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CN107068802A - Improve the pretreatment unit and its processing method of polysilicon chip etching matte uniformity - Google Patents

Improve the pretreatment unit and its processing method of polysilicon chip etching matte uniformity Download PDF

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Publication number
CN107068802A
CN107068802A CN201611242271.3A CN201611242271A CN107068802A CN 107068802 A CN107068802 A CN 107068802A CN 201611242271 A CN201611242271 A CN 201611242271A CN 107068802 A CN107068802 A CN 107068802A
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thermostat
conveying roller
constant temperature
polysilicon chip
pretreatment unit
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钱小芳
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China National Building Materials Group Corp Jetion Solar (china) Co Ltd
Jetion Solar China Co Ltd
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China National Building Materials Group Corp Jetion Solar (china) Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/137Batch treatment of the devices
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B33/00After-treatment of single crystals or homogeneous polycrystalline material with defined structure
    • C30B33/08Etching
    • C30B33/10Etching in solutions or melts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Weting (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention provides the pretreatment unit for improving polysilicon chip etching matte uniformity, including a thermostat for accommodating thermostatted water and the conveying roller being arranged in thermostat, the conveying roller is placed under the thermostatted water, silicon chip to be etched is placed on the conveying roller, the conveying roller is rotated, the silicon chip motion to be etched is driven, described device also includes the air-dried mechanism of constant temperature of one and the port of export UNICOM of the thermostat.Beneficial effects of the present invention are embodied in:The polysilicon chip for needing to etch is maintained at temperature for 8 10 DEG C in advance, it is suitable with etching groove temperature, uniformity between uniformity and piece can be greatly improved in the piece of polysilicon chip matte, the aberration piece ratio of cell piece, the qualification rate of raising cell piece is reduced.

Description

提高多晶硅片刻蚀绒面均匀性的预处理装置及其处理方法Pretreatment device and treatment method for improving uniformity of etched textured surface of polycrystalline silicon wafer

技术领域technical field

本发明属于太阳能电池组件技术领域,具体涉及一种提高多晶硅片刻蚀绒面均匀性的预处理装置及其处理方法。The invention belongs to the technical field of solar battery components, and in particular relates to a pretreatment device and a treatment method for improving the uniformity of etched textured surfaces of polycrystalline silicon wafers.

背景技术Background technique

多晶硅电池片的工艺制造流程一般是清洗制作绒面,然后扩散制作PN结、腐蚀去磷硅玻璃、PECVD镀膜、丝网印刷电极烧结,最后测试包装。清洗刻蚀是制造太阳能电池的第一道工艺,如何在p型硅片表面获得均匀的刻蚀绒面和保持每批硅片绒面的一致性是清洗工段考虑的重要问题。现有的多晶硅片一般都是直接上料进入刻蚀槽,硅片表面温度在20-25℃,进入刻蚀槽后,由于刻蚀槽内药液温度在8-10℃,硅片表面温度与刻蚀槽药液温度差距大,导致硅片表面刻蚀不均匀。The manufacturing process of polysilicon cells is generally cleaning and making suede, then diffusing to make PN junction, etching and dephosphorizing silicon glass, PECVD coating, screen printing electrode sintering, and finally testing and packaging. Cleaning and etching are the first process for manufacturing solar cells. How to obtain a uniform etching texture on the surface of p-type silicon wafers and maintain the consistency of the texture of each batch of silicon wafers is an important issue considered by the cleaning section. Existing polysilicon wafers are generally directly loaded into the etching tank, and the surface temperature of the silicon wafer is 20-25 ° C. After entering the etching tank, since the temperature of the chemical solution in the etching tank is 8-10 ° C, the surface temperature of the silicon wafer The temperature difference between the chemical solution and the etching tank is large, resulting in uneven etching on the surface of the silicon wafer.

发明内容Contents of the invention

本发明提供了一种提高多晶硅片刻蚀绒面均匀性的预处理装置及其处理方法。The invention provides a pretreatment device and a treatment method for improving the uniformity of the etched suede surface of a polycrystalline silicon wafer.

