CN107807481B - Wiring structure of display substrate - Google Patents
Wiring structure of display substrate Download PDFInfo
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- CN107807481B CN107807481B CN201711072694.XA CN201711072694A CN107807481B CN 107807481 B CN107807481 B CN 107807481B CN 201711072694 A CN201711072694 A CN 201711072694A CN 107807481 B CN107807481 B CN 107807481B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The invention discloses a wiring structure of a display substrate, wherein the wiring structure comprises: the device comprises a curing pad, a curing wire, a test pad and an active switch; the curing pad is arranged on the array substrate of the display panel and is used for receiving the common voltage; the curing wire is connected with the curing pad and used for transmitting the public voltage to the display panel; the test pad is arranged on the array substrate and used for receiving test voltage; the active switch is connected with the test pad and the curing pad corresponding to the adjacent display panel; when the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel. When the corresponding curing pads of the adjacent display panels are communicated, whether the curing wiring is disconnected or not can be judged through the measuring device, so that the reason that the pre-dip angle curing cannot be performed is rapidly determined.
Description
Technical Field
The invention relates to the technical field of display, in particular to a wiring structure of a display substrate.
Background
Currently, an alignment film is required to determine an initial orientation angle (i.e., a pretilt angle) of liquid crystal molecules in manufacturing a liquid crystal display panel, and a rubbing alignment film method is generally used to align the liquid crystal molecules. However, the rubbing alignment requires highly precise control of the process flow, and the operation of the process flow is not easy to control. In order to ameliorate the above disadvantages of rubbing alignment, polymeric photoalignment techniques may be employed. The photoalignment technology needs to dope a reactive monomer (monomer) into a liquid crystal layer, and apply a common voltage (also called a curing voltage) to the liquid crystal layer by using a display panel, and irradiate the liquid crystal layer with ultraviolet light through a Mask (Mask) under the effect of the curing voltage, so that the reactive monomer is polymerized and cured, and a polymer layer is formed on the substrates at both sides of the liquid crystal layer at the same time, so that the liquid crystal of the liquid crystal layer has a certain pretilt angle.
In the existing photoalignment technology, a routing structure needs to be preset around a display substrate, the routing structure reserves a curing pad and a curing routing, and the curing pad is connected with a display panel in the display substrate through the curing routing and is used for receiving a common voltage. If a certain curing trace is disconnected, voltage cannot be transmitted to the display panel, and curing cannot be performed to form a pretilt angle. However, the conventional trace structure for curing cannot detect whether the curing trace is broken. Therefore, it is necessary to provide a wiring structure of a display substrate to solve the above-mentioned problems.
Disclosure of Invention
The embodiment of the invention provides a wiring structure of a display substrate, which aims at conveniently detecting whether a curing wiring is disconnected or not so as to judge the reason that the curing of a pretilt angle cannot be performed.
In one aspect, the present invention provides a routing structure of a display substrate, where the display substrate includes at least two display panels, including:
At least two curing pads arranged on the array substrate of the display panel and used for receiving common voltage, wherein one curing pad is used as a main curing pad, and the other curing pads are used as auxiliary curing pads;
A curing trace connected to the curing pad for transmitting the common voltage to the display panel;
The test pad is arranged on the array substrate and is used for receiving test voltage;
the active switches are connected with the test pads and the curing pads corresponding to the adjacent display panels;
when the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel.
In another aspect, the present invention further provides a wiring structure of a display substrate, where the display substrate includes at least two display panels, including:
The curing pad is arranged on the array substrate of the display panel and is used for receiving the common voltage;
A curing trace connected to the curing pad for transmitting the common voltage to the display panel;
The test pad is arranged on the array substrate and is used for receiving test voltage;
an active switch connected with the test pad and the curing pad corresponding to the adjacent display panel;
when the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel.
In the wiring structure of the present invention, the test pad and the curing pad are disposed on the same side of the display panel.
In the wiring structure of the present invention, the curing pad includes a first curing pad and a second curing pad connected by the curing wiring, and the first curing pad and the second curing pad are disposed on two sides of the display panel.
