CN106444118A - Embedded touch testing circuit - Google Patents
Embedded touch testing circuit Download PDFInfo
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- CN106444118A CN106444118A CN201610656668.0A CN201610656668A CN106444118A CN 106444118 A CN106444118 A CN 106444118A CN 201610656668 A CN201610656668 A CN 201610656668A CN 106444118 A CN106444118 A CN 106444118A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/13338—Input devices, e.g. touch panels
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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- General Physics & Mathematics (AREA)
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- Crystallography & Structural Chemistry (AREA)
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Abstract
The invention provides an embedded touch testing circuit. The embedded touch testing circuit comprises an control signal sources, a capacitive coupling module and a switch module, wherein the switch module comprises m input ends, n control ends and an output end; the input ends are connected with corresponding touch electrodes; the control ends are connected with corresponding control signal sources; the output end is connected with a touch signal acquiring terminal; the capacitive coupling module is connected with touch electrodes in a coupled manner; n and m are positive integers; and m is smaller than or equal to 2^n. According to the embedded touch testing circuit, the capacitive coupling module triggers the touch electrodes to generate touch signals, the switch module acquires the touch signals generated by the touch electrodes one by one, the acquired touch signals are compared, so that testing of a touch screen function of a touch screen is finished, waste of materials such as chips and flat cables can be avoided, and production efficiency is improved.
Description
Technical Field
The invention relates to the technical field of touch control, in particular to an embedded touch control test circuit.
Background
Compared with the conventional technology of disposing a touch panel on a liquid crystal panel, research on integration of the touch panel function and the liquid crystal panel is increasing, and thus an in-cell touch screen appears. In-cell touch screen technologies include both in-cell and on-cell. In-cell touch screen technology refers to the embedding of touch panel functionality into liquid crystal pixels, while on-cell touch screen technology refers to the embedding of touch panel functionality between a color filter substrate and a polarizer. Compared with an on-cell touch screen, the in-cell touch screen can realize the second lighter and thinner panel.
In the in-cell touch screen technology, in a cell (assembly process), only the display function of the touch screen is generally tested, but the touch function of the touch screen is not tested. The touch function needs to be tested after the chip and the flat cable are bound, so that a touch screen with poor touch cannot be screened out in a cell stage, the waste of materials such as the chip and the flat cable is caused, and the production efficiency is reduced.
Therefore, it is desirable to provide an in-cell touch test circuit to solve the problems of the prior art.
Disclosure of Invention
The invention aims to provide an embedded touch control test circuit, which aims to solve the technical problems that the existing touch screen cannot test the touch function in a cell stage, and can test the touch screen after bonding materials such as chips, cables and the like, so that the material waste is caused, and the production efficiency is reduced.
In order to solve the above problems, the technical scheme provided by the invention is as follows:
the invention provides an embedded touch control test circuit, which comprises:
n control signal sources for providing control signals;
the capacitive coupling module is used for triggering the touch electrode to generate a touch signal;
the switch module comprises m input ends, n control ends and an output end, and is used for receiving the touch signals on the m touch electrodes and outputting the touch signal on one touch electrode to the touch signal acquisition terminal under the control of the control signals; wherein,
the input end is connected with a corresponding touch electrode, the control end is connected with a corresponding control signal source, the output end is connected with a touch signal acquisition terminal, the capacitive coupling module is coupled with the touch electrode, n and m are positive integers, and m is less than or equal to 2^ n.
In the embedded touch test circuit of the invention, the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
In the embedded touch control test circuit, the control unit comprises a plurality of thin film transistors, the grid electrode of each thin film transistor is connected with the scanning line control signal source, the source electrode of each thin film transistor is connected with the scanning line input signal source, and the drain electrode of each thin film transistor is connected with the corresponding scanning line.
In the embedded touch control test circuit, the switch module comprises a plurality of thin film transistors, each touch control electrode is connected with the touch control signal acquisition terminal through n thin film transistors connected in series, and the grid electrode of each thin film transistor is connected with a corresponding control signal source.
In the embedded touch control test circuit, the thin film transistor is an N-type thin film transistor or a P-type thin film transistor.
The invention also provides an embedded touch control test circuit, which comprises:
n control signal sources for providing control signals;
the capacitive coupling module is used for triggering the touch electrode to generate a touch signal;
the switch module comprises m input ends, n control ends and an output end, and is used for receiving the touch signals on the m touch electrodes and outputting the touch signal on one touch electrode to the touch signal acquisition terminal under the control of the control signals; wherein,
the input end is connected with a corresponding touch electrode, the control end is connected with a corresponding control signal source, the output end is connected with a touch signal acquisition terminal, the capacitive coupling module is coupled with the touch electrode, n and m are positive integers, and m is less than or equal to 2^ (n + 1).
