CN105823990A - Analog load for testing SOC power source - Google Patents
Analog load for testing SOC power source Download PDFInfo
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- CN105823990A CN105823990A CN201510000928.4A CN201510000928A CN105823990A CN 105823990 A CN105823990 A CN 105823990A CN 201510000928 A CN201510000928 A CN 201510000928A CN 105823990 A CN105823990 A CN 105823990A
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Abstract
The invention discloses an analog load for testing an SOC power source, comprising a current adjustment unit, a delay adjustment unit, and a control module. The extracted current input of the current adjustment unit is connected with the positive electrode of an analog power source, and the current output of the current adjustment unit is connected with the negative electrode of the analog power source. The current control input of the current adjustment unit is connected with the current control output of the control module, and the delay control input of the current adjustment unit is connected with the delay control output of the control module through the delay adjustment unit. Under control of the control module, the current adjustment unit simulates the working current of a simulated load. The power output end of a power source to be tested outputs extracted current to be tested, and the performance of the power source to be tested is tested through a power source test device. The control module makes the extracted current input by the current adjustment unit change linearly through the delay adjustment unit. The analog load can simulate various changes of an SOC load, and realize analog test of the transient and DC load currents of an SOC power source.
Description
Technical field
The present invention relates to the simulation test field of SOC power supply, particularly relate to a kind of fictitious load for testing SOC power supply.
Background technology
Along with the increasingly prosperity of IC design industry, integrated circuit structure becomes increasingly complex, and SOC(system on a chip) (SOC) gets more and more, and accordingly, the requirement to SOC power supply is also more and more higher；More and more higher to the performance requirement of power-supply management system, its power detecting system also becomes increasingly complex.
When the moment of load absorption electric current generation saltus step, the output voltage of power-supply management system moment can deviate setting value and it needs to after certain time, can be only achieved stable output state.This time period is normally referred to as the load transient recovery time of power supply, or transient response time, sign: when load current generation transient changing when, the time that supply voltage is required in returning to set point.If voltage transient responding ability is poor, transient response time is longer, causes power source internal element undercharge/charging excess, and output voltage falls/and overshoot time is long, amplitude is excessive, and output voltage deviates significantly from desired value.The load that desired value in inaccuracy or deviation electric power output voltage can cause power supply driving is broken down or possibly even damages, particularly when load includes sensitive circuit, fast-changing device, such as microprocessor, radio-frequency devices etc..
Therefore, the parameter such as output voltage precision, load regulation is the important performance indexes of power-supply management system, can be evaluated the quality of this power-supply management system by the output voltage precision of detection power-supply management system.
But, the current fictitious load employed in power supply test is only capable of the size of fictitious load electric current, can not realize the transient changing time of fictitious load electric current is controlled, rising time when can not control fictitious load curent change and trailing edge time, it is impossible to test out the transient response performance of tested power supply exactly.
Summary of the invention
It is an object of the invention to overcome the deficiencies in the prior art, a kind of fictitious load for testing SOC power supply is provided, this fictitious load controls the size of extraction current value by current adjustment unit, rising time during extraction curent change and trailing edge time is controlled by time delay adjustment unit, the various changes of SOC load can be simulated, the transient changing electric current to SOC power supply and the simulation test of DC load current can be realized, simultaneously, also make the structure using the power detecting system of fictitious load of the present invention simpler, test function is more easily implemented, test result is more accurate.
It is an object of the invention to be achieved through the following technical solutions: a kind of fictitious load for testing SOC power supply, it includes current adjustment unit, time delay adjustment unit and control module, and described control module includes current control module, delays time to control module and data processing module.
The extraction current input terminal of described current adjustment unit is connected with analog power positive pole, the current output terminal of current adjustment unit with dock, the electric current of current adjustment unit is controlled input and is connected with the current controling end of data processing module by current control module, and the delays time to control input of current adjustment unit passes sequentially through time delay adjustment unit and delays time to control module and is connected with the delays time to control end of data processing module.
The data processing module external control data to receiving carries out dissection process, extract the current controling signal in this external control data and delay control signal, and current controling signal is sent to current control module, current control module controls current adjustment unit simulation according to this current controling signal and exports a certain size electric current so that the extraction electric current exported from the power output end of power supply to be measured is identical with the working current value being modeled load.
