CN107246919B - A kind of control system and its refrigeration determination method of refrigeration type infrared detector - Google Patents
A kind of control system and its refrigeration determination method of refrigeration type infrared detector Download PDFInfo
- Publication number
- CN107246919B CN107246919B CN201710304463.0A CN201710304463A CN107246919B CN 107246919 B CN107246919 B CN 107246919B CN 201710304463 A CN201710304463 A CN 201710304463A CN 107246919 B CN107246919 B CN 107246919B
- Authority
- CN
- China
- Prior art keywords
- infrared detector
- refrigeration
- focal plane
- temperature
- microcontroller
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005057 refrigeration Methods 0.000 title claims abstract description 111
- 238000000034 method Methods 0.000 title claims abstract description 28
- 238000005070 sampling Methods 0.000 claims abstract description 26
- 230000008859 change Effects 0.000 claims description 10
- 238000012937 correction Methods 0.000 claims description 3
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
- 238000011010 flushing procedure Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 6
- 230000004044 response Effects 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000008014 freezing Effects 0.000 description 2
- 238000007710 freezing Methods 0.000 description 2
- 206010000234 Abortion spontaneous Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 208000015994 miscarriage Diseases 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 208000000995 spontaneous abortion Diseases 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B49/00—Arrangement or mounting of control or safety devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/068—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling parameters other than temperature
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/15—Power, e.g. by voltage or current
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/21—Temperatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mechanical Engineering (AREA)
- Thermal Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a kind of control systems of refrigeration type infrared detector and its refrigeration determination method, the system to include refrigeration type infrared detector, penetrate a grade follower, AD sampling module and microcontroller.The method that this method uses the temperature feedback of continuous Timing measurement focal plane infrared detector, it is modified according to the actual use situation focal plane operating temperature of infrared detector with respect to the functional relation of output voltage by the amending unit of microcontroller, again by the comprehensive descision unit of microcontroller to the variation slope of temperature versus time, stablize refrigeration work temperature, the time for reaching stable refrigeration work temperature carries out comprehensive descision, monitor the temperature of focal plane infrared detector in real time, reducing erroneous judgement leads to that focal plane infrared detector powers in advance or refrigeration machine has freezed good but focal plane infrared detector the case where can not powering on and Startup calibration is caused to fail.
Description
Technical field
The present invention relates to the control system of infrared thermal imaging technique field more particularly to a kind of refrigeration type infrared detector and
Its determination method that freezes.
Background technique
Infrared detection system has following several advantages: environmental suitability height, good concealment, the ability for identifying camouflaged target
By force, its is small in size, light-weight, low in energy consumption and compared with radar system.Due to infrared detection technique have the advantages that its it is unique to
It is widely studied and applied it in military and national defense and civil field, especially in the traction of military requirement and related skill
Under the promotion of art development, the infrared detection technique as new and high technology will more extensively in following application, and status is more important.
The core devices of infrared detection system are infrared detectors, due to making the material energy gap very little of infrared detector,
If environment temperature is high, dark current caused by being gushed as heat and thermal noise are big, directly influence signal-to-noise ratio, the response wave length of detector
With each index such as responsive time constant.In order to improve the performance of infrared detection system, it is necessary to reduce infrared spy by freezing
The operating temperature of device is surveyed, to contain the generation of dark current, increases signal-to-noise ratio.Infrared detector is after sub-cooled, the response time
Shortening, sensitivity raising, response wave length broadening, limited ambient noise reduce.
Infrared detector can be divided into refrigeration type infrared detector and non-refrigeration type infrared detector according to refrigeration modes.System
The stability of cold mould infrared detector operating temperature directly determines the performance of infrared detection system.Most of infrared spy in focal plane
Device is surveyed all to work in the humidity province 77K~80K.
