CN105444817A - Readout circuit of resistive composite sensor array, and readout method thereof - Google Patents

Abstract

The invention discloses a readout circuit of a resistive composite sensor array, which belongs to the technical field of sensors. The present invention aims at the problem of the data reading speed of the two-dimensional array composed of resistive composite sensors containing an odd number of two-terminal resistive sensitive units. Based on the dual voltage feedback method, the array structure and the corresponding readout circuit are designed. The detection can read the resistance values of two resistive units sensitive to different physical quantities in the same resistive composite sensor, thereby greatly improving the data detection speed of the sensor array and effectively reducing the complexity of the sensing system. The invention also discloses a readout method of the readout circuit. Compared with the prior art, the detection speed of the present invention is faster, and some resistive sensitive units to be tested that require high-frequency detection can be detected multiple times in one scan. In addition, the circuit complexity and implementation of the present invention The cost is lower.

Description

Readout Circuit and Readout Method of Resistive Composite Sensor Array

technical field

The invention relates to the technical field of sensors, in particular to a readout circuit of a resistive composite sensor array and a readout method thereof.

Background technique

The array sensing device is to combine multiple sensing elements with the same performance according to the structure of a two-dimensional array. It can change or generate corresponding shapes and characteristics by detecting changes in parameters focused on the array. This feature is widely used in biosensing, temperature tactile and thermal imaging based on infrared sensors, etc.

Resistive sensing arrays are widely used in infrared imaging simulation systems, force tactile sensing and temperature tactile sensing. Taking temperature touch as an example, since the temperature sensing device involves the transfer of heat and the perception of temperature, in order to obtain the thermal properties of the object, the device puts forward higher requirements for the temperature measurement accuracy and resolution, and in order to further obtain the different positions of the object The thermal properties exhibited by the material put forward higher spatial resolution requirements for the temperature sensing device.

The quality or resolution of a resistive sensing array needs to be increased by increasing the number of sensors in the array. However, when the scale of the sensor array increases, it becomes difficult to collect information and process signals for all components. Generally, all resistive sensors in an M×N array need to be accessed one by one, and each resistive sensor has two ports, requiring 2×M×N connecting lines in total. This connection method is not only complicated to connect, but also can only select a single resistance to be tested each time, the scanning speed is slow, the cycle is long, and the efficiency is low. In order to reduce the complexity of device interconnection, a two-dimensional array of shared row and column lines can be introduced, and the scan controller can be combined with a single operational amplifier circuit and a multiplexer. However, only a single resistance to be measured can be realized. Therefore, how to simultaneously select multiple resistances to be measured in each scan has become a difficult problem to be overcome.

Regarding the detection research of resistive sensing arrays, in 2006, R.S.Saxena et al. proposed an array detection technology based on infrared thermal imaging. The test structure is based on the configuration of resistive sensing networks. Based on the linearity and homogeneity of resistance, the compensation network theorem and The superposition network theorem develops a theoretical model of this resistive network. Using a 16×16 array network bolometer array for verification, only 32 pins are used, it has been confirmed that the model can effectively distinguish device damage or small changes in device value, it has a certain accuracy, but there is still a problem in detection speed technical flaws. In 2009, Y.J.Yang et al. proposed a 32×32 array of temperature and tactile sensing arrays for the artificial skin of the robotic arm. A multiplexer was added to the array network, and the speed of row selection and column selection was greatly accelerated. The maximum detection The rate can reach 3000 sensing units per second, but the detection of this array can only detect a single unit to be tested each time, and the detection efficiency becomes the biggest technical bottleneck.

A Chinese invention patent (CN201110148963.2) discloses an array temperature tactile sensing device, which uses a resistance sensing array to realize temperature tactile sensing, and its feedback drive isolation circuit selects the voltage of the line where the resistance to be measured is located. The terminal voltage VSG after the device is fed back to the non-selected row lines and column lines. Although the accuracy is improved to a certain extent, there is no breakthrough in the detection speed. Another Chinese invention patent CN201410183065 "A detection circuit for a resistive sensor array with enhanced voltage feedback", which combines a scan controller, a feedback circuit, a row multiplexer and a column multiplexer on the basis of the patent CN201110148963.2 The feedback circuit is composed of a single operational amplifier and a voltage divider circuit. The resistors R1 and R2 in the voltage divider circuit are resistors with specific resistance values, and the ratio of the resistor R1 to the resistor R2 is limited to R1:R2=Rr:Rs, Among them, Rr represents the channel internal resistance of the row multiplexer, and Rs represents the sampling resistance. Although this method can effectively reduce the interference of the adjacent column resistance of the resistance to be measured and the internal resistance of the column multiplexer on the measurement of the measured resistance, and significantly improve its measurement accuracy, it still only selects a single resistance to be measured each time. , so in the detection speed, further improvement is needed.

With the development of sensor technology, a class of resistive composite sensors has emerged. Each sensor is composed of multiple two-terminal resistive sensitive units, which can simultaneously detect multiple identical or different physical quantities. For a sensor array composed of such resistive composite sensors, if the traditional voltage feedback method is used for scanning measurement, only the resistance of a single resistive sensitive unit can be obtained in a single measurement, and the detection speed is low. In addition, since the number of resistive sensitive units in the sensor array is larger, it also brings about the problem that the number of wiring required to form the array is too large and the complexity is too high.

Contents of the invention

The technical problem to be solved by the present invention is to overcome the deficiencies in the prior art, provide a readout circuit and a readout method of a resistive composite sensor array, and aim at a two-dimensional array composed of resistive composite sensors, based on the dual voltage feedback method , increase the number of resistive sensitive units that can be read in a single detection, thereby increasing the detection speed and effectively reducing the complexity of the sensing system.

