CN107419329B - Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond - Google Patents
Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond Download PDFInfo
- Publication number
- CN107419329B CN107419329B CN201710363710.4A CN201710363710A CN107419329B CN 107419329 B CN107419329 B CN 107419329B CN 201710363710 A CN201710363710 A CN 201710363710A CN 107419329 B CN107419329 B CN 107419329B
- Authority
- CN
- China
- Prior art keywords
- diamond
- single crystal
- crystal diamond
- situ
- nano
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/186—Epitaxial-layer growth characterised by the substrate being specially pre-treated by, e.g. chemical or physical means
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/20—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer
- C30B25/205—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer the substrate being of insulating material
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/04—Diamond
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Carbon And Carbon Compounds (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
一种单晶金刚石表面原位n型半导体化全碳结构的制备方法,属于半导体基础电路用基体材料制备领域。工艺步骤为:a.利用机械抛光将单晶金刚石抛光至表面粗糙度低于1nm;b.酸洗并采用H2等离子体原位刻蚀,使籽晶表面形成微观形核点;c.将单晶金刚石基底置于钼托微槽内,样品表面至槽高度与样品和微槽间隙比例保持在0.5‑0.7之间;d.以单晶金刚石为籽晶,通过控制沉积工艺抑制含碳基团的空间传输与表面扩散,在单晶金刚石表面sp3结构下抑制抽取反应,依赖单晶金刚石的台阶与缺陷区,实现超纳米金刚石形核与生长;同时掺氮实现超纳米金刚石的n型掺杂,最终在未改变单晶金刚石籽晶原始条件下实现表面原位n型导电超纳米金刚石薄层的制备,形成一种全碳结构的金刚石半导体。
The invention discloses a method for preparing an in-situ n-type semiconducting all-carbon structure on the surface of a single crystal diamond, which belongs to the field of preparing base materials for semiconductor basic circuits. The process steps are: a. using mechanical polishing to polish the single crystal diamond until the surface roughness is lower than 1nm; b. pickling and using H2 plasma in-situ etching to form microscopic nucleation points on the surface of the seed crystal; c. The single crystal diamond substrate is placed in the microgroove of the molybdenum support, and the ratio between the height of the sample surface to the groove and the gap between the sample and the microgroove is kept between 0.5-0.7; d. Using single crystal diamond as the seed crystal, the carbon-containing matrix is suppressed by controlling the deposition process The spatial transmission and surface diffusion of clusters suppress the extraction reaction under the sp 3 structure on the surface of single crystal diamond, relying on the steps and defect areas of single crystal diamond to realize the nucleation and growth of ultra-nano-diamond; at the same time, nitrogen doping realizes the n-type of ultra-nano-diamond Doping, and finally realize the preparation of in-situ n-type conductive ultra-nano-diamond thin layer on the surface without changing the original conditions of the single crystal diamond seed crystal, forming a diamond semiconductor with an all-carbon structure.
Description
技术领域:Technical field:
本发明涉及半导体基础电路用基体材料制备领域;特别是在单晶金刚石表面利用等离子刻蚀与气相沉积,在金刚石表面直接原位半导体化形成n型超纳米金刚石薄层,得到一种全碳结构的金刚石半导体。The invention relates to the field of base material preparation for semiconductor basic circuits; in particular, plasma etching and vapor deposition are used on the surface of single crystal diamond to directly in-situ semiconductorize the surface of the diamond to form an n-type ultra-nano-diamond thin layer to obtain an all-carbon structure diamond semiconductor.
技术背景technical background
金刚石具有更宽的带隙(5.5eV)、高载流子迁移率(特别是空穴迁移率比单晶Si、GaAs高得多)、低介电常数(5.7)、极高的Johnson指标和Keyse指标(均高于Si和GaAs十倍以上)等等,被誉为高频高功率以及高温耐压领域的终极宽禁带半导体,也被称为第四代半导体。且因其具有的极佳的稳定性而使得半导体器件能够在极端环境下正常工作。然而,金刚石中碳原子半径和晶格常数较小,禁带宽度大,因此许多杂质原子在金刚石中溶解度很低,且杂质的电离能较高制约了金刚石半导体的发展。掺入金刚石膜中的n型杂质能级深,导致载流子浓度低,迁移率小,电阻率高,目前离子掺杂仍面临诸多问题。关于n型金刚石的制备方法多采用CVD法和离子注入的方法,相关研究取得了一定进展,但效果仍不理想,且破坏了金刚石本身晶体完整性。为此学者们开始探索并研究了氮掺杂超纳米金刚石的方式实现n型导电(Phys.Rev.B.74,235434(2006)及其导电机制(Phys.Rev.B.70,125412(2004))。由于是超纳米金刚石中存在大量的晶界,且氮在晶界区域引起了渗流途径而提高了n型导电,随着氮含量的增加提高了载流子迁移率和扩宽能带而使电导率绝对值提高。Neda等用氮掺杂超纳米金刚石实现了n型导电而制备了压阻传感器(DiamondRelat.Mater.70,145150(2016);Abdelrahman等使用氮掺杂n型超纳米金刚石制得了紫外探测器(Appl.Phys.A.123,167(2017))。可见氮掺杂n型超纳米金刚石成为了金刚石n型半导体化的有效方法,且其性能已达到了硼掺杂金刚石的水平。但是,当前氮掺杂n型超纳米金刚石薄膜制备均采用异质基底,如Si等,往往由于衬底低的热导率与低的耐压性,使得金刚石优良的电学性能难以发挥,限制了超纳米金刚石优异性能的充分应用。与此同时,在异质衬底上生长纳米金刚石甚至超纳米金刚石,为提高形核率往往需要采用机械研磨或偏压等方法,使得生长工艺复杂,且易引起基片的应力与变形。