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CN107180778A - A kind of wafer jig for capillary processing - Google Patents

A kind of wafer jig for capillary processing Download PDF

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Publication number
CN107180778A
CN107180778A CN201710580760.8A CN201710580760A CN107180778A CN 107180778 A CN107180778 A CN 107180778A CN 201710580760 A CN201710580760 A CN 201710580760A CN 107180778 A CN107180778 A CN 107180778A
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China
Prior art keywords
wafer
hole
support seat
inlet channel
capillary processing
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CN201710580760.8A
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Chinese (zh)
Inventor
高健
陈伟帆
陈新
陈云
贺云波
汤晖
杨志军
张昱
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Guangdong University of Technology
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Guangdong University of Technology
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Priority to CN201710580760.8A priority Critical patent/CN107180778A/en
Publication of CN107180778A publication Critical patent/CN107180778A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67069Apparatus for fluid treatment for etching for drying etching

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

本发明公开一种用于微孔加工的晶圆夹具,包括环状支撑座、进气通道、出气通道、固定件,环状支撑座中间开设悬空孔,晶圆边缘由环状支撑座支撑,当晶圆的中间正对悬空孔放置时,晶圆的中心用于刻蚀的位置呈悬空,可以用于激光刻蚀加工微孔;进气通道和出气通道分别开设于环状支撑座的周向侧壁上,使悬空孔与外界保持横向连通,出气通道与进气通道相对设置;固定件与晶圆的边缘接触,将晶圆压装固定于环状支撑座的上表面。晶圆正上方设置吹气装置,当微孔打通后将晶圆上微孔中的碎屑向下吹送至悬空孔内,碎屑随进气通道进入的气流从出气通道向外排出,避免碎屑在晶圆的微孔加工处堆积,进而避免碎屑产生溅射层,提高微孔深径比。

The invention discloses a wafer fixture for micro-hole processing, which comprises an annular support seat, an air inlet channel, an air outlet channel, and a fixing piece. A suspended hole is set in the middle of the annular support seat, and the edge of the wafer is supported by the annular support seat. When the middle of the wafer is placed against the suspended hole, the center of the wafer is suspended for etching, which can be used for laser etching to process micro-holes; the air inlet channel and the air outlet channel are respectively opened on the circumference of the ring support seat On the side wall, the suspension hole is kept in transverse communication with the outside world, and the air outlet channel and the air inlet channel are arranged opposite to each other; the fixing piece contacts the edge of the wafer, and the wafer is press-fitted and fixed on the upper surface of the ring-shaped support seat. An air blowing device is set directly above the wafer. When the micropores are opened, the debris in the micropores on the wafer is blown downward into the suspended hole. The debris enters the airflow from the air inlet channel and is discharged from the air outlet channel to avoid debris. The debris accumulates at the micro-hole processing of the wafer, thereby preventing the debris from producing a sputtering layer and improving the micro-hole depth-to-diameter ratio.

Description

一种用于微孔加工的晶圆夹具A wafer fixture for micro-hole processing

技术领域technical field

本发明涉及半导体加工技术领域,更进一步涉及一种用于微孔加工的晶圆夹具。The invention relates to the technical field of semiconductor processing, and further relates to a wafer fixture for microhole processing.

背景技术Background technique

目前,三维封装芯片微孔的加工方法主要分为干法刻蚀、湿法刻蚀和激光打孔刻蚀等几种方式,激光微孔加工为非接触式打孔,设备可移植性高等特性受到广泛关注。激光微孔加工应用于众多场合,例如PCB板的微孔加工,激光切割孔等。在三维芯片封装的微孔加工方面,常常需要对材料芯片进行三维微孔加工,并要求微孔具有较高的径深比、良好的圆整度、几乎无重铸层、极小的热影响区以及孔壁光滑无锥度等。At present, the processing methods of micro-holes in three-dimensional packaging chips are mainly divided into dry etching, wet etching and laser drilling and etching. Laser micro-hole processing is non-contact drilling, and the equipment has high portability. Widespread concern. Laser micro-hole processing is used in many occasions, such as micro-hole processing of PCB boards, laser cutting holes, etc. In the microhole processing of three-dimensional chip packaging, it is often necessary to process three-dimensional microholes on the material chip, and the microholes are required to have a high diameter-to-depth ratio, good roundness, almost no recasting layer, and minimal thermal influence The area and the hole wall are smooth without taper, etc.

