CN105304784A - LED chip packaging structure and LED chip packaging method - Google Patents
LED chip packaging structure and LED chip packaging method Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000004806 packaging method and process Methods 0.000 title abstract description 22
- 239000004065 semiconductor Substances 0.000 claims abstract description 59
- 239000000758 substrate Substances 0.000 claims abstract description 9
- 238000005530 etching Methods 0.000 claims description 19
- 238000012856 packing Methods 0.000 claims 5
- 210000003141 lower extremity Anatomy 0.000 claims 3
- 238000001259 photo etching Methods 0.000 claims 2
- 238000007789 sealing Methods 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 abstract description 22
- 238000003466 welding Methods 0.000 abstract description 10
- 238000000206 photolithography Methods 0.000 abstract description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- XOYLJNJLGBYDTH-UHFFFAOYSA-M chlorogallium Chemical compound [Ga]Cl XOYLJNJLGBYDTH-UHFFFAOYSA-M 0.000 description 4
- 239000000460 chlorine Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 2
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- UPWPDUACHOATKO-UHFFFAOYSA-K gallium trichloride Chemical compound Cl[Ga](Cl)Cl UPWPDUACHOATKO-UHFFFAOYSA-K 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/831—Electrodes characterised by their shape
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/032—Manufacture or treatment of electrodes
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Abstract
本发明公开了一种LED芯片封装结构及其封装方法,所述LED芯片包括衬底、N型半导体层、发光层、P型半导体层及N电极和P电极,所述LED芯片上预设有用于进行MESA光刻的MESA线,所述P型半导体层、发光层及部分N型半导体层沿MESA线刻蚀形成有N台阶,所述N台阶上设有支撑平台,所述N电极包裹所述支撑平台并与N型半导体层电性连接,所述N电极的上边缘与MESA线之间的距离大于N电极的下边缘与MESA线之间的距离,所述N电极上通过焊球与焊接线电性连接。本发明通过在N台阶上设置支撑平台,N电极设于支撑平台的上方和侧边,支撑平台能够有效释放焊球在N电极上表面的表面应力,减小了焊接时N电极的变形,有效提高了LED器件的稳定性。
The invention discloses an LED chip packaging structure and a packaging method thereof. The LED chip includes a substrate, an N-type semiconductor layer, a light-emitting layer, a P-type semiconductor layer, and an N electrode and a P electrode. On the MESA line where MESA photolithography is performed, the P-type semiconductor layer, light-emitting layer and part of the N-type semiconductor layer are etched along the MESA line to form an N step, and a supporting platform is provided on the N step, and the N electrode wraps the The supporting platform is electrically connected with the N-type semiconductor layer, the distance between the upper edge of the N electrode and the MESA line is greater than the distance between the lower edge of the N electrode and the MESA line, and the solder ball and the MESA line are connected on the N electrode Welding wires are electrically connected. In the present invention, a support platform is arranged on the N steps, and the N electrodes are arranged on the top and side of the support platform. The support platform can effectively release the surface stress of the solder balls on the upper surface of the N electrodes, reducing the deformation of the N electrodes during welding, and effectively The stability of the LED device is improved.
Description
技术领域 technical field
本发明涉及半导体发光器件技术领域,尤其涉及一种LED芯片封装结构及其封装方法。 The invention relates to the technical field of semiconductor light emitting devices, in particular to an LED chip packaging structure and a packaging method thereof.
背景技术 Background technique
发光二极管(Light-EmittingDiode,LED)是一种能发光的半导体电子元件。这种电子元件早在1962年出现,早期只能发出低光度的红光,之后发展出其他单色光的版本,时至今日能发出的光已遍及可见光、红外线及紫外线,光度也提高到相当的光度。而用途也由初时作为指示灯、显示板等;随着技术的不断进步,发光二极管已被广泛的应用于显示器、电视机采光装饰和照明。 A light-emitting diode (Light-EmittingDiode, LED) is a semiconductor electronic component that can emit light. This electronic component appeared as early as 1962. In the early days, it could only emit red light with low luminosity. Later, other monochromatic light versions were developed. Today, the light that can be emitted has covered visible light, infrared rays and ultraviolet rays, and the luminosity has also increased to a considerable extent. of luminosity. The use has also been used as indicator lights, display panels, etc. from the beginning; with the continuous advancement of technology, light-emitting diodes have been widely used in displays, TV lighting decoration and lighting.
