CN105866560A - High-performance antenna far-field measurement darkroom and design method - Google Patents
High-performance antenna far-field measurement darkroom and design method Download PDFInfo
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- 238000005259 measurement Methods 0.000 title claims abstract description 38
- 238000013461 design Methods 0.000 title claims abstract description 15
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000011358 absorbing material Substances 0.000 claims abstract description 30
- 239000013598 vector Substances 0.000 claims abstract description 10
- 230000003068 static effect Effects 0.000 abstract 3
- 238000002310 reflectometry Methods 0.000 description 23
- 239000000463 material Substances 0.000 description 8
- 241000209094 Oryza Species 0.000 description 3
- 235000007164 Oryza sativa Nutrition 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 235000009566 rice Nutrition 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 230000001143 conditioned effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- XOFYZVNMUHMLCC-ZPOLXVRWSA-N prednisone Chemical compound O=C1C=C[C@]2(C)[C@H]3C(=O)C[C@](C)([C@@](CC4)(O)C(=O)CO)[C@@H]4[C@@H]3CCC2=C1 XOFYZVNMUHMLCC-ZPOLXVRWSA-N 0.000 description 2
- 230000011514 reflex Effects 0.000 description 2
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- 238000012360 testing method Methods 0.000 description 2
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- 101000931114 Rattus norvegicus Glucose-6-phosphate isomerase Proteins 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052934 alunite Inorganic materials 0.000 description 1
- 239000010424 alunite Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005388 cross polarization Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
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- 230000007613 environmental effect Effects 0.000 description 1
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- 239000003205 fragrance Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- KPZTWMNLAFDTGF-UHFFFAOYSA-D trialuminum;potassium;hexahydroxide;disulfate Chemical compound [OH-].[OH-].[OH-].[OH-].[OH-].[OH-].[Al+3].[Al+3].[Al+3].[K+].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O KPZTWMNLAFDTGF-UHFFFAOYSA-D 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
- G01R29/105—Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
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Abstract
The invention belongs to the field of antenna darkroom measurement and particularly relates to a high-performance antenna far-field measurement darkroom and a design method. In the high-performance antenna far-field measurement darkroom, a wave-absorbing material in a Fresnel zone is arranged in a wavy and gradual changing mode so that electric waves transmitted by a source antenna can be diffusely scattered in the Fresnel zone, meanwhile the path difference of different paths of scattered waves entering a static zone is lambda/2, and vectors of different paths of scattered waves are offset. By the adoption of the measurement darkroom, the static zone performance can be effectively improved, and the static zone performance of the darkroom can be improved to be about 15dB through vector offset.
Description
Technical field
The invention belongs to antenna darkroom fields of measurement, be specifically related to a kind of high performance antenna far-field measurement darkroom and method for designing, its
It is characterised by the concrete form that in Far-Field antennas measurement system darkroom, absorbing material is installed, makes darkroom measure environment and reach high performance purpose.
Background technology
The development of current science and technology is more and more higher to the performance requirement of antenna, and Antenna Design and antenna measurement are antenna performance research
Two importances, they complement each other, and influence each other, mutually restrict.Antenna measurement can be divided into far field and near field measurement, nothing
Which kind of measurement main purpose of opinion is to obtain Antenna Far Field radiation characteristic.Gain and minor level in Antenna Far Field radiation characteristic
(containing front and back than) be key index (Liu Anbang Zhang Yuqiao etc. " improve antenna gain stated accuracy technique study and error evaluation ",
Microwave journal, in June, 2012).Affect during Far-Field antennas measurement system antenna gain and minor level (containing front and back than) measurement error
In item factor, darkroom quiet zone performance is principal element, and its relation is the most as follows:
Relation between gain measurement precision and quiet zone reflectivity level: microwave dark room ensures that when antenna gain is measured, other factors does not considers
Time antenna gain measurement error mainly produced by space standing wave, maximum gain measurement error Δ GmaxDB is:
ΔGmaxDB=20lg (1 ± 10(Γ/20))
In formula, Γ is quiet zone reflectivity level.
