CN105467298A - Probe-free detection system - Google Patents
Probe-free detection system Download PDFInfo
- Publication number
- CN105467298A CN105467298A CN201510918181.0A CN201510918181A CN105467298A CN 105467298 A CN105467298 A CN 105467298A CN 201510918181 A CN201510918181 A CN 201510918181A CN 105467298 A CN105467298 A CN 105467298A
- Authority
- CN
- China
- Prior art keywords
- propulsion system
- probe
- armshaft
- cross bar
- slip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
The invention discloses a probe-free detection system which is disposed on a work piece fixation table (1) and comprises a square horizontal beam (4) composed of four mutually perpendicular horizontal rods (2). The system is characterized by comprising shaft arms (6), probe assemblies (8), a measurement arm (10), as well as a first dynamic device, a second dynamic device, a third dynamic device and a fourth dynamic device. The system disclosed by the invention gets rid of the design in the prior art that the position of a probe is fixed and cannot be adjusted and adopts a movable probe. During each detection course, the position of a detection point is determined, so that testing results are prevented from being influenced by the inaccurate position.
Description
Technical field
The present invention relates to a kind of without probe detection system.
Background technology
In IC industrial chain, integrated circuit testing is an only industry running through integrated circuit and produce and apply overall process.If integrated circuit (IC) design, not by the validation test of prototype, just can not drop into volume production; In volume production, if not by the middle survey of Probe test station, just cannot encapsulate in next operation; And the finished product test (becoming to survey) after encapsulation is the finishing operation of integrated circuit (IC) products, only have the circuit of test passes just may to dispatch from the factory as formal integrated circuit (IC) products.And in market circulation subsequently and engineer applied, integrated circuit also has to pass through the comprehensive or property the special procured test of multiple different application target and different service condition.
The detection of integrated circuit of the prior art is all the tester by having probe, and during test, probe is forced on the circuit board of electronic product.Its major function is occurred the in the fabrication process defect of detected electrons product, the defect of electronic product certainly will complete screening before shipment, to increase the yield of product, otherwise product can be made cannot to play the function of expection, more severe patient, because a product and make entire block be returned goods improperly, business opportunity may be forfeited, even affects goodwill.So the quality of probe mass is depended in the detection success or not of electronic product to a great extent, probe in use, easy appearance and product loose contact or using repeatedly, occur the phenomenons such as wearing and tearing thus cause test unstable, this has very large impact to the test of electronic product.
Therefore need badly and work out a kind of detection system that can reduce above-mentioned shortcoming.
Summary of the invention
The technical problem to be solved in the present invention is to provide and a kind ofly can prevents the bad or wearing and tearing of probes touch etc. from causing testing unstable test macro.
For solving the problem, the invention provides a kind of without probe detection system, it is arranged on above Work piece fixing platform, comprises the square beam be made up of four orthogonal cross bars, it is characterized in that, also comprise:
-armshaft, is at least provided with two, and the described cross bar that its head and the tail are parallel to each other with two is respectively slidably connected;
-probe assembly, it is slidably connected at the bottom of armshaft, and described probe assembly comprises elevating mechanism and is connected to the probe below described elevating mechanism;
-gage beam, be positioned at immediately below described armshaft, and the described cross bar that its head and the tail are parallel to each other with two is respectively slidably connected, the slid underneath of described gage beam is connected with the photoelectricity gauge head that can sense tested pilot on workpiece, described photoelectricity gauge head is also provided with the distance measuring equipment being clipped to two orthogonal described cross bar distances for measuring its point;
-the first propulsion system and the second propulsion system, the slip being respectively used to drive described armshaft on described cross bar and the slip of described probe assembly on described armshaft, the first propulsion system and the second drive unit are all by PLC controlled motion;
-three propulsion system and the 4th propulsion system, the slip being respectively used to drive described gage beam respectively on described cross bar and the slip of described photoelectricity side head on measured arm.
As a further improvement on the present invention, described first propulsion system, the second propulsion system, the 3rd propulsion system and the 4th propulsion system are linear electric motors.
