CN105527465B - Connector test socket and connector test device - Google Patents
Connector test socket and connector test device Download PDFInfo
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- CN105527465B CN105527465B CN201410522399.XA CN201410522399A CN105527465B CN 105527465 B CN105527465 B CN 105527465B CN 201410522399 A CN201410522399 A CN 201410522399A CN 105527465 B CN105527465 B CN 105527465B
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Abstract
本发明公开了连接器测试插座及连接器测试装置，本发明所述的连接器测试插座，其特征在于，包括：壳体，所述壳体具有探针固定孔；所述壳体设置有第一通孔，所述第一通孔与所述探针固定孔连通；探针，所述探针设置于所述探针固定孔内，并包括探头部分；保持架，所述保持架设置有探头固定孔，所述保持架可移动地设置于所述壳体内；所述探头部分位于所述保持架的所述探头固定孔内，并可在所述探头固定孔内移动。本发明中的连接器测试插座及连接器测试装置，探针与连接器的连接端子以可插拔的方式连接，连接端子与探针连接后，利用电流测试装置测试连接端子和探针两端是否导电，即可判断连接端子安装是否合格。
The invention discloses a connector test socket and a connector test device. The connector test socket of the invention is characterized by comprising: a shell, the shell has a probe fixing hole; the shell is provided with a first a through hole, the first through hole communicates with the probe fixing hole; a probe, the probe is arranged in the probe fixing hole and includes a probe part; a holder, the holder is provided with a probe fixing hole, the holder is movably arranged in the housing; the probe part is located in the probe fixing hole of the holder and can move in the probe fixing hole. In the connector test socket and the connector test device of the present invention, the probe is connected to the connecting terminal of the connector in a pluggable manner, and after the connecting terminal is connected to the probe, the current testing device is used to test the connecting terminal and both ends of the probe Whether it is conductive or not, it can be judged whether the installation of the connecting terminal is qualified.
Description
Technical Field
The invention relates to a connector test socket and a connector test device.
Background
A conventional connector generally includes a connector housing and a plurality of connection terminals provided on the housing. The connecting terminal is connected with a lead. There is a risk of damage during mounting of the connection terminal in the connector housing. The more miniaturized connectors, the higher the risk of damage to the connection terminals during installation. The damage may be the case when the connection terminal is disconnected from the wire or when the connection terminal is not mounted in place. Either type of damage can affect the proper use of the connector.
In the prior art, a special connector testing device is not provided, and whether a connecting terminal of a connector is correctly installed or not and whether the connector can conduct electricity normally or not can not be quickly tested.
Disclosure of Invention
It is an object of the present invention to overcome the deficiencies of the prior art by providing a connector testing socket that facilitates testing of a connector.
In order to achieve the above purpose, the invention is realized by the following technical scheme:
connector test socket, characterized by, includes:
a housing having a probe fixing hole; the shell is provided with a first through hole which is communicated with the probe fixing hole;
a probe disposed within the probe fixation hole and including a probe portion;
the holder is provided with a probe fixing hole and is movably arranged in the shell;
the probe part is positioned in the probe fixing hole of the retainer and can move in the probe fixing hole.
Preferably, the device further comprises an elastic reset device; when the retainer is pressed to move, the elastic resetting device generates elastic deformation and has elastic deformation force; after the pressure applied to the retainer disappears, the retainer is reset by the elastic deformation force of the elastic resetting device.
Preferably, the elastic return means is a spring.
Preferably, the device further comprises a guide device, wherein the guide device is connected with the retainer; when the retainer is pressed to move, the guide device limits the moving track of the retainer.
Preferably, the guide means is a guide rod; the housing includes a probe fixing plate; the probe is arranged on the probe fixing plate; the shell is provided with a guide rod hole; one end of the guide rod is connected with the retainer, and the guide rod can be movably inserted in the shell along the guide rod hole.