Be can be calculated by above formula: between gain measurement precision and quiet zone reflectivity level, relation is:
| Certainty of measurement (dB) | 1.0 | 0.5 | 0.25 | 0.15 | 0.1 |
| Γ demand (dB) | -20 | -25 | -30 | -35 | -40 |
Relation between minor level certainty of measurement and quiet zone reflectivity level: when carrying out antenna pattern measurement in microwave dark room, by ring
Pattern measurement error delta E (dB) that border is caused is:
Δ E (dB)=20lg (1 ± 10((Γ-A)/20))
In formula, Γ is quiet zone reflectivity level, and A is antenna radiation pattern minor level.
Be can be calculated by above formula: between 12dB secondary lobe directional diagram measurement error and quiet zone reflectivity level, relation is:
| Γ(dB) | -30 | -35 | -40 | -45 | -50 |
| Measurement error (dB) | ±1.1 | ±0.6 | ±0.35 | ±0.20 | ±0.11 |
Therefore, being necessary for building high performance far field antenna measurement microwave dark room to improve Far-Field antennas measurement system precision, design is built
Make the foundation engineering that high performance microwave darkroom is antenna measurement, needed for being the reality improving antenna measurement precision.
The electrical property of microwave dark room is mainly characterized by the characteristic in dead zone, and the characteristic in dead zone is again with size, the dead zone reflection electricity in dead zone
The parameters such as flat, cross polarization degree, field uniformity, multipath loss and operating frequency range are stated.
Minimum region is disturbed by various stray waves in referring to darkroom in so-called dead zone.Its size except with darkroom geometry, work
Outside the Pass working frequency, the electrical property of absorbing material have, the also structure with required reflectance level, the shape in dead zone and darkroom has
Close.Quiet zone reflectivity level, can describe with following formula:
Wherein: EDFor direct wave in-field, darkroom；ERFor by reflection, diffraction and the equivalent reflective field being scattered in measurement point synthesis.
The core index of microwave dark room electrical property is quiet zone reflectivity level, and other index is all the most relevant with quiet zone reflectivity level,
Quiet zone reflectivity level size is relevant with the gain of darkroom designing technique, darkroom layout, absorbing material performance and source antenna, but totally
For, lowest operating frequency quiet zone reflectivity level is most difficult to reach requirement.The environmental disturbances of antenna measurement mainly by darkroom body of wall,
The scattering of turntable, source antenna support, tested products support etc. and source antenna leakage cause.Turntable and tested products support, make
Special suction ripple process eliminate its scattering impact (this east of Yang Wen unicorn Liu. the low frequency 3 D electromagnetic of the microwave dark room performance " analyze ", electric
Magnetic disturbance and compatibility, in January, 2009).Source antenna leakage is solved by the absorbing material being laid on rear wall.Body of wall is darkroom
Main body, by laying suitable absorbing material and rational material layout, can make the scattering of body of wall be reduced to the scope allowed.
The calculating thinking of quiet zone reflectivity level is: application geometric optical theory, sets microwave absorbing material performance simulation function and (inhales
Receive performance to change with angle of incidence) and source antenna directivity analog function (being fitted for foundation with the transmitting antenna parameter provided),
Calculate darkroom each wall reflective level worst performance that homophase is added in dead zone, then obtain dead zone reflection according to homophase superposition probability
Level distribution.
The reflection interference of darkroom ceiling, ground and side wall is with geometrical relationship between direct wave in dead zone as shown in Figure 1；Wherein
D=B-γ
In formula, L (rice) is that spacing received and dispatched by antenna, and B is the height (or wide) in (rice) darkroom, and γ is (rice) ceiling and ground suction
Wave material equivalent reflective face thickness sum.
Quiet zone reflectivity level under darkroom ceiling, ground and side wall conditioned reflex is:
Γi(Qzreflectivity)=Ratφ+Gatθ+20Lgcosθ
In formula, Rat φ is metope absorbing material reflection loss (with measured data as foundation), and Gat θ is source antenna directivity factor.
Quiet zone reflectivity level under the main wall conditioned reflex of darkroom should be better than: Γ j (Qzreflectivity)=R
In formula, R is main wall absorbing material reflection loss.