In the wiring structure of the present invention, the test pad includes a first test pad and a second test pad, the first test pad and the first curing pad are located on the same side of the display panel, and the second test pad and the second curing pad are located on the same side of the display panel.
In the wiring structure of the invention, the active switch comprises a control end, a first connecting end and a second connecting end; the control end is connected with the first test pad, the first connecting end is connected with the first curing pad, and the second connecting end is connected with the second curing pad corresponding to the adjacent display panel.
In the wiring structure of the invention, the display panel further comprises a test wiring, and the active switches corresponding to the adjacent display panels are connected through the test wiring.
In the wiring structure of the present invention, the test wiring and the curing wiring are located at two sides of the display panel.
In the wiring structure of the invention, the curing pad and the test pad are made of metal materials; the metal materials of the curing pad and the test pad are different.
In the wiring structure of the present invention, the active switch includes a thin film transistor.
The wiring structure of the display substrate provided by the embodiment of the invention comprises: the device comprises a curing pad, a curing wire, a test pad and an active switch; the curing pad is arranged on the array substrate of the display panel and is used for receiving the common voltage; the curing wire is connected with the curing pad and used for transmitting the public voltage to the display panel; the test pad is arranged on the array substrate and used for receiving test voltage; the active switch is connected with the test pad and the curing pad corresponding to the adjacent display panel; when the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel. When the corresponding curing pads of the adjacent display panels are communicated, the curing wires are detected through an external measuring device, so that whether the curing wires are disconnected or not is judged, and the reason that the pre-dip angle curing cannot be performed is rapidly determined.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a layout structure of a display substrate according to an embodiment of the invention;
FIG. 2 is a schematic diagram of a layout structure of a display substrate according to an embodiment of the invention;
FIG. 3 is a schematic view of a portion of the trace structure of the display substrate shown in FIG. 1;
FIG. 4 is another schematic diagram of the trace structure of the display substrate shown in FIG. 3;
Fig. 5 is a schematic diagram of a trace structure of the display substrate shown in fig. 3.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The terms of directions used in the present invention, such as "up", "down", "front", "back", "left", "right", "inside", "outside", "side", etc., refer only to the directions of the attached drawings. Accordingly, directional terminology is used to describe and understand the invention and is not limiting of the invention. In addition, in the drawings, structures similar or identical to those of the drawings are denoted by the same reference numerals.
Referring to fig. 1 and fig. 2, fig. 1 is a schematic diagram of a layout structure of a display substrate according to an embodiment of the invention, and fig. 2 is another schematic diagram of a layout structure of a display substrate according to an embodiment of the invention. The display substrate 100 is a large mother substrate, and the display substrate 100 may be cut into a plurality of display panels. In one embodiment, when fabricating the display substrate 100, a plurality of thin film transistor arrays are often fabricated on a large first substrate 111, and the first substrate 111 may be, for example, a glass substrate, and corresponds to the first glass substrate 111; a plurality of color film arrays are simultaneously fabricated on another large Zhang Dier substrate 112, the second substrate 112 may be, for example, a glass substrate, and the second glass substrate 112 is corresponding to the first glass substrate 111, and at least one display panel 110 may be fabricated by fastening the first glass substrate 111 and the second glass substrate 112 and pouring liquid crystal molecules, so as to increase the fabrication efficiency of the display panel 110.
For the sake of convenience in understanding the specific structure of the display substrate 100, fig. 2 is a schematic diagram of the structure of the second glass substrate 112, which is not shown. In the display substrate 100 shown in fig. 1 and 2, the display substrate 100 includes four display panels 110. It is understood that in other embodiments, the number of display panels 110 included in the display substrate 100 may be other numbers, which is not particularly limited herein.
In this embodiment, the display panel 110 is a liquid crystal display panel. In order to align the liquid crystal molecules in the display panel 110 by using the photoalignment technique, a routing structure is often disposed around the display panel 110. Wherein the routing structure comprises: a curing pad 120, curing traces 130, test pads 140, and an active switch 150.