It is setting one that tradition, which determines that refrigeration type infrared detector reaches stable refrigeration work temperature and the method for the operation is stable,
A temperature spot, when focal plane, infrared detector operating temperature reaches this temperature and is judged to freezing, and not up to then continues to freeze.But
The voltage data corresponding with operating temperature for being limited in that the output of focal plane infrared detector of the method, desired voltage signal
The curve of monotonic increase, but actual acquisition to voltage feedback signal be the curve for being gradually increased, and having many local extremums,
Traditional determination method setting fixed temperature value is determined just to will appear erroneous judgement, and the method does not consider the following aspects also
Influence:
1. the operating temperature of each focal plane infrared detector is different；
2. each focal plane infrared detector configures different disposal circuit, operating temperature can be variant；
3. environment temperature locating for the infrared detector of focal plane can also have an impact to its operating temperature.
It will lead to refrigeration type infrared detector in summary and reach stable refrigeration work temperature but far beyond set temperature
Point, and actually using the different stable refrigeration work temperature of situation is also dynamic change.Therefore just using traditional determination method
It cannot accurately determine whether refrigeration type infrared detector freezes, it is higher the probability judged by accident occur, influences refrigeration mode infrared acquisition
Device works normally.
Summary of the invention
The technical problem to be solved in the present invention is that for being difficult to accurately determine refrigeration type infrared detector in the prior art
Refrigerating state defect, the control system and its refrigeration determination method of a kind of refrigeration type infrared detector are provided.
The technical solution adopted by the present invention to solve the technical problems is:
The present invention provides a kind of control system of refrigeration type infrared detector, the refrigeration including being sequentially connected and forming loop
Type infrared detector, emitter follower, A/D sampling module and microcontroller, refrigeration type infrared detector include refrigeration machine and coke
Plane infrared detector；The output end of microcontroller is connected with refrigeration machine, the output end and emitter-base bandgap grading of focal plane infrared detector with
It is connected with device；Wherein:
Thermometric diode built in the infrared detector of focal plane, thermometric diode is with focal plane infrared detector operating temperature
Variation and itself resistance value changes, and then the output voltage of focal plane infrared detector is made to change；
Output voltage of the emitter follower for focal plane infrared detector inputs A/D sampling module after amplifying,
Data acquisition is carried out by A/D sampling module；
Microcontroller, including amending unit and comprehensive descision unit complete refrigeration for setting focal plane infrared detector
Operating temperature section, the collected data of A/D sampling module are sent to the amending unit in microcontroller and are modified, and are intended
Actual relationship curve is closed out, by comprehensive descision unit to the slope of the temperature data relative time variation in data office, Jiao Ping
The operating temperature of surface detector, and reach the time three of stable refrigeration work temperature and be compared, determine that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, passes through control
The motor running speed of refrigeration machine processed makes infrared detector work in focal plane in cryogenic temperature section.
The present invention provides a kind of refrigeration determination method of the control system of refrigeration type infrared detector, comprising the following steps:
Thermometric diode built in S1, focal plane infrared detector with focal plane infrared detector operating temperature variation
And itself resistance value changes, and then the output voltage of focal plane infrared detector is made to change；It is corresponding with temperature defeated
Voltage is input to A/D sampling module after emitter follower amplifies out, carries out data acquisition by A/D sampling module；
S2, setting continuous sampling interval time, the focal plane infrared detector work at multiple moment that every continuous acquisition is arrived
Make the corresponding voltage data of temperature to be modified by the amending unit of microcontroller, fits actual relationship curve, then by micro-
Slope of the comprehensive descision unit of controller to the temperature data relative time variation in data, the work temperature of focus planar detector
Degree, the time three for reaching stable refrigeration work temperature are compared, and determine whether focal plane infrared detector has reached stabilization
Refrigeration work temperature and steady operation；
S3, setting focal plane infrared detector completes the operating temperature section of refrigeration in the microcontroller, and A/D is sampled mould
The collected data of block are sent to microcontroller and are calculated, and the motor control amount of refrigeration machine is obtained by calculation, and are made by control
The motor running speed of cold makes infrared detector work in focal plane in cryogenic temperature section.
Further, the focal plane infrared detector at 3 moment arrived continuous acquisition in step S2 of the invention works
The corresponding voltage data of temperature is compared by microcontroller.
Further, by the power module of control refrigerating device inner in step S3 of the invention, to the motor of refrigeration machine
Running speed is controlled.