A readout circuit of a resistive composite sensor array, the resistive composite sensor array is a two-dimensional array composed of M×N resistive composite sensors; each resistive composite sensor includes 2K+1 two-terminal resistive Sensitive unit, one end of each resistive sensitive unit is connected to the common terminal of the resistive composite sensor, and the other end is an independent terminal, each resistive composite sensor has a total of 2K+2 endpoints; the common terminal of the resistive composite sensor in the same column The end points are connected to each other to form the shared column line of the resistive composite sensor in the column, and the other ends of the i-th resistive sensitive unit in the same row of resistive composite sensors are connected to each other to form the i-th shared row line of the resistive composite sensor in the row , i=1, 2,..., 2K+1; K is a non-zero natural number; the readout circuit includes: a row multiplexer, a column multiplexer, a scan controller, a first voltage feedback drive circuit, a first Two voltage feedback drive circuits, sampling resistors, and test voltage input terminals; one end of the sampling resistors is grounded, and the other end is connected to the input terminal of the first voltage feedback drive circuit; the 2K+1 common row lines of each row of resistive composite sensors are pre-connected according to the same The grouping method is divided into two groups; for the common row lines belonging to the first group, the row multiplexer can make any one of the common row lines connected to the test voltage input terminal under the control of the scan controller and feedback with the second voltage The output terminal of the driving circuit is disconnected, or connected with the output terminal of the second voltage feedback driving circuit and disconnected with the input terminal of the test voltage; for the shared row lines belonging to the second group, the row multiplexer can be used in the scanning controller Under control, any one of the shared row lines is connected to the input terminal of the first voltage feedback driving circuit and disconnected from the output terminal of the second voltage feedback driving circuit, or is connected to the output terminal of the second voltage feedback driving circuit and connected to the output terminal of the second voltage feedback driving circuit. The input terminal of the first voltage feedback drive circuit is disconnected; the column multiplexer can make any common column line connected with the input terminal of the second voltage feedback drive circuit under the control of the scan controller to connect with the first voltage feedback drive circuit The output terminal of the first voltage feedback driving circuit is disconnected, or connected with the output terminal of the first voltage feedback driving circuit and disconnected with the input terminal of the second voltage feedback driving circuit.

Preferably, the first voltage feedback drive circuit includes a first operational amplifier and a first drive circuit, the inverting input terminal of the first operational amplifier is connected to the output terminal of the first operational amplifier and the input terminal of the first drive circuit, and the second The non-inverting input terminal of an operational amplifier and the output terminal of the first driving circuit are respectively used as the input terminal of the first voltage feedback driving circuit and the output terminal of the first voltage feedback driving circuit; the second voltage feedback driving circuit includes a second operational amplifier and the second driving circuit, the inverting input end of the second operational amplifier is connected with the output end of the second operational amplifier and the input end of the second driving circuit, the non-inverting input end of the second operational amplifier and the output end of the second driving circuit are respectively As the input terminal of the second voltage feedback driving circuit and the output terminal of the second voltage feedback driving circuit.

Preferably, the 2K+1 common row lines of each row of resistive composite sensors are divided into two groups whose numbers are K and K+1 respectively.

Preferably, the row multiplexer includes M(2K+1) two-way analog switches corresponding one-to-one to the M(2K+1) shared row lines of the resistive composite sensor array; In the grouping situation, the M(2K+1) two-choice one-way analog switches are divided into corresponding two groups; for each two-choice one-way analog switch in the first group, its common input/output port corresponds to The shared row line connection of the two independent input/output terminals is respectively connected with the test voltage input terminal and the output terminal of the second voltage feedback driving circuit, and its control signal input terminal is connected with the scan controller; for each of the second group A two-way alternative to one bidirectional analog switch, its common input/output end is connected to the corresponding common row line, and its two independent input/output ends are respectively connected to the input end of the first voltage feedback driving circuit and the second voltage feedback driving circuit. The output end is connected, and its control signal input end is connected with the scanning controller.

Preferably, the column multiplexer includes N two-to-one bidirectional analog switches corresponding one-to-one to the N shared column lines of the resistive composite sensor array; for each two-to-one bidirectional analog switch, its common input/ The output terminal is connected to the corresponding common column line, and its two independent input/output terminals are respectively connected to the output terminal of the first voltage feedback driving circuit and the input terminal of the second voltage feedback driving circuit, and its control signal input terminal is connected to the scan control device connection.

As in the readout method of the readout circuit described in any one of the above technical solutions, the scan controller controls the column multiplexer, so that the common column line of the currently scanned column resistive composite sensor is connected to the input end of the second voltage feedback drive circuit. It is disconnected from the output terminal of the first voltage feedback driving circuit, and the remaining common column lines are connected to the output terminal of the first voltage feedback driving circuit and disconnected from the input terminal of the second voltage feedback driving circuit; at the same time, the scanning controller controls the rows The multiplexer is used to connect the common row line belonging to the first group among the 2K+1 shared row lines corresponding to the current scanning line resistive composite sensor to the test voltage input terminal, and the corresponding row resistive composite sensor One shared row line belonging to the second group among the 2K+1 shared row lines is connected to the input terminal of the first voltage feedback drive circuit, and all other shared row lines in the resistive composite sensor array are connected to the second voltage feedback drive circuit Then use the following formula to obtain the resistance value R1 of the resistive sensitive unit corresponding to the common row line connected to the test voltage input terminal in the resistive composite sensor at the intersection of the current scanning row and column, and The resistance value R2 of the resistive sensitive unit corresponding to the common row line connected to the input end of the first voltage feedback drive circuit:

$\left\{\begin{array}{c}\mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 1</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; I</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&Center\; Dot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\\ \mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 2</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&Center\; Dot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\end{array}\right.$

In the formula, VI is the test voltage input by the test voltage input terminal, V _S1 is the input terminal voltage of the first voltage feedback driving circuit, V _S2 is the input terminal voltage of the second voltage feedback driving circuit, and R _{S is} the sampling resistor resistance value.

According to the same inventive idea, the following technical solutions can also be obtained:

A sensing device, comprising a resistive composite sensor array and a readout circuit, the resistive composite sensor array is a two-dimensional array composed of M×N resistive composite sensors; each resistive composite sensor includes 2K+1 Two-terminal resistive sensitive units, one end of each resistive sensitive unit is connected to the common terminal of the resistive composite sensor, and the other end is an independent terminal, and each resistive composite sensor has a total of 2K+2 terminals; the same column resistance The common endpoints of the resistive composite sensors are connected to each other to form the common column line of the resistive composite sensor, and the other ends of the i-th resistive sensitive unit in the same row of resistive composite sensors are connected to each other to form the row of resistive composite sensors. i shared row lines, i=1, 2, ..., 2K+1; K is a non-zero natural number; the readout circuit is the readout circuit described in any technical solution above.