但目前激光微孔成型的质量普遍不高,存在微孔的径深比不高、出入口圆整度低、通孔锥度等问题。传统的激光微孔加工过程中,晶圆在机械固定或者吸盘固定的夹具上进行,如图1所示,为现有技术中一种晶圆夹具的结构示意图,晶圆片放置于底座01上,通过四周的限位圆环02实现限位和固定。在大量激光高深径比微孔加工实验中发现,加工碎屑的排除对加工质量有关键性影响。碎屑吸收激光能量,激光能量无法传递到微孔的底部,无法进行加工出高深度的微孔;传统加工过程碎屑只能向上排出,在此过程中,往上飞溅的碎屑吸收后续激光的能量,使加工过程缓慢,能量在孔上方累积,增大孔径,同时碎屑吸收能量使碎屑溅射到孔壁上,孔壁粗糙度增加,加大的重铸层。However, the quality of laser microhole forming is generally not high at present, and there are problems such as low diameter-to-depth ratio of microholes, low roundness of entrance and exit, and through-hole taper. In the traditional laser micro-hole processing process, the wafer is carried out on a mechanically fixed or chuck-fixed fixture, as shown in Figure 1, which is a schematic structural diagram of a wafer fixture in the prior art, and the wafer is placed on the base 01 , The limit and fixation are realized through the limit ring 02 around. In a large number of laser high-depth-diameter ratio micro-hole machining experiments, it was found that the removal of machining debris has a key influence on the machining quality. The debris absorbs the laser energy, and the laser energy cannot be transmitted to the bottom of the microhole, so it is impossible to process a high-depth microhole; the debris can only be discharged upward in the traditional processing process, and the debris splashed upward absorbs the subsequent laser during the process The energy makes the machining process slow, and the energy accumulates above the hole, increasing the hole diameter. At the same time, the debris absorbs the energy and makes the debris sputter onto the hole wall, increasing the roughness of the hole wall, and increasing the recasting layer.

对于本领域的技术人员来说,如何设计一种能够及时排除加工过程产生的碎屑的装置,是目前需要解决的技术问题。For those skilled in the art, how to design a device that can remove debris generated during the machining process in time is a technical problem that needs to be solved at present.

发明内容Contents of the invention

本发明提供一种用于微孔加工的晶圆夹具,可以及时将刻蚀产生的碎屑排出,从而提高加工质量,具体方案如下:The present invention provides a wafer fixture for micro-hole processing, which can discharge the debris generated by etching in time, thereby improving the processing quality. The specific scheme is as follows:

一种用于微孔加工的晶圆夹具,包括:A wafer fixture for microvia machining, comprising:

环状支撑座,中间开设悬空孔;晶圆的中间正对所述悬空孔悬空放置,其边缘由所述环状支撑座支撑;A ring-shaped support seat with a suspension hole in the middle; the middle of the wafer is placed in the air facing the suspension hole, and its edge is supported by the ring-shaped support seat;

进气通道,开设于所述环状支撑座的周向侧壁上,使所述悬空孔与外界保持横向连通;The air intake channel is opened on the circumferential side wall of the annular support seat, so that the suspended hole is kept in lateral communication with the outside world;

出气通道,开设于所述环状支撑座的周向侧壁上,使所述悬空孔与外界保持横向连通,所述出气通道与所述进气通道相对设置;晶圆正上方设置吹气装置,将晶圆上微孔中的碎屑向下吹送至所述悬空孔内,并随所述进气通道进入的气流从所述出气通道向外排出;The air outlet channel is opened on the circumferential side wall of the annular support seat, so that the suspended hole is kept in lateral communication with the outside world, the air outlet channel is arranged opposite to the air inlet channel; an air blowing device is arranged directly above the wafer , blowing the debris in the micropores on the wafer downwards into the suspended holes, and discharging the airflow from the air outlet channel along with the air inlet channel;

固定件,与晶圆的边缘接触,将晶圆压装固定于所述环状支撑座的上表面。The fixing part is in contact with the edge of the wafer, and press-fits and fixes the wafer on the upper surface of the ring-shaped support seat.