Delay control signal is sent to delays time to control module by data processing module, delays time to control module controls the delay state of time delay adjustment unit according to this delay control signal so that the extraction electric current that the extraction current input terminal of current adjustment unit is inputted linearly changes.
Described current adjustment unit includes N+M matrix current adjustment circuit parallel with one another, described each matrix current adjustment circuit all includes current draw module and switch module, the input of current draw module is connected with analog power positive pole, the outfan of current draw module is connected with the input of switch module, the outfan of switch module with dock, the control end of switch module is connected with current control module by the first bus.
Described current draw module includes DC current source.
Described switch module includes switching metal-oxide-semiconductor, and the source electrode of switch metal-oxide-semiconductor is connected with the outfan of current draw module, and the drain electrode of switch metal-oxide-semiconductor is connected with fictitious load power cathode, and the grid of switch metal-oxide-semiconductor is connected with current control module by the first bus.
Described time delay adjustment unit includes M time delay module, the input of described each time delay module all connects with the outfan of corresponding current draw module, the outfan of each time delay module all connects with the control end of corresponding switch module, and the control end of each time delay module is all connected with delays time to control module by the second bus.
Described time delay module includes delay capacitor.
Described control module also includes that transient state makes energy control module and clock signal receiver module.
Described transient state makes the input of energy control module enable control port by transient state and receives transient control signal, and transient state makes the outfan of energy control module be connected with the transient state enable input of data processing module.
The input of described clock signal receiver module receives clock signal by clock signal receiving port, and the outfan of clock signal receiver module is connected with the clock signal input terminal of data processing module.
After data processing module receives transient control signal, the extraction electric current that control current adjustment unit is inputted dynamically changes with the clock signal received by clock signal receiving module.
The power output end of described power supply to be measured is also connected with the test input of power supply testing device, is tested extraction electric current by power supply testing device.
Described power supply testing device includes oscillograph.
The invention has the beneficial effects as follows:
1) present invention controls the size of extraction current value by current adjustment unit, rising time during extraction curent change and trailing edge time is controlled by time delay adjustment unit, the various changes of SOC load can be simulated, the transient changing electric current to SOC power supply and the simulation test of DC load current can be realized, meanwhile, also make that the structure using the power detecting system of fictitious load of the present invention is simpler, test function is more easily implemented, test result is more accurate.
2) present invention is the highest to the control of extraction electric current, the rapid dynamic response speed of extraction electric current, and its response time can regulate and control.
3) the topmost feature of the present invention is, two kinds of methods such as delay control method and current control method can be passed through, control the time delay size of extraction curent change, the change extracting electric current is linearly changed, realize in the curent change curve to extraction electric current, to rising time and the control of trailing edge time, thus realize tested power supply is carried out the test of different stage, can accurately detect the transient response performance of tested power supply.
Accompanying drawing explanation
Fig. 1 is the ultimate principle block diagram of a kind of fictitious load for testing SOC power supply of the present invention；
Fig. 2 is the system principle diagram of a kind of fictitious load for testing SOC power supply of the present invention；
Fig. 3 is the current curve schematic diagram extracting electric current in the present invention.
Detailed description of the invention
Technical scheme is described in further detail below in conjunction with the accompanying drawings, but protection scope of the present invention is not limited to the following stated.
As it is shown in figure 1, a kind of fictitious load for testing SOC power supply, it includes current adjustment unit, time delay adjustment unit and control module, and described control module includes current control module, delays time to control module and data processing module.
The extraction current input terminal of described current adjustment unit is connected with analog power positive pole, the current output terminal of current adjustment unit with dock, can be connected to analog power negative pole, the electric current of current adjustment unit is controlled input and is connected with the current controling end of data processing module by current control module, and the delays time to control input of current adjustment unit passes sequentially through time delay adjustment unit and delays time to control module and is connected with the delays time to control end of data processing module.
The data processing module external control data to receiving carries out dissection process, extract the current controling signal in this external control data and delay control signal, and current controling signal is sent to current control module, current control module controls current adjustment unit simulation according to this current controling signal and exports a certain size electric current so that the extraction electric current exported from the power output end of power supply to be measured is identical with the working current value being modeled load.