Each resistive composite sensor may include 2K+1 two-terminal resistive sensitive units sensitive to the same physical quantity, or may include 2K+1 two-terminal resistive sensitive units sensitive to different physical quantities. The latter is preferred, so that multiple different physical quantities (such as temperature, pressure, light intensity, etc.) can be detected simultaneously.

Compared with the prior art, the present invention has the following beneficial effects:

1. The present invention is aimed at the detection needs of the resistive composite sensor array. Under the premise of not destroying the structure of the resistive composite sensor array and not interrupting the normal operation of the sensor array, the internal detection of a certain resistive composite sensor on any row or column Any two resistive sensitive units can be detected at the same time, which improves the detection speed.

2. The inspection speed of the present invention is improved and the cycle is shortened, which can effectively reduce the impact of time on the sensor array. At the same time, for the resistive sensitive unit to be tested that is sensitive to physical quantities, when the physical properties change rapidly, the circuit of the present invention can be more accurate. Quickly detect the change and complete the measurement of the change.

3. For some resistive sensitive units to be tested that require high-frequency detection in the resistive composite sensor array, the present invention can realize the detection of one or some of the resistive composite sensors in the array by changing the programming of the scanning controller. The resistive sensitive unit is tested multiple times at a high frequency, and a high scanning speed can be ensured while completing the detection of all other resistive sensitive units to be tested.

4. The present invention adopts a dual-voltage feedback driving circuit, and on the premise of ensuring measurement accuracy, it reduces the number of wiring between devices and reduces the cost of the circuit to a certain extent.

5. The present invention adopts a resistive composite sensor array sharing row lines and column lines, and distributes them two-dimensionally in an M×N manner. Taking a resistive composite sensor array containing three resistive sensitive units in each sensor as an example, a total of 3×M×N resistive sensitive units, the invention can reduce the number of connections to 3M+N, reduces the complexity of device interconnection, and ensures that each resistive composite sensor in the array includes each internal A resistive sensitive cell has a unique combination of row and column access.

Description of drawings

1 is a schematic diagram of a resistive composite sensor array sharing row lines (X lines, Y lines, Z lines) and column lines (O lines);

Fig. 2 is a schematic circuit diagram of a specific embodiment of the present invention;

Fig. 3 is a schematic diagram of the area division of the resistive composite sensor array when detecting the resistive sensitive unit to be tested;

Fig. 4 is the circuit schematic diagram of the same row as the resistive composite sensor where the resistive sensitive unit to be measured is located when the readout circuit of the present invention works;

Fig. 5 is a schematic circuit diagram of the same resistive composite sensor where the resistive sensitive unit to be measured is located when the readout circuit of the present invention works;

Fig. 6 is the schematic circuit diagram of the non-selected row and non-selected column resistive compound sensor array when the readout circuit of the present invention works;

Fig. 7 is the simplified schematic diagram of the circuit when the readout circuit of the present invention works;

FIG. 8 is a schematic diagram of circuit and area division according to another embodiment of the present invention.

The meanings of the symbols in the figure are as follows:

1. Resistive compound sensor array, 2. X and Y unit row multiplexer, 3. Z unit row multiplexer, 4. Column multiplexer, 5. Scan controller voltage, 6. First voltage Feedback drive circuit, 7, second voltage feedback drive circuit, 8, X unit row multiplexer Y, 9, Z unit row multiplexer.

detailed description

The present invention aims at the data reading speed problem of a two-dimensional array composed of resistive composite sensors with an odd number of resistive sensitive units in each sensor, and designs an array structure and a corresponding readout circuit based on a dual-voltage feedback method. This detection can read the resistance values of two different resistive sensitive units in the same resistive composite sensor, thereby greatly improving the data detection speed of the sensor array and effectively reducing the complexity of the sensing system.

The technical scheme adopted in the present invention is specifically as follows:

A readout circuit of a resistive composite sensor array, the resistive composite sensor array is a two-dimensional array composed of M×N resistive composite sensors; each resistive composite sensor includes 2K+1 two-terminal resistive Sensitive unit, one end of each resistive sensitive unit is connected to the common terminal of the resistive composite sensor, and the other end is an independent terminal, each resistive composite sensor has a total of 2K+2 endpoints; the common terminal of the resistive composite sensor in the same column The end points are connected to each other to form the shared column line of the resistive composite sensor in the column, and the other ends of the i-th resistive sensitive unit in the same row of resistive composite sensors are connected to each other to form the i-th shared row line of the resistive composite sensor in the row , i=1, 2,..., 2K+1; K is a non-zero natural number; the readout circuit includes: a row multiplexer, a column multiplexer, a scan controller, a first voltage feedback drive circuit, a first Two voltage feedback drive circuits, sampling resistors, and test voltage input terminals; one end of the sampling resistors is grounded, and the other end is connected to the input terminal of the first voltage feedback drive circuit; the 2K+1 common row lines of each row of resistive composite sensors are pre-connected according to the same The grouping method is divided into two groups; for the common row lines belonging to the first group, the row multiplexer can make any one of the common row lines connected to the test voltage input terminal under the control of the scan controller and feedback with the second voltage The output terminal of the driving circuit is disconnected, or connected with the output terminal of the second voltage feedback driving circuit and disconnected with the input terminal of the test voltage; for the shared row lines belonging to the second group, the row multiplexer can be used in the scanning controller Under control, any one of the shared row lines is connected to the input terminal of the first voltage feedback driving circuit and disconnected from the output terminal of the second voltage feedback driving circuit, or is connected to the output terminal of the second voltage feedback driving circuit and connected to the output terminal of the second voltage feedback driving circuit. The input terminal of the first voltage feedback drive circuit is disconnected; the column multiplexer can make any common column line connected with the input terminal of the second voltage feedback drive circuit under the control of the scan controller to connect with the first voltage feedback drive circuit The output terminal of the first voltage feedback driving circuit is disconnected, or connected with the output terminal of the first voltage feedback driving circuit and disconnected with the input terminal of the second voltage feedback driving circuit.