Preferably, a compression spring is arranged in the shell; a flange is arranged on the guide rod; the compression spring is sleeved on the guide rod; one end of the compression spring is abutted against the flange, and the other end of the compression spring is abutted against the inner wall of the shell.
Preferably, the probe comprises a main body part, and the main body part of the probe is in interference fit with the probe fixing hole.
Preferably, the probe comprises a probe portion; the probe part of the probe is positioned in the probe fixing hole and is in clearance fit with the probe fixing hole.
Preferably, the probe part of the probe is completely positioned in the probe fixing hole, so that the retainer protects the probe part.
Preferably, the inner wall of the first through hole is provided with a step surface.
Preferably, the housing includes a probe fixing plate having a probe fixing hole formed therein.
Preferably, the housing comprises a base plate, a probe holder and a front plate; the probe fixing hole is arranged on the probe seat; the front plate and the bottom plate are respectively arranged at two ends of the probe seat; the first through hole is arranged on the front plate.
Preferably, the front plate is provided with a step for matching with a projection arranged on the tested connector shell.
Preferably, the number of the front plates is multiple, and the front plates are detachably connected with the probe seat and have different first through holes.
Another object of the present invention is to provide a connector testing apparatus capable of conveniently testing a connector in order to overcome the disadvantages of the prior art.
In order to achieve the above purpose, the invention is realized by the following technical scheme:
the connector testing device is characterized by comprising a current testing device and the connector testing socket; the probe and the current testing device form part of a current loop; when a connecting terminal of the connector is connected with the probe, the current testing device tests whether the connecting terminal and the probe are electrically conducted; and judging whether the connection terminal is installed correctly according to whether the connection terminal and the probe are electrically conducted, if not, the connection terminal is installed incorrectly, and if so, the connection terminal is installed correctly.
According to the connector test socket and the connector test device, the probe is connected with the connecting terminal of the connector in a pluggable mode, and after the connecting terminal is connected with the probe, the current test device is used for testing whether the two ends of the connecting terminal and the two ends of the probe are conductive or not, so that whether the connecting terminal is installed qualified or not can be judged. If the conductive circuit is conductive, the connection terminal is installed successfully; if the connection terminal is not conductive, the connection terminal is not installed properly. The connector test socket and the connector test device can conveniently test whether the connection terminal of the connector is correctly installed or not and whether the connector is normally conductive or not. Particularly suitable for testing a connector provided with a plurality of connection terminals. The end part of the probe is positioned in the probe fixing hole of the protective frame, and the protective frame can protect the probe from being damaged by external force. Especially, when the connecting terminal is in contact connection with the probe, the probe can be protected by the protection frame, and the probe is prevented from being damaged in the connection process. The movable arrangement of fender bracket makes it be applicable to various connectors, is applicable to the connecting terminal of various length sizes. By arranging the elastic reset device, the protection frame can be automatically reset, and a buffer effect can be provided when the protection frame is pressed. The guide device is arranged to limit the movement of the protective frame and prevent the probe from being blocked or damaged due to skew in the movement process. The front plate and the bottom plate are detachably connected with the probe seat, so that the probe seat is convenient to replace.
Drawings
FIG. 1 is a schematic partial cross-sectional view of the structure of an embodiment of the present invention.
Fig. 2 is a schematic cross-sectional view of the structure of the embodiment of the present invention.
Fig. 3 is a schematic cross-sectional view of the structure of the embodiment of the present invention in a position of use.
Fig. 4 is a reference diagram showing a state of use of the connector test socket of the present invention.
Fig. 5 is an enlarged view of a portion a in fig. 4.
Detailed Description
The invention is further illustrated below with reference to examples and figures.
As shown in fig. 1 to 5, the connector test socket 100 includes a housing 110 and a probe 120. The housing 110 has a probe fixing hole 111 extending in the connector insertion direction. The probe 120 is fixedly disposed in the probe fixing hole 111. The housing 110 is provided with a first through hole 112 for inserting the connector to be tested. The first through hole 112 communicates with the probe fixing hole 111 so that a connector under test inserted in the first through hole 112 can be connected with the probe 120 disposed in the probe fixing hole 111. For example, the connection terminals of the connector are pluggable into the probes 120 in the probe fixing holes 111.
