CN105446135A - Self-adaptive calibration sampling direct current offset FPGA and intelligent control device - Google Patents
Self-adaptive calibration sampling direct current offset FPGA and intelligent control device Download PDFInfo
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Abstract
本发明提供一种自适应校准采样直流偏置的FPGA,包括第一、第二、第三运算器和逻辑位移器;第一运算器为减法运算器,其第一输入端与第二运算器的输出端及第三运算器的第一输入端均相连,第二输入端与逻辑位移器的输出端相连,输出端与第二运算器的第一输入端相连;第二运算器为加法运算器,其第二输入端与ADC相连,输出端与逻辑位移器的输入端相连;第三运算器为减法运算器,其第二输入端与ADC相连,输出端与外部的DSP芯片相连;逻辑位移器通过数据连线的偏移排列实现二进制数位移,且二进制数位移位数由ADC的采样频率决定。实施本发明,可自适应校准采样结果的直流偏置,省时省力,具有扩展性且利用工业批量生产。
The present invention provides a kind of FPGA of self-adaptive calibration sampling DC offset, comprises first, second, the 3rd computing unit and logic shifter; The output end of the third arithmetic unit is connected to the first input end of the third arithmetic unit, the second input end is connected to the output end of the logic shifter, and the output end is connected to the first input end of the second arithmetic unit; the second arithmetic unit is an addition operation The second input terminal is connected to the ADC, and the output terminal is connected to the input terminal of the logic shifter; the third arithmetic unit is a subtraction operator, the second input terminal is connected to the ADC, and the output terminal is connected to the external DSP chip; the logic The shifter realizes the binary number shift through the offset arrangement of the data connection, and the number of bits shifted by the binary number is determined by the sampling frequency of the ADC. The implementation of the present invention can self-adaptively calibrate the DC bias of the sampling result, save time and effort, have scalability and utilize industrial batch production.
Description
技术领域 technical field
本发明涉及电力系统装置智能化控制技术领域,尤其涉及一种自适应校准采样直流偏置的FPGA及智能控制装置。 The invention relates to the technical field of intelligent control of power system devices, in particular to an FPGA and an intelligent control device for self-adaptive calibration and sampling DC bias.
背景技术 Background technique
电力系统智能控制装置(如电能质量治理装置、谐波治理装置)需配置采样设备对目标电能参数及输出的电能参数进行采样,作为控制算法的基础和来源。然而,电能参数通常为几百伏特甚至到一万伏特的高等级电压,智能控制装置却能够直接处理的电压等级一般为5伏特到10伏特左右。 Power system intelligent control devices (such as power quality control devices, harmonic control devices) need to configure sampling equipment to sample target power parameters and output power parameters as the basis and source of control algorithms. However, the electrical energy parameter is usually a high-level voltage of several hundred volts or even 10,000 volts, but the voltage level that the intelligent control device can directly handle is generally about 5 volts to 10 volts.
因此,如图1所示,原始的电能参数信号(即高压信号)需经一级或多级PT/CT转换成低压采样信号后,再通过霍尔测量元件转换成ADC(数模转换器)采样芯片或板卡所能处理的电压信号。在FPGA芯片控制下,ADC采样芯片完成采样过程,并将采样到的电压信号交由FPGA芯片,进一步输出给智能控制装置的核心处理器DSP进行计算。 Therefore, as shown in Figure 1, the original electric energy parameter signal (that is, the high-voltage signal) needs to be converted into a low-voltage sampling signal by one or more stages of PT/CT, and then converted into an ADC (digital-to-analog converter) by a Hall measuring element. Sampling the voltage signal that the chip or board can handle. Under the control of the FPGA chip, the ADC sampling chip completes the sampling process, and delivers the sampled voltage signal to the FPGA chip, which is further output to the core processor DSP of the intelligent control device for calculation.
在上述转换和采样过程中,如果霍尔测量元件的供电电压供给不平衡或ADC芯片的参考电压不平衡,就会使得采样结果出现直流偏置。一旦直流偏置叠加在电力系统的工频50Hz之上,会给后续的控制算法带来非常不利的影响,例如过零点检测的相位偏差、有效值计算的偏移以及谐波分量计算的频谱分布错误等等。 During the above conversion and sampling process, if the power supply voltage supply of the Hall measuring element is unbalanced or the reference voltage of the ADC chip is unbalanced, a DC bias will appear in the sampling result. Once the DC bias is superimposed on the power frequency 50Hz of the power system, it will have a very adverse impact on the subsequent control algorithm, such as the phase deviation of zero-crossing detection, the offset of RMS calculation and the spectrum distribution of harmonic component calculation errors and so on.
