CN107315152A - A kind of many Measurement channel built-in self-test circuit designs - Google Patents
A kind of many Measurement channel built-in self-test circuit designs Download PDFInfo
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- CN107315152A CN107315152A CN201710320350.XA CN201710320350A CN107315152A CN 107315152 A CN107315152 A CN 107315152A CN 201710320350 A CN201710320350 A CN 201710320350A CN 107315152 A CN107315152 A CN 107315152A
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- 238000005259 measurement Methods 0.000 title claims abstract description 88
- 238000012360 testing method Methods 0.000 title claims abstract description 27
- 238000013461 design Methods 0.000 title claims abstract description 15
- 230000002159 abnormal effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 10
- 238000007689 inspection Methods 0.000 abstract description 8
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000012795 verification Methods 0.000 abstract description 5
- 238000003745 diagnosis Methods 0.000 abstract 1
- 238000002955 isolation Methods 0.000 abstract 1
- 238000012544 monitoring process Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
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- 230000005611 electricity Effects 0.000 description 1
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- 238000012423 maintenance Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention belongs to signal detection field, there is provided be segmented " self-inspection " and measurement accuracy " self checking " circuit design method in a kind of many Measurement channel measurement signals distribution control based on band switch, machine.The characteristics of mainly using band switch, devise many Measurement channels " the closure self-inspection loop " of short circuit and the measurement accuracy checking circuit with " verification resistance " paragraph by paragraph, while many Measurement channel signal distribution controls are taken into account, realize quick " self-inspection " and " online " verification of test equipment measurement accuracy in many Measurement channel machines, user is facilitated to test equipment self-technique status monitoring, or interlock circuit fault diagnosis provides detection means, is conducive to Fault Isolation and failure to be accurately positioned.The circuit design also has autgmentability strong, it can realize that connection in series-parallel extends according to similar circuit theory, the situation of the series-connection connector (or adapter) on each section of Measurement channel is applied also for, and is able to detect that the connected state of connector (or adapter).
Description
Technical field
The invention belongs to signal detection field, it is related to a test equipment built in test survey technology.
Background technology
The extension of Measurement channel can be realized using a knife multi gear (or being thrown a knife) band switch more.In actual use,
Open circuit or path resistance abnormal (typically becoming big) occurs in each Measurement channel will produce influence to measurement result.In a certain drive test amount
When whether passage the situation of " open circuit " or " path resistance is abnormal " occurs, generally require to open test equipment cabinet, using artificial
The method investigation trouble point of measurement, operating process is cumbersome, and detection efficiency is low.For the Measurement channel of multistage circuits cascading, how
Designed by equipment built in test, it is determined that be which section Measurement channel it is problematic, timely and accurately fault point, will be helped
In the rapid-maintenance of equipment, or change in time to standby Measurement channel.In addition during test equipment use, user is closed very much
Test equipment measurement accuracy is noted whether in the range of index request.For resistance measurement function, resistance measurement precision does not conform to
Lattice, then the result of test equipment measurement will be inaccurate, insincere.If test equipment possesses measurement accuracy self checking function,
The problem can be solved.
The content of the invention
The purpose of the present invention is：There is provided a kind of many Measurement channel measurement signals distribution control based on band switch, in machine
It is segmented " self-inspection " and measurement accuracy " self checking " circuit design method.
