CN106199195A - Printed circuit board (PCB) ion migration test system - Google Patents
Printed circuit board (PCB) ion migration test system Download PDFInfo
- Publication number
- CN106199195A CN106199195A CN201610564775.0A CN201610564775A CN106199195A CN 106199195 A CN106199195 A CN 106199195A CN 201610564775 A CN201610564775 A CN 201610564775A CN 106199195 A CN106199195 A CN 106199195A
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- China
- Prior art keywords
- test
- pcb
- circuit board
- printed circuit
- ion migration
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000012360 testing method Methods 0.000 title claims abstract description 77
- 238000013508 migration Methods 0.000 title claims abstract description 38
- 230000005012 migration Effects 0.000 title claims abstract description 38
- 238000009413 insulation Methods 0.000 claims abstract description 9
- 238000012546 transfer Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims abstract description 7
- 238000007405 data analysis Methods 0.000 claims abstract description 5
- 230000001681 protective effect Effects 0.000 claims abstract description 3
- 238000005259 measurement Methods 0.000 claims description 11
- 238000004891 communication Methods 0.000 claims 3
- 238000013461 design Methods 0.000 claims 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 239000000919 ceramic Substances 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- 238000009826 distribution Methods 0.000 claims 1
- 230000007613 environmental effect Effects 0.000 claims 1
- 238000012544 monitoring process Methods 0.000 claims 1
- 238000004886 process control Methods 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- 150000002500 ions Chemical class 0.000 description 18
- 238000010586 diagram Methods 0.000 description 8
- 230000005684 electric field Effects 0.000 description 3
- 241001269238 Data Species 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses a kind of printed circuit board (PCB) ion migration test system, control and data analysis upper computer software including DC source, electrometer, multi-channel switch system, multi-channel high-speed System of voltage acquisition, transfer adapter, system.System uses current method to measure the insulation resistance of printed circuit board (PCB) to assess the situation of ion migration.It is a feature of the present invention that: described DC source is connected with tested pilot by transfer adapter; sample resistance and protective resistance are connected in TCH test channel loop; electrometer is sequentially connected in series into TCH test channel by multi-channel switch system; electric current in high-acruracy survey passage; multi-channel high-speed System of voltage acquisition is connected with sample resistance; monitor the leakage current of each passage in real time; upper computer software controls DC source, electrometer, multi-channel switch system and the work schedule of multi-channel high-speed System of voltage acquisition, carries out data analysis and provides result of determination.The test system structure concision and compact of the present invention, easy to use, measuring accuracy is high, and test speed is fast, improves the automaticity of printed circuit board (PCB) ion migration test, also improves the reliability of printed circuit board (PCB) ion migration test result.
Description
Technical field
The present invention relates to a kind of printed circuit board (PCB) ion migration test system, test object includes: whole printed circuit board (PCB),
Insulant and semi-conducting material etc. need to measure the object of insulation degree.Belong to precision measurement equipment technology field.
Background technology
Ion migration refers between the substrate in electronic system product and electronic device or between circuit owing to existing between line
Distributed electric field, can make some metal ion being between the two poles of the earth migrate under electric field action, and i.e. cation is to being in the moon
The position of pole state is moved, and anion can move to the position being in anode state.Under high temperature, high humidity and voltage conditions, collection
Become the short circuit running through substrate that causes due to ion migration of circuit and surface, to the short circuit on surface, catastrophic inefficacy can occur.With
Miniaturization and the densification of electronic equipment, ion migration assessment and insulation degree assess ever more important.
According to IPC-TM-650 2.6.14/2.6.14.1, IPC-TM-650 2.6.3.7 and IPC-TM-650 2.6.25
Suggestion, the material such as printed circuit board base board should carry out ion migration test assessment.Under specified temp humidity and voltage conditions,
Particular electrical circuit carries out the megger test up to 500 hours to 1000 hours, and test period is less than 20 minutes.The most domestic
Printed circuit board (PCB) ion migration Auto-Test System still the most in high precision.
Summary of the invention
Fig. 1 is described printed circuit board (PCB) ion migration test principle block diagram.System include DC source, electrometer,
Multi-channel switch system, multi-channel high-speed System of voltage acquisition, transfer adapter, system control soft with data analysis host computer
Part.System uses current method to measure the insulation resistance of printed circuit board (PCB) to assess the situation of ion migration.Inventive feature exists
In: described DC source is connected with tested pilot by transfer adapter, and sample resistance and protective resistance are connected on TCH test channel
In loop, electrometer is sequentially connected in series into TCH test channel, the electric current in high-acruracy survey passage, manifold by multi-channel switch system
Road high speed System of voltage acquisition is connected with sample resistance, monitors the leakage current of each passage in real time, and upper computer software controls direct current
Power supply, electrometer, multi-channel switch system and the work schedule of multi-channel high-speed System of voltage acquisition, carry out data analysis and give
Go out result of determination.