In the readout method of the readout circuit as described above, the scan controller controls the column multiplexer so that the common column line of the currently scanned column resistive composite sensor is connected to the input end of the second voltage feedback drive circuit and connected to the first voltage The output terminal of the feedback drive circuit is disconnected, and the other common column lines are connected with the output terminal of the first voltage feedback drive circuit and disconnected with the input terminal of the second voltage feedback drive circuit; at the same time, the scan controller controls the row multiplexer , so that one of the 2K+1 shared row lines corresponding to the resistive composite sensor in the current scanning row and belonging to the first group is connected to the test voltage input terminal, and the 2K+1 shared row lines corresponding to the resistive composite sensor in this row One of the common row lines belonging to the second group is connected to the input terminal of the first voltage feedback driving circuit, and all other common row lines in the resistive composite sensor array are connected to the output terminals of the second voltage feedback driving circuit Then use the following formula to obtain the resistance value R1 of the resistive sensitive unit corresponding to the common row line connected to the test voltage input terminal in the resistive composite sensor at the intersection of the current scanning row and column, and the resistance value R1 related to the first voltage feedback The resistance value R2 of the resistive sensitive unit corresponding to the common row line connected to the input terminal of the driving circuit:

$\left\{\begin{array}{c}\mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 1</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; I</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&Center\; Dot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\\ \mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 2</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&CenterDot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\end{array}\right.$

In the formula, VI is the test voltage input by the test voltage input terminal, V _S1 is the input terminal voltage of the first voltage feedback driving circuit, V _S2 is the input terminal voltage of the second voltage feedback driving circuit, and R _{S is} the sampling resistor resistance value.

In order to facilitate the public's understanding, the technical solution of the present invention will be further described in detail below by taking the simplest resistive composite sensor array with each sensor including three resistive sensitive units as an example, and in conjunction with the accompanying drawings.

The resistive composite sensor array (M*N) structure in the present embodiment is as shown in Figure 1, and it is the two-dimensional array that is made of M*N resistive composite sensors, and it shares row line (X line, Y line, Z line) and column line (O line), row line (X line, Y line, Z line) are all orthogonal to the column line (O line). Each resistive composite sensor in the array has three resistive sensing units (R _x , R _y , R _z ), one end of the three resistive sensing units is connected to the common terminal (O line), and each has a Independent connection terminals (X line, Y line, Z line). M×N resistive composite sensors are connected two-dimensionally in the way of sharing row and column lines, M is the number of rows, N is the number of columns, the O lines of each column are connected together, there are N column lines in total, and the X lines of each row are connected in Together, the Y lines of each row are connected together, and the Z lines of each row are connected together. There are 3M row lines in total. Each resistive sensitive unit in each resistive composite sensor in the array has a unique row line and A combination of column lines. In this way, each resistive composite sensor is distributed according to the two-dimensional structure of M×N, and only 3M+N wires are needed to ensure that the specific resistive sensitive unit in any specific resistive composite sensor can Access is achieved by controlling the appropriate combination of row and column lines. According to the two-dimensional array structure distribution of M×N, where M is the number of rows and N is the number of columns, the resistive sensitive units of the X unit, Y unit, and Z unit in the resistive composite sensor in the i-th row and j-th column Represented by R _xij , R _yij , R _zij respectively, where i=1, 2, ..., M, j = 1, 2, ..., N.

Based on the resistive composite sensor array shown in Figure 1, a specific embodiment of the sensing device constructed by the present invention is shown in Figure 2 (taking R _x11 and R _z11 as the resistive sensitive unit to be measured as an example). As shown in Figure 2, the sensing device includes a resistive composite sensor array 1 sharing row lines (X lines, Y lines, Z lines) and column lines (O lines), and a readout circuit, which includes : X and Y unit row multiplexer 2, Z unit row multiplexer 3, column multiplexer 4, scan controller 5, first voltage feedback drive circuit 6, second voltage feedback drive circuit 7. In this embodiment, X-lines, Y-lines, and Z-lines are divided into two groups, one group is X-lines and Y-lines, and the other group is Z-lines. In order to simplify the circuit and reduce the cost, the X and Y unit row multiplexers 2, the Z unit row multiplexers 3, and the column multiplexers 4 in this embodiment respectively adopt 2M, M, and N secondary selectors A bidirectional analog switch (such as the most common controllable single-pole double-throw switch) is constructed, and the control terminals of each alternative bidirectional analog switch are connected to and controlled by the scanning controller 5 .

As shown in Figure 2, the common input/output terminals x _ri terminals (i=1, 2, . The M X lines of the sensor array are connected in one-to-one correspondence, and one of the independent input/output terminals a _r1 , a _r2 , ..., a _rM of the M two-way analog switches is connected to the test voltage V _I , and the other is independently The input/output ends b _r1 , b _r2 , ..., b _rM are connected to the output end of the second voltage feedback drive circuit 7; the other M two-to-one bidirectional analog switches in the X and Y unit row multiplexers 2 are common The input/output terminal y _ri terminal (i=1, 2, ..., M) is connected to the M Y lines of the resistive composite sensor array in one-to-one correspondence, and one of the M two-to-one bidirectional analog switches is independently input/output The terminals c _r1 , c _r2 , ..., c _rM are connected to the test voltage V _I , and the other independent input/output terminals d _r1 , d _r2 , ..., d _rM are connected to the output terminal of the second voltage feedback drive circuit 7; The common input/output terminal z _ri end (i=1, 2, . One-to-one correspondence connection, one of the independent input/output terminals e _r1 , e _r2 , ..., e _rM of the M two-to-one bidirectional analog switches is connected to the output terminal of the second voltage feedback drive circuit 7, and the other independent input/output terminal The output terminals f _r1 , f _r2 ,..., f _rM terminals are connected to the input terminals of the first voltage feedback drive circuit 6; the common input/output terminals o _cj terminals of the N two-to-one bidirectional analog switches of the column multiplexer 4 (j=1, 2, ..., N) are connected to the N O lines of the resistive composite sensor array in one-to-one correspondence, and one of the N independent input/output terminals a _c1 , a _c2 , _{Terminals . . .} The scan controller 4 outputs scan control signals to control the connection mode of the ports in each multiplexer. The X and Y unit row multiplexers 2 control the x _ri terminal and the a _ri terminal or Connected to b _ri terminal, y _ri terminal connected to c _ri terminal or d _ri terminal; Z unit row multiplexer 3 controls z unit row control signal to control z _ri terminal to communicate with e _ri terminal or f _ri terminal; The column multiplexer 4 controls the o _cj terminal to communicate with the a _cj terminal or the b _cj terminal through the column control signal. In this way, any two resistive sensitive units to be tested in the resistive composite sensor located in row i and column j in the array can be simultaneously selected for simultaneous detection, and all resistive sensitive units to be tested in the array can be traversed.

