CN106679842A - Temperature measuring method and circuit adopting reference voltage compensation technology - Google Patents
Temperature measuring method and circuit adopting reference voltage compensation technology Download PDFInfo
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- CN106679842A CN106679842A CN201611065994.0A CN201611065994A CN106679842A CN 106679842 A CN106679842 A CN 106679842A CN 201611065994 A CN201611065994 A CN 201611065994A CN 106679842 A CN106679842 A CN 106679842A
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- temperature
- reference voltage
- voltage source
- fpga chip
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
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Abstract
The invention discloses a temperature measuring method and circuit adopting the reference voltage compensation technology. The method is characterized in that a reference voltage source supplies power for a platinum resistor temperature measuring bridge while the temperature of the reference voltage source is measured through a digital temperature measuring sensor attached to the surface of the reference voltage source, and the temperature is transmitted to a FPGA chip; the platinum resistor temperature measuring bridge converts the measured temperature into voltage change, and the voltage change sequentially passes a filter circuit, an operation amplifier and an A/D conversion module and is input into the FPGA chip; the FPGA chip performs the error compensation and calculation of the measured temperature according to the temperature error calibration model of the reference voltage source and the nonlinear calibration model of a platinum resistor so as to output the digital quantity of the measured temperature. The method has the advantages that error compensation is performed on the output value of reference voltage, the reference voltage is kept accurate as much as possible during the calculation, and temperature measuring precision is increased to a large degree.
Description
Technical field
The present invention relates to technical field of temperature measurement, more particularly to a kind of temp measuring method of employing reference voltage compensation technology
And temperature measurement circuit.
Background technology
The advantages of platinum resistance is with its temperature-measuring range width, high precision, good stability, high indicating value repdocutbility and resistance to oxidation, in temperature
Degree fields of measurement occupies critical role.In order to reduce impact of the lead resistance to platinum resistor temperature measuring precision, typically using electric bridge electricity
Design on road.Its principle is：A voltage drive is provided using reference voltage source for bridge circuit, bridge circuit is by the reference voltage
The measurement voltage changed with platinum resistance change in resistance is converted into, by collection, the survey that measurement voltage signal obtains temperature is processed
Value.Wherein, the magnitude of voltage of reference voltage source output can change with ambient temperature and produce drift, and this temperature error is high-precision
Degree thermometric occasion is more projected, and temperature measurement accuracy is have impact on to a great extent.
The content of the invention
For the defect that above-mentioned prior art is present, the present invention proposes a kind of thermometric side of employing reference voltage compensation technology
Method and temperature measurement circuit, improve temperature measurement accuracy.
A kind of temp measuring method of employing reference voltage compensation technology that the present invention is provided, it is theed improvement is that, benchmark electricity
While potential source is powered for platinum resistor temperature measuring electric bridge, the Digital Measurement of Temperature sensor fitted by surface is measured its temperature and passes to FPGA
Chip；Dut temperature is changed into change in voltage by the platinum resistor temperature measuring electric bridge, then sequentially passes through filter circuit, operational amplifier
With the fpga chip is input into after A/D modular converters；Temperature error peg model of the fpga chip according to reference voltage source
With platinum resistance nonlinear calibration model, error compensation and the calculating of the dut temperature are carried out, export the number of the dut temperature
Word amount.
Preferably, the step of temperature error peg model for setting up the reference voltage source, includes：
(1) the Digital Measurement of Temperature sensor laminating reference voltage source, the surface temperature of the reference voltage source is passed
To the fpga chip；
(2) output voltage of the reference voltage source is passed to after the operational amplifier and the A/D modular converters
The fpga chip；
(3) temperature in reference voltage source place space is adjusted, the fpga chip latches institute under output different temperatures
State the surface temperature and output voltage of reference voltage source；
(4) surface temperature for being obtained according to step (3) and output voltage values are modeled, and determine the output of the reference voltage source
The function of voltage and surface temperature.
