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CN105698987A - X-ray stress analyzing device - Google Patents

X-ray stress analyzing device Download PDF

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Publication number
CN105698987A
CN105698987A CN201610005877.9A CN201610005877A CN105698987A CN 105698987 A CN105698987 A CN 105698987A CN 201610005877 A CN201610005877 A CN 201610005877A CN 105698987 A CN105698987 A CN 105698987A
Authority
CN
China
Prior art keywords
array detector
ray tube
linear array
laser instrument
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610005877.9A
Other languages
Chinese (zh)
Inventor
张龙祥
吕克茂
贞宇亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Handan Aisite Stress Technology Co Ltd
Original Assignee
Handan Aisite Stress Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Handan Aisite Stress Technology Co Ltd filed Critical Handan Aisite Stress Technology Co Ltd
Priority to CN201610005877.9A priority Critical patent/CN105698987A/en
Publication of CN105698987A publication Critical patent/CN105698987A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/25Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons

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  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The present invention provides an X-ray stress analyzing device which is simple in structure and is convenient to operate. The X-ray stress analyzing device comprises a chassis, and an X-ray tube, a left linear-array detector, a right linear-array detector, a left laser and a right laser which are separately located in the chassis via an internal support, the left linear-array detector and the left laser are located at the left side of the X-ray tube, and the right linear-array detector and the right laser are located at the right side of the X-ray tube. The center lines of the left and right linear-array detectors and the incident ray of the X-ray tube are intersected at a stress test point, the laser beams of the left and right lasers are also intersected at the stress test point, and the included angle of the plane of the chassis and the incident ray of the X-ray tube is 55 degrees.

Description

X ray stress analysis equipment
Technical field
The present invention relates to a kind of stress analysis equipment, especially a kind of X ray stress analysis equipment。
Background technology
Now all of X ray stress test equipment all must have two kinds of motions: (1) measures the mechanism of the angle of diffraction 2 θ by mechanical scanning;(2) mechanism at Ψ angle is changed。Test process is all measure the angle of diffraction 2 θ respectively at several different Ψ angles, then calculates stress。
Summary of the invention
The invention provides a kind of simple in construction, easy to operate X ray stress analysis equipment。
Realize the X ray stress analysis equipment of the object of the invention, including casing, be positioned at the X-ray tube of casing, left linear array detector, right linear array detector, left laser instrument and right laser instrument;Described casing is arranged on multisection type gimbals by finely tuning elevating mechanism;Described X-ray tube is arranged in casing by internal stent, and described left linear array detector, right linear array detector, left laser instrument and right laser instrument are arranged in casing respectively through internal stent;Described left linear array detector and left laser instrument are positioned at the left side of X-ray tube, and described right linear array detector and right laser instrument are positioned at the right side of X-ray tube;
Described left linear array detector and the centrage of right linear array detector intersect at stress test point with the line of incidence of X-ray tube, and the laser beam of described left laser instrument and right laser instrument also intersects at stress test point;
The plane of described casing and the line of incidence of X-ray tube are 55 ° of angles。
Having the beneficial effect that of the X ray stress analysis equipment of the present invention:
The X ray stress analysis equipment of the present invention, simple in construction, a casing comprising X-ray tube and two linear array detectors can realize, without two described in background technology kind motion, only the plane of casing need to be adjusted and tested plane parallel, left and right two linear array detectors directly gather data, then calculate stress value, provide test result, easy to operate。
Accompanying drawing explanation
Fig. 1 is the structural representation of the X ray stress analysis equipment of the present invention。
Fig. 2 is the A-A sectional view of Fig. 1。
Fig. 3 is the B-B sectional view of Fig. 1。
Detailed description of the invention
As shown in Figures 1 to 3, the X ray stress analysis equipment of the present invention, including casing 1, it is positioned at the X-ray tube 2 of casing 1, left linear array detector 3, right linear array detector 4, left laser instrument 5 and right laser instrument 6;Described casing 1 is arranged on multisection type gimbals by finely tuning elevating mechanism 12;Described X-ray tube 2 is arranged in casing 1 by internal stent, and described left linear array detector 2, right linear array detector 3, left laser instrument 4 and right laser instrument 5 are arranged in casing 1 respectively through internal stent;Described left linear array detector 3 and left laser instrument 5 are positioned at the left side of X-ray tube 2, and described right linear array detector 4 and right laser instrument 6 are positioned at the right side of X-ray tube 2;
The centrage 9,11 of described left linear array detector 3 and right linear array detector 4 and the line of incidence 7 of X-ray tube 2 intersect at stress test point S, and the laser beam 8,10 of described left laser instrument 5 and right laser instrument 6 also intersects at stress test point S;
The line of incidence 7 of the plane of described casing 1 and X-ray tube 2 is in 55 ° of angles。
With an X-ray tube and two linear array detectors for core devices, become the equipment of the present invention by necessary internal stent and housing combination。The centrage of two detectors and be set to 2 η with line of incidence angle, angle summit is S。Also installing two laser instrument in left and right in housing, two bundle laser are intersected in S point。Additionally it is equipped with fine setting elevating mechanism and multisection type gimbals, namely can be used for stress test。Only need to use two bundle laser alignment test point S, adjust box shell reference plane (See Figure) so as to be parallel to sample testing face, after start, do not measure action, gather data and test within several seconds to tens seconds, can be completed。
Here 2 η determine according to the target of different detected materials and X-ray tube。
Embodiment described above is only that the preferred embodiment of the present invention is described; not the scope of the present invention is defined; under design spirit premise without departing from the present invention; various deformation that technical solution of the present invention is made by this area ordinary skill technical staff and improvement, all should fall in the protection domain that claims of the present invention are determined。

