CN106019120B - Test and management method based on expansible device detection library - Google Patents
Test and management method based on expansible device detection library Download PDFInfo
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- 238000007726 management method Methods 0.000 title claims abstract description 15
- 238000010998 test method Methods 0.000 title claims abstract description 13
- 238000012360 testing method Methods 0.000 claims abstract description 126
- 238000004088 simulation Methods 0.000 claims description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
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Abstract
The invention discloses the test and management methods based on expansible device detection library, including load component inventory and index library file；The test index in index storehouse is accessed, index name is read；Index list object is created, index name is stored into index list object；Access the type of device information in component inventory, reading device typonym；Device list object is created, type of device title is stored into device list object；It is successively read the corresponding test index of device list object in step 5, the reference of the corresponding index name of index list object is established according to the corresponding test index of device list object, and save into the corresponding test index list of device list object；The selection situation for judging type of device title in device list object, judges the selected state of the corresponding test index of device typonym；The type of device title in step 4 is saved to component inventory, saves device library file of the corresponding test index information of the type of device title into step 1.
Description
Technical field
The present invention relates to frequency domain/time-domain signal testing field, especially a kind of test based on expansible device detection library
Management method.
Background technique
Currently, measured device wide variety in semiconductor monolithic integrated circ Auto-Test System, every one kind device all has
Have the characteristics that testing process is more unified compared with specification, index, but the test index library of all kinds of devices is not identical.Such as: attenuator
The test index that type of device is related to has the indexs such as working frequency, attenuation, input power, attenuation accuracy, low noise device class
The test index that type is related to has working frequency, power gain, saturation power, harmonic wave, clutter, 1dB compression point power, noise coefficient
Etc. indexs.It can be seen that there are also different test indexs for the two kinds of existing public test index of device.
Currently existing technical solution is to establish a test index library.When needing to test a certain types of devices, just arrange
Test index all in test index library out, allows user to select, and the index item that user selects is saved in one and is matched
It sets in file, the index item that will be saved in load configurations file when the application is restarted.Prior art is being tested
When a certain types of devices, need to select institute's test index in need by hand.Although the index item of selection is also saved to configuration
It in file, and can be loaded into program when program restarts, be provided with certain hommization, but there are following several
Point disadvantage:
1) index item in test index library is very more, and test index required for oneself is selected in numerous index item
It is a cumbersome job, is very easy to error, and user also needs deep knowledge on testing and experience.
2) when user will test another type device, it is invalid for the test index selected originally, needs to re-start
Selection is to override original selection.In this way, when user usually to multiple types device switch test when, would have to time time choosing
It selects, significantly increases work difficulty and error probability.
Summary of the invention
In order to solve the deficiencies in the prior art, the present invention provides a kind of test and management side based on expansible device detection library
Method.
To achieve the above object, the present invention adopts the following technical solutions:
Based on the test and management method in expansible device detection library, it is based on component inventory and index storehouse, the component inventory includes
Type of device information, and type of device store all type of device titles, the corresponding test index list of type of device title with
And the test index chooses attribute, the index storehouse includes all test indexs, the test index includes index name.
The method is as follows:
Step 1: load component inventory and index library file, component inventory and index storehouse are stored using XML file format；
Step 2: the test index in access index storehouse reads index name；
Step 3: creation index list object, for storing the test index in step 2, by the index name in step 2
Title is stored into index list object；
Step 4: the type of device information in access component inventory, reading device typonym；
Step 5: creation device list object stores the type of device title in step 4 into device list object；
Step 6: it is successively read the corresponding test index of device list object in step 5, according to device list object pair
The test index answered establishes the reference of the corresponding index name of index list object, and saves to the corresponding survey of device list object
It tries in index list；
Step 7: judging the selection situation of type of device title in device list object, judges that device typonym is corresponding
Test index selected state；
Step 8: the type of device title in step 4 is saved to component inventory, it is corresponding to save the type of device title
Device library file of the test index information into step 1.
Preferably, the test index includes the electrology characteristic of type of device title.
Preferably, the component inventory and test index library are established according to device simulation or actual test.
