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CN105364715A - Polishing trimmer - Google Patents

Polishing trimmer Download PDF

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Publication number
CN105364715A
CN105364715A CN201410391317.2A CN201410391317A CN105364715A CN 105364715 A CN105364715 A CN 105364715A CN 201410391317 A CN201410391317 A CN 201410391317A CN 105364715 A CN105364715 A CN 105364715A
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China
Prior art keywords
polishing
layer
sapphire
microstructure
protrusion
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CN201410391317.2A
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张延瑜
王兴民
李瑞评
陈智勇
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CRYSTALWISE Tech Inc
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CRYSTALWISE Tech Inc
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Priority to CN201410391317.2A priority Critical patent/CN105364715A/en
Publication of CN105364715A publication Critical patent/CN105364715A/en
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  • Polishing Bodies And Polishing Tools (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

The invention relates to a polishing dresser, which comprises a base and a sapphire polishing pad, wherein the sapphire polishing pad comprises a root and a polishing layer, the root is fixedly arranged on the base, the polishing layer comprises a plurality of protrusions and a plurality of recesses, and a microstructure with the surface roughness of 0.1-5 microns is formed on the surface of at least one of the protrusions and the recesses. Therefore, the grinding layer and the root part of the polishing dresser are integrally formed, and the problem that grinding particles of a traditional dresser fall off is thoroughly solved; and the microstructure of the surface of the abrasive layer is utilized to increase the dressing efficiency of the polishing pad.

Description

抛光修整器Polishing trimmer

技术领域technical field

本发明与抛光工具表面的修整或活化有关;特别是指一种抛光修整器。The present invention relates to the conditioning or activation of polishing tool surfaces; in particular, it relates to a polishing conditioner.

背景技术Background technique

抛光是指使用物理机械或化学药品降低被加工物表面粗糙度的技术,主要应用于精密机械和光学工业,抛光过程中,被加工物需加压于一高速旋转的抛光垫以进行磨光,为避免抛光垫使用后的变形或堆屑影响后续抛光作用的效率,利用修整器维持稳定的抛光垫表面型态是一必要步骤。Polishing refers to the technology of using physical machinery or chemicals to reduce the surface roughness of the processed object. It is mainly used in precision machinery and optical industries. During the polishing process, the processed object needs to be pressed on a high-speed rotating polishing pad for polishing. In order to prevent the polishing pad from being deformed or piled up after use to affect the efficiency of the subsequent polishing action, it is a necessary step to use a dresser to maintain a stable surface morphology of the polishing pad.

现有的抛光修整器是以钻石磨粒结合于金属基材的表面所制成,但由于该钻石磨粒是以烧结或黏着的方式结合于金属基材的表面,其结合力会因接触面积与接触面间的热涨冷缩所影响,导致该钻石磨粒脱落而造成被加工物的刮伤甚至破损;且该些钻石磨粒裸露于金属基材表面的高度、形状及尺寸不一,使得钻石磨粒的可利用率不稳定。Existing polishing and dressing devices are made by bonding diamond abrasive grains to the surface of the metal substrate, but since the diamond abrasive grains are bonded to the surface of the metal substrate by sintering or adhesion, the bonding force will vary depending on the contact area. Affected by the thermal expansion and contraction between the contact surface and the contact surface, the diamond abrasive grains will fall off and cause scratches or even damage to the processed object; and the height, shape and size of the diamond abrasive grains exposed on the surface of the metal substrate are different, Makes the availability of diamond abrasive grains unstable.

中国台湾专利号M465659揭露一改良的化学机械研磨修整器,包括一具有金属支撑层及研磨颗粒的研磨层,其中该研磨颗粒排列于金属支撑层的相对的两面,用以降低研磨层在硬焊后冷却所造成的变形程度;另外,各研磨颗粒露出于金属支撑层的高度相等且顶端皆具有一平坦面,使得该些研磨颗粒的突出端可共同形成一平坦表面,提高该修整器对抛光垫的修整均匀性。China Taiwan Patent No. M465659 discloses an improved chemical mechanical grinding dresser, including an abrasive layer with a metal support layer and abrasive grains, wherein the abrasive grains are arranged on opposite sides of the metal support layer to reduce the wear of the abrasive layer on brazing The degree of deformation caused by post-cooling; in addition, the heights of each abrasive grain exposed on the metal support layer are equal and the tops all have a flat surface, so that the protruding ends of these abrasive grains can jointly form a flat surface, which improves the polishing effect of the dresser. Pad dressing uniformity.