可选地,所述固定件包括相互固定连接的橡胶层和金属层,下层的所述橡胶层用于与晶圆压接;所述橡胶层和所述金属层对应贯通开设固定孔,通过所述固定孔与所述环状支撑座采用螺栓连接固定。Optionally, the fixing member includes a rubber layer and a metal layer that are fixedly connected to each other, and the rubber layer in the lower layer is used for crimping with the wafer; the rubber layer and the metal layer are correspondingly provided with fixing holes, through which the The fixing hole and the annular support seat are fixed by bolt connection.

可选地,所述固定件靠近晶圆的侧壁为圆弧面,圆弧面的圆弧直径大于或等于所述悬空孔的直径。Optionally, the side wall of the fixing member close to the wafer is an arc surface, and the arc diameter of the arc surface is greater than or equal to the diameter of the suspension hole.

可选地,所述环状支撑座的上表面沿所述悬空孔的周向开设定位槽,所述定位槽的尺寸略大于晶圆的圆周,且其深度小于或等于晶圆的厚度。Optionally, a positioning groove is defined on the upper surface of the annular support seat along the circumference of the suspension hole, the size of the positioning groove is slightly larger than the circumference of the wafer, and its depth is less than or equal to the thickness of the wafer.

可选地,所述定位槽上设置标志线,所述标示线与晶圆上的定位缺口的形状及尺寸相同。Optionally, marking lines are set on the positioning grooves, and the marking lines are the same in shape and size as the positioning notches on the wafer.

可选地,所述环状支撑座的上表面还设置取放槽,所述取放槽位于所述定位槽周向之外,且深度大于所述定位槽。Optionally, the upper surface of the annular support seat is further provided with a pick-and-place groove, and the pick-and-place groove is located outside the circumferential direction of the positioning groove and has a depth greater than that of the positioning groove.

可选地,所述进气通道为螺纹孔,用于连接气嘴;所述出气通道为纵截面呈矩形的通孔,尺寸大于所述进气通道。Optionally, the air inlet passage is a threaded hole for connecting an air nozzle; the air outlet passage is a through hole with a rectangular longitudinal section, and its size is larger than that of the air inlet passage.

可选地,所述进气通道的上端距离放置到位的晶圆下表面的间距为0.5~1.5mm。Optionally, the distance between the upper end of the air inlet channel and the lower surface of the placed wafer is 0.5-1.5 mm.

可选地,所述环状支撑座沿竖直向设置固定螺孔,所述固定螺孔沿周向分布。Optionally, the annular support seat is provided with fixing screw holes along the vertical direction, and the fixing screw holes are distributed along the circumferential direction.

可选地,晶圆上方的吹气装置向下吹送氮气,与所述进气通道连接的气嘴吹送空气。Optionally, the blowing device above the wafer blows nitrogen downward, and the gas nozzle connected to the air inlet channel blows air.

本发明提供了一种用于微孔加工的晶圆夹具,包括环状支撑座、进气通道、出气通道、固定件等结构,环状支撑座中间开设悬空孔,晶圆边缘由环状支撑座支撑,当晶圆的中间正对悬空孔放置时,晶圆的中心用于刻蚀的位置呈悬空,可以用于激光刻蚀加工微孔;进气通道和出气通道分别开设于环状支撑座的周向侧壁上,使悬空孔与外界保持横向连通,出气通道与进气通道相对设置;固定件与晶圆的边缘接触,将晶圆压装固定于环状支撑座的上表面。The invention provides a wafer fixture for micro-hole processing, which includes structures such as an annular support seat, an air inlet channel, an air outlet channel, and a fixing piece. A suspended hole is set in the middle of the annular support seat, and the edge of the wafer is supported by an annular shape. Seat support, when the middle of the wafer is placed directly against the suspended hole, the center of the wafer is suspended for etching, which can be used for laser etching to process micro-holes; the air inlet channel and the air outlet channel are respectively opened on the ring support On the circumferential side wall of the seat, the suspension hole is kept in transverse communication with the outside world, and the air outlet channel and the air intake channel are arranged oppositely; the fixing member contacts the edge of the wafer, and the wafer is press-fitted and fixed on the upper surface of the ring-shaped support seat.