为了解决上述转换和采样过程中存在的问题,通常使用标准信号源进行校准的方法。该方法为采用信号源输送一个标准的工频电压信号,然后统计分析最终得到的数字化信号,并待提取出直流分量后,手动调校采样器件的供电电压平衡和ADC芯片的参考电压平衡,或者在数字化以后的信号中,通过数字式的校正系数在原始的采样数值基础上减去校准计算得到的直流校正系数,获得没有直流偏置的采样结果,但是该方法的缺点在于:一、需要过多的人工干预,费时费力;二、不具有扩展性,不利于工业批量生产。 In order to solve the above-mentioned problems existing in the conversion and sampling process, a standard signal source is usually used for calibration. The method is to use a signal source to transmit a standard power frequency voltage signal, and then statistically analyze the final digitized signal, and after extracting the DC component, manually adjust the power supply voltage balance of the sampling device and the reference voltage balance of the ADC chip, or In the digitized signal, the DC correction coefficient calculated by calibration is subtracted from the original sampling value by the digital correction coefficient to obtain the sampling result without DC bias, but the disadvantages of this method are: 1. A lot of manual intervention is time-consuming and labor-intensive; second, it does not have scalability, which is not conducive to industrial mass production.
发明内容 Contents of the invention
本发明实施例所要解决的技术问题在于,提供一种自适应校准采样直流偏置的FPGA及智能控制装置,可自适应校准采样结果的直流偏置,省时省力,具有扩展性且利用工业批量生产。 The technical problem to be solved by the embodiments of the present invention is to provide an FPGA and an intelligent control device that can self-adaptively calibrate the sampling DC bias, which can self-adaptively calibrate the DC bias of the sampling results, save time and effort, have scalability and utilize industrial batch Production.
为了解决上述技术问题,本发明实施例提供了一种自适应校准采样直流偏置的FPGA,其与ADC采样芯片相配合,所述FPGA包括第一运算器、第二运算器、第三运算器以及逻辑位移器;其中, In order to solve the above technical problems, an embodiment of the present invention provides an FPGA for adaptively calibrating the sampling DC bias, which cooperates with the ADC sampling chip, and the FPGA includes a first arithmetic unit, a second arithmetic unit, and a third arithmetic unit and logical shifters; where,
所述第一运算器、第二运算器及第三运算器均具有两个输入端和一个输出端; The first computing unit, the second computing unit and the third computing unit each have two input terminals and one output terminal;
所述第一运算器为减法运算器,其第一输入端与所述第二运算器的输出端及所述第三运算器的第一输入端均相连,第二输入端与所述逻辑位移器的输出端相连,输出端与所述第二运算器的第一输入端相连; The first computing unit is a subtraction computing unit, and its first input terminal is connected to the output terminal of the second computing unit and the first input terminal of the third computing unit, and the second input terminal is connected to the logic displacement The output end of the device is connected, and the output end is connected with the first input end of the second arithmetic unit;
所述第二运算器为加法运算器,其第二输入端与所述ADC采样芯片相连,输出端与所述逻辑位移器的输入端相连; The second arithmetic unit is an addition unit, its second input terminal is connected with the ADC sampling chip, and its output terminal is connected with the input terminal of the logic shifter;
所述第三运算器为减法运算器,其第二输入端与所述ADC采样芯片相连,输出端与外部的DSP芯片相连; The third arithmetic unit is a subtraction unit, its second input terminal is connected with the ADC sampling chip, and its output terminal is connected with an external DSP chip;
所述逻辑位移器通过数据连线的偏移排列实现二进制数位移;其中,所述二进制数位移位数由所述ADC采样芯片的采样频率决定。 The logic shifter realizes the binary number shift through the offset arrangement of the data connection; wherein, the number of shifted bits of the binary number is determined by the sampling frequency of the ADC sampling chip.
其中,当所述ADC采样芯片的采样频率为20KHz时,所述逻辑位移器可实现16位二进制数右移。 Wherein, when the sampling frequency of the ADC sampling chip is 20KHz, the logic shifter can realize the right shift of 16-bit binary numbers.
其中,所述FPGA还包括寄存器,所述寄存器位于所述第二运算器的输出端及所述第三运算器的第一输入端之间,还与所述第一运算器的第一输入端及所述逻辑位移器的输入端均相连。 Wherein, described FPGA also comprises register, and described register is positioned between the output end of described second arithmetic unit and the first input end of described third arithmetic unit, also with the first input end of described first arithmetic unit and the input terminals of the logic shifter are connected.
本发明实施例还提供了一种智能控制装置,其包括前述的FPGA。 An embodiment of the present invention also provides an intelligent control device, which includes the aforementioned FPGA.
实施本发明实施例,具有如下有益效果: Implementing the embodiment of the present invention has the following beneficial effects:
在本发明实施例中,由于FPGA中逻辑位移器的二进制数位移位数由ADC采样芯片的采样频率决定,可通过第一运算器、第二运算器、第三运算器以及逻辑位移器模拟出ADC采样芯片直流偏置并自适应校准,因此省时省力,具有扩展性且利用工业批量生产。 In the embodiment of the present invention, since the binary number of the logic shifter in the FPGA is determined by the sampling frequency of the ADC sampling chip, it can be simulated by the first arithmetic unit, the second arithmetic unit, the third arithmetic unit and the logic shifter. The ADC sampling chip is DC biased and self-adaptively calibrated, so it saves time and effort, is scalable and utilizes industrial mass production.
附图说明 Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,根据这些附图获得其他的附图仍属于本发明的范畴。 In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those of ordinary skill in the art, obtaining other drawings based on these drawings still belongs to the scope of the present invention without any creative effort.
图1为现有技术中自适应校准采样直流偏置的FPGA的逻辑设计的结构示意图; Fig. 1 is the structural representation of the logical design of the FPGA of self-adaptive calibration sampling DC bias in the prior art;
图2为本发明实施例一提供的自适应校准采样直流偏置的FPGA的逻辑设计的结构示意图; FIG. 2 is a schematic structural diagram of the logic design of the FPGA for adaptively calibrating sampling DC bias provided by Embodiment 1 of the present invention;
图3为本发明实施例一提供的自适应校准采样直流偏置的FPGA中直流偏置提取的应用场景图; FIG. 3 is an application scene diagram of DC offset extraction in an FPGA for adaptively calibrating and sampling DC offset provided by Embodiment 1 of the present invention;
图4为本发明实施例一提供的自适应校准采样直流偏置的FPGA中直流偏置校准的应用场景图; FIG. 4 is an application scene diagram of DC offset calibration in an FPGA for adaptively calibrating sampling DC offset provided by Embodiment 1 of the present invention;
图中,1-第一运算器,2-第二运算器,3-第三运算器,4-逻辑位移器。 In the figure, 1-first computing unit, 2-second computing unit, 3-third computing unit, 4-logic shifter.
具体实施方式 detailed description
为使本发明的目的、技术方案和优点更加清楚,下面将结合附图对本发明作进一步地详细描述。 In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.
发明人发现,智能控制装置转换和采样过程中,可利用FPGA的硬件计算能力,在ADC采样结果传送到DSP之前,对其进行消除直流偏置处理。因此,提出在FPGA上构造一个等同于低通数字式滤波器的电路来提取直流分量,以某一截止频率进行滤波,得到满足电力系统设计条件的滤波结果,然后进行下一步的校准处理。 The inventors found that during the conversion and sampling process of the intelligent control device, the hardware computing capability of the FPGA can be used to eliminate the DC bias of the ADC sampling result before it is transmitted to the DSP. Therefore, it is proposed to construct a circuit equivalent to a low-pass digital filter on the FPGA to extract the DC component, perform filtering at a certain cut-off frequency, and obtain a filtering result that meets the design conditions of the power system, and then proceed to the next step of calibration.
该电路低通滤波器的原理为在ADC采样结果输入的数值序列x上,进行公式(1)的迭代计算,得到直流分量的序列y: The principle of the low-pass filter of this circuit is to perform iterative calculation of the formula (1) on the numerical sequence x input by the ADC sampling result to obtain the sequence y of the DC component:
(1) (1)
式(1)中,为滤波系数,其与截止频率的关系为:;其中,和分别为ADC采样芯片的采样周期和采样频率。 In formula (1), is the filter coefficient, which is related to the cut-off frequency The relationship is: ;in, and are the sampling period and sampling frequency of the ADC sampling chip, respectively.
直流分量y得到以后,采用公式(2)做一次减法,得到ADC采样结果输入数值序列x中的交流分量z,即得到没有直流偏置的采样结果: After the DC component y is obtained, use the formula (2) to do a subtraction to obtain the AC component z in the input value sequence x of the ADC sampling result, that is, to obtain the sampling result without DC bias:
(2) (2)
由于滤波系数为小数,经转换为整数后,可确定出采样结果的精度,并根据采样结果的精度利用FPGA的计算能力进行直流偏置自适应校准的实现。 Due to filter coefficient is a decimal, after being converted into an integer, the precision of the sampling result can be determined, and according to the precision of the sampling result, the calculation capability of the FPGA is used to realize the DC bias adaptive calibration.