Preferably, in the type of device information, the attribute of choosing of test index includes yes/no, attribute be to indicate to use
Family selected the test index, and attribute is that no expression user does not select the test index.
Preferably, the test index further includes the class name for realizing the test index and the class of test index set interface
Name.
Preferably, in the step 7, judge the selection situation of type of device title in device list object, specific steps
Are as follows:
When having selected some type of device title, then the corresponding test index of type of device title is shown.
It is further preferred that referring in the step 7 when selected some corresponding partial test of type of device title
Mark, then be yes by the attribute changes of choosing of the corresponding test index of type of device title.
The beneficial effects of the present invention are:
The present invention increases a component inventory, when user selects a kind of type of device, journey on the basis of test index library
Sequence only lists all test index information involved in the type of device, and user can further customize on this basis and test
Indication information, the selection of user will be saved in the corresponding test index library of type of device by program automatically；When user selects
When a kind of new type of device, program will list the corresponding all test index information of the type of device, after user customizes selection
Also it will be automatically saved in the test index library of new type of device；If user is switched to original type of device, program is certainly
It is dynamic that the option frame that user customized originally is carried and shown, it significantly reduces the work difficulty of user, improve type of device pair
The standardization for the test index information answered.
Detailed description of the invention
Fig. 1 is existing structural schematic diagram；
Fig. 2 is component inventory provided by the invention and index storehouse system assumption diagram；
Fig. 3 is the test and management method specific flow chart provided by the invention based on expansible device detection library；
Fig. 4 is embodiment flow chart provided by the invention.
Specific embodiment
Present invention will be further explained below with reference to the attached drawings and examples.
As shown in Figure 1, existing technical solution is to establish a test index library.When needing to test a certain types of devices
When, test index all in test index library is just listed, user is allowed to select, and the index item that user selects is saved in
In one configuration file, the index item that will be saved in load configurations file when the application is restarted.Prior art
When testing a certain types of devices, need to select institute's test index in need by hand.Although the index item of selection is also saved
Into configuration file, and can be loaded into program when program restarts.
The invention proposes a kind of test and management methods based on expansible device detection library, as shown in Fig. 2, this method is adopted
Architecture includes component inventory and index storehouse, and the component inventory includes type of device information, and type of device storage is all
The corresponding test index list of type of device title, type of device title and the test index choose attribute, the finger
Marking library includes all test indexs, and the test index includes index name, and the index storehouse includes that all type of device are corresponding
Indication information, any indication information include index name, index class name and provide setup measures class name.Different device classes
Type can be directed toward the same indication information in index storehouse simultaneously.
Embodiment:
Index storehouse contains all test indexs, lists partial test index now, as follows:
{ output power, output frequency, modulation output power, gain, noise coefficient, gain compression, conversion loss, pulse
Width, harmonic wave, third order intermodulation, waveform analysis, power consumption, working efficiency }；It include all test index titles in bracket.
Such as: [power consumption] index is for characterizing the power that device consumes at work.
Component inventory contains all type of device supported at present, lists part of devices type now:
{ transceiver, receiver, frequency mixer, attenuator, low noise, isolator }；
All device names are listed in above-mentioned set, and the corresponding test index of any device name is in index storehouse
Several indexs.
Such as: the corresponding test index of device of the entitled low noise of type of device is { [output power], [gain], [humorous
Wave], [power consumption], other index names in index storehouse are nonsensical to low noise, and the purpose of this method is to work as subscriber selector
When part typonym is [low noise], user interface only shows [output power], [gain], [harmonic wave], [power consumption] this four fingers
Mark, other indexs are without display.
Following presentation device library file, file use XML format:
Component inventory successively stores device name, and in following examples, device name is that { output power, output frequency, modulation are defeated
Out power, gain, noise coefficient, gain compression, conversion loss, pulse width, harmonic wave, third order intermodulation, waveform analysis, power consumption,
Working efficiency }.