LED芯片封装结构目前分成正装、倒装、垂直三种封装结构,目前正装封装结构是最使用最多的。正装封装结构的LED芯片在封装制程里需使用打线(wirebonding)工艺,鉴于正装封装结构的LED芯片P电极和N电极同侧的特殊性,要求打线过程中焊球和电极结合的面积不要超出芯片制程的预设的MESA线。 LED chip packaging structures are currently divided into three packaging structures: front-mount, flip-chip, and vertical. At present, the front-mount packaging structure is the most used. The LED chip with the front package structure needs to use the wire bonding process in the packaging process. In view of the particularity of the P electrode and the N electrode of the LED chip with the front package structure on the same side, it is required that the bonding area of the solder ball and the electrode during the wire bonding process should not be large. Beyond the preset MESA line of the chip process.
随着LED技术的发展,LED芯片N电极和P电极的面积变得越来越小,打线使用的材料由金线变成了合金线;导致现有打线制程会出现如图1所示的问题:焊球和N电极结合过程中N电极变形严重,会对LED芯片的稳定性造成影响,当N电极变形部分超出MESA线时,会出现LED芯片失效。 With the development of LED technology, the area of the N electrode and P electrode of the LED chip becomes smaller and smaller, and the material used for bonding has changed from gold wire to alloy wire; resulting in the existing wire bonding process as shown in Figure 1. Problem: The N electrode deforms seriously during the bonding process of the solder ball and the N electrode, which will affect the stability of the LED chip. When the deformed part of the N electrode exceeds the MESA line, the LED chip will fail.
因此,针对上述技术问题,有必要提供一种LED芯片封装结构及其封装方法。 Therefore, in view of the above technical problems, it is necessary to provide an LED chip packaging structure and a packaging method thereof.
发明内容 Contents of the invention
本发明的目的在于提供一种LED芯片封装结构及其封装方法。 The object of the present invention is to provide an LED chip packaging structure and a packaging method thereof.
为了实现上述目的,本发明实施例提供的技术方案如下: In order to achieve the above object, the technical solutions provided by the embodiments of the present invention are as follows:
一种LED芯片封装结构,所述LED芯片包括衬底、N型半导体层、发光层、P型半导体层及N电极和P电极,所述LED芯片上预设有用于进行MESA光刻的MESA线,所述P型半导体层、发光层及部分N型半导体层沿MESA线刻蚀形成有N台阶,所述N台阶上设有支撑平台,所述N电极包裹所述支撑平台并与N型半导体层电性连接,所述N电极的上边缘与MESA线之间的距离大于N电极的下边缘与MESA线之间的距离,所述N电极上通过焊球与焊接线电性连接。 An LED chip packaging structure, the LED chip includes a substrate, an N-type semiconductor layer, a light-emitting layer, a P-type semiconductor layer, and an N electrode and a P electrode, and the LED chip is preset with a MESA line for performing MESA photolithography , the P-type semiconductor layer, light-emitting layer and part of the N-type semiconductor layer are etched along the MESA line to form an N step, the N step is provided with a supporting platform, and the N electrode wraps the supporting platform and is connected with the N-type semiconductor The layers are electrically connected, the distance between the upper edge of the N electrode and the MESA line is greater than the distance between the lower edge of the N electrode and the MESA line, and the N electrode is electrically connected to the welding wire through solder balls.
作为本发明的进一步改进,所述N电极的下边缘边缘与MESA线之间的距离为5~15μm,N电极的上边缘与MESA线之间的距离为10~30μm。 As a further improvement of the present invention, the distance between the lower edge of the N electrode and the MESA line is 5-15 μm, and the distance between the upper edge of the N electrode and the MESA line is 10-30 μm.
作为本发明的进一步改进,所述N电极在支撑平台侧边的厚度为0.5~3μm,所述N电极在支撑平台上方的厚度为0.5~3μm。 As a further improvement of the present invention, the thickness of the N electrode on the side of the support platform is 0.5-3 μm, and the thickness of the N electrode above the support platform is 0.5-3 μm.
作为本发明的进一步改进,所述N电极在支撑平台上方的厚度与N电极在支撑平台侧边的厚度相等。 As a further improvement of the present invention, the thickness of the N electrode above the support platform is equal to the thickness of the N electrode at the side of the support platform.
作为本发明的进一步改进,所述焊球的面积小于N电极上表面的面积。 As a further improvement of the present invention, the area of the solder ball is smaller than the area of the upper surface of the N electrode.
作为本发明的进一步改进,所述支撑平台为与N型半导体层绝缘连接或电性导通连接。 As a further improvement of the present invention, the support platform is insulated or electrically conductively connected to the N-type semiconductor layer.
相应地,一种LED芯片封装结构的封装方法,所述封装方法包括: Correspondingly, a packaging method of an LED chip packaging structure, the packaging method comprising:
在衬底上依次外延生长N型半导体层、发光层及P型半导体层,形成LED外延结构; Epitaxial growth of N-type semiconductor layer, light-emitting layer and P-type semiconductor layer on the substrate in sequence to form LED epitaxial structure;
在LED外延结构上形成MESA线,并采用MESA光刻形成N电极区域; Form MESA lines on the LED epitaxial structure, and use MESA photolithography to form the N electrode area;
对N电极区域刻蚀形成N台阶,N台阶上形成有支撑平台; Etching the N electrode area to form an N step, and a supporting platform is formed on the N step;
在支撑平台上方和侧边形成于N型半导体层电性连接的N电极,所述N电极的上边缘与MESA线之间的距离大于N电极的下边缘与MESA线之间的距离; An N-electrode electrically connected to the N-type semiconductor layer is formed above and on the side of the support platform, and the distance between the upper edge of the N-electrode and the MESA line is greater than the distance between the lower edge of the N-electrode and the MESA line;
在P型半导体层上形成于P型半导体层电性连接的P电极。 A P electrode electrically connected to the P-type semiconductor layer is formed on the P-type semiconductor layer.
作为本发明的进一步改进,“对N电极区域刻蚀形成N台阶,N台阶上形成有支撑平台”具体包括: As a further improvement of the present invention, "etching the N electrode region to form an N step, and forming a supporting platform on the N step" specifically includes:
对N电极区域全部刻蚀至N型半导体层,而后在N型半导体层上外延生长支撑平台。 Etching the entire N electrode region up to the N-type semiconductor layer, and then epitaxially growing a supporting platform on the N-type semiconductor layer.
作为本发明的进一步改进,“对N电极区域刻蚀形成N台阶,N台阶上形成有支撑平台”具体包括: As a further improvement of the present invention, "etching the N electrode region to form an N step, and forming a supporting platform on the N step" specifically includes:
采用掩膜对N电极区域部分刻蚀至N型半导体层,保留N电极区域中间的部分外延层,形成支撑平台。 A mask is used to partially etch the N-electrode region up to the N-type semiconductor layer, and a part of the epitaxial layer in the middle of the N-electrode region is reserved to form a supporting platform.
作为本发明的进一步改进,所述N台阶通过ICP刻蚀形成。 As a further improvement of the present invention, the N step is formed by ICP etching.
本发明的有益效果是: The beneficial effects of the present invention are:
本发明通过在N台阶上设置支撑平台,N电极设于支撑平台的上方和侧边,支撑平台能够有效释放焊球在N电极上表面的表面应力,减小了焊接时N电极的变形,有效提高了LED器件的稳定性。 In the present invention, a support platform is arranged on the N steps, and the N electrodes are arranged on the top and side of the support platform. The support platform can effectively release the surface stress of the solder balls on the upper surface of the N electrodes, reducing the deformation of the N electrodes during welding, and effectively The stability of the LED device is improved.
