CN105698987A - X-ray stress analyzing device - Google Patents
X-ray stress analyzing device Download PDFInfo
- Publication number
- CN105698987A CN105698987A CN201610005877.9A CN201610005877A CN105698987A CN 105698987 A CN105698987 A CN 105698987A CN 201610005877 A CN201610005877 A CN 201610005877A CN 105698987 A CN105698987 A CN 105698987A
- Authority
- CN
- China
- Prior art keywords
- array detector
- ray tube
- linear array
- laser instrument
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims abstract description 15
- 230000003028 elevating effect Effects 0.000 claims description 4
- 238000010276 construction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000033001 locomotion Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons
Landscapes
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The present invention provides an X-ray stress analyzing device which is simple in structure and is convenient to operate. The X-ray stress analyzing device comprises a chassis, and an X-ray tube, a left linear-array detector, a right linear-array detector, a left laser and a right laser which are separately located in the chassis via an internal support, the left linear-array detector and the left laser are located at the left side of the X-ray tube, and the right linear-array detector and the right laser are located at the right side of the X-ray tube. The center lines of the left and right linear-array detectors and the incident ray of the X-ray tube are intersected at a stress test point, the laser beams of the left and right lasers are also intersected at the stress test point, and the included angle of the plane of the chassis and the incident ray of the X-ray tube is 55 degrees.
Description
Technical field
The present invention relates to a kind of stress analysis equipment, especially a kind of X ray stress analysis equipment。
Background technology
Now all of X ray stress test equipment all must have two kinds of motions: (1) measures the mechanism of the angle of diffraction 2 θ by mechanical scanning;(2) mechanism at Ψ angle is changed。Test process is all measure the angle of diffraction 2 θ respectively at several different Ψ angles, then calculates stress。
Summary of the invention
The invention provides a kind of simple in construction, easy to operate X ray stress analysis equipment。
Realize the X ray stress analysis equipment of the object of the invention, including casing, be positioned at the X-ray tube of casing, left linear array detector, right linear array detector, left laser instrument and right laser instrument;Described casing is arranged on multisection type gimbals by finely tuning elevating mechanism;Described X-ray tube is arranged in casing by internal stent, and described left linear array detector, right linear array detector, left laser instrument and right laser instrument are arranged in casing respectively through internal stent;Described left linear array detector and left laser instrument are positioned at the left side of X-ray tube, and described right linear array detector and right laser instrument are positioned at the right side of X-ray tube;
Described left linear array detector and the centrage of right linear array detector intersect at stress test point with the line of incidence of X-ray tube, and the laser beam of described left laser instrument and right laser instrument also intersects at stress test point;
The plane of described casing and the line of incidence of X-ray tube are 55 ° of angles。
Having the beneficial effect that of the X ray stress analysis equipment of the present invention:
The X ray stress analysis equipment of the present invention, simple in construction, a casing comprising X-ray tube and two linear array detectors can realize, without two described in background technology kind motion, only the plane of casing need to be adjusted and tested plane parallel, left and right two linear array detectors directly gather data, then calculate stress value, provide test result, easy to operate。
Accompanying drawing explanation
Fig. 1 is the structural representation of the X ray stress analysis equipment of the present invention。
Fig. 2 is the A-A sectional view of Fig. 1。
Fig. 3 is the B-B sectional view of Fig. 1。
Detailed description of the invention
As shown in Figures 1 to 3, the X ray stress analysis equipment of the present invention, including casing 1, it is positioned at the X-ray tube 2 of casing 1, left linear array detector 3, right linear array detector 4, left laser instrument 5 and right laser instrument 6;Described casing 1 is arranged on multisection type gimbals by finely tuning elevating mechanism 12;Described X-ray tube 2 is arranged in casing 1 by internal stent, and described left linear array detector 2, right linear array detector 3, left laser instrument 4 and right laser instrument 5 are arranged in casing 1 respectively through internal stent;Described left linear array detector 3 and left laser instrument 5 are positioned at the left side of X-ray tube 2, and described right linear array detector 4 and right laser instrument 6 are positioned at the right side of X-ray tube 2;
The centrage 9,11 of described left linear array detector 3 and right linear array detector 4 and the line of incidence 7 of X-ray tube 2 intersect at stress test point S, and the laser beam 8,10 of described left laser instrument 5 and right laser instrument 6 also intersects at stress test point S;
The line of incidence 7 of the plane of described casing 1 and X-ray tube 2 is in 55 ° of angles。
With an X-ray tube and two linear array detectors for core devices, become the equipment of the present invention by necessary internal stent and housing combination。The centrage of two detectors and be set to 2 η with line of incidence angle, angle summit is S。Also installing two laser instrument in left and right in housing, two bundle laser are intersected in S point。Additionally it is equipped with fine setting elevating mechanism and multisection type gimbals, namely can be used for stress test。Only need to use two bundle laser alignment test point S, adjust box shell reference plane (See Figure) so as to be parallel to sample testing face, after start, do not measure action, gather data and test within several seconds to tens seconds, can be completed。
Here 2 η determine according to the target of different detected materials and X-ray tube。
Embodiment described above is only that the preferred embodiment of the present invention is described; not the scope of the present invention is defined; under design spirit premise without departing from the present invention; various deformation that technical solution of the present invention is made by this area ordinary skill technical staff and improvement, all should fall in the protection domain that claims of the present invention are determined。
Claims (2)
1.X X-ray stress analysis X equipment, it is characterised in that: include casing, be positioned at the X-ray tube of casing, left linear array detector, right linear array detector, left laser instrument and right laser instrument;Described X-ray tube is arranged in casing by internal stent, and described left linear array detector, right linear array detector, left laser instrument and right laser instrument are arranged in casing respectively through internal stent;Described left linear array detector and left laser instrument are positioned at the left side of X-ray tube, and described right linear array detector and right laser instrument are positioned at the right side of X-ray tube;
Described left linear array detector and the centrage of right linear array detector intersect at stress test point with the line of incidence of X-ray tube, and the laser beam of described left laser instrument and right laser instrument also intersects at stress test point;
The plane of described casing and the line of incidence of X-ray tube are 55 ° of angles。
2. X ray stress analysis equipment according to claim 1, it is characterised in that: described casing is arranged on multisection type gimbals by finely tuning elevating mechanism。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610005877.9A CN105698987A (en) | 2016-01-07 | 2016-01-07 | X-ray stress analyzing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610005877.9A CN105698987A (en) | 2016-01-07 | 2016-01-07 | X-ray stress analyzing device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN105698987A true CN105698987A (en) | 2016-06-22 |
Family
ID=56226130
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610005877.9A Pending CN105698987A (en) | 2016-01-07 | 2016-01-07 | X-ray stress analyzing device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105698987A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110542507A (en) * | 2019-10-16 | 2019-12-06 | 丹东浩元仪器有限公司 | detection method of detection device of X-ray stress determinator |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4686631A (en) * | 1985-02-08 | 1987-08-11 | Ruud Clayton O | Method for determining internal stresses in polycrystalline solids |
US5125016A (en) * | 1983-09-22 | 1992-06-23 | Outokumpu Oy | Procedure and measuring apparatus based on X-ray diffraction for measuring stresses |
US5148458A (en) * | 1990-01-18 | 1992-09-15 | Clayton Ruud | Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction |
US6353656B1 (en) * | 1998-07-24 | 2002-03-05 | Technology For Energy Corporation | Radioisotope based x-ray residual stress analysis apparatus |
US20090274274A1 (en) * | 2008-05-01 | 2009-11-05 | Bruker Axs, Inc. | Handheld two-dimensional x-ray diffractometer |
CN201583490U (en) * | 2009-12-02 | 2010-09-15 | 江苏天瑞仪器股份有限公司 | Novel upward-lighting type testing mechanism |
CN202583096U (en) * | 2012-05-11 | 2012-12-05 | 武汉钢铁(集团)公司 | Laser focusing device for X-ray stress tester |
CN203519519U (en) * | 2013-08-22 | 2014-04-02 | 武汉钢铁(集团)公司 | Three-dimensional laser focusing device for X-ray stress test |
-
2016
- 2016-01-07 CN CN201610005877.9A patent/CN105698987A/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5125016A (en) * | 1983-09-22 | 1992-06-23 | Outokumpu Oy | Procedure and measuring apparatus based on X-ray diffraction for measuring stresses |
US5125016B1 (en) * | 1983-09-22 | 1998-02-24 | Outokumpu Oy | Procedure and measuring apparatus based on x-ray diffraction for measuring stresses |
US4686631A (en) * | 1985-02-08 | 1987-08-11 | Ruud Clayton O | Method for determining internal stresses in polycrystalline solids |
US5148458A (en) * | 1990-01-18 | 1992-09-15 | Clayton Ruud | Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction |
US6353656B1 (en) * | 1998-07-24 | 2002-03-05 | Technology For Energy Corporation | Radioisotope based x-ray residual stress analysis apparatus |
US20090274274A1 (en) * | 2008-05-01 | 2009-11-05 | Bruker Axs, Inc. | Handheld two-dimensional x-ray diffractometer |
CN201583490U (en) * | 2009-12-02 | 2010-09-15 | 江苏天瑞仪器股份有限公司 | Novel upward-lighting type testing mechanism |
CN202583096U (en) * | 2012-05-11 | 2012-12-05 | 武汉钢铁(集团)公司 | Laser focusing device for X-ray stress tester |
CN203519519U (en) * | 2013-08-22 | 2014-04-02 | 武汉钢铁(集团)公司 | Three-dimensional laser focusing device for X-ray stress test |
Non-Patent Citations (2)
Title |
---|
中华人民共和国工业和信息化部: "《无损检测仪器X射线应力测定仪技术条件JBT9394-2011》", 20 December 2011 * |
吕克茂: "残余应力测定的基本知识——第四讲 X射线应力测定方法(一)", 《理化检验(物理分册)》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110542507A (en) * | 2019-10-16 | 2019-12-06 | 丹东浩元仪器有限公司 | detection method of detection device of X-ray stress determinator |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3032288B1 (en) | Alignment system and method for container or vehicle inspection system | |
CN105334144B (en) | A kind of monodisperse aerosol grain size and apparatus for measuring concentration based on light scattering | |
CN104316443B (en) | A PM 2.5 Concentration Monitoring Method Based on CCD Backscattering | |
CN111289496B (en) | A detection method and device for long-distance zoom laser-induced breakdown spectroscopy | |
CN108287126B (en) | Nanoparticle size measurement system | |
CN104949689A (en) | Source imaging-based laser plummet digital calibrating method and device | |
CN103954593A (en) | Plasma signal acquisition device based on laser-induced-breakdown spectroscopy | |
CN104792798A (en) | Total internal reflection illumination technology-based subsurface damage measuring apparatus and method thereof | |
CN108920869B (en) | MPO focusing imaging performance analysis method based on grazing incidence X-ray optical simulation | |
CN201569492U (en) | Instrument for detecting optical fiber field distribution | |
CN104535300A (en) | Large-diameter collimator wavefront and image surface position calibration device and method | |
CN110618104A (en) | Terahertz spectrometer probe | |
CN110360924A (en) | A kind of laminated micro imaging method of double wave and system | |
CN107219183A (en) | Open light path type atmospheric trace gas infrared detecting device | |
CN103017664B (en) | Method and system for calibrating laser beam analyzer | |
CN105698987A (en) | X-ray stress analyzing device | |
CN107884061B (en) | A dynamic photoelastic ultrasound imaging method and system | |
CN113074848A (en) | Optical elasticity testing system and method based on optical amplification technology | |
CN104266968B (en) | High accuracy polarization two is to reflection automatic measuring instrument | |
CN110031100B (en) | A multi-dimensional short-wave infrared spectroscopy imaging detection device | |
Aumeyr et al. | Advanced simulations of optical transition and diffraction radiation | |
CN107085233A (en) | A kind of local radiation flow measuring system based on precise pinhole | |
CN206546439U (en) | A kind of X-ray energy spectrum imaging system | |
KR101558737B1 (en) | Beam alignment apparatus for off-axis cavity spectroscopy and method thereof | |
CN103245445A (en) | Stress meter |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160622 |