CN106559149A - A kind of throughput testing approach and device of multiple terminals - Google Patents

Abstract

The present invention provides a multi-terminal throughput testing method and device, which are applied to the architecture of a multi-probe darkroom. The throughput testing method includes: acquiring the interference intensity between a plurality of terminals under test arranged in a multi-probe darkroom; A plurality of first tested terminals whose intensity is less than or equal to a preset intensity value sends multiple test signals of different test frequency bands to a channel emulator in parallel, and the channel emulator passes the multiple test signals through the multi-probe anechoic chamber. Send different probes to multiple first terminals under test in parallel; respectively adjust the transmission power of multiple test signals, the direction of arrival of multiple test signals, and the placement posture of multiple first terminals under test to obtain the first terminal under test respectively. Throughput change information of the measured terminal. In the embodiment of the present invention, according to the interference intensity between the terminals under test, for multiple terminals with no interference or weak interference, the method of sending test signals in parallel to perform throughput test improves the test efficiency while ensuring the accuracy .

Description

A multi-terminal throughput testing method and device

technical field

The invention relates to the technical field of wireless communication, in particular to a multi-terminal throughput testing method and device.

Background technique

The throughput performance of an LTE terminal directly affects the user experience of the terminal. MIMO technology (Multiple Input Multiple Output technology) is one of the core technologies for improving throughput in LTE. MIMO technology needs to be applicable in a wireless propagation environment with relatively low spatial correlation and rich multipath components. The multi-antenna performance of an LTE terminal directly affects the spatial channel conditions, thus affecting the applicability of MIMO technology and affecting the throughput performance of the terminal. The MIMO over-the-air technology is used to test the multi-antenna receiving performance of the terminal.

The multi-probe anechoic chamber method is one of the existing MIMO OTA (multiple-input multiple-output over-the-air technology) testing schemes. As shown in Figure 1, the base station simulator is used to simulate the LTE cell and establish a communication connection with the terminal; the channel simulator uses To simulate the wireless propagation environment, the downlink signal is attenuated; the antenna probe in the multi-probe darkroom is used to radiate the signal according to certain mapping rules, and the required wireless propagation environment is built around the terminal under test, so as to test the throughput of the terminal.

The existing MIMO OTA test takes a long time and costs high. Due to possible multi-terminal interference, parallel test environment construction and control and other difficulties in the test process, the existing solution can only carry out the throughput test of one terminal at the same time, which is inefficient. . And because the MIMO OTA test system is expensive, the low test efficiency causes a great waste of test resources.

Contents of the invention

The purpose of the present invention is to provide a multi-terminal throughput testing method and device, which solves the problem that in the prior art, the MIMO OTA testing system can only carry out the throughput testing of one terminal at the same time, and the test efficiency is low, resulting in waste of resources.

In order to achieve the above object, the present invention provides a multi-terminal throughput testing method, which is applied to the architecture of a multi-probe darkroom, including:

Acquiring the interference intensity between a plurality of terminals under test arranged in the multi-probe darkroom;

For a plurality of first tested terminals whose interference intensity is less than or equal to a preset intensity value, a plurality of test signals of different test frequency bands are issued in parallel to a channel emulator, and the channel emulator passes the plurality of test signals through the Different probes in the multi-probe darkroom are issued in parallel to multiple first terminals under test;

respectively adjusting the transmission power of the plurality of test signals, the direction of arrival of the plurality of test signals, and the placement postures of the plurality of first terminals under test, and acquiring the throughput changes of the plurality of first terminals under test respectively information.

Wherein, the throughput testing method also includes:

For a plurality of second tested terminals whose interference strength is greater than the preset strength value, serially issue a test signal for the second tested terminal to the channel emulator, and the channel emulator transmits the test signal Sending serially to the second terminal under test through the probes in the multi-probe darkroom;

The transmission power of the test signal, the direction of arrival of the test signal, and the posture of the second terminal under test are sequentially adjusted, and throughput change information of the second terminal under test is sequentially acquired.

Wherein, the step of obtaining the interference intensity between a plurality of terminals under test arranged in the multi-probe darkroom includes:

Obtain out-of-band radiation spectrum information when each terminal under test works in all test frequency bands;

According to the out-of-band radiation spectrum information, the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band is determined.

Wherein, the steps of obtaining the out-of-band radiation spectrum information when each terminal under test respectively works in all test frequency bands include:

Establish a communication link with each terminal under test;

receiving an uplink signal transmitted by a corresponding terminal under test when it works in each test frequency band through the communication link;

According to the uplink signal, the out-of-band radiation spectrum information of each terminal under test when it works in each test frequency band is acquired.

Wherein, the method also includes:

According to the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band, determine that multiple work in different test frequency bands, and when the different test frequency bands work at the same time, the mutual interference intensity is less than or The terminal under test equal to the preset strength value is the first terminal under test.

Wherein, a plurality of test signals of different test frequency bands are issued in parallel to a channel emulator, and the plurality of test signals are issued in parallel by the channel emulator to a plurality of first tested devices through different probes in the multi-probe darkroom Terminal steps include:

A plurality of test signals of different test frequency bands are transmitted in parallel to the channel emulator through a plurality of base station simulators, and the test signal is output from a preset output port to a multi-probe darkroom and connected to the preset output port by the channel emulator The corresponding multiple probes transmit the multiple test signals in parallel by the multiple probes; the multiple test signals construct a corresponding wireless channel environment around the first terminal under test;

Controlling and controlling the plurality of base station simulators and first tested terminals corresponding to the test frequency bands to respectively establish communication links, and sending a parallel communication link with the first tested terminals to a plurality of first tested terminals through the communication links. The test signal corresponding to the channel model that the terminal works on.

Wherein, said respectively adjusting the transmission power of said plurality of test signals, the direction of arrival of said plurality of test signals, and the placement postures of said plurality of first terminals under test respectively obtains the plurality of first terminals under test The steps for throughput change information include:

Respectively adjusting the transmission power of the plurality of test signals and the direction of arrival of the plurality of test signals, respectively obtaining the throughput change information of the corresponding first terminal under test under the current placement posture;

Adjusting the placement postures of the plurality of first terminals under test, and adjusting the transmission power of the test signal and the direction of arrival of the test signal, respectively obtaining the corresponding first terminal under test under the adjusted placement posture Throughput change information;

determining throughput change information of the plurality of first terminals under test under all postures;

The average throughput change information of the first terminal under test is determined according to the throughput change information of the first terminal under test under all postures.

The embodiment of the present invention also provides a multi-terminal throughput testing device, which is applied to a multi-probe darkroom architecture, including:

An interference acquisition module, configured to acquire the interference intensity between a plurality of terminals under test arranged in the multi-probe darkroom;

The parallel test module is used to send a plurality of test signals of different test frequency bands to a channel emulator in parallel to a plurality of first tested terminals whose interference intensity is less than or equal to a preset intensity value, and the channel emulator will Multiple test signals are sent in parallel to multiple first terminals under test through different probes in the multi-probe darkroom;

The first information acquisition module is configured to separately adjust the transmission power of the multiple test signals, the direction of arrival of the multiple test signals, and the placement postures of the multiple first terminals under test, and acquire multiple first tested terminals respectively. - Throughput change information of the terminal under test.

Wherein, the throughput testing device also includes:

A serial test module, configured to serially issue a test signal for a second terminal under test to the channel emulator for a plurality of second terminals under test whose interference strength is greater than the preset strength value, and the channel emulator The emulator serially sends the test signal to the second terminal under test through the probes in the multi-probe darkroom;

The second information acquisition module is configured to sequentially adjust the transmission power of the test signal, the direction of arrival of the test signal, and the placement posture of the second terminal under test, and sequentially acquire changes in the throughput of the second terminal under test. information

Wherein, the interference acquisition module includes:

A spectrum acquisition module, configured to acquire out-of-band radiation spectrum information when each terminal under test works in all test frequency bands;

The interference acquisition sub-module is configured to determine the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band according to the out-of-band radiation spectrum information.

Wherein, the spectrum acquisition module includes:

Establishing a module for establishing a communication link with each terminal under test;

A receiving module, configured to receive an uplink signal transmitted by a corresponding terminal under test when it works in each test frequency band through the communication link;

The spectrum acquisition sub-module is configured to acquire out-of-band radiation spectrum information when each terminal under test works in each test frequency band according to the uplink signal.

Wherein, the device also includes:

A determining module, configured to determine multiple operating in different test frequency bands according to the interference intensity between the tested terminal operating in each test frequency band and other tested terminals, and to determine the mutual interference between the different test frequency bands when the different test frequency bands work at the same time The terminal under test whose interference strength is less than or equal to the preset strength value is the first terminal under test.

Wherein, the parallel testing module includes:

The first parallel sub-module is used to transmit a plurality of test signals of different test frequency bands in parallel to the channel emulator through a plurality of base station simulators, and the channel emulator outputs the test signals from a preset output port to a multi-probe A plurality of probes corresponding to the preset output port in the darkroom transmit the plurality of test signals in parallel by the plurality of probes; the plurality of test signals construct a corresponding wireless channel environment around the first terminal under test ;

The second parallel sub-module is used to control and control the plurality of base station emulators to establish communication links with the first terminals under test corresponding to the test frequency bands, and to download in parallel to a plurality of first terminals under test through the communication links. sending the test signal corresponding to the channel model in which the first terminal under test works.

Wherein, the first information acquisition module includes:

The first adjustment module is configured to respectively adjust the transmission power of the plurality of test signals and the direction of arrival of the plurality of test signals, and respectively obtain the throughput change information of the corresponding first terminal under test under the current placement posture;

The second adjustment module is configured to adjust the placement postures of the plurality of first terminals under test, and adjust the transmission power of the test signal and the direction of arrival of the test signal, and respectively obtain the corresponding adjustments of the first terminals under test. The throughput change information under the post posture;

The first information acquisition submodule is configured to determine the throughput change information of the plurality of first tested terminals under all postures;

The second information acquisition submodule is configured to determine the average throughput change information of the first terminal under test according to the throughput change information of the first terminal under test under all postures.

The technical solution of the present invention has at least the following beneficial effects:

The multi-terminal throughput testing method and device of the embodiments of the present invention are applicable to the structure of a multi-probe darkroom. The testing method uses The method of sending test signals in parallel for throughput test improves the test efficiency while ensuring the accuracy; for terminals with strong interference, it switches to the method of sending test signals serially for throughput test to ensure the accuracy of the test. Accuracy, effectively improving throughput test efficiency and reducing terminal test time and cost.

Description of drawings

Fig. 1 shows the structural diagram of MIMO OTA test system in multi-probe darkroom in the prior art;

Fig. 2 shows the flow chart of the basic steps of the multi-terminal throughput testing method provided by the embodiment of the present invention;

FIG. 3 shows a schematic diagram of the out-of-band radiation spectrum of the terminal under test in an embodiment of the present invention;

Fig. 4 shows the multi-probe anechoic multi-terminal MIMO OTA throughput testing system provided by the embodiment of the present invention;

Fig. 5 shows the flow chart of obtaining the out-of-band radiation spectrum information of the terminal under test in an embodiment of the present invention;

FIG. 6 shows a flowchart for determining the first terminal under test and the second terminal under test in an embodiment of the present invention;

FIG. 7 shows a schematic structural diagram of a channel emulator provided by an embodiment of the present invention;

FIG. 8 shows a specific test flowchart of a multi-terminal throughput test method provided by an embodiment of the present invention;

FIG. 9 shows a structural diagram of a multi-terminal throughput testing device provided by an embodiment of the present invention.

detailed description

In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to the drawings and specific embodiments.

Aiming at the problem that the MIMO OTA test system in the prior art can only carry out the throughput test of one terminal at the same time, the test efficiency is low and the resources are wasted, the present invention provides a multi-terminal throughput test method and device, according to each terminal to be tested Interference intensity between multiple terminals with no interference or weak interference, the throughput test method of sending test signals in parallel improves the test efficiency while ensuring accuracy; and for terminals with strong interference, Then switch to the method of serially sending test signals for throughput testing to ensure test accuracy, effectively improve throughput test efficiency and reduce terminal test time and cost.

As shown in Figure 2, a multi-terminal throughput testing method provided by an embodiment of the present invention is applied to a multi-probe darkroom architecture, and the throughput testing method includes:

Step 21, acquiring the interference intensity between multiple terminals under test set in the multi-probe darkroom; wherein, multiple terminals under test may work in different frequency bands or in the same frequency band. For example, when obtaining the terminal under test 1 working in frequency band 1, the interference intensity between the terminal under test 1 and other terminals under test operating in frequency band 1, frequency band 2, ..., frequency band n respectively; When the frequency band is 2, the interference intensity between the tested terminal 1 and other tested terminals respectively working in the frequency band 1, the frequency band 2,..., the frequency band n, and so on, so as to determine the interference intensity between multiple tested terminals.

Step 22, for a plurality of first tested terminals whose interference strength is less than or equal to a preset strength value, send multiple test signals of different test frequency bands to a channel emulator in parallel, and the multiple test signals are transmitted by the channel emulator Signals are sent in parallel to multiple first terminals under test through different probes in the multi-probe darkroom; since the MIMO OTA test uses the throughput curve as the criterion, the downlink power that drops from the maximum throughput to 95% of the maximum throughput is concerned Therefore, the downlink signal is strong, that is, the downlink signal is a large signal relative to the possible out-of-band radiation interference of the terminal, which provides the possibility to carry out parallel testing of multiple terminals. Interference between multiple terminals can be completely avoided as long as the out-of-band radiation interference intensity between terminals is not too strong. Among them, a plurality of first tested terminals whose interference strength is less than or equal to a preset strength value can be regarded as avoiding mutual interference, that is, when all first tested terminals work in their respective frequency bands at the same time (multiple The first terminal under test must work in a different test frequency band), and will not cause interference to other terminals under test. Therefore, parallel test signals can be issued to multiple first terminals under test, thereby improving test efficiency.

In order to realize the decoupling between each first tested terminal, a plurality of base station emulators are set to connect with a plurality of first tested terminals respectively, then a plurality of base station simulators simultaneously transmit a plurality of test signals of different test frequency bands, and multiple A first terminal under test can only receive a test signal sent by a base station simulator connected to it, thereby realizing parallel testing of multiple first terminals under test.

At the same time, the channel emulator includes a darkroom antenna mapping unit, which completes the mapping of the downlink signal transmitted by the base station simulator to the darkroom probes in the multi-probe darkroom. That is, in the case of parallel testing of multiple first terminals under test, the downlink signals after fading can be output and fed into the darkroom probe at the same time; while in the case of single terminal testing, the downlink signals after fading are only input into one base station simulator The downlink signal is fed into the darkroom probe.

Step 23, respectively adjusting the transmission power of the multiple test signals, the direction of arrival of the multiple test signals, and the placement postures of the multiple first terminals under test, and obtaining the information of the multiple first terminals under test respectively. Throughput change information. The embodiment of the present invention can obtain a throughput variation curve with the transmission power variation; specifically, the implementation of the present invention mainly focuses on the transmission power value of the downlink test signal when the terminal under test drops from the maximum throughput to 95% of the maximum throughput. ; If the transmission power value is smaller, it indicates that the performance of the terminal under test is better; if the transmission power value is larger, it indicates that the performance of the terminal under test is worse. Specifically, due to the application scenario of a multi-probe anechoic room, in addition to the transmission power of the test signal, the incoming wave direction of the test signal and the placement posture of the terminal under test need to be considered for the change of the throughput of the terminal under test. The average throughput change information of the measured terminal.

In the above-mentioned embodiments of the present invention, the multi-terminal throughput testing method provided by the embodiments of the present invention avoids interference between multiple terminals based on the judgment of interference intensity, realizes parallel testing of multiple terminals, and improves test efficiency.

Further, the throughput testing method provided by the above-mentioned embodiments of the present invention also includes:

Step 24, for a plurality of second terminals under test whose interference strength is greater than the preset strength value, serially send test signals for the second terminals under test to the channel emulator, and the channel emulator sends the test signals for the second terminals under test The test signal is serially sent to the second terminal under test through the probes in the multi-probe darkroom; wherein, the second terminal under test has very strong interference in all test frequency bands, that is, the second terminal under test No matter which test frequency band it works in, it will cause greater interference to other terminals under test. Therefore, these terminals cannot be tested in parallel; and in order to ensure the accuracy of the test, for this part of the second terminal under test, serial The throughput test is performed by sending a test signal to the line, that is, the throughput test is performed on a terminal-by-terminal basis.

In practical applications, it is generally used to perform parallel tests on multiple first terminals under test first, and then perform serial tests on multiple second terminals under test after the test is completed; it is also possible to perform serial tests on multiple second terminals under test first. For the test, after the test is completed, a parallel test of multiple first terminals under test is performed, which is not specifically limited here.

Continuing from the above example, multiple base station simulators are set up for the parallel testing of multiple first terminals under test, then when multiple second terminals under test are tested serially, the second terminal under test can be performed with any base station simulator The connection is not limited to a certain base station simulator.

Step 25, sequentially adjusting the transmission power of the test signal, the direction of arrival of the test signal, and the posture of the second terminal under test, and sequentially acquiring throughput change information of the second terminal under test. The test of the second terminal under test in the embodiment of the present invention is consistent with the test process in the prior art, and will not be described in detail here. Specifically, in the embodiment of the present invention, by sequentially adjusting the transmission power of a plurality of test signals, the throughput change curve of the second terminal under test corresponding to each second terminal under test as the transmission power changes can be obtained; specifically, In the implementation of the present invention, the main attention is paid to the transmission power value of the downlink test signal when the terminal under test drops from the maximum throughput to 95% of the maximum throughput; if the transmission power value is smaller, it indicates that the performance of the terminal under test is better ; The larger the transmit power value, the worse the performance of the terminal under test. Specifically, due to the application scenario of a multi-probe anechoic room, in addition to the transmission power of the test signal, the incoming wave direction of the test signal and the placement posture of the terminal under test need to be considered for the change of the throughput of the terminal under test. The average throughput change information of the measured terminal.

Specifically, in the above-mentioned embodiment of the present invention, step 21 includes:

Step 211, obtain the out-of-band radiation spectrum information when each terminal under test respectively works in all test frequency bands; specifically, the out-of-band radiation spectrum information can be obtained by a spectrum analyzer, and can also be realized by some software programming methods, here Not specifically limited. Among them, in order to facilitate the acquisition of the spectrum analyzer and reduce the number of spectrum analyzers, a signal splitter is set in the specific application of the present invention, the spectrum analyzer is connected to the signal splitter, and the uplink of the terminal is intercepted from the signal splitter. signal to obtain out-of-band spectrum information. Specifically, the output terminals of the signal splitter are respectively connected to multiple base station simulators, so as to realize the communication between the terminal under test and the base station simulators.

Step 212, according to the out-of-band radiation spectrum information, determine the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band. Wherein, when the terminal under test works in a test frequency band, the out-of-band radiation spectrum information of the terminal under test can intuitively and accurately indicate whether the terminal under test interferes with other frequency bands; for example, as shown in Figure 3, the terminal under test The out-of-band radiation spectrum schematic diagram of ; wherein, the curve 101 represents the out-of-band radiation spectrum information when the terminal 1 works in the frequency band 1, and the spectrum information indicates that when the terminal 1 works in the frequency band 1, there is strong interference to the frequency band a; the curve 102 Indicates the out-of-band radiation spectrum information when terminal 2 works in frequency band 2. The spectrum information indicates that when terminal 2 works in frequency band 2, there is strong interference to frequency band b; curve 103 represents the out-of-band radiation when terminal n works in frequency band n The radiation spectrum information indicates that when the terminal n works in the frequency band n, there is strong interference to the frequency band n+3.

Specifically, in the above-mentioned embodiment of the present invention, step 211 includes:

Step 2111, establish a communication link with each terminal under test;

Step 2112, receiving the uplink signal transmitted by the corresponding terminal under test when it works in each test frequency band through the communication link;

Step 2113, according to the uplink signal, obtain out-of-band radiation spectrum information when each terminal under test works in each test frequency band.

In the above-mentioned embodiments of the present invention, it is necessary to obtain the out-of-band radiation spectrum information of the terminal. First, it is necessary to establish a communication connection between the terminal and a base station simulator, so that the terminal and the base station simulator can communicate; and then from the uplink signal of the terminal under test A part is separated to evaluate the radiation performance of the terminal (that is, the intensity of out-of-band radiation interference).

Specifically, the embodiment of the present invention is applicable to a MIMO OTA test system in a multi-probe darkroom, and the structure of the multi-probe multi-terminal MIMO OTA throughput test system provided by the embodiment of the present invention is shown in FIG. 4 . Based on the above system structure, as shown in Figure 5,

The steps to obtain the out-of-band radiation spectrum information are as follows:

Step 51, the terminal under test 1 establishes a connection with any base station simulator, and transmits an uplink signal with maximum power;

Step 52, using a spectrum analyzer to sequentially capture the out-of-band radiation spectrum when the terminal under test 1 works respectively in all frequency bands to be tested (spectrum schematic as shown in Figure 3);

Step 53: Disconnect the terminal under test 1 from the base station simulator, repeat steps 51-52 for the terminals under test 2-N in sequence, and capture the out-of-band radiation spectrum information of all terminals under test so far.

Further, the multi-terminal throughput testing method provided in the embodiment of the present invention also includes:

According to the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band, determine that multiple work in different test frequency bands, and when the different test frequency bands work at the same time, the mutual interference intensity is less than or The terminal under test equal to the preset strength value is the first terminal under test. Among them, the test frequency band is allocated through a series of mathematical algorithms, and the test frequency band with weak or no interference is assigned to the tested terminal based on the mutual interference intensity between the tested terminals; and for all test frequency bands, the interference is very low. A strong terminal under test can choose a frequency band for testing. It should be noted that the characteristic of the first terminal under test is that it works in different test frequency bands, and when multiple first terminals under test work in the corresponding test frequency bands at the same time, they have weak or no interference with each other. Wherein, for a terminal under test with strong interference intensity in each test frequency band, it is determined to be the second terminal under test, that is, such terminals under test can only perform a serial test.

In short, the multiple first tested terminals work in different test frequency bands respectively, and do not cause interference to other terminals when the multiple first tested terminals work in their respective assigned test frequency bands simultaneously. That is, according to the captured out-of-band radiation spectrum of the terminal, select a combination of frequency bands with no interference or weak interference for parallel testing to improve efficiency; and for scenarios with strong interference in all frequency bands, test the terminal separately to ensure the accuracy of the test sex. As shown in Figure 3, curve 101 shows that when terminal 1 works in test frequency band 1, frequency band a cannot be used for parallel testing, that is, the terminal tested in parallel with terminal 1 working in test frequency band 1 cannot work in frequency band a; Figure 3 only As an example, the embodiments of the present invention need to be based on the spectrum conditions when the terminals work in their respective supported frequency bands, so there will be many spectrum distributions (such as the spectrum of N terminals*M frequency bands), by selecting the terminal under test and the test frequency band There is no or low interference between each other; finally, after the analysis of the out-of-band radiation spectrum by the present invention, the operating frequency bands (i.e. the test frequency bands during the test throughput) of each first terminal under test determined by the terminal are shown in Figure 6 . It can be seen from FIG. 6 that when terminal 1 , terminal 2 , and terminal 3 work in their respective operating frequency bands simultaneously, there is no interference among the terminals.

It should be noted that, when applied to the test system shown in FIG. 4 provided by the present invention, the switching between multi-terminal parallel test and single-terminal serial test is realized through the central controller, effectively reducing the terminal test time and cost.

The multi-terminal throughput test method provided by the embodiment of the present invention is applied to the multi-probe multi-terminal MIMO OTA throughput test system shown in FIG. The process of sending a test signal and performing a throughput test is described in detail:

That is, in the embodiment of the present invention, step 22 includes:

Step 221, transmit a plurality of test signals of different test frequency bands in parallel to the channel emulator through a plurality of base station simulators, and the test signal is output from a preset output port to a multi-probe darkroom by the channel emulator. Set a plurality of probes corresponding to the output port, and transmit the plurality of test signals in parallel by a plurality of the probes; the plurality of test signals construct a corresponding wireless channel environment around the first terminal under test; the multi-probe darkroom Under the model, the multi-probe anechoic chamber can construct multiple wireless environments at the same time, such as establishing independent UMI channel environments for different terminals at the same time, or establishing a UMI channel environment for the same terminal and establishing a UMA channel environment for another terminal. It is mainly implemented through a channel emulator, which can complete the configuration of the channel model required for the test. It should be noted that there can be multiple channel emulators, or one when the number of channels is sufficient. The result of the channel emulator is shown in Figure 7. An anechoic antenna mapping unit is set in the channel emulator, and the mapping relationship between different channel models (ie output ports) and different anechoic probes is stored in the anechoic antenna mapping unit. For example, the test signal whose channel model is UMI is output from port 1, and the test signal whose channel model is UMA is output from port 2, etc., which are not listed here.

Specifically, the test signals output from different output ports have different channel models, and will be sent through different probes (it should be noted that a test signal can be sent through one probe or multiple probes, here Not specifically limited), so as to construct different channel environments in the dark room. It should be noted that a terminal under test can only receive test signals in its own working frequency band within its own channel model.

Step 222: Control and control the plurality of base station simulators to establish communication links with the first terminals under test corresponding to the test frequency bands, and issue a parallel communication link with the first terminals under test through the communication links to multiple first terminals under test. The test signal corresponding to the channel model in which the terminal under test works.

And, step 24 includes:

Step 241, respectively adjusting the transmission power of the multiple test signals and the direction of arrival of the multiple test signals, and obtaining the throughput change information of the corresponding first terminal under test under the current posture;

Step 242, adjusting the placement postures of the plurality of first terminals under test, and adjusting the transmission power of the test signal and the direction of arrival of the test signal, respectively obtaining the adjusted placement of the corresponding first terminals under test Throughput change information under posture;

Step 243, determining throughput change information of the plurality of first terminals under test under all postures;

Step 244: Determine the average throughput change information of the first terminal under test according to the throughput change information of the first terminal under test under all postures.

It should be noted that before the embodiment of the present invention is applied to the test system shown in Figure 4, initialization is required: initialize the base station simulator, and set the base station simulator to different test frequency bands for testing corresponding frequency bands with different terminals under test Connect, for example, set test frequency band 1 for base station simulator 1, if terminal under test 1 works in test frequency band 1, then base station simulation 1 is used for communicating with terminal under test 1 on test frequency band 1; Initialize channel emulator, control The channel emulator completes the configuration of the channel model required for the test (there can be multiple channel emulators, or one if there are enough channels); the darkroom antenna mapping unit of the initialization channel emulator, the channel emulator The structure is shown in Figure 7, that is, the control channel emulator completes the mapping from its output port to the anechoic antenna (if the channel models used by different terminals are different, the mapping from the channel emulator to the anechoic antenna port needs to meet the requirements of different channel models, in order to To achieve the purpose of building multiple wireless environments simultaneously in the darkroom); initialize the multi-probe darkroom and open the communication antenna path.

After the initialization is completed, the test process can be carried out, so the specific test process is as follows, as shown in Figure 8:

Step 81, adjusting multiple terminals under test to be placed in a multi-probe darkroom with a certain posture;

Step 82, the base station emulator transmits test signals with a certain directionality to the terminal through multiple antennas around the darkroom, and builds the required wireless test environment around the terminal under test (the wireless propagation environment of the test can be the same or multiple , such as establishing independent UMI channel environments for different terminals at the same time or establishing a UMI channel environment for one terminal and establishing a UMA channel environment for another terminal);

Step 83, adjust the transmission power of the test signal, so that each terminal under test in the parallel test establishes a communication connection with the test base station respectively, and is in a state of 100% maximum throughput; wherein, each terminal under test only receives the test signal of the corresponding test frequency band , which do not interfere with each other;

Step 84, continuously reducing the transmission power of the test signal while ensuring that the communication link is not disconnected, and counting the downlink throughput changes of the multiple tested terminals tested in parallel through the base station simulator;

Step 85, change the incoming direction of the downlink signal at a preset angle in the horizontal direction (for example, the system shown in FIG. 4 includes 8 probes, the preset angle is 45°) as a step size, and repeat step 84. Average the throughput curves under all rotation angles obtained by each terminal’s respective test to obtain the throughput performance of each terminal in this posture; it should be noted that the test process of different terminals is independent, so after the test of one terminal may be completed, other terminals may Still testing but do not affect each other.

Step 86, adjust the terminal to the next placement posture to be tested after completing one placement posture, and repeat steps 84 to 85 until all placement postures and test angles are completed.

In step 87, after the parallel terminal test is completed, a serial throughput test is performed on the interfering terminal, and steps 83 to 86 are repeated in order to complete the test of all terminals.

In summary, the embodiment of the present invention proposes a method for simultaneously carrying out multi-terminal throughput testing in MIMO OTA technology, by controlling different terminals to work in different test frequency bands, and at the same time introducing a spectrum analysis link to automatically determine whether there is For interference conditions such as intermodulation, spurious, and frequency multiplication, parallel testing is used in non-interference scenarios, and serial testing is switched to serial testing in the presence of interference, thereby doubling the test efficiency while ensuring test accuracy.

In order to better achieve the above purpose, as shown in Figure 9, a multi-terminal throughput testing device applied to a multi-probe darkroom architecture is characterized in that it includes:

An interference acquisition module 91, configured to acquire the interference intensity between a plurality of terminals under test arranged in the multi-probe darkroom;

The parallel test module 92 is used for sending a plurality of test signals of different test frequency bands to a channel emulator in parallel to a plurality of first tested terminals whose interference intensity is less than or equal to a preset intensity value, and the channel emulator sending multiple test signals to multiple first terminals under test in parallel through different probes in the multi-probe darkroom;

The first information acquisition module 93 is configured to separately adjust the transmit power of the multiple test signals, the directions of arrival of the multiple test signals, and the placement postures of the multiple first terminals under test, and acquire multiple Throughput change information of the first terminal under test.

Specifically, in the above-mentioned embodiment of the present invention, the throughput testing device also includes:

A serial test module, configured to serially issue a test signal for a second terminal under test to the channel emulator for a plurality of second terminals under test whose interference strength is greater than the preset strength value, and the channel emulator The emulator serially sends the test signal to the second terminal under test through the probes in the multi-probe darkroom;

The second information acquisition module is configured to sequentially adjust the transmission power of the test signal, the direction of arrival of the test signal, and the placement posture of the second terminal under test, and sequentially acquire changes in the throughput of the second terminal under test. information

Specifically, in the above-mentioned embodiments of the present invention, the interference acquisition module 91 includes:

A spectrum acquisition module, configured to acquire out-of-band radiation spectrum information when each terminal under test works in all test frequency bands;

The interference acquisition sub-module is configured to determine the interference intensity between the terminal under test and other terminals under test respectively working in each test frequency band according to the out-of-band radiation spectrum information.