As a further improvement on the present invention, described jacking gear is cylinder.
Beneficial effect of the present invention is, the present invention has abandoned prior art position of probe and fixed nonadjustable design, adopts movable probe, and in testing process each time, carries out position and determine, thus prevent from affecting test result because position is inaccurate to check point.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention;
Wherein: 1-fixed station; 2-cross bar; 4-crossbeam; 6-armshaft; 8-probe assembly; 10-gage beam; 12-photoelectricity gauge head.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further details.
As shown in Figure 1, the present invention includes the square beam 4 be made up of four orthogonal cross bars 2, it is characterized in that, also comprise:
-armshaft 6, is at least provided with two, and the described cross bar 2 that its head and the tail are parallel to each other with two is respectively slidably connected;
-probe assembly 8, it is slidably connected at the bottom of armshaft 6, and described probe assembly 8 comprises elevating mechanism and is connected to the probe below described elevating mechanism;
-gage beam 10, be positioned at immediately below described armshaft 6, and the described cross bar 2 that its head and the tail are parallel to each other with two is respectively slidably connected, the slid underneath of described gage beam 10 is connected with the photoelectricity gauge head 12 that can sense tested pilot on workpiece, described photoelectricity gauge head 12 is also provided with the distance measuring equipment being clipped to two orthogonal described cross bar 2 distances for measuring its point;
-the first propulsion system and the second propulsion system, the slip being respectively used to drive described armshaft 6 on described cross bar 2 and the slip of described probe assembly 8 on described armshaft 6, the first propulsion system and the second drive unit are all by PLC controlled motion;
-three propulsion system and the 4th propulsion system, the slip being respectively used to drive described gage beam 10 respectively on described cross bar 2 and the slip of described photoelectricity side head on measured arm 10.
As a further improvement on the present invention, described first propulsion system, the second propulsion system, the 3rd propulsion system and the 4th propulsion system are linear electric motors.
As a further improvement on the present invention, described jacking gear is cylinder.
Of the present invention concrete original as follows:
(1) tested point location, gage beam 10 and photoelectricity gauge head 12 is driven to move respectively by the 3rd propulsion system and the 4th propulsion system, when photoelectricity gauge head 12 is positioned at directly over tested point, photoelectricity gauge head 12 controls the 3rd propulsion system and the 4th propulsion system stop motion, then the distance that its point is clipped to vertical cross bar 2 measured by distance measuring equipment, X1, Y1, set up coordinate system (X1, Y1), coordinate (X2, Y2), (X3 of each tested point is so obtained, Y3) ... (Xn, Yn).
(2) probe motion, on each cross bar 2, armshaft 6, the first propulsion system, the second propulsion system are respectively under the effect of PLC, move to above-mentioned coordinate (X1, Y1) (X2, Y2), (X3, Y3) ... (Xn, Yn) directly over, moved by lift cylinder, contact with tested point, complete measurement.
The invention discloses a kind of without probe detection system, it is arranged on Work piece fixing platform (1) top, comprise the square beam (4) be made up of four orthogonal cross bars (2), it is characterized in that, also comprise: armshaft (6), at least be provided with two, and the described cross bar (2) that its head and the tail are parallel to each other with two is respectively slidably connected; Probe assembly (8), it is slidably connected at the bottom of armshaft (6), described probe assembly (8) comprises elevating mechanism and the probe that is connected to below described elevating mechanism and gage beam (10), the present invention has abandoned prior art position of probe and has fixed nonadjustable design, adopt movable probe, and in testing process each time, position is carried out to check point and determines, thus prevent from affecting test result because position is inaccurate.