The wiring structure will be described in detail with reference to fig. 1 to 5 of the drawings, and is specifically as follows:
As shown in fig. 1, the curing pad 120 is disposed on the array substrate of the display panel 110. The curing pad 120 is configured to receive a common voltage, where the common voltage is a preset voltage, and the liquid crystal of the liquid crystal layer has a certain pretilt angle through a photoalignment technology under the action of the preset voltage. The curing trace 130 is disposed on the array substrate. The curing trace 130 is connected to the curing pad 120 and the display panel 110, and is used for transmitting the common voltage received by the curing pad 120 to the display panel 110. The test pad 140 is disposed on the array substrate, and the test pad 140 is configured to receive a test voltage. The active switch 150 is connected to the test pad 140 and the corresponding curing pad 120 of the adjacent display panel 110. The active switch 150 may perform a closing operation when receiving a predetermined signal, for example, a high signal.
When the test pad 140 receives the test voltage, the active switch 150 connects the curing pads 120 corresponding to the adjacent display panels 110, so that the curing trace 130 can be detected by an external detection device, and thus whether the curing trace 130 is disconnected can be quickly known.
In one embodiment, the external test device may be a multimeter. It will be appreciated that in other embodiments, the external detecting device may be other devices for detecting whether the line is disconnected, which is not particularly limited herein.
In one embodiment, the active switches are TFTs (Thin Film Transistor, thin film transistors), and the number of active switches may be plural.
In one embodiment, the test pad 140 and the curing pad 120 are disposed on the same side of the display panel 110. Specifically, referring to fig. 3, fig. 3 is a schematic view of a portion of the trace structure of the display substrate shown in fig. 1. Only one display panel 110 and its corresponding trace structure are shown in fig. 3. One skilled in the art can easily know the other display panels 110 and the corresponding wiring structures according to the display panels 110 and the corresponding wiring structures shown in fig. 3.
In the display panel 110 and the corresponding trace structure shown in fig. 3, the curing pad 120 includes a first curing pad 121 and a second curing pad 122. The first and second curing pads 121 and 122 are disposed at both sides of the display panel 110, and the first and second curing pads 121 and 122 are connected through the curing trace 130.
The test pad 140 includes a first test pad 141 and a second test pad 142. The first test pad 141 and the first curing pad 121 are located on the same side of the display panel 110, and the second test pad 142 and the second curing pad 122 are located on the same side of the display panel 110.
In addition, in order to simplify the process design, the first and second curing pads 121 and 122 are disposed opposite to the display panel 110; the first and second test pads 141 and 142 are disposed opposite to the display panel 110.
It is understood that in other embodiments, the test pad 140 may include only the first test pad 141. That is, the number of the test pads 140 corresponding to each display panel 110 is one. Of course, the number of the test pads 140 corresponding to each display panel 110 may be three or more, and the number of the test pads 140 is not limited herein.
The active switch 150 includes a control terminal 151, a first connection terminal 152, and a second connection terminal 153. The control end 151 is connected to the first test pad 141; the first connection end 152 is connected to the first curing pad 121; the second connection end 153 is connected to the second curing pad 122 corresponding to the adjacent display panel 110.
In this embodiment, the adjacent display panels 110 refer to adjacent display panels 110 in the same row or column. For example, as shown in fig. 2, in the display substrate 100 shown in fig. 2, two display panels 110 in the same row are adjacent display panels, and two display panels 110 in the same column are also adjacent display panels. That is, the adjacent display panels 110 do not include the diagonally adjacent case.
For example, in the second display panel 110 in the first row in fig. 1, the first connection 152 of the active switch 150 is connected to the first curing pad 121, and the second connection 153 of the active switch is connected to the second curing pad 122 of the first display panel 110 in the first row. Thus, when the active switch 150 is in the on state, the first curing pad 121 corresponding to the second display panel 110 in the first column is connected to the second curing pad 122 in the first display panel 110 in the first column, that is, the curing pads in the two display panels 110 in the first column are connected to each other, which facilitates the subsequent detection of whether the curing trace 130 is disconnected by using an external detection device.