以ADC采样芯片的采样频率=20KHz,采样周期=0.5ms为例,设计出截止频率=0.1Hz,得到滤波系数; Sampling frequency of ADC sampling chip =20KHz, sampling period =0.5ms as an example, design the cutoff frequency =0.1Hz, get the filter coefficient ;
滤波系数需要首先近似转换成整数为,由变换后的滤波系数可知,ADC采样芯片的精度为16位; filter coefficient needs to be first approximated into an integer as , by the transformed filter coefficient It can be seen that the precision of the ADC sampling chip is 16 bits;
因此,公式(1)可转变成公式(3): Therefore, formula (1) can be transformed into formula (3):
(3) (3)
并进一步将公式(3)改写成FPGA硬件计算所能够表达的计算公式(4): And further rewrite formula (3) into calculation formula (4) that can be expressed by FPGA hardware calculation:
(4) (4)
式(4)中,运算符“+”表示无符号的加法,在硬件电路中可以用运算器ADDER实现;运算符“-”表示无符号的减法,在硬件电路中使用运算器ADDER实现;运算符“》”表示二进制右移,在硬件电路中通过数据连线的偏移排列实现。 In formula (4), the operator "+" means unsigned addition, which can be realized by the arithmetic unit ADDER in the hardware circuit; the operator "-" means unsigned subtraction, which can be realized by the arithmetic unit ADDER in the hardware circuit; The symbol ">" means binary right shift, which is realized through the offset arrangement of the data connection in the hardware circuit.
综上所述,如图2所示,为本发明实施例一中,发明人提供的一种自适应校准采样直流偏置的FPGA,其与ADC采样芯片(未图示)相配合,FPGA包括第一运算器1、第二运算器2、第三运算器3以及逻辑位移器4;其中, In summary, as shown in Figure 2, in Embodiment 1 of the present invention, the inventor provides an FPGA for adaptively calibrating sampling DC bias, which cooperates with an ADC sampling chip (not shown), and the FPGA includes The first computing unit 1, the second computing unit 2, the third computing unit 3 and the logic shifter 4; wherein,
第一运算器1、第二运算器2及第三运算器3均具有两个输入端和一个输出端; The first computing unit 1, the second computing unit 2 and the third computing unit 3 each have two input terminals and one output terminal;
第一运算器1为减法运算器,其第一输入端与第二运算器2的输出端及第三运算器3的第一输入端均相连,第二输入端与逻辑位移器4的输出端相连,输出端与第二运算器2的第一输入端相连; The first computing unit 1 is a subtracting computing unit, its first input terminal is connected with the output terminal of the second computing unit 2 and the first input terminal of the third computing unit 3, and the second input terminal is connected with the output terminal of the logic shifter 4 connected, the output end is connected to the first input end of the second arithmetic unit 2;
第二运算器2为加法运算器,其第二输入端与ADC采样芯片相连,输出端与逻辑位移器4的输入端相连; The second computing unit 2 is an addition computing unit, its second input terminal is connected with the ADC sampling chip, and the output terminal is connected with the input terminal of the logic shifter 4;
第三运算器3为减法运算器,其第二输入端与ADC采样芯片相连,输出端与外部的DSP芯片(未图示)相连; The third arithmetic unit 3 is a subtraction unit, the second input end of which is connected to the ADC sampling chip, and the output end is connected to an external DSP chip (not shown);
逻辑位移器4通过数据连线的偏移排列实现二进制数位移;其中,二进制数位移位数由ADC采样芯片的采样频率决定。 The logic shifter 4 realizes the binary number shift through the offset arrangement of the data connection; wherein, the number of bits shifted by the binary number is determined by the sampling frequency of the ADC sampling chip.
应当说明的是,FPGA构建的截止频率根据ADC采样芯片的实际采样频率进行设计,当ADC采样芯片的实际采样频率为固定值时,则FPGA构建的截止频率也为固定值,从而可以得到滤波系数,进一步推导出ADC采样结果的精度,而逻辑位移器4二进制数位移的位数由上述ADC采样结果的精度决定,因此逻辑位移器4二进制数位移由ADC采样芯片的采样频率决定。 It should be noted that the FPGA build cutoff frequency According to the actual sampling frequency of the ADC sampling chip Design, when the actual sampling frequency of the ADC sampling chip is a fixed value, the cutoff frequency constructed by the FPGA is also a fixed value, so that the filter coefficient can be obtained , further deduce the accuracy of the ADC sampling result, and the number of digits shifted by the logic shifter 4 binary number is determined by the accuracy of the ADC sampling result, so the logic shifter 4 binary number displacement is determined by the sampling frequency of the ADC sampling chip.