<ChipCollection>// component inventory
<Chip Name=" low noise ">
<TestParameter Name=" output power " Checked=" true "/>
<TestParameter Name=" gain " Checked=" true "/>
<TestParameter Name=" harmonic wave " Checked=" false "/>
<TestParameter Name=" power consumption " Checked=" true "/>
</Chip>
<Chip Name=" transceiver ">
</Chip>
<Chip Name=" receiver ">
</Chip></ChipCollection>
Following presentation index library file, file use XML format:
Index storehouse successively test index title, in following examples, the entitled low noise of test index, transceiver and reception
The test index of device, transceiver and receiver is unlisted, and the corresponding test index of low noise is [output power], [gain], [humorous
Wave], [power consumption], and the rear of test index show the test index choose attribute, in the example, [output power] chooses category
Property by Checked=" true " indicate, i.e., [output power] choose attribute be it is yes, show to have been selected, [harmonic wave] is chosen
Attribute be it is no, expression do not made selection.
In following index storehouses, SettingClass indicates to realize that the class name of the test index, RunClass indicate that test is surveyed
Try the class name at setup measures interface.
<TestItemCollection>// index storehouse
< TestItem Name=" output power " SettingClass=" SCGL_Setting "
RunClass=" SCGL_Run " >
< TestItem Name=" output frequency " SettingClass=" SCPL_Setting "
RunClass=" SCPL_Run " >
< TestItem Name=" modulation output power " SettingClass=" TZSCGL_Setting "
RunClass=" TZSCGL_Run " >
<TestItem Name=" gain " SettingClass=" ZY_Setting " RunClass=" ZY_Run ">
< TestItem Name=" noise coefficient " SettingClass=" ZSXS_Setting "
RunClass=" ZSXS_Run " >
<TestItem Name=" gain compression " SettingClass=" " RunClass=" ">
<TestItem Name=" conversion loss " SettingClass=" " RunClass=" ">
<TestItem Name=" pulse width " SettingClass=" " RunClass=" ">
<TestItem Name=" harmonic wave " SettingClass=" " RunClass=" ">
<TestItem Name=" third order intermodulation " SettingClass=" " RunClass=" ">
<TestItem Name=" waveform analysis " SettingClass=" " RunClass=" ">
<TestItem Name=" power consumption " SettingClass=" " RunClass=" ">
<TestItem Name=" working efficiency " SettingClass=" " RunClass=" ">
</TestItemCollection>
</Setting>
This method detailed process is as follows:
Step 101, component inventory and index library file are loaded, and is stored as XML format.
Step 102, the test index for first accessing index storehouse, is successively read each test index of index storehouse.User obtains
The information of test index.
Step 103, an index list object is created in memory, for storing the content of all test indexs, successively
The each test index for reading index storehouse constructs index object according to each test index, and is saved in index list object.
Index list object refers to that These parameters library form, concrete mode are to sequentially list test index.
Step 104, the type of device information for accessing component inventory is successively read each type of device title of component inventory.With
Family acquisition device typonym.
Step 105, a device list object is created in memory be successively read device for storing all type of device
Each type of device title in part library constructs device type object according to type of device title, which is saved in device
In part list object.Type of device title is successively stored and saves the type of device title successively stored to device class by user
Type list.
Step 106, be successively read device list object is related to test index, arranges according to test index building index is related to
The reference of corresponding index title in table, and be saved in the corresponding index list of type of device title.Due to type of device title
Corresponding specific test index, user can obtain the corresponding test of type of device title by reading device list of types
Index, and test index is saved into the corresponding index list of the type of device title.
Step 107, judge whether user has selected type of device.Due to type of device titles all in device list object
Corresponding test index rear has indicated the attribute of choosing of test index, and user judges according to the selection attribute.
Step 108, when user has selected certain type of device, then all tested indexs that the type of device is related to are shown
Information.
Step 109, if user once selected the type of device that part has been selected to be related to tested index in the past, by this
Tested index is shown as selected state a bit.Such as: the test index [output power] of low noise choose attribute be it is yes, then to the survey
Examination index shown, test index [harmonic wave] choose attribute be it is no, then follow the steps 110.
Step 110, judge whether user has selected certain test indexs.