Operation instruction
1, editor's measurement condition
Described printed circuit board (PCB) ion migration test system uses measurement condition to manage test sequence, operating mode list such as Fig. 2 institute
Showing, each entry of operating mode can arrange the total time of test, time delay, test interval, pressing time, stress voltage and survey
The parameters such as examination voltage.It is to wait for the time that temperature humidity is stable, during this period of time DC source not output voltage time delay,
One period of time delay that each operating mode entry only most starts.Being to wait for the time that electric field is stable pressing time, DC source is defeated
Go out test voltage, often have one period of pressing time before wheel test.Test interval is interlude between twice test, is surveying
Try in interval time, DC source output stress voltage.The sequential chart of test is as shown in Figure 3.
2, test setting is carried out
As shown in Figure 4.Each group may select different measurement condition.Each TCH test channel can be independently selected for test or accident
Examination.Test criteria has two kinds, and a kind of is the number of times according to activation threshold value, as it is shown in figure 5, when measuring insulation resistance value less than setting threshold
When value reaches set point number, it is believed that this TCH test channel lost efficacy；Another kind is the time according to activation threshold value, as shown in Figure 6, works as survey
When amount insulation resistance value reaches the setting time less than setting threshold value, it is believed that this TCH test channel lost efficacy.Both criterions can act as simultaneously
With.Leakage current threshold is the threshold value set for high speed System of voltage acquisition, when the leakage current measured is more than this threshold value, it is believed that
This TCH test channel lost efficacy.
3, testing and control
System uses full-automation test, need not manual operation, but user still can carry out " time-out ", " stopping " in test process
Deng operation.
4, data process
Electrometer takes one-shot measurement multiple data when measuring, removal gross error of leaving out the beginning and the end after being ranked up data, so
After average, direct current power source voltage value obtains the resistance of insulation resistance divided by this meansigma methods.All initial datas are saved in number
According in file, as shown in Figure 7.System can automatic report generation, comprise some statistical datas and test result, as shown in Figure 8.
Accompanying drawing explanation
Fig. 1 is printed circuit board (PCB) ion migration test principle figure；
Fig. 2 is printed circuit board (PCB) ion migration measurement condition schematic diagram；
Fig. 3 is printed circuit board (PCB) ion migration test sequence explanatory diagram；
Fig. 4 is printed circuit board (PCB) ion migration test setting explanatory diagram；
Fig. 5 is printed circuit board (PCB) ion migration test failure criterion 1 schematic diagram；
Fig. 6 is printed circuit board (PCB) ion migration test failure criterion 2 schematic diagram；
Fig. 7 is printed circuit board (PCB) ion migration test result file schematic diagram；
Fig. 8 is printed circuit board (PCB) ion migration testing journal sheet's file schematic diagram.
Claims (12)
1. a printed circuit board (PCB) ion migration test system, including DC source, electrometer, multi-channel switch system, manifold
Road high speed System of voltage acquisition, transfer adapter, system control and data analysis upper computer software.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: described printed circuit board (PCB)
Ion migration test system uses current method to measure the insulation resistance of printed circuit board (PCB) to assess the situation of ion migration, unidirectional current
Source is connected with tested pilot by transfer adapter, and sample resistance and protective resistance are connected in TCH test channel loop, electrometer
Being sequentially connected in series into TCH test channel, the electric current in high-acruracy survey passage by multi-channel switch system, multi-channel high-speed voltage is adopted
Collecting system is connected with sample resistance, monitors the leakage current of each passage in real time.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: system uses modularity
Design, flexibly configurable DC source, electrometer, multi-channel switch system, multi-channel high-speed System of voltage acquisition, transfer connect
The quantity of device, to constitute the system of different TCH test channel quantity.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: system test precision is full
Foot IPC-TM-650 2.6.14/2.6.14.1, IPC-TM-650 2.6.3.7 and IPC-TM-650 2.6.25 is for test system
The requirement of system precision.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: system is only furnished with one
In the case of electrometer, test 128 passages less than 10 minutes.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: DC source can be compiled
Process control, produces stress voltage and test voltage in conjunction with test sequence, has tri-kinds of voltage specifications of 100V, 300V and 500V, direct current
Power supply has output short circuit protection function, to protect electrometer and TCH test channel without damage.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: multi-channel switch system
Each TCH test channel comprise major loop and measure branch road (as shown in Figure 1), during pressurized state, K1 close, K2 disconnect, poll survey
During amount, K2 first closes, and disconnects after K1, measures after terminating, and K1 first closes, and disconnects after K2, adds continuously ensureing that test sample is in
The state of pressure.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: transfer adapter owns
The positive pole of passage is connected by copper coin, has same positive potential position, and negative pole uses separate coaxial cable connector, both ensures
All TCH test channels in one group have identical reference potential, have again good shielding anti-jamming effectiveness.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: multi-channel switch system
Use ceramic multilayer circuits plate design, relay drive layer with measure signals layer separate, relay drive signal centre two-layer,
Test signal distributions is at top layer and bottom.