As shown in Figure 2, the first voltage feedback driving circuit 6 in this embodiment includes an operational amplifier 1 (AMP1) and a driving circuit 1 (Drive1), and the non-inverting input terminal of the operational amplifier 1 is used as the input of the first voltage feedback driving circuit 6 terminal, and the input terminal of the first voltage feedback drive circuit 6 is connected to one end of the sampling resistor Rs, the other end of the sampling resistor Rs is grounded, and the output terminal of the first voltage feedback drive circuit 6 is connected to the inverting input terminal of the operational amplifier 1 , while the output end of the first voltage feedback driving circuit 6 is connected to the input end of the driving circuit 1 and ADC1; the second voltage feedback driving circuit 7 includes an operational amplifier 2 (AMP2) and a driving circuit 2 (Drive2), and the non-inverting input of the operational amplifier 2 terminal is used as the input terminal of the second voltage feedback driving circuit 7, and its inverting input terminal is connected to the output terminal to form feedback, and at the same time, the output terminal of the operational amplifier 2 is connected to the input terminal of the driving circuit 2 and ADC2.

Figure 3 shows the area division of the resistive composite sensor array when detecting the resistive sensitive unit to be tested, and this figure takes R _x11 and R _z11 as the resistive sensitive unit to be tested as an example. As shown in Figure 3, the X line of the resistive composite sensor located in the first row and the first column is connected to the a _r1 end of the X and Y unit row multiplexers, and the Y line is connected to the X and Y unit row multiplexer terminals. The d _r1 end is connected, the Z line is connected with the f _r1 end of the row multiplexer of the Z unit, and the O line is connected with the b _c1 end of the column multiplexer. At this time, R _x11 and R _z11 are selected for measurement. The invention can simultaneously scan the two resistive sensitive units to be tested. The resistive composite sensor array is divided into 4 regions by the resistive composite sensor where the resistive sensitive units _Rx11 and _Rz11 are located:

1) Area I: The resistive sensitive units R _x11 and R _z11 to be tested are located in the resistive composite sensor in the first row and first column. At this time, the x _r1 end of the row 1 where the independent end of the resistive sensitive unit R _x11 is located is connected to a _r1 The voltage value of the a _r1 terminal is the test voltage V _I , the o _c1 terminal of the column 1 where the common terminal of the resistive sensitive unit R _x11 is located is connected to the b _c1 terminal, and the voltage value of the b _c1 terminal is the test voltage V _s2 . The sensitive unit R _x11 is selected for measurement; the z _r1 terminal of the row 1 where the independent terminal of the resistive sensitive unit R _z11 is located is connected to the f _r1 terminal, the voltage value of the f _r1 terminal is the sampling voltage V _s1 , and the common terminal of the resistive sensitive unit R _z11 is located The o _c1 terminal of column 1 is connected to the b _c1 terminal, and the voltage value of the b _c1 terminal is the test voltage V _s2 . At this time, the resistive sensitive unit R _z11 is selected for measurement; the independent terminal of the resistive sensitive unit R _y11 is located in y _r1 of row 1 The terminal is connected to the d _r1 terminal, and the voltage value of the d _r1 terminal is the second feedback voltage V _F2 .

2) Zone II: the non-to-be-tested adjacent rows of resistive composite sensors in the same column as the resistive composite sensors where the resistive sensitive units _Rx11 and _Rz11 are located, a total of (M-1) pieces, the (M- 1) The column line shared by adjacent resistive composite sensors not to be tested is the column line 1 of the resistive sensitive units _Rx11 and _Rz11 to be tested, the o _c1 end of the column line 1 is connected to the b _c1 end, and the voltage at the b _c1 end The value is the test voltage V _s2 , because the row lines of these devices are not selected, for the row lines of the unselected X unit, it is expressed as row p, and the corresponding x _rp terminal is connected to the b _rp terminal, and the voltage of the b _rp terminal The value is the second feedback voltage V _F2 . For the row line of the unselected Y unit, it is expressed as row q, and the corresponding y _rq terminal is connected to the d _rq terminal, and the voltage value of the d _rq terminal is the second feedback voltage V _F2 , for the row line of the unselected Z unit, it is denoted as row m, the corresponding z _rm terminal is connected to the e _rm terminal, and the voltage value of the e _rm terminal is the second feedback voltage V _F2 .

3) Area III: the non-to-be-tested adjacent column resistive composite sensor in the same row as the resistive composite sensor where the resistive sensitive units _Rx11 and _Rz11 are located, a total of (N-1) devices, due to the resistive The composite sensor array shares row lines (X line, Y line, Z line), and the row lines (X line, Y line, Z line) of the (N-1) adjacent column resistive composite sensors that are not to be tested are _Measure the _row lines ( _X line, Y line, _Z line) of the resistive composite sensor where the resistive sensitive units R _x11 and R _z11 are located. The value is the test voltage V _I , the Y line is connected to the y _r1 terminal, the y _r1 terminal is connected to the d _r1 terminal, the voltage value of the d _r1 terminal is the second feedback voltage V _F2 , the Z line is connected to the z _r1 terminal, and the z _r1 terminal is connected to the f The _r1 terminals are connected, and the voltage value of the f _r1 terminal is the first feedback voltage V _F1 . Since the column lines of these devices are not selected, these unselected column lines are denoted as column j′, and the o _cj ′ end of the column j′ is connected to the a _cj ′ end, and the voltage value of the a _cj ′ end is the first feedback voltage V _F1 .

4) Area IV: the resistive composite sensor area where neither the row line nor the column line is selected, a total of (M-1)×(N-1) devices, because the row lines (X line, Y line, Z line) and column line (O line) are not selected, the o _cj 'end of the column j' where it is located is connected to the a _cj 'end, and the voltage value of the a _cj 'end is the first feedback voltage V _F1 ; The x _rp terminal of the row line of the X unit in the row p is connected to the b _rp terminal, and the voltage value of the b _rp terminal is the second feedback voltage V _F2 ; the y _rq terminal of the row line of the Y unit in the row q where it is located is connected to the d _rq terminal , the voltage value of the d _rq terminal is the second feedback voltage V _F2 ; the z _rm terminal of the row line of the Z unit in the row m where it is located is connected to the e _rm terminal, and the voltage value of the e _rm terminal is the second feedback voltage V _F2 .