Step 111, if user has selected certain test indexs, program will modify in device object phase in index list
That answers index chooses attribute.Test index [harmonic wave] choose attribute be it is no, then it is yes for modifying [harmonic wave] and choosing attribute.
Step 112, judge whether user will save setting.
Step 113, it if to save setting, first has to the title for the type of device that user selects being saved in user configuration
In file, data are saved convenient for being directly loaded into user's last time when next startup program.
Step 114, the test index information preservation of customized each type of device title is then returned into device index
Library file.
This method has the beneficial effect that with four aspects:
(1) component inventory is introduced between user and test index, component inventory is by all type of device structures that can test
At type of device information includes type of device title, the corresponding index list of type of device title and type of device title and refers to
The mapping status of list is marked, which provides a user the more accurate index list of a content and mapping status.
(2) index list and type of device information are all saved in component inventory, and are only saved in user profile
The type of device title that user finally selects customizes the different of data with user after can extending to avoid the indication information of index storehouse
Cause problem.
(3) component inventory and index storehouse are two independent sectors, and the index list that type of device information includes is then to finger
The reference for marking indication information in library not only improves the shared of test index data, and can guarantee each type of device test index letter
The consistency of breath, this mode are convenient for the extension of component inventory: when needing to be added new indication information or the original indication information of modification
When, it is only necessary to test index library part is modified, type of device ensure that the consistency of data to the reference of test index item.
(4) component inventory is saved to an XML file, and XML file is the text file for saving hierarchical data, very easily
In modification, the modification to component inventory can be completed by manual edit content of text.
Above-mentioned, although the foregoing specific embodiments of the present invention is described with reference to the accompanying drawings, not protects model to the present invention
The limitation enclosed, those skilled in the art should understand that, based on the technical solutions of the present invention, those skilled in the art are not
Need to make the creative labor the various modifications or changes that can be made still within protection scope of the present invention.
Claims (7)
1. being based on component inventory and index storehouse, the component inventory includes device based on the test and management method in expansible device detection library
Part type information, and type of device information includes all type of device titles, the corresponding test index list of type of device title
And the attribute whether test index in the test index list is selected, the index storehouse include all test indexs,
The test index includes index name, which comprises the following steps:
Step 1: load component inventory and index library file, component inventory and index storehouse are stored using XML file format；
Step 2: the test index in access index storehouse reads index name；
Step 3: creation index list object stores the index name in step 2 into index list object；
Step 4: the type of device information in access component inventory, reading device typonym；
Step 5: creation device list object stores the type of device title in step 4 into device list object；
Step 6: being successively read the corresponding test index of device list object in step 5, corresponding according to device list object
Test index establishes the reference of the corresponding index name of index list object, and saves to the corresponding test of device list object and refer to
It marks in list；
Step 7: judging the selection situation of type of device title in device list object, judges the corresponding survey of device typonym
Try the selected state of index；
Step 8: the type of device title in step 4 is saved to component inventory, saves the corresponding test of the type of device title
Device library file of the indication information into step 1.
2. the test and management method as described in claim 1 based on expansible device detection library, which is characterized in that the test
Index includes the electrology characteristic of type of device title.
3. the test and management method as described in claim 1 based on expansible device detection library, which is characterized in that the device
Library and test index library are established according to device simulation or actual test.
4. the test and management method as described in claim 1 based on expansible device detection library, which is characterized in that the test
Index further includes the class name for realizing the test index and the class name of test index set interface.
5. the test and management method as described in claim 1 based on expansible device detection library, which is characterized in that the device
In type information, the attribute whether test index is selected includes yes/no, attribute be to indicate that user selected the test
Index, attribute are that no expression user does not select the test index.
6. the test and management method as described in claim 1 based on expansible device detection library, which is characterized in that the step
In seven, the selection situation of type of device title in device list object, specific steps are judged are as follows:
When having selected some type of device title, then the corresponding test index of type of device title is shown.
7. the test and management method as claimed in claim 6 based on expansible device detection library, which is characterized in that the step
In seven, when selected the corresponding partial test index of some type of device title, then by the corresponding survey of type of device title
It is yes for trying the attribute changes of choosing of index.
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