晶圆正上方设置吹气装置,当微孔打通后将晶圆上微孔中的碎屑向下吹送至悬空孔内,碎屑随进气通道进入的气流从出气通道向外排出,避免碎屑在晶圆的微孔加工处堆积,进而避免碎屑产生的溅射层,提高微孔的深径比。An air blowing device is set directly above the wafer. When the micropores are opened, the debris in the micropores on the wafer is blown downward into the suspended hole. The debris enters the airflow from the air inlet channel and is discharged from the air outlet channel to avoid debris. Chips accumulate at the micro-hole processing of the wafer, thereby avoiding the sputtering layer generated by the chips and improving the depth-to-diameter ratio of the micro-holes.

附图说明Description of drawings

为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

图1为现有技术中一种晶圆夹具的结构示意图;FIG. 1 is a schematic structural diagram of a wafer fixture in the prior art;

图2为本发明提供的用于微孔加工的晶圆夹具一种具体实施方式的结构示意图;FIG. 2 is a structural schematic diagram of a specific embodiment of a wafer fixture for microhole processing provided by the present invention;

图3为气体循环的示意图;Fig. 3 is the schematic diagram of gas circulation;

图4为固定件的一种具体结构图。Fig. 4 is a specific structural diagram of the fixing member.

其中包括:These include:

环状支撑座1、悬空孔11、进气通道12、出气通道13、定位槽14、标志线15、取放槽16、固定螺孔17、固定件2、橡胶层21、金属层22、固定孔23。Annular support base 1, suspension hole 11, air intake channel 12, air outlet channel 13, positioning groove 14, marking line 15, access groove 16, fixing screw hole 17, fixing piece 2, rubber layer 21, metal layer 22, fixing Hole 23.

具体实施方式detailed description

本发明的核心在于提供一种用于微孔加工的晶圆夹具,可以及时将刻蚀产生的碎屑排出,从而提高加工质量。The core of the present invention is to provide a wafer fixture for micro-hole processing, which can discharge debris generated by etching in time, thereby improving processing quality.

为了使本领域的技术人员更好地理解本发明的技术方案,下面将结合附图及具体的实施方式,对本发明的晶圆夹具进行详细的介绍说明。In order to enable those skilled in the art to better understand the technical solutions of the present invention, the wafer holder of the present invention will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

如图2所示,为本发明提供的用于微孔加工的晶圆夹具一种具体实施方式的结构示意图。其中包括环状支撑座1、进气通道12、出气通道13、固定件2等结构,环状支撑座1是主体的支撑结构,用于放置晶圆片,环状支撑座1用于与其他结构相连接。环状支撑座1中间开设悬空孔11,悬空孔11呈上下贯通设置,晶圆放置于悬空孔11上,其边缘由环状支撑座1支撑,晶圆的中间正对悬空孔11悬空放置。As shown in FIG. 2 , it is a structural schematic diagram of a specific embodiment of a wafer fixture for micro-hole processing provided by the present invention. It includes structures such as an annular support seat 1, an air inlet passage 12, an air outlet passage 13, and a fixing member 2. The annular support seat 1 is the supporting structure of the main body for placing wafers, and the annular support seat 1 is used for connecting with other structure connected. A suspension hole 11 is provided in the middle of the ring-shaped support base 1, and the suspension hole 11 is vertically connected. The wafer is placed on the suspension hole 11, and its edge is supported by the ring-shaped support base 1.

进气通道12开设于环状支撑座1的周向侧壁上,呈横向贯通设置,使悬空孔12与外界保持横向连通;出气通道13开设于环状支撑座1的周向侧壁上,使悬空孔11与外界保持横向连通;出气通道13与进气通道12相对设置,从进气通道12中进入的气体可以直接从出气通道13中向外排出,不受阻碍。The air inlet channel 12 is opened on the circumferential side wall of the annular support seat 1, and is arranged horizontally through, so that the suspended hole 12 is kept in transverse communication with the outside world; the air outlet channel 13 is opened on the circumferential side wall of the annular support seat 1, Keep the suspended hole 11 in horizontal communication with the outside world; the gas outlet channel 13 is arranged opposite to the inlet channel 12, and the gas entering from the inlet channel 12 can be directly discharged from the outlet channel 13 without hindrance.