Still taking R _x11 and R _z11 as the resistive sensitive unit to be tested as an example, Fig. 4 shows a schematic circuit diagram of the readout circuit of the present invention in the same column as the resistive composite sensor where the resistive sensitive unit to be tested is located. It can be seen from Figure 4 that the column voltage of the resistive composite sensor where the resistive sensitive units R _x11 and R _z11 are located is the test voltage V _s2 , the row voltage of the first row where the independent terminal of R _x11 is located is the test voltage V _I , and the independent terminal of R _z11 is The row voltage of the first row is the sampling voltage V _s1 , and the row voltage of the independent end of the resistive sensitive unit R _y11 of the unselected Y unit in the resistive composite sensor is the second feedback voltage V _F2 , where V _F2 =V _s2 , it can be seen that there is no potential difference between the two ends of R _y11 , that is, no current flows; the row voltages of the X, Y, and Z units of the resistive composite sensors in the other non-selected rows are the second feedback voltage V _F2 , and the column voltage is the same as the voltage to be tested The column voltage of the resistive composite sensor where the resistive sensitive unit is located is the same, which is the test voltage V _s2 , wherein, V _F2 =V _s2 , when the circuit is working, the resistive composite sensor located in the selected column but not in the selected row has no Potential difference, so no current flows, that is, the current on the resistive sensitive units in all resistive composite sensors in Zone II is 0, and the resistive sensitive units R _x11 and R _z11 to be tested in Zone I are due to the potential difference between their two ends , so there is current passing through, and the two resistive sensitive units form a series loop with the sampling resistor R _s , so I _x11 =I _y21 .

Fig. 5 is a schematic circuit diagram of the readout circuit of the present invention working with the resistive composite sensor where the resistive sensitive unit to be tested is located. Figure 5 still takes R _x11 and R _z11 as an example of the resistive sensitive unit to be tested, the column voltage of the resistive composite sensor where it is located is the test voltage V _s2 , the row voltage of the row where the independent terminal of R _x11 is located is the test voltage V _I , The row voltage of the row where the independent terminal of R _z11 is located is the sampling voltage V _s1 , and the row voltage of the row where the independent terminal of R _y11 is located is the second feedback voltage V _F2 , where, V _F2 = V _s2 , it can be seen that there is no potential difference between the two ends of R _y11 , that is, there is no Current flows; because the resistive composite sensors of the same row share the row line (X line, Y line, Z line), the row voltage of the resistive sensitive unit of the X unit of the resistive composite sensor of the non-selected column is the test voltage V _I , the row voltage of the resistive sensitive unit of the Y unit is the second feedback voltage V _F2 , the row voltage of the resistive sensitive unit of the Z unit is the sampling voltage V _s1 , and the column voltages of the resistive composite sensors of the remaining non-selected columns are The first feedback voltage V _F1 , where V _F1 =V _s1 . When the circuit is working, the resistive sensitive units R _x11 and R _z11 to be tested in area I have a current passing through due to the potential difference between their two ends. These two resistive sensitive units form a series circuit with the sampling resistor R _s , so I _x11 =I _y21 . The resistive sensitive unit of the Z unit in the resistive composite sensor located in the III area has no potential difference on both sides, so no current flows; the resistive sensitive unit of the X unit is the test voltage VI because the row voltage is the test voltage V _I , and the common terminal voltage is the first A feedback voltage V _F1 , because V _I ≠ V _F1 , so the resistive sensitive unit of each X unit in the resistive composite sensor in this area has a current flow, and the current will be relatively large; the resistive sensitive unit of the Y unit Since the row voltage is the second feedback voltage V _F2 and the common terminal voltage is the first feedback voltage V _F1 , there is a potential difference between the two ends of the Y unit, so a current flows through it.

Fig. 6 is a schematic circuit diagram of a resistive composite sensor array of non-selected rows and non-selected columns when the circuit of the present invention is working. The non-selected row and non-selected column resistive composite sensor array is the IV area, and there are (M-1)×(N-1) resistive composite sensors in total. The row voltage of the X unit in each resistive composite sensor is the second feedback voltage V _F2 , the row voltage of the Y unit is the second feedback voltage V _F2 , the row voltage of the Z unit is the second feedback voltage V _F2 , and the common terminal The column voltage is the first feedback voltage V _F1 , so there is a potential difference at both ends of each resistive sensitive unit in this area, so each resistor has a current passing through, forming a loop.

Fig. 7 is a simplified schematic diagram of the circuit when the circuit of the present invention is working. It can be clearly seen from the simplified circuit that the resistive sensitive units R _x11 and R _z11 to be tested form a series circuit with the sampling resistor R _s , the input test voltage is V _I , and the potential drops to the test voltage V _s2 after passing through R _x11 . After passing through R _z11 , the potential drops to the sampling voltage V _s1 , and after passing through R _s , it is grounded, and the potential drops to 0. The current of the entire series circuit is expressed as I, then

I=V _s1 /Rs

Using the principle of resistor voltage division, it is easy to obtain the resistance values of the resistors R _x11 and R _z11 to be tested:

R _x11 ＝(V _I -V _s2 )/I

R _z11 =(V _s2 -V _s1 )/I

FIG. 8 shows the circuit and area division of another embodiment of the present invention. This embodiment is the pull-down of the resistive sensitive unit of the Y unit. As shown in Figure 8, the sensing device in this embodiment includes: M×N resistive compound sensor array 1, X unit row multiplexer 8, Y and Z unit row multiplexer 9, column multiplexer device 4, scan controller 5, first voltage feedback driving circuit 6 and second voltage feedback driving circuit 7. Among them, the internal connection mode of the M×N resistive composite sensor array 1 remains unchanged, the a _r1 , a _r2 , ..., a _rM ports of the X unit row multiplexer 8 are connected to the test voltage V _I , and the X unit row multiple The b _r1 , b _r2 , ..., b _rM ports of the road selector 8 are connected to the output terminal of the second voltage feedback drive circuit 7; the c _r1 , c _r2 , ..., c _rM of the Y and Z unit row multiplexers 9 Ports and e _r1 , e _r2 , ..., e _rM ports are connected to the output terminals of the second voltage feedback drive circuit 7, d _r1 , d _r2 , ..., d _rM ports of the Y and Z unit row multiplexers 9 and f _r1 , _{f r2} , . The scanning controller 5 outputs scanning control signals, the X unit control signal controls the X unit row multiplexer 8, the Y and Z unit control signals control the Y and Z unit row multiplexer 9, and the column control signal controls the column multiplexer 4.

Still taking R _x11 and R _y11 as the resistive sensitive unit to be tested as an example, the x _r1 terminal of the X unit row multiplexer is connected to the a _r1 terminal of the X unit row multiplexer, and the a _r1 terminal is connected to the test voltage V _I The y _r1 terminals of the Y and Z unit row multiplexers are connected with the d _r1 terminals of the Y and Z unit row multiplexers, and the d _r1 terminals are connected with the sampling voltage V _s1 , and the remaining 3M-2 row lines are connected with The second feedback voltage V _F2 is connected. The o _c1 terminal of the column multiplexer is connected to the b _c1 terminal of the column multiplexer, and the remaining N-1 column lines are all connected to the first feedback voltage V _F1 . The resistive composite sensor array is divided into four regions by the resistive composite sensor where the resistive sensitive units R _x11 and R _z11 are located.

Area I: The resistive composite sensor where the resistive sensitive units R _x11 and R _z11 are located is located in the first row and the first column of the array, the row voltage of the row where the independent terminal of R _x11 is located is the test voltage V _I , and the independent terminal of R _y11 is located The row voltage of the row is the sampling voltage V _s1 , the common terminal voltage, that is, the column voltage is the test voltage V _s2 , and the row voltage of the row where the independent terminal of R _z11 is located is the second feedback voltage V _F2 , wherein, V _F2 =V _s2 , so R _z11 There is no potential difference between the two ends, that is, no current flows. And the resistive sensitive unit R _x11 and R _y11 to be measured are owing to there is potential difference at both ends respectively, so there is electric current to pass through, these two resistive sensitive units form the series loop with sampling resistor R _s , so I _x11 =I _y11 =I, wherein I is the current in the series loop.

Zone II: the resistive composite sensor in the same column as the resistive composite sensor where the resistive sensitive units _Rx11 and _Ry11 are located is not to be tested, and there are M-1 devices in total. The row voltage of each unit is the second feedback voltage V _F2 , and the column voltage is the voltage of the common column line, that is, the test voltage V _s2 , wherein, V _F2 =V _s2 , so the two ends of each resistive sensitive unit in the II area are With a potential difference, no current flows.

Zone III: The resistive composite sensor in the same row as the resistive composite sensor where the resistive sensitive units _Rx11 and _Ry11 are located is not to be tested, and there are N-1 devices in total. The row voltage of each resistive sensitive unit is the voltage of the common row line (X line, Y line, Z line), which are test voltage V _I , sampling voltage V _s1 , and second feedback voltage V _F2 , and the column voltages are the first Feedback voltage V _F1 , wherein, V _F1 =V _s1 . The resistive sensitive unit of the Y unit has no potential difference on both sides, so no current flows; the resistive sensitive unit of the X unit has the test voltage V _I as the row voltage, and the common terminal voltage is the first feedback voltage V _F1 , because V _I ≠ V _F1 , so the resistive sensitive unit of each X unit in the resistive composite sensor in this area has a current flow, and the current will be relatively large; the resistive sensitive unit of the Z unit is the second feedback voltage V _F2 due to the row voltage , the common terminal voltage is the first feedback voltage V _F1 , and there is a potential difference between the two ends of the Z unit, so a current flows through it.

Region IV: the same as when the resistive sensitive unit of the Y unit is pulled up.

Similarly, using the principle of resistor voltage division, it is easy to obtain the resistance values of the resistors R _x11 and R _y11 to be tested:

I=V _s1 /Rs

R _x11 ＝(V _I -V _s2 )/I

R _y11 =(V _s2 −V _s1 )/I

According to the above analysis, it can be seen that for any resistive composite sensor in the resistive composite sensor array that includes 3 resistive sensitive units for each sensor, the present invention can obtain all three resistive sensitive units by only two measurements. , and one of the resistive sensitive units was measured twice. In the same way, it can be seen that for a resistive composite sensor array that includes 5 resistive sensitive units for each sensor, all 5 resistive sensitive elements in any resistive composite sensor can be obtained through at least three and at most four measurements using the present invention. The resistance value of the unit; and for the resistive compound sensor array that includes 7 resistive sensitive units for each sensor, utilize the present invention to be able to obtain all 7 in any resistive compound sensor by measuring at least four times, at most six times The resistance value of the resistive sensitive unit; the resistive composite sensor array in which each sensor includes more resistive sensitive units is similar, and will not be repeated here. Therefore, according to actual needs, different grouping methods can be used to obtain the fastest detection speed; or, while obtaining a faster detection speed, one or several blocks that require high-frequency detection can be detected in one scan. The sex-sensitive unit takes multiple measurements.

In addition, the above row and column are relative concepts, which can be completely interchanged by those skilled in the art, and various existing or future technologies can also be used for the specific realization of components such as row and column multiplexers and voltage feedback drive circuits; Those skilled in the art should know that such simple deformations based on the idea of the present invention are still covered by the technical solution of the present invention.

Claims (8)