本发明的目的通过以下技术方案来实现:The purpose of the present invention is achieved through the following technical solutions:

提高多晶硅片刻蚀绒面均匀性的预处理装置,包括一容纳有恒温水的恒温槽及设置于恒温槽内的传输滚轮,所述传输滚轮置于所述恒温水下,待刻蚀硅片置于所述传输滚轮上,所述传输滚轮转动,带动所述待刻蚀硅片运动,所述装置还包括一与所述恒温槽的出口端联通的恒温风干机构。The pretreatment device for improving the uniformity of etched suede surface of polycrystalline silicon wafers includes a constant temperature tank containing constant temperature water and transmission rollers arranged in the constant temperature tank, the transmission rollers are placed under the constant temperature water, and the silicon wafers to be etched are placed On the transmission roller, the transmission roller rotates to drive the movement of the silicon wafer to be etched, and the device also includes a constant temperature air-drying mechanism connected with the outlet end of the constant temperature tank.

优选地,所述恒温风干机构包括与恒温槽内的传输滚轮同一平面的传输辊,所述传输辊上方设置有恒温风刀。Preferably, the constant temperature air-drying mechanism includes a transmission roller on the same plane as the transmission roller in the constant temperature tank, and a constant temperature air knife is arranged above the transmission roller.

优选地,所述传输滚轮设置有上、下层传输滚轮,待刻蚀硅片设置于所述上、下层传输滚轮之间,所述上、下层传输滚轮转动,带动待刻蚀硅片进行传输。Preferably, the transmission rollers are provided with upper and lower transmission rollers, and the silicon wafer to be etched is arranged between the upper and lower transmission rollers, and the upper and lower transmission rollers rotate to drive the silicon wafer to be etched for transmission.

优选地,所述恒温槽下方设置有溶液槽,所述恒温槽与所述溶液槽通过水泵循环连接,所述溶液槽内设置有恒温控制机构,所述恒温槽与所述溶液槽内均设置有与所述恒温控制机构电性连接的温度传感器。Preferably, a solution tank is provided below the constant temperature tank, and the constant temperature tank and the solution tank are circulated through a water pump. A constant temperature control mechanism is arranged in the solution tank, and both the constant temperature tank and the solution tank are provided with There is a temperature sensor electrically connected with the constant temperature control mechanism.

优选地,所述恒温水的温度为8-10℃,所述恒温水为去离子水。Preferably, the temperature of the constant temperature water is 8-10°C, and the constant temperature water is deionized water.

优选地,所述传输滚轮上设置有分隔带,同一传输滚轮上的相邻分隔带之间的距离与待刻蚀硅片的宽度相当。Preferably, the transport rollers are provided with separation strips, and the distance between adjacent separation strips on the same transport roller is equivalent to the width of the silicon wafer to be etched.

优选地,所述装置还包括有用于驱动所述滚轮转动的驱动电机。Preferably, the device further includes a drive motor for driving the rollers to rotate.

优选地,所述装置的出料端与刻蚀装置的进料端封闭连接。Preferably, the discharge end of the device is sealed and connected to the feed end of the etching device.

提高多晶硅片刻蚀绒面均匀性的预处理方法,包括如下步骤,A pretreatment method for improving the uniformity of the etched textured surface of polysilicon wafers, comprising the following steps,

S1、溶液槽内溶液的恒温调节,控制;通过恒温控制机构将溶液槽内的溶液控制在温度为8-10℃;S1. Constant temperature adjustment and control of the solution in the solution tank; the solution in the solution tank is controlled at a temperature of 8-10°C through a constant temperature control mechanism;

S2、多晶硅片放入恒温槽,将多晶硅片放入恒温槽的上、下层传输滚轮之间;S2. Put the polysilicon wafer into the constant temperature tank, and put the polysilicon wafer between the upper and lower transmission rollers of the constant temperature tank;

S3、恒温槽内注入溶液,并保持温度在8-10℃,通过联通的水泵将溶液槽内的溶液注入到恒温槽,并浸没恒温槽内的传输滚轮和多晶硅片表面;S3. Inject the solution into the constant temperature tank, and keep the temperature at 8-10°C, inject the solution in the solution tank into the constant temperature tank through the water pump of Unicom, and immerse the transmission roller and the surface of the polysilicon wafer in the constant temperature tank;

S4、恒温槽内通入8-10℃的去离子水,没过传输滚轮,从而给硅片降温,使硅片表面的温度降到8-10℃;S4. Put 8-10°C deionized water into the constant temperature tank, submerge the transfer rollers, so as to cool down the silicon wafer and reduce the surface temperature of the silicon wafer to 8-10°C;

S5、硅片出恒温槽的水浴后,进入到恒温风干机构,恒温风刀启动,将硅片表面吹干,进一步的进入到刻蚀槽,所述恒温风刀的温度为8-10℃。S5. After the silicon wafer leaves the water bath in the constant temperature tank, it enters the constant temperature air drying mechanism. The constant temperature air knife is activated to dry the surface of the silicon wafer, and then enters the etching tank. The temperature of the constant temperature air knife is 8-10°C.

本发明的有益效果体现在:将需要刻蚀的多晶硅片预先保持在温度为8-10℃,与刻蚀槽温度相当,可以大大提高多晶硅片绒面的片内均匀性与片间均匀性,降低电池片的色差片比例,提高电池片的合格率。The beneficial effect of the present invention is reflected in: the polysilicon wafer to be etched is maintained at a temperature of 8-10°C in advance, which is equivalent to the temperature of the etching tank, and the intra-chip uniformity and inter-chip uniformity of the suede surface of the polycrystalline silicon wafer can be greatly improved. Reduce the ratio of the color difference film of the cell and improve the qualified rate of the cell.

附图说明Description of drawings

图1:本发明的结构示意图。Figure 1: Schematic diagram of the structure of the present invention.

具体实施方式detailed description

以下结合实施例具体阐述本发明的技术方案,本发明揭示了一种提高多晶硅片刻蚀绒面均匀性的预处理装置,如图1所示,包括一容纳有恒温水的恒温槽2及与所述恒温槽的出口端联通的恒温风干机构。所述装置的出料端与刻蚀装置的进料端封闭连接,进一步的,是指恒温风干机构与刻蚀装置的进料端封闭连接。The technical scheme of the present invention is specifically described below in conjunction with the examples. The present invention discloses a pretreatment device that improves the uniformity of the etched suede surface of polycrystalline silicon wafers. A constant temperature air-drying mechanism connected to the outlet end of the constant temperature tank. The discharge end of the device is closed and connected with the feed end of the etching device, and further, the constant temperature air-drying mechanism is closed and connected with the feed end of the etching device.

所述恒温槽2内设置有置于所述恒温水下的传输滚轮,所述传输滚轮包括有上层传输滚轮3、下层传输滚轮4。待刻蚀硅片设置于所述上、下层传输滚轮之间;所述装置还包括有用于驱动所述滚轮转动的驱动电机,所述上、下层传输滚轮转动,带动待刻蚀硅片进行传输。所述恒温水的温度为8-10℃,所述恒温水为去离子水。The constant temperature tank 2 is provided with transmission rollers placed under the constant temperature water, and the transmission rollers include an upper transmission roller 3 and a lower transmission roller 4 . The silicon wafer to be etched is arranged between the upper and lower layer transmission rollers; the device also includes a driving motor for driving the rotation of the rollers, and the rotation of the upper and lower layer transmission rollers drives the silicon wafer to be etched for transmission . The temperature of the constant temperature water is 8-10° C., and the constant temperature water is deionized water.

所述恒温风干机构包括与恒温槽内的传输滚轮同一平面的传输辊6,所述传输辊6上方设置有恒温风刀7。本发明中,同一平面进一步的限制为同一水平面,当恒温槽内的多晶硅片在出口端时,可以很好的进入到恒温风干机构内,实现无缝对接。The constant temperature air-drying mechanism includes a transmission roller 6 on the same plane as the transmission roller in the constant temperature tank, and a constant temperature air knife 7 is arranged above the transmission roller 6 . In the present invention, the same plane is further limited to the same horizontal plane, and when the polysilicon wafer in the constant temperature tank is at the outlet end, it can well enter into the constant temperature air-drying mechanism to realize seamless docking.

为了更好的对恒温槽2内的去离子水进行水温及水量的控制,所述恒温槽下方设置有溶液槽1,所述恒温槽2与所述溶液槽1通过水泵循环连接,所述溶液槽1内设置有恒温控制机构,所述恒温槽2与所述溶液槽1内均设置有与所述恒温控制机构电性连接的温度传感器。In order to better control the water temperature and water volume of the deionized water in the constant temperature tank 2, a solution tank 1 is arranged below the constant temperature tank, and the constant temperature tank 2 is connected to the solution tank 1 through a water pump circulation. A constant temperature control mechanism is arranged in the tank 1, and a temperature sensor electrically connected to the constant temperature control mechanism is arranged in the constant temperature tank 2 and the solution tank 1 .

为了能进行更量化的硅片传输,所述传输滚轮上设置有分隔带5,同一传输滚轮上的相邻分隔带之间的距离与待刻蚀硅片的宽度相当。本发明中采用的分隔带5为4个,将传输滚轮分为5个区域,可以同时五排硅片同时输送。In order to carry out more quantified silicon wafer transmission, the transfer rollers are provided with separation strips 5 , and the distance between adjacent separation strips on the same transmission roller is equivalent to the width of the silicon wafers to be etched. The number of separation belts 5 used in the present invention is 4, and the transmission rollers are divided into 5 areas, so that five rows of silicon wafers can be simultaneously transported.

以下阐述下利用本装置进行提高多晶硅片刻蚀绒面均匀性的预处理方法,包括如下步骤,The following describes the pretreatment method for improving the uniformity of the etched textured surface of polysilicon wafers by using the device, including the following steps,

S1、溶液槽内溶液的恒温调节,控制;通过恒温控制机构将溶液槽内的溶液控制在温度为8-10℃;S1. Constant temperature adjustment and control of the solution in the solution tank; the solution in the solution tank is controlled at a temperature of 8-10°C through a constant temperature control mechanism;

S2、多晶硅片放入恒温槽,将多晶硅片放入恒温槽的上、下层传输滚轮之间;S2. Put the polysilicon wafer into the constant temperature tank, and put the polysilicon wafer between the upper and lower transmission rollers of the constant temperature tank;

S3、恒温槽内注入溶液,并保持温度在8-10℃,通过联通的水泵将溶液槽内的溶液注入到恒温槽,并浸没恒温槽内的传输滚轮和多晶硅片表面;S3. Inject the solution into the constant temperature tank, and keep the temperature at 8-10°C, inject the solution in the solution tank into the constant temperature tank through the water pump of Unicom, and immerse the transmission roller and the surface of the polysilicon wafer in the constant temperature tank;

S4、恒温槽内通入8-10℃的去离子水,没过传输滚轮,从而给硅片降温,使硅片表面的温度降到8-10℃;S4. Put 8-10°C deionized water into the constant temperature tank, submerge the transfer rollers, so as to cool down the silicon wafer and reduce the surface temperature of the silicon wafer to 8-10°C;

S5、硅片出恒温槽的水浴后,进入到恒温风干机构,恒温风刀启动,将硅片表面吹干,进一步的进入到刻蚀槽,所述恒温风刀的温度为8-10℃。S5. After the silicon wafer leaves the water bath in the constant temperature tank, it enters the constant temperature air drying mechanism. The constant temperature air knife is activated to dry the surface of the silicon wafer, and then enters the etching tank. The temperature of the constant temperature air knife is 8-10°C.

表1为采用本发明中的预处理对最后产品反射率的影响与现有技术的对比表:Table 1 is a comparison table of the influence of the pretreatment in the present invention on the reflectivity of the final product and the prior art:

实施例Example 现有技术反射率Prior art reflectivity 发明技术反射率Invention Technology Reflectivity 11 20.5620.56 20.3620.36 22 21.2321.23 19.4619.46 33 21.8921.89 19.5419.54 44 22.4722.47 19.4719.47 55 20.1420.14 20.3920.39 66 21.5821.58 20.5820.58 77 19.5819.58 20.1420.14 88 22.3622.36 19.7819.78 99 21.821.8 20.6220.62 1010 19.0819.08 19.6819.68 标准偏差standard deviation 1.171.17 0.470.47

。以上充分显示了本发明的方法保证产品进入刻蚀槽前,使硅片表面的温度降到与刻蚀槽药液一样的温度,不仅不会影响刻蚀槽药液的浓度,而且能均匀地与药液发生反应。. The above fully shows that the method of the present invention ensures that before the product enters the etching tank, the temperature on the surface of the silicon wafer is reduced to the same temperature as the etching tank chemical solution, which not only does not affect the concentration of the etching tank chemical solution, but also can uniformly React with liquid medicine.

本发明尚有多种具体的实施方式。凡采用等同替换或者等效变换而形成的所有技术方案,均落在本发明要求保护的范围之内。The present invention still has multiple specific implementation modes. All technical solutions formed by equivalent replacement or equivalent transformation fall within the protection scope of the present invention.

Claims (9)

1. improve the pretreatment unit that polysilicon chip etches matte uniformity, it is characterised in that:Thermostatted water is accommodated including one Thermostat and the conveying roller being arranged in thermostat, the conveying roller are placed under the thermostatted water, and silicon chip to be etched is placed in On the conveying roller, the conveying roller is rotated, and drives the silicon chip motion to be etched, described device also include one with it is described The constant temperature of the port of export UNICOM of thermostat air-dries mechanism.
2. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 1, it is characterised in that:It is described Constant temperature, which air-dries mechanism, to be included the conplane delivery roll of conveying roller in thermostat, the delivery roll top are provided with constant temperature Air knife.
3. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 1, it is characterised in that:It is described Conveying roller is provided with upper and lower layer conveying roller, and silicon chip to be etched is arranged between the upper and lower layer conveying roller, it is described it is upper, Lower floor's conveying roller is rotated, and drives silicon chip to be etched to be transmitted.
4. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 1, it is characterised in that:It is described Solution tank is provided with below thermostat, the thermostat is connected by water pump circulation with the solution tank, set in the solution tank Thermostatic control mechanism is equipped with, the thermostat is with being provided with what is be electrically connected with the thermostatic control mechanism in the solution tank Temperature sensor.
5. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 1, it is characterised in that:It is described The temperature of thermostatted water is 8-10 DEG C, and the thermostatted water is deionized water.
6. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 3, it is characterised in that:It is described Width of the distance between the adjacent dividing strip being provided with conveying roller on dividing strip, same conveying roller with silicon chip to be etched Quite.
7. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 2, it is characterised in that:It is described Device also includes the motor for driving the roller to rotate.
8. the pretreatment unit that polysilicon chip etches matte uniformity is improved as claimed in claim 1, it is characterised in that:It is described The feed end closing of the discharge end and etching device of device is connected.
9. improve the preprocess method that polysilicon chip etches matte uniformity, it is characterised in that:Comprise the following steps,
The thermostatic control of solution in S1, solution tank, control;The solution in solution tank is controlled in temperature by thermostatic control mechanism For 8-10 DEG C;
S2, polysilicon chip are put into thermostat, and polysilicon chip is put between the upper and lower layer conveying roller of thermostat;
Injection solution in S3, thermostat, and maintain the temperature at 8-10 DEG C, the solution in solution tank is injected by the water pump of UNICOM To thermostat, and submerge the conveying roller in thermostat and polysilicon chip surface;
8-10 DEG C of deionized water is passed through in S4, thermostat, did not had conveying roller, so as to give silicon chip cooling, makes silicon chip surface Temperature drops to 8-10 DEG C;
S5, silicon chip go out after the water-bath of thermostat, enter constant temperature and air-dry mechanism, constant temperature air knife starts, silicon chip surface is dried up, entered One step enters etching groove, and the temperature of the constant temperature air knife is 8-10 DEG C.
CN201611242271.3A 2016-12-29 2016-12-29 Improve the pretreatment unit and its processing method of polysilicon chip etching matte uniformity Pending CN107068802A (en)

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CN107919307A (en) * 2017-12-05 2018-04-17 泰州中来光电科技有限公司 A kind of feeding device of wet etching
CN108155118A (en) * 2017-12-06 2018-06-12 中建材浚鑫科技有限公司 A kind of polysilicon chip cleaning system and its cleaning method
CN109659261A (en) * 2018-12-19 2019-04-19 武汉华星光电半导体显示技术有限公司 Substrate etch equipment and its processing system

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CN103409752A (en) * 2013-07-18 2013-11-27 新奥光伏能源有限公司 Wet etching apparatus and wet etching method
CN104835717A (en) * 2015-03-23 2015-08-12 中建材浚鑫科技股份有限公司 Pre-cleaning process before texturing process

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JP2012182284A (en) * 2011-03-01 2012-09-20 Hitachi Chem Co Ltd Plating pretreatment device, and plating pretreatment method
CN103409752A (en) * 2013-07-18 2013-11-27 新奥光伏能源有限公司 Wet etching apparatus and wet etching method
CN104835717A (en) * 2015-03-23 2015-08-12 中建材浚鑫科技股份有限公司 Pre-cleaning process before texturing process

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Publication number Priority date Publication date Assignee Title
CN107919307A (en) * 2017-12-05 2018-04-17 泰州中来光电科技有限公司 A kind of feeding device of wet etching
CN108155118A (en) * 2017-12-06 2018-06-12 中建材浚鑫科技有限公司 A kind of polysilicon chip cleaning system and its cleaning method
CN109659261A (en) * 2018-12-19 2019-04-19 武汉华星光电半导体显示技术有限公司 Substrate etch equipment and its processing system

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Application publication date: 20170818