In the embedded touch test circuit of the invention, the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
In the embedded touch control test circuit, the control unit comprises a plurality of thin film transistors, the grid electrode of each thin film transistor is connected with the scanning line control signal source, the source electrode of each thin film transistor is connected with the scanning line input signal source, and the drain electrode of each thin film transistor is connected with the corresponding scanning line.
In the embedded touch control test circuit, the switch module comprises a plurality of thin film transistors, each touch control electrode is connected with the touch control signal acquisition terminal through n thin film transistors connected in series, and the grid electrode of each thin film transistor is connected with a corresponding control signal source.
In the embedded touch control test circuit, the thin film transistor is an N-type thin film transistor or a P-type thin film transistor.
The embedded touch control test circuit triggers the touch control electrodes through the capacitive coupling module to generate touch control signals, acquires the touch control signals generated by each touch control electrode one by one through the switch module, and compares the acquired touch control signals, so that the touch screen function test of the touch screen is completed; the technical problems that the touch function of the existing touch screen needs to be tested after the chip and the flat cable are bound, so that the touch screen with poor touch cannot be screened out in a cell stage, materials such as the chip and the flat cable are wasted, and production efficiency is reduced are solved.
In order to make the aforementioned and other objects of the present invention more comprehensible, preferred embodiments accompanied with figures are described in detail below:
drawings
The technical solution and other advantages of the present invention will become apparent from the following detailed description of specific embodiments of the present invention, which is to be read in connection with the accompanying drawings.
FIG. 1 is a schematic diagram of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
FIG. 2 is a schematic circuit diagram of a capacitive coupling module according to a first preferred embodiment of an in-cell touch test circuit of the present invention;
FIG. 3 is a schematic circuit diagram of a switch module according to a first preferred embodiment of the in-cell touch test circuit of the present invention;
FIG. 4 is a schematic diagram illustrating a second preferred embodiment of an in-cell touch test circuit according to the present invention;
FIG. 5 is a schematic circuit diagram of a capacitive coupling module according to a second preferred embodiment of the in-cell touch test circuit of the present invention;
fig. 6 is a schematic circuit diagram of a switch module according to a second preferred embodiment of the in-cell touch test circuit of the present invention.
Detailed Description
To further illustrate the technical means and effects of the present invention, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
It should be noted that, the embodiment of the in-cell touch test circuit of the present invention is exemplified by a 4 × 4 matrix touch electrode, and those skilled in the art can deduce the circuit connection relationship of all touch electrodes of the touch screen according to the following teaching and teachings.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
the embedded touch control test circuit of the preferred embodiment comprises: 4 control signal sources, a capacitive coupling module 16 and a switch module 10. 4 control signal sources for providing control line signals; the capacitive coupling module 16 is used for triggering the touch electrode to generate a touch signal; the switch module 10 comprises 16 input ends, 4 control ends and an output end, and the switch module 10 is used for receiving the touch signals on the 16 touch electrodes and outputting the touch signal on one of the touch electrodes to the touch signal acquisition terminal 15 under the control of the control signal;
the input end is connected with the corresponding touch electrode, the control end is connected with the corresponding control signal source, the output end is connected with the touch signal acquisition terminal 15, and the capacitive coupling module 16 is coupled with the touch electrode. In particular, the 4 control signal sources of the preferred embodiment can control the one-by-one collection of the touch signals generated on the 16 touch electrodes at most.
In the embedded touch test circuit of the preferred embodiment, the 4 control signal sources include: a first control signal source 11, a second control signal source 12, a third control signal source 13, and a fourth control signal source 14.
Referring to fig. 2, fig. 2 is a schematic circuit diagram of a capacitive coupling module according to a first preferred embodiment of an in-cell touch test circuit of the present invention;
in the embedded touch test circuit of the preferred embodiment, the capacitive coupling module 16 includes: a constant voltage power supply 161, a scan line input signal source 163, a scan line control signal source 162, and a control unit 167. A constant voltage power supply 161 for supplying a constant voltage level; a scan line input signal source 163 for providing a scan line input signal; a scan line control signal source 162 for providing a scan line control signal; a control unit 167, configured to receive a scan line input signal, and output the scan line input signal under the control of the scan line control signal;
the constant voltage source 161 is connected to the data line 164, the scan line input signal source 163 is connected to the input terminal of the control unit 167, the scan line control signal source 162 is connected to the control terminal of the control unit 167, and the output terminal of the control unit 167 is connected to the scan line 165.
Specifically, the control unit 167 includes 12 thin film transistors T1 to T12, one thin film transistor corresponding to one scanning line 165, a gate of each thin film transistor is connected to the scanning line control signal source 162, a source of each thin film transistor is connected to the scanning line input signal source 163, and a drain of each thin film transistor is connected to the corresponding scanning line 165.
Referring to fig. 3, fig. 3 is a schematic circuit diagram of a switch module according to a first preferred embodiment of an in-cell touch test circuit of the present invention;
in the embedded touch test circuit of the preferred embodiment, the switch module 10 includes 64 thin film transistors T13-T76, wherein each touch electrode is connected to the touch signal collecting terminal 15 through 4 thin film transistors, and the gate of each thin film transistor is connected to a corresponding control signal source.