Delay control signal is sent to delays time to control module by data processing module, delays time to control module controls the delay state of time delay adjustment unit according to this delay control signal, control rising time and the trailing edge time of the extraction electric current that current adjustment unit is inputted so that the extraction electric current that current adjustment unit is inputted linearly changes.
Rising time may be defined as current-responsive curve and may be defined as current-responsive curve and drop to the time needed for steady-state value 10% from the 10% of the steady-state value time rising to needed for steady-state value 90%, trailing edge time from the 90% of steady-state value.
Described current adjustment unit includes N+M matrix current adjustment circuit parallel with one another, described each matrix current adjustment circuit all includes current draw module and switch module, the input of current draw module is connected with analog power positive pole, the outfan of current draw module is connected with the input of switch module, the outfan of switch module with dock, can be connected to analog power negative pole, the control end of switch module is connected with current control module by the first bus.
Described current draw module is the current source circuit that output electric current can change within the specific limits, as can be selected for exporting the DC current source that electric current can change within the specific limits, it is possible to use other to have the current circuit of this DC current source function.
The output electric current of heretofore described current draw module can change within the specific limits, and not output electric current is invariable constant current abstraction module.Due to the output current-variable of current draw module, thus could realize when extracting curent change, can control to extract rising time and the trailing edge time of curent change, to change the fictitious load of the present invention measuring accuracy to tested power supply.
Described switch module can use switch metal-oxide-semiconductor, it is also possible to other any switches realizing this identical function.The source electrode of switch metal-oxide-semiconductor is connected with the outfan of current draw module, and the drain electrode of switch metal-oxide-semiconductor is connected with fictitious load power cathode, and the grid of switch metal-oxide-semiconductor is connected with current control module by the first bus.
Described time delay adjustment unit includes M time delay module, the input of described each time delay module all connects with the outfan of corresponding current draw module, the outfan of each time delay module all connects with the control end of corresponding switch module, and the control end of each time delay module is all connected with delays time to control module by the second bus.
Described time delay module can use delay capacitor circuit to realize the time experienced when extraction curent change is increased or decreased, and certainly may be used without any module with this delay function.
Described control module also includes that transient state makes energy control module and clock signal receiver module.
Described transient state makes the input of energy control module enable control port by transient state and receives transient control signal, and transient state makes the outfan of energy control module be connected with the transient state enable input of data processing module.
The input of described clock signal receiver module receives clock signal by clock signal receiving port, and the outfan of clock signal receiver module is connected with the clock signal input terminal of data processing module.
After data processing module receives transient control signal, the extraction electric current that control current adjustment unit is inputted dynamically changes with the clock signal received by clock signal receiving module.
The present invention is additionally provided with the I for transmitting control data2C module, I2The data output end of C module is connected with the data input pin of data processing module, I2The data input pin of C module is connected with data receiver port, I2The clock signal input terminal of C module is connected with clock signal receiving port.I2C module realizes being converted to serial data parallel port data.
The power output end of described power supply to be measured is also connected with the test input of power supply testing device, is tested extraction electric current by power supply testing device.
Described power supply testing device can be selected for oscillograph, it is possible to uses other power detecting instrument, described power supply to be measured to include the power-supply management system in SOC(system on a chip) SOC.
Whether the present invention can meet the standard of regulation by the electric current that the power-supply management system that oscillograph detects in SOC(system on a chip) SOC is exported.Fictitious load can simulate the various load devices that SOC power-supply management system is connected, and the various changes of electric current needed for simulating this device.By fictitious load after power supply to be measured extracts extraction electric current to be tested, oscillograph can be used to observe, record the parameter of this extraction electric current, and it is compared with expected value, calculate the error of extraction electric current, draw this most standard compliant conclusion of SOC power-supply management system.
The basic functional principle of the present invention is: control module is according to the external control signal received, control the break-make of current adjustment unit breaker in middle array, current adjustment unit output is made to meet the working current value of simulated load, the extraction electric current I to be tested i.e. exported from the power output end of power supply to be measuredOUTEqual to being modeled the operating current I needed for load, then power supply testing device such as oscillograph is used to detect this extraction electric current IOUT, and analyze further this power supply to be measured output electric current whether reach standard.