Further, pass through amending unit in step S2 of the invention to its operating temperature and corresponding voltage data relationship
It is fitted, the functional relation between the actual work temperature and output voltage of focal plane infrared detector are as follows:
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
Further, the focal plane infrared detector set in step S2 of the invention completes the operating temperature section of refrigeration
Are as follows: [T10,T20]=[50K, 90K], reach the time t of stable refrigeration work temperature0=10min, hot operation；8min, room temperature
Work.
Further, determine whether to reach the method for stable refrigeration work temperature and the operation is stable in step S3 of the invention
Are as follows:
Continuous sampling interval time t is set, t ,=tn+1-tn=tn-tn-1, n takes 2,3,4 ..., and N acquires t respectivelyn-1,
tn, tn+1The temperature voltage data of the focal plane infrared detector at three moment are converted to corresponding temperature T through amplificationn-1, Tn,
Tn+1It send to microcontroller, is compared by slope of the microcontroller to the temperature data relative time variation that adjacent continuous samples,
Slope calculation formula are as follows:
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, but Tn-1, Tn,Then determine the refrigeration machine event of focal plane infrared detector
Barrier；
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10,T20], though then determine that focal plane infrared detector reaches steady
It customizes cold operating temperature but refrigeration machine is not up to stable state；
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10,T20], tn+1≤t0Three conditions meet simultaneously, just sentence
Fixed-focus plane infrared detector has reached stable refrigeration work temperature, and the operation is stable.
The beneficial effect comprise that: the control system and its refrigeration of refrigeration type infrared detector of the invention determine
Method, it is contemplated that individual difference, use environment, the processing circuit of configuration and the acquisition module equal difference of refrigeration type infrared detector
It is different to cause its stable refrigeration work temperature different, using the refrigeration judgement side of this refrigeration type infrared detector of the invention
Method expands and stablizes refrigeration work temperature range, it is ensured that existing refrigeration type infrared detector is all suitable for；Refrigeration type infrared detector
Stablizing refrigeration work temperature is dynamic change, using the refrigeration determination method of this refrigeration type infrared detector of the invention,
It sets interval, acquires the temperature voltage data of focal plane infrared detector in real time, and will continuously acquire data progress three times
It compares to determine, effectively reduces traditional determination method probability of miscarriage of justice, it is ensured that refrigeration type infrared detector works normally.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is the system block diagram of the embodiment of the present invention；
Fig. 2 is the microcontroller functional block diagram of the embodiment of the present invention；
Fig. 3 is the revised temperature and voltage relationship matched curve figure of the embodiment of the present invention；
Fig. 4 is the temperature and time graph of relation of the embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that described herein, specific examples are only used to explain the present invention, not
For limiting the present invention.
As shown in Figure 1, the control system of the refrigeration type infrared detector of the embodiment of the present invention, including be sequentially connected and form
The refrigeration type infrared detector of loop, emitter follower, A/D sampling module and microcontroller, refrigeration type infrared detector include
Refrigeration machine and focal plane infrared detector；The output end of microcontroller is connected with refrigeration machine, the output of focal plane infrared detector
End is connected with emitter follower；Wherein:
Thermometric diode built in the infrared detector of focal plane, thermometric diode is with focal plane infrared detector operating temperature
Variation and itself resistance value changes, and then the output voltage of focal plane infrared detector is made to change；
Output voltage of the emitter follower for focal plane infrared detector inputs A/D sampling module after amplifying,
Data acquisition is carried out by A/D sampling module；
Microcontroller, including amending unit and comprehensive descision unit complete refrigeration for setting focal plane infrared detector
Operating temperature section, the collected data of A/D sampling module are sent to the amending unit in microcontroller and are modified, and are intended
Actual relationship curve is closed out, by comprehensive descision unit to the slope of the temperature data relative time variation in data office, Jiao Ping
The operating temperature of surface detector, and reach the time three of stable refrigeration work temperature and be compared, determine that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, passes through control
The motor running speed of refrigeration machine processed makes infrared detector work in focal plane in cryogenic temperature section.
