CN106055443A - A Multi-channel DC Cycle Test System - Google Patents

Abstract

The invention discloses a multi-channel DC cycle test system. The system includes: a control host, which sets the parameters of multiple tested machines, test cycle times, and cycle time interval parameters through programs, and outputs control information according to the input information. To the single-chip controller module; the single-chip controller module, after receiving the information input by the control host, sends the switch signal to multiple servers under test through the multi-way switch module; the structure of the multi-way switch module includes multi-way relays, each relay According to the control signal sent by the single-chip controller module, the power button of the corresponding test machine is turned on and off. The system of the present invention can realize the test of multiple tested machines at one time without interfering with each other, the test results are independent, no manual participation is required, and the test status of each machine can be monitored in time to achieve multi-channel monitoring and multi-channel control The effect can effectively improve the test efficiency and simplify the test process.

Description

A Multi-channel DC Cycle Test System

technical field

The present invention relates to the technical field of server stability/reliability testing, in particular to a multi-channel DC cycle test system, an automatic test system capable of performing DC on/off cycle tests on multiple servers at the same time, and in particular to an application to Automated testing methods for server functionality and reliability.

Background technique

In the testing of servers, storage and other products, the DC switch cycle test is a must-test item in the testing of electronic products such as calculators. It is related to the reliability and stability of the product, but the current test equipment can only be one-to-one for the product. When there are many products, due to the limited number of test equipment, it is easy to cause conflicts of equipment resources. Different products need to be tested in a queue, prolonging the test time, which will increase the product development and testing cycle.

Contents of the invention

The technical problem to be solved by the present invention is: aiming at the shortcomings of the prior art, the present invention provides a multi-channel DC cycle test system, which can perform DC switch cycle test on multiple servers at the same time.

The technical scheme adopted in the present invention is:

A multi-channel DC cycle test system, the system includes a control host, a single-chip controller module, a multi-channel switch module, wherein:

Control the host machine, set parameters such as multi-channel tested machines, test cycle times, and cycle time intervals through the program, and output control information to the single-chip controller module according to the input information, and also display the test status in real time and communicate with the controller The function of transmitting information;

The single-chip controller module, after receiving the information input by the control host, sends control signals to multiple servers under test through the multi-way switch module;

The structure of the multi-way switch module includes multiple relays, and each relay completes the switching action of the Power Button corresponding to the power button of the test machine according to the control signal sent by the single-chip controller module.

Through the control of the host computer by this system, a single machine can perform the automatic test of the DC switch cycle on multiple test machines at the same time, without manual participation, and can monitor the test status of each machine in time, and can achieve multi-channel monitoring and multi-channel control. Effect.

The system operation process is as follows:

1) First connect the control host and the single-chip controller module through the serial port data line, and then connect the switch signal line of the multi-way switch module with the switch signal line of the server;

2) Run the control program of the control host, first activate the serial port, if it is successful, it means that the communication between the control host and the single-chip controller module is normal, then set the number of cycle tests and delay time and other parameters, and then start the corresponding control signal of the machine under test, The control host sends the set information to the single-chip controller module;

3) When the single-chip controller module receives the corresponding setting information, it controls the corresponding relay to close once according to the set information, which is equivalent to pressing the Power Button of the test machine, the test machine starts, and sends a message after the start is successful. To the control host, the control host then sends a message to the controller, which controls the corresponding relay to close once, and the testing machine is shut down, thus completing a cycle.

The control host records and displays the state through software during the test until the set number of cycles is completed, and displays the test result.

The beneficial effects of the present invention are:

By controlling the host computer, the system of the present invention can automatically test the DC power-on/off cycle of multiple test machines at the same time, so as to achieve the test of multiple machines under test at the same time without interfering with each other, and the test results are independent without the need for Manual participation, and can monitor the test status of each machine in time, can achieve the effect of multi-channel monitoring and multi-channel control, can effectively improve the test efficiency and simplify the test process, suitable for all current server products, and improve the test efficiency The degree of automation can ensure the real user environment and product quality.