The present invention can simulate the various changes of SOC power source loads, can realize the transient state to SOC power supply and the simulation test of DC load current.
1) DC load of SOC power supply is simulated
If the operating current needed for being modeled load is DC current I1, external equipment the most only need to be used to send the control signal of analog DC load, it is low level signal that transient state enables signal, and this control signal includes current controling signal and delay control signal.The switch arrays that control module controls in current adjustment unit according to current controling signal carry out selectivity conducting so that the extraction electric current to be tested extracted from the power output end of power supply to be measured is identical with the working current value being modeled load, i.e. extraction electric current IOUTEqual to this working direct current I1。
2) the transient response load of simulation SOC power supply
If the electric current I that the operating current being modeled load is dynamically change2, then needing to use external equipment to send transient state and enable signal and control signal, this control signal includes current controling signal and delay control signal.It is high level signal that transient state enables signal, and control module controls the extraction electric current I that current adjustment unit is inputtedOUTDynamically change with the change of the clock signal received by clock signal receiving module；Control module controls current adjustment unit simulation according to current controling signal and exports a certain size electric current so that the extraction electric current I extracted from the power output end of power supply to be measuredOUTWith the operating current I being modeled load2Identical；And according to the delay state of delay control signal control time delay adjustment unit, control the extraction electric current I that current adjustment unit is inputtedOUTLinearly change, also control rising time and trailing edge time lengthening in extraction curent change curve or shorten.The performance of power supply to be measured can be tested by changing rising time and the trailing edge time of extraction current curve.
Clock signal received by control module keeps consistent with the clock signal of the operating current being modeled load.
As in figure 2 it is shown, described switch module uses switch metal-oxide-semiconductor, described time delay module uses delay capacitor.
Described current adjustment unit includes 1～N+M current source, i.e. current source I1, current source I2..., current source IN, current source IN+1, current source IN+2..., current source IN+M, wherein, N >=1, M >=1.Described current source is the current module that output electric current can change within the specific limits.
Described current adjustment unit include 1～N+M switch metal-oxide-semiconductor, i.e. switch metal-oxide-semiconductor M1, switch metal-oxide-semiconductor M2..., switch metal-oxide-semiconductor MN, switch metal-oxide-semiconductor MN+1..., switch metal-oxide-semiconductor MN+M。
1～N+M current source I1～IN+MInput be all connected with analog power positive pole, 1～N+M current source I1～IN+MOutfan respectively with 1～N+M switch metal-oxide-semiconductor M1～MN+MSource electrode connect, 1～N+M switch metal-oxide-semiconductor M1～MN+MDrain electrode all with dock, or be connected with fictitious load power cathode, 1～N+M switch metal-oxide-semiconductor M1～MN+MGrid be all connected with the electric current control output end mouth of control module by the first bus.
Described time delay adjustment unit includes 1～M delay capacitor, i.e. delay capacitor C1, delay capacitor C2..., delay capacitor CM。
1～M delay capacitor C1～CMIt is connected in parallel on the N+1～N+M switch metal-oxide-semiconductor M respectivelyN+1～MN+MSource electrode and the two ends of drain electrode, delay capacitor C1～CMControl end be all connected with the delays time to control output port of control module by the second bus.
Wherein, 1 to n-th current source I1～INFor controlling the minimum extraction current value size of fictitious load of the present invention, N+1 to m-th current source IN+1～IMFor controlling the maximum extraction current value size of fictitious load of the present invention, 1 to m-th delay capacitor C1～CMFor controlling the duration that the extraction current value of fictitious load of the present invention is changed to experience required for maximum by minima.
Such as, current source I is controlled1～INTotal extraction electric current be 1mA, control current source IN+1～IMTotal extraction electric current be 499mA so that the extraction electric current of fictitious load is changed to maximum 500mA by minima 1mA.Control delay capacitor C1～CMThe rising time making this curent change process is 30 μ s.Oscillograph and fictitious load are connected on tested power supply, start tested power supply is carried out performance test, the output voltage waveform of the tested power supply of oscilloscope display, if the error of this voltage oscillogram and expectation oscillogram is in allowed band, then the performance conformance with standard regulation of this tested power supply.