As shown in Fig. 2, the refrigeration determination method of the control system of the refrigeration type infrared detector of the embodiment of the present invention, including
Following steps:
Thermometric diode built in S1, focal plane infrared detector with focal plane infrared detector operating temperature variation
And itself resistance value changes, and then the output voltage of focal plane infrared detector is made to change；It is corresponding with temperature defeated
Voltage is input to A/D sampling module after emitter follower amplifies out, carries out data acquisition by A/D sampling module；
S2, setting continuous sampling interval time, the focal plane infrared detector work at multiple moment that every continuous acquisition is arrived
Make the corresponding voltage data of temperature (such as table 1) to be modified by the amending unit of microcontroller, fits actual relationship curve (such as
Shown in Fig. 3), then pass through slope K of the comprehensive descision unit to the temperature data relative time variation in data of microcontroller, it is burnt
The work temperature of planar detector, the time t three for reaching stable refrigeration work temperature are compared, and determine that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation.
The operating temperature and output voltage tables of data of 1 focal plane infrared detector of table
S3, setting focal plane infrared detector completes the operating temperature section of refrigeration in the microcontroller, and A/D is sampled mould
The collected data of block are sent to microcontroller and are calculated, and the motor control amount of refrigeration machine is obtained by calculation, and are made by control
The motor running speed of cold makes infrared detector work in focal plane in cryogenic temperature section；
Function in step S2 of the invention between the actual work temperature and output voltage of focal plane infrared detector closes
System are as follows:
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
The focal plane infrared detector set in step S3 of the invention completes the operating temperature section of refrigeration are as follows: [T10,
T20]=[50K, 90K], reach the time t of stable refrigeration work temperature0=10min (hot operation), 8min (room temperature work).
As shown in figure 4, determining whether to reach the method for stable refrigeration work temperature in step S3 of the invention are as follows: setting connects
Continuous sampling interval duration t, t ,=tn+1-tn=tn-tn-1, n takes 2,3,4 ..., and N acquires t respectivelyn-1, tn, tn+1Three moment
The temperature voltage data of focal plane infrared detector are converted to corresponding temperature T through amplificationn-1, Tn, Tn+1It send to microcontroller,
It is compared by slope of the microcontroller to the temperature data relative time variation that adjacent continuous samples, slope calculation formula are as follows:
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, but Tn-1, Tn,Then determine the refrigeration machine event of focal plane infrared detector
Barrier.
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10,T20], though then determine that focal plane infrared detector reaches steady
It customizes cold operating temperature but refrigeration machine is not up to stable state.
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10,T20], tn+1≤t0Three conditions meet simultaneously, just may be used
Determine that focal plane infrared detector has reached stable refrigeration work temperature, and the operation is stable.
It should be understood that for those of ordinary skills, it can be modified or changed according to the above description,
And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.
Claims (4)
1. a kind of refrigeration determination method of the control system of refrigeration type infrared detector, which is characterized in that infrared by refrigeration mode
The control system of detector realizes that the system includes the refrigeration type infrared detector for being sequentially connected and forming loop, emitter following
Device, A/D sampling module and microcontroller, refrigeration type infrared detector include refrigeration machine and focal plane infrared detector；Microcontroller
The output end of device is connected with refrigeration machine, and the output end of focal plane infrared detector is connected with emitter follower；Wherein:
Thermometric diode built in the infrared detector of focal plane, thermometric diode with focal plane infrared detector operating temperature change
Change and itself resistance value changes, and then the output voltage of focal plane infrared detector is made to change；
Output voltage of the emitter follower for focal plane infrared detector inputs A/D sampling module after amplifying, by A/D
Sampling module carries out data acquisition；
Microcontroller, including amending unit and comprehensive descision unit complete the work of refrigeration for setting focal plane infrared detector
Make temperature range, the collected data of A/D sampling module are sent to the amending unit in microcontroller and are modified, and are fitted
Actual relationship curve, by comprehensive descision unit to the slope of the temperature data relative time variation in data office, focal plane is visited
The operating temperature of device is surveyed, and reaches the time three of stable refrigeration work temperature and is compared, determines focal plane infrared acquisition
Whether device has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, is made by control
The motor running speed of cold makes infrared detector work in focal plane in cryogenic temperature section；
Method includes the following steps:
Thermometric diode built in S1, focal plane infrared detector with the variation of focal plane infrared detector operating temperature and from
Body resistance value changes, and then the output voltage of focal plane infrared detector is made to change；Output electricity corresponding with temperature
Pressure is input to A/D sampling module after emitter follower amplifies, and carries out data acquisition by A/D sampling module；
S2, setting continuous sampling interval time, the focal plane infrared detector at multiple moment that every continuous acquisition is arrived work warm
It spends corresponding voltage data to be modified by the amending unit of microcontroller, fits actual relationship curve, then pass through microcontroller
Slope of the comprehensive descision unit of device to the temperature data relative time variation in data, the operating temperature of focus planar detector,
The time three for reaching stable refrigeration work temperature is compared, and determines whether focal plane infrared detector has reached stable refrigeration
Operating temperature and steady operation；
S3, setting focal plane infrared detector completes the operating temperature section of refrigeration in the microcontroller, and A/D sampling module is adopted
The data collected are sent to microcontroller and are calculated, and the motor control amount of refrigeration machine is obtained by calculation, by controlling refrigeration machine
Motor running speed, make focal plane infrared detector work in cryogenic temperature section；
The focal plane infrared detector set in step S2 completes the operating temperature section of refrigeration are as follows: [T10,T20]=[50K,
90K], reach the time t of stable refrigeration work temperature0=10min, hot operation；8min, room temperature work；
Determine whether to reach the method for stable refrigeration work temperature and the operation is stable in step S3 are as follows:
Continuous sampling interval time t ', t '=t are setn+1-tn=tn-tn-1, n takes 2,3,4 ..., and N acquires t respectivelyn-1, tn, tn+1
The temperature voltage data of the focal plane infrared detector at three moment are converted to corresponding temperature T through amplificationn-1, Tn, Tn+1Send to
Microcontroller is compared, slope meter by slope of the microcontroller to the temperature data relative time variation that adjacent continuous samples
Calculate formula are as follows:
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, butThen determine the refrigeration machine failure of focal plane infrared detector；
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10,T20], though then determine that focal plane infrared detector reaches stable system
Cold operating temperature but refrigeration machine is not up to stable state；
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10,T20], tn+1≤t0Three conditions meet simultaneously, just determine burnt flat
Flushing external detector has reached stable refrigeration work temperature, and the operation is stable.
2. the refrigeration determination method of the control system of refrigeration type infrared detector according to claim 1, which is characterized in that
In step S2 by continuous acquisition to the corresponding voltage data of focal plane infrared detector operating temperature at 3 moment pass through micro-control
Device processed is compared.
3. the refrigeration determination method of the control system of refrigeration type infrared detector according to claim 1, which is characterized in that
By the power module of control refrigerating device inner in step S3, the motor running speed of refrigeration machine is controlled.
4. the refrigeration determination method of the control system of refrigeration type infrared detector according to claim 1, which is characterized in that
Its operating temperature and corresponding voltage data relationship are fitted by amending unit in step S2, focal plane infrared detector
Actual work temperature and output voltage between functional relation are as follows:
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710304463.0A CN107246919B (en) | 2017-05-03 | 2017-05-03 | A kind of control system and its refrigeration determination method of refrigeration type infrared detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710304463.0A CN107246919B (en) | 2017-05-03 | 2017-05-03 | A kind of control system and its refrigeration determination method of refrigeration type infrared detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107246919A CN107246919A (en) | 2017-10-13 |
| CN107246919B true CN107246919B (en) | 2019-08-23 |
Family
ID=60016451
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710304463.0A Active CN107246919B (en) | 2017-05-03 | 2017-05-03 | A kind of control system and its refrigeration determination method of refrigeration type infrared detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107246919B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110907041A (en) * | 2019-12-06 | 2020-03-24 | 中国空空导弹研究院 | Refrigeration state judgment system of refrigeration type infrared focal plane detector |
| CN111765979A (en) * | 2020-06-05 | 2020-10-13 | 威图视觉系统(深圳)有限公司 | Infrared thermal imaging measurement data analysis combined compensation temperature calibration method |
| CN112284552B (en) * | 2020-09-09 | 2023-12-22 | 中国航空工业集团公司洛阳电光设备研究所 | Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector |
| CN114244978B (en) * | 2021-11-25 | 2024-08-06 | 中国空间技术研究院 | Reliability management system and method for infrared camera with infrared refrigerator |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1304067A (en) * | 1999-12-09 | 2001-07-18 | 特克特朗尼克公司 | heat control system for testing and measuring device |
| WO2003006161A2 (en) * | 2001-07-11 | 2003-01-23 | Dongqing Li | Microchannel thermal reactor |
| US7317505B2 (en) * | 2003-11-07 | 2008-01-08 | Canon Kabushiki Kaisha | Exposure apparatus and device manufacturing method |
| CN101319969A (en) * | 2008-06-19 | 2008-12-10 | 浙江工业大学 | Method and device for rapid evaluation of cooling quality of small compression refrigeration appliances |
| CN201229510Y (en) * | 2008-07-15 | 2009-04-29 | 湖北研博光电科技有限公司 | High precision temperature control device for infrared focus plane |
-
2017
- 2017-05-03 CN CN201710304463.0A patent/CN107246919B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1304067A (en) * | 1999-12-09 | 2001-07-18 | 特克特朗尼克公司 | heat control system for testing and measuring device |
| WO2003006161A2 (en) * | 2001-07-11 | 2003-01-23 | Dongqing Li | Microchannel thermal reactor |
| US7317505B2 (en) * | 2003-11-07 | 2008-01-08 | Canon Kabushiki Kaisha | Exposure apparatus and device manufacturing method |
| CN101319969A (en) * | 2008-06-19 | 2008-12-10 | 浙江工业大学 | Method and device for rapid evaluation of cooling quality of small compression refrigeration appliances |
| CN201229510Y (en) * | 2008-07-15 | 2009-04-29 | 湖北研博光电科技有限公司 | High precision temperature control device for infrared focus plane |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107246919A (en) | 2017-10-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107246919B (en) | A kind of control system and its refrigeration determination method of refrigeration type infrared detector | |
| Cho et al. | Postsilicon voltage guard-band reduction in a 22 nm graphics execution core using adaptive voltage scaling and dynamic power gating | |
| US9797799B2 (en) | Intelligent adaptive system and method for monitoring leakage of oil pipeline networks based on big data | |
| CN109782827A (en) | Cooling control method and equipment, electronic equipment and computer readable storage medium | |
| US7796948B2 (en) | Method and apparatus for optimizing radio performance through inferred knowledge of indoor-outdoor radio status | |
| CN106482748B (en) | A kind of interference type optical fiber gyroscope random walk method for diagnosing faults | |
| CN111114792B (en) | Icing sensor and method capable of calculating icing rate | |
| CN108170179A (en) | A kind of temprature control method based on non-refrigeration type infrared imaging component | |
| Zhang et al. | Cleaning environmental sensing data streams based on individual sensor reliability | |
| Parida et al. | A thermal imaging based wireless sensor network for automatic water leakage detection in distribution pipes | |
| US11990023B2 (en) | Method of predicting the risk of a liquid freezing | |
| Ping | Analysis of ocean clutter for wide-band radar based on real data | |
| CN102890160B (en) | Detecting method and detecting device of wind measuring equipment | |
| CN114166356B (en) | PIR threshold adjustment method, PIR threshold adjustment system and monitoring device | |
| CN105466064A (en) | Universal split type linear stirling refrigerator driving method and driving circuit | |
| CN109211980A (en) | Device for monitoring icing and method based on Piezoelectric Impedance principle | |
| CN106708130A (en) | Semiconductor refrigeration temperature control system | |
| CN109445506B (en) | Portable voltage tracking type constant current source module | |
| JP2018160076A (en) | Abnormality determination device and abnormality determination method | |
| Ai et al. | Characterization of a traffic management system using pyroelectric infrared sensors | |
| Zhang et al. | Reduce or remove: Individual sensor reliability profiling and data cleaning | |
| CN113899573B (en) | Detection device and detection method for refrigerator procedure test | |
| CN110277834A (en) | A method, system, and storage medium for monitoring internal loads of a grid-responsive building | |
| CN107025162A (en) | Adjust the system and method for data collection frequencies | |
| Song et al. | Research on High Precision Cryocooler Control System for Satellite-Borne |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |