[go: up one dir, main page]

CN106774235B - Abnormal state diagnosis device and method for analog input channel - Google Patents

Abnormal state diagnosis device and method for analog input channel Download PDF

Info

Publication number
CN106774235B
CN106774235B CN201510827799.6A CN201510827799A CN106774235B CN 106774235 B CN106774235 B CN 106774235B CN 201510827799 A CN201510827799 A CN 201510827799A CN 106774235 B CN106774235 B CN 106774235B
Authority
CN
China
Prior art keywords
input signal
value
abnormal state
deviation
baseline
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510827799.6A
Other languages
Chinese (zh)
Other versions
CN106774235A (en
Inventor
胡喜
卓越
李季
黄立明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Ltd China
Original Assignee
Siemens Ltd China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ltd China filed Critical Siemens Ltd China
Priority to CN201510827799.6A priority Critical patent/CN106774235B/en
Publication of CN106774235A publication Critical patent/CN106774235A/en
Application granted granted Critical
Publication of CN106774235B publication Critical patent/CN106774235B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

The invention provides an abnormal state diagnosis device and method of an analog input channel. The device includes: the steady state determining module receives an input signal of the analog input channel and determines whether the input signal reaches a steady state or not according to the change of the input signal; a baseline value generation module for generating a baseline value of the input signal according to a statistical value of the input signal under a condition that the input signal reaches a steady state; and the abnormal state diagnosis module monitors the deviation of the statistic value of the input signal and the baseline value and determines whether the input signal has an abnormal state according to the deviation. According to the embodiment of the invention, the abnormal state of the input signal of the analog input channel can be detected in time, convenience is provided for maintenance and operation of the field device, and the method can be implemented on the basis of the existing hardware device of the industrial control device, and is economical and convenient.

Description

Abnormal state diagnosis device and method for analog input channel
Technical Field
The present invention relates to a diagnostic apparatus and method for an industrial control device, and more particularly, to an abnormal state diagnostic apparatus and method for an analog input channel of an industrial control device.
Background
Currently, industrial control devices such as Programmable Logic Controllers (PLCs) and Distributed Control Systems (DCS) are increasingly used in industrial automation. Industrial control devices such as PLCs and DCS typically have Analog Input (AI) channels to receive analog inputs from field devices, such as process variables like temperature, pressure, flow, etc., which are sensed by respective sensors and then converted to electrical signals by transmitters to the analog input channels of the industrial control devices.
The analog input channel of an industrial control device is typically configured with one or more LEDs to indicate the status of the analog input channel, such as abnormal conditions of open/short channel, overload/underload, lack of operating voltage, and the like. However, the LED configured for the analog input channel generally cannot indicate whether the input signal of the analog input channel has an abnormal state. If the input signal from the field device can be found to be abnormal in time, great convenience is provided for the maintenance and operation of the field device.
Disclosure of Invention
In view of the above, an object of the present invention is to provide an abnormal state diagnosis apparatus and method for an analog input channel, which can detect an abnormal state of an input signal of the analog input channel in time, and facilitate maintenance and operation of a field device.
In order to achieve the above object, an abnormal state diagnosis apparatus of an analog input channel according to the present invention includes:
the steady state determining module receives an input signal of the analog input channel and determines whether the input signal reaches a steady state or not according to the change of the input signal;
a baseline value generation module for generating a baseline value of the input signal according to a statistical value of the input signal under a condition that the input signal reaches a steady state;
and the abnormal state diagnosis module monitors the deviation of the statistic value of the input signal and the baseline value and determines whether the input signal has an abnormal state according to the deviation.
The abnormal state diagnosis method of the analog input channel comprises the following steps:
receiving an input signal of the analog input channel, and determining whether the input signal reaches a steady state according to the change of the input signal;
generating a baseline value of the input signal according to the statistic value of the input signal under the condition that the input signal reaches a steady state;
and monitoring the deviation of the statistic value of the input signal and the baseline value, and determining whether the input signal has an abnormal state according to the deviation.
In an embodiment according to the present invention, statistical characteristics of an input signal of an analog input channel are used to monitor changes in sampled values of the input signal relative to the statistical characteristics thereof to detect whether an abnormal state of the input signal occurs. And the statistical characteristics of the input signals are dynamically obtained according to the sampling values of the input signals, and the statistical rules of the input signals can be accurately reflected in time, so that the abnormal states of the input signals can be timely detected. The abnormal state of the detected input signal is indicated by the LED configured for the analog input channel, great convenience can be provided for maintenance and operation of the field device, and in addition, the embodiment of the invention can be implemented on the basis of the existing hardware device of the industrial control device, no additional expenditure is generated at all, and the invention is economical and convenient.
Drawings
Objects, features and effects of the present invention will be described in detail by specific embodiments according to the present invention with reference to the accompanying drawings. These descriptions are only used as examples and are not intended to limit the scope of the present invention. Wherein:
FIG. 1 shows a schematic structural diagram of a first embodiment of the device according to the invention;
FIG. 2 shows a schematic structural diagram of a second embodiment of the device according to the invention;
FIG. 3 shows a schematic flow chart of a first embodiment of the method according to the invention;
FIG. 4 shows a schematic diagram of a baseline value generation flow according to an embodiment of the method of the invention;
fig. 5 shows a flow diagram of an embodiment two of the method according to the invention.
Detailed Description
Fig. 1 shows a schematic structural diagram of a first exemplary embodiment of a device according to the present invention. As shown in fig. 1, the abnormal state diagnostic apparatus 10 includes:
the steady state determining module 11 receives an input signal of an analog input channel, and determines whether the input signal reaches a steady state according to the change of the input signal;
a baseline value generation module 12 for generating a baseline value of the input signal from a statistical value of the input signal under a condition that the input signal reaches a steady state;
and an abnormal state diagnosis module 13 for monitoring the deviation of the statistic value of the input signal from the baseline value and determining whether the input signal has an abnormal state according to the deviation.
In an embodiment according to the present invention, statistical characteristics of an input signal of an analog input channel are used to monitor changes in sampled values of the input signal relative to the statistical characteristics thereof to detect whether an abnormal state of the input signal occurs. Under the condition that the input signal reaches a steady state, the change of the input signal conforms to a specific statistical rule under a normal state. Therefore, the baseline value of the input signal can be generated according to the statistical characteristics of the input signal, and when the change of the input signal is obviously deviated from the baseline value of the input signal, the abnormal state of the input signal can be detected.
And the statistical characteristics of the input signals are dynamically obtained according to the sampling values of the input signals, and the statistical rules of the input signals can be accurately reflected in time, so that the abnormal states of the input signals can be timely detected.
Fig. 2 shows a schematic structural diagram of a second embodiment of the device according to the invention. As shown in fig. 2, the abnormal state diagnostic apparatus 20 includes:
the steady state determining module 21 receives an input signal of an analog input channel, and determines whether the input signal reaches a steady state according to the change of the input signal;
a baseline value generation module 22 for generating a baseline value of the input signal according to the statistical value of the input signal under the condition that the input signal reaches a steady state;
an abnormal state diagnosis module 23 that monitors a deviation of the statistical value of the input signal from the baseline value and determines whether an abnormal state occurs in the input signal according to the deviation;
and an indication module 24 for generating an alarm when the input signal has an abnormal state.
In the embodiment of the invention, the abnormal state of the detected input signal is further indicated through the LED configured for the analog input channel or the human-computer interface device of the industrial control equipment, so that the field operator can be timely warned, and great convenience is provided for the maintenance and operation of the field equipment.
In the above embodiment of the present invention, the baseline value generation module may further regenerate the baseline value of the input signal according to the statistical value of the input signal under the condition that the deviation monitored by the abnormal state diagnosis module exceeds a set threshold.
Since the process variable of a field device is usually sensed by a corresponding sensor, the process variable sensed by the sensor device may change asymptotically as a result of factors such as aging of the sensor device or changes in the operating environment, which may be reflected as a gradual change in the statistical characteristics of the input signal of the analog input channel. Therefore, under the condition that the deviation monitored by the abnormal state diagnosis module exceeds a set threshold value, the baseline value generation module regenerates the baseline value of the input signal according to the statistic value of the input signal, so that the method can automatically adapt to the gradual change of the statistic characteristics of the input signal, improve the diagnosis accuracy and reduce the false alarm.
A baseline value of the input signal may be generated from a mean and a standard deviation of the input signal. Under the condition that the input signal of the analog input channel reaches a steady state, the analog input channel CAN transmit the sampling value of the input signal to an industrial control device through an industrial field communication bus such as ModBus or CAN and the like so as to calculate the mean value and the standard deviation of the input signal and generate the base line value of the input signal. Considering that the computing power and the storage space of industrial control equipment such as a PLC and a DCS are generally limited, the mean value M and the standard deviation S of the input signal may be iteratively calculated in an incremental manner as follows:
c0: initializing n to 0; ex is 0; ex2 ═ 0;
c1: if n is 0, then K is X, n + is 1; wherein X is a sampling value of the input signal;
c2: otherwise, Ex + (X-K); ex2 ═ X-K (X-K); k + ═ Ex/n;
c3: if n is equal to a set iteration count value, M is equal to K; s ═ S (Ex2- (Ex)/n)/(n-1);
c4: otherwise, n + ═ 1;
the operations of C1 through C4 described above are iterated.
According to the generated baseline value of the input signal, the abnormal state diagnosis module monitors a deviation between a statistical value of the input signal and the baseline value, and determines whether an abnormal state occurs in the input signal according to the deviation, which may specifically include:
calculating a mean value and a standard deviation of sampling values of the input signal;
if the difference between the mean value of the sampling values of the input signal and the M exceeds the set threshold, informing the baseline value generation module to regenerate the baseline value of the input signal;
otherwise, calculating the difference between the standard deviation of the sampling values of the input signals and the S;
and if the difference value between the standard deviation of the sampling value of the input signal and the S exceeds a set first threshold value, determining that the input signal is in an abnormal state.
In the above embodiment of the present invention, the steady-state determining module may determine whether the input signal reaches a steady state according to the change of the input signal, specifically including:
calculating the difference value between the sampling value of the input signal and a set steady-state value;
and if the absolute value of the difference value between the sampling value of the input signal and the steady state value is smaller than a set second threshold value in a set time window, determining that the input signal reaches the steady state.
In the above embodiments according to the present invention, the threshold, the first threshold, the second threshold and the length of the time window may be set according to empirical values, historical data and/or experimental simulation results.
It will be understood by those skilled in the art that the above description has been made with reference to the mean and standard deviation of input signals as examples of input signal statistics, but the present invention is not limited thereto, in view of the fact that the computing power and memory space of industrial control devices such as PLC and DCS are generally limited. It will be understood by those skilled in the art that the statistical value of the input signal may also adopt any other value capable of reflecting the statistical characteristics of the input signal without departing from the technical idea of the present invention.
Fig. 3 shows a schematic flow chart of a first exemplary embodiment of the method according to the present invention. As shown in fig. 3, in this embodiment, the method includes:
s31: receiving an input signal of an analog input channel;
s32: determining whether the input signal reaches a steady state according to the change of the input signal; if the input signal reaches a steady state, performing S33;
s33: generating a baseline value of the input signal according to the statistic value of the input signal;
s34: monitoring a deviation of a statistical value of the input signal from the baseline value;
s35: if the deviation exceeds a set threshold, executing S33, and regenerating a baseline value of the input signal according to the statistic value of the input signal, otherwise, executing S36;
s36: and determining whether the input signal has an abnormal state according to the deviation.
Considering that the computing power and storage space of industrial control devices such as PLC and DCS are often limited, the baseline value of the input signal can be generated from the mean and standard deviation of the input signal to reduce the amount of computation and storage required. Fig. 4 shows a schematic diagram of a baseline value generation flow according to an embodiment of the method of the present invention, in which the mean value M and the standard deviation S of the input signal are iteratively calculated in an incremental manner to further reduce the amount of calculation and storage of the industrial control device. As shown in fig. 4, the process includes:
s41: initializing n to 0; ex is 0; ex2 ═ 0;
s42: receiving a sampling value X of the input signal;
s43: is n 0? If n is 0, performing S44, otherwise, performing S45;
s44: let K ═ X, n + ═ 1; returning to S42;
S45:Ex+=(X-K);Ex2-=(X-K)*(X-K);K+=Ex/n;
s46: determine if n is equal to a set iteration count? If so, performing S47, otherwise, performing S48;
s47: let M be K; s ═ S (Ex2- (Ex)/n)/(n-1); the flow ends.
S48: n + ═ 1; returning to S42.
Fig. 5 shows a flow diagram of a second embodiment of the method according to the invention, in which the baseline values M and S can be generated according to the flow shown in fig. 4. As shown in fig. 5, it includes:
s51: receiving an input signal of an analog input channel;
s52: calculating the difference value between the sampling value of the input signal and a set steady-state value;
s53: judging whether the absolute value of the difference value between the sampling value of the input signal and the steady-state value is smaller than a set second threshold value within a set time window, if so, executing S54, otherwise, returning to S52;
s54: generating baseline values M and S of the input signal;
s55: calculating a mean value and a standard deviation of sampling values of the input signal;
s56: judging whether the difference value between the mean value of the sampling values of the input signals and the M exceeds a set threshold value, if so, returning to S54, otherwise, executing S57;
s57: judging whether the difference value between the standard deviation of the sampling value of the input signal and the S exceeds a set first threshold value, if so, executing S58, otherwise, returning to S55;
s58: and determining that the input signal has an abnormal state and alarming.
For a detailed description of the steps of the above embodiment, reference may be made to the above description of the embodiment of the apparatus according to the invention, and further description is omitted here.
It will be appreciated by those skilled in the art that while the present description has been described in terms of various embodiments, it is not intended that each embodiment comprises a separate embodiment, and that such descriptions are provided for clarity only and that those skilled in the art will be able to combine the embodiments as a whole to form further embodiments as will be appreciated by those skilled in the art.
The above description is only an exemplary embodiment of the present invention, and is not intended to limit the scope of the present invention. Any equivalent alterations, modifications and combinations can be made by those skilled in the art without departing from the spirit and principles of the invention.