The present invention is achieved through the following technical solutions：
1. a kind of many Measurement channel built-in self-test circuits design is (see accompanying drawing 1), in two prime measurement point JC1, JC2 and appoint
Anticipate between two tested measuring point Aj, Bj (j=1,2,3 ..., N are integer, similarly hereinafter), 2 knife multi gear band switch Ka of series connection,
Kb (a, b are band switch K identification number).It is characterized in that：
(1) Ka-Mo, Ka-Mp are connected with JC1, JC2 respectively, the Measurement channel (JC1 to Ka- formed before band switch Ka
) and (JC2 to Ka-Mp) Mo.Kb-Mo, Kb-Mp are connected with Ka-o-v, Ka-p-v respectively, the survey formed between band switch Ka, Kb
Measure passage (Ka-o-v to Kb-Mo) and (Ka-p-v to Kb-Mp).Kb-o-i, Kb-p-i are connected with Aj, Bj respectively, form wave band
Switch the Measurement channel (Kb-o-i to Aj) and (Kb-p-i to Bj) after Kb.V gears, band switch Kb in band switch Ka
The i-th gear connect in the case of, two prime measurement point JC1, JC2 and any two are detected measuring point Aj, Bj and are connected together,
Form Measurement channel (JC1-Aij) and (JC2-Bij).
(2) Ka-o-u is connected with Ka-p-u, forms short circuit connection between gear.Connected in band switch Ka u gears
In the case of, it can check that the connected state of this 2 sections of Measurement channels of (JC1 to Ka-Mo) and (JC2 to Ka-Mp) is (logical from JC1, JC2 end
Road is normal, breaking, circuit impedance is abnormal etc., similarly hereinafter).
(3) Kb-o-f is connected with Kb-p-f, forms short circuit connection between gear.Opened in band switch Ka v gears, wave band
In the case of the f gears connection for closing Kb, (JC1 to Ka-Mo), (JC2 to Ka-Mp), (Ka-o-v can be checked from JC1, JC2 end
To Kb-Mo), the connected state of (Ka-p-v to Kb-Mp) each section of Measurement channel.
(4) in the case where above-mentioned (2), (3) are while carry out, (Ka-o-v to Kb-Mo), (Ka-p-v to Kb- can be deduced
Mp) the connected state of this 2 sections of Measurement channels.
2. a kind of many Measurement channel built-in self-test circuit designs according to 1., it is characterised in that：In Ka-o-w and Ka-
Resistance Ry1 (in accompanying drawing 2) is connected between p-w, available for check meter measurement accuracy.Connect in band switch Ka w gears
In the case of logical, from JC1, JC2 end can check meter measurement accuracy, while can also check (JC1 to Ka-Mo) and (JC2 to Ka-
Mp) the connected state of this 2 sections of Measurement channels.
3. a kind of many Measurement channel built-in self-test circuit designs according to 1., it is characterised in that：In Kb-o-h and Kb-
Resistance Ry2 (in accompanying drawing 3) is connected between p-h, available for check meter measurement accuracy.In band switch Ka v gears, ripple
In the case that Duan Kaiguan Kb h gears are connected, from JC1, JC2 end can check meter measurement accuracy, while can also check (JC1
To Ka-Mo), (JC2 to Ka-Mp), (Ka-o-v to Kb-Mo), the connected state of (Ka-p-v to Kb-Mp) each section of Measurement channel.
4. a kind of many Measurement channel built-in self-test circuit designs according to 1., it is characterised in that：Separately include connector
(or adapter) SP (x), SP (y), SP (z), SP (m) are connected on Measurement channel (JC1 to Ka-Mo), (JC2 to Ka-Mp), (Ka-
O-v to Kb-Mo), in (Ka-p-v to Kb-Mp), see accompanying drawing 4.
The invention has the advantages that：
Present invention contrast prior art has following remarkable advantage：
(1) realize the selection and distribution of many Measurement channels by band switch switching control, and realize to JC1,
JC2 to (JC1 to Ka-Mo), (JC2 to Ka-Mp), (Ka-o-v to Kb-Mo), (Ka-p-v to Kb- between band switch Kb
Mp) " self-inspection " function in the section machine of each section of Measurement channel, improves self-inspection efficiency and reduces the scope of fault location.
(2) realize " online " verification to test instrumentation resistance measurement precision, it may also be said to realized to tester
" online " self-inspection of table resistance measurement function, can avoid measuring instrumentss overproof using the incredible situation of caused test result.
(3) self-test operations process intuitive is strong, easy to operate.