1. A readout circuit of a resistive composite sensor array, characterized in that, the resistive composite sensor array is a two-dimensional array formed of M * N resistive composite sensors; each resistive composite sensor comprises 2K Two-terminal resistive sensitive units, one end of 2K two-terminal resistive sensitive units is connected to the common terminal of the resistive composite sensor, and the other end is an independent terminal, each resistive composite sensor has a total of 2K+1 terminals; the same column The common terminals of the resistive composite sensors are connected to each other to form the common column line of the resistive composite sensors in this row, and the other ends of the i-th resistive sensitive unit in the same row of resistive composite sensors are connected to each other to form the common column line of the row of resistive composite sensors. The i-th common row line, i=1, 2, ..., 2K; K is a natural number greater than 0; the readout circuit includes: a row multiplexer, a column multiplexer, a scan controller, a first voltage Feedback drive circuit, second voltage feedback drive circuit, sampling resistor, test voltage input terminal; one end of the sampling resistor is grounded, and the other end is connected to the input terminal of the first voltage feedback drive circuit; 2K shared row lines of each row of resistive composite sensors According to the same grouping method, it is divided into two groups; for the common row lines belonging to the first group, the row multiplexer can make any one of the common row lines connected to the test voltage input terminal under the control of the scan controller and connected to the second group. The output terminals of the two voltage feedback drive circuits are disconnected, or connected with the output terminals of the second voltage feedback drive circuit and disconnected with the test voltage input terminals; for the shared row lines belonging to the second group, the row multiplexer can be Under the control of the scan controller, any one of the common row lines is connected to the input terminal of the first voltage feedback driving circuit and disconnected from the output terminal of the second voltage feedback driving circuit, or connected to the output terminal of the second voltage feedback driving circuit The input terminal of the first voltage feedback drive circuit is disconnected; the column multiplexer can make any common column line connected with the input terminal of the second voltage feedback drive circuit under the control of the scan controller to be connected with the first voltage The output terminal of the feedback driving circuit is disconnected, or connected with the output terminal of the first voltage feedback driving circuit and disconnected with the input terminal of the second voltage feedback driving circuit. 2. readout circuit as claimed in claim 1, is characterized in that, described first voltage feedback driving circuit comprises the first operational amplifier and the first driving circuit, the inverting input end of the first operational amplifier and the first operational amplifier The output end is connected to the input end of the first driving circuit, and the non-inverting input end of the first operational amplifier and the output end of the first driving circuit are respectively used as the input end of the first voltage feedback driving circuit and the output end of the first voltage feedback driving circuit; The second voltage feedback driving circuit includes a second operational amplifier and a second driving circuit, the inverting input terminal of the second operational amplifier is connected with the output terminal of the second operational amplifier and the input terminal of the second driving circuit, and the second operational amplifier The non-inverting input end of the second drive circuit and the output end of the second drive circuit are respectively used as the input end of the second voltage feedback drive circuit and the output end of the second voltage feedback drive circuit. 3. The readout circuit according to claim 1, wherein the 2K shared row lines of each row of resistive composite sensors are divided into two groups with the same number. 4. The readout circuit according to claim 1, wherein the row multiplexer comprises M×2K two-choice one-to-one bidirectional one-to-one correspondence with the M×2K shared row lines of the resistive composite sensor array Analog switch; according to the grouping of the shared row lines, the M×2K two-to-one bidirectional analog switches are divided into corresponding two groups; for each two-to-one bidirectional analog switch in the first group, its common input/output terminal is connected with the corresponding common row line, its two independent input/output terminals are respectively connected with the test voltage input terminal and the output terminal of the second voltage feedback driving circuit, and its control signal input terminal is connected with the scan controller; for the second For each two-choice one-way analog switch in the group, its common input/output terminal is connected to its corresponding shared row line, and its two independent input/output terminals are respectively connected to the input terminal of the first voltage feedback drive circuit and the second voltage feedback drive circuit. The output terminal of the feedback driving circuit is connected, and the control signal input terminal thereof is connected with the scanning controller. 5. readout circuit as claimed in claim 1, is characterized in that, described column multiplexer comprises and the N shared column lines of resistive composite sensor array one-to-one correspondence N two select one bidirectional analog switch; For For each two-to-one bidirectional analog switch, its common input/output terminal is connected to its corresponding common column line, and its two independent input/output terminals are respectively connected to the output terminal of the first voltage feedback drive circuit and the second voltage feedback drive circuit. The input terminal is connected, and the control signal input terminal is connected with the scan controller. 6. The readout method of the readout circuit according to any one of claims 1 to 5, wherein the scan controller controls the column multiplexer so that the shared column line of the currently scanned column resistive composite sensor is connected to the second The input terminal of the voltage feedback drive circuit is connected and disconnected from the output terminal of the first voltage feedback drive circuit, and the remaining common column lines are connected with the output terminal of the first voltage feedback drive circuit and connected with the input terminal of the second voltage feedback drive circuit Disconnect; at the same time, the scan controller controls the row multiplexer, so that a common row line belonging to the first group among the 2K shared row lines corresponding to the current scanning row resistive composite sensor is connected to the test voltage input terminal, and the Among the 2K shared row lines corresponding to the row resistive sensor, one shared row line belonging to the second group is connected to the input terminal of the first voltage feedback drive circuit, and all other shared row lines in the resistive composite sensor array are connected to the second group. The output end of the two-voltage feedback drive circuit is connected; then use the following formula to obtain the resistance of the resistive sensitive unit corresponding to the common row line connected to the test voltage input end in the resistive composite sensor at the intersection of the current scan row and column The value R1, and the resistance value R2 of the resistive sensitive unit corresponding to the common row line connected to the input terminal of the first voltage feedback drive circuit: $\left\{\begin{array}{c}\mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 1</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; I</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&Center\; Dot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\\ \mathrm{<span\; class="notranslate">\; R</span>}\mathrm{<span\; class="notranslate">\; 2</span>}<span\; class="notranslate">\; =</span>\frac{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 2</span>}}<span\; class="notranslate">\; -</span>{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}{{\mathrm{<span\; class="notranslate">\; V</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}\mathrm{<span\; class="notranslate">\; 1</span>}}}<span\; class="notranslate">\; \&Center\; Dot;</span>{\mathrm{<span\; class="notranslate">\; R</span>}}_{\mathrm{<span\; class="notranslate">\; the\; s</span>}}\end{array}\right.$ In the formula, VI is the test voltage input by the test voltage input terminal, V _S1 is the input terminal voltage of the first voltage feedback driving circuit, V _S2 is the input terminal voltage of the second voltage feedback driving circuit, and R _{S is} the sampling resistor resistance value. 7. A sensing device, comprising a resistive composite sensor array and a readout circuit, characterized in that, the resistive composite sensor array is a two-dimensional array formed of M * N resistive composite sensors; each resistive The composite sensor includes 2K two-terminal resistive sensitive units. One end of the 2K two-terminal resistive sensitive units is connected to the common terminal of the resistive composite sensor, and the other end is an independent terminal. Each resistive composite sensor has a total of 2K+1 endpoints; the common endpoints of the resistive composite sensor in the same row are connected to each other to form the shared column line of the resistive composite sensor in the row, and the other ends of the i-th resistive sensitive unit in the resistive composite sensor in the same row are connected to each other to form the row. The ith shared row line of the resistive composite sensor, i=1, 2, ..., 2K; K is a natural number greater than 0; the readout circuit is the readout circuit described in any one of claims 1-5. 8. The sensing device according to claim 7, wherein each resistive composite sensor comprises 2K two-terminal resistive sensitive units sensitive to different physical quantities.