[go: up one dir, main page]

CN106990469A - 偏振片的检查方法和偏光板的制造方法 - Google Patents

偏振片的检查方法和偏光板的制造方法 Download PDF

Info

Publication number
CN106990469A
CN106990469A CN201610868030.3A CN201610868030A CN106990469A CN 106990469 A CN106990469 A CN 106990469A CN 201610868030 A CN201610868030 A CN 201610868030A CN 106990469 A CN106990469 A CN 106990469A
Authority
CN
China
Prior art keywords
polarizer
image pickup
unpolarized
lighting division
unpolarized portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610868030.3A
Other languages
English (en)
Chinese (zh)
Inventor
古泽修也
杉脇正晃
八重樫将宽
木村真规子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to CN202410285306.XA priority Critical patent/CN118294465B/zh
Publication of CN106990469A publication Critical patent/CN106990469A/zh
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G02B5/3041Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks
    • G02B5/305Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks including organic materials, e.g. polymeric layers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10Beam splitting or combining systems
    • G02B27/14Beam splitting or combining systems operating by reflection only
    • G02B27/149Beam splitting or combining systems operating by reflection only using crossed beamsplitting surfaces, e.g. cross-dichroic cubes or X-cubes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Polarising Elements (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201610868030.3A 2015-09-30 2016-09-29 偏振片的检查方法和偏光板的制造方法 Pending CN106990469A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410285306.XA CN118294465B (zh) 2015-09-30 2016-09-29 检查方法、偏光板的制造方法以及偏振片的非偏振部的检查装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-195109 2015-09-30
JP2015195109A JP6604805B2 (ja) 2015-09-30 2015-09-30 偏光子の検査方法および偏光板の製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN202410285306.XA Division CN118294465B (zh) 2015-09-30 2016-09-29 检查方法、偏光板的制造方法以及偏振片的非偏振部的检查装置

Publications (1)

Publication Number Publication Date
CN106990469A true CN106990469A (zh) 2017-07-28

Family

ID=58494496

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201610868030.3A Pending CN106990469A (zh) 2015-09-30 2016-09-29 偏振片的检查方法和偏光板的制造方法
CN202410285306.XA Active CN118294465B (zh) 2015-09-30 2016-09-29 检查方法、偏光板的制造方法以及偏振片的非偏振部的检查装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202410285306.XA Active CN118294465B (zh) 2015-09-30 2016-09-29 检查方法、偏光板的制造方法以及偏振片的非偏振部的检查装置

Country Status (3)

Country Link
JP (1) JP6604805B2 (ja)
KR (1) KR102314235B1 (ja)
CN (2) CN106990469A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109324063A (zh) * 2017-07-31 2019-02-12 日东电工株式会社 偏振膜的摄像装置、检查装置以及检查方法
CN110989066A (zh) * 2019-12-20 2020-04-10 京东方科技集团股份有限公司 偏光片、其制作方法及显示装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102486442B1 (ko) * 2019-06-07 2023-01-09 주식회사 엘지화학 편광판의 액정얼룩 검사장치 및 편광판의 액정얼룩 검사방법
US12121218B2 (en) 2020-05-11 2024-10-22 Welch Allyn, Inc. Configuring optical light path having beam overlap on image sensor

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075363A (ja) * 2001-06-21 2003-03-12 Ricoh Co Ltd 欠陥検査装置及びその方法
TW200422661A (en) * 2002-12-05 2004-11-01 Nitto Denko Corp Method for producing polarizing plate, polarizing plate and image display device using the same
CN1844901A (zh) * 2005-04-08 2006-10-11 欧姆龙株式会社 缺陷检查方法以及利用该方法的缺陷检查装置
TWI349771B (ja) * 2003-10-09 2011-10-01 Nitto Denko Corp
JP2014081482A (ja) * 2012-10-16 2014-05-08 Nitto Denko Corp 偏光子および画像表示装置
CN104007116A (zh) * 2013-02-21 2014-08-27 欧姆龙株式会社 缺陷检查装置及缺陷检查方法
JP2014164084A (ja) * 2013-02-25 2014-09-08 Nitto Denko Corp 偏光子および画像表示装置
CN105229500A (zh) * 2013-09-30 2016-01-06 Lg化学株式会社 局部具有去偏光区域的偏光板及其制备方法
CN105247395A (zh) * 2014-03-26 2016-01-13 Lg化学株式会社 制造含有局部漂白区域的偏光元件的方法、制造偏光元件辊的方法以及制造单片式偏光元件的方法
CN105738380A (zh) * 2014-12-29 2016-07-06 三星显示有限公司 显示装置的检查装置以及显示装置的检查方法
CN105891932A (zh) * 2015-02-16 2016-08-24 日东电工株式会社 偏振片、偏光板和图像显示装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08247965A (ja) * 1995-03-08 1996-09-27 Sumitomo Electric Ind Ltd 表面外観検査装置
JP2000009591A (ja) 1998-06-25 2000-01-14 Omron Corp 検査装置
JP2003344301A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査方法および検査装置
US20040212555A1 (en) 2003-04-23 2004-10-28 Falco Mark A. Portable electronic device with integrated display and camera and method therefore
DE10337040B4 (de) * 2003-08-12 2013-01-17 Sick Ag Vorrichtung zur Untersuchung einer Oberfläche oder einer Schicht
TWI249615B (en) * 2004-03-26 2006-02-21 Optimax Tech Corp Method and device for testing polarization sheet
KR100788734B1 (ko) * 2005-12-05 2008-01-02 에버테크노 주식회사 편광필름 검사장치 및 방법
JP4646951B2 (ja) 2007-06-06 2011-03-09 株式会社半導体エネルギー研究所 センサ付き表示装置
JP5434457B2 (ja) 2009-10-09 2014-03-05 ソニー株式会社 光学ユニットおよび撮像装置
US8467177B2 (en) 2010-10-29 2013-06-18 Apple Inc. Displays with polarizer windows and opaque masking layers for electronic devices
KR101293210B1 (ko) 2010-12-15 2013-08-05 주식회사 엘지화학 디스플레이 기기용 편광판의 구멍 형성 장치 및 방법
JP2012167975A (ja) * 2011-02-14 2012-09-06 Toray Advanced Film Co Ltd 欠陥検査方法および欠陥検査装置
KR101495759B1 (ko) 2011-04-18 2015-02-26 주식회사 엘지화학 디스플레이 장치용 편광판, 이를 이용한 액정 패널 및 디스플레이 장치
US9075199B2 (en) 2012-10-30 2015-07-07 Apple Inc. Displays with polarizer layers for electronic devices
JP2014167548A (ja) * 2013-02-28 2014-09-11 Nitto Denko Corp 画像表示装置の製造方法および該製造方法により得られる画像表示装置

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075363A (ja) * 2001-06-21 2003-03-12 Ricoh Co Ltd 欠陥検査装置及びその方法
TW200422661A (en) * 2002-12-05 2004-11-01 Nitto Denko Corp Method for producing polarizing plate, polarizing plate and image display device using the same
TWI349771B (ja) * 2003-10-09 2011-10-01 Nitto Denko Corp
CN1844901A (zh) * 2005-04-08 2006-10-11 欧姆龙株式会社 缺陷检查方法以及利用该方法的缺陷检查装置
JP2014081482A (ja) * 2012-10-16 2014-05-08 Nitto Denko Corp 偏光子および画像表示装置
CN104007116A (zh) * 2013-02-21 2014-08-27 欧姆龙株式会社 缺陷检查装置及缺陷检查方法
JP2014164084A (ja) * 2013-02-25 2014-09-08 Nitto Denko Corp 偏光子および画像表示装置
CN105229500A (zh) * 2013-09-30 2016-01-06 Lg化学株式会社 局部具有去偏光区域的偏光板及其制备方法
CN105247395A (zh) * 2014-03-26 2016-01-13 Lg化学株式会社 制造含有局部漂白区域的偏光元件的方法、制造偏光元件辊的方法以及制造单片式偏光元件的方法
CN105738380A (zh) * 2014-12-29 2016-07-06 三星显示有限公司 显示装置的检查装置以及显示装置的检查方法
CN105891932A (zh) * 2015-02-16 2016-08-24 日东电工株式会社 偏振片、偏光板和图像显示装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
刘旭: "《现代投影显示技术》", 31 March 2009, 浙江大学出版社 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109324063A (zh) * 2017-07-31 2019-02-12 日东电工株式会社 偏振膜的摄像装置、检查装置以及检查方法
CN109324063B (zh) * 2017-07-31 2022-09-09 日东电工株式会社 偏振膜的摄像装置、检查装置以及检查方法
CN110989066A (zh) * 2019-12-20 2020-04-10 京东方科技集团股份有限公司 偏光片、其制作方法及显示装置
CN110989066B (zh) * 2019-12-20 2022-01-11 京东方科技集团股份有限公司 偏光片、其制作方法及显示装置

Also Published As

Publication number Publication date
JP2017067664A (ja) 2017-04-06
KR102314235B1 (ko) 2021-10-18
JP6604805B2 (ja) 2019-11-13
CN118294465A (zh) 2024-07-05
CN118294465B (zh) 2025-05-02
KR20170038687A (ko) 2017-04-07

Similar Documents

Publication Publication Date Title
JP4855493B2 (ja) 光学表示装置製造システム及び光学表示装置製造方法
KR102802262B1 (ko) 편광자의 검사 방법
CN106990469A (zh) 偏振片的检查方法和偏光板的制造方法
KR20240085234A (ko) 편광자의 검사 방법 및 편광판의 제조 방법
CN107144908B (zh) 偏振板的制造方法和偏振板的制造装置
KR20210124118A (ko) 편광판의 검사 방법 및 검사 장치
CN107615051A (zh) 光透射性膜的缺陷检查方法、直线偏振片膜的制造方法以及偏振板的制造方法
JP6898492B2 (ja) 偏光子の検査方法および偏光板の製造方法
JP2021039118A (ja) 偏光子の製造方法
JP2017068124A (ja) 長尺状偏光子の検査方法
JP2009204607A (ja) 光学表示ユニットの検査方法および検査装置
JP6986614B2 (ja) 偏光子の製造方法
JP6695670B2 (ja) 偏光板の製造方法
JP6706476B2 (ja) 長尺状偏光子の検査方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20170728