More preferably, the output voltage of step (4) reference voltage source is as follows with the function of surface temperature：
Set up the reference voltage output VREFWith the temperature value TV-REFBetween functional relationship be：
VREF=VREF0+f(TV-REF) (1)
In formula, VREFOn the basis of voltage source output voltage；VREF0On the basis of voltage source theoretical output voltage；f(TV-REF)
For the piecewise function that output error is varied with temperature.
More preferably, the piecewise function f (TV-REF) in waypoint by analysis regression criterion determine.
More preferably, the step of setting up the platinum resistance nonlinear calibration model includes：
1) reference voltage source is powered for the platinum resistor temperature measuring electric bridge；
2) temperature in platinum resistance place space is adjusted so as to synchronous with the temperature change of step (3), the fpga chip lock
Deposit platinum resistance resistance data at different temperatures and export；
3) according to step 2) in temperature and correspondence resistance data modeling, determine the letter of the platinum resistance resistance and temperature
Number.
More preferably, carry out the error compensation of the dut temperature and calculating comprises the steps：
I. according to formula (1), the output voltage V of calculating benchmark voltage sourceREFValue；
II. the voltage V of the exit point of the platinum resistor temperature measuring electric bridge is calculatedT：
In formula, β is the amplification of operational amplifier when carrying out temp measuring method；VDTo carry out fpga chip during temp measuring method
Receive the digital quantity of A/D modular converters output；
III. platinum resistance resistance R is calculatedT：
In formula, R is the precision resistance of definite value；
V. the digital quantity T of dut temperature is calculated：
T=g (RT) (4)。
More preferably, reference voltage source place space and platinum resistance place space are separately positioned on into same incubator
Same position, when carrying out temperature adjustment, the setting to the incubator includes：
1. when incubator stands, 25 DEG C of insulation 60min；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
3. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 80 DEG C, being incubated 10min；
4. incubator is lowered the temperature 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
5. 4. return to step carries out incubator cooling, until when the Temperature of Warm Case is -40 DEG C, being incubated 10min；
6. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 25 DEG C, being incubated 10min.
More preferably, the temperature measurement circuit includes platinum resistor temperature measuring electric bridge, filter circuit, operational amplifier, A/D moduluss of conversion
Block, reference voltage source, Digital Measurement of Temperature sensor and fpga chip；
The Digital Measurement of Temperature sensor is fitted and be connected with the fpga chip after the reference voltage source；The reference voltage
Source successively with the platinum resistor temperature measuring electric bridge, the filter circuit, the operational amplifier, A/D modular converters and described
Fpga chip connects.
More preferably, platinum resistance model PT100, the platinum resistor temperature measuring electric bridge includes platinum resistance and 3 resistances
Identical definite value precision resistance；In two branch roads of the platinum resistance and definite value precision resistance composition, symmetric position is led
The model of line, length, wire laying mode are identical.
In technical scheme：
(1) error compensation is carried out by the output valve to reference voltage, reference voltage is ensured as far as possible in calculating process
Accurately, so as to improve temperature measurement accuracy to a great extent；
(2) reference voltage source Temperature error model scaling method is devised, periodic calibration can be effectively ensured temperature measurement circuit
Precision it is steady in a long-term.
(3) parameter in FGPA chip softwares is easy to modification, and function waypoint can easily be accommodated, in terms of compensation precision is improved
There is preferable operability.
(4) the reference voltage source Temperature error model scaling method of design, for the other application occasion of reference voltage source
It is equally applicable.
(5) while platinum resistance nonlinearity erron is compensated, the compensation of reference voltage source temperature error is carried out, it is extra to increase
System power dissipation it is less, simple structure, it is easy to accomplish.
Description of the drawings
Fig. 1 is the temperature measurement circuit schematic diagram of the employing reference voltage compensation technology of the embodiment of the present invention；
Fig. 2 is the reference voltage source temperature error Calibration Circuit schematic diagram of the embodiment of the present invention；
Fig. 3 is the platinum resistor temperature measuring electrical bridge principle figure of the embodiment of the present invention.