In the example shown in the drawing, the housing 110 includes a front plate 113, a probe holder 114, and a base plate 115, and the front plate 113 and the base plate 115 are fixed to both ends of the probe holder 114 in an insertion direction, respectively. The probe mount 114 is used to fixedly mount a probe 120. The probe mount 114 includes a probe fixing plate 116. One or more probe fixing holes 111 are provided in the probe fixing plate 116 for fixedly mounting the probes 120. In the example shown, the probe retaining hole 111 is an interference fit with the body portion 1201 of the probe 120, with the probe head portion 121 of the probe extending upwardly beyond the upper surface 1161 of the probe retaining plate 116. For example, the probe head portions 121 of the probes are disposed in the same plane, such as a plane in the horizontal direction in fig. 2. In one example as shown in fig. 2, the body portion 1201 of the probe 120 extends upwardly beyond the upper surface 1161 of the probe retaining plate 116.
A front plate 113 and a base plate 115 are respectively coupled to both ends of the probe socket 114 to form a socket housing 110. The front plate 113 is provided with the first through hole 112. The shape of the first through hole 112 is adapted to the shape of the connector to be tested, so that the connector to be tested can be conveniently inserted, and the connector to be tested can be guided in the inserting process. According to a preferred embodiment of the present invention, a plurality of front plates 113 are detachably connected to the probe holders 114, respectively. Providing different shapes of the first through-hole 112 on different front plates 116 allows the present invention to be adapted to test various connectors by replacing the front plate 116. According to another preferred embodiment of the present invention, the front plate 113 is provided with a step surface 1131. The position of the step surface 1131 is set according to the structure of the connector to be tested.
A plurality of probes 120 are mounted on the probe fixing plate 116. The probe 120 is adapted to be removably connected to a connection terminal of a connector to form an electrical path. The structure of the probe 120 is adapted to the connection terminal, and the probe and the connection terminal are connected in a pluggable manner. If the connecting terminal is in a cylindrical shape, the probe is in a rod shape or a rod shape; if the connecting terminal is rod-shaped or rod-shaped, the probe is cylindrical. The number of probes 120 and the distribution pattern on the probe fixing plate 116 are adapted to the number of connection terminals and the distribution pattern on the connector, and each probe 120 is connected to one of the connection terminals in a pluggable manner. In the example shown, the probe portion 121 of the probe is rod-shaped. The probe 120 is fixed to the probe fixing plate 116. In one example as shown in fig. 2, a main body portion 1201 of the probe is fixed in the probe fixing hole 111; the probe head portion 121 of the probe extends upwardly beyond the upper surface 1161 of the probe retaining plate 116. In another example, the body portion 1201 of the probe 120 extends downward beyond the lower surface 1162 of the probe retaining plate 116, out of the probe retaining hole 111. In one example as shown in fig. 2, the body portion 1201 of the probe 120 extends continuously through the base plate 115 and the other end 122 of the probe 120 is positioned outside the probe-holding hole 111. In another example, the other end 122 of the probe 120 extends continuously across the lower surface 1151 of the base plate 115 for connection to a test circuit (not shown).
The connector test socket 100 also includes a holder 130. The holder 130 is disposed within the housing 110. In one example as shown in fig. 2, a holder 130 is disposed in an upper space 119 formed between the front plate 113 and the probe holder 114. The holder 130 is movably disposed in the upper space 119 of the case 110.
The holder 130 is provided with a probe fixing hole 132. When the connector test socket 100 is mounted, the probe fixing holes 132 in the holder 130 are aligned with the probe fixing holes 111 in the probe fixing plate 116 to receive the mounting probes 120. In the example shown, the body portion 1201 of each probe 120 is held within one of the probe-holding holes 111, and the probe portion 121 of each probe 120 extends into one of the probe-holding holes 132 in the holder 130. In one example as shown in fig. 2, the probe portion 121 of the probe 120 is located in the probe fixing hole 132 and is lower than the upper surface 1301 of the holder 130, i.e., the probe portion 121 of the probe 120 is completely located in the probe fixing hole 132, so that the holder 130 protects the probe portion 121.
According to an embodiment of the present invention, the holder 130 is provided on the probe holder 114 through a guide and an elastic restoring means, and is movable up and down in the insertion direction within the upper space 119 of the case 110. In the example shown, the cage 130 is disposed within the upper space 119 of the housing 110 and is coupled to the guide. As shown, the probe mount 114 has a guide rod aperture 118 disposed therein. The guide device includes two guide rods 140, and the guide rods 140 are movably inserted into the probe base 114 along the guide rod holes 118. The upper end of the guide bar 140 is coupled to the holder 130 by a screw 142. The probe holder 114 moves the holder 130 up and down in the insertion direction by restricting the movement locus of the guide bar 140. For example, when the holder 130 is pressed to move downward, the guide means restricts the moving trajectory of the holder 130.
The resilient return means is disposed within the housing 110. When the retainer 130 is pressed to move, the elastic reset device generates elastic deformation and has elastic deformation force. After the pressure applied to the retainer 130 is removed, the retainer 130 is restored by the elastic deformation force of the elastic restoring means. In the example shown, the elastic return means comprise a compression spring 150. In one example as shown in the drawings, the lower end portion of the guide bar 140 is disposed in a mounting hole 1152 of the guide bar 140 disposed in the base plate 115 and is movable within the mounting hole 1152. A flange 141 is provided on the lower end of the guide bar 140. The lower end portion of the guide bar 140 is disposed in a guide bar 140 mounting hole 1152 in the base plate 115 and is movable within the mounting hole 1152. A compression spring 150 is disposed around the lower end of the guide bar 140. The compression spring 150 has one end abutting against the flange 141 and the other end abutting against the base plate 115.
As shown in fig. 4 and 5, in the present embodiment, the connector 200 is inserted into the first through hole 112 of the front plate 113. In the example shown in the figure, the connection terminal 210 in the connector 200 is a female terminal, and the probe head portion 121 of the probe is rod-shaped. During insertion of the connector 200 into the first through hole 112, the front end of the connector 200 first contacts the holder 130, and then presses the holder 130 downward in the insertion direction. As the holder 130 is pressed down by the connector 200, the probe portion 121 of the probe pin 120 is exposed from the upper surface 1301 of the holder 130, and enters the front end of the connector 200 so as to be connected to the corresponding connection terminal 210. When the projection 201 provided on the housing of the connector 200 is stopped by the step surface 1131, the connector 200 is inserted into position. The connection terminals 210 of the connector 200 are brought into contact with the probe head portions 121 of the probes 120 exposed through the probe head fixing holes 132 of the holder 130 to be electrically connected.
When the connection terminal 210 is electrically contacted with the probe portion 121 of the probe 120, an electrical path is formed. The connection terminal 210 and the probe 120 are connected by an ammeter or a voltmeter, and whether the connection terminal 210 and the probe 120 are in contact with each other and energized can be determined according to the detection result of the ammeter or the voltmeter. When the connector 200 is mounted in place in the first through hole 112, if most of the connection terminals 210 are combined with the probes 120 and then energized and some are not energized, the connection terminals are not properly mounted. If all the power is on, all the installation is qualified. If all the connection terminals are not energized, it is determined that all the connection terminals are not properly mounted or are not mounted in place in the first through holes 112.