然而,上述的改良虽能提高各研磨颗粒的可使用率,亦可有效降低研磨颗粒脱落的可能性,但因该研磨颗粒与金属支撑层仍属不同的材质,受热或冷却时可能会因具有不同的热膨胀系数而使得两者的结合力下降,无法真正解决研磨颗粒脱落的问题。However, although the above-mentioned improvement can increase the usability of each abrasive grain, it can also effectively reduce the possibility of the abrasive grain falling off, but because the abrasive grain and the metal support layer are still made of different materials, they may be damaged due to the presence of abrasive particles when heated or cooled. Different coefficients of thermal expansion lead to a decrease in the bonding force between the two, which cannot really solve the problem of abrasive particles falling off.

发明内容Contents of the invention

有鉴于此,本发明的目的在于提供一种抛光修整器,是降低研磨颗粒脱落的风险,能有效维持抛光垫的抛光效率。In view of this, the object of the present invention is to provide a polishing dresser, which can reduce the risk of abrasive particles falling off and can effectively maintain the polishing efficiency of the polishing pad.

缘以达成上述目的,本发明所提供的抛光修整器包含一基座与一蓝宝石研磨垫。其中,该蓝宝石研磨垫包含一根部及一研磨层,该根部固设于该基座上,该研磨层包括有多个突起部与多个凹部,其中各该突起部与各该凹部的至少之一者的表面形成有表面粗糙度介于0.1~5微米(μm)之间的微结构。In order to achieve the above object, the polishing conditioner provided by the present invention includes a base and a sapphire polishing pad. Wherein, the sapphire grinding pad includes a root portion and a grinding layer, the root portion is fixed on the base, and the grinding layer includes a plurality of protrusions and a plurality of recesses, wherein at least one of each protrusion and each recess is A microstructure with a surface roughness between 0.1 and 5 micrometers (μm) is formed on the surface of one.

本发明的效果在于该蓝宝石研磨垫的研磨层及根部是一体成形,取代传统修整器中的研磨颗粒的结合,并解决了过去因热涨冷缩而产生的研磨颗粒脱落的问题;此外,利用研磨层表面的微结构增加对抛光垫修整的效率。The effect of the present invention is that the grinding layer and the root of the sapphire grinding pad are integrally formed, replacing the combination of grinding particles in the traditional dresser, and solving the problem of falling off of grinding particles caused by thermal expansion and contraction in the past; in addition, using The microstructure of the abrasive layer surface increases the efficiency of polishing pad conditioning.

附图说明Description of drawings

图1是本发明一较佳实施例抛光修整器的剖面图,揭示研磨层的突起部表面形成有微结构。FIG. 1 is a cross-sectional view of a polishing dresser according to a preferred embodiment of the present invention, revealing that microstructures are formed on the surface of the protrusions of the abrasive layer.

图2是本发明上述较佳实施例抛光修整器的俯视图,揭示蓝宝石研磨垫以单一圆盘的型态固设于基座上。FIG. 2 is a top view of the polishing conditioner according to the preferred embodiment of the present invention, showing that the sapphire polishing pad is fixed on the base in the form of a single disk.

图3是本发明上述较佳实施例抛光修整器的局部剖面图,揭示蓝宝石研磨垫的各部位长度。Fig. 3 is a partial sectional view of the polishing dresser according to the preferred embodiment of the present invention, revealing the length of each part of the sapphire polishing pad.

图4是本发明上述较佳实施例抛光修整器的局部示意图,揭示研磨层的突起部的形状为平顶圆锥。FIG. 4 is a partial schematic view of the polishing dresser according to the above-mentioned preferred embodiment of the present invention, revealing that the shape of the protrusion of the grinding layer is a flat-topped cone.