Specifically, as shown in fig. 4, fig. 4 is another schematic structural diagram of the trace structure of the display substrate shown in fig. 3. In the wiring structure of the display substrate shown in fig. 4, the active switch 150 may be, for example, a thin film transistor or other transistors. Taking a thin film transistor as an example, the control terminal 151 of the active switch 150 is a gate of the thin film transistor, the first connection terminal 152 is a drain of the thin film transistor, and the second connection terminal 153 is a source of the thin film transistor.
In one embodiment, as shown in fig. 1-3, the trace structure further includes a test trace 160. The active switches 150 corresponding to the adjacent display panels 110 are connected through the test wires 160, and specifically, in the active switches 150 corresponding to the adjacent display panels 110, the control ends 151 thereof are connected together through the test wires 160. In this way, when the first test pad 141 corresponding to the first display panel 110 in the first column receives the test voltage, the test voltage can be transmitted to the control ends of the plurality of active switches 150 corresponding to the two display panels 110 in the first column through the test trace 160, so as to open the plurality of active switches 150, so that the curing pads 120 and the curing traces 130 in the two adjacent display panels 110 in the first column are in communication with each other.
In one embodiment, as shown in fig. 1, the test traces 160 and the curing traces 130 are located on both sides of the display panel 110 in order to prevent signal interference while optimizing space utilization on the display substrate 100. Of course, in other embodiments, the test traces 160 and the curing traces 130 may be disposed on the same side or adjacent sides of the display panel 110, which is not particularly limited herein.
In one embodiment, as shown in fig. 5, the number of the curing pads 120 in the trace structure is at least two. In order to save the curing cost and to limit the limited space on the display substrate 100, the number of curing pads 120 is generally set to two. One of the two curing pads 120 serves as a primary curing pad and the other serves as a secondary curing pad. When the main curing pad is damaged, the auxiliary curing pad may be used for curing, thereby improving the curing efficiency of the display substrate 100.
It is understood that when the number of the curing pads 120 is two, the number of the curing traces 130 and the active switches 150 is two accordingly. Both active switches 150 are connected to the test pad 140. The active switches 150 corresponding to the adjacent display panels 110 are connected together through the test traces 160.
In addition, in order to transmit the voltage signal, the curing pad 120, the test pad 140, the curing trace 130 and the test trace 160 are all made of metal materials. In one embodiment, the metal materials of the curing pad 120 and the test pad 140 are different.
In the trace structure of the display substrate provided in this embodiment, the trace structure includes a curing pad 120, a curing trace 130, a test pad 140 and an active switch 150. The curing pad 120 is disposed on the array substrate of the display panel 110 to receive a common voltage; the curing trace 130 is connected with the curing pad 120 to transmit a common voltage to the display panel 110; the test pad 140 is disposed on the array substrate to receive a test voltage; the active switch 150 is connected to the test pad 140 and the corresponding curing pad 120 of the adjacent display panel 110; when the test pad 140 receives the test voltage, the active switch 150 connects the curing pad 120 corresponding to the adjacent display panel 110. When the corresponding curing pads 120 of the adjacent display panels 110 are connected, the curing traces 130 are detected by an external measuring device, so as to determine whether the curing traces 130 are disconnected or not, and quickly determine the reason why the pre-tilt curing cannot be performed.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (5)
1. A wiring structure of a display substrate, the display substrate including at least two display panels, comprising:
two curing pads arranged on the array substrate of the display panel and used for receiving common voltage, wherein one curing pad is used as a main curing pad, and the other curing pads are used as auxiliary curing pads;
two curing wires connected with the curing pads for transmitting the common voltage to the display panel, wherein one curing wire is connected with one curing pad;
the curing pads comprise a first curing pad and a second curing pad which are connected through the curing wire, and the first curing pad and the second curing pad are arranged on two sides of the display panel;
the test pad is arranged on the array substrate and used for receiving test voltage, the test pad comprises a first test pad and a second test pad, the first test pad and the first curing pad are positioned on the same side of the display panel, and the second test pad and the second curing pad are positioned on the same side of the display panel;
The active switches are connected with the test pads and the curing pads corresponding to the adjacent display panels, and each active switch comprises a control end, a first connecting end and a second connecting end; the control end is connected with the first test pad, the first connecting end is connected with the first curing pad, and the second connecting end is connected with a second curing pad corresponding to the adjacent display panel;
when the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel.