Darkroom quiet zone reflectivity level is:
From above-mentioned discussion, after darkroom bulk and source antenna are selected, the quality of darkroom quiet zone performance depends on inhaling ripple material
The absorbing property of material, Theoretical Calculation and engineering practice show: during the 1GHz frequency range of conventional rectangular darkroom, quiet zone reflectivity level is only capable of reaching
-40dB (Li Gaosheng Liu Ji is refined. " research of microwave dark room design principle and application ", electric wave science journal, in October, 2004),
When quiet zone reflectivity level is reached-45dB by-40dB, the error caused by darkroom interference measured by antenna gain becomes in a small amount, right
When-12dB antenna side lobe is measured by the error that causes of darkroom interference by ± 0.35dB be reduced to ± 0.20dB improves 43%, therefore,
Build the unremitting pursuit that high performance antenna far-field measurement darkroom is people.
At present, microwave dark room design calculates and mostly uses electric wave geometric optics and geometric theory of diffraction, and both of which belongs to ray theory,
The former is mainly used in the calculating of mirror area echo, and the latter mainly calculates the diffracted wave that object edge produces.Disappear when using some measures
After the impact on dead zone of the direct reflection ripple, the diffracted wave the to be considered impact on dead zone.The effect of diffracted wave is thoroughly to disappear
Remove, measure can only be used as far as possible to reduce.Owing to echo is known and controlled, and diffracted wave is unknown and uncontrollable.
Therefore, darkroom design should avoid the generation of diffracted wave as far as possible.
Known by electric wave geometric theory of diffraction: microwave dark room ceiling, ground and both walls reflecting surface are all ellipsoids, elliptical reflecting face length
Semiaxis aNWith semi-minor axis bNBeing the function of frequency, antenna transmitting-receiving spacing, darkroom size and geometrical relationship etc., space geometry relation is fixed
Justice is as in figure 2 it is shown, in figure
2aN=R × F1×(1+F2 2-2×F3)0.5
2bN=R × ((F1 2-1)×(1+F2 2-2×F3))0.5
Ψ=tg-1(HA+HT)/R
F1=(N × λ)/(2 × R)+Sec Ψ
F2=(HT 2-HA 2)/[(F1 2-1)×R2]
F3=(HT 2+HA 2)/[(F1 2-1)×R2]
R antenna transmitting-receiving spacing, unit m in formula；
Ψ reflected ray with the angle between reflecting surface, unit (O)；
λ electric wave wavelength, unit m；
HALaunch antenna to reflecting surface distance, unit m；
HTReception antenna is to reflecting surface distance, unit m；
N Fresnel-zone number, takes natural number.
Elliptic reflecting surface major semiaxis a can be calculated by darkroom physical dimensionNWith semi-minor axis bN, this face is the main anti-of this metope electric wave
Penetrate region.Echo processes the whether proper key being darkroom and designing success or failure herein.
Darkroom absorbing material absorbing property is the basis that darkroom quiet zone performance index realizes, and the absorbing property of pyramid type absorbing material takes
Certainly in parameter D/ λ, wherein D is the height of pyramid type absorbing material, and λ is wavelength.Absorbing material test curve shows, D/ λ
The biggest, absorbing property is the best.Additionally, Radio wave incident angle also has significant impact to the performance of absorbing material.Absorbing material test song
Line is it is also shown that angle of incidence is the biggest, and absorbing property is the poorest, and especially after angle of incidence is more than 60 °, performance drastically declines.Angle
Cone absorbing material absorbing property is the function of absorbing material electrical height and Radio wave incident angle.Its basic law is as shown in Figure 3, Figure 4.
Side, rectangle darkroom Radio wave incident angle is generally no greater than 60 °, and now 1000mm height pyramid absorbing material absorbing property is at 1GHz
Time less than-30dB.In low-frequency range 1GHz, absorbing material absorbing property does not ensures darkroom quiet degree requirement, and high at more than 2GHz
Frequency range, absorbing material thickness increases by more than 1 times, and absorbing property strengthens；Antenna directivity strengthens simultaneously, thus can ensure darkroom
Quiet zone performance requirement.So darkroom design ensures that after selected absorbing material kind low-frequency range absorbing property is key point.
Summary of the invention
Do not ensure, in low-frequency range, the problem that the quiet degree in darkroom requires in order to solve existing pyramid absorbing material, the invention provides one
Plant high performance antenna far-field measurement darkroom and method for designing；Darkroom quiet zone performance requirement can be ensured in low-frequency range, efficiently solve
The problem that prior art exists.