If the rising time that extraction electric current is changed to 500mA by 1mA is set to 10 μ s, again this tested power supply is carried out performance test, if the voltage oscillogram on oscillograph is bigger with the error of expectation oscillogram, beyond the limits of error, then this tested power supply transient response time be more than 10 μ s, its power source performance and do not meet higher level standard regulation.
As it is shown on figure 3, described delay capacitor can use tunable capacitor, controlled the current curve of its corresponding switch metal-oxide-semiconductor by tunable capacitor, control the rising time T in this current curveriseWith trailing edge time Tfall.By adjusting the capacitance of different delayed time electric capacity so that the rising time T of different switch metal-oxide-semiconductorsriseWith trailing edge time TfallThe most consistent, thus more accurate analog current be can be combined out.
When the capacitance that delays time to control module controls tunable capacitor increases, the rising time T of its corresponding switch metal-oxide-semiconductorriseDuration increase, its trailing edge time TfallCorresponding prolongation so that electric current climbing time and the fall time of switch metal-oxide-semiconductor output increase, thus extract electric current IOUTCan the most linearly rise to stationary value, i.e. maximum current value Imax, and minimum current value I is linearly decreased at a slow speed from stationary valueminOr null value.
When the capacitance that delays time to control module controls tunable capacitor reduces, the rising time T of its corresponding switch metal-oxide-semiconductorriseDuration reduce, its trailing edge time TfallShorten accordingly so that electric current climbing time and the fall time of switch metal-oxide-semiconductor output reduce, thus extract electric current IOUTFast linear change can rise to stationary value, i.e. maximum current value Imax, and minimum current value I can be dropped to from stationary value fast linearminOr null value.
1) present invention can make extraction electric current I by regulating the size of delay capacitorOUTLinearly change.
After fictitious load steady operation, if the capacitance of delay capacitor increases, continuation is charged by delay capacitor, flows into linearly reducing with the increase of delay capacitor of switch metal-oxide-semiconductor source electrode；If the capacitance of delay capacitor reduces, delay capacitor will start electric discharge, flows into the extraction electric current I of switch metal-oxide-semiconductor source electrodeOUTLinearly increase with the reduction of delay capacitor；The changing value of delay capacitor is the biggest, extracts electric current IOUTRising time TriseThe longest.
2) present invention drives the size of electric current also by regulation switch metal-oxide-semiconductor, and i.e. the input current size of regulation switch metal-oxide-semiconductor gate terminal, makes extraction electric current IOUTLinearly change.
When driving electric current bigger, it is fast that switch metal-oxide-semiconductor turns on and off speed, the rising time T of the extraction current curve of this switch metal-oxide-semiconductor inputriseWith trailing edge time TfallThe shortest；When driving electric current less, it is slow that switch metal-oxide-semiconductor turns on and off speed, the rising time T of the current curve of this switch metal-oxide-semiconductorriseWith trailing edge time TfallThe longest.
Claims (9)
1. the fictitious load being used for testing SOC power supply, it is characterised in that: it includes current adjustment unit, time delay adjustment unit and control module, and described control module includes current control module, delays time to control module and data processing module；
The extraction current input terminal of described current adjustment unit is connected with analog power positive pole, the current output terminal of current adjustment unit with dock, the electric current of current adjustment unit is controlled input and is connected with the current controling end of data processing module by current control module, and the delays time to control input of current adjustment unit passes sequentially through time delay adjustment unit and delays time to control module and is connected with the delays time to control end of data processing module；
The data processing module external control data to receiving carries out dissection process, extract the current controling signal in this external control data and delay control signal, and current controling signal is sent to current control module, current control module controls current adjustment unit simulation according to this current controling signal and exports a certain size electric current so that the extraction electric current exported from the power output end of power supply to be measured is identical with the working current value being modeled load；
Delay control signal is sent to delays time to control module by data processing module, delays time to control module controls the delay state of time delay adjustment unit according to this delay control signal so that the extraction electric current that the extraction current input terminal of current adjustment unit is inputted linearly changes.