图5类同图1,揭示研磨层的凹部表面形成有微结构。FIG. 5 is similar to FIG. 1 , revealing that microstructures are formed on the surface of the concave portion of the grinding layer.

图6类同图1,揭示研磨层的突起部表面与凹部表面皆形成有微结构。FIG. 6 is similar to FIG. 1 , revealing that microstructures are formed on both the surface of the protrusion and the surface of the recess of the polishing layer.

图7类同图2,揭示蓝宝石研磨垫以多个圆盘环状排列于基座上。FIG. 7 is similar to FIG. 2 , showing that the sapphire polishing pads are arranged on the base in a ring shape of a plurality of disks.

图8类同图2,揭示蓝宝石研磨垫以多个扇形环状排列于基座上。FIG. 8 is similar to FIG. 2 , showing that the sapphire polishing pads are arranged on the base in a plurality of fan-shaped rings.

图9类同图4,揭示研磨层的突起部的形状为平顶四角锥。FIG. 9 is similar to FIG. 4 , revealing that the shape of the protrusion of the abrasive layer is a flat-topped quadrangular pyramid.

图10类同图4,揭示研磨层的突起部的形状为平顶三角锥。FIG. 10 is similar to FIG. 4 , revealing that the shape of the protrusion of the abrasive layer is a flat-topped triangular pyramid.

图11类同图4,揭示研磨层的突起部的形状为平顶六角锥。FIG. 11 is similar to FIG. 4 , revealing that the shape of the protrusion of the polishing layer is a flat-topped hexagonal pyramid.

图12类同图4,揭示研磨层的突起部的形状为圆柱。FIG. 12 is similar to FIG. 4 , revealing that the shape of the protrusion of the grinding layer is a cylinder.

图13类同图4,揭示研磨层的突起部的形状为四角柱。FIG. 13 is similar to FIG. 4 , revealing that the shape of the protrusion of the polishing layer is a square column.

【符号说明】【Symbol Description】

1抛光修整器1 polishing trimmer

10基座10 base

20蓝宝石研磨垫20 sapphire grinding pads

22根部24研磨层24A突起部22 Root 24 Grinding layer 24A Protrusion

24B凹部26微结构24B Recess 26 Microstructure

t蓝宝石研磨垫的厚度tThickness of sapphire lapping pad

w突起部底宽h突起部高度wProtrusion bottom width hProtrusion height

p两相邻突起部的间距p The distance between two adjacent protrusions

具体实施方式detailed description

为能更清楚地说明本发明,兹举较佳实施例并配合图示详细说明如后,请参图1至图4所示,为本发明一较佳实施例的抛光修整器1,包含有一基座10以及一蓝宝石研磨垫20。In order to illustrate the present invention more clearly, the preferred embodiment is given hereby and the detailed description is as follows in conjunction with the drawings. Please refer to FIGS. The base 10 and a sapphire polishing pad 20 .

该抛光修整器1的该蓝宝石研磨垫20的晶体结构是单晶、双晶或多晶结构,并包含一根部22及一研磨层24,该根部22是以硬焊、胶黏或卡榫的方式固设于该基座10上,该研磨层24包括有多个突起部24A与多个凹部24B。The crystal structure of the sapphire polishing pad 20 of the polishing trimmer 1 is a single crystal, twin crystal or polycrystalline structure, and includes a root portion 22 and a grinding layer 24, and the root portion 22 is brazed, glued or tenoned The abrasive layer 24 is fixed on the base 10 in a manner, and includes a plurality of protrusions 24A and a plurality of recesses 24B.

在本实施例中,各该突起部24A的表面更形成有表面粗糙度介于0.1~5微米(μm)之间的微结构26,该微结构26系经黄光微影技术或激光切割技术而制得具有图案化的结构。该黄光微影技术制程的蚀刻是采用含卤素的气体或其他化合物气体,如Cl2、BCl3或SF6等进行干蚀刻,或采用强酸或混合强酸,如硫酸、磷酸或硫磷混酸等进行湿蚀刻。In this embodiment, the surface of each protrusion 24A is further formed with a microstructure 26 with a surface roughness ranging from 0.1 to 5 micrometers (μm), and the microstructure 26 is made by yellow light lithography technology or laser cutting technology have a patterned structure. The etching of the yellow light lithography process is to use halogen-containing gas or other compound gas, such as Cl 2 , BCl 3 or SF 6 , etc. for dry etching, or use strong acid or mixed strong acid, such as sulfuric acid, phosphoric acid or sulfur-phosphoric acid for wet etching. etch.