In the present invention, darkroom mentality of designing is that Fresnel region direct reflection is changed into many point scattering, makes Fresnel region by design
Absorbing material undaform gradual change is laid, and allowing the different paths scattered wave wave path-difference entering dead zone is λ/2, makes the scattering in different path
Wave vector offsets, thus reaches to promote quiet zone performance purpose.
High performance antenna far-field measurement darkroom of the present invention method for designing, is to make Fresnel region inhale ripple by design in darkroom
Material undaform gradual change is laid, and the electric wave making source antenna launch forms diffusing scattering at Fresnel region, meanwhile, allows entrance dead zone not
It is λ/2 with path scattered wave wave path-difference, makes the scattered wave vector cancellation in different path.
The present invention also provides a kind of high performance antenna far-field measurement darkroom designed by said method simultaneously, in luxuriant and rich with fragrance alunite in this darkroom
The absorbing material in your district is that undaform gradual change is laid, and the electric wave making source antenna launch forms diffusing scattering at Fresnel region, allows meanwhile
The different paths scattered wave wave path-difference entering dead zone is λ/2, makes the scattered wave vector cancellation in different path.
From geometric optical theory, the electric wave that source antenna is launched through secondary and the above energy in dead zone that is reflected into thereof relative to one
Secondary reflection belongs in a small amount, and its impact is not considered.Mainly considering primary event, the electric wave that source antenna A launches is through Fresnel region once
Be reflected into dead zone point B path as it is shown in figure 5,1. number electric wave path identical with 3. number electric wave path wave-path.Ripple material inhaled by pyramid
1. number material can be equivalent to flat board Multilayer Microwave Absorption Materials, is laid by design absorbing material waveform gradual change, just makes and 3. number wave paths
Footpath is λ/2 with a 2. number wave path wave path-difference, and scattered wave is vector cancellation in dead zone, thus promotes quiet zone performance.Through Theoretical Calculation,
Darkroom quiet zone performance about 15dB can be promoted by vector cancellation.
Accompanying drawing explanation
Fig. 1 is the darkroom geometrical relationship needed for quiet zone reflectivity level calculates.
Fig. 2 is the geometric parameter of Fresnel-zone.
The absorbing property of absorbing material when Fig. 3 is vertical incidence.
Fig. 4 is the absorbing property of different incidence angles absorbing material.
Fig. 5 is high performance antenna far-field measurement darkroom absorbing material placement model.
Detailed description of the invention
Embodiment one:
As it is shown in figure 5, design principle is as follows:
1.1 2aNCalculating
2aN=R × F1×(1+F22-2×F3)0.5
2bN=R × ((F1 2-1)×(1+F2 2-2×F3))0.5
Ψ=tg-1(HA+HT)/R
F1=(N × λ)/(2 × R)+Sec Ψ
F2=(HT 2-HA 2)/[(F1 2-1)×R2]
F3=(HT 2+HA 2)/[(F1 2-1)×R2]
R antenna transmitting-receiving spacing, unit m in formula
Ψ reflected ray is with the angle between reflecting surface, unit (°)
λ electric wave wavelength, unit m
HALaunch antenna to reflecting surface distance, unit m
HTReception antenna is to reflecting surface distance, unit m
N Fresnel-zone number, takes natural number
Taken 3 (value is typically no less than 3, is the common knowledge of this area) by darkroom physical dimension Fresnel-zone number, can calculate
Obtain elliptic reflecting surface major semiaxis aNWith semi-minor axis bN, this face is the key reflections region of this metope electric wave.For ensureing that not same polarization is many
The uniformity of path loss, Fresnel region major axis takes 2aN(CE in Fig. 5, D are the midpoint of CE).
The calculating of 1.2H
Mainly considering primary event, the electric wave that source antenna A launches enters dead zone point B path such as figure through Ferned Area primary event
Shown in 5,1. number electric wave path is identical with 3. number electric wave path wave-path.The value of H 1. number just make and 3. number wave path with 2. number
λ/2 of frequency centered by wave path wave path-difference, echo is vector cancellation in dead zone, thus promotes quiet zone performance.
Case: certain darkroom shield size: 37.8m (length) × 18.4m (wide) × 17.7m (high), darkroom use frequency be 0.69GHz～
6GHz, 2aN=9m, H=0.72m.