Claims (3)
1., without a probe detection system, it is arranged on Work piece fixing platform (1) top, comprises the square beam (4) be made up of four orthogonal cross bars (2), it is characterized in that, also comprise:
-armshaft (6), is at least provided with two, and the described cross bar (2) that its head and the tail are parallel to each other with two is respectively slidably connected;
-probe assembly (8), it is slidably connected at the bottom of armshaft (6), and described probe assembly (8) comprises elevating mechanism and is connected to the probe below described elevating mechanism;
-gage beam (10), be positioned at immediately below described armshaft (6), and the described cross bar (2) that its head and the tail are parallel to each other with two is respectively slidably connected, the slid underneath of described gage beam (10) is connected with the photoelectricity gauge head (12) that can sense tested pilot on workpiece, described photoelectricity gauge head (12) is also provided with the distance measuring equipment being clipped to two orthogonal described cross bar (2) distances for measuring its point;
-the first propulsion system and the second propulsion system, the slip being respectively used to drive described armshaft (6) on described cross bar (2) and the slip of described probe assembly (8) on described armshaft (6), the first propulsion system and the second drive unit are all by PLC controlled motion;
-three propulsion system and the 4th propulsion system, the slip being respectively used to drive described gage beam (10) respectively on described cross bar (2) and the slip of described photoelectricity side head on measured arm (10).
2. according to claim 1 a kind of without probe detection system, it is characterized in that, described first propulsion system, the second propulsion system, the 3rd propulsion system and the 4th propulsion system are linear electric motors.
3. according to claim 1 a kind of without probe detection system, it is characterized in that, described jacking gear is cylinder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510918181.0A CN105467298A (en) | 2015-12-10 | 2015-12-10 | Probe-free detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510918181.0A CN105467298A (en) | 2015-12-10 | 2015-12-10 | Probe-free detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105467298A true CN105467298A (en) | 2016-04-06 |
Family
ID=55605214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510918181.0A Pending CN105467298A (en) | 2015-12-10 | 2015-12-10 | Probe-free detection system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105467298A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106093296A (en) * | 2016-05-27 | 2016-11-09 | 山东省农业科学院玉米研究所 | A kind of corn breeding single grain determination of water instrument |
| CN107677953A (en) * | 2017-09-29 | 2018-02-09 | 京东方科技集团股份有限公司 | A kind of probe system and its control method, lighting machine |
| CN108318805A (en) * | 2018-02-09 | 2018-07-24 | 宁波鄞州国康机械科技有限公司 | A kind of electronics integrated equipment |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201033625A (en) * | 2008-10-23 | 2010-09-16 | Nidec Read Corp | Printed circuit board testing fixture and printed circuit board testing system with the same |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN102236032A (en) * | 2010-05-07 | 2011-11-09 | 北京京东方光电科技有限公司 | Array detection equipment |
| CN102736017A (en) * | 2012-06-14 | 2012-10-17 | 中山市奇辉照明电器有限公司 | Fire-fighting lamp circuit board on-line dynamic tester and testing method |
| CN205333796U (en) * | 2015-12-10 | 2016-06-22 | 苏州世纪福智能装备股份有限公司 | No probe detecting system |
-
2015
- 2015-12-10 CN CN201510918181.0A patent/CN105467298A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201033625A (en) * | 2008-10-23 | 2010-09-16 | Nidec Read Corp | Printed circuit board testing fixture and printed circuit board testing system with the same |
| CN102236032A (en) * | 2010-05-07 | 2011-11-09 | 北京京东方光电科技有限公司 | Array detection equipment |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN102736017A (en) * | 2012-06-14 | 2012-10-17 | 中山市奇辉照明电器有限公司 | Fire-fighting lamp circuit board on-line dynamic tester and testing method |
| CN205333796U (en) * | 2015-12-10 | 2016-06-22 | 苏州世纪福智能装备股份有限公司 | No probe detecting system |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106093296A (en) * | 2016-05-27 | 2016-11-09 | 山东省农业科学院玉米研究所 | A kind of corn breeding single grain determination of water instrument |
| CN107677953A (en) * | 2017-09-29 | 2018-02-09 | 京东方科技集团股份有限公司 | A kind of probe system and its control method, lighting machine |
| CN108318805A (en) * | 2018-02-09 | 2018-07-24 | 宁波鄞州国康机械科技有限公司 | A kind of electronics integrated equipment |
| CN108318805B (en) * | 2018-02-09 | 2019-07-02 | 嵊州潘辰机械科技有限公司 | A kind of electronics integrated equipment |
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| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160406 |