Claims (2)

1.X X-ray stress analysis X equipment, it is characterised in that: include casing, be positioned at the X-ray tube of casing, left linear array detector, right linear array detector, left laser instrument and right laser instrument;Described X-ray tube is arranged in casing by internal stent, and described left linear array detector, right linear array detector, left laser instrument and right laser instrument are arranged in casing respectively through internal stent;Described left linear array detector and left laser instrument are positioned at the left side of X-ray tube, and described right linear array detector and right laser instrument are positioned at the right side of X-ray tube;
Described left linear array detector and the centrage of right linear array detector intersect at stress test point with the line of incidence of X-ray tube, and the laser beam of described left laser instrument and right laser instrument also intersects at stress test point;
The plane of described casing and the line of incidence of X-ray tube are 55 ° of angles。
2. X ray stress analysis equipment according to claim 1, it is characterised in that: described casing is arranged on multisection type gimbals by finely tuning elevating mechanism。
CN201610005877.9A 2016-01-07 2016-01-07 X-ray stress analyzing device Pending CN105698987A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610005877.9A CN105698987A (en) 2016-01-07 2016-01-07 X-ray stress analyzing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610005877.9A CN105698987A (en) 2016-01-07 2016-01-07 X-ray stress analyzing device

Publications (1)

Publication Number Publication Date
CN105698987A true CN105698987A (en) 2016-06-22

Family

ID=56226130

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610005877.9A Pending CN105698987A (en) 2016-01-07 2016-01-07 X-ray stress analyzing device

Country Status (1)

Country Link
CN (1) CN105698987A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110542507A (en) * 2019-10-16 2019-12-06 丹东浩元仪器有限公司 detection method of detection device of X-ray stress determinator

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids
US5125016A (en) * 1983-09-22 1992-06-23 Outokumpu Oy Procedure and measuring apparatus based on X-ray diffraction for measuring stresses
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
US6353656B1 (en) * 1998-07-24 2002-03-05 Technology For Energy Corporation Radioisotope based x-ray residual stress analysis apparatus
US20090274274A1 (en) * 2008-05-01 2009-11-05 Bruker Axs, Inc. Handheld two-dimensional x-ray diffractometer
CN201583490U (en) * 2009-12-02 2010-09-15 江苏天瑞仪器股份有限公司 Novel upward-lighting type testing mechanism
CN202583096U (en) * 2012-05-11 2012-12-05 武汉钢铁(集团)公司 Laser focusing device for X-ray stress tester
CN203519519U (en) * 2013-08-22 2014-04-02 武汉钢铁(集团)公司 Three-dimensional laser focusing device for X-ray stress test

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5125016A (en) * 1983-09-22 1992-06-23 Outokumpu Oy Procedure and measuring apparatus based on X-ray diffraction for measuring stresses
US5125016B1 (en) * 1983-09-22 1998-02-24 Outokumpu Oy Procedure and measuring apparatus based on x-ray diffraction for measuring stresses
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
US6353656B1 (en) * 1998-07-24 2002-03-05 Technology For Energy Corporation Radioisotope based x-ray residual stress analysis apparatus
US20090274274A1 (en) * 2008-05-01 2009-11-05 Bruker Axs, Inc. Handheld two-dimensional x-ray diffractometer
CN201583490U (en) * 2009-12-02 2010-09-15 江苏天瑞仪器股份有限公司 Novel upward-lighting type testing mechanism
CN202583096U (en) * 2012-05-11 2012-12-05 武汉钢铁(集团)公司 Laser focusing device for X-ray stress tester
CN203519519U (en) * 2013-08-22 2014-04-02 武汉钢铁(集团)公司 Three-dimensional laser focusing device for X-ray stress test

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
中华人民共和国工业和信息化部: "《无损检测仪器X射线应力测定仪技术条件JBT9394-2011》", 20 December 2011 *
吕克茂: "残余应力测定的基本知识——第四讲 X射线应力测定方法(一)", 《理化检验(物理分册)》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110542507A (en) * 2019-10-16 2019-12-06 丹东浩元仪器有限公司 detection method of detection device of X-ray stress determinator

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Application publication date: 20160622