Diamond has a wider band gap (5.5eV), high carrier mobility (especially hole mobility is much higher than single crystal Si and GaAs), low dielectric constant (5.7), extremely high Johnson index and Keyse indicators (all ten times higher than Si and GaAs), etc., are known as the ultimate wide bandgap semiconductor in the field of high frequency, high power and high temperature withstand voltage, also known as the fourth generation semiconductor. And because of its excellent stability, semiconductor devices can work normally in extreme environments. However, the radius and lattice constant of carbon atoms in diamond are small, and the band gap is large. Therefore, the solubility of many impurity atoms in diamond is very low, and the high ionization energy of impurities restricts the development of diamond semiconductors. The n-type impurities doped into the diamond film have a deep energy level, resulting in low carrier concentration, low mobility, and high resistivity. At present, ion doping still faces many problems. The preparation methods of n-type diamond mostly adopt CVD method and ion implantation method, and the relevant research has made some progress, but the effect is still not ideal, and the crystal integrity of diamond itself is destroyed. For this reason, scholars have begun to explore and study the way of nitrogen-doped ultra-nanodiamond to realize n-type conduction (Phys. )).Because there are a large number of grain boundaries in the ultra-nanodiamond, and the nitrogen causes the percolation pathway in the grain boundary area to improve the n-type conduction, and the carrier mobility and the broadened energy band are improved with the increase of the nitrogen content The absolute value of the conductivity is increased. Neda et al. used nitrogen-doped ultra-nanodiamond to realize n-type conductivity and prepared a piezoresistive sensor (DiamondRelat.Mater.70, 145150 (2016); Abdelrahman et al. used nitrogen-doped n-type ultra-nano Diamond has made an ultraviolet detector (Appl.Phys.A.123,167 (2017)). It can be seen that nitrogen-doped n-type ultra-nanodiamond has become an effective method for diamond n-type semiconductorization, and its performance has reached that of boron-doped diamond. However, the current preparation of nitrogen-doped n-type ultra-nano-diamond films all use heterogeneous substrates, such as Si, etc., often due to the low thermal conductivity and low pressure resistance of the substrate, it is difficult to exert the excellent electrical properties of diamond. Limiting the full application of the excellent properties of ultra-nano-diamond. At the same time, growing nano-diamond or even ultra-nano-diamond on heterogeneous substrates often requires mechanical grinding or biasing to increase the nucleation rate, making the growth process complicated. And it is easy to cause stress and deformation of the substrate.
发明内容Contents of the invention
为解决上述问题,本发明的目的在于提出一种基于高导热单晶金刚石为基底形核生长超纳米n型金刚石,从而形成一种兼具良好导热与导电特性的全金刚石碳结构半导体。采用机械抛光将单晶金刚石抛光达到极低粗糙度后,通过酸洗将其置于钼托微槽内,保证样品与槽保持一定几何学关系,采用H2等离子体原位刻蚀使籽晶表面形成微观形核点。随后通过控制沉积工艺,在不改变金刚石籽晶原始条件下依赖单晶金刚石刻蚀后的台阶与缺陷区,实现超纳米金刚石形核的同时掺氮实现n型掺杂生长,满足表面原位n型导电超纳米金刚石薄层的制备,形成一种全碳结构的金刚石半导体。In order to solve the above problems, the object of the present invention is to propose a method of nucleation and growth of supernano n-type diamond based on high thermal conductivity single crystal diamond, thereby forming an all-diamond carbon structure semiconductor with good thermal conductivity and electrical conductivity. After the single crystal diamond is polished to a very low roughness by mechanical polishing, it is placed in the molybdenum support microgroove by pickling to ensure that the sample and the groove maintain a certain geometric relationship, and the seed crystal is etched by H2 plasma in situ The surface forms microscopic nucleation sites. Then, by controlling the deposition process and relying on the steps and defect regions after etching of the single crystal diamond without changing the original conditions of the diamond seed crystal, the nucleation of ultra-nanodiamonds can be achieved while doping nitrogen to achieve n-type doping growth, satisfying the in-situ n on the surface. The preparation of a type conductive ultra-nano-diamond thin layer forms a diamond semiconductor with an all-carbon structure.