Specific embodiment
To make the objects, technical solutions and advantages of the present invention become more apparent, referring to the drawings and preferred reality is enumerated
Example is applied, the present invention is described in more detail.However, it is necessary to explanation, many details listed in description are only to be
Reader is set to have a thorough explanation to the one or more aspects of the present invention, even without these specific details can also
Realize the aspects of the invention.
The temp measuring method and temperature measurement circuit of the employing reference voltage compensation technology of the present embodiment, Main is electric with platinum
When resistance carries out temperature survey, error compensation is carried out by the output valve to reference voltage, reference voltage is ensured in calculating process
As far as possible accurately, so as to improve temperature measurement accuracy to a great extent.Specifically：
The temperature measurement circuit of the employing reference voltage compensation technology that the present embodiment is proposed is as shown in figure 1, including platinum resistor temperature measuring
Electric bridge, filter circuit, operational amplifier, A/D modular converters, reference voltage source, Digital Measurement of Temperature sensor and fpga chip；Numeral
Temperature transducer laminating reference voltage source after be connected with fpga chip, reference voltage source successively with platinum resistor temperature measuring electric bridge, filter
The connection of circuit, operational amplifier, A/D modular converters and fpga chip.Reference voltage source be platinum resistor temperature measuring electric bridge power it is same
When, temperature T of the Digital Measurement of Temperature sensor measuring basiss voltage source fitted by surfaceV-REFPass to fpga chip；Platinum resistance is surveyed
Dut temperature is changed into change in voltage by warm electric bridge, is output as VT-PAnd VT-N, amplify β times through operational amplifier, then through A/D
Analog quantity is converted to digital quantity V by modular converterDAfter be input into fpga chip；Temperature error of the fpga chip according to reference voltage source
Peg model and platinum resistance nonlinear calibration model, carry out error compensation and the calculating of dut temperature, export the number of dut temperature
Word amount.
Specifically, when the present embodiment sets up the temperature error peg model of reference voltage source, its Calibration Circuit schematic diagram is such as
Shown in Fig. 2, including reference voltage source, operational amplifier, A/D modular converters, Digital Measurement of Temperature sensor and fpga chip.Numeral is surveyed
Temperature sensor laminating reference voltage source, by surface temperature T of reference voltage sourceV-REFPass to fpga chip.At the same time, benchmark electricity
The output voltage V of potential sourceREFAmplify α times through operational amplifier, then analog quantity is switched to into digital quantity V through A/D modular convertersRD
After pass to fpga chip.The temperature in reference voltage source place space is adjusted, fpga chip latches benchmark electricity under output different temperatures
The surface temperature and output voltage of potential source, is modeled, modeling using MATLAB to reference voltage source surface temperature and output voltage values
Process is as follows：
According to the digital quantity V of fpga chip outputRD, calculating benchmark voltage output amount VREF：
α is the amplification of operational amplifier in formula；
Reference voltage output VREFWith temperature value TV-REFBetween functional relationship be：
VREF=VREF0+f(TV-REF) (1)
In formula, VREFOn the basis of voltage source output voltage；VREF0On the basis of voltage source theoretical output voltage；f(TV-REF)
For the piecewise function that output error is varied with temperature.Piecewise function f (TV-REF) in parameters use least square fitting
Obtain, waypoint is determined by analysis regression criterion.Parameter includes cubic term coefficient, secondary term coefficient, Monomial coefficient, constant
.
Specifically, when the present embodiment sets up platinum resistance nonlinear calibration model, its platinum resistor temperature measuring bridge circuit schematic diagram
As shown in figure 3, including platinum resistance and 3 resistance identical definite value precision resistances.Reference voltage source is the confession of platinum resistor temperature measuring electric bridge
In two branch roads of electricity, platinum resistance and definite value precision resistance composition, the model of the wire of symmetric position, length, wire laying mode phase
Together.Platinum resistance model PT100 of the present embodiment.In modeling, the temperature in platinum resistance place space is adjusted so as to benchmark electricity
The temperature error of potential source demarcates temperature change synchronization during modeling, records platinum resistance resistance data at different temperatures, and passes
To fpga chip, fpga chip latches output temperature and corresponding resistance data.Modeled using MATLAB, determine the platinum resistance
The function of resistance and temperature.
The present embodiment reference voltage source temperature error demarcate modeling and platinum resistance nonlinear calibration model when, by benchmark
Voltage source place space and platinum resistance place space are separately positioned on the same position of same incubator, when carrying out temperature adjustment,
Setting to incubator includes：
1. circuit devcie, 25 DEG C of insulation 60min of incubator are put into；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
3. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 80 DEG C, being incubated 10min；
4. incubator is lowered the temperature 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
5. 4. return to step carries out incubator cooling, until when the Temperature of Warm Case is -40 DEG C, being incubated 10min；
6. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 25 DEG C, being incubated 10min.
Specifically, when the present embodiment carries out the error compensation of dut temperature and calculates, step is as follows：
I. known quantity V is usedREF0With fpga chip input quantity TV-REF, according to the reference voltage source temperature error mark
The functional relationship that the method for determining is obtained, calculating benchmark voltage output amount VREFValue：
VREF=VREF0+f(TV-REF) (1)
In formula, VREF0On the basis of voltage source theoretical output, f (TV-REF) it is to characterize the segmentation that output error is varied with temperature
Function；
II. using known quantity β and fpga chip input quantity VD, calculate the voltage V of platinum resistor temperature measuring bridge output pointT：
In formula, β is the amplification of operational amplifier when carrying out temp measuring method；VDTo carry out fpga chip during temp measuring method
Receive the digital quantity of A/D modular converters output；
III. according to platinum resistor temperature measuring electric bridge according to electrical bridge principle, the voltage V of platinum resistor temperature measuring bridge output pointTFor：
Therefore, platinum resistance resistance RTComputing formula is：
In formula, R is the precision resistance of definite value；
V. using above-mentioned steps III gained platinum resistance resistance RT, according to the function that the platinum resistance nonlinear calibration is obtained
Relation, calculates output valve T of dut temperature：
T=g (RT) (4)。
Finally, fpga chip exports the digital quantity of dut temperature.
Partial parameters are as follows in the present embodiment circuit：
The resistance of precision resistance is 100 Europe in platinum resistor temperature measuring electric bridge；
Model DS18B20 of Digital Measurement of Temperature sensor；
A/D modular converters include A/D conversion chips, its model ADS1146.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (9)
1. a kind of temp measuring method of employing reference voltage compensation technology, it is characterised in that reference voltage source is platinum resistor temperature measuring electricity
While bridge is powered, the Digital Measurement of Temperature sensor fitted by surface is measured its temperature and passes to fpga chip；The platinum resistance is surveyed
Dut temperature is changed into change in voltage by warm electric bridge, then is sequentially passed through defeated after filter circuit, operational amplifier and A/D modular converters
Enter the fpga chip；Temperature error peg model and platinum resistance nonlinear calibration of the fpga chip according to reference voltage source
Model, carries out error compensation and the calculating of the dut temperature, exports the digital quantity of the dut temperature.
2. temp measuring method as claimed in claim 1, it is characterised in that set up the temperature error calibration mold of the reference voltage source
The step of type, includes：
(1) the Digital Measurement of Temperature sensor laminating reference voltage source, by the surface temperature of the reference voltage source institute is passed to
State fpga chip；
(2) output voltage of the reference voltage source passes to described after the operational amplifier and the A/D modular converters
Fpga chip；
(3) temperature in reference voltage source place space is adjusted, the fpga chip latches the base under output different temperatures
The surface temperature and output voltage of reference voltage source；
(4) surface temperature for being obtained according to step (3) and output voltage values are modeled, and determine the output voltage of the reference voltage source
With the function of surface temperature.
3. temp measuring method as claimed in claim 2, it is characterised in that the output voltage of step (4) reference voltage source with
The function of surface temperature is as follows：
Set up the reference voltage output VREFWith the temperature value TV-REFBetween functional relationship be：
VREF=VREF0+f(TV-REF) (1)
In formula, VREFOn the basis of voltage source output voltage；VREF0On the basis of voltage source theoretical output voltage；f(TV-REF) it is defeated
Go out the piecewise function that error is varied with temperature.
4. temp measuring method as claimed in claim 3, it is characterised in that the piecewise function f (TV-REF) in waypoint by point
Analysis regression criterion determines.
5. temp measuring method as claimed in claim 2, it is characterised in that the step of setting up the platinum resistance nonlinear calibration model
Including：
1) reference voltage source is powered for the platinum resistor temperature measuring electric bridge；
2) temperature in platinum resistance place space is adjusted so as to synchronous with the temperature change of step (3), the fpga chip latches platinum
Resistance resistance data at different temperatures are simultaneously exported；
3) according to step 2) in temperature and correspondence resistance data modeling, determine the function of the platinum resistance resistance and temperature.
6. the temp measuring method as described in claim 3-5 is arbitrary, it is characterised in that carry out the dut temperature error compensation and
Calculating comprises the steps：
I. according to formula (1), the output voltage V of calculating benchmark voltage sourceREFValue；
II. the voltage V of the exit point of the platinum resistor temperature measuring electric bridge is calculatedT：
In formula, β is the amplification of operational amplifier when carrying out temp measuring method；VDReceive to carry out fpga chip during temp measuring method
The digital quantity of A/D modular converters output；
III. platinum resistance resistance R is calculatedT：
In formula, R is the precision resistance of definite value；
V. the digital quantity T of dut temperature is calculated：
T=g (RT) (4)。
7. temp measuring method as claimed in claim 5, it is characterised in that by reference voltage source place space and platinum resistance institute
The same position of same incubator is separately positioned in space, when carrying out temperature adjustment, the setting to the incubator includes：
1. when incubator stands, 25 DEG C of insulation 60min；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
3. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 80 DEG C, being incubated 10min；
4. incubator is lowered the temperature 5 DEG C with 1 DEG C/min speed, in temperature spot insulation 10min；
5. 4. return to step carries out incubator cooling, until when the Temperature of Warm Case is -40 DEG C, being incubated 10min；
6. 2. return to step carries out incubator intensification, until when the Temperature of Warm Case is 25 DEG C, being incubated 10min.
8. a kind of temperature measurement circuit for temp measuring method, it is characterised in that the temperature measurement circuit includes platinum resistor temperature measuring electric bridge, filter
Wave circuit, operational amplifier, A/D modular converters, reference voltage source, Digital Measurement of Temperature sensor and fpga chip；
The Digital Measurement of Temperature sensor is fitted and be connected with the fpga chip after the reference voltage source；The reference voltage source according to
It is secondary with the platinum resistor temperature measuring electric bridge, the filter circuit, the operational amplifier, the A/D modular converters and the FPGA
Chip connects.
9. temperature measurement circuit as claimed in claim 8, it is characterised in that platinum resistance model PT100, the platinum resistance is surveyed
Warm electric bridge includes platinum resistance and 3 resistance identical definite value precision resistances；The platinum resistance and the definite value precision resistance are constituted
Two branch roads in, the model of the wire of symmetric position, length, wire laying mode are identical.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611065994.0A CN106679842B (en) | 2016-11-28 | 2016-11-28 | A kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology |
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|---|---|---|---|
| CN201611065994.0A CN106679842B (en) | 2016-11-28 | 2016-11-28 | A kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology |
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| CN106679842A true CN106679842A (en) | 2017-05-17 |