以ADC采样芯片的采样频率=20KHz,采样周期=0.5ms为例,逻辑位移器4可实现16位二进制数右移。 Sampling frequency of ADC sampling chip =20KHz, sampling period =0.5ms as an example, logic shifter 4 can realize right shift of 16-bit binary number.
更进一步的,FPGA还包括寄存器5,寄存器5位于第二运算器2的输出端及第三运算器3的第一输入端之间,还与第一运算器1的第一输入端及逻辑位移器4的输入端均相连。 Furthermore, the FPGA also includes a register 5, which is located between the output terminal of the second operator 2 and the first input terminal of the third operator 3, and is also connected to the first input terminal of the first operator 1 and the logical displacement The input terminals of device 4 are connected.
如图3和图4所示,对本发明实施例一中的自适应校准采样直流偏置的FPGA的应用场景做进一步说明: As shown in Fig. 3 and Fig. 4, the application scenario of the FPGA with adaptive calibration sampling DC bias in Embodiment 1 of the present invention is further described:
图3中,直流分量计算中间结果t由寄存器mean_reg保存,运算器Add0完成公式(4)中的减法运算,计算得到,并将计算结果送到运算器Add1作为第一个输入;ADC采样芯片输入的数据x从sample端口进入运算电路,作为运算器Add1的一个输入;运算器Add1完成公式(4)中的加号算符,计算得到,结果传送到寄存器mean_reg完成对中间结果t的更新。 In Figure 3, the intermediate result t of the DC component calculation is saved by the register mean_reg, and the operator Add0 completes the subtraction operation in formula (4), and the calculation is , and send the calculation result to the operator Add1 as the first input; the data x input by the ADC sampling chip enters the operation circuit from the sample port as an input of the operator Add1; the operator Add1 completes the plus sign in formula (4) operator, calculated , the result is transferred to the register mean_reg to complete the update of the intermediate result t.
图4中,直流分量y提取完成以后,校准以后的结果可以在直流分量的基础上再进行一次数学运算得到,通过端口acresult完成输出。 In Figure 4, after the extraction of the DC component y is completed, the result after calibration It can be obtained by performing another mathematical operation on the basis of the DC component, and the output is completed through the port acresult.
相对于本发明实施例一,本发明实施例二提供了一种智能控制装置,该智能控制装置包括本发明实施例一的自适应校准采样直流偏置的FPGA,具有与本发明实施例一中自适应校准采样直流偏置的FPGA相同构造及连接关系,因此在此不再一一赘述。 Compared with Embodiment 1 of the present invention, Embodiment 2 of the present invention provides an intelligent control device, which includes the FPGA for adaptively calibrating and sampling DC bias in Embodiment 1 of the present invention, and has the same characteristics as in Embodiment 1 of the present invention. The structure and connection relationship of the FPGA for adaptively calibrating the sampling DC bias are the same, so details will not be repeated here.
实施本发明实施例,具有如下有益效果: Implementing the embodiment of the present invention has the following beneficial effects:
在本发明实施例中,由于FPGA中逻辑位移器的二进制数位移位数由ADC采样芯片的采样频率决定,可通过第一运算器、第二运算器、第三运算器以及逻辑位移器模拟出ADC采样芯片直流偏置并自适应校准,因此省时省力,具有扩展性且利用工业批量生产。 In the embodiment of the present invention, since the binary number of the logic shifter in the FPGA is determined by the sampling frequency of the ADC sampling chip, it can be simulated by the first arithmetic unit, the second arithmetic unit, the third arithmetic unit and the logic shifter. The ADC sampling chip is DC biased and self-adaptively calibrated, so it saves time and effort, is scalable and utilizes industrial mass production.
以上所揭露的仅为本发明一种较佳实施例而已,当然不能以此来限定本发明之权利范围,因此依本发明权利要求所作的等同变化,仍属本发明所涵盖的范围。 The above disclosure is only a preferred embodiment of the present invention, which certainly cannot limit the scope of rights of the present invention. Therefore, equivalent changes made according to the claims of the present invention still fall within the scope of the present invention.
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