(4) the circuit autgmentability is strong, and can realizing extension according to similar circuit theory, (such as multiple band switch Kb are simultaneously
On the gear that band switch Ka is connected to after connection).
(5) invention can also be carried out to connector (or adapter) SP (x) or SP (y) connected in circuit path situation
Check.
Brief description of the drawings：
Fig. 1 to Fig. 4 is schematic diagram of the invention；Fig. 5 and Fig. 6 is Example 1 and Example 2 of the present invention.
Fig. 1 is into Fig. 6：JC1, JC2 represent 2 prime measurement points；Aj, Bj represent that any two is detected measuring point；K represents ripple
Duan Kaiguan；A, b are band switch K identification number；Ka represents band switch Ka；Kb represents band switch Kb；O, p represent that wave band is opened
2 random layers on K are closed, u, v, w represent 3 gears on band switch Ka；F, h represent 2 gears on band switch Kb；
I (i=1,2,3 ..., N are integer) represents i-th of the gear not taken by f, h gear on band switch Ka (or Kb)；Wave band
Switching the method for expressing of some gear terminal on K, (such as Kb-o-i represents band switch Kb o for " K identification numbers-layer-gear "
The gear terminal of upper i-th of the gear of layer), on band switch the method for expressing of some public terminal be "-M layers of K identification numbers " (for example
Kb-Mo represents upper o layers of band switch Kb public terminal)；Ry1 (in accompanying drawing 2) or Ry2 (in accompanying drawing 3) represent any one
Or one group of measuring resistance；SP (m), SP (x), SP (y), SP (z) represent connector (or adapter)；CAij, CBij are represented and joined
Number i, j associated Measurement channel.
Embodiment：
With reference to the accompanying drawings and examples 1 and embodiment 2 the invention will be further described.
Embodiment 1：
The present embodiment provides a kind of corresponding specific implementation of description of the invention accompanying drawing 5.Circuit in accompanying drawing 5 is included
The concrete application situation of several schematic circuits in accompanying drawing 1, accompanying drawing 2, accompanying drawing 3, in figure 5 in accompanying drawing 1, accompanying drawing 2, accompanying drawing 3
Free parameter embodied, be described as follows：
Identification number parameter a, b of band switch access value 1,2 respectively；
Gear parameter i access value 2,3；
Measured point parameter j numerical value takes 1,2；
Layer parameter o, p take 1,2 respectively；
Gear parameter u, v, w take 1,2,3 respectively；
Gear parameter f, h takes 1,4 respectively；
Resistance parameter Ry1 takes 4 Ω；
Resistance parameter Ry2 takes 20M Ω.
It is flat using 2 disks 1.0 using 2 Ge Hang Star, one knife, 12 grades of 4 layers of band switches as K2, K1 when physical circuit is implemented
Side silver-plated RVV as measuring circuit signal wire.The circuit shown in accompanying drawing 5 can produce one to 2 to specifications
The physical circuit that the tested measuring point (A1, B1) of group, (A2, B2) are measured.
2 prime measurement points JC1, JC2 connect two test sides of measuring instrumentss respectively.JC1, JC2 respectively with K1-M1, K1-
M2 is connected；A1, B1 are connected with K2-1-2, K2-2-2 respectively；K2-1-3 is connected with A2, and K2-2-3 is connected with B2；K2-M1 and K1-
1-2 is connected；K2-M2 is connected with K1-2-2.
K1-1-1 and K1-2-1 short circuit connections；K2-1-1 and K2-2-1 short circuit connections.
4 Ω resistance (verification resistance) are connected between K1-1-3 and K1-2-3；20M Ω electricity is connected between K2-1-4 and K2-2-4
Hinder (verification resistance).