2. A wiring structure of a display substrate, the display substrate including at least two display panels, comprising:
The curing pad is arranged on the array substrate of the display panel and is used for receiving the common voltage;
A curing trace connected to the curing pad for transmitting the common voltage to the display panel;
The test pad is arranged on the array substrate and is used for receiving test voltage;
an active switch connected with the test pad and the curing pad corresponding to the adjacent display panel;
When the test pad receives the test voltage, the active switch communicates the curing pad corresponding to the adjacent display panel;
The test pad and the curing pad are arranged on the same side of the display panel;
the curing pads comprise a first curing pad and a second curing pad which are connected through the curing wire, and the first curing pad and the second curing pad are arranged on two sides of the display panel;
The test pad comprises a first test pad and a second test pad, the first test pad and the first curing pad are positioned on the same side of the display panel, the second test pad and the second curing pad are positioned on the same side of the display panel, and the curing pad and the test pad are made of metal materials; the metal materials of the curing pad and the test pad are different;
The active switch comprises a control end, a first connecting end and a second connecting end; the control end is connected with the first test pad, the first connecting end is connected with the first curing pad, and the second connecting end is connected with the second curing pad corresponding to the adjacent display panel.
3. The routing structure of the display substrate according to claim 2, further comprising a test routing through which the active switches corresponding to the adjacent display panels are connected.
4. A trace structure for a display substrate according to claim 3, wherein the test trace and the curing trace are located on both sides of the display panel.
5. The routing structure of claim 2, wherein the active switch comprises a thin film transistor.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711072694.XA CN107807481B (en) | 2017-11-03 | 2017-11-03 | Wiring structure of display substrate |
| PCT/CN2017/117324 WO2019085196A1 (en) | 2017-11-03 | 2017-12-20 | Wiring structure of display substrate |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711072694.XA CN107807481B (en) | 2017-11-03 | 2017-11-03 | Wiring structure of display substrate |
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| CN107807481A CN107807481A (en) | 2018-03-16 |
| CN107807481B true CN107807481B (en) | 2024-06-28 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108831359B (en) * | 2018-06-22 | 2020-08-11 | 惠科股份有限公司 | Display panel and display device thereof |
| CN109031723B (en) * | 2018-08-22 | 2021-06-04 | 惠科股份有限公司 | Array substrate, liquid crystal module and liquid crystal display equipment |
| CN109637405B (en) * | 2018-12-05 | 2021-04-06 | 惠科股份有限公司 | Method and device for testing array substrate and storage medium |
| CN110189671B (en) * | 2019-06-26 | 2022-02-01 | 滁州惠科光电科技有限公司 | Box-formed test circuit, array substrate and liquid crystal display device |
| CN112068375B (en) * | 2020-09-23 | 2022-10-11 | 北海惠科光电技术有限公司 | Mother substrate and display panel |
| CN112987352A (en) * | 2021-03-02 | 2021-06-18 | 深圳市华星光电半导体显示技术有限公司 | Testing device and testing method for array substrate |
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| CN107037637A (en) * | 2017-06-13 | 2017-08-11 | 深圳市华星光电技术有限公司 | Liquid crystal light orientation panel Wiring structure and liquid crystal display panel light alignment method |
| CN107068029A (en) * | 2017-06-20 | 2017-08-18 | 惠科股份有限公司 | Test circuit and test method of display panel |
| CN207366904U (en) * | 2017-11-03 | 2018-05-15 | 惠科股份有限公司 | Wiring structure of display substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107807481A (en) | 2018-03-16 |
| WO2019085196A1 (en) | 2019-05-09 |
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