CN105445689A - Metering calibration method for asymmetric components of switch long time delay testing stand - Google Patents

Abstract

The invention relates to a metering calibration method for asymmetric components of a switch long time delay testing stand, being able to measure the waveform distortion factor under a maximum output current, for a long time delay tripping characteristic testing stand, and being able to measure the asymmetric components of the output current through the waveform distortion factor. The metering calibration method for asymmetric components of a switch long time delay testing stand only analyzes the asymmetric content of the output current of a long time delay tripping characteristic testing stand through a simple waveform, and cannot accurately meter the asymmetric content. The metering calibration method can meter and calculate the asymmetric content of the output current of the long time delay tripping characteristic testing stand; and in a book Test and Detection of Low Voltage Electric Appliance, the distortion factor of a test power supply is prescribed to be less than or equal to 5% so that the prescribed limit value is 5%. The metering calibration method can determine whether the long time delay tripping characteristic testing stand accords with national standard.

Description

A measurement and calibration method for the asymmetric component of the switch long-delay test bench

technical field

The invention belongs to the field of electrical testing equipment, in particular to a method for measuring and calibrating the asymmetric component of a switch long-delay test bench.

Background technique

The measurement of asymmetrical components is an important measurement and calibration index of the long-time switch action characteristic test bench, which ensures that the characteristic test bench meets the requirements of national standards during 3C certification and factory inspection of circuit breakers and other products. However, the calibration lacks certain norms and operation standardization and unified steps, which has caused great obstacles to the operator in the actual calibration process, not only affecting the work efficiency, but also causing large errors in many test benches, and even causing damage to the test bench. . Therefore, the problem to be solved urgently is to seek a measurement and calibration method for the asymmetric component of the switch long-delay test bench with better applicability.

Clause GB14048.2-20088.3.3.1.3 clearly stipulates that when conducting the breaking characteristic test under overload conditions, it is required that the test current should have no asymmetrical component. According to the requirements of national standards, it is necessary to measure and evaluate the symmetrical component of the output current of the long-delay characteristic test bench. The existing measurement and calibration method of the characteristic test bench is only for the calibration of transformers and display instruments, and cannot evaluate this technology. index. In the domestic and foreign specifications, there is no clear measurement method for the asymmetric component of the long-time delay test bench.

Contents of the invention

The purpose of the present invention is to overcome the deficiencies of the prior art, to provide a switch long-delay test bench that ensures that the existing characteristic test bench is more in line with the requirements of national standards, and that the performance of components such as circuit breakers is more superior. Metrological Calibration Method for Symmetrical Components.

The present invention solves its technical problem and realizes by taking the following technical solutions:

A method for measuring and calibrating the asymmetrical component of a switch long-delay test bench. For a long-delay tripping characteristic test bench, the waveform distortion degree under the maximum output current is measured, and the asymmetrical component of the output current is measured through the waveform distortion degree.

Moreover, the measurement method is: after the current output of the test bench is stable, measure the waveform and distortion of the output current, measure 5 sets of values, and take the maximum value of the data in the 5 sets of data, and the maximum value is within 5%.

Advantage and positive effect of the present invention are:

The method for measuring and calibrating the asymmetric component of the switch long-delay test bench provided by the present invention can only analyze the asymmetric content of the output current of the long-delay trip characteristic test bench through simple waveform analysis, and cannot accurately measure its content. Through the above method, the asymmetric content of the output current of the long-delay tripping characteristic test bench can be measured and calculated. In the book "Test and Inspection of Low-Voltage Electrical Appliances", it is stipulated that the distortion degree of the test power supply is ≤5%, so the limit value is specified 5%. Through this method, it can be judged whether the long-delay tripping characteristic test bench complies with the national standard.

Description of drawings

Figure 1 is a block diagram of the wiring structure of the switch long-delay test bench.

detailed description

The present invention will be further described in detail below in conjunction with the accompanying drawings and through specific embodiments. The following embodiments are only descriptive, not restrictive, and cannot limit the protection scope of the present invention.

A method for measuring and calibrating the asymmetrical component of the switch long-delay test bench. For the long-delay tripping characteristic test bench, the waveform distortion degree under the maximum output current is measured, and the asymmetric component measurement of the output current is measured by the waveform distortion degree. The method is: after the current output of the test bench is stable, measure the waveform and distortion of the output current, measure 5 sets of values, take the maximum value of the data in the 5 sets of data, and the maximum value is within 5%.

In the book "Test and Inspection of Low-Voltage Electrical Appliances", it is stipulated that the distortion degree of the test power supply is ≤5%, so the limit value is 5%. Through this method, it can be judged whether the long-delay tripping characteristic test bench complies with the national standard.

Although the embodiments and drawings of the present invention are disclosed for the purpose of illustration, those skilled in the art can understand that various replacements, changes and modifications are possible without departing from the spirit and scope of the present invention and the appended claims Therefore, the scope of the present invention is not limited to what is disclosed in the embodiments and drawings.

Claims (2)

1. A method for measuring and calibrating the asymmetric component of a switch long-time-delay test bench, characterized in that: for the long-time-delay tripping characteristic test bench, measure the waveform distortion degree under the maximum output current, and measure the output by the waveform distortion degree Asymmetrical components of current. 2. The method for measuring and calibrating the asymmetric component of the switch long-time-delay test bench according to claim 1, characterized in that: the measuring method is: after the test bench current output is stable, measure the waveform and distortion of the output current, measure For 5 sets of values, take the maximum value of the data in the 5 sets of data, and the maximum value is within 5%.