So, situations below can be achieved：
(1) in the case that the 2nd gear, band switch K2 the 2nd gear in band switch K1 is connected, two prime measurements
Point JC1, JC2 and tested measuring point A1, B1 are connected together, and form Measurement channel JC1-A21 and JC2-B21.In band switch K1
The 2nd gear, in the case that band switch K2 the 3rd gear connects, two prime measurement point JC1, JC2 and tested measuring point A2,
B2 is connected together, and forms Measurement channel JC1-A32 and JC2-B32.
(2) in the case where band switch K1 the 1st gear is connected, JC1, JC2 end points are closed back by gear formation
Road, can checking the connected states of this 2 sections of Measurement channels of (JC1 to K1-M1) and (JC2 to K1-M2) from JC1, JC2 end, (path is just
Often, open circuit, path circuitry impedance exception etc., similarly hereinafter).
(3) similarly, in the case that the 2nd gear in band switch K1, band switch K2 the 1st gear are connected, from JC1,
JC2 ends can check (JC1 to K1-M1), (JC2 to K1-M2), (K1-1-2 to K2-M1), (K1-2-2 to K2-M2) this 4 sections measurements
The connected state of passage.
(4), can check meter 4 Ω resistance of detection from JC1, JC2 end in the case where band switch K1 the 3rd gear is connected
When measurement accuracy, while can also check (JC1 to K1-M1), the connected state of (JC2 to K1-M2) this 2 sections of Measurement channels.
(5) in the case that the 2nd gear, band switch K2 the 4th gear in band switch K1 is connected, from JC1, JC2 end
Can check meter detect 20M Ω resistance measurement accuracy, while can also check (JC1 to K1-M1), (JC2 to K1-M2), (K1-
1-2 to K2-M1), the connected state of (K1-2-2 to K2-M2) this 4 sections of Measurement channels.
Embodiment 2
Embodiment 2 is to adding the specific of the situation of connector (or adapter) in Measurement channel in accompanying drawing 4 of the present invention
Embodiment.In fact embodiment 2 is that on the basis of embodiment 1, giving increases the concrete case of 4 connectors in circuit,
Physical circuit connection figure is shown in accompanying drawing 6, is described as follows：
Free parameter x, y, z in connector (or adapter) in accompanying drawing 4, m are taken into 1,2,3,4, i.e. respective figure 6 respectively
Middle connector SP (1), SP (2), SP (3), SP (4).
Accompanying drawing 6 and accompanying drawing 5 compare, and have been connected respectively even on Measurement channel K1-1-2 to K2-M1 and K1-2-2 to K2-M2
Device SP (1) and connector SP (2) are met, connector of having been connected respectively on Measurement channel (JC2 to K1-M2) and (JC1 to K1-M1)
SP (3) and connector SP (4).
In actual applications, in the case where band switch K1 the 1st gear is connected, connection can be checked from JC1, JC2 end
Device SP (3), SP (4) connected state；The situation that 1st gear of the 2nd gear, band switch K2 in band switch K1 is connected
Under, connector SP (1), SP (2), SP (3), SP (4) connected state can be checked from JC1, JC2 end；Two kinds of situations of summary,
It can be inferred that connector SP (1), SP (2) connected state.
Circuit design method described in this patent, with good autgmentability.In real work, the Measurement channel being related to
Several cases often exceeded with connector described in embodiment 1 and embodiment 2.In fact, we use circuit of the present invention
Design method, has made an XX-X computer that upper control computer progress conducting Insulation test is equipped to certain type and has turned on and insulated
Tester, realizes the measurement signal selection control and built in test to 24 Measurement channels, also achieves 4 Ω, 5M Ω, 20M
Ω, 39M Ω points position resistance precision verifying function.By " self-inspection " circuit in the machine of the present invention, 2 Measurement channels have been accurately positioned
The higher failure of upper via resistance, demonstrates the actual application value of the present invention.
Above example combination accompanying drawing is described to the embodiment of the present invention, but these explanations do not make sense
To limit the scope of the present invention, protection scope of the present invention is limited by appended claims, any in right of the present invention
It is required that on the basis of change be all protection scope of the present invention.
Claims (4)
1. a kind of many Measurement channel built-in self-test circuit designs, are detected in two prime measurement point JC1, JC2 and any two
Between point Aj, Bj (j=1,2,3 ..., N are integer), connect 2 a knife multi gears (or being thrown a knife) band switch Ka, Kb more,
It is characterized in that：(1) Ka-Mo, Ka-Mp are connected with JC1, JC2 respectively, and (JC1 is extremely for the Measurement channel formed before band switch Ka
) and (JC2 to Ka-Mp) Ka-Mo；(2) Kb-Mo, Kb-Mp are connected with Ka-o-v, Ka-p-v respectively, form band switch Ka, Kb
Between Measurement channel (Ka-o-v to Kb-Mo) and (Ka-p-v to Kb-Mp)；(3) Kb-o-i, Kb-p-i are connected with Aj, Bj respectively,
The Measurement channel (Kb-o-i to Aj) and (Kb-p-i to Bj) formed after band switch Kb；(4) at v grades of band switch Ka
In the case that position, band switch Kb the i-th gear are connected, two prime measurement point JC1, JC2 and any two be detected measuring point Aj,
Bj is connected together, and forms Measurement channel (JC1-Aij) and (JC2-Bij)；(5) Ka-o-u is connected with Ka-p-u, forms gear
Between short circuit connection, band switch Ka u gears connect in the case of, from JC1, JC2 end can check (JC1 to Ka-Mo) and
The connected state (path is normal, breaking, circuit impedance is abnormal etc., similarly hereinafter) of (JC2 to Ka-Mp) this 2 sections of Measurement channels；(6)Kb-
O-f is connected with Kb-p-f, forms short circuit connection, the f gears of v gears, band switch Kb in band switch Ka between gear
In the case of connection, (JC1 to Ka-Mo), (JC2 to Ka-Mp), (Ka-o-v to Kb-Mo), (Ka- can be checked from JC1, JC2 end
P-v to Kb-Mp) each section of Measurement channel connected state.
2. a kind of many Measurement channel built-in self-test circuit designs according to claim 1, it is characterised in that：In Ka-o-w and
Resistance Ry1 is connected between Ka-p-w, available for check meter measurement accuracy；The feelings connected in band switch Ka w gears
Under condition, from JC1, JC2 end can check meter measurement accuracy, while can also check (JC1 to Ka-Mo) and (JC2 to Ka-Mp) this 2
The connected state of section Measurement channel.
3. a kind of many Measurement channel built-in self-test circuit designs according to claim 1, it is characterised in that：In Kb-o-h and
Resistance Ry2 is connected between Kb-p-h, available for check meter measurement accuracy；In band switch Ka v gears, band switch
In the case that Kb h gears are connected, from JC1, JC2 end can check meter measurement accuracy, while can also check (JC1 to Ka-
Mo), (JC2 to Ka-Mp), (Ka-o-v to Kb-Mo), the connected state of (Ka-p-v to Kb-Mp) each section of Measurement channel.
4. a kind of many Measurement channel built-in self-test circuit designs according to claim 1, it is characterised in that：It is another to include connection
Device (or adapter) SP (x), SP (y), SP (z), SP (m) be connected on Measurement channel (JC1 to Ka-Mo), (JC2 to Ka-Mp),
In (Ka-o-v to Kb-Mo), (Ka-p-v to Kb-Mp).
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| CN201710320350.XA CN107315152A (en) | 2017-04-28 | 2017-04-28 | A kind of many Measurement channel built-in self-test circuit designs |
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| CN201710320350.XA CN107315152A (en) | 2017-04-28 | 2017-04-28 | A kind of many Measurement channel built-in self-test circuit designs |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113504395A (en) * | 2021-08-05 | 2021-10-15 | 上海御渡半导体科技有限公司 | Method for detecting connectivity of ATE channel |
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Application publication date: 20171103 |