A kind of fictitious load for testing SOC power supply the most according to claim 1, it is characterized in that: described current adjustment unit includes N+M matrix current adjustment circuit parallel with one another, described each matrix current adjustment circuit all includes current draw module and switch module, the input of current draw module is connected with analog power positive pole, the outfan of current draw module is connected with the input of switch module, the outfan of switch module with dock, the control end of switch module is connected with current control module by the first bus.
A kind of fictitious load for testing SOC power supply the most according to claim 2, it is characterised in that: described current draw module includes DC current source.
A kind of fictitious load for testing SOC power supply the most according to claim 2, it is characterized in that: described switch module includes switching metal-oxide-semiconductor, the source electrode of switch metal-oxide-semiconductor is connected with the outfan of current draw module, the drain electrode of switch metal-oxide-semiconductor is connected with fictitious load power cathode, and the grid of switch metal-oxide-semiconductor is connected with current control module by the first bus.
A kind of fictitious load for testing SOC power supply the most according to claim 2, it is characterized in that: described time delay adjustment unit includes M time delay module, the input of described each time delay module all connects with the outfan of corresponding current draw module, the outfan of each time delay module all connects with the control end of corresponding switch module, and the control end of each time delay module is all connected with delays time to control module by the second bus.
A kind of fictitious load for testing SOC power supply the most according to claim 5, it is characterised in that: described time delay module includes delay capacitor.
A kind of fictitious load for testing SOC power supply the most according to claim 1, it is characterised in that: described control module also includes that transient state makes energy control module and clock signal receiver module；
Described transient state makes the input of energy control module enable control port by transient state and receives transient control signal, and transient state makes the outfan of energy control module be connected with the transient state enable input of data processing module；
The input of described clock signal receiver module receives clock signal by clock signal receiving port, and the outfan of clock signal receiver module is connected with the clock signal input terminal of data processing module；
After data processing module receives transient control signal, the extraction electric current that control current adjustment unit is inputted dynamically changes with the clock signal received by clock signal receiving module.
A kind of fictitious load for testing SOC power supply the most according to claim 1, it is characterised in that: the power output end of described power supply to be measured is also connected with the test input of power supply testing device, is tested extraction electric current by power supply testing device.
A kind of fictitious load for testing SOC power supply the most according to claim 8, it is characterised in that: described power supply testing device includes oscillograph.
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| CN108735136B (en) * | 2018-06-13 | 2021-09-21 | 京东方科技集团股份有限公司 | Display substrate, test circuit and test method |
| CN111381654A (en) * | 2018-12-29 | 2020-07-07 | 成都海光集成电路设计有限公司 | Load detection circuit, SOC system, and method for configuring load detection circuit |
| CN111381654B (en) * | 2018-12-29 | 2022-01-11 | 成都海光集成电路设计有限公司 | Load detection circuit, SOC system, and method for configuring load detection circuit |
| CN113740600A (en) * | 2020-05-29 | 2021-12-03 | 常州星宇车灯股份有限公司 | Car lamp dynamic current time sequence detection device and detection method based on high-speed acquisition board card |
| CN112763930A (en) * | 2020-12-01 | 2021-05-07 | 国营芜湖机械厂 | Device and method for measuring response time of airborne power supply |
| CN114578255A (en) * | 2022-01-27 | 2022-06-03 | 苏州浪潮智能科技有限公司 | Method and system for testing power supply voltage |
| CN114578255B (en) * | 2022-01-27 | 2024-02-02 | 苏州浪潮智能科技有限公司 | A power supply voltage testing method and system |
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|---|---|
| CN105823990B (en) | 2018-11-09 |
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Address after: 610041 floor 4, block A, 1 building 200, Tianfu five street, hi tech Zone, Chengdu, Sichuan. Patentee after: CHENGDU ANALOG CIRCUIT TECHNOLOGY Inc. Address before: The middle high tech Zone Yizhou road in Chengdu city of Sichuan Province in 610000 1800, 1 17 storey building No. 1705 Patentee before: CHENGDU RUICHENG XINWEI TECHNOLOGY Co.,Ltd. |
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