附图说明 Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明中记载的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。 In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments described in the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.
图1为现有技术LED芯片上N电极焊接处的电镜图。 FIG. 1 is an electron microscope image of the N electrode welding place on the LED chip in the prior art.
图2a为本发明一具体实施方式中LED芯片的侧面结构示意图。 Fig. 2a is a schematic diagram of the side structure of an LED chip in a specific embodiment of the present invention.
图2b为本发明一具体实施方式中LED芯片的俯视结构示意图。 Fig. 2b is a schematic top view structure diagram of an LED chip in a specific embodiment of the present invention.
具体实施方式 detailed description
为了使本技术领域的人员更好地理解本发明中的技术方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都应当属于本发明保护的范围。 In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
本发明公开了一种LED芯片封装结构,所述LED芯片包括衬底、N型半导体层、发光层、P型半导体层及N电极和P电极,所述LED芯片上预设有用于进行MESA光刻的MESA线,所述P型半导体层、发光层及部分N型半导体层沿MESA线刻蚀形成有N台阶,所述N台阶上设有支撑平台,所述N电极包裹所述支撑平台并与N型半导体层电性连接,所述N电极的上边缘与MESA线之间的距离大于N电极的下边缘与MESA线之间的距离,所述N电极上通过焊球与焊接线电性连接。 The invention discloses an LED chip packaging structure. The LED chip includes a substrate, an N-type semiconductor layer, a light-emitting layer, a P-type semiconductor layer, and an N electrode and a P electrode. engraved MESA line, the P-type semiconductor layer, light-emitting layer and part of the N-type semiconductor layer are etched along the MESA line to form an N step, the N step is provided with a support platform, the N electrode wraps the support platform and It is electrically connected with the N-type semiconductor layer, the distance between the upper edge of the N electrode and the MESA line is greater than the distance between the lower edge of the N electrode and the MESA line, and the N electrode is electrically connected to the welding line through the solder ball. connect.
参图2a所示,本发明的一具体实施方式中LED芯片封装结构从下至上依次包括: Referring to Fig. 2a, in a specific embodiment of the present invention, the LED chip packaging structure includes from bottom to top:
衬底10,衬底可以是蓝宝石、Si、SiC、GaN、ZnO等; Substrate 10, the substrate can be sapphire, Si, SiC, GaN, ZnO, etc.;
N型半导体层20,N型半导体层可以是N型GaN等; N-type semiconductor layer 20, the N-type semiconductor layer can be N-type GaN, etc.;
发光层30,发光层可以是GaN、InGaN等; A light-emitting layer 30, the light-emitting layer can be GaN, InGaN, etc.;
P型半导体层40,P型半导体层可以是P型GaN等; P-type semiconductor layer 40, the P-type semiconductor layer can be P-type GaN, etc.;
N电极60及P电极70,N电极60设置于N台阶50上,且与N型半导体层20电性连接,P电极70设于P型半导体层40上方,且与P型半导体层40电性连接。 The N electrode 60 and the P electrode 70, the N electrode 60 is arranged on the N step 50, and is electrically connected with the N-type semiconductor layer 20, and the P electrode 70 is arranged above the P-type semiconductor layer 40, and is electrically connected with the P-type semiconductor layer 40 connect.
其中,结合图2b所示,LED芯片上预设有用于进行MESA光刻的MESA线1,经过MESA光刻后可以形成MESA图层2。 Wherein, as shown in FIG. 2 b , MESA lines 1 for performing MESA lithography are preset on the LED chip, and MESA layers 2 can be formed after MESA lithography.