本发明的技术方案为:Technical scheme of the present invention is:
一种单晶金刚石表面原位n型半导体化的制备方法。其特征在于通过微波等离子体刻蚀与气相沉积技术在单晶金刚石表面直接生成n型导电超纳米金刚石薄层,工艺步骤为如下:A preparation method for in-situ n-type semiconducting on the surface of single crystal diamond. It is characterized in that an n-type conductive ultra-nano-diamond thin layer is directly generated on the surface of single crystal diamond by microwave plasma etching and vapor deposition technology, and the process steps are as follows:
(1)单晶金刚石籽晶的研磨和抛光(1) Grinding and polishing of single crystal diamond seed crystal
为保证生长超纳米金刚石后表面满足电子器件要求,首先对单晶金刚石生长表面进行精密抛光。用颗粒度为40、20、10和2.5的金刚石微粉,进行预抛光;后置于精密金刚石抛光盘上进行精抛光,抛光后实现表面粗糙度低于1nm。In order to ensure that the surface after growing ultra-nanometer diamond meets the requirements of electronic devices, the surface of single crystal diamond growth is firstly polished precisely. Pre-polish with diamond micropowder with a particle size of 40, 20, 10 and 2.5; then place it on a precision diamond polishing disc for fine polishing. After polishing, the surface roughness is less than 1nm.
(2)单晶金刚石籽晶酸洗处理(2) Single crystal diamond seed crystal pickling treatment
为保证单晶金刚石表面光洁,去除可能存在的金属夹杂,碳氢化合物,石墨等。抛光后将籽晶样品置于HCl:H2SO4的混合液中煮沸后用去离子水冲洗;再依次置于丙酮溶液和无水乙醇中超声清洗吹干。In order to ensure the smooth surface of single crystal diamond, remove possible metal inclusions, hydrocarbons, graphite, etc. After polishing, the seed crystal samples were boiled in a mixture of HCl:H 2 SO 4 and rinsed with deionized water; then ultrasonically cleaned and dried in acetone solution and absolute ethanol in turn.
(3)单晶金刚石沉积环境的建立(3) Establishment of single crystal diamond deposition environment
将单晶金刚石基底置于钼托方形微槽内,样品表面至槽表面高度与样品测边缘和微槽间距比例保持在0.5-0.7之间,钼托厚度在5-15mm,微槽深度在500微米-1500微米之间。并将钼托置于铜导热基台上保证热量散失。该方法能够保持一个合适的金刚石基底沉积的局部和近邻环境。因金刚石单晶若处在等离子场中,温度和腔压相互影响而无法达到合适的条件,且表面沉积超纳米金刚石过程容易有微晶的出现和在等离子体中籽晶表面边缘温度过高而使籽晶表面温度分布不均而影响沉积层的平整度,从而要避免快速生长出现纳米团簇,使得金刚石表面沉积层达到平整化。而且,晶粒尺寸取决于化学反应平均自由程度以及边界层厚度,所设计的槽深能够提高金刚石表面稳流层厚度,晶粒尺寸随边界层厚度的增加而减小,有利于晶粒的二次形核;同时能够保证活性基团浓度,保证超纳米晶的快速形核生长。与此同时,控制钼托厚度,使其表面处于等离子体球边缘,在降低流场对金刚石表面冲刷的同时保证生长所需基团的浓度,稳定超纳米金刚石的形核生长。Place the single crystal diamond substrate in the square microgroove of the molybdenum holder, the height from the surface of the sample to the surface of the groove and the distance between the edge of the sample and the distance between the microgroove are kept between 0.5-0.7, the thickness of the molybdenum holder is 5-15mm, and the depth of the microgroove is 500 Between microns and 1500 microns. And place the molybdenum bracket on the copper heat conduction base to ensure heat dissipation. The method is able to maintain a suitable local and immediate environment for diamond substrate deposition. Because if the diamond single crystal is in the plasma field, the temperature and the cavity pressure will affect each other and cannot reach the appropriate conditions, and the process of depositing ultra-nano diamond on the surface is prone to the appearance of microcrystals and the edge temperature of the seed crystal surface is too high in the plasma. The uneven temperature distribution on the surface of the seed crystal affects the flatness of the deposited layer, so as to avoid the rapid growth of nano-clusters and make the deposited layer on the diamond surface smooth. Moreover, the grain size depends on the average degree of freedom of chemical reactions and the thickness of the boundary layer. The designed groove depth can increase the thickness of the stable flow layer on the diamond surface, and the grain size decreases with the increase of the boundary layer thickness, which is beneficial to the two Secondary nucleation; at the same time, it can ensure the concentration of active groups and ensure the rapid nucleation and growth of ultra-nanocrystals. At the same time, the thickness of the molybdenum support is controlled so that its surface is at the edge of the plasma sphere, while reducing the erosion of the flow field on the diamond surface, while ensuring the concentration of the groups required for growth, and stabilizing the nucleation and growth of ultra-nano diamond.