| CN106679842B CN106679842B (en) | 2019-02-26 |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109655179A (en) * | 2018-12-06 | 2019-04-19 | 东南大学 | Three-dimensional force sensor measuring circuit and method with temperature-compensating and optical fiber output |
| CN110243486A (en) * | 2019-07-04 | 2019-09-17 | 上海申矽凌微电子科技有限公司 | Full temperature high-precision temperature sensor-based system, method and medium |
| CN110411608A (en) * | 2019-07-23 | 2019-11-05 | 瑞纳智能设备股份有限公司 | A kind of modification method and system of list firewire switch temperature measurement error |
| CN111551295A (en) * | 2020-04-14 | 2020-08-18 | 杭州柯林电气股份有限公司 | Cable joint stress monitoring circuit and cable joint stress monitoring device |
| CN112198915A (en) * | 2020-10-22 | 2021-01-08 | 上海卫星工程研究所 | Satellite double-super-platform magnetic levitation electric drive temperature compensation method and system |
| CN112462740A (en) * | 2020-11-25 | 2021-03-09 | 中国兵器工业集团第二一四研究所苏州研发中心 | Temperature compensation calibration method for Stirling refrigerator controller |
| CN114636484A (en) * | 2022-05-09 | 2022-06-17 | 深圳市航顺芯片技术研发有限公司 | Digital temperature sensor, chip temperature detection system and chip temperature detection method |
| CN116054826A (en) * | 2023-03-31 | 2023-05-02 | 中勍科技股份有限公司 | Digital low-cost high-precision current frequency conversion system |
| CN118408653A (en) * | 2024-04-24 | 2024-07-30 | 常州大学 | A multi-channel temperature precision measurement circuit and measurement method based on PT1000 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1963908A (en) * | 2005-11-10 | 2007-05-16 | 昆达电脑科技(昆山)有限公司 | Temperature compensating apparatus of LCD element and its method |
| CN101019010A (en) * | 2004-09-15 | 2007-08-15 | 皇家飞利浦电子股份有限公司 | Digital temperature sensors and calibration thereof |
-
2016
- 2016-11-28 CN CN201611065994.0A patent/CN106679842B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101019010A (en) * | 2004-09-15 | 2007-08-15 | 皇家飞利浦电子股份有限公司 | Digital temperature sensors and calibration thereof |
| CN1963908A (en) * | 2005-11-10 | 2007-05-16 | 昆达电脑科技(昆山)有限公司 | Temperature compensating apparatus of LCD element and its method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109655179A (en) * | 2018-12-06 | 2019-04-19 | 东南大学 | Three-dimensional force sensor measuring circuit and method with temperature-compensating and optical fiber output |
| CN110243486A (en) * | 2019-07-04 | 2019-09-17 | 上海申矽凌微电子科技有限公司 | Full temperature high-precision temperature sensor-based system, method and medium |
| CN110243486B (en) * | 2019-07-04 | 2021-01-08 | 上海申矽凌微电子科技有限公司 | Full-temperature high-precision temperature sensing system, method and medium |
| CN110411608A (en) * | 2019-07-23 | 2019-11-05 | 瑞纳智能设备股份有限公司 | A kind of modification method and system of list firewire switch temperature measurement error |
| CN110411608B (en) * | 2019-07-23 | 2021-01-19 | 瑞纳智能设备股份有限公司 | Correction method and system for temperature measurement error of single-live-wire switch |
| CN111551295A (en) * | 2020-04-14 | 2020-08-18 | 杭州柯林电气股份有限公司 | Cable joint stress monitoring circuit and cable joint stress monitoring device |
| CN112198915A (en) * | 2020-10-22 | 2021-01-08 | 上海卫星工程研究所 | Satellite double-super-platform magnetic levitation electric drive temperature compensation method and system |
| CN112462740A (en) * | 2020-11-25 | 2021-03-09 | 中国兵器工业集团第二一四研究所苏州研发中心 | Temperature compensation calibration method for Stirling refrigerator controller |
| CN114636484A (en) * | 2022-05-09 | 2022-06-17 | 深圳市航顺芯片技术研发有限公司 | Digital temperature sensor, chip temperature detection system and chip temperature detection method |
| CN114636484B (en) * | 2022-05-09 | 2022-08-23 | 深圳市航顺芯片技术研发有限公司 | Digital temperature sensor, chip temperature detection system and chip temperature detection method |
| CN116054826A (en) * | 2023-03-31 | 2023-05-02 | 中勍科技股份有限公司 | Digital low-cost high-precision current frequency conversion system |
| CN118408653A (en) * | 2024-04-24 | 2024-07-30 | 常州大学 | A multi-channel temperature precision measurement circuit and measurement method based on PT1000 |
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| Publication number | Publication date |
|---|---|
| CN106679842B (en) | 2019-02-26 |
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