CN107917671A - A kind of capacitor film thickness error detection method - Google Patents
A kind of capacitor film thickness error detection method Download PDFInfo
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- CN107917671A CN107917671A CN201711483131.XA CN201711483131A CN107917671A CN 107917671 A CN107917671 A CN 107917671A CN 201711483131 A CN201711483131 A CN 201711483131A CN 107917671 A CN107917671 A CN 107917671A
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- laser
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- metallized film
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- film thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The invention discloses a kind of capacitor film thickness error detection method, including：Metallized film to be detected is laid in detection platform；Metallized film to be detected is blowed；Laser is launched to metallized film to be detected in default Laser emission position；The laser after being reflected by metallized film to be detected whether is collected in default laser collection position detection, when testing result is no, sends carry out information warning.So, metallized film is detected by the reflection of light and whether there is thickness error, when detecting that laser gathers position detection to the laser launched in corresponding Laser emission position, illustrate that metallized film thickness qualities are preferable, when detecting that laser collection position is not detected by the laser of corresponding Laser emission position transmitting, illustrate metallized film thickness abnormity, send information warning at this time, there is beneficial technique effect and significant practical value.
Description
Technical field
The present invention relates to capacitor technology field, more particularly to a kind of capacitor film thickness error detection method.
Background technology
Capacitor is widely used in fields such as power electronics, communications service and rail transports at present, with scientific and technological level
Development, capacitor rely on its good electrical performance and high reliability, become promote above-mentioned industry field update can not or
Scarce electronic component, wherein thin film capacitor have greatly promoted the hair in capacitor technology field due to small, safe
Exhibition.The general preparation method of thin film capacitor is by metallic film and poly- ethyl ester, polypropylene, polystyrene or poly- carbonic acid in the prior art
After the plastic films such as ester is overlapping from both ends, the metallized film electrode of cylindrical shape is wound into, is then placed into capacitor case,
Insulating oil and epoxy resin are injected, then thin film capacitor is obtained after assembling.
Metallized film, should coating became uneven, splashing point, snake, oxide layer occur during evaporation the defects of
Easily appearance loss is excessive after membrane electrode is wound into for class defect film, and product quality is difficult to control, and is even triggered when serious
Capacitor explodes.
The content of the invention
Based on technical problem existing for background technology, the present invention proposes a kind of capacitor film thickness error detection side
Method；
A kind of capacitor film thickness error detection method proposed by the present invention, including：
Metallized film to be detected is laid in detection platform；
Metallized film to be detected is blowed；
Laser is launched to metallized film to be detected in default Laser emission position；
The laser after being reflected by metallized film to be detected whether is collected in default laser collection position detection, works as inspection
When survey result is no, carry out information warning is sent.
Preferably, it is described that metallized film to be detected is blowed, specifically include：By perpendicular to detection platform and with
The wind regime of metallized film homonymy to be detected carries out outlet air to metallized film to be detected.
Preferably, the default Laser emission position and default laser collection position are located at metallized film to be detected
Both sides and formed symmetrically with metallized film to be detected.
Preferably, the default Laser emission position includes the sub- position of n Laser emission；The default laser collection
Position includes n laser and gathers sub- position, wherein n >=2.
Preferably, swashing after being reflected by metallized film to be detected whether is collected in default laser collection position detection
Light, specifically includes：Laser reading devices are set in default laser collection position, to detect whether laser collection position gathers
Laser to after being reflected by metallized film to be detected.
Preferably, the laser collected after being reflected by metallized film to be detected is not detected in default laser collection position
Afterwards, further include：Metallized film to be detected is marked.
The present invention blows metallized film to be detected by the way that metallized film to be detected is laid in detection platform
Wind, launches laser in default Laser emission position to metallized film to be detected, is in default laser collection position detection
The no laser collected after being reflected by metallized film to be detected, when testing result is no, sends carry out information warning, such as
This, detects metallized film by the reflection of light and whether there is thickness error, when detect laser collection position detection to
During the laser of corresponding Laser emission position transmitting, illustrate that metallized film thickness qualities are preferable, when detecting laser collection
Position is not detected by the laser of corresponding Laser emission position transmitting, is illustrated metallized film thickness abnormity, is sent at this time
Information warning, has beneficial technique effect and significant practical value.
Brief description of the drawings
Fig. 1 is a kind of flow diagram of capacitor film thickness error detection method proposed by the present invention.
Embodiment
Reference Fig. 1, a kind of capacitor film thickness error detection method proposed by the present invention, including：
Metallized film to be detected is laid in detection platform.
In concrete scheme, by way of mechanically or manually by metallized film to be detected it is smooth be layered on default light
In sliding and clean detection platform.
Metallized film to be detected is blowed, is specifically included：By perpendicular to detection platform and with metal to be detected
The wind regime for changing film homonymy carries out outlet air to metallized film to be detected.
In concrete scheme, by perpendicular to detection platform and with the wind regime of metallized film homonymy to be detected to be detected
Metallized film is blowed, and on the one hand can blow dust and impurity on metallized film to be detected off, avoids dust and miscellaneous
Matter influences the reflection of light, so that the drop point of reflected light has an impact；On the other hand, metallized film to be detected and inspection are made by blowing
Survey platform to be more bonded, make metallization thin surface to be detected more smooth, so as to avoid metallization to be detected thin because of fold
There is error in the presence of the drop point of reflected light is caused.
Laser, the default Laser emission position are launched to metallized film to be detected in default Laser emission position
Including the sub- position of n Laser emission.
In concrete scheme, laser emitter is preset in multiple Laser emission positions, is simultaneously emitted by laser to gold to be detected
Categoryization film launches laser.
The laser after being reflected by metallized film to be detected whether is collected in default laser collection position detection, works as inspection
When survey result is no, carry out information warning is sent, metallized film to be detected is marked.Wherein, the default laser
Transmitting position and default laser collection position are located at metallized film both sides to be detected and are formed with metallized film to be detected
The symmetrical default laser collection position includes n laser and gathers sub- position, wherein n >=2.
In concrete scheme, laser emitter default with multiple Laser emission positions, which corresponds, sets laser to collect
The center line of metallized film to be detected is passed through axisymmetricly in the position of device, laser collector and laser emitter, to detect
The laser reflected by metallized film to be detected, when detecting the laser of corresponding Laser emission transmitting, illustrates that metallization is thin
Film thickness quality is preferable, when detect laser collection position be not detected by corresponding Laser emission position transmitting laser
When, illustrate metallized film thickness abnormity.
Present embodiment carries out metallized film to be detected by the way that metallized film to be detected is laid in detection platform
Blowing, launches laser in default Laser emission position to metallized film to be detected, and position detection is gathered in default laser
The laser after being reflected by metallized film to be detected whether is collected, when testing result is no, sends carry out information warning, such as
This, detects metallized film by the reflection of light and whether there is thickness error, when detect laser collection position detection to
During the laser of corresponding Laser emission position transmitting, illustrate that metallized film thickness qualities are preferable, when detecting laser collection
Position is not detected by the laser of corresponding Laser emission position transmitting, is illustrated metallized film thickness abnormity, is sent at this time
Information warning, has beneficial technique effect and significant practical value.
The foregoing is only a preferred embodiment of the present invention, but protection scope of the present invention be not limited thereto,
Any one skilled in the art the invention discloses technical scope in, technique according to the invention scheme and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (6)
- A kind of 1. capacitor film thickness error detection method, it is characterised in that including：Metallized film to be detected is laid in detection platform；Metallized film to be detected is blowed；Laser is launched to metallized film to be detected in default Laser emission position；The laser after being reflected by metallized film to be detected whether is collected in default laser collection position detection, when detection is tied When fruit is no, carry out information warning is sent.
- 2. capacitor film thickness error detection method according to claim 1, it is characterised in that described to gold to be detected Categoryization film is blowed, and specifically includes：By perpendicular to detection platform and with the wind regime pair of metallized film homonymy to be detected Metallized film to be detected carries out outlet air.
- 3. capacitor film thickness error detection method according to claim 1, it is characterised in that the default laser Transmitting position and default laser collection position are located at metallized film both sides to be detected and are formed with metallized film to be detected Symmetrically.
- 4. capacitor film thickness error detection method according to claim 3, it is characterised in that the default laser Transmitting position includes the sub- position of n Laser emission；The default laser collection position includes n laser and gathers sub- position, its Middle n >=2.
- 5. capacitor film thickness error detection method according to claim 1, it is characterised in that adopted in default laser Whether collection position detection collects the laser after being reflected by metallized film to be detected, specifically includes：Gathered in default laser Position sets laser reading devices, to detect whether laser collection position is collected by after metallized film to be detected reflection Laser.
- 6. capacitor film thickness error detection method according to claim 1, it is characterised in that adopted in default laser After collection position does not detect the laser collected after being reflected by metallized film to be detected, further include：To metallized film to be detected It is marked.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711483131.XA CN107917671A (en) | 2017-12-29 | 2017-12-29 | A kind of capacitor film thickness error detection method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711483131.XA CN107917671A (en) | 2017-12-29 | 2017-12-29 | A kind of capacitor film thickness error detection method |
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| CN107917671A true CN107917671A (en) | 2018-04-17 |
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| CN201711483131.XA Pending CN107917671A (en) | 2017-12-29 | 2017-12-29 | A kind of capacitor film thickness error detection method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108490137A (en) * | 2018-04-28 | 2018-09-04 | 安徽普和电子有限公司 | A kind of intelligent capacitor film precision detection system |
| CN108593851A (en) * | 2018-04-28 | 2018-09-28 | 安徽普和电子有限公司 | A kind of capacitor film automation precision detection system |
| CN108760626A (en) * | 2018-04-28 | 2018-11-06 | 安徽普和电子有限公司 | A kind of capacitor film quality determining method |
| CN108956635A (en) * | 2018-09-04 | 2018-12-07 | 邯郸学院 | A kind of film quality detection device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103964838A (en) * | 2013-01-28 | 2014-08-06 | 三菱综合材料株式会社 | Dielectric thin film-forming composition and method of forming dielectric thin film |
| CN205175922U (en) * | 2015-11-10 | 2016-04-20 | 温岭市华航电子科技有限公司 | Metallized film detects platform for condenser |
| US20170003116A1 (en) * | 2015-06-30 | 2017-01-05 | Korea Research Institute Of Standards And Science | Apparatus for real-time non-contact non-destructive thickness measurement using terahertz wave |
| CN106643528A (en) * | 2016-09-28 | 2017-05-10 | 铜陵市铜创电子科技有限公司 | Metalized film thickness observation device |
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2017
- 2017-12-29 CN CN201711483131.XA patent/CN107917671A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103964838A (en) * | 2013-01-28 | 2014-08-06 | 三菱综合材料株式会社 | Dielectric thin film-forming composition and method of forming dielectric thin film |
| US20170003116A1 (en) * | 2015-06-30 | 2017-01-05 | Korea Research Institute Of Standards And Science | Apparatus for real-time non-contact non-destructive thickness measurement using terahertz wave |
| CN205175922U (en) * | 2015-11-10 | 2016-04-20 | 温岭市华航电子科技有限公司 | Metallized film detects platform for condenser |
| CN106643528A (en) * | 2016-09-28 | 2017-05-10 | 铜陵市铜创电子科技有限公司 | Metalized film thickness observation device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108490137A (en) * | 2018-04-28 | 2018-09-04 | 安徽普和电子有限公司 | A kind of intelligent capacitor film precision detection system |
| CN108593851A (en) * | 2018-04-28 | 2018-09-28 | 安徽普和电子有限公司 | A kind of capacitor film automation precision detection system |
| CN108760626A (en) * | 2018-04-28 | 2018-11-06 | 安徽普和电子有限公司 | A kind of capacitor film quality determining method |
| CN108956635A (en) * | 2018-09-04 | 2018-12-07 | 邯郸学院 | A kind of film quality detection device |
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Application publication date: 20180417 |