Specifically, the thin film transistors T13, T14, T15 and T16 are connected in series, the source of the thin film transistor T13 is connected to the first touch electrode, and the drain of the thin film transistor T16 is connected to the touch signal acquisition terminal 15;
the thin film transistors T17, T18, T19 and T20 are connected in series, the source electrode of the thin film transistor T17 is connected with the second touch electrode, and the drain electrode of the thin film transistor T20 is connected with the touch signal acquisition terminal 15;
the thin film transistors T21, T22, T23 and T24 are connected in series, the source electrode of the thin film transistor T21 is connected with the third touch electrode, and the drain electrode of the thin film transistor T24 is connected with the touch signal acquisition terminal 15;
the thin film transistors T25, T26, T27 and T28 are connected in series, the source electrode of the thin film transistor T25 is connected with the fourth touch electrode, and the drain electrode of the thin film transistor T28 is connected with the touch signal acquisition terminal 15;
the thin film transistors T29, T30, T31 and T32 are connected in series, the source electrode of the thin film transistor T29 is connected with the fifth touch electrode, and the drain electrode of the thin film transistor T32 is connected with the touch signal acquisition terminal 15;
the thin film transistors T33, T34, T35 and T36 are connected in series, the source electrode of the thin film transistor T33 is connected with the sixth touch electrode, and the drain electrode of the thin film transistor T36 is connected with the touch signal acquisition terminal 15;
the thin film transistors T37, T38, T39 and T40 are connected in series, the source electrode of the thin film transistor T37 is connected with the seventh touch electrode, and the drain electrode of the thin film transistor T40 is connected with the touch signal acquisition terminal 15;
the thin film transistors T41, T42, T43 and T44 are connected in series, the source electrode of the thin film transistor T41 is connected with the eighth touch electrode, and the drain electrode of the thin film transistor T44 is connected with the touch signal acquisition terminal 15;
the thin film transistors T45, T46, T47 and T48 are connected in series, the source electrode of the thin film transistor T45 is connected with the ninth touch electrode, and the drain electrode of the thin film transistor T48 is connected with the touch signal acquisition terminal 15;
the thin film transistors T49, T50, T51 and T52 are connected in series, the source electrode of the thin film transistor T49 is connected with the tenth touch electrode, and the drain electrode of the thin film transistor T52 is connected with the touch signal acquisition terminal 15;
the thin film transistors T53, T54, T55 and T56 are connected in series, the source electrode of the thin film transistor T53 is connected with the eleventh touch electrode, and the drain electrode of the thin film transistor T56 is connected with the touch signal acquisition terminal 15;
the thin film transistors T57, T58, T59 and T60 are connected in series, the source electrode of the thin film transistor T57 is connected with the twelfth touch electrode, and the drain electrode of the thin film transistor T60 is connected with the touch signal acquisition terminal 15;
the thin film transistors T61, T62, T63 and T64 are connected in series, the source electrode of the thin film transistor T61 is connected with the thirteenth touch electrode, and the drain electrode of the thin film transistor T64 is connected with the touch signal acquisition terminal 15;
the thin film transistors T65, T66, T67 and T68 are connected in series, the source electrode of the thin film transistor T65 is connected with the fourteenth touch electrode, and the drain electrode of the thin film transistor T68 is connected with the touch signal acquisition terminal 15;
the thin film transistors T69, T70, T71 and T72 are connected in series, the source electrode of the thin film transistor T69 is connected with the fifteenth touch electrode, and the drain electrode of the thin film transistor T72 is connected with the touch signal acquisition terminal 15;
the thin film transistors T73, T74, T75 and T76 are connected in series, the source of the thin film transistor T73 is connected to the sixteenth touch electrode, and the drain of the thin film transistor T76 is connected to the touch signal collecting terminal 15.
The first control signal source 11 is connected to gates of the thin film transistors T13, T17, T21, T25, T29, T33, T37, T41, T45, T49, T53, T57, T61, T65, T69, and T73;
the second control signal source 12 is connected to the gates of the thin film transistors T14, T18, T22, T26, T30, T34, T38, T42, T46, T50, T54, T58, T62, T66, T70, and T74;
the third control signal source 13 is connected to the gates of the thin film transistors T15, T19, T23, T27, T31, T35, T39, T43, T47, T51, T55, T59, T63, T67, T71, and T75;
the fourth control signal source 14 is connected to gates of the thin film transistors T16, T20, T24, T28, T32, T36, T40, T44, T48, T52, T56, T60, T64, T68, T72, and T76.