When the socket 100 is tested using the connector, the guide bar 140 moves downward as the holder 130 moves downward. The guide bar 140 is constrained by the guide bar aperture 118 in the probe holder 114 and can only move axially along the guide bar aperture 118. The guide rod hole 118 is matched with the guide rod 140 to define the moving track of the holder 130, so that the holder 130 protects the probe part 121 of the probe 120 arranged in the probe fixing hole 132. When the guide bar 140 moves downward, the compression spring 150 is compressed to generate an elastic deformation force.
After the detection is completed, the connector 200 is pulled out of the first through hole 112. The connection terminal 210 is separated from the probe 120. When the connector 200 is pulled out, the holder 130 is moved upward by the elastic deformation force of the compression spring 150, and the probe 120 withdrawn from the connector 200 is accommodated in the probe fixing hole 132. The holder 130 protects the probe 120 separated from the connector 200. .
According to a preferred embodiment of the present invention, the housing 110 may be provided with a plurality of front plates 113. Each front plate 113 may be provided with a shape of the first through-hole 112. Each type of first through-hole 112 is suitable for one type of connector. By replacing different front boards 113, the front board 113, the probe seat 114 and the base board 115 can be combined into a test socket suitable for different connectors, and the applicability is wider. The holder 130 may protect the probe 120 from damage. The probe part 121 of the probe pin 120 is inserted into the probe fixing hole 132 of the holder 130, and the holder 130 can conveniently insert and extract the connection terminal 210 and the probe pin 120 in the process of inserting and extracting the probe pin 120 and the connection terminal 210 of the connector 200, and can protect the probe pin 120 from being bent and broken easily, thereby prolonging the service life of the probe pin 120.
The connector test socket in the embodiment together with the current detection device can be used as a connector test device for testing whether the connection terminals of the connector are correctly installed.
The terms "upper", "lower", "left" and "right" used in the present invention are relative terms used with reference to fig. 3.
The embodiments of the present invention are merely illustrative, and not restrictive, of the scope of the claims, and other substantially equivalent alternatives may occur to those skilled in the art and are within the scope of the present invention.
Claims (19)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410522399.XA CN105527465B (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410522399.XA CN105527465B (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector test device |
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| Publication Number | Publication Date |
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| CN105527465A CN105527465A (en) | 2016-04-27 |
| CN105527465B true CN105527465B (en) | 2020-03-20 |
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| CN201410522399.XA Active CN105527465B (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector test device |
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| CN106199260B (en) * | 2016-06-30 | 2019-03-15 | 南京中车浦镇城轨车辆有限责任公司 | A kind of electrical cnnector detection device |
| CN107749538B (en) * | 2017-11-10 | 2024-03-12 | 江苏特创科技有限公司 | Interface end test assembly and interface end test device |
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| CN111308237A (en) * | 2020-01-16 | 2020-06-19 | 深圳市蓝眼博科科技有限公司 | Survey value needle, survey value needle structure and automatic value measuring machine |
| JP7455593B2 (en) * | 2020-01-21 | 2024-03-26 | 株式会社エンプラス | socket |
| CN113325203B (en) * | 2020-02-29 | 2023-08-18 | 电连技术股份有限公司 | Detection connector |
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| CN112858956B (en) * | 2021-01-29 | 2022-03-18 | 珠海市精实测控技术有限公司 | B2B connector needle block conduction reliability detection device |
| CN113917319A (en) * | 2021-12-06 | 2022-01-11 | 新恒汇电子股份有限公司 | Chip packaging switching test device and method |
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| CN204129082U (en) * | 2014-09-30 | 2015-01-28 | 泰科电子(上海)有限公司 | Connector test socket and connector testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP4921348B2 (en) * | 2007-12-28 | 2012-04-25 | 矢崎総業株式会社 | Conduction pin protection structure for continuity tester |
| CN203422394U (en) * | 2013-06-26 | 2014-02-05 | 陈妙妙 | FPC connector |
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| CN1207595A (en) * | 1997-07-31 | 1999-02-10 | 住友电装株式会社 | Inspection unit of connector inspection apparatus |
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| CN105527465A (en) | 2016-04-27 |
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