除了环状支撑座1及其附属部件之外,在晶圆正上方还设置吹气装置,如图3所示,为气体循环的示意图,晶圆上方吹气装置的气流为A,吹送方向沿微孔的开设方向,将晶圆上微孔中的碎屑向下吹送至悬空孔11内,并随进气通道12进入的气流从出气通道13向外排出,为B,通过相互交叉的气流,将激光刻蚀过程中产生的碎屑及时排出到外部。In addition to the annular support base 1 and its accessories, a gas blowing device is also provided directly above the wafer, as shown in Figure 3, which is a schematic diagram of gas circulation. The air flow of the gas blowing device above the wafer is A, and the blowing direction is along the The opening direction of the microholes blows the debris in the microholes on the wafer downward into the suspended hole 11, and the airflow entering the air inlet channel 12 is discharged from the air outlet channel 13, which is B, through the intersecting airflow , to discharge the debris generated during the laser etching process to the outside in time.

固定件2与晶圆的边缘接触,将晶圆压装固定于环状支撑座1的上表面,起到固定晶圆的作用。采用本发明提供的晶圆夹具,当晶圆夹装定位后,其中间部分为悬空状态;在微孔刻蚀贯通之前,通过晶圆上方的吹气装置将产生的碎屑及时吹出,此时碎屑从晶圆的上方排出,减少碎屑的积累,提供相对良好的加工条件;当微孔贯通之后,在上方气流的吹动下,碎屑会沿着微孔从下方排出,进气通道12中通入气流,进入到悬空孔11中之后,沿着进气通道12和出气通道13这条通路向外排出。The fixing member 2 is in contact with the edge of the wafer, and press-fits and fixes the wafer on the upper surface of the ring-shaped support seat 1 to play the role of fixing the wafer. With the wafer fixture provided by the present invention, when the wafer fixture is positioned, its middle part is in a suspended state; before the micropores are etched through, the debris generated is blown out in time through the blowing device above the wafer. Chips are discharged from the top of the wafer, reducing the accumulation of chips and providing relatively good processing conditions; when the micro-holes are penetrated, under the blowing of the upper airflow, the chips will be discharged from the bottom along the micro-holes, and the air intake channel 12 into the air flow, after entering the suspension hole 11, along the path of the air inlet passage 12 and the air outlet passage 13 to be discharged outwards.

相对于只能向上排出的排屑方式,本发明将晶圆悬空设置,在下方设置碎屑排出的通道,在微孔刚形成时,即可使碎屑向下方排出,加速了排屑效率,增加出口的直径,减小通孔锥度。Compared with the chip removal method that can only be discharged upward, the present invention places the wafer in the air, and sets the chip discharge channel below. When the micropores are just formed, the chips can be discharged downward, which accelerates the chip removal efficiency. Increase the diameter of the outlet and reduce the taper of the through hole.

在上述方案的基础上,如图4所示,为固定件2的一种具体结构图,固定件2包括相互固定连接的橡胶层21和金属层22,橡胶层21在下,金属层22在上,下层的橡胶层21用于与晶圆压接,橡胶可以柔性变形,避免压坏晶圆;橡胶层21和金属层22对应贯通开设固定孔23,固定孔23贯穿橡胶层21和金属层22,通过固定孔23与环状支撑座1采用螺栓连接固定,螺栓插入固定孔23中,并与环状支撑座1上相应的螺纹孔连接,即可实现固定。On the basis of the above scheme, as shown in Figure 4, it is a specific structural diagram of the fixing part 2, the fixing part 2 includes a rubber layer 21 and a metal layer 22 fixedly connected to each other, the rubber layer 21 is on the bottom, and the metal layer 22 is on the top , the lower rubber layer 21 is used for crimping with the wafer, and the rubber can be flexibly deformed to avoid crushing the wafer; the rubber layer 21 and the metal layer 22 are correspondingly opened with a fixing hole 23, and the fixing hole 23 runs through the rubber layer 21 and the metal layer 22 , through the fixing hole 23 and the ring-shaped support seat 1 adopting bolt connection and fixing, the bolt is inserted in the fixing hole 23, and connected with the corresponding threaded hole on the ring-shaped support seat 1, and then the fixing can be realized.