(4)单晶金刚石籽晶的等离子表面刻蚀(4) Plasma surface etching of single crystal diamond seed crystal
采用H2等离子体刻蚀,使得在去除金刚石表面可能存在的畸变区或位错露头的同时产生了单晶金刚石的台阶与缺陷区。该过程在等离子体启动和调节工艺参数达到稳定状态过程中原位完成,具体是:氢气通量为200-300sccm,甲烷流量5-25sccm。由于通入甲烷会使温度升高大约30-50℃,故在通入H2后,功率2000-3000W,调节腔压控制温度在700-740℃左右,刻蚀10-15分钟。使得在去除金刚石表面可能存在的畸变区或位错露头的同时产生了单晶金刚石的台阶与缺陷区。在实际刻蚀过程中,氢等离子体对表面畸变和位错扩展区的刻蚀速率远大于完好区域。在去除金刚石表面可能存在的畸变区或位错露头的同时产生了单晶金刚石的台阶与缺陷区,依赖于此实现纳米金刚石直接形核与生长。同时,对单晶金刚石籽晶的H2等离子原位刻蚀使得其表面形成大量H终结,悬挂键上的原子H要不断地移开并被含C的组元所替代,保持金刚石生长所需的理想界面,有助于超纳米晶的形核生长。悬挂键是甲烷提供的碳源C替代,通过控制甲烷流量,调节功率腔压,保证温度而实现。H2 plasma etching is used to remove the possible distortion regions or dislocation outcrops on the diamond surface, and at the same time produce steps and defect regions of single crystal diamond. This process is completed in situ during the process of starting the plasma and adjusting the process parameters to reach a steady state, specifically: the hydrogen flux is 200-300sccm, and the methane flow rate is 5-25sccm. Since the introduction of methane will increase the temperature by about 30-50°C, after the introduction of H 2 , the power is 2000-3000W, the chamber pressure is adjusted to control the temperature at about 700-740°C, and the etching is performed for 10-15 minutes. The steps and defect areas of single crystal diamond are produced while removing the distortion area or dislocation outcrop that may exist on the diamond surface. In the actual etching process, the etching rate of hydrogen plasma on the surface distortion and dislocation expansion area is much higher than that on the intact area. While removing the possible distortion areas or dislocation outcrops on the diamond surface, steps and defect areas of single crystal diamond are generated, relying on this to realize the direct nucleation and growth of nano-diamonds. At the same time, the H2 plasma in-situ etching of the single crystal diamond seed crystal causes a large number of H terminations to be formed on the surface, and the atoms H on the dangling bonds are constantly removed and replaced by C-containing components to maintain the diamond growth. The ideal interface is conducive to the nucleation and growth of ultra-nanocrystals. The dangling bond is the replacement of carbon source C provided by methane, which is realized by controlling the flow of methane, adjusting the pressure of the power chamber, and ensuring the temperature.
(5)表面超纳米层的沉积生长(5) Deposition and growth of super-nanolayer on the surface
在刻蚀后不改变金刚石状态,只通过控制功率、温度、腔压和气体流量在快速形核生长过程中形成n型掺杂的超纳米金刚石。通过控制等离子体中含碳基团浓度,抑制含碳基团的空间传输与表面扩散,在单晶金刚石表面sp3结构下抑制抽取反应,依赖单晶金刚石的台阶与缺陷区,实现纳米金刚石直接形核与生长,甲烷流量5-25sccm,使得实现高的CH4通量,在适宜温度和相对低压情况下,环境中形成CH3和CH2基体,以及二聚物C2都是纳米金刚石形核生长所需的物质。氮气的添加也会加快生长速率。通过控制掺氮比例,在纳米金刚石形核同时,实现C-C晶格的氮原子并入。相比CH4/H2等离子体,外加的N2提供了很多额外的反应路径和包括有N的新中间反应物而导致不同的N2能够引起产物形成纳米晶。The state of the diamond is not changed after etching, and the n-type doped ultra-nano-diamond is formed in the process of rapid nucleation and growth only by controlling the power, temperature, chamber pressure and gas flow. By controlling the concentration of carbon-containing groups in the plasma, inhibiting the spatial transmission and surface diffusion of carbon-containing groups, suppressing the extraction reaction under the sp 3 structure on the surface of single crystal diamond, and relying on the steps and defect areas of single crystal diamond, the direct Nucleation and growth, the methane flow rate is 5-25 sccm, which makes the realization of high CH 4 flux, under the condition of suitable temperature and relatively low pressure, CH 3 and CH 2 matrix are formed in the environment, and the dimer C 2 is in the form of nano-diamond Substances required for nuclear growth. Nitrogen addition also increases the growth rate. By controlling the ratio of nitrogen doping, the incorporation of nitrogen atoms into the CC lattice is realized at the same time as the nucleation of nanodiamonds. Compared with CH 4 /H 2 plasma, the addition of N 2 provides many additional reaction pathways and new intermediate reactants including N leading to different N 2 can induce the formation of nanocrystals in the product.
进一步的,步骤(1)所述的预抛光时间为24-48小时。Further, the pre-polishing time in step (1) is 24-48 hours.
进一步的,步骤(1)所述精抛光步骤是:在精密金刚石抛光盘上,控制转速为40转/分钟,80转/分钟,120转/分钟情况下分别进行20-30小时,40-60小时和80-100小时进行抛光处理。Further, the fine polishing step in step (1) is: on the precision diamond polishing disc, the control speed is 40 rpm, 80 rpm, and 120 rpm, respectively, for 20-30 hours, 40-60 hours and 80-100 hours for polishing.
进一步的步骤(2)所述酸洗处理是抛光后将籽晶样品置于HCl:H2SO4=1:5的混合液中煮沸45分钟到1小时,后用去离子水冲洗;再依次置于丙酮溶液和无水乙醇中各超声清洗10-15分钟,吹干。The pickling treatment in the further step (2) is that after polishing, the seed crystal sample is placed in a mixture of HCl:H 2 SO 4 =1:5 and boiled for 45 minutes to 1 hour, and then rinsed with deionized water; and then sequentially Place in acetone solution and absolute ethanol for ultrasonic cleaning for 10-15 minutes, and dry.