本实施方式中的P型半导体层40、发光层30及部分N型半导体层20沿MESA线1刻蚀形成有N台阶50,N台阶50上设有支撑平台51,N电极60包裹支撑平台51并与N型半导体层20电性连接,N电极60上通过焊球与焊接线电性连接。 In this embodiment, the P-type semiconductor layer 40, the light-emitting layer 30 and part of the N-type semiconductor layer 20 are etched along the MESA line 1 to form an N step 50, and a support platform 51 is provided on the N step 50, and the N electrode 60 wraps the support platform 51 And it is electrically connected with the N-type semiconductor layer 20 , and the N electrode 60 is electrically connected with the welding wire through the solder ball.
接合图2b所示,本实施方式中N电极60包括两部分,即位于支撑平台51侧边的N电极部分和位于支撑平台51上方的N电极部分,其中,位于支撑平台51上方的N电极部分的上边缘与MESA线之间的距离大于位于支撑平台51侧边的N电极部分的下边缘与MESA线之间的距离。 As shown in FIG. 2b, the N electrode 60 in this embodiment includes two parts, namely the N electrode part located on the side of the support platform 51 and the N electrode part located above the support platform 51, wherein the N electrode part located above the support platform 51 The distance between the upper edge of the N electrode and the MESA line is greater than the distance between the lower edge of the N-electrode portion on the side of the support platform 51 and the MESA line.
在本发明的一优选实施例中,N电极的下边缘边缘与MESA线之间的距离为5~15μm,N电极的上边缘与MESA线之间的距离为10~30μm; In a preferred embodiment of the present invention, the distance between the lower edge of the N electrode and the MESA line is 5-15 μm, and the distance between the upper edge of the N electrode and the MESA line is 10-30 μm;
在本发明的一优选实施例中,N电极60在支撑平台51上方的厚度为0.5~3μm,N电极60在支撑平台51侧边的厚度为0.5~3μm。 In a preferred embodiment of the present invention, the thickness of the N electrode 60 above the support platform 51 is 0.5-3 μm, and the thickness of the N electrode 60 on the side of the support platform 51 is 0.5-3 μm.
在本发明的一优选实施例中,N电极60在支撑平台51上方的厚度与N电极60在支撑平台51侧边的厚度相等。 In a preferred embodiment of the present invention, the thickness of the N electrode 60 above the support platform 51 is equal to the thickness of the N electrode 60 at the side of the support platform 51 .
在进行焊接时,焊球的面积小于N电极60上表面的面积。 During soldering, the area of the solder ball is smaller than the area of the upper surface of the N electrode 60 .
优选地,本发明图2a、2b所示的一具体实施例中,N电极60的下边缘与MESA线1之间的距离为9~10μm,N电极60的上边缘与MESA线1之间的距离为18~20μm;N电极60在支撑平台51侧边的厚度为2μm,且N电极60在支撑平台51上方的厚度与N电极60在支撑平台51侧边的厚度相等。 Preferably, in a specific embodiment shown in FIGS. The distance is 18-20 μm; the thickness of the N electrode 60 on the side of the support platform 51 is 2 μm, and the thickness of the N electrode 60 above the support platform 51 is equal to the thickness of the N electrode 60 on the side of the support platform 51 .
其中,支撑平台51可以与N型半导体层绝缘连接或电性导通连接。 Wherein, the support platform 51 may be insulated or electrically connected to the N-type semiconductor layer.
本实施例中的LED芯片在焊接过程中,焊球能够覆盖支撑平台上方的N电极,而焊球与支撑平台侧边的N电极不在同一平面内,焊球变形部分不会对侧边的N电极造成挤压,有效地释放了焊球在N电极上表面的表面应力,降低了N电极变形的情况,减小了LED器件失效的情况,有效提高了LED器件的稳定性。 During the welding process of the LED chip in this embodiment, the solder balls can cover the N electrodes above the support platform, but the solder balls and the N electrodes on the side of the support platform are not in the same plane, and the deformed part of the solder balls will not interfere with the N electrodes on the side. The extrusion caused by the electrode effectively releases the surface stress of the solder ball on the upper surface of the N electrode, reduces the deformation of the N electrode, reduces the failure of the LED device, and effectively improves the stability of the LED device.
另外,本实施方式中LED芯片封装结构的封装方法,具体包括: In addition, the packaging method of the LED chip packaging structure in this embodiment specifically includes:
在衬底10上依次外延生长N型半导体层20、发光层30及P型半导体层40,形成LED外延结构; Epitaxially grow the N-type semiconductor layer 20, the light emitting layer 30 and the P-type semiconductor layer 40 on the substrate 10 in order to form an LED epitaxial structure;
在LED外延结构上形成MESA线1,并采用MESA光刻1形成N电极区域; Form a MESA line 1 on the LED epitaxial structure, and use MESA photolithography 1 to form an N electrode region;
对N电极区域刻蚀形成N台阶50,N台阶50上形成有支撑平台51; Etching the N electrode region to form an N step 50, and a supporting platform 51 is formed on the N step 50;
在支撑平台50上方和侧边形成于N型半导体层电性连接的N电极60; An N-electrode 60 electrically connected to the N-type semiconductor layer is formed above and on the side of the support platform 50;
在P型半导体层上形成于P型半导体层电性连接的P电极70。 A P electrode 70 electrically connected to the P-type semiconductor layer is formed on the P-type semiconductor layer.
其中,在本发明的一优选实施例中,“对N电极区域刻蚀形成N台阶,N台阶上形成有支撑平台”具体包括: Among them, in a preferred embodiment of the present invention, "etching the N electrode region to form an N step, and forming a supporting platform on the N step" specifically includes:
对N电极区域全部刻蚀至N型半导体层,而后在N型半导体层上外延生长支撑平台。 Etching the entire N electrode region up to the N-type semiconductor layer, and then epitaxially growing a supporting platform on the N-type semiconductor layer.
该方法是先将N电极区域处的外延层全部刻蚀掉,此步骤与现有技术完全相同,而后在N台阶50的对应区域再生长支撑平台51。 In this method, all the epitaxial layer at the N electrode region is firstly etched away, this step is completely the same as the prior art, and then the support platform 51 is regrown in the corresponding region of the N step 50 .
在本发明的另一优选实施例中,“对N电极区域刻蚀形成N台阶,N台阶上形成有支撑平台”具体包括: In another preferred embodiment of the present invention, "etching the N electrode region to form an N step, and forming a supporting platform on the N step" specifically includes:
采用掩膜对N电极区域部分刻蚀至N型半导体层,保留N电极区域中间的部分外延层,形成支撑平台。 A mask is used to partially etch the N-electrode region up to the N-type semiconductor layer, and a part of the epitaxial layer in the middle of the N-electrode region is reserved to form a supporting platform.
该方法是在进行刻蚀过程中,在支撑平台对应处利用掩膜,将部分外延层保留进而形成支撑平台,无需外延生长支撑平台。 In the method, during the etching process, a mask is used at the corresponding position of the support platform to retain part of the epitaxial layer to form the support platform, without the need for epitaxial growth of the support platform.
本实施方式中刻蚀采用的是ICP刻蚀工艺,ICP蚀刻即气体刻蚀,反应气主要有氯气、氩、四氟化碳、氧气。氯气、四氟化碳、氧气刻蚀原理是在射频作用下产生高能等离子体,同GaN反应达到刻蚀效果,生成挥发性的Ga、GaClx、Ga+、GaClx +、N2,GaF等,生成挥发性氯化镓、氟化镓等被泵抽离反应腔体;氩主要是物理轰击功效,同时Cl2也有物理轰击功效,原理如下: The etching in this embodiment adopts the ICP etching process, and the ICP etching is gas etching, and the reaction gases mainly include chlorine, argon, carbon tetrafluoride, and oxygen. The etching principle of chlorine gas, carbon tetrafluoride and oxygen is to generate high-energy plasma under the action of radio frequency, react with GaN to achieve etching effect, and generate volatile Ga, GaCl x , Ga + , GaCl x + , N 2 , GaF, etc. , to generate volatile gallium chloride, gallium fluoride, etc., which are pumped out of the reaction chamber; argon mainly has the effect of physical bombardment, and Cl 2 also has the effect of physical bombardment, the principle is as follows:
GaN+Cl→Ga,GaClx,Ga+,GaClx +,N2(x=1,2,3)。 GaN+Cl→Ga, GaCl x , Ga + , GaCl x + , N 2 (x=1, 2, 3).
当然,在其他实施方式中也可以采用其他刻蚀工艺形成N台阶及支撑平台,此处不再一一举例进行说明。 Certainly, in other implementation manners, other etching processes may also be used to form the N step and the supporting platform, which will not be illustrated here one by one.
在对上述LED芯片封装结构进行焊接时,焊球与N电极进行焊接,金线与焊球电性连接,其中,焊球的形状大致呈圆形,且焊球的面积小于N电极上表面的面积,以免焊球在焊接时凸出于N电极外部,避免了焊球与MESA线接触。同时,支撑平台的设置可以减小焊接过程中焊球在N电极上的表面应力,防止N电极变形与MESA线接触造成失效。 When the above-mentioned LED chip packaging structure is soldered, the solder ball is soldered to the N electrode, and the gold wire is electrically connected to the solder ball. The shape of the solder ball is roughly circular, and the area of the solder ball is smaller than that of the upper surface of the N electrode. area, so as to prevent the solder ball from protruding from the outside of the N electrode during soldering, and avoiding the contact between the solder ball and the MESA line. At the same time, the setting of the supporting platform can reduce the surface stress of the solder ball on the N electrode during the welding process, and prevent the deformation of the N electrode and the contact with the MESA line to cause failure.
由以上技术方案可以看出,与现有技术相比,本发明通过在N台阶上设置支撑平台,N电极设于支撑平台的上方和侧边,支撑平台能够有效释放焊球在N电极上表面的表面应力,减小了焊接时N电极的变形,有效提高了LED器件的稳定性。 It can be seen from the above technical solutions that, compared with the prior art, the present invention provides a supporting platform on the N step, and the N electrode is arranged on the top and side of the supporting platform, and the supporting platform can effectively release solder balls on the upper surface of the N electrode. The surface stress reduces the deformation of the N electrode during welding and effectively improves the stability of the LED device.
对于本领域技术人员而言,显然本发明不限于上述示范性实施例的细节,而且在不背离本发明的精神或基本特征的情况下,能够以其他的具体形式实现本发明。因此,无论从哪一点来看,均应将实施例看作是示范性的,而且是非限制性的,本发明的范围由所附权利要求而不是上述说明限定,因此旨在将落在权利要求的等同要件的含义和范围内的所有变化囊括在本发明内。不应将权利要求中的任何附图标记视为限制所涉及的权利要求。 It will be apparent to those skilled in the art that the invention is not limited to the details of the above-described exemplary embodiments, but that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Accordingly, the embodiments should be regarded in all points of view as exemplary and not restrictive, the scope of the invention being defined by the appended claims rather than the foregoing description, and it is therefore intended that the scope of the invention be defined by the appended claims rather than by the foregoing description. All changes within the meaning and range of equivalents of the elements are embraced in the present invention. Any reference sign in a claim should not be construed as limiting the claim concerned.
此外,应当理解,虽然本说明书按照实施方式加以描述,但并非每个实施方式仅包含一个独立的技术方案,说明书的这种叙述方式仅仅是为清楚起见,本领域技术人员应当将说明书作为一个整体,各实施例中的技术方案也可以经适当组合,形成本领域技术人员可以理解的其他实施方式。 In addition, it should be understood that although this specification is described according to implementation modes, not each implementation mode only contains an independent technical solution, and this description in the specification is only for clarity, and those skilled in the art should take the specification as a whole , the technical solutions in the various embodiments can also be properly combined to form other implementations that can be understood by those skilled in the art.
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