Claims (10)

1. An abnormal state diagnosis apparatus of an analog input channel, comprising:
the steady state determining module receives an input signal of the analog input channel and determines whether the input signal reaches a steady state or not according to the change of the input signal;
a baseline value generation module for generating a baseline value of the input signal according to a statistical value of the input signal under a condition that the input signal reaches a steady state;
an abnormal state diagnosis module for monitoring the deviation of the statistic value of the input signal and the baseline value and determining whether the input signal has an abnormal state according to the deviation;
wherein the mean M and the standard deviation S of the input signal are iteratively calculated in an incremental manner as follows:
c0: initializing n to 0; ex is 0; ex2 ═ 0;
c1: if n is 0, then K is X, n + is 1; wherein X is a sampling value of the input signal;
c2: otherwise, Ex + (X-K); ex2 ═ X-K (X-K); k + ═ Ex/n;
c3: if n is equal to a set iteration count value, M is equal to K; s ═ S (Ex2- (Ex)/n)/(n-1);
c4: otherwise, n + ═ 1;
the operations of C1 through C4 described above are iterated.
2. The abnormal state diagnostic device according to claim 1,
the baseline value generation module is further configured to regenerate a baseline value of the input signal according to the statistical value of the input signal under the condition that the deviation monitored by the abnormal state diagnosis module exceeds a set threshold.
3. The abnormal-state diagnostic device according to claim 2, wherein the baseline value of the input signal is a mean value and a standard deviation of the input signal.
4. The abnormal state diagnostic apparatus according to claim 2, wherein the abnormal state diagnostic module monitors a deviation of a statistical value of the input signal from the baseline value and determines whether an abnormal state of the input signal occurs according to the deviation, includes:
calculating a mean value and a standard deviation of sampling values of the input signal;
if the difference between the mean value of the sampling values of the input signal and the M exceeds the set threshold, informing the baseline value generation module to regenerate the baseline value of the input signal;
otherwise, calculating the difference between the standard deviation of the sampling values of the input signals and the S;
and if the difference value between the standard deviation of the sampling value of the input signal and the S exceeds a set first threshold value, determining that the input signal is in an abnormal state.
5. The abnormal state diagnostic apparatus according to any one of claims 1 to 4, wherein the steady state determination module that determines whether the input signal has reached a steady state based on a change in the input signal includes:
calculating the difference value between the sampling value of the input signal and a set steady-state value;
and if the absolute value of the difference value between the sampling value of the input signal and the steady state value is smaller than a set second threshold value in a set time window, determining that the input signal reaches the steady state.
6. An abnormal state diagnosis method of an analog input channel includes:
receiving an input signal of the analog input channel, and determining whether the input signal reaches a steady state according to the change of the input signal;
generating a baseline value of the input signal according to the statistic value of the input signal under the condition that the input signal reaches a steady state;
monitoring the deviation of the statistic value of the input signal and the baseline value, and determining whether the input signal has an abnormal state according to the deviation;
wherein the mean M and the standard deviation S of the input signal are iteratively calculated in an incremental manner as follows:
c0: initializing n to 0; ex is 0; ex2 ═ 0;
c1: if n is 0, then K is X, n + is 1; wherein X is a sampling value of the input signal;
c2: otherwise, Ex + (X-K); ex2 ═ X-K (X-K); k + ═ Ex/n;
c3: if n is equal to a set iteration count value, M is equal to K; s ═ S (Ex2- (Ex)/n)/(n-1);
c4: otherwise, n + ═ 1;
the operations of C1 through C4 described above are iterated.
7. The abnormal state diagnostic method according to claim 6, further comprising:
and under the condition that the deviation between the statistic value of the input signal and the baseline value exceeds a set threshold value, regenerating the baseline value of the input signal according to the statistic value of the input signal.
8. The abnormal state diagnostic method of claim 7, wherein the baseline value of the input signal is a mean and a standard deviation of the input signal.
9. The abnormal state diagnostic method of claim 7, wherein the monitoring a deviation of the statistical value of the input signal from the baseline value and determining whether the input signal has an abnormal state according to the deviation comprises:
calculating a mean value and a standard deviation of sampling values of the input signal;
if the difference between the mean value of the sampling values of the input signal and the M exceeds the set threshold, informing the baseline value generation module to regenerate the baseline value of the input signal;
otherwise, calculating the difference between the standard deviation of the sampling values of the input signals and the S;
and if the difference value between the standard deviation of the sampling value of the input signal and the S exceeds a set first threshold value, determining that the input signal is in an abnormal state.
10. The abnormal state diagnostic method according to any one of claims 6 to 9, wherein the determining whether the input signal has reached a steady state based on the change in the input signal includes:
calculating the difference value between the sampling value of the input signal and a set steady-state value;
and if the absolute value of the difference value between the sampling value of the input signal and the steady state value is smaller than a set second threshold value in a set time window, determining that the input signal reaches the steady state.
CN201510827799.6A 2015-11-25 2015-11-25 Abnormal state diagnosis device and method for analog input channel Active CN106774235B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510827799.6A CN106774235B (en) 2015-11-25 2015-11-25 Abnormal state diagnosis device and method for analog input channel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510827799.6A CN106774235B (en) 2015-11-25 2015-11-25 Abnormal state diagnosis device and method for analog input channel