In the embedded touch test circuit of the preferred embodiment, the thin film transistors T1 to T12, T13, T17, T21, T25, T29, T33, T37, T41, T14, T18, T22, T26, T46, T50, T54, T58, T15, T19, T31, T35, T47, T51, T63, T67, T16, T24, T32, T40, T48, T56, T64, and T72 are N-type thin film transistors; the thin film transistors T45, T49, T53, T57, T61, T65, T69, T73, T30, T34, T38, T42, T62, T66, T70, T74, T23, T27, T39, T43, T55, T59, T71, T75, T20, T28, T36, T44, T52, T60, T68, and T76 are P-type thin film transistors.
When the embedded touch test circuit of the preferred embodiment is used, firstly, the constant voltage power supply 161 provides 0V voltage to the data line 164 to prevent the data line from generating electrical interference to the touch electrode; then, the scan line control signal source 162 provides a high-voltage scan line control signal to the tfts T1-T12, and the scan line input signal source 163 provides a scan line input signal with a certain frequency and a certain voltage to the scan lines via the tfts T1-T12, so as to trigger the touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 165 and the touch electrodes.
Then, the first control signal source 11, the second control signal source 12, the third control signal source 13 and the fourth control signal source 14 provide high-potential control signals, the thin film transistors T13, T14, T15 and T16 connected in series are turned on, and at this time, the touch signal on the first touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11, the second control signal source 12 and the third control signal source 13 provide a high-potential control signal, the fourth control signal source 14 provides a low-potential control signal, the series thin film transistors T17, T18, T19 and T20 are turned on, and at this time, the touch signal on the second touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11, the second control signal source 12 and the fourth control signal source 14 provide a high-potential control signal, the third control signal source 13 provides a low-potential control signal, the thin film transistors T21, T22, T23 and T24 connected in series are turned on, and at this time, the touch signal on the third touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11 and the second control signal source 12 provide a high-potential control signal, the third control signal source 13 and the fourth control signal source 14 provide a low-potential control signal, the series thin film transistors T25, T26, T27 and T28 are turned on, and at this time, the touch signal on the fourth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11, the third control signal source 13 and the fourth control signal source 14 provide a high-potential control signal, the second control signal source 12 provides a low-potential control signal, the thin film transistors T29, T30, T31 and T32 connected in series are turned on, and at this time, the touch signal on the fifth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11 and the third control signal source 13 provide a high-potential control signal, the second control signal source 12 and the fourth control signal source 14 provide a low-potential control signal, the thin film transistors T33, T34, T35 and T36 connected in series are turned on, and at this time, the touch signal on the sixth touch electrode is output to the touch signal acquisition terminal 15;
at the next moment, the first control signal source 11 and the fourth control signal source 14 provide a high-potential control signal, the second control signal source 12 and the third control signal source 13 provide a low-potential control signal, the thin film transistors T37, T38, T39 and T40 connected in series are turned on, and at this time, the touch signal on the seventh touch electrode is output to the touch signal acquisition terminal 15;
at the next moment, the first control signal source 11 provides a high-potential control signal, the second control signal source 12, the third control signal source 13 and the fourth control signal source 14 provide a low-potential control signal, the thin film transistors T41, T42, T43 and T44 connected in series are turned on, and at this time, the touch signal on the eighth touch electrode is output to the touch signal acquisition terminal 15;
at the next moment, the second control signal source 12, the third control signal source 13 and the fourth control signal source 14 provide a high-potential control signal, the first control signal source 11 provides a low-potential control signal, the thin film transistors T45, T46, T47 and T48 connected in series are turned on, and at this time, the touch signal on the ninth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the second control signal source 12 and the third control signal source 13 provide a high-potential control signal, the first control signal source 11 and the fourth control signal source 14 provide a low-potential control signal, the series thin film transistors T49, T50, T51 and T52 are turned on, and at this time, the touch signal on the tenth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the second control signal source 12 and the fourth control signal source 14 provide a high-potential control signal, the first control signal source 11 and the third control signal source 13 provide a low-potential control signal, the series thin film transistors T53, T54, T55 and T56 are turned on, and at this time, the touch signal on the eleventh touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the second control signal source 12 provides a high-potential control signal, the first control signal source 11, the third control signal source 13 and the fourth control signal source 14 provide a low-potential control signal, the series thin film transistors T57, T58, T59 and T60 are turned on, and at this time, the touch signal on the twelfth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the third control signal source 13 and the fourth control signal source 14 provide a high-potential control signal, the first control signal source 11 and the second control signal source 12 provide a low-potential control signal, the series thin film transistors T61, T62, T63 and T64 are turned on, and at this time, the touch signal on the thirteenth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the third control signal source 13 provides a high-potential control signal, the first control signal source 11, the second control signal source 12 and the fourth control signal source 14 provide a low-potential control signal, the thin film transistors T65, T66, T67 and T68 connected in series are turned on, and at this time, the touch signal on the fourteenth touch electrode is output to the touch signal acquisition terminal 15;
at the next moment, the fourth control signal source 14 provides a high-potential control signal, the first control signal source 11, the second control signal source 12 and the third control signal source 13 provide a low-potential control signal, the series thin film transistors T69, T70, T71 and T72 are turned on, and at this time, the touch signal on the fifteenth touch electrode is output to the touch signal collecting terminal 15;
at the next moment, the first control signal source 11, the second control signal source 12, the third control signal source 13, and the fourth control signal source 14 provide low-potential control signals, the series thin film transistors T73, T74, T75, and T76 are turned on, and at this time, the touch signal on the sixteenth touch electrode is output to the touch signal collecting terminal 15.