进一步的,步骤(5)所述形成n型掺杂的超纳米金刚石的具体工艺条件是:功率800w-3000w,温度400-750℃,腔压保持在5~15.5kPa情况下,在流量为100-500sccm的氢气和5-25sccm的甲烷中通入1-60sccm流量的N2。Further, the specific process conditions for forming n-type doped ultra-nano-diamond in step (5) are: power 800w-3000w, temperature 400-750°C, chamber pressure maintained at 5-15.5kPa, flow rate of 100 - 500 sccm of hydrogen and 5-25 sccm of methane are fed with N 2 at a flow rate of 1-60 sccm.
本发明实施过程的关键在于:The key of the present invention's implementation process is:
(1)对单晶金刚石籽晶表面处理过程中,以不同粒径的金刚石粉以及适度的抛光时间对籽晶生长面进行精密抛光,达到极度光洁,消除石墨相,避免晶粒异常长大或形成纳米团簇。(1) In the process of surface treatment of single crystal diamond seed crystal, the growth surface of seed crystal is precisely polished with diamond powder of different particle sizes and moderate polishing time to achieve extreme smoothness, eliminate graphite phase, and avoid abnormal grain growth or form nanoclusters.
(2)在实现表面抛光过程中,除采用机械抛光的方法,也采用了机械化学抛光、等离子体辅助或复合抛光等手段,对金刚石基底表面进行精密平整化处理,以达到表面粗糙度小于1nm。(2) In the process of surface polishing, in addition to mechanical polishing, mechanochemical polishing, plasma-assisted or composite polishing are also used to precisely planarize the surface of the diamond substrate to achieve a surface roughness of less than 1nm .
(3)单晶金刚石沉积环境的建立是基于金刚石单晶籽晶的尺寸设计沉积台的几何结构,样品表面至槽表面高度与样品测边缘和微槽间距比例保持在0.5-0.7之间,控制钼托厚度使其表面处于等离子体球边缘。建立和稳定超纳米金刚石的形核生长的适宜环境。(3) The establishment of the single crystal diamond deposition environment is to design the geometric structure of the deposition table based on the size of the diamond single crystal seed crystal. The height from the sample surface to the groove surface is kept between 0.5-0.7 between the sample edge and the distance between the micro grooves. The molybdenum support is so thick that its surface is at the edge of the plasma sphere. Establish and stabilize a suitable environment for the nucleation and growth of ultra-nanometer diamonds.
(4)单晶金刚石籽晶的纯H2等离子表面刻蚀。使得在去除金刚石表面可能存在的畸变区或位错露头的同时产生单晶金刚石的台阶与缺陷区。同时形成大量的氢终结。保持金刚石生长所需的理想界面,有助于超纳米晶的形核生长。(4) Pure H2 plasma surface etching of single crystal diamond seed crystal. The step and defect area of single crystal diamond can be produced while removing the distortion area or dislocation outcrop that may exist on the diamond surface. Simultaneously a large number of hydrogen terminations are formed. Maintaining the ideal interface required for diamond growth contributes to the nucleation and growth of ultra-nanocrystals.
(5)在纯H2环境中通过控制等离子体中含碳基团浓度,甲烷流量8-15sccm,使得实现高的CH4通量,在适宜温度和相对低压情况下,环境中形成CH3和C2H基体,以及二聚物C2都是超纳米金刚石形核生长所需的物质。(5) In the pure H2 environment, by controlling the concentration of carbon-containing groups in the plasma, the methane flow rate is 8-15 sccm, so that high CH4 flux can be realized, and at a suitable temperature and relatively low pressure, CH3 and The C 2 H matrix and the dimer C 2 are the substances required for the nucleation and growth of ultra-nano diamond.
(6)在设置功率800-3000W,温度400-750℃,腔压保持在5~15.5kPa。加入的高浓度氮源1-60sccm的N2能够加速金刚石的生长,以保证超纳米金刚石的快速形核生长。同时以保证能在单晶金刚石表面形成超纳米金刚石的同时实现氮掺杂,形成n型导电的超纳米金刚石层。(6) The set power is 800-3000W, the temperature is 400-750°C, and the cavity pressure is kept at 5-15.5kPa. The added high-concentration nitrogen source 1-60sccm N2 can accelerate the growth of diamond, so as to ensure the rapid nucleation and growth of ultra-nano diamond. At the same time, nitrogen doping can be realized while super-nano-diamond can be formed on the surface of single-crystal diamond to form an n-type conductive super-nano-diamond layer.
(7)除了氮掺杂外,还可以引入不同气源实现S、P掺杂形成n型导电,或者B等掺杂形成p型导电。(7) In addition to nitrogen doping, different gas sources can also be introduced to realize S and P doping to form n-type conduction, or B and other doping to form p-type conduction.
(8)金刚石基底籽晶可以采用高温高压籽晶或同质外延单晶金刚石。同样也可以采用多晶金刚石以及硅、GaN、SiC等与金刚石的复合结构。(8) The diamond substrate seed crystal can be high temperature and high pressure seed crystal or homoepitaxial single crystal diamond. Similarly, polycrystalline diamond and composite structures of silicon, GaN, SiC, etc. and diamond can also be used.
