CN106840036A - A kind of diadactic structure light optimization method suitable for fast three-dimensional appearance measuring - Google Patents
A kind of diadactic structure light optimization method suitable for fast three-dimensional appearance measuring Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
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Abstract
The invention discloses a kind of diadactic structure light optimization method suitable for fast three-dimensional appearance measuring, it is characterised in that comprise the following steps：Camera, projecting apparatus λ corrections；Camera calibration, distortion correction；Projection phase-shifted grating striped；Projection diadactic structure pumped FIR laser figure；Phase shift method obtains grating wrapped phase, and grating level is obtained using strip encoding；Absolute phase is obtained, Carrier-smoothed code is completed；Phase mapping is true altitude, reconstructs three-D profile.The present invention is using the diadactic structure pumped FIR laser method for optimizing, can realize that object three-dimensional contour outline is reconstructed, and this method can accurately determine the cycle level of projection grating striped, avoid the non-linear projection problem of multi-stage grey scale value and the color Aliasing Problem of multi-channel projection, measuring speed is quick, there is good adaptability to different measurement objects, with the significant technique effect of protrusion.
Description
Technical Field
The invention relates to a binary structured light optimization method suitable for rapid three-dimensional topography measurement, and belongs to the technical field of rapid three-dimensional topography measurement.
Background
The 3D imaging based on the structured light projection can provide three-dimensional contour information of an object, the three-dimensional contour of the surface of the object can be accurately reconstructed by decoding and phase expansion of an image, and the structured light three-dimensional imaging is widely applied to the field of industrial three-dimensional measurement with the advantages of large view field, non-contact, high precision, real-time performance and the like.
Various phase shifting methods including three-step, four-step and N-step phase shifting methods are used for three-dimensional reconstruction of an object, the more the number of stripes projected by the phase shifting method is, the higher the accuracy is, but the acquisition speed is restricted, the obtained phase is a relative phase [1-3] wrapped in [ -pi, pi ], and in order to obtain an absolute phase with one-to-one correspondence between the phase and the object, the phase needs to be unwrapped, and the phase cycle order is determined. Zheng D et al use two sets of multilevel gray scale value step phase encoded stripes, one set of which equally divides the full field into a plurality of regions and the other set of which equally divides each region again to jointly generate a step phase and determine the level of the stripe. Fu Y et al project sinusoidal stripes and ladder coding stripes respectively based on a four-step phase shift method of multi-level gray value coding, adopt a set of multi-level gray value coding, improve the efficiency of understanding the wrapping, can further reduce the number of coding stripe patterns by increasing the gray level, and apply the coding stripe patterns in the blade morphology measurement. Zhou C et al modulate the sinusoidal and staircase coding stripes into different channels of the color stripes using color stripe projection, reducing the number of stripe projections and further increasing the measurement speed.
Although these methods can be used for three-dimensional topography measurements, the following problems have not been fully solved: 1) the problem of projection nonlinearity caused by multi-level gray values; 2) color aliasing problems for color projection; 3) the adaptability problem of the coding method; 4) the three-dimensional measurement speed is low.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a binary structured light optimization method suitable for rapid three-dimensional shape measurement.
In order to solve the technical problem, the invention provides a binary structured light optimization method suitable for rapid three-dimensional shape measurement, which is characterized by comprising the following steps of: lambda correction of a camera and a projector; calibrating a camera and correcting distortion; projecting phase shift grating stripes; projecting a binary structure light coding pattern; solving the wrapping phase of the grating by a phase shift method, and solving the grating level by using the coding stripes; solving an absolute phase to finish phase unwrapping; the phase is mapped to the real height, and a three-dimensional profile is reconstructed.
Preferably, the camera calibration and distortion correction comprises: calibrating a camera used in the experiment by using a Zhangyingyou calibration method, solving internal and external parameters of the camera, and carrying out distortion correction on the shot image according to the parameters.
Preferably, the projected phase-shift grating stripes comprise: projecting a plurality of four-step phase-shift sinusoidal grating stripes to the surface of an object to be measured, and acquiring patterns projected to the surface of the object by using a camera.
Preferably, the projected sinusoidal grating adopts an N-step phase shift method, and obtains phase information by projecting multiple structured light patterns with phase differences, and the light intensity expression of the kth phase shift projection pattern is:
wherein, Ik(x, y) is the intensity of light somewhere on the projected image (k is 0,1,2,3), I' (x, y) is the background intensity, I "(x, y) is the modulated intensity,for the phase to be solved, N represents the number of projection images.
Preferably, the projecting binary structured light code pattern comprises: and projecting a plurality of binary structure light coding patterns corresponding to the three-step phase shift, and acquiring the pattern projected to the surface of the object by using a camera.
Preferably, the projecting binary structured light code pattern further comprises: encoding the step phase into a binary black-and-white pattern, wherein the projected ith binary encoding stripe expression is as follows:
wherein L is the sum of the x direction of the coding stripe patternLength, presetting displacement value for x direction, l is single fringe width, N is phase shift step number of projection fringe, k is number of step phase sub-area, k value is log2(L/L) determination; the relative phase of three-step phase shift corresponding to the demodulated binary coding stripe is a step phase, the step phase and the 2 pi jump position of the sine wrapping phase are coincided, a reasonable value needs to be set, and the phase coding is subjected to offset correction in advance.
Preferably, the phase shift method for determining the phase of the grating envelope, and determining the grating order using the encoded fringes comprises: obtaining the wrapping phase of the grating stripe by a four-step phase shift method, and determining the period order of the grating stripe by utilizing the step phase obtained after the demodulation of the binary coding stripe; the solving of the absolute phase and the completion of the phase unwrapping comprise: finally, unwrapping the wrapped phase according to the cycle order to obtain an absolute phase, and completing unwrapping the phase.
Preferably, after a plurality of phase shift patterns are projected by using an N-step phase shift method, the obtained sine wrapping phase expression is as follows:
the phase obtained by the formula is wrapped in [ -pi, pi [ -pi [ ]]The relative phase with the inner period of 2 pi, in order to improve the measurement precision, the grating stripe has a plurality of periods in the whole measurement range in the actual measurement, and the period is adjusted byUnwrapping is performed to obtain continuous absolute phase values that completely reflect changes in the intensity of the projected fringe by the object.
Preferably, the step of calculating the grating order is:
step SS 1: the number r of the neutron regions in the step phase is 2k-1The total number S of the step steps is 6r, and the number of the step steps obtained by binary structured light coding is 6r by a three-step phase shift method;
step SS 2: in order to ensure that each period of the sinusoidal grating has a corresponding step phase and the phase expansion can be smoothly carried out, the period number T of the sinusoidal grating bar and the number k of the sub-regions of the binary coding bar only need to satisfy the following relation:
T＜6×2k-1；
step SS 3: and (3) obtaining the sine stripe order t in the corresponding region from the step phase in each sub-region:
wherein,the step phase is obtained by N-step phase shift method.
Preferably, the absolute phase is calculated by:
obtaining half unwrapped phase with incompletely unwrapped sine stripe phase from t value
And then, expanding again by using a traditional neighborhood analysis method, and adding 6 multiplied by 2 pi to the phase with the adjacent phase difference value exceeding 6 multiplied by 2 pi at the phase jump position of the half-expanded phase diagram for the step phase adopting the 3-step phase shift method to finish the unwrapping of the phase.
The invention achieves the following beneficial effects: (1) the coding step stripes of the invention adopt binary stripes, are insensitive to stripe contrast, avoid the superposition of phase errors and the influence of projection nonlinearity, and can effectively reduce measurement errors; (2) the invention adopts monochromatic projection, which can avoid the color aliasing problem of multi-channel color projection; (3) the invention can make pertinence adjustment aiming at different sine stripe periods by setting the k value, and can self-adapt the step number by changing the N value, thereby improving the flexibility of measurement; (4) the invention reduces the number of projection stripes and improves the measuring speed under the same condition.
Drawings
FIG. 1 is a flow chart of a binary structured light optimization method suitable for rapid three-dimensional topography measurement according to the present invention.
Fig. 2 is a diagram of the steps and effects of three-dimensional reconstruction of a turtle model according to an embodiment of the present invention.
Detailed Description
The invention is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
Fig. 1 is a flowchart of a binary structured light optimization method suitable for rapid three-dimensional topography measurement according to the present invention. The invention provides a binary structured light optimization method suitable for rapid three-dimensional topography measurement, which comprises the following steps: lambda correction of a camera and a projector; calibrating a camera and correcting distortion; projecting phase shift grating stripes; projecting a binary structure light coding pattern; solving the wrapping phase of the grating by a phase shift method, and solving the grating level by using the coding stripes; solving an absolute phase to finish phase unwrapping; mapping the phase to be the real height, reconstructing a three-dimensional profile, namely mapping the absolute phase to be the real height of the object, and realizing the reconstruction of the three-dimensional shape of the surface of the object to be measured.
As a preferred embodiment, the camera calibration and distortion correction includes: calibrating a camera used in the experiment by using a Zhangyingyou calibration method, solving internal and external parameters of the camera, and carrying out distortion correction on the shot image according to the parameters.
As a preferred embodiment, the projected phase-shift grating stripe comprises: projecting a plurality of four-step phase-shift sinusoidal grating stripes to the surface of an object to be measured, and acquiring patterns projected to the surface of the object by using a camera.
As a preferred embodiment, the projected sinusoidal grating adopts an N-step phase shift method, and obtains phase information by projecting a plurality of structured light patterns with phase differences, where the light intensity expression of the k-th phase shift projection pattern is:
wherein, Ik(x, y) is the intensity of light somewhere on the projected image (k is 0,1,2,3), I' (x, y) is the background intensity, I "(x, y) is the modulated intensity,for the phase to be solved, N represents the number of projection images.
In a preferred embodiment, the projecting binary structured light code pattern comprises: and projecting a plurality of binary structure light coding patterns corresponding to the three-step phase shift, and acquiring the pattern projected to the surface of the object by using a camera.
As a preferred embodiment, the projecting the binary structured light code pattern further comprises: encoding the step phase into a binary black-and-white pattern, wherein the projected ith binary encoding stripe expression is as follows:
wherein, L is the total length of the coding fringe pattern in the x direction, a preset displacement value is in the x direction, L is the width of a single fringe, N is the phase shift step number of the projection fringe, k is the number of the step phase sub-regions, and the value of k is represented by k-log2(L/L) determination; demodulate to obtain twoThe relative phase of three-step phase shift corresponding to the element coding stripe is a step phase, the step phase is coincided with the 2 pi jump position of the sine wrapping phase, a reasonable value needs to be set, and the phase coding is subjected to offset correction in advance.
As a preferred embodiment, the phase shift method for determining the phase of the grating envelope, wherein determining the grating order using the code stripes comprises: obtaining the wrapping phase of the grating stripe by a four-step phase shift method, and determining the period order of the grating stripe by utilizing the step phase obtained after the demodulation of the binary coding stripe; the solving of the absolute phase and the completion of the phase unwrapping comprise: finally, unwrapping the wrapped phase according to the cycle order to obtain an absolute phase, and completing unwrapping the phase.
As a preferred embodiment, after a plurality of phase shift patterns are projected by using N-step phase shift method, the obtained sinusoidal wrapping phase expression is:
the phase obtained by the formula is wrapped in [ -pi, pi [ -pi [ ]]The relative phase with the inner period of 2 pi, in order to improve the measurement precision, the grating stripe has a plurality of periods in the whole measurement range in the actual measurement, and the period is adjusted byUnwrapping is performed to obtain continuous absolute phase values that completely reflect changes in the intensity of the projected fringe by the object.
As a preferred embodiment, the calculation of the raster order includes:
step SS 1: the number r of the neutron regions in the step phase is 2k-1The total number S of the step steps is 6r, and the number of the step steps obtained by binary structured light coding is 6r by a three-step phase shift method;
step SS 2: in order to ensure that each period of the sinusoidal grating has a corresponding step phase and the phase expansion can be smoothly carried out, the period number T of the sinusoidal grating bar and the number k of the sub-regions of the binary coding bar only need to satisfy the following relation:
T＜6×2k-1；
step SS 3: and (3) obtaining the sine stripe order t in the corresponding region from the step phase in each sub-region:
wherein,the step phase is obtained by N-step phase shift method.
As a preferred embodiment, the method for calculating the absolute phase includes:
obtaining half unwrapped phase with incompletely unwrapped sine stripe phase from t value
And then, expanding again by using a traditional neighborhood analysis method, and adding 6 multiplied by 2 pi to the phase with the adjacent phase difference value exceeding 6 multiplied by 2 pi at the phase jump position of the half-expanded phase diagram for the step phase adopting the 3-step phase shift method to finish the unwrapping of the phase.
Fig. 2 is a diagram of the steps and effects of three-dimensional reconstruction of a turtle model according to an embodiment of the present invention. Firstly, four sinusoidal stripes with four-step phase shift are projected on the surface of the object, and then three binary structured light code patterns corresponding to three-step phase shift are projected, where k is 2, as shown in fig. 2.1. To improve the accuracy of the experimental results, the projected patterns are all corrected for distortion, as shown in fig. 2.2. After the grating fringe order is determined, the absolute phase of the object surface is obtained by using the grating order, and the absolute phase is mapped into the real height, so that the three-dimensional profile of the object surface can be reconstructed, as shown in fig. 2.3.
Therefore, the method can realize the reconstruction of the three-dimensional profile of the object by utilizing the optimized binary structure light coding method, can accurately determine the period level of the projection grating stripe, avoids the problem of nonlinear projection of multi-level gray values and the problem of color aliasing of multi-channel projection, has high measurement speed, has good adaptability to different measurement objects, and has remarkable technical effect.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.
Claims (10)
1. A binary structured light optimization method suitable for rapid three-dimensional topography measurement is characterized by comprising the following steps: lambda correction of a camera and a projector; calibrating a camera and correcting distortion; projecting phase shift grating stripes; projecting a binary structure light coding pattern; solving the wrapping phase of the grating by a phase shift method, and solving the grating level by using the coding stripes; solving an absolute phase to finish phase unwrapping; the phase is mapped to the real height, and a three-dimensional profile is reconstructed.
2. The binary structured light optimization method for fast three-dimensional topography measurement according to claim 1, wherein the camera calibration and distortion correction comprises: calibrating a camera used in the experiment by using a Zhangyingyou calibration method, solving internal and external parameters of the camera, and carrying out distortion correction on the shot image according to the parameters.
3. The binary structured light optimization method for fast three-dimensional topography measurement according to claim 1, wherein said projecting phase-shift grating stripes comprises: projecting a plurality of four-step phase-shift sinusoidal grating stripes to the surface of an object to be measured, and acquiring patterns projected to the surface of the object by using a camera.
4. The binary structured light optimization method suitable for fast three-dimensional topography measurement according to claim 3, wherein the projected sinusoidal grating obtains phase information by projecting a plurality of structured light patterns with phase differences by using an N-step phase shift method, and the light intensity expression of the k-th phase shift method projection pattern is as follows:
wherein, Ik(x, y) is the intensity of light somewhere on the projected image (k is 0,1,2,3), I' (x, y) is the background intensity, I "(x, y) is the modulated intensity,for the phase to be solved, N represents the number of projection images.