Finally, comparing the acquired touch signals, and if the waveforms of all the acquired touch signals are consistent, determining that the touch screen is a good product; if the waveform difference between a certain touch signal and other touch signals is large, it can be concluded that the touch electrode is short-circuited or open-circuited.
The embedded touch control test circuit of the preferred embodiment triggers the touch control electrodes to generate the touch control signals through the capacitive coupling module 16, collects the touch control signals generated by each touch control electrode one by one through the switch module 10, and compares the collected touch control signals, so that the touch screen function test of the touch screen is completed, the waste of materials such as chips and cables is avoided, and the production efficiency is improved.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a second preferred embodiment of an in-cell touch test circuit according to the present invention;
the difference between the preferred embodiment and the first preferred embodiment is that the use of one control signal source is reduced, and since each control signal source needs to reserve a position on the touch screen frame, the reduction of the use of the control signal source is beneficial to narrowing the frame.
The embedded touch control test circuit of the preferred embodiment comprises: 3 control signal sources, a capacitive coupling module 25 and a switch module 20. 3 control signal sources for providing control line signals; the capacitive coupling module 25 is used for triggering the touch electrode to generate a touch signal; the switch module 20 comprises 16 input ends, 3 control ends and an output end, and the switch module 20 is used for receiving the touch signals on the 16 touch electrodes and outputting the touch signal on one of the touch electrodes to the touch signal acquisition terminal 24 under the control of the control signal;
the input end is connected with the corresponding touch electrode, the control end is connected with the corresponding control signal source, the output end is connected with the touch signal acquisition terminal 24, and the capacitive coupling module 25 is coupled with the touch electrode. In particular, the 3 control signal sources of the preferred embodiment can control the one-by-one collection of the touch signals generated on the 16 touch electrodes at most.
In the embedded touch test circuit of the preferred embodiment, the 3 control signal sources include: a first control signal source 21, a second control signal source 22, and a third control signal source 23.
Referring to fig. 5, fig. 5 is a schematic circuit diagram of a capacitive coupling module according to a second preferred embodiment of the in-cell touch test circuit of the present invention;
in the embedded touch test circuit of the preferred embodiment, the capacitive coupling module 25 includes: a constant voltage source 251, a scan line input signal source 253, a scan line control signal source 252, and a control unit 257. A constant voltage power supply 251 for supplying a constant voltage level; a scan line input signal source 253 for providing a scan line input signal; a scan line control signal source 252 for providing a scan line control signal; a control unit 257 for receiving the scan line input signal and outputting the scan line input signal under the control of the scan line control signal;
the constant voltage source 251 is connected to the data line 254, the scan line input signal source 253 is connected to an input terminal of the control unit 257, the scan line control signal source 252 is connected to a control terminal of the control unit 257, and an output terminal of the control unit 257 is connected to the scan line 255.
Specifically, the control unit 257 includes 12 thin film transistors D1 to D12, one thin film transistor corresponding to one scanning line 255, a gate of each thin film transistor being connected to the scanning line control signal source 252, a source of each thin film transistor being connected to the scanning line input signal source 253, and a drain of each thin film transistor being connected to the corresponding scanning line 255.
Referring to fig. 6, fig. 6 is a circuit schematic diagram of a switch module of a second preferred embodiment of an in-cell touch test circuit according to the present invention
In the embedded touch test circuit of the preferred embodiment, the switch module 20 includes 48 thin film transistors D13-D60, wherein each touch electrode is connected to the touch signal collecting terminal 24 through 3 thin film transistors, and the gate of each thin film transistor is connected to a corresponding control signal source.
Specifically, the thin film transistors D13, D14 and D15 are connected in series, the source of the thin film transistor D13 is connected to the first touch electrode, and the drain of the thin film transistor D15 is connected to the touch signal acquisition terminal 24;
the thin film transistors D16, D17 and D18 are connected in series, the source electrode of the thin film transistor D16 is connected with the second touch electrode, and the drain electrode of the thin film transistor D18 is connected with the touch signal acquisition terminal 24;
the thin film transistors D19, D20 and D21 are connected in series, the source electrode of the thin film transistor D19 is connected with the third touch electrode, and the drain electrode of the thin film transistor D21 is connected with the touch signal acquisition terminal 24;
the thin film transistors D22, D23 and D24 are connected in series, the source electrode of the thin film transistor D23 is connected with the fourth touch electrode, and the drain electrode of the thin film transistor D24 is connected with the touch signal acquisition terminal 24;
the thin film transistors D25, D26 and D27 are connected in series, the source electrode of the thin film transistor D25 is connected with the fifth touch electrode, and the drain electrode of the thin film transistor D27 is connected with the touch signal acquisition terminal 24;
the thin film transistors D28, D29 and D30 are connected in series, the source electrode of the thin film transistor D28 is connected with the sixth touch electrode, and the drain electrode of the thin film transistor D30 is connected with the touch signal acquisition terminal 24;
the thin film transistors D31, D32 and D33 are connected in series, the source electrode of the thin film transistor D31 is connected with the seventh touch electrode, and the drain electrode of the thin film transistor D33 is connected with the touch signal acquisition terminal 24;
the thin film transistors D34, D35 and D36 are connected in series, the source electrode of the thin film transistor D34 is connected with the eighth touch electrode, and the drain electrode of the thin film transistor D36 is connected with the touch signal acquisition terminal 24;
the thin film transistors D37, D38 and D39 are connected in series, the source electrode of the thin film transistor D37 is connected with the ninth touch electrode, and the drain electrode of the thin film transistor D39 is connected with the touch signal acquisition terminal 24;
the thin film transistors D40, D41 and D42 are connected in series, the source electrode of the thin film transistor D40 is connected with the tenth touch electrode, and the drain electrode of the thin film transistor D42 is connected with the touch signal acquisition terminal 24;
the thin film transistors D43, D44 and D45 are connected in series, the source electrode of the thin film transistor D43 is connected with the eleventh touch electrode, and the drain electrode of the thin film transistor D45 is connected with the touch signal acquisition terminal 24;
the thin film transistors D46, D47 and D48 are connected in series, the source electrode of the thin film transistor D46 is connected with the twelfth touch electrode, and the drain electrode of the thin film transistor D48 is connected with the touch signal acquisition terminal 24;
the thin film transistors D49, D50 and D51 are connected in series, the source electrode of the thin film transistor D49 is connected with the thirteenth touch electrode, and the drain electrode of the thin film transistor D51 is connected with the touch signal acquisition terminal 24;
the thin film transistors D52, D53 and D54 are connected in series, the source electrode of the thin film transistor D52 is connected with the fourteenth touch electrode, and the drain electrode of the thin film transistor D54 is connected with the touch signal acquisition terminal 24;
the thin film transistors D55, D56 and D57 are connected in series, the source electrode of the thin film transistor D55 is connected with the fifteenth touch electrode, and the drain electrode of the thin film transistor D57 is connected with the touch signal acquisition terminal 24;
the thin film transistors D58, D59 and D60 are connected in series, the source of the thin film transistor D58 is connected to the sixteenth touch electrode, and the drain of the thin film transistor D60 is connected to the touch signal acquisition terminal 24.
The first control signal source 21 is connected to the gates of the thin film transistors D13, D16, D19, D22, D25, D28, D31, D34, D37, D40, D43, D46, D49, D52, D55, and D58;
the second control signal source 22 is connected to the gates of the thin film transistors D14, D17, D20, D23, D26, D29, D32, D35, D38, D41, D44, D47, D50, D53, D56, and D59;
the third control signal source 23 is connected to the gates of the thin film transistors D15, D18, D21, D24, D27, D30, D33, D36, D39, D42, D45, D48, D51, D54, D57, and D60;
in the embedded touch test circuit of the preferred embodiment, the thin film transistors D7-D12, D13, D16, D19, D22, D25, D28, D31, D34, D14, D17, D20, D23, D38, D41, D44, D47, D15, D21, D27, D33, D39, D45, D51, and D57 are N-type thin film transistors; the thin film transistors D1 to D6, D37, D40, D43, D46, D49, D52, D55, D58, D26, D29, D32, D35, D50, D53, D56, D59, D18, D24, D30, D36, D42, D48, D54, and D60 are P-type thin film transistors.
When the embedded touch test circuit of the preferred embodiment is used, firstly, the constant voltage power supply 251 provides 0V voltage to the data line 254, so as to prevent the data line from generating electrical interference to the touch electrode; then, the scan line control signal source 252 provides a scan line control signal with a high potential to the thin film transistors D7-D12, and the scan line input signal source 253 provides a scan line input signal with a certain frequency and a certain voltage to the scan lines through the thin film transistors D7-D12, so as to trigger the first, second, fifth, sixth, ninth, tenth, thirteenth, and fourteenth touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 255 and the touch electrodes.
Then, the first control signal source 21, the second control signal source 22 and the third control signal source 23 provide high-potential control signals, the series thin film transistors D13, D14 and D15 are turned on, and the series thin film transistors D19, D20 and D21 are turned on, at this time, since a touch signal is generated on the first touch electrode and no touch signal is generated on the third touch electrode, the touch signal on the first touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 and the second control signal source 22 provide a high-potential control signal, the third control signal source 23 provides a low-potential control signal, the series thin film transistors D16, D17 and D18 are turned on, and the series thin film transistors D22, D23 and D24 are turned on, at this time, since a touch signal is generated on the second touch electrode and no touch signal is generated on the fourth touch electrode, the touch signal on the second touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 and the third control signal source 23 provide a high-potential control signal, the second control signal source 22 provides a low-potential control signal, the series thin film transistors D25, D26 and D27 are turned on, and the series thin film transistors D31, D32 and D33 are turned on, at this time, since a touch signal is generated on the fifth touch electrode and no touch signal is generated on the seventh touch electrode, the touch signal on the fifth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 provides a high-potential control signal, the second control signal source 22 and the third control signal source 23 provide a low-potential control signal, the series thin film transistors D28, D29 and D30 are turned on, and the series thin film transistors D34, D35 and D36 are turned on, at this time, since a touch signal is generated on the sixth touch electrode and no touch signal is generated on the eighth touch electrode, the touch signal on the sixth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the second control signal source 22 and the third control signal source 23 provide a high-potential control signal, the first control signal source 21 provides a low-potential control signal, the series thin film transistors D37, D38 and D39 are turned on, and the series thin film transistors D43, D44 and D45 are turned on, at this time, since a touch signal is generated on the ninth touch electrode and no touch signal is generated on the eleventh touch electrode, the touch signal on the ninth touch electrode is output to the touch signal collecting terminal 24;
at the next moment, the second control signal source 22 provides a high-potential control signal, the first control signal source 21 and the third control signal source 23 provide a low-potential control signal, the series thin film transistors D40, D41 and D42 are turned on, and the series thin film transistors D46, D47 and D48 are turned on, at this time, since a touch signal is generated on the tenth touch electrode and no touch signal is generated on the twelfth touch electrode, the touch signal on the tenth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the third control signal source 23 provides a high-potential control signal, the first control signal source 21 and the second control signal source 22 provide a low-potential control signal, the series thin film transistors D49, D50 and D51 are turned on, and the series thin film transistors D55, D56 and D57 are turned on, at this time, since a touch signal is generated on the thirteenth touch electrode and no touch signal is generated on the fifteenth touch electrode, the touch signal on the thirteenth touch electrode is output to the touch signal collecting terminal 24;
at the next moment, the first control signal source 21, the second control signal source 22 and the third control signal source 23 provide low-potential control signals, the series thin film transistors D52, D53 and D54 are turned on, and the series thin film transistors D58, D59 and D60 are turned on, at this time, since a touch signal is generated on the fourteenth touch electrode and no touch signal is generated on the sixteenth touch electrode, the touch signal on the fourteenth touch electrode is output to the touch signal acquisition terminal 24.
Then, the constant voltage power supply 251 provides 0V voltage to the data line 254 to prevent the data line from generating electrical interference to the touch electrode; then, the scan line control signal source 252 provides scan line control signals with a low voltage level to the tfts D1-D6, and the scan line input signal source 253 provides scan line input signals with a certain frequency and a certain voltage level to the scan lines via the tfts D1-D6, so as to trigger the third, fourth, seventh, eighth, eleventh, twelfth, fifteenth, and sixteen touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 255 and the touch electrodes.
Then, the first control signal source 21, the second control signal source 22 and the third control signal source 23 provide high-potential control signals, the series thin film transistors D13, D14 and D15 are turned on, and the series thin film transistors D19, D20 and D21 are turned on, at this time, since a touch signal is generated on the third touch electrode and no touch signal is generated on the first touch electrode, the touch signal on the third touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 and the second control signal source 22 provide a high-potential control signal, the third control signal source 23 provides a low-potential control signal, the series thin film transistors D16, D17 and D18 are turned on, and the series thin film transistors D22, D23 and D24 are turned on, at this time, since a touch signal is generated on the fourth touch electrode and no touch signal is generated on the second touch electrode, the touch signal on the fourth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 and the third control signal source 23 provide a high-potential control signal, the second control signal source 22 provides a low-potential control signal, the series thin film transistors D25, D26 and D27 are turned on, and the series thin film transistors D31, D32 and D33 are turned on, at this time, since a touch signal is generated on the seventh touch electrode and no touch signal is generated on the fifth touch electrode, the touch signal on the seventh touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21 provides a high-potential control signal, the second control signal source 22 and the third control signal source 23 provide a low-potential control signal, the series thin film transistors D28, D29 and D30 are turned on, and the series thin film transistors D34, D35 and D36 are turned on, at this time, since a touch signal is generated on the eighth touch electrode and no touch signal is generated on the sixth touch electrode, the touch signal on the eighth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the second control signal source 22 and the third control signal source 23 provide a high-potential control signal, the first control signal source 21 provides a low-potential control signal, the series thin film transistors D37, D38 and D39 are turned on, and the series thin film transistors D43, D44 and D45 are turned on, at this time, since a touch signal is generated on the eleventh touch electrode and no touch signal is generated on the ninth touch electrode, the touch signal on the eleventh touch electrode is output to the touch signal collecting terminal 24;
at the next moment, the second control signal source 22 provides a high-potential control signal, the first control signal source 21 and the third control signal source 23 provide a low-potential control signal, the series thin film transistors D40, D41 and D42 are turned on, and the series thin film transistors D46, D47 and D48 are turned on, at this time, since a touch signal is generated on the twelfth touch electrode and no touch signal is generated on the tenth touch electrode, the touch signal on the twelfth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the third control signal source 23 provides a high-potential control signal, the first control signal source 21 and the second control signal source 22 provide a low-potential control signal, the series thin film transistors D49, D50 and D51 are turned on, and the series thin film transistors D55, D56 and D57 are turned on, at this time, since a touch signal is generated on the fifteenth touch electrode and a touch signal is not generated on the thirteenth touch electrode, the touch signal on the fifteenth touch electrode is output to the touch signal acquisition terminal 24;
at the next moment, the first control signal source 21, the second control signal source 22 and the third control signal source 23 provide low-potential control signals, the series thin film transistors D52, D53 and D54 are turned on, and the series thin film transistors D58, D59 and D60 are turned on, at this time, since a touch signal is generated on the sixteenth touch electrode and no touch signal is generated on the fourteenth touch electrode, the touch signal on the sixteenth touch electrode is output to the touch signal acquisition terminal 24.
Finally, comparing the acquired touch signals, and if the waveforms of all the acquired touch signals are consistent, determining that the touch screen is a good product; if the waveform difference between a certain touch signal and other touch signals is large, it can be concluded that the touch electrode is short-circuited or open-circuited.
The embedded touch control test circuit of the preferred embodiment triggers the touch control electrodes through the capacitive coupling module 25 to generate touch control signals, collects the touch control signals generated by each touch control electrode one by one through the switch module 20, and compares the collected touch control signals, so that the touch screen function test of the touch screen is completed, the waste of materials such as chips and cables is avoided, and the production efficiency is improved.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (10)
1. An in-cell touch test circuit, comprising:
n control signal sources for providing control signals;
the capacitive coupling module is used for triggering the touch electrode to generate a touch signal;
the switch module comprises m input ends, n control ends and an output end, and is used for receiving the touch signals on the m touch electrodes and outputting the touch signal on one of the touch electrodes to a touch signal acquisition terminal under the control of the control signals; wherein,
the input end is connected with the corresponding touch electrode, the control end is connected with the corresponding control signal source, the output end is connected with the touch signal acquisition terminal, the capacitive coupling module is connected with the touch electrode in a coupling mode, n and m are positive integers, and m is smaller than or equal to 2^ n.
2. The in-cell touch test circuit of claim 1, wherein the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
3. The in-cell touch test circuit of claim 2, wherein the control unit comprises a plurality of thin film transistors, a gate of each thin film transistor is connected to the scan line control signal source, a source of each thin film transistor is connected to the scan line input signal source, and a drain of each thin film transistor is connected to the corresponding scan line.
4. The in-cell touch test circuit of claim 1, wherein the switch module comprises a plurality of thin film transistors, each of the touch electrodes is connected to the touch signal collecting terminal through n thin film transistors connected in series, and a gate of each of the thin film transistors is connected to the corresponding control signal source.
5. The in-cell touch test circuit of claim 3 or 4, wherein the thin film transistor is an N-type thin film transistor or a P-type thin film transistor.
6. An in-cell touch test circuit, comprising:
n control signal sources for providing control signals;
the capacitive coupling module is used for triggering the touch electrode to generate a touch signal;
the switch module comprises m input ends, n control ends and an output end, and is used for receiving the touch signals on the m touch electrodes and outputting the touch signal on one of the touch electrodes to a touch signal acquisition terminal under the control of the control signals; wherein,
the input end is connected with the corresponding touch electrode, the control end is connected with the corresponding control signal source, the output end is connected with the touch signal acquisition terminal, the capacitive coupling module is connected with the touch electrode in a coupling mode, n and m are positive integers, and m is smaller than or equal to 2^ (n + 1).
7. The in-cell touch test circuit of claim 6, wherein the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
8. The in-cell touch test circuit of claim 7, wherein the control unit comprises a plurality of TFTs, a gate of each TFT is connected to the scan line control signal source, a source of each TFT is connected to the scan line input signal source, and a drain of each TFT is connected to the corresponding scan line.
9. The in-cell touch test circuit of claim 7, wherein the switch module comprises a plurality of thin film transistors, each of the touch electrodes is connected to the touch signal collecting terminal through n thin film transistors connected in series, and a gate of each of the thin film transistors is connected to the corresponding control signal source.
10. The in-cell touch test circuit of claim 8 or 9, wherein the thin film transistor is an N-type thin film transistor or a P-type thin film transistor.
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Application publication date: 20170222 |