本发明和现有技术相比所具有的有益效果在于:Compared with the prior art, the present invention has the beneficial effects of:
(1)单晶金刚石具有自然界最高的热导率,通过高导热单晶金刚石表面形成n型导电纳米/超纳米金刚石,在形成良好的n型导电同时,能够实现器件的高效散热。(1) Single crystal diamond has the highest thermal conductivity in nature, and n-type conductive nano/ultra-nano diamond is formed on the surface of high thermal conductivity single crystal diamond, which can realize efficient heat dissipation of devices while forming good n-type conductivity.
(2)在单晶金刚石表面沉积超纳米金刚石,在及其光洁的表面无需研磨、添加纳米金刚石粉、加偏压等形核预处理手段,利用刻蚀后单晶金刚石本身的台阶与缺陷,可快速形成纳米金刚石晶粒与晶界,实现形核,大大降低了制备流程的复杂程度。(2) Deposit ultra-nano-diamond on the surface of single-crystal diamond, without grinding, adding nano-diamond powder, biasing and other nucleation pretreatment methods on the surface, and using the steps and defects of single-crystal diamond itself after etching, Nano-diamond grains and grain boundaries can be quickly formed to realize nucleation, which greatly reduces the complexity of the preparation process.
(3)本发明实现单晶金刚石表面沉积超纳米金刚石,避免了异种物质间界面失配而影响性能的问题。同时也避免了由于离子注入和CVD生长掺杂而导致的金刚石的相破坏和的杂质原子难以离化以及在高温环境下易于石墨化的问题。该全金刚石结构有着更优异的热稳定性。(3) The present invention realizes the deposition of ultra-nanometer diamond on the surface of single crystal diamond, avoiding the problem that the performance is affected by the interface mismatch between different substances. At the same time, it also avoids the phase damage of diamond caused by ion implantation and CVD growth doping, the impurity atoms are difficult to ionize, and the problems of easy graphitization under high temperature environment are avoided. The all-diamond structure has better thermal stability.
(4)金刚石单晶表面形成纳米金刚石复合结构,成为全金刚石结构,或称全碳结构,除具有良好的导热性与导电性外,由于金刚石碳材料的化学惰性,该全碳结构还将具有具有良好的耐酸碱腐蚀、耐辐射等一系列优异特性,能够为恶劣环境性电子器件的开发提供衬底,进一步扩宽了该金刚石电子器件的应用领域。(4) A nano-diamond composite structure is formed on the surface of the diamond single crystal, which becomes an all-diamond structure, or an all-carbon structure. In addition to having good thermal conductivity and electrical conductivity, due to the chemical inertia of the diamond carbon material, the all-carbon structure will also have It has a series of excellent properties such as good acid and alkali corrosion resistance and radiation resistance, and can provide a substrate for the development of harsh environment electronic devices, further expanding the application field of the diamond electronic device.
附图说明Description of drawings
图1是本发明单晶金刚石表面沉积高含氮超纳米金刚石薄层的样品正反面拉曼(Raman)光谱图。Fig. 1 is the front and back Raman spectrograms of a sample with a high nitrogen-containing ultra-nano-diamond thin layer deposited on the surface of the single crystal diamond of the present invention.
图2是本发明单晶金刚石表面沉积高含氮超纳米金刚石薄层的扫描(SEM)照片Fig. 2 is the scanning (SEM) photograph of the high nitrogen-containing ultra-nano-diamond thin layer deposited on the surface of single crystal diamond of the present invention
具体实施方式Detailed ways
具体实施方式一Specific implementation mode one
(1)高温高压单晶金刚石籽晶表面距钼托槽高度H与籽晶距槽壁间距L之比为0.57,其钼托厚度5mm,微槽深度700μm;(2)按N2:(H2+CH4)=1:312的流量比:N2为1sccm、H2为12sccm、CH4为300sccm,在腔压为10.6~10.65kPa,缓升功率并保持在1600-1650W;(3)籽晶表面温度在640℃~645℃,沉积时间1小时,后缓慢冷却至室温。所得沉积层拉光谱图见附图,主要的拉曼位移峰位于:1140,1332,1340,1470和1580cm-1处。其中,1332cm-1处出现的是金刚石的特征峰,该峰的半高宽很大,是典型的超纳米金刚石来拉曼图谱。表面形貌图如图二所示。(1) The ratio of the surface of the high temperature and high pressure single crystal diamond seed crystal to the height H of the molybdenum bracket and the distance L between the seed crystal and the groove wall is 0.57, the thickness of the molybdenum bracket is 5mm, and the depth of the microgroove is 700 μm; (2) According to N 2 : (H 2 + CH 4 ) = 1:312 flow ratio: N 2 is 1 sccm, H 2 is 12 sccm, CH 4 is 300 sccm, the chamber pressure is 10.6-10.65kPa, and the power is slowly increased and maintained at 1600-1650W; (3) The surface temperature of the seed crystal is 640°C-645°C, the deposition time is 1 hour, and then slowly cooled to room temperature. The Raman spectrum of the obtained sediment layer is shown in the accompanying drawing, and the main Raman shift peaks are located at 1140, 1332, 1340, 1470 and 1580 cm −1 . Among them, what appears at 1332cm -1 is the characteristic peak of diamond, and the half-maximum width of this peak is very large, which is a typical Raman spectrum of ultra-nano diamond. The surface topography is shown in Fig. 2.