固定件2优选地设置两块,当然,若为一个完整的圆环状结构也是可以的。固定件2靠近晶圆的侧壁为圆弧面,此侧壁可称为内侧壁,为靠近圆心的一侧,圆弧面的圆弧直径大于或等于悬空孔11的直径,当与环状支撑座1相互固定连接后,固定件2的内侧面与悬空孔11的外周恰好重合、或者与悬空孔11的外周有一小段距离,从而避免压到晶圆的悬空部分。The fixing part 2 is preferably provided with two pieces, of course, if it is a complete circular structure, it is also possible. The side wall of the fixing member 2 close to the wafer is an arc surface, and this side wall can be called the inner wall, which is the side close to the center of the circle. The arc diameter of the arc surface is greater than or equal to the diameter of the suspension hole 11. After the support bases 1 are fixedly connected to each other, the inner surface of the fixing member 2 coincides with the outer periphery of the floating hole 11 or has a small distance from the outer periphery of the floating hole 11, so as to avoid pressing on the floating part of the wafer.

为了方便对晶圆进行定位,在环状支撑座1的上表面沿悬空孔11的周向开设定位槽14,定位槽14的尺寸略大于晶圆的圆周,使晶圆可以完全放入;定位槽14的深度小于或等于晶圆的厚度,当晶圆放置后可以恰好与环状支撑座1的上表面齐平或者略高于环状支撑座1的上表面,以方便固定件2夹持定位。优选地,定位槽14环状结构的宽度可为10mm,使晶圆加工处均呈悬浮状态。In order to facilitate the positioning of the wafer, a positioning groove 14 is provided on the upper surface of the annular support seat 1 along the circumference of the suspension hole 11, and the size of the positioning groove 14 is slightly larger than the circumference of the wafer, so that the wafer can be completely put in; positioning The depth of the groove 14 is less than or equal to the thickness of the wafer. When the wafer is placed, it can be just flush with or slightly higher than the upper surface of the annular support base 1, so as to facilitate the clamping of the fixture 2. position. Preferably, the width of the annular structure of the positioning groove 14 may be 10 mm, so that all wafer processing locations are in a suspended state.

定位槽14整体呈圆形,在定位槽14的圆周方向上设置标志线15,标志线15与晶圆上的定位缺口的形状和尺寸均相同,可以准确定位晶圆位置。定位过程如下:将晶圆放置在定位槽14中,定位槽14的尺寸略大于晶圆,晶圆可晃动;此时将晶圆上的定位缺口与标志线15对紧贴合,即可实现精确的定位。The positioning groove 14 has a circular shape as a whole, and a marking line 15 is set on the circumferential direction of the positioning groove 14. The marking line 15 has the same shape and size as the positioning notch on the wafer, so that the wafer position can be accurately positioned. The positioning process is as follows: the wafer is placed in the positioning groove 14, the size of the positioning groove 14 is slightly larger than the wafer, and the wafer can be shaken; at this time, the positioning gap on the wafer is closely fitted with the marking line 15, and the process can be realized. precise positioning.

环状支撑座1的上表面还设置取放槽16,取放槽16位于定位槽14周向之外,与定位槽14保持连通,取放槽16的深度大于定位槽14,可以方便夹持晶圆。一般地,取放槽16应设置两个,呈相对设置,方便从两侧抓取晶圆。The upper surface of the annular support seat 1 is also provided with a pick-and-place groove 16, which is located outside the positioning groove 14 in the circumferential direction, and is in communication with the positioning groove 14. The depth of the pick-and-place groove 16 is greater than the positioning groove 14, which can facilitate the clamping of the wafer. . Generally, two pick-and-place slots 16 should be set up opposite to each other, so as to facilitate grabbing wafers from both sides.

具体地,进气通道12为螺纹孔,用于连接气嘴,直接将带有螺纹的气嘴拧上固定即可,图2中所示设置两个进气通道12,具体的数量设定可根据应用作出选择,本发明在此不作具体的限定。出气通道13为纵截面呈矩形的通孔,尺寸大于进气通道12,可以对悬空孔11中的气流进行整合,从而排出碎屑。Specifically, the air intake channel 12 is a threaded hole, which is used to connect the air nozzle, and it is sufficient to directly screw the air nozzle with the thread to fix it. As shown in Figure 2, two air intake channels 12 are set, and the specific number can be set The choice is made according to the application, and the present invention is not specifically limited here. The air outlet passage 13 is a through hole with a rectangular longitudinal section, and its size is larger than that of the air inlet passage 12, which can integrate the airflow in the suspended hole 11, thereby discharging debris.