5. The binary structured light optimization method for fast three-dimensional topographic measurement as claimed in claim 1, wherein the projecting the binary structured light code pattern comprises: and projecting a plurality of binary structure light coding patterns corresponding to the three-step phase shift, and acquiring the pattern projected to the surface of the object by using a camera.
6. The binary structured light optimization method for fast three-dimensional topographic measurement as claimed in claim 5, wherein said projecting the binary structured light code pattern further comprises: encoding the step phase into a binary black-and-white pattern, wherein the projected ith binary encoding stripe expression is as follows:
wherein, L is the total length of the coding fringe pattern in the x direction, a preset displacement value is in the x direction, L is the width of a single fringe, N is the phase shift step number of the projection fringe, k is the number of the step phase sub-regions, and the value of k is represented by k-log2(L/L) determination; the relative phase of three-step phase shift corresponding to the demodulated binary coding stripe is a step phase, the step phase and the 2 pi jump position of the sine wrapping phase are coincided, a reasonable value needs to be set, and the phase coding is subjected to offset correction in advance.
7. The binary structured light optimization method for fast three-dimensional topography measurement according to claim 1, wherein the phase shift method is used for solving the grating wrapping phase, and the solving the grating order by using the coding stripes comprises: obtaining the wrapping phase of the grating stripe by a four-step phase shift method, and determining the period order of the grating stripe by utilizing the step phase obtained after the demodulation of the binary coding stripe; the solving of the absolute phase and the completion of the phase unwrapping comprise: finally, unwrapping the wrapped phase according to the cycle order to obtain an absolute phase, and completing unwrapping the phase.
8. The binary structured light optimization method suitable for fast three-dimensional topography measurement according to claim 7, wherein after a plurality of phase shift patterns are projected by using an N-step phase shift method, the obtained sine wrapped phase expression is as follows:
the phase obtained by the formula is wrapped in [ -pi, pi [ -pi [ ]]The relative phase with the inner period of 2 pi, in order to improve the measurement precision, the grating stripe has a plurality of periods in the whole measurement range in the actual measurement, and the period is adjusted byUnwrapping is performed to obtain continuous absolute phase values that completely reflect changes in the intensity of the projected fringe by the object.
9. The binary structured light optimization method for fast three-dimensional topography measurement according to claim 1, wherein the grating level calculation step is:
step SS 1: the number r of the neutron regions in the step phase is 2k-1The total number S of the step steps is 6r, and the number of the step steps obtained by binary structured light coding is 6r by a three-step phase shift method;
step SS 2: in order to ensure that each period of the sinusoidal grating has a corresponding step phase and the phase expansion can be smoothly carried out, the period number T of the sinusoidal grating bar and the number k of the sub-regions of the binary coding bar only need to satisfy the following relation:
T＜6×2k-1；
step SS 3: and (3) obtaining the sine stripe order t in the corresponding region from the step phase in each sub-region:
wherein,the step phase is obtained by N-step phase shift method.
10. The binary structured light optimization method suitable for fast three-dimensional topography measurement according to claim 1, wherein the absolute phase is calculated by:
obtaining half unwrapped phase with incompletely unwrapped sine stripe phase from t value
And then, expanding again by using a traditional neighborhood analysis method, and adding 6 multiplied by 2 pi to the phase with the adjacent phase difference value exceeding 6 multiplied by 2 pi at the phase jump position of the half-expanded phase diagram for the step phase adopting the 3-step phase shift method to finish the unwrapping of the phase.
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| CN107547798A (en) * | 2017-08-09 | 2018-01-05 | 广东欧珀移动通信有限公司 | Shooting focusing control method, device and terminal device |
| CN108955574A (en) * | 2018-07-09 | 2018-12-07 | 广东工业大学 | A kind of method for three-dimensional measurement and system |
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