具体实施方式二Specific implementation mode two
(1)高温高压单晶金刚石籽晶表面距钼托槽高度H与籽晶距槽壁间距L之比为0.62,其钼托厚度8mm,微槽深度800μm;(2)按N2:(H2+CH4)=30:312的流量比:N2为30sccm、H2为12sccm、CH4为300sccm,在腔压为12.7~12.75kPa,缓升功率并保持在1800-1850W;(3)籽晶表面温度在680℃~685℃,沉积时间1小时,后缓慢冷却至室温。所得沉积层拉光谱图与实施方式一相同。(1) The ratio of the surface of the high temperature and high pressure single crystal diamond seed crystal to the height H of the molybdenum bracket and the distance L between the seed crystal and the groove wall is 0.62, the thickness of the molybdenum bracket is 8mm, and the depth of the microgroove is 800 μm; (2) According to N 2 : (H 2 + CH 4 ) = 30:312 flow ratio: N 2 is 30 sccm, H 2 is 12 sccm, CH 4 is 300 sccm, the chamber pressure is 12.7-12.75kPa, and the power is slowly increased and maintained at 1800-1850W; (3) The surface temperature of the seed crystal is 680°C-685°C, the deposition time is 1 hour, and then slowly cooled to room temperature. The obtained deposition layer pull spectrum is the same as that of Embodiment 1.
具体实施方式三Specific implementation mode three
(1)高温高压单晶金刚石籽晶表面距钼托槽高度H与籽晶距槽壁间距L之比为0.63,其钼托厚度10mm,微槽深度900μm;(2)按N2:(H2+CH4)=30:312的流量比:N2为30sccm、H2为12sccm、CH4为300sccm,在腔压为14.1~14.5kPa,缓升功率并保持在2350-2400W左右;(3)籽晶表面温度在745℃~755℃,沉积时间1小时,后缓慢冷却至室温。所得沉积层拉光谱图与实施方式一相同。(1) The ratio of the surface of the high temperature and high pressure single crystal diamond seed crystal to the height H of the molybdenum bracket and the distance L between the seed crystal and the groove wall is 0.63, the thickness of the molybdenum bracket is 10mm, and the depth of the microgroove is 900 μm; (2) According to N 2 : (H 2 +CH 4 )=30:312 flow ratio: N 2 is 30sccm, H 2 is 12sccm, CH 4 is 300sccm, the chamber pressure is 14.1-14.5kPa, slowly increase the power and keep it at about 2350-2400W; (3 ) The surface temperature of the seed crystal is 745° C. to 755° C., the deposition time is 1 hour, and then slowly cooled to room temperature. The obtained deposition layer pull spectrum is the same as that of Embodiment 1.
具体实施方式四Specific implementation mode four
(1)高温高压单晶金刚石籽晶表面距钼托槽高度H与籽晶距槽壁间距L之比为0.60,其钼托厚度15mm,微槽深度1500μm;(2)按N2:(H2+CH4)=60:312的流量比:N2为60sccm、H2为12sccm、CH4为300sccm,在腔压为14.5~15kPa,缓升功率并保持在2350-2400W左右;(3)籽晶表面温度在745℃~755℃,沉积时间1小时,后缓慢冷却至室温。所得沉积层拉光谱图与实施方式一相同。(1) The ratio of the surface of the high temperature and high pressure single crystal diamond seed crystal to the height H of the molybdenum bracket and the distance L between the seed crystal and the groove wall is 0.60, the thickness of the molybdenum bracket is 15mm, and the depth of the microgroove is 1500 μm; (2) According to N 2 : (H 2 + CH 4 ) = 60:312 flow ratio: N 2 is 60 sccm, H 2 is 12 sccm, CH 4 is 300 sccm, the chamber pressure is 14.5-15kPa, and the power is slowly increased and maintained at about 2350-2400W; (3) The surface temperature of the seed crystal is 745°C-755°C, the deposition time is 1 hour, and then slowly cooled to room temperature. The obtained deposition layer pull spectrum is the same as that of Embodiment 1.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710363710.4A CN107419329B (en) | 2017-05-22 | 2017-05-22 | Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710363710.4A CN107419329B (en) | 2017-05-22 | 2017-05-22 | Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107419329A CN107419329A (en) | 2017-12-01 |
CN107419329B true CN107419329B (en) | 2019-08-27 |
Family
ID=60427965
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710363710.4A Active CN107419329B (en) | 2017-05-22 | 2017-05-22 | Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107419329B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108411276B (en) * | 2018-04-08 | 2019-12-03 | 河南佰特科技有限公司 | A kind of crystal seed implantation methods of cvd diamond thick film |
CN108588822B (en) * | 2018-04-08 | 2019-12-17 | 北京科技大学 | Uninterrupted dynamic in situ synthesis method of single crystal and ultra-nanodiamond composite structure |
CN109537052A (en) * | 2018-11-27 | 2019-03-29 | 西安碳星半导体科技有限公司 | A kind of pretreated method of CVD single crystal diamond film |
CN110281142A (en) * | 2019-06-20 | 2019-09-27 | 山东大学 | Diamond seed preparation method, diamond seed and monocrystalline |
CN110600366B (en) * | 2019-09-20 | 2021-06-18 | 西安交通大学 | (100) Crystalline diamond n-channel junction field effect transistor and method for making the same |
CN110571310B (en) * | 2019-09-20 | 2020-11-17 | 西安交通大学 | A method for forming ohmic contact of (100) oriented n-type single crystal diamond electrode |
CN111088523B (en) * | 2020-01-07 | 2021-04-20 | 北京科技大学 | A method for heteroepitaxial growth of large-size single crystal diamond |
CN111206280B (en) * | 2020-01-07 | 2021-02-12 | 北京科技大学 | A method for epitaxial growth of high quality and large size single crystal diamond |
CN111172508A (en) * | 2020-02-24 | 2020-05-19 | 北京科技大学 | A method for increasing the pressure limit of diamond counter-anvil |
CN113278947B (en) * | 2021-05-27 | 2022-01-04 | 杭州超然金刚石有限公司 | Crystal diamond nitrogen-doped semiconductor composite material and preparation method thereof |
CN113337887B (en) * | 2021-06-01 | 2023-01-06 | 南京大学 | Application of laser-assisted MPCVD method to enhance SiV color center of single crystal diamond and single crystal diamond with SiV color center |
CN116463609A (en) * | 2023-03-30 | 2023-07-21 | 南京大学 | A device and method for effectively realizing silicon doping in diamond |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104878447A (en) * | 2015-06-04 | 2015-09-02 | 哈尔滨工业大学 | Seed crystal-substrate in-situ connection method for homoepitaxial-growth monocrystalline diamond |
CN105331948A (en) * | 2015-09-25 | 2016-02-17 | 北京科技大学 | Manufacturing method for surface type-P conductive diamond heat sink material |
CN106012003A (en) * | 2016-06-07 | 2016-10-12 | 武汉工程大学 | Two-dimensional expansion method for CVD monocrystal diamond |
CN106048719A (en) * | 2016-07-08 | 2016-10-26 | 武汉大学 | Substrate holder and method for growing monocrystalline diamond |
-
2017
- 2017-05-22 CN CN201710363710.4A patent/CN107419329B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104878447A (en) * | 2015-06-04 | 2015-09-02 | 哈尔滨工业大学 | Seed crystal-substrate in-situ connection method for homoepitaxial-growth monocrystalline diamond |
CN105331948A (en) * | 2015-09-25 | 2016-02-17 | 北京科技大学 | Manufacturing method for surface type-P conductive diamond heat sink material |
CN106012003A (en) * | 2016-06-07 | 2016-10-12 | 武汉工程大学 | Two-dimensional expansion method for CVD monocrystal diamond |
CN106048719A (en) * | 2016-07-08 | 2016-10-26 | 武汉大学 | Substrate holder and method for growing monocrystalline diamond |
Also Published As
Publication number | Publication date |
---|---|
CN107419329A (en) | 2017-12-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107419329B (en) | Preparation method of in-situ n-type semiconducting all-carbon structure on the surface of single crystal diamond | |
CN102102220B (en) | Preparation method of graphene on diamond (111) surface | |
CN111029246B (en) | Method for reducing triangular defects in SiC epitaxial layer | |
CN108588822B (en) | Uninterrupted dynamic in situ synthesis method of single crystal and ultra-nanodiamond composite structure | |
CN111206280A (en) | Method for epitaxial growth of high-quality large-size single crystal diamond | |
JP6542347B2 (en) | Method of manufacturing epitaxial silicon carbide single crystal wafer and epitaxial silicon carbide single crystal wafer | |
CN101481792A (en) | Preparation of boron doped diamond superconduction material | |
CN110863243B (en) | A Secondary Epitaxy Method for Fabricating High-Quality Diamond Single Crystals Using Nanostructures | |
CN111118471A (en) | A kind of preparation method of high-quality polycrystalline diamond film | |
CN110281142A (en) | Diamond seed preparation method, diamond seed and monocrystalline | |
CN104947068A (en) | Preparation method of diamond heat sink piece | |
CN117468088B (en) | Ultra-large single crystal domain quasi-suspended graphene and preparation method thereof | |
JP2006328455A (en) | Epitaxial silicon carbide single crystal substrate and manufacturing method thereof | |
CN113089093B (en) | Method for forming diamond semiconductor structure | |
CN207775345U (en) | Diamond/graphene composite heat conduction film and cooling system | |
CN111232972B (en) | Preparation method of high-performance boron-doped diamond nanowire | |
Hu et al. | High-rate growth of single-crystal diamond with an atomically flat surface by microwave plasma chemical vapor deposition | |
CN109881248B (en) | Nitrogen-sulfur co-doped n-type semiconductor diamond material and preparation method thereof | |
CN111593318A (en) | N-type semiconductor composite film of diamond nanocrystal/nitrogen-doped silicon carbide interface phase and preparation method thereof | |
CN108360065A (en) | A kind of method and growth structure of growth single-crystal diamond | |
WO2008035468A1 (en) | THIN NANODIAMOND FILM HAVING n-TYPE CONDUCTIVITY AND PROCESS FOR PRODUCING THE SAME | |
CN115161767A (en) | Preparation method of (100)/(111) oriented composite high-performance diamond semiconductor | |
CN113174582A (en) | Method for preparing diamond film by microwave plasma chemical vapor deposition method | |
CN114496728A (en) | Preparation method of low-defect silicon carbide epitaxial material | |
CN115233309B (en) | Gallium nitride substrate, gallium nitride single crystal layer and manufacturing method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |