CN106526015A - Apparatus for detecting trace phosphor impurity in hydrogen and detection method thereof - Google Patents
Apparatus for detecting trace phosphor impurity in hydrogen and detection method thereof Download PDFInfo
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Abstract
本发明公开了一种氢气中痕量磷杂质的检测装置及检测方法,其先采用变温浓缩装置对氢气中的磷杂质进行浓缩,然后将其解吸后用气相色谱仪FPD检测器检测磷杂质的峰面积,外标法定量,检出限低至亚ppb级,能满足电子级多晶硅对氢气的质量要求。本发明检出限低,操作简单,半小时即能完成检测过程,检测结果重复性好。能准确检测多晶硅生产用氢气中痕量磷杂质的含量,对多晶硅产品质量控制具有重要意义。The invention discloses a detection device and detection method for trace phosphorus impurities in hydrogen gas. Firstly, a temperature-variable concentration device is used to concentrate phosphorus impurities in hydrogen gas, and then the phosphorus impurities are detected by a gas chromatograph FPD detector after desorption. The peak area is quantified by external standard method, and the detection limit is as low as sub-ppb level, which can meet the quality requirements of electronic grade polysilicon for hydrogen. The invention has low detection limit, simple operation, the detection process can be completed in half an hour, and the detection result has good repeatability. The ability to accurately detect the content of trace phosphorus impurities in hydrogen used for polysilicon production is of great significance to the quality control of polysilicon products.
Description
技术领域technical field
本发明属于多晶硅生产技术领域,尤其是多晶硅生产用氢气中痕量磷的检测领域,具体涉及一种多晶硅用氢气中痕量磷杂质的浓缩装置及检测方法。The invention belongs to the technical field of polysilicon production, in particular to the detection field of trace phosphorus in hydrogen gas for polysilicon production, and specifically relates to a concentration device and detection method for trace phosphorus impurities in hydrogen gas used for polysilicon.
背景技术Background technique
氢气是多晶硅生产中的重要原料,其质量控制一般参照《氢气》GB/T 3634.2-2011进行,仅检测氮、氧、氩、一氧化碳、二氧化碳、甲烷、水分等杂质含量,对多晶硅生产中影响最大杂质磷没有相应的指标要求和检测方法。Hydrogen is an important raw material in polysilicon production. Its quality control is generally carried out in accordance with "Hydrogen" GB/T 3634.2-2011. Only the content of impurities such as nitrogen, oxygen, argon, carbon monoxide, carbon dioxide, methane, and moisture is detected, which has the greatest impact on polysilicon production. Impurity phosphorus has no corresponding index requirements and detection methods.
随着多晶硅内在质量提升至电子级水平,生产系统对于氢气的质量波动变得尤为敏感。氢气中磷杂质的含量更是直接制约多晶硅内在质量的主要因素之一。建立氢气中痕量磷杂质的检测方法能够对生产质量管控提供确实的数据支持,确保多晶硅内在质量的稳定和提升。As the intrinsic quality of polysilicon increases to electronic-grade levels, the production system becomes particularly sensitive to fluctuations in the quality of hydrogen. The content of phosphorus impurities in hydrogen is one of the main factors that directly restrict the intrinsic quality of polysilicon. The establishment of a detection method for trace phosphorus impurities in hydrogen can provide reliable data support for production quality control and ensure the stability and improvement of the intrinsic quality of polysilicon.
经查阅相关资料和进行实验,磷在氢气中主要以磷化氢的型式存在,含量要求小于ppbv。磷化氢,无色气体,有芥末和大蒜的特有臭味,但工业品有腐鱼样臭味,高度易燃,剧毒,有腐蚀性,对环境有害,吸入磷化氢会对心脏、呼吸系统、肾、肠胃、神经系统和肝脏造成影响,接触限值:0.3mg/m3,沸点-87.7℃,微溶于水,易溶于乙醇。After reviewing relevant information and conducting experiments, phosphorus mainly exists in the form of phosphine in hydrogen gas, and the content requirement is less than ppbv. Phosphine, a colorless gas, has the peculiar smell of mustard and garlic, but industrial products have a rotten fish-like smell, highly flammable, highly toxic, corrosive, and harmful to the environment. Inhalation of phosphine can harm the heart, Respiratory system, kidney, stomach, nervous system and liver are affected, exposure limit: 0.3mg/m 3 , boiling point -87.7℃, slightly soluble in water, easily soluble in ethanol.
目前行业内基本未对氢气中磷杂质进行检测,仅查阅到空气中磷杂质的检测方法,常规方法主要是钼酸铵比色法和气相色谱法。前者钼酸铵比色法需将磷化氢与强氧化剂吸收,生成正磷酸盐,然后用分光光度计间接检测磷化氢的含量,此方法只适用于高浓度的场合,氢气中的磷化氢低于其检出限而无法检测。后者气相色谱法检测,如用FPD检测器仅能检测到0.1ppmv左右的PH3,不能满足多晶硅尤其是电子级多晶硅生产对磷杂质含量小于ppbv的要求。At present, there is basically no detection of phosphorus impurities in hydrogen in the industry, and only the detection methods of phosphorus impurities in the air can be found. The conventional methods are mainly ammonium molybdate colorimetry and gas chromatography. The former ammonium molybdate colorimetric method needs to absorb phosphine and a strong oxidant to generate orthophosphate, and then use a spectrophotometer to indirectly detect the content of phosphine. This method is only suitable for high-concentration occasions. Phosphate in hydrogen Hydrogen was below its detection limit and could not be detected. The latter gas chromatographic detection method, such as FPD detector, can only detect PH3 of about 0.1ppmv, which cannot meet the requirements of polysilicon, especially electronic grade polysilicon production, for phosphorus impurity content less than ppbv.
发明内容Contents of the invention
本发明所要解决的技术问题是提供一种氢气中痕量磷杂质的检测装置及检测方法,结构简单、操作方便、分析时间短、灵敏度高。The technical problem to be solved by the present invention is to provide a detection device and detection method for trace phosphorus impurities in hydrogen, which have simple structure, convenient operation, short analysis time and high sensitivity.
为解决上述技术问题,本发明所采用的技术方案是:一种氢气中痕量磷杂质的检测装置,包括依次连接的第一截止阀、质量流量控制器、第一六通阀、第二截止阀和放空管;第一六通阀与浓缩柱连接形成闭合回路;第一六通阀还分别连接有载气管道和色谱柱,色谱柱还连接有FPD检测器;所述浓缩柱根据吸附或解吸磷杂质分别设置冷却装置或者加热装置。In order to solve the above technical problems, the technical solution adopted in the present invention is: a detection device for trace phosphorus impurities in hydrogen, including a first cut-off valve, a mass flow controller, a first six-way valve, a second cut-off valve connected in sequence valve and vent pipe; the first six-way valve is connected with the concentration column to form a closed loop; the first six-way valve is also connected with carrier gas pipeline and chromatographic column respectively, and the chromatographic column is also connected with FPD detector; Or desorbing phosphorus impurities are respectively equipped with a cooling device or a heating device.
所述的冷却装置为装有液氮的容器,所述的加热装置为装有热水的容器。The cooling device is a container containing liquid nitrogen, and the heating device is a container containing hot water.
所述载气管道上还设有电子流量控制系统。An electronic flow control system is also provided on the carrier gas pipeline.
该检测装置还设有第二六通阀,第二六通阀与定量环连接形成闭合回路,第二六通阀还分别连接有样品进口、样品出口及载气进口及载气出口。The detection device is also provided with a second six-way valve, which is connected with the quantitative loop to form a closed loop, and the second six-way valve is also connected with the sample inlet, the sample outlet, the carrier gas inlet and the carrier gas outlet respectively.
所述的浓缩柱为SE-30柱,为Φ3mm×0.6m不锈钢柱,填料为100%二甲基聚硅氧烷,柱容量为1mL~1.5mL。其对磷有较好的吸附和解吸效果,容量在1~1.5mL不仅能起到较好的浓缩效果,同时进样量得到控制,不会导致色谱峰拖尾。The concentration column is an SE-30 column, which is a Φ3mm×0.6m stainless steel column, filled with 100% dimethyl polysiloxane, and has a column capacity of 1mL-1.5mL. It has a good adsorption and desorption effect on phosphorus, and the capacity of 1-1.5mL can not only achieve a good concentration effect, but also control the injection volume, which will not cause chromatographic peak tailing.
本发明还涉及一种氢气中痕量磷杂质的检测方法,包括以下步骤:The present invention also relates to a method for detecting trace phosphorus impurities in hydrogen, comprising the following steps:
1)浓缩过程将第一六通阀打在取样位置上,样品气首先通过浓缩装置,在低温条件下,样品气中的痕量磷杂质在浓缩柱中被吸附,样品气中的氢气排出,并记录通过浓缩柱的样品气体积,确定浓缩的倍数;1) During the concentration process, the first six-way valve is set on the sampling position, and the sample gas first passes through the concentration device. Under low temperature conditions, the trace phosphorus impurities in the sample gas are absorbed in the concentration column, and the hydrogen in the sample gas is discharged. And record the volume of sample gas passing through the concentration column to determine the concentration multiple;
2)检测过程取消浓缩装置的低温条件,排出浓缩柱中多余的氢气,对浓缩柱进行加热,使浓缩柱中吸附的磷杂质解吸出来,将第一六通阀打到进样位置,通过载气将磷杂质带入色谱柱进行分离,用FPD检测器测定磷的峰面积;根据浓缩的体积计算出样品气中磷杂质的含量。2) Cancel the low temperature condition of the concentration device during the detection process, discharge the excess hydrogen in the concentration column, heat the concentration column to desorb the phosphorus impurities adsorbed in the concentration column, turn the first six-way valve to the sample injection position, and pass the The phosphorus impurities are brought into the chromatographic column by the gas for separation, and the peak area of phosphorus is measured with an FPD detector; the content of phosphorus impurities in the sample gas is calculated according to the concentrated volume.
所述的样品气的浓缩时的流量为300mL~500mL/min,可有效保证分析效率和浓缩时的回收率。浓缩时间在3min~5min,浓缩气体体积小于2500mL,满足回收率要求。The flow rate during concentration of the sample gas is 300mL-500mL/min, which can effectively ensure the analysis efficiency and the recovery rate during concentration. The concentration time is between 3 minutes and 5 minutes, and the volume of the concentrated gas is less than 2500mL, which meets the recovery requirement.
所述低温条件通过将浓缩装置浸入装有液氮的容器中达到,加热时采用热水浴的方式进行。进一步地,所述的热水温度为60℃~70℃,可有效的使氢气中含磷杂质解析,并使多晶硅生产用氢气中可能存在的氯硅烷等杂质不在浓缩柱中沉积。The low temperature condition is achieved by immersing the concentrating device in a container filled with liquid nitrogen, and a hot water bath is used for heating. Further, the temperature of the hot water is 60°C-70°C, which can effectively decompose the phosphorus-containing impurities in the hydrogen, and prevent impurities such as chlorosilanes that may exist in the hydrogen for polysilicon production from depositing in the concentration column.
本发明通过浓缩装置与气相色谱仪FPD联用检测氢气中痕量磷杂质;其原理为:氢气由管路或钢瓶取样,减压后进入浓缩装置,磷杂质在低温(液氮温度)下被吸附,氢气不能被吸附由放空口连续放空,氢气浓缩体积被准确计量,然后升温进行解吸,用载气把浓缩后的磷杂质带入气相色谱仪,经色谱柱分离后由FPD检测器检测,通过对样品峰面积与标准气体中磷色谱峰面积比较计算样品中磷的总量,根据氢气浓缩体积,换算出进样氢气中的磷浓度。The present invention detects trace phosphorus impurities in hydrogen by combining a concentration device with a gas chromatograph FPD; the principle is: the hydrogen is sampled from a pipeline or steel cylinder, and enters the concentration device after decompression, and the phosphorus impurities are removed at low temperature (liquid nitrogen temperature). Adsorption, the hydrogen cannot be adsorbed and continuously vented through the vent port, the concentrated volume of hydrogen is accurately measured, and then the temperature is raised for desorption, and the concentrated phosphorus impurities are brought into the gas chromatograph with the carrier gas, separated by the chromatographic column and detected by the FPD detector. Calculate the total amount of phosphorus in the sample by comparing the peak area of the sample with the peak area of the phosphorus chromatogram in the standard gas, and convert the concentration of phosphorus in the hydrogen gas into the sample according to the hydrogen concentration volume.
本发明的装置和检测方法具有如下优点及有益效果:The device and detection method of the present invention have the following advantages and beneficial effects:
1)本发明的装置通过放空管连续放空,0.1ppm(v/v)的磷化氢标准气浓缩倍数理论上可以107以上,因实际气体中含有其他杂质气体和浓缩倍数高色谱出峰拖尾等因素,经实验确定,浓缩倍数基本可以达到1000~3000倍以上,具有较好的线性和重复性,使氢气中磷化氢的检出限低至0.1ppb(v/v)以下。1) The device of the present invention is continuously vented through the vent pipe, and the concentration ratio of 0.1ppm (v/v) phosphine standard gas can theoretically be more than 107 , because the actual gas contains other impurity gases and the concentration ratio is high and the chromatographic peak Due to factors such as tailing, it is determined through experiments that the concentration ratio can basically reach more than 1000-3000 times, with good linearity and repeatability, so that the detection limit of phosphine in hydrogen is as low as 0.1ppb (v/v).
2)本发明的装置通过质量流量控制器,能准确控制气体流量和计算体积,反应浓缩装置中的压力,能与气相色谱仪较好的联用和配合,使得本检测方法有较好的重现性和稳定性。2) the device of the present invention can accurately control the gas flow and the calculated volume through the mass flow controller, and the pressure in the reaction concentration device can be used and cooperated with the gas chromatograph preferably, so that the detection method has a good weight performance and stability.
3)本发明装置和检测方法,具有结构简单、操作方便、分析时间短、灵敏度高等优点。3) The device and detection method of the present invention have the advantages of simple structure, convenient operation, short analysis time and high sensitivity.
附图说明Description of drawings
图1是本发明提供装置的结构示意图。Fig. 1 is a schematic structural diagram of the device provided by the present invention.
图中:1、第一截止阀,2、质量流量控制器,3、第一六通阀,4、浓缩柱,5、第二截止阀,6、冷却装置或者加热装置,7、放空管,8、第二六通阀,9、定量环,10、电子流量控制,11、色谱柱,12、FPD检测器。In the figure: 1. The first stop valve, 2. The mass flow controller, 3. The first six-way valve, 4. The concentration column, 5. The second stop valve, 6. Cooling device or heating device, 7. Vent pipe , 8, the second six-way valve, 9, quantitative loop, 10, electronic flow control, 11, chromatographic column, 12, FPD detector.
具体实施方式detailed description
下面结合实施例,进一步阐明本发明。这些实施例应理解为仅用于说明本发明而不是用于限制本发明的保护范围。在阅读了本发明记载的内容之后,本领域技术人员可以对本发明作各种改动或修改,这些等效变化和修饰同样落入本发明权利要求书所限定的范围。Below in conjunction with embodiment, further illustrate the present invention. These examples should be understood as only for illustrating the present invention but not for limiting the protection scope of the present invention. After reading the contents of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent changes and modifications also fall within the scope defined by the claims of the present invention.
一种氢气中痕量磷杂质的检测装置,包括依次连接的第一截止阀1、质量流量控制器2、第一六通阀3、第二截止阀5和放空管7;第一六通阀3与浓缩柱4连接形成闭合回路;第一六通阀3还分别连接有载气管道13和色谱柱11,色谱柱11,还连接有FPD检测器;所述浓缩柱4根据吸附或解吸磷杂质分别设置冷却装置或者加热装置6。A detection device for trace phosphorus impurities in hydrogen, comprising a first stop valve 1, a mass flow controller 2, a first six-way valve 3, a second stop valve 5, and a vent pipe 7 connected in sequence; the first six-way Valve 3 is connected with concentration column 4 to form a closed loop; the first six-way valve 3 is also connected with carrier gas pipeline 13 and chromatographic column 11 respectively, and chromatographic column 11 is also connected with FPD detector; Phosphorous impurities are respectively provided with a cooling device or a heating device 6 .
进一步地,所述的冷却装置为装有液氮的容器,所述的加热装置为装有热水的容器。Further, the cooling device is a container containing liquid nitrogen, and the heating device is a container containing hot water.
进一步地,所述载气管道13上还设有电子流量控制系统10。Further, an electronic flow control system 10 is also provided on the carrier gas pipeline 13 .
进一步地,该检测装置还设有第二六通阀8,第二六通阀8与定量环9连接形成闭合回路,第二六通阀8还分别连接有样品进口、样品出口及载气进口及载气出口。Further, the detection device is also provided with a second six-way valve 8, the second six-way valve 8 is connected with the quantitative loop 9 to form a closed circuit, and the second six-way valve 8 is also connected with a sample inlet, a sample outlet and a carrier gas inlet respectively. and carrier gas outlet.
进一步地,所述的浓缩柱为SE-30柱,为Φ3mm×0.6m不锈钢柱,填料为100%二甲基聚硅氧烷,柱容量为1mL~1.5mL。Further, the said concentration column is an SE-30 column, which is a Φ3mm×0.6m stainless steel column, filled with 100% dimethylpolysiloxane, and the column capacity is 1mL-1.5mL.
对比例1:Comparative example 1:
0.1ppm(v/v)磷化氢标准气C0直接进样实验0.1ppm (v/v) phosphine standard gas C 0 direct sampling experiment
1)实验步骤:标准气经减压后与第二六通阀相连接,将第二六通阀打在取样位置,置换1分钟,然后将第二六通阀打到进样位置,标准气进入气相色谱仪被FPD检测器检测,测得标准气中磷化氢峰面积A0。1) Experimental steps: After the standard gas is decompressed, it is connected to the second six-way valve, and the second six-way valve is set to the sampling position, and replaced for 1 minute, then the second six-way valve is set to the sampling position, and the standard gas After entering the gas chromatograph, it is detected by the FPD detector, and the peak area A 0 of phosphine in the standard gas is measured.
2)实验条件:色谱柱:DC550,1/8in×3m,17.5%,DB-1,0.53mm*30m*1um;仪器:Agilent7890A,配FPD检测器;进样口温度:150℃;柱温:初始温度45℃,保持3min,15℃/min,升至150℃,保持3min;载气流量:15mL/min;FPD检测器温度:220℃;定量环体积V0:1mL。2) Experimental conditions: Chromatographic column: DC550, 1/8in×3m, 17.5%, DB-1, 0.53mm*30m*1um; instrument: Agilent7890A, equipped with FPD detector; inlet temperature: 150°C; column temperature: The initial temperature is 45°C, hold for 3min, rise to 150°C at 15°C/min, hold for 3min; carrier gas flow rate: 15mL/min; FPD detector temperature: 220°C; volume of quantitative loop V 0 : 1mL.
3)重复上述实验6次,实验结果如表1所示,保留时间、峰面积、峰高、噪声的相对标准偏差均小于5%,满足方法重现性要求:3) The above experiment was repeated 6 times, and the experimental results are shown in Table 1. The relative standard deviations of retention time, peak area, peak height, and noise were all less than 5%, meeting the reproducibility requirements of the method:
表1 1mL标准气的实验数据Table 1 Experimental data of 1mL standard gas
4)未浓缩时方法检出限DL的计算:4) Calculation of method detection limit DL when not concentrated:
DL=3Nc/h(N:噪声;c:标准气浓度;h:标准气峰高)DL=3Nc/h (N: noise; c: standard gas concentration; h: standard gas peak height)
=3*9.13*0.1/74.87=3*9.13*0.1/74.87
=0.036ppm(v/v)=0.036ppm(v/v)
实施例1:0.1ppm(v/v)磷化氢标准气作为样品气进行浓缩检测实验Embodiment 1: 0.1ppm (v/v) phosphine standard gas carries out concentration detection experiment as sample gas
实验步骤:使用浓缩过程和分析检测过程两个步骤,在浓缩过程中,样品气经减压后与第一六通阀相连接,将第一六通阀打在取样位置上,开启第一截止阀和第二截止阀,置换1分钟,关闭第二截止阀,垫气30秒,上升液氮杯,使浓缩柱完全浸没在液氮里,流量稳定后开启第二截止阀,磷化氢在液氮温度下被浓缩柱吸附,氢气不能被吸附,由第二截止阀连续放空,通过浓缩柱的气体体积被质量流量控制器准确记录,浓缩到所需体积V(1000mL、1500mL、2000mL)附近时,关闭第一截止阀;再进行检测分析步骤,放下液氮,将浓缩柱多余的氢气经第二截止阀放空,关闭第二截止阀,用60℃~70℃水浴浸没浓缩柱,使磷化氢解吸出来,1分钟后,将第一六通阀打到进样位置,通过载气将磷杂质带入色谱柱进行分离,FPD检测器测定样品气体中磷化氢的峰面积A。Experimental procedure: Two steps are used: the concentration process and the analysis and detection process. During the concentration process, the sample gas is decompressed and connected to the first six-way valve. The first six-way valve is placed on the sampling position, and the first cut-off valve is opened. Valve and the second shut-off valve, replace for 1 minute, close the second shut-off valve, cushion the gas for 30 seconds, raise the liquid nitrogen cup, so that the concentration column is completely submerged in the liquid nitrogen, open the second shut-off valve after the flow is stable, and the phosphine Adsorbed by the concentration column at liquid nitrogen temperature, hydrogen cannot be absorbed, and the second stop valve is continuously emptied, and the gas volume passing through the concentration column is accurately recorded by the mass flow controller, and concentrated to the required volume V (1000mL, 1500mL, 2000mL) , close the first cut-off valve; then carry out the detection and analysis step, put down the liquid nitrogen, vent the excess hydrogen in the concentration column through the second stop valve, close the second stop valve, and immerse the concentration column with a 60°C-70°C water bath to make the phosphorus The hydrogen hydride is desorbed, and after 1 minute, the first six-way valve is turned to the sampling position, and the phosphorus impurities are brought into the chromatographic column through the carrier gas for separation, and the FPD detector measures the peak area A of the phosphine in the sample gas.
1、实验条件:浓缩柱:SE-30柱,Φ3mm×0.6m不锈钢柱;浓缩流量:500mL/min。1. Experimental conditions: Concentration column: SE-30 column, Φ3mm×0.6m stainless steel column; Concentration flow rate: 500mL/min.
2、结果计算:样品气体中磷化氢浓度C为2. Calculation of results: the concentration C of phosphine in the sample gas is
C------样品气中PH3的含量(体积分数);C ------ PH 3 content (volume fraction) in the sample gas;
A------样品气中PH3的峰面积;A------Peak area of PH 3 in the sample gas;
C0------标准气中PH3的含量(体积分数);C 0 ------ the content of PH 3 in the standard gas (volume fraction);
V0-------标准气体积(mL),本实验采用1mL定量环;V 0 ------- standard gas volume (mL), this experiment uses a 1mL quantitative loop;
A0------标准气中PH3的峰面积;A 0 ------ peak area of PH 3 in standard gas;
V-------样品气的浓缩体积(mL)。V-------concentrated volume of sample gas (mL).
3、按上述的实验步骤、实验条件和结果计算,分别浓缩0.1ppmv的PH3标准气体体积到500mL,1000mL,1500mL,2000mL作为样品气进行测试,重复实验6次,分别采取进样的谱图进行分析,其分析结果如下表2-表5所示:3. According to the above-mentioned experimental steps, experimental conditions and calculation results, the PH3 standard gas volume of 0.1ppmv was concentrated to 500mL, 1000mL, 1500mL, and 2000mL as the sample gas for testing, and the experiment was repeated 6 times. Analysis, the analysis results are shown in Table 2-Table 5 below:
表2 浓缩500mL的实验数据Table 2 Experimental data of concentrated 500mL
表3 浓缩1000mL的实验数据Table 3 Concentrated 1000mL experimental data
表4 浓缩1500mL的实验数据Table 4 Concentrated 1500mL experimental data
表5 浓缩2000mL的实验数据Table 5 Concentrated 2000mL experimental data
4、从上表可以看出,各种浓缩倍数下峰面积、单位峰面积、计算浓度的相对标准偏差均小于5%,满足方法重复性要求;回收率在84.08~101.51%之间,取得较好的回收效果。4. It can be seen from the above table that the relative standard deviations of the peak area, unit peak area, and calculated concentration under various concentration multiples are all less than 5%, which meets the repeatability requirements of the method; the recovery rate is between 84.08% and 101.51%, achieving relatively Good recycling effect.
5、按上述500、1000、1500、2000倍的浓缩体积,以磷化氢的峰面积和浓缩倍数拟合线性方程:y=685.66x,y为磷化氢的峰面积(pA*s),x为浓缩体积(mL),拟合系数R=0.9963,以浓缩体积2000倍计算方法检出限=DL/2000=0.018ppb(v/v)。5, according to the concentration volume of above-mentioned 500,1000,1500,2000 times, with the peak area of phosphine and the concentration multiple fitting linear equation: y=685.66x, y is the peak area (pA*s) of phosphine, x is the concentrated volume (mL), the fitting coefficient R=0.9963, and the detection limit of the method is calculated by 2000 times the concentrated volume=DL/2000=0.018ppb (v/v).
实施例2:多晶硅用氢气浓缩及检测Example 2: Concentration and detection of polysilicon with hydrogen
按照实施例1的实验步骤、实验条件、结果计算,取多晶硅生产中的样品氢气进行浓缩1000mL,重复实验6次的浓缩实验,实验结果如表6:According to the experimental procedures, experimental conditions, and result calculations of Example 1, the sample hydrogen in polysilicon production was taken to concentrate 1000mL, and the concentration experiment was repeated 6 times. The experimental results are shown in Table 6:
表6 样品气浓缩1000倍的实验数据Table 6 Experimental data of sample gas enriched 1000 times
从上述结果看,其相对标准偏差在4.42~6.15%,有较好的重复性,循环氢磷含量有较大波动,是生产中重点监控对象。From the above results, its relative standard deviation is 4.42-6.15%, which has good repeatability, and the circulating hydrogen and phosphorus content has large fluctuations, so it is the key monitoring object in production.
以上描述并不用以限制本发明,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above description is not intended to limit the present invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.
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