优选地,进气通道12的上端距离放置到位的晶圆下表面的间距为0.5~1.5mm,既能进行气体的流动循环,又保证气体不直接吹到晶圆,防止气压吹断晶圆。Preferably, the distance between the upper end of the air inlet channel 12 and the lower surface of the wafer placed in place is 0.5-1.5mm, which can not only carry out the flow circulation of the gas, but also ensure that the gas is not directly blown to the wafer, preventing the wafer from being blown by the air pressure.

环状支撑座1沿竖直向设置固定螺孔17,固定螺孔17沿周向分布,可以将环状支撑座1与加工装置进行固定。The annular support base 1 is vertically provided with fixing screw holes 17, and the fixing screw holes 17 are distributed along the circumferential direction, which can fix the annular support base 1 and the processing device.

晶圆上方的吹气装置向下吹送氮气,氮气除了吹动碎屑之外,还可防止激光加工处因高温发生氧化,对微孔起到保护作用。与进气通道12连接的气嘴吹送空气,从进气通道12进入的气体成分不作严格限定,可采用普通压缩空气。The blowing device above the wafer blows nitrogen downward. In addition to blowing debris, nitrogen can also prevent oxidation of the laser processing due to high temperature and protect the micropores. Air is blown by the air nozzle connected to the air intake channel 12, and the composition of the gas entering from the air intake channel 12 is not strictly limited, and ordinary compressed air can be used.

对所公开的实施例的上述说明,使本领域专业技术人员能够实现或使用本发明。对这些实施例的多种修改对本领域的专业技术人员来说将是显而易见的,本文中所定义的一般原理,可以在不脱离本发明的精神或范围的情况下,在其它实施例中实现。因此,本发明将不会被限制于本文所示的这些实施例,而是要符合与本文所公开的原理和新颖特点相一致的最宽的范围。The above description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention will not be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. a kind of wafer jig for capillary processing, it is characterised in that including:
Circumferential support seat (1), centre opens up hanging hole (11);The centre of wafer is just vacantly placed to the hanging hole (11), its Edge is supported by circumferential support seat (1);
In inlet channel (12), the circumferential side wall for being opened in the circumferential support seat (1), the hanging hole (12) is set to be protected with extraneous Hold cross connection;
In outlet passageway (13), the circumferential side wall for being opened in the circumferential support seat (1), the hanging hole (11) is set to be protected with extraneous Cross connection is held, the outlet passageway (13) is oppositely arranged with the inlet channel (12);Wafer is arranged above blowning installation, Chip in micropore on wafer is blowed downwards to the hanging hole (11), and the air-flow entered with the inlet channel (12) Discharged from the outlet passageway (13);
Fixture (2), the EDGE CONTACT with wafer press-fits wafer the upper surface for being fixed on the circumferential support seat (1).
2. the wafer jig according to claim 1 for capillary processing, it is characterised in that the fixture (2) includes The rubber layer (21) and metal level (22) being mutually permanently connected, the rubber layer (21) of lower floor are used to crimp with wafer;It is described Rubber layer (21) and the metal level (22) correspondence insertion open up fixing hole (23), pass through the fixing hole (23) and the ring-type Support base (1) is fixed with bolts.
3. the wafer jig according to claim 2 for capillary processing, it is characterised in that the fixture (2) is close The side wall of wafer is arc surface, and the arc diameter of arc surface is more than or equal to the diameter of the hanging hole (11).
4. the wafer jig according to claim 1 for capillary processing, it is characterised in that the circumferential support seat (1) Circumference of the upper surface along the hanging hole (11) open up locating slot (14), the size of the locating slot (14) is slightly larger than wafer Circumference, and its depth is less than or equal to the thickness of wafer.
5. the wafer jig according to claim 4 for capillary processing, it is characterised in that set on the locating slot (14) Markings (15) are put, the marking line is identical with the shape and size of the locating notch on wafer.
6. the wafer jig according to claim 4 for capillary processing, it is characterised in that the circumferential support seat (1) Upper surface also set up and pick and place groove (16), the groove (16) that picks and places is outside the locating slot (14) circumference, and depth is more than The locating slot (14).
7. the wafer jig according to claim 1 for capillary processing, it is characterised in that the inlet channel (12) is Screwed hole, for connecting valve;The outlet passageway (13) is the rectangular through hole in longitudinal section, and size is more than the inlet channel (12)。
8. the wafer jig according to claim 7 for capillary processing, it is characterised in that the inlet channel (12) The spacing for the wafer lower surface that upper end distance is in place is 0.5~1.5mm.
9. the wafer jig according to claim 1 for capillary processing, it is characterised in that the circumferential support seat (1) Along vertical to fixing threaded hole (17) is set, the fixing threaded hole (17) is circumferentially distributed.
10. the wafer jig according to claim 1 for capillary processing, it is characterised in that the air blowing dress above wafer Put and blow nitrogen downwards, the valve being connected with the inlet channel (12) blows air.
CN201710580760.8A 2017-07-17 2017-07-17 A kind of wafer jig for capillary processing Pending CN107180778A (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109624109A (en) * 2019-02-20 2019-04-16 广州安特激光技术有限公司 A kind of plummer of wafer cutter device
CN110125565A (en) * 2019-06-24 2019-08-16 温州大学激光与光电智能制造研究院 The fixture of oil-spraying plate micropore laser processing
CN110919119A (en) * 2019-11-27 2020-03-27 武汉心浩智能科技有限公司 5G dielectric filter assembly line tool clamp and method
CN111198285A (en) * 2018-11-16 2020-05-26 杭州海康微影传感科技有限公司 Wafer test probe station
CN113251936A (en) * 2021-07-09 2021-08-13 成都太科光电技术有限责任公司 Vertical semiconductor wafer TTV interference testing device
CN114833660A (en) * 2022-05-20 2022-08-02 江苏爱矽半导体科技有限公司 Wafer thinning equipment and use method thereof
TWI774590B (en) * 2021-10-22 2022-08-11 環球晶圓股份有限公司 Wafer jig, wafer structure and wafer processing method
CN116540503A (en) * 2023-07-03 2023-08-04 之江实验室 Fixing device for laser direct writing sample and working method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH091375A (en) * 1995-06-21 1997-01-07 Amada Co Ltd Light moving type laser beam machine
US20070145026A1 (en) * 2005-12-22 2007-06-28 Hidehisa Murase Laser processing apparatus and laser processing method as well as debris extraction mechanism and debris extraction method
CN102112267A (en) * 2008-06-18 2011-06-29 伊雷克托科学工业股份有限公司 Debris capture and removal for laser micromachining
CN207558750U (en) * 2017-07-17 2018-06-29 广东工业大学 A kind of wafer jig for capillary processing

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH091375A (en) * 1995-06-21 1997-01-07 Amada Co Ltd Light moving type laser beam machine
US20070145026A1 (en) * 2005-12-22 2007-06-28 Hidehisa Murase Laser processing apparatus and laser processing method as well as debris extraction mechanism and debris extraction method
CN102112267A (en) * 2008-06-18 2011-06-29 伊雷克托科学工业股份有限公司 Debris capture and removal for laser micromachining
CN207558750U (en) * 2017-07-17 2018-06-29 广东工业大学 A kind of wafer jig for capillary processing

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111198285A (en) * 2018-11-16 2020-05-26 杭州海康微影传感科技有限公司 Wafer test probe station
CN111198285B (en) * 2018-11-16 2022-05-03 杭州海康微影传感科技有限公司 Wafer test probe station
CN109624109A (en) * 2019-02-20 2019-04-16 广州安特激光技术有限公司 A kind of plummer of wafer cutter device
CN110125565A (en) * 2019-06-24 2019-08-16 温州大学激光与光电智能制造研究院 The fixture of oil-spraying plate micropore laser processing
CN110125565B (en) * 2019-06-24 2024-05-14 温州大学激光与光电智能制造研究院 Clamp for micropore laser processing of fuel injection sheet
CN110919119A (en) * 2019-11-27 2020-03-27 武汉心浩智能科技有限公司 5G dielectric filter assembly line tool clamp and method
CN113251936A (en) * 2021-07-09 2021-08-13 成都太科光电技术有限责任公司 Vertical semiconductor wafer TTV interference testing device
TWI774590B (en) * 2021-10-22 2022-08-11 環球晶圓股份有限公司 Wafer jig, wafer structure and wafer processing method
CN114833660A (en) * 2022-05-20 2022-08-02 江苏爱矽半导体科技有限公司 Wafer thinning equipment and use method thereof
CN116540503A (en) * 2023-07-03 2023-08-04 之江实验室 Fixing device for laser direct writing sample and working method
CN116540503B (en) * 2023-07-03 2023-10-24 之江实验室 A fixing device and working method for laser direct writing samples

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