会社新克 | Positive photosensitive composition |
JP2005105209A (en) | 2003-10-01 | 2005-04-21 | Yokohama Rubber Co Ltd:The | Highly damping elastomer composition |
JP4951200B2 (en) * | 2004-08-20 | 2012-06-13 | 東洋インキScホールディングス株式会社 | Color filter |
JP2015166431A (en) * | 2014-03-04 | 2015-09-24 | 日立化成株式会社 | Thermosetting resin composition, prepreg and laminated plate |
JP6287652B2 (en) * | 2014-07-10 | 2018-03-07 | 日油株式会社 | Photosensitive resin composition and use thereof |
JP6528421B2 (en) * | 2015-01-28 | 2019-06-12 | 住友ベークライト株式会社 | Photosensitive resin composition |
-
2016
- 2016-07-21 CN CN201680048062.7A patent/CN107922708A/en active Pending
- 2016-07-21 KR KR1020187007447A patent/KR101927037B1/en active Active
- 2016-07-21 JP JP2016143408A patent/JP6354802B2/en active Active
- 2016-07-21 WO PCT/JP2016/071401 patent/WO2017033633A1/en active Application Filing
- 2016-07-26 TW TW105123570A patent/TWI694098B/en active
-
2018
- 2018-03-19 JP JP2018050528A patent/JP6414352B2/en active Active
- 2018-08-03 JP JP2018146540A patent/JP6468393B2/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6416925B1 (en) * | 1997-02-18 | 2002-07-09 | Fuji Photo Film Co., Ltd. | Positive working photosensitive composition |
US6534235B1 (en) * | 2000-10-31 | 2003-03-18 | Kansai Research Institute, Inc. | Photosensitive resin composition and process for forming pattern |
CN1500119A (en) * | 2001-02-26 | 2004-05-26 | 音思万有限公司 | Positive photodefinable compsn. of polycarboxylic acid, phenolic and thermocurable resins |
CN103370347A (en) * | 2010-11-24 | 2013-10-23 | 普罗米鲁斯有限责任公司 | A self-imageable film forming polymer, compositions thereof and devices and structures made therefrom |
CN104216222A (en) * | 2013-05-29 | 2014-12-17 | 住友电木株式会社 | Photosensitive resin composition and electronic device |
CN104216228A (en) * | 2013-05-29 | 2014-12-17 | 住友电木株式会社 | Negative photosensitive resin composition, electronic device and polymer |
JP5672403B1 (en) * | 2014-05-26 | 2015-02-18 | 住友ベークライト株式会社 | Photosensitive resin composition and electronic device |
Non-Patent Citations (2)
Title |
---|
俞铁铭 等: "《精细有机单元反应与工艺》", 31 January 2015, 浙江大学出版社 * |
段行信: "《实用精细有机合成手册》", 31 January 2000, 化学工业出版社 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113811556A (en) * | 2019-05-08 | 2021-12-17 | 住友电木株式会社 | Photosensitive resin composition, resin film, and electronic device |
CN113811556B (en) * | 2019-05-08 | 2024-05-28 | 住友电木株式会社 | Photosensitive resin composition, resin film and electronic device |
CN110511532A (en) * | 2019-09-25 | 2019-11-29 | 河南工业大学 | A kind of maleic anhydride-acrylate copolymer modified phenolic resin |
CN110511532B (en) * | 2019-09-25 | 2022-03-25 | 河南工业大学 | A kind of maleic anhydride-acrylate copolymer modified phenolic resin |
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TWI694098B (en) | 2020-05-21 |
TW201718719A (en) | 2017-06-01 |
KR20180031804A (en) | 2018-03-28 |
JP2018109196A (en) | 2018-07-12 |
JP6468393B2 (en) | 2019-02-13 |
JP2017039909A (en) | 2017-02-23 |
JP6354802B2 (en) | 2018-07-11 |
JP6414352B2 (en) | 2018-10-31 |
KR101927037B1 (en) | 2018-12-07 |
JP2018172700A (en) | 2018-11-08 |
WO2017033633A1 (en) | 2017-03-02 |
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