Description of drawings

Fig. 1 is the flow chart of the system operation of the present invention.

detailed description

Below in conjunction with accompanying drawing of description, the present invention is further described according to specific embodiment:

Example 1:

A multi-channel DC cycle test system, the system includes a control host, a single-chip controller module, a multi-channel switch module, wherein:

Control the host machine, set parameters such as multi-channel tested machines, test cycle times, and cycle time intervals through the program, and output control information to the single-chip controller module according to the input information, and also display the test status in real time and communicate with the controller The function of transmitting information;

The single-chip controller module, after receiving the information input by the control host, sends control signals to multiple servers under test through the multi-way switch module;

The structure of the multi-way switch module includes multiple relays, and each relay completes the switching action of the Power Button corresponding to the power button of the test machine according to the control signal sent by the single-chip controller module.

Through this system, the control host can simultaneously perform automatic testing of the DC on/off cycle for multiple test machines without manual participation, and can monitor the test status of each machine in time to achieve multi-channel monitoring and multi-channel control. Effect.

Example 2

As shown in Figure 1, on the basis of Embodiment 1, the system operation process described in this embodiment is as follows:

1) First connect the control host and the single-chip controller module through the serial port data line, and then connect the switch signal line of the multi-way switch module with the switch signal line of the server;

2) Run the control program of the control host, first activate the serial port, if it is successful, it means that the communication between the control host and the single-chip controller module is normal, then set the number of cycle tests and delay time and other parameters, and then start the corresponding control signal of the machine under test, The control host sends the set information to the single-chip controller module;

3) When the single-chip controller module receives the corresponding setting information, it controls the corresponding relay to close once according to the set information, which is equivalent to pressing the Power Button of the test machine, the test machine starts, and sends a message after the start is successful. To the control host, the control host then sends a message to the controller, which controls the corresponding relay to close once, and the testing machine is shut down, thus completing a cycle.

Example 3

On the basis of Embodiment 1 or 2, the control host described in this embodiment records and displays the status through software during the test, until the set number of cycles is completed, and displays the test result.

The embodiments are only used to illustrate the present invention, rather than to limit the present invention. Those of ordinary skill in the relevant technical field can also make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, all equivalent The technical solution also belongs to the category of the present invention, and the scope of patent protection of the present invention should be defined by the claims.

Claims (3)

1. a multichannel DC loop test system, it is characterised in that: described system includes controlling main frame, singlechip controller mould Block, variable connector module, wherein:

Control main frame, by the tested board of program setting multichannel, test loop number of times, circulation time spacing parameter, and according to defeated The information entered, output control information is to singlechip controller module；

Singlechip controller module, after accepting to control the information that main frame inputs, gives multiple stage tested respectively by variable connector module Server sends switching on and shutting down signal；

The structure of variable connector module includes multicircuit relay, and every road relay sends control letter according to singlechip controller module Number complete the switching on and shutting down action of corresponding tester table power knob.

A kind of multichannel DC loop test system the most according to claim 1, it is characterised in that described system operation is such as Under:

1) first control main frame is coupled by serial port data line with singlechip controller module, then variable connector module Switching on and shutting down holding wire couples with the switching on and shutting down holding wire of server；

2) run the control program of control main frame, first activate serial ports, if successfully representing and controlling main frame and singlechip controller mould Block communication is normal, then sets number of times and the delay time parameter of loop test, then starts corresponding that road of tested machine Control signal, controls main frame and the information set up is sent to singlechip controller module;

3) after singlechip controller module receives the configuration information of correspondence, that road relay corresponding is controlled according to the information arranged Device close once, tester table start, after starting successfully photos and sending messages give control main frame, control main frame photos and sending messages again to controller, Controlling that road relay corresponding to close once, test machine is closed, and so far completes once to circulate.

A kind of multichannel DC loop test system the most according to claim 1 and 2, it is characterised in that: described control main frame exists Test process pass through software records and shows state, until the cycle-index set completes, and showing test result.