Publications (2)

Publication Number Publication Date
CN106774235A CN106774235A (en) 2017-05-31
CN106774235B true CN106774235B (en) 2021-08-31

Family

ID=58963711

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510827799.6A Active CN106774235B (en) 2015-11-25 2015-11-25 Abnormal state diagnosis device and method for analog input channel

Country Status (1)

Country Link
CN (1) CN106774235B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106774235B (en) * 2015-11-25 2021-08-31 西门子(中国)有限公司 Abnormal state diagnosis device and method for analog input channel
CN109405852A (en) * 2018-12-17 2019-03-01 北京无线电测量研究所 A kind of three Axle mould analog quantity Gyro Calibration system and methods

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5164912A (en) * 1989-11-17 1992-11-17 Westinghouse Electric Corp. Expert system tester
CN101156120A (en) * 2005-04-04 2008-04-02 费舍-柔斯芒特系统股份有限公司 Statistical processing methods used in anomaly detection
CN101535911A (en) * 2006-10-17 2009-09-16 罗斯蒙德公司 Industrial process sensor with sensor coating detection
CN101641508A (en) * 2007-03-26 2010-02-03 丰田自动车株式会社 Forced air induction system for internal combustion engine and abnormality diagnosis method for same system
CN102472647A (en) * 2009-07-23 2012-05-23 西屋电气有限责任公司 Method for treating steam generator tubes of a nuclear power plant
CN102509280A (en) * 2011-11-10 2012-06-20 重庆大学 Multi-focus image fusion method
CN103327887A (en) * 2011-01-13 2013-09-25 里斯米亚医疗公司 Electroanatomical mapping
CN103379422A (en) * 2012-04-19 2013-10-30 通用电气公司 System and methods for sensing the operational status of an acoustic horn
CN103997313A (en) * 2012-10-25 2014-08-20 通用汽车环球科技运作有限责任公司 Exponentially weighted moving averaging filter with adjustable weighting factor
CN106774235A (en) * 2015-11-25 2017-05-31 西门子(中国)有限公司 The abnormality diagnostic device and method of a kind of simulation input channel