Printed circuit board (PCB) ion migration the most according to claim 1 test system is characterized in that: electrometer is measured and many
Passage high speed System of voltage acquisition is measured separate, and two the separate threads being generalized machine software are controlled, electrostatic
Meter is responsible for accurately measuring, and the measurement data of upper computer software record is measured as basic calculation with electrometer and obtains, multi-channel high-speed
System of voltage acquisition is responsible for the leakage current of real-time monitoring and test passage, more than sampling rate 10K, can catch ion migration phenomenon
Trickle behavior, only when leakage current is more than setting value, measurement result is just generalized machine software records.
11. printed circuit board (PCB) ion migration according to claim 1 test systems is characterized in that: system has and environment
The communication interface of experimental box, upper computer software can carry out communication by communication interface and environmental test chamber, controls and obtain environment
The temperature and humidity of proof box.
12. printed circuit board (PCB) ion migration according to claim 1 test systems is characterized in that: upper computer software controls
DC source, electrometer, multi-channel switch system, the work schedule of the hardware such as multi-channel high-speed System of voltage acquisition, it is ensured that high
Precision insulation resistance value is measured and real-time channel leakage current test, and upper computer software can arrange certain Rule of judgment, automatic decision
Test result is the most qualified and stops the measurement to dead channels, and upper computer software can arrange measurement form, in the process of measurement
In, the parameter such as stress voltage, test voltage, pressing time, time delay and test interval all can change.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610564775.0A CN106199195A (en) | 2016-07-19 | 2016-07-19 | Printed circuit board (PCB) ion migration test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610564775.0A CN106199195A (en) | 2016-07-19 | 2016-07-19 | Printed circuit board (PCB) ion migration test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106199195A true CN106199195A (en) | 2016-12-07 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201610564775.0A Pending CN106199195A (en) | 2016-07-19 | 2016-07-19 | Printed circuit board (PCB) ion migration test system |
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| CN (1) | CN106199195A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107255784A (en) * | 2017-07-10 | 2017-10-17 | 深圳崇达多层线路板有限公司 | The many physical quantity systems and measuring method of a kind of wiring board |
| CN111077427A (en) * | 2018-10-22 | 2020-04-28 | 现代摩比斯株式会社 | Apparatus and method for detecting ion migration |
| WO2021196988A1 (en) * | 2020-04-03 | 2021-10-07 | 长鑫存储技术有限公司 | Test circuit and semiconductor testing method |
| CN114624498A (en) * | 2022-03-10 | 2022-06-14 | 珠海市运泰利自动化设备有限公司 | Low current test system |
| CN117148027A (en) * | 2023-10-31 | 2023-12-01 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Electromigration testing device and method |
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| JPH01307673A (en) * | 1988-06-07 | 1989-12-12 | Sutabiraizaa Kk | Dc constant-voltage circuit system for superconducting measurement |
| CN1829911A (en) * | 2003-06-20 | 2006-09-06 | 杨百翰大学 | Single device for ion mobility and ion trap mass spectrometry |
| CN1950698A (en) * | 2004-07-27 | 2007-04-18 | 工程吸气公司 | Ion mobility spectrometer comprising a corona discharge ionization element |
| CN101335177A (en) * | 2007-06-29 | 2008-12-31 | 株式会社日立制作所 | Ion trap, mass analyzer, ion mobility analyzer |
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| CN103091577A (en) * | 2013-01-06 | 2013-05-08 | 中国电力科学研究院 | Direct current insulator ionic migration test equipment |
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| JPH01307673A (en) * | 1988-06-07 | 1989-12-12 | Sutabiraizaa Kk | Dc constant-voltage circuit system for superconducting measurement |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107255784A (en) * | 2017-07-10 | 2017-10-17 | 深圳崇达多层线路板有限公司 | The many physical quantity systems and measuring method of a kind of wiring board |
| CN111077427A (en) * | 2018-10-22 | 2020-04-28 | 现代摩比斯株式会社 | Apparatus and method for detecting ion migration |
| CN111077427B (en) * | 2018-10-22 | 2022-03-08 | 现代摩比斯株式会社 | Apparatus and method for detecting ion migration |
| WO2021196988A1 (en) * | 2020-04-03 | 2021-10-07 | 长鑫存储技术有限公司 | Test circuit and semiconductor testing method |
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| CN114624498A (en) * | 2022-03-10 | 2022-06-14 | 珠海市运泰利自动化设备有限公司 | Low current test system |
| CN117148027A (en) * | 2023-10-31 | 2023-12-01 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Electromigration testing device and method |
| CN117148027B (en) * | 2023-10-31 | 2024-01-30 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Electromigration test device and method |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20161207 |
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