如图2与图3所示,该蓝宝石研磨垫20是以单一圆盘的型态固设于基座10上,其中该蓝宝石研磨垫20的厚度t介于100至5000微米(μm)之间;该研磨层24的各该突起部24A的底宽w介于5至250微米(μm)之间,高度h介于5至250微米(μm)之间;而该两相邻突起部24A之间的间距p则介于5至650微米(μm)之间,其中该突起部24A的形状为平顶圆锥(图4参照)。As shown in FIGS. 2 and 3 , the sapphire polishing pad 20 is fixed on the base 10 in the form of a single disc, wherein the thickness t of the sapphire polishing pad 20 is between 100 and 5000 microns (μm). ; The bottom width w of each of the protrusions 24A of the abrasive layer 24 is between 5 and 250 microns (μm), and the height h is between 5 and 250 microns (μm); and between the two adjacent protrusions 24A The distance p between them is between 5 and 650 micrometers (μm), wherein the shape of the protruding portion 24A is a flat-topped cone (refer to FIG. 4 ).

上述实施例的该抛光修整器1的该蓝宝石研磨垫20是利用具高硬度且成本较钻石低的材料,以表面图案化制成该研磨层24,无研磨颗粒脱落的风险,且利用更精细的微结构26有效维持抛光垫的抛光效率。The sapphire grinding pad 20 of the polishing dresser 1 in the above-mentioned embodiment is made of a material with high hardness and lower cost than diamond, and the grinding layer 24 is made of surface patterning, without the risk of abrasive particles falling off, and using finer The microstructure 26 effectively maintains the polishing efficiency of the polishing pad.

另,本发明的该微结构26除了上述形成于该突起部24A的表面外,尚有如图5所示的形成于该凹部24B的表面;甚至如图6所示,同时形成于该突起部24A以及该凹部24B的表面。由于抛光垫表面不平整,当抛光垫和该研磨层24的该凹部24B接触时,该凹部24B表面的微结构26可增加对抛光垫的研磨面积,有效提高活化抛光垫的效率。In addition, the microstructure 26 of the present invention is formed on the surface of the concave portion 24B as shown in FIG. 5 in addition to the above-mentioned surface formed on the protrusion 24A; even as shown in FIG. And the surface of the concave portion 24B. Since the surface of the polishing pad is uneven, when the polishing pad is in contact with the concave portion 24B of the abrasive layer 24, the microstructure 26 on the surface of the concave portion 24B can increase the polishing area of the polishing pad, effectively improving the efficiency of activating the polishing pad.

再者,该蓝宝石研磨垫20固设于基座10上的型态并无限制,意即包括上述的单一圆盘的型态、如图7所示的多个圆盘的环状排列,抑或者如图8所示的多个扇形的环状排列的型态。Furthermore, the pattern of the sapphire polishing pad 20 being fixed on the base 10 is not limited, and it means to include the pattern of the above-mentioned single disc, the annular arrangement of a plurality of discs as shown in FIG. 7 , or Or the form of a plurality of fan-shaped circular arrangements as shown in FIG. 8 .

此外,该研磨层24的各该突起部24A的形状除了上述的平顶圆锥外,尚有平顶多角椎如平顶三角锥及平顶四角锥、立体梯形、圆柱、多角柱如方柱(图9至图13参照)或前述各形状的至少二种形状的组合。In addition, the shape of each protrusion 24A of the abrasive layer 24 includes flat-topped polygonal pyramids such as flat-topped triangular pyramids and flat-topped quadrangular pyramids, three-dimensional trapezoids, cylinders, and polygonal columns such as square columns ( 9 to 13 refer to) or a combination of at least two shapes of the aforementioned shapes.

综上所述,本发明抛光修整器的研磨层及根部是一体成形,彻底解决传统修整器的研磨颗粒脱落的问题;并利用研磨层表面的微结构增加对抛光垫修整的效率。To sum up, the abrasive layer and the root of the polishing dresser of the present invention are integrally formed, which completely solves the problem of abrasive particles falling off in traditional dressers; and utilizes the microstructure on the surface of the abrasive layer to increase the dressing efficiency of the polishing pad.

以上所述仅为本发明较佳可行实施例而已,举凡应用本发明说明书及申请专利范围所为的等效变化,理应包含在本发明的专利范围内。The above descriptions are only preferred feasible embodiments of the present invention, and all equivalent changes made by applying the description of the present invention and the scope of the patent application should be included in the scope of the patent of the present invention.

Claims (11)

1.一种拋光修整器,其特征在于包括: 1. A polishing finisher, characterized in that comprising: 一基座; a base; 一蓝宝石研磨垫,包含一根部及一研磨层,该根部固设于该基座上,该研磨层包括有多个突起部与多个凹部,其中各该突起部与各该凹部的至少之一者的表面形成有表面粗糙度介于0.1~5微米之间的微结构。 A sapphire grinding pad, comprising a root portion and a grinding layer, the root portion is fixed on the base, the grinding layer includes a plurality of protrusions and a plurality of recesses, wherein at least one of each protrusion and each recess A microstructure with a surface roughness ranging from 0.1 to 5 micrometers is formed on the surface. 2.如权利要求1所述的拋光修整器,其特征在于,该蓝宝石研磨垫的根部是以硬焊、胶黏或卡榫的方式固设于该基座上。 2. The polishing trimmer according to claim 1, wherein the root of the sapphire polishing pad is fixed on the base by brazing, gluing or tenon. 3.如权利要求1所述的拋光修整器,其特征在于,该蓝宝石研磨垫的晶体结构是单晶、双晶或多晶结构。 3. The polishing trimmer as claimed in claim 1, wherein the crystal structure of the sapphire polishing pad is single crystal, twin crystal or polycrystalline structure. 4.如权利要求1所述的拋光修整器,其特征在于,该蓝宝石研磨垫的厚度介于100至5000微米之间。 4. The polishing conditioner as claimed in claim 1, wherein the thickness of the sapphire polishing pad is between 100 and 5000 microns. 5.如权利要求1所述的拋光修整器,其特征在于,该研磨层的各该突起部的底宽介于5至250微米之间。 5 . The polishing dresser as claimed in claim 1 , wherein the bottom width of each protrusion of the grinding layer is between 5 and 250 microns. 5 . 6.如权利要求1所述的拋光修整器,其特征在于,该研磨层的各该突起部的高度介于5至250微米之间。 6 . The polishing dresser as claimed in claim 1 , wherein the height of each protrusion of the grinding layer is between 5 and 250 microns. 7.如权利要求1所述的拋光修整器,其特征在于,该研磨层的各该突起部的形状为平顶圆锥、平顶多角锥、立体梯形、圆柱、多角柱或前述各形状的至少二种形状的组合。 7. The polishing finisher as claimed in claim 1, characterized in that, the shape of each protrusion of the grinding layer is a flat-topped cone, a flat-topped polygonal pyramid, a three-dimensional trapezoid, a cylinder, a polygonal column, or at least one of the aforementioned shapes. A combination of two shapes. 8.如权利要求1所述的拋光修整器,其特征在于,两相邻突起部之间的间距介于5至650微米之间。 8. The polishing conditioner as claimed in claim 1, wherein the distance between two adjacent protrusions is between 5 and 650 microns. 9.如权利要求1所述的拋光修整器,其特征在于,该研磨层的微结构为经图案化制程而得。 9. The polishing device as claimed in claim 1, wherein the microstructure of the polishing layer is obtained through a patterning process. 10.如权利要求9所述的拋光修整器,其特征在于,该研磨层的微结构是经黄光微影技术而制得具有图案化的结构。 10 . The polishing device according to claim 9 , wherein the microstructure of the abrasive layer has a patterned structure produced by yellow light lithography. 11 . 11.如权利要求9所述的拋光修整器,其特征在于,该研磨层的微结构是经激光切割技术而制得具有图案化的结构。 11. The polishing dresser according to claim 9, characterized in that, the microstructure of the grinding layer is made with a patterned structure by laser cutting technology.
CN201410391317.2A 2014-08-11 2014-08-11 Polishing trimmer Pending CN105364715A (en)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106002632A (en) * 2016-07-20 2016-10-12 厦门润晶光电集团有限公司 Chemical-mechanical grinding and polishing pad dresser
CN106956213A (en) * 2017-02-24 2017-07-18 咏巨科技有限公司 Combined trimmer and manufacturing method thereof
CN108857866A (en) * 2017-05-12 2018-11-23 中国砂轮企业股份有限公司 Dresser for chemical mechanical polishing pad and manufacturing method thereof
CN112677046A (en) * 2020-12-22 2021-04-20 金华博蓝特电子材料有限公司 Polishing pad dresser and manufacturing method thereof
CN113172553A (en) * 2021-05-25 2021-07-27 宁波江丰电子材料股份有限公司 Chemical mechanical grinding polishing pad dressing device and preparation method thereof
CN113199400A (en) * 2021-05-25 2021-08-03 宁波江丰电子材料股份有限公司 Chemical mechanical grinding polishing pad dressing device and preparation method thereof
CN114603483A (en) * 2022-03-23 2022-06-10 长鑫存储技术有限公司 Polishing pad dresser and chemical mechanical polishing device

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CN102612734A (en) * 2009-09-01 2012-07-25 圣戈班磨料磨具有限公司 Chemical mechanical polishing conditioner
CN202952159U (en) * 2012-08-08 2013-05-29 铼钻科技股份有限公司 Chemical mechanical polishing dresser
TWM458275U (en) * 2013-03-08 2013-08-01 Tera Xtal Technology Corp Sapphire polishing pad dresser
CN103688343A (en) * 2011-03-07 2014-03-26 恩特格里公司 Chemical mechanical planarization pad conditioner

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JPH1044023A (en) * 1996-08-02 1998-02-17 Asahi Daiyamondo Kogyo Kk Dresser and manufacturing method thereof
CN102612734A (en) * 2009-09-01 2012-07-25 圣戈班磨料磨具有限公司 Chemical mechanical polishing conditioner
CN103688343A (en) * 2011-03-07 2014-03-26 恩特格里公司 Chemical mechanical planarization pad conditioner
CN202952159U (en) * 2012-08-08 2013-05-29 铼钻科技股份有限公司 Chemical mechanical polishing dresser
TWM458275U (en) * 2013-03-08 2013-08-01 Tera Xtal Technology Corp Sapphire polishing pad dresser

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106002632A (en) * 2016-07-20 2016-10-12 厦门润晶光电集团有限公司 Chemical-mechanical grinding and polishing pad dresser
CN106956213A (en) * 2017-02-24 2017-07-18 咏巨科技有限公司 Combined trimmer and manufacturing method thereof
CN106956213B (en) * 2017-02-24 2019-01-22 咏巨科技有限公司 Combined trimmer and manufacturing method thereof
CN108857866A (en) * 2017-05-12 2018-11-23 中国砂轮企业股份有限公司 Dresser for chemical mechanical polishing pad and manufacturing method thereof
CN112677046A (en) * 2020-12-22 2021-04-20 金华博蓝特电子材料有限公司 Polishing pad dresser and manufacturing method thereof
CN113172553A (en) * 2021-05-25 2021-07-27 宁波江丰电子材料股份有限公司 Chemical mechanical grinding polishing pad dressing device and preparation method thereof
CN113199400A (en) * 2021-05-25 2021-08-03 宁波江丰电子材料股份有限公司 Chemical mechanical grinding polishing pad dressing device and preparation method thereof
CN114603483A (en) * 2022-03-23 2022-06-10 长鑫存储技术有限公司 Polishing pad dresser and chemical mechanical polishing device

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