Performance comparison:
| Frequency | 0.7GHz | 1.7GHz | 3GHz | 6GHz |
| Quiet zone reflectivity level (untreated) | -29.6dB | -40.6dB | -50.1dB | -50.9dB |
| Quiet zone reflectivity level (double wave wave of the present invention process) | -44.3dB | -48.2dB | -50.9dB | -51.3dB |
Use said method and the microwave dark room of Measure Design, certain darkroom engineering obtains successful Application, darkroom quiet zone reflectivity level
Reach-46dB@0.79GHz～0.96GHz, it is achieved that predetermined design object.This microwave dark room method for designing and thinking are to " high
Efficiency-cost ratio " design-build of microwave dark room has good reference and directiveness.
Claims (2)
1. a high performance antenna far-field measurement darkroom, it is characterised in that in this darkroom, the absorbing material at Fresnel region is ripple
Wave type gradual change lay, the electric wave making source antenna launch forms diffusing scattering at Fresnel region, meanwhile, allow entrance dead zone different paths
Scattered wave wave path-difference is λ/2, makes the scattered wave vector cancellation in different path.
2. a high performance antenna far-field measurement darkroom method for designing, it is characterised in that make Fresnel by design in darkroom
District's absorbing material undaform gradual change is laid, and the electric wave making source antenna launch forms diffusing scattering at Fresnel region, meanwhile, makes entrance quiet
The different paths scattered wave wave path-difference in district is λ/2, makes the scattered wave vector cancellation in different path.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405256A (en) * | 2016-08-26 | 2017-02-15 | 西安空间无线电技术研究所 | Plane near field darkroom scattering test and compensation method |
| CN106597129A (en) * | 2017-01-12 | 2017-04-26 | 深圳市通用测试系统有限公司 | Microwave anechoic chamber |
| CN106841825A (en) * | 2017-01-03 | 2017-06-13 | 北京环境特性研究所 | A kind of near field antenna beam steering system based on suction ripple cavity configuration |
| CN113030597A (en) * | 2019-12-24 | 2021-06-25 | 川升股份有限公司 | Antenna measurement system integrating far field and shrinking distance field |
| CN117990994A (en) * | 2024-01-24 | 2024-05-07 | 南京航空航天大学 | Large-size dead zone forming system, large-size target indoor RCS high-precision testing system based on system and testing method |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405256A (en) * | 2016-08-26 | 2017-02-15 | 西安空间无线电技术研究所 | Plane near field darkroom scattering test and compensation method |
| CN106405256B (en) * | 2016-08-26 | 2019-02-19 | 西安空间无线电技术研究所 | A test and compensation method for planar near-field darkroom scattering |
| CN106841825A (en) * | 2017-01-03 | 2017-06-13 | 北京环境特性研究所 | A kind of near field antenna beam steering system based on suction ripple cavity configuration |
| CN106841825B (en) * | 2017-01-03 | 2020-08-04 | 北京环境特性研究所 | Near-field antenna beam control system based on wave-absorbing cavity structure |
| CN106597129A (en) * | 2017-01-12 | 2017-04-26 | 深圳市通用测试系统有限公司 | Microwave anechoic chamber |
| CN106597129B (en) * | 2017-01-12 | 2024-02-02 | 深圳市通用测试系统有限公司 | Microwave darkroom |
| CN113030597A (en) * | 2019-12-24 | 2021-06-25 | 川升股份有限公司 | Antenna measurement system integrating far field and shrinking distance field |
| CN113030597B (en) * | 2019-12-24 | 2024-05-17 | 川升股份有限公司 | Antenna measurement system integrating far field and reduced range field |
| CN117990994A (en) * | 2024-01-24 | 2024-05-07 | 南京航空航天大学 | Large-size dead zone forming system, large-size target indoor RCS high-precision testing system based on system and testing method |
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| CN105866560B (en) | 2019-04-16 |
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Effective date of registration: 20190515 Address after: 210000 No. 2 Jingshan Village, Yaxi Town, Gaochun District, Nanjing City, Jiangsu Province Patentee after: Nanjing bright Electronics Co., Ltd. Address before: Room 702, 23 Building, 49 Bancang Street, Xuanwu District, Nanjing City, Jiangsu Province, 210000 Patentee before: Liu Bendong |