Specifically, in the above-mentioned embodiments of the present invention, the spectrum acquisition module includes:

Establishing a module for establishing a communication link with each terminal under test;

A receiving module, configured to receive an uplink signal transmitted by a corresponding terminal under test when it works in each test frequency band through the communication link;

The spectrum acquisition sub-module is configured to acquire out-of-band radiation spectrum information when each terminal under test works in each test frequency band according to the uplink signal.

Specifically, in the above-mentioned embodiments of the present invention, the device further includes:

A determining module, configured to determine multiple operating in different test frequency bands according to the interference intensity between the tested terminal operating in each test frequency band and other tested terminals, and to determine the mutual interference between the different test frequency bands when the different test frequency bands work at the same time The terminal under test whose interference strength is less than or equal to the preset strength value is the first terminal under test.

Specifically, in the above-mentioned embodiment of the present invention, the parallel testing module 92 includes:

The first parallel sub-module is used to transmit a plurality of test signals of different test frequency bands in parallel to the channel emulator through a plurality of base station simulators, and the channel emulator outputs the test signals from a preset output port to a multi-probe A plurality of probes corresponding to the preset output port in the darkroom transmit the plurality of test signals in parallel by the plurality of probes; the plurality of test signals construct a corresponding wireless channel environment around the first terminal under test ;

The second parallel sub-module is used to control and control the plurality of base station emulators to establish communication links with the first terminals under test corresponding to the test frequency bands, and to download in parallel to a plurality of first terminals under test through the communication links. sending the test signal corresponding to the channel model in which the first terminal under test works.

Specifically, in the above-mentioned embodiments of the present invention, the first information acquisition module 93 includes:

The first adjustment module is configured to respectively adjust the transmission power of the plurality of test signals and the direction of arrival of the plurality of test signals, and respectively obtain the throughput change information of the corresponding first terminal under test under the current placement posture;

The second adjustment module is configured to adjust the placement postures of the plurality of first terminals under test, and adjust the transmission power of the test signal and the direction of arrival of the test signal, and respectively obtain the corresponding adjustments of the first terminals under test. The throughput change information under the post posture;

The first information acquisition submodule is configured to determine the throughput change information of the plurality of first tested terminals under all postures;

The second information acquisition submodule is configured to determine the average throughput change information of the first terminal under test according to the throughput change information of the first terminal under test under all postures.

The embodiment of the present invention proposes a method for simultaneously carrying out multi-terminal throughput testing in MIMO OTA technology, by controlling different terminals to work in different test frequency bands, and at the same time introducing a spectrum analysis link to automatically determine whether there is intermodulation, In the case of interference such as spurious and frequency multiplication, the parallel test is used in the non-interference scene, and the serial test is switched to the serial test in the case of interference, so as to double the test efficiency while ensuring the test accuracy.

It should be noted that, the multi-terminal throughput testing device provided in the embodiment of the present invention is a testing device applying the above-mentioned multi-terminal throughput testing method, and all the embodiments of the above-mentioned multi-terminal throughput testing method are applicable to the multi-terminal throughput testing method. Test devices, and all can achieve the same or similar beneficial effects.

The above description is a preferred embodiment of the present invention, it should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present invention, some improvements and modifications can also be made, these improvements and modifications It should also be regarded as the protection scope of the present invention.

Claims (14)

1. a kind of throughput testing approach of multiple terminals, is applied to the framework in Multi probe darkroom, it is characterised in that include：

Acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom；

Multiple first measured terminals of one preset strength value are less than or equal to interference strength, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, and multiple test signals are handed down to into multiple first measured terminals parallel by the different probes in the Multi probe darkroom by the channel simulator；

The handling capacity change information put posture, obtain multiple first measured terminals respectively of transmission power, the arrival bearing of the plurality of test signal and the plurality of first measured terminal of the plurality of test signal is adjusted respectively.

2. the throughput testing approach of multiple terminals according to claim 1, it is characterised in that the throughput testing approach also includes：

Multiple second measured terminals of the preset strength value are more than to interference strength, the test signal for the second measured terminal is issued to the channel simulator serial, the test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom by the channel simulator；

It is sequentially adjusted in the handling capacity change information put posture, obtain the second measured terminal successively of transmission power, the arrival bearing of the test signal and second measured terminal of the test signal.

3. the throughput testing approach of multiple terminals according to claim 1, it is characterised in that the step of acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom includes：

Obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information；

According to the out-of-band radiation spectrum information, it is determined that work in respectively each test frequency range measured terminal and other measured terminals between interference strength.

4. the throughput testing approach of multiple terminals according to claim 3, it is characterised in that the step of obtaining out-of-band radiation spectrum information when each measured terminal works in all test frequency ranges respectively includes：

Communication link is set up with each measured terminal；

The upward signal launched when corresponding measured terminal works in each test frequency range is received by the communication link；

According to the upward signal, out-of-band radiation spectrum information when each measured terminal works in each test frequency range is obtained.

5. the throughput testing approach of multiple terminals according to claim 3, it is characterised in that methods described also includes：

According to work in respectively each test frequency range measured terminal and other measured terminals between interference strength, determine it is multiple work in different test frequency ranges, and the interference strengths when the different test frequency ranges are worked simultaneously each other are the first measured terminal less than or equal to the measured terminal of the preset strength value.

6. the throughput testing approach of multiple terminals according to claim 1, it is characterized in that, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, multiple test signals are included by different the step of being handed down to multiple first measured terminals parallel of popping one's head in the Multi probe darkroom by the channel simulator：

By multiple base station simulators to the different multiple test signals for testing frequency range of channel simulator transmitted in parallel, the test signal is exported into into a Multi probe darkroom multiple probes corresponding with the default output port from default output port by the channel simulator, by the plurality of test signals of multiple probe transmitted in parallel；The plurality of test signal builds corresponding wireless channel environment around first measured terminal；

First measured terminal of the corresponding test frequency range of the plurality of base station simulator of control control sets up communication link respectively, parallel issues with the channel model of the first measured terminal work corresponding test signal to multiple first measured terminals by the communication link.

7. the throughput testing approach of multiple terminals according to claim 6, it is characterized in that, the transmission power for adjusting the plurality of test signal respectively, the arrival bearing of the plurality of test signal and the plurality of first measured terminal put posture, include the step of the handling capacity change information for obtaining multiple first measured terminals respectively：

The arrival bearing of the transmission power and multiple test signals of the plurality of test signal is adjusted respectively, obtains handling capacity change information of corresponding first measured terminal in the case where posture is currently put respectively；

Adjust the posture of putting of the plurality of first measured terminal, and adjust the arrival bearing of the transmission power and test signal of the test signal, obtain the corresponding first measured terminal handling capacity change information put under posture after the adjustment respectively；

Determine the plurality of first measured terminal in all of handling capacity change information put under posture；

According to first measured terminal in all handling capacity change informations put under posture, the average throughput change information of first measured terminal is determined.

8. a kind of testing throughput device of multiple terminals, is applied to Multi probe darkroom framework, it is characterised in that include：

Interference acquisition module, for obtaining the interference strength being arranged between multiple measured terminals in the Multi probe darkroom；

Concurrent testing module, for multiple first measured terminals of a preset strength value are less than or equal to interference strength, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, and multiple test signals are handed down to into multiple first measured terminals parallel by the different probes in the Multi probe darkroom by the channel simulator；

First information acquisition module, for adjusting the handling capacity change information put posture, obtain multiple first measured terminals respectively of transmission power, the arrival bearing of the plurality of test signal and the plurality of first measured terminal of the plurality of test signal respectively.

9. the testing throughput device of multiple terminals according to claim 8, it is characterised in that the testing throughput device also includes：

Serial test module, for being more than multiple second measured terminals of the preset strength value to interference strength, the test signal for the second measured terminal is issued to the channel simulator serial, the test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom by the channel simulator；

Second data obtaining module, for being sequentially adjusted in the handling capacity change information put posture, obtain the second measured terminal successively of transmission power, the arrival bearing of the test signal and second measured terminal of the test signal.

10. the testing throughput device of multiple terminals according to claim 8, it is characterised in that the interference acquisition module includes：

Frequency spectrum acquisition module, for obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information；

Interference acquisition submodule, for according to the out-of-band radiation spectrum information, it is determined that the interference strength between working in the measured terminal and other measured terminals of each test frequency range respectively.

The testing throughput device of 11. multiple terminals according to claim 10, it is characterised in that the frequency spectrum acquisition module includes：

Module is set up, for communication link being set up with each measured terminal；

Receiver module, for receiving the upward signal launched when corresponding measured terminal works in each test frequency range by the communication link；

Frequency spectrum acquisition submodule, for according to the upward signal, obtaining out-of-band radiation spectrum information when each measured terminal works in each test frequency range.

The testing throughput device of 12. multiple terminals according to claim 10, it is characterised in that described device also includes：

Determining module, for according to work in respectively each test frequency range measured terminal and other measured terminals between interference strength, determine it is multiple work in different test frequency ranges, and the interference strengths when the different test frequency ranges are worked simultaneously each other are the first measured terminal less than or equal to the measured terminal of the preset strength value.

The testing throughput device of 13. multiple terminals according to claim 8, it is characterised in that the concurrent testing module includes：

First paralleled sub-modules, for multiple test signals of frequency range are tested by multiple base station simulators to channel simulator transmitted in parallel difference, the test signal is exported into into a Multi probe darkroom multiple probes corresponding with the default output port from default output port by the channel simulator, by the plurality of test signals of multiple probe transmitted in parallel；The plurality of test signal builds corresponding wireless channel environment around first measured terminal；

Second paralleled sub-modules, the first measured terminal for the corresponding test frequency range of the plurality of base station simulator of control sets up communication link respectively, parallel issues with the channel model of the first measured terminal work corresponding test signal to multiple first measured terminals by the communication link.

The testing throughput device of 14. multiple terminals according to claim 13, it is characterised in that the first information acquisition module includes：

First adjusting module, for adjusting the arrival bearing of the transmission power and multiple test signals of the plurality of test signal respectively, obtains handling capacity change information of corresponding first measured terminal in the case where posture is currently put respectively；

Second adjusting module, posture is put for adjust the plurality of first measured terminal, and the arrival bearing of the transmission power and test signal of the test signal is adjusted, the corresponding first measured terminal handling capacity change information put under posture after the adjustment is obtained respectively；

First information acquisition submodule, for determining the plurality of first measured terminal in all of handling capacity change information put under posture；

Second acquisition of information submodule, determines the average throughput change information of first measured terminal for according to first measured terminal in all handling capacity change informations put under posture.