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102315978A (en) * 2010-06-29 2012-01-11 百度在线网络技术(北京)有限公司 Method and device for detecting abnormal conditions of subset in open-type interactive platform

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5164912A (en) * 1989-11-17 1992-11-17 Westinghouse Electric Corp. Expert system tester
CN101156120A (en) * 2005-04-04 2008-04-02 费舍-柔斯芒特系统股份有限公司 Statistical processing methods used in anomaly detection
CN101535911A (en) * 2006-10-17 2009-09-16 罗斯蒙德公司 Industrial process sensor with sensor coating detection
CN101641508A (en) * 2007-03-26 2010-02-03 丰田自动车株式会社 Forced air induction system for internal combustion engine and abnormality diagnosis method for same system
CN102472647A (en) * 2009-07-23 2012-05-23 西屋电气有限责任公司 Method for treating steam generator tubes of a nuclear power plant
CN103327887A (en) * 2011-01-13 2013-09-25 里斯米亚医疗公司 Electroanatomical mapping
CN102509280A (en) * 2011-11-10 2012-06-20 重庆大学 Multi-focus image fusion method
CN103379422A (en) * 2012-04-19 2013-10-30 通用电气公司 System and methods for sensing the operational status of an acoustic horn
CN103997313A (en) * 2012-10-25 2014-08-20 通用汽车环球科技运作有限责任公司 Exponentially weighted moving averaging filter with adjustable weighting factor
CN106774235A (en) * 2015-11-25 2017-05-31 西门子(中国)有限公司 The abnormality diagnostic device and method of a kind of simulation input channel

Also Published As

Publication number Publication date
CN106774235A (en) 2017-05-31

Similar Documents

Publication Publication Date Title
CN108638128B (en) Real-time abnormity monitoring method and system of industrial robot
US10476386B2 (en) Digitally controlled power supply apparatus and production management system
RU2576588C2 (en) Detection of sensor performance degradation implemented in transmitter
US11226607B2 (en) Abnormality determination system, data transmitter-receptor, motor controller, and method for determining abnormality
US20200210263A1 (en) System and method for detecting anomalies in cyber-physical system with determined characteristics
US20170317916A1 (en) Control system, control method, control program, and recording medium
US9405278B2 (en) Method for operating a safety control device
KR101178186B1 (en) Method of alarming abnormal situation of plc based manufacturing system using plc signal pattern in pc based system
CN111033413B (en) Monitoring device and method for monitoring a system
KR102561410B1 (en) Ai-based autonomous control integrated building automatic control system
KR102168736B1 (en) Abnormality detection device, abnormality detection system, and abnormality detection method
EP3299918A1 (en) Abnormality diagnosis system and abnormality diagnosis method
EP3674946B1 (en) System and method for detecting anomalies in cyber-physical system with determined characteristics
JP6568076B2 (en) Normalized process dynamics
US20110264396A1 (en) Electrical circuit with physical layer diagnostics system
CN106774235B (en) Abnormal state diagnosis device and method for analog input channel
EP3234706B1 (en) Apparatus and methods for monitoring subsea electrical systems using adaptive models
JP7168567B2 (en) Method and Apparatus for Collecting Motion Data for Industrial Robot Applications
EP4325377A1 (en) Data processing device, data analyzing device, data processing system and method for processing data
US10234057B2 (en) Method for detecting an operating condition on a valve assembly and implementation thereof
EP3338188B1 (en) Method for determining a mean time to failure of an electrical device
CN113778044A (en) Monitoring method and device for blower system of thermal power plant
US11366460B2 (en) System for monitoring electrical devices and a method thereof
JP2014134999A (en) Valve diagnosis apparatus
JP4402613B2 (en) Plant abnormality monitoring system and plant abnormality monitoring method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant