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CN106203199A - A kind of method and device of double-interface card performance test - Google Patents

A kind of method and device of double-interface card performance test Download PDF

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Publication number
CN106203199A
CN106203199A CN201610488478.2A CN201610488478A CN106203199A CN 106203199 A CN106203199 A CN 106203199A CN 201610488478 A CN201610488478 A CN 201610488478A CN 106203199 A CN106203199 A CN 106203199A
Authority
CN
China
Prior art keywords
test
waveform
double
interface card
performance test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610488478.2A
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Chinese (zh)
Inventor
杨勋
熊传光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Tianyu Information Industry Co Ltd
Original Assignee
Wuhan Tianyu Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan Tianyu Information Industry Co Ltd filed Critical Wuhan Tianyu Information Industry Co Ltd
Priority to CN201610488478.2A priority Critical patent/CN106203199A/en
Publication of CN106203199A publication Critical patent/CN106203199A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/0095Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly

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  • Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The invention discloses the method and device of a kind of double-interface card performance test, the method includes: setting up performance test data storehouse and build test environment, test environment includes double-interface card, card reader, test program, waveform recognition plug-in unit and test equipment;Correspondence instruction is performed according to difference transaction;Waveform when being performed by test monitoring of tools and recording instruction;Waveform recognition plug-in unit identification waveform also records the corresponding execution time instructed;The execution time that every instructs is exported and be saved in Excel, and collects, judge whether double-interface card meets performance standard with this.The present invention can recognize that various time for each instructions in waveform by waveform recognition plug-in unit, compatible preferable, can programming count single time for each instruction collecting, provide performance test report, instruction exchange hour is obtained without manually measuring waveform, and tester is without possessing the most professional waveform recognition ability, reduces tester's working strength, substantially increases testing efficiency.

Description

A kind of method and device of double-interface card performance test
Technical field
The present invention relates to double-interface card operating system testing field, a kind of method being specifically related to double-interface card performance test And device.
Background technology
Constantly promoting and using along with double-interface card technology, the requirement to double-interface card performance of transaction is more and more higher, In order to meet the different demands of different industries, need to meet the requirement to double-interface card performance of transaction by technological means.
Can double-interface card performance test, for verifying whether double-interface card operating system meets the requirement on exchange hour A transaction is completed within the time of regulation.For non-contact card, such as mass transit card, need in user's brush public transport The moment of card can complete a transaction, if double-interface card operating system can not quickly respond, may leave at double-interface card Go back incomplete transaction during card swiping terminal, Consumer's Experience will be had a strong impact on.
In existing test, the performance test of double-interface card is high, if measured waveform by hand by tester Obtain the exchange hour of instruction, in the case of complex operation and efficiency do not have a large amount of test event, based on each double-interface card, all Need its performance is tested, cause the working strength of tester big and maintenance cost is higher, and need tester Possesses the waveform recognition ability of specialty.
In view of this, it is badly in need of the new method of a kind of double-interface card performance test, solves existing method of testing and cause test The working strength of personnel is big and maintenance cost is higher, and requires the problem that tester possesses the waveform recognition ability of specialty.
Summary of the invention
The technical problem to be solved is to provide the new method of a kind of double-interface card performance test, it is possible to reduces and surveys The working strength of examination personnel and maintenance cost, and do not require that tester possesses the most professional waveform recognition ability.
In order to solve above-mentioned technical problem, the technical solution adopted in the present invention is to provide a kind of double-interface card performance test Method, comprise the following steps:
Setting up performance test data storehouse and build test environment, test environment includes double-interface card, card reader, test journey Sequence, waveform recognition plug-in unit and test equipment;
According to instruction corresponding in different transaction execution performance test databases;
Waveform when being performed by test monitoring of tools and recording instruction;
Waveform recognition plug-in unit is by the waveform of record in instruction execution information identification test equipment, and records corresponding instruction The execution time;
By waveform recognition plug-in unit, the execution time that every instructs export and is saved in Excel, and every is instructed The execution time collects, and whether meets the criterion of performance requirement in this, as double-interface card.
In technique scheme, call described test equipment by the button in described test program, described when performing Waveform during instruction in test program, when described test monitoring of tools and recording instruction perform.
In technique scheme, the instruction letter being preset with in described waveform recognition plug-in unit in described performance test data storehouse Breath, and preserve with text message form, when performing instruction corresponding in described performance test data storehouse, described waveform recognition is inserted Part identifies the waveform of record in described test equipment automatically, and records the execution time of corresponding instruction.
In technique scheme, when command information to be measured has renewal, the described performance test data storehouse of corresponding renewal.
Present invention also offers the device of a kind of double-interface card performance test, including performance test database, double-interface card, Card reader, test program, waveform recognition plug-in unit and test equipment,
Described performance test data storehouse is built in computer, is used for recording script, including command information to be measured;
Described double-interface card is intelligent cards to be tested;
Described card reader connects computer by USB interface, for reading described double-interface card to be tested;
Described test program is built in computer, accesses described card reader by particular port, performs described performance test Script in data base, and output test result;
Described waveform recognition plug-in unit is integrated in described test program, is previously provided with in described performance test data storehouse Instruction to be measured, identifies the waveform of record in described test equipment, and the execution time that correspondence instructs is carried out statistical summaries;
Described test equipment connects computer, accesses described test program by particular port, for performing process at script Waveform when middle monitoring and recording instruction perform.
The present invention can be held concurrently with custom instruction to identify the execution time of various instructions in waveform by waveform recognition plug-in unit Capacitive is preferable, and can execution time of the single instruction of programming count collecting, provide according to interiorly or exteriorly demand Satisfactory performance test report, tester without removing to obtain by manually measuring waveform the exchange hour of instruction again, And tester need not possess the most professional waveform recognition ability, except performance test data storehouse is safeguarded by needs Outward, other maintenance workload there is no, reduces the working strength of tester, substantially increases testing efficiency.
Accompanying drawing explanation
The method flow diagram of a kind of double-interface card performance test that Fig. 1 provides for the embodiment of the present invention;
The structure drawing of device of a kind of double-interface card performance test that Fig. 2 provides for the embodiment of the present invention.
Detailed description of the invention
In order to detect whether the performance of transaction of double-interface card meets requirement, can the instruction such as specified in the time of regulation Interior transaction completes, and embodiments provides the method and device of a kind of double-interface card performance test, it is possible to reduce test The working strength of personnel, and do not require that tester possesses the most professional waveform recognition ability, substantially increase testing efficiency.
Below in conjunction with specification drawings and specific embodiments, the present invention is described in detail.
A kind of method embodiments providing double-interface card performance test, as it is shown in figure 1, comprise the following steps:
Test environment is also built in S1, establishment performance test data storehouse, and test environment includes double-interface card, card reader, test Program, waveform recognition plug-in unit and test equipment.
Above-mentioned performance test data storehouse is built in computer, including command information to be measured;Above-mentioned card reader is connect by USB Mouth connects computer, for reading double-interface card to be tested;Above-mentioned test program is built in computer, is accessed by particular port Card reader;Above-mentioned waveform recognition plug-in unit is integrated in test program, is preset with the instruction letter needing to identify in waveform recognition plug-in unit Breath;After above-mentioned test equipment connects computer, access test program by particular port.
Calling test equipment by the button in test program, when the instruction performed in test program, test equipment is just Can monitor waveform when performing with recording instruction, waveform recognition plug-in unit will identify the waveform of record in test equipment automatically, And the execution time that correspondence instructs is carried out statistical summaries.
S2, according to instruction corresponding in different transaction execution performance test databases.
S3, by test monitoring of tools and recording instruction perform time waveform.
S4, waveform recognition plug-in unit are by the waveform of record in instruction execution information identification test equipment, and record correspondence and refer to The execution time of order.
In the above-mentioned methods, function is set by the instruction in waveform recognition plug-in unit, sets in advance in waveform recognition plug-in unit It is equipped with the command information (command information to be measured in performance test data storehouse) needing to record the execution time, and with text message shape Formula preserves, and when instruction corresponding in execution performance test database, waveform recognition plug-in unit can identify that instruction, instruction perform automatically After completing, record the execution time of every instruction.
S5, by waveform recognition plug-in unit, the execution time that every instructs is exported and is saved in Excel, and to every instruction The execution time collect, obtain total execution time, whether meet the judgement mark of performance requirement in this, as double-interface card Accurate.
In the above-mentioned methods, when command information to be measured has renewal, corresponding renewal performance test data storehouse.
The embodiment of the present invention additionally provides the device of a kind of double-interface card performance test, as in figure 2 it is shown, include performance test Data base 10, double-interface card 11, card reader 12, test program 13, waveform recognition plug-in unit 14 and test equipment 15.
Performance test data storehouse 10 is built in computer, is used for recording script, (includes being correlated with including command information to be measured APDU instruction);
Double-interface card 11 is intelligent cards to be tested;
Card reader 12 connects computer by USB interface, for reading double-interface card 11 to be tested, by double-interface card 11 with Test program 13 couples together;
Test program 13 is built in computer, accesses card reader 12 by particular port, is set with test by double-interface card 11 Standby 15 couple together, the script in execution performance test database 10, and output test result;
Waveform recognition plug-in unit 14 is integrated in test program 13, the finger to be measured being previously provided with in performance test data storehouse 10 Order, identifies the waveform of record in test equipment 15, and the execution time that correspondence instructs is carried out statistical summaries;
Test equipment 15 connects computer, accesses test program 13 by particular port, supervises during performing at script Waveform when control and recording instruction perform.
The present invention is not limited to above-mentioned preferred forms, the structure change that anyone makes under the enlightenment of the present invention, Every have same or like technical scheme, within each falling within protection scope of the present invention with the present invention.

Claims (5)

1. the method for a double-interface card performance test, it is characterised in that comprise the following steps:
Setting up performance test data storehouse and build test environment, test environment includes double-interface card, card reader, test program, ripple Shape identification plug-in unit and test equipment;
According to instruction corresponding in different transaction execution performance test databases;
Waveform when being performed by test monitoring of tools and recording instruction;
Waveform recognition plug-in unit is by the waveform of record in instruction execution information identification test equipment, and records the execution of corresponding instruction Time;
By waveform recognition plug-in unit, the execution time that every instructs export and is saved in Excel, and the execution that every is instructed Time collects, and whether meets the criterion of performance requirement in this, as double-interface card.
2. the method for double-interface card performance test as claimed in claim 1, it is characterised in that by described test program Button calls described test equipment, when the instruction performed in described test program, and described test monitoring of tools and recording instruction Waveform during execution.
3. the method for double-interface card performance test as claimed in claim 1, it is characterised in that pre-in described waveform recognition plug-in unit It is provided with the command information in described performance test data storehouse, and preserves with text message form, when performing described performance test number During according to corresponding in storehouse instruction, described waveform recognition plug-in unit identifies the waveform of record in described test equipment automatically, and record right The execution time that should instruct.
4. the method for double-interface card performance test as claimed in claim 1, it is characterised in that when command information to be measured has more Time new, the described performance test data storehouse of corresponding renewal.
5. the device of a double-interface card performance test, it is characterised in that include performance test database, double-interface card, Card Reader Device, test program, waveform recognition plug-in unit and test equipment,
Described performance test data storehouse is built in computer, is used for recording script, including command information to be measured;
Described double-interface card is intelligent cards to be tested;
Described card reader connects computer by USB interface, for reading described double-interface card to be tested;
Described test program is built in computer, accesses described card reader by particular port, performs described performance test data Script in storehouse, and output test result;
Described waveform recognition plug-in unit is integrated in described test program, and be previously provided with in described performance test data storehouse is to be measured Instruction, identifies the waveform of record in described test equipment, and the execution time that correspondence instructs is carried out statistical summaries;
Described test equipment connects computer, accesses described test program by particular port, supervises during performing at script Waveform when control and recording instruction perform.
CN201610488478.2A 2016-06-28 2016-06-28 A kind of method and device of double-interface card performance test Pending CN106203199A (en)

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Application Number Priority Date Filing Date Title
CN201610488478.2A CN106203199A (en) 2016-06-28 2016-06-28 A kind of method and device of double-interface card performance test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610488478.2A CN106203199A (en) 2016-06-28 2016-06-28 A kind of method and device of double-interface card performance test

Publications (1)

Publication Number Publication Date
CN106203199A true CN106203199A (en) 2016-12-07

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112100082A (en) * 2020-11-10 2020-12-18 深圳市深圳通有限公司 IC card test method, apparatus, system, and computer-readable storage medium
CN112270153A (en) * 2020-12-15 2021-01-26 鹏城实验室 Waveform acquisition method and device, test equipment, and computer-readable storage medium

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102541052A (en) * 2012-02-16 2012-07-04 山东电力研究院 Real-time test method for computer control system
CN102539970A (en) * 2012-01-04 2012-07-04 华北电网有限公司计量中心 RFID equipment testing method and system
TW201321779A (en) * 2011-11-23 2013-06-01 Uniform Ind Corp Test system for magnetic stripe decoder and method thereof
CN103186756A (en) * 2011-12-31 2013-07-03 国民技术股份有限公司 Testing device and testing method for card reader
US20130240625A1 (en) * 2012-03-14 2013-09-19 Uniform Industrial Corp. Test device for magnetic stripe decoder chip
CN104915695A (en) * 2015-06-24 2015-09-16 武汉天喻信息产业股份有限公司 Method and device for testing dual-interface IC card

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201321779A (en) * 2011-11-23 2013-06-01 Uniform Ind Corp Test system for magnetic stripe decoder and method thereof
CN103186756A (en) * 2011-12-31 2013-07-03 国民技术股份有限公司 Testing device and testing method for card reader
CN102539970A (en) * 2012-01-04 2012-07-04 华北电网有限公司计量中心 RFID equipment testing method and system
CN102541052A (en) * 2012-02-16 2012-07-04 山东电力研究院 Real-time test method for computer control system
US20130240625A1 (en) * 2012-03-14 2013-09-19 Uniform Industrial Corp. Test device for magnetic stripe decoder chip
CN104915695A (en) * 2015-06-24 2015-09-16 武汉天喻信息产业股份有限公司 Method and device for testing dual-interface IC card

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112100082A (en) * 2020-11-10 2020-12-18 深圳市深圳通有限公司 IC card test method, apparatus, system, and computer-readable storage medium
CN112270153A (en) * 2020-12-15 2021-01-26 鹏城实验室 Waveform acquisition method and device, test equipment, and computer-readable storage medium

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Application publication date: 20161207

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