CN105300300A - Coated film thickness device for simultaneously measuring single-sided coated lens at multiple points and method thereof - Google Patents
Coated film thickness device for simultaneously measuring single-sided coated lens at multiple points and method thereof Download PDFInfo
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Abstract
本发明提供了一种多点同时测量单面镀膜透镜的镀膜厚度装置及其方法,该装置包括光源、分光装置、透镜、光电位移传感器、信号放大器、光信号处理器和计算机;所述光源、分光装置、透镜和所述光电位移传感器的光接收面的中心同一光路上、且依次排列;所述光电位移传感器、信号放大器、光信号处理器和计算机依次电连接。光源经过所述分光装置分成多束光,经过透镜投射到所述光电位移传感器上,所述光电位移传感器将光信号经过所述信号放大装置放大后传送到所述光信号处理器,所述光信号处理器将光信号转换为电信号后输入到所述计算机,所述计算机进行薄膜厚度的计算,可实现同时多点测量单面镀膜透镜的镀膜厚度,通过对比镀膜厚度分析镀膜的均匀性。
The invention provides a device and method for simultaneously measuring the coating thickness of a single-sided coated lens at multiple points. The device includes a light source, a spectroscopic device, a lens, a photoelectric displacement sensor, a signal amplifier, an optical signal processor and a computer; The light splitting device, the lens and the center of the light-receiving surface of the photoelectric displacement sensor are on the same optical path and arranged in sequence; the photoelectric displacement sensor, signal amplifier, optical signal processor and computer are electrically connected in sequence. The light source is divided into multiple beams by the spectroscopic device, projected onto the photoelectric displacement sensor through the lens, and the photoelectric displacement sensor amplifies the optical signal through the signal amplification device and then transmits it to the optical signal processor. The signal processor converts the optical signal into an electrical signal and then inputs it to the computer. The computer calculates the thickness of the film, which can realize simultaneous multi-point measurement of the coating thickness of the single-sided coated lens, and analyze the uniformity of the coating by comparing the coating thickness.
Description
技术领域technical field
本发明属于光学透镜生产领域,尤其针对于大批量生产的、单面镀膜的凸透镜和凹透镜的镀膜厚度测量,具体涉及一种多点同时测量单面镀膜透镜的镀膜厚度装置及其方法。The invention belongs to the field of optical lens production, and is especially aimed at measuring the coating thickness of single-sided coated convex lenses and concave lenses produced in large quantities, and in particular relates to a multi-point simultaneously measuring coating thickness device and method for single-sided coated lenses.
背景技术Background technique
无论是生活上还是军事上,光学透镜必不可少。但无论是树脂透镜还是玻璃透镜,其本身的透光率都只有91%左右,会有部分光线在两个表面反射回来。镜片的反射可使光线透过率减小并且在视网膜形成干扰而影响成像质量。而镀膜技术是利用光学技术,通过在透镜表面镀上一定厚度的单层或者多层光学薄膜使镜片获得一些新的原先所不具备的光学性能,以改善镜片反射光线的能力起到增强或者减少光线透过率使镜片的透光率增加到98%。Whether it is life or military, optical lenses are essential. However, whether it is a resin lens or a glass lens, its own light transmittance is only about 91%, and some light will be reflected back on the two surfaces. The reflection of the lens can reduce the light transmittance and form interference in the retina to affect the image quality. The coating technology is the use of optical technology, by coating a certain thickness of single-layer or multi-layer optical film on the surface of the lens to obtain some new optical properties that the lens did not have before, so as to improve the ability of the lens to reflect light and enhance or reduce it. The light transmittance increases the light transmittance of the lens to 98%.
镀膜后,镜片表面反射光线透过率降低,解决镜片在强光下难以成像的问题,防止紫外线、红外线、x线对视力的损伤。After coating, the transmittance of reflected light on the surface of the lens is reduced, which solves the problem that the lens is difficult to image under strong light, and prevents damage to vision caused by ultraviolet rays, infrared rays, and x-rays.
目前镜片镀膜主要有两种薄膜:一种是抗反射膜。另一种是加硬膜。对于透镜,镀膜厚度是个重要参数,镀膜的均匀性决定着透镜是否可以使用,因此透镜所镀薄膜厚度测量成为生产中一个必不可少的环节。At present, there are mainly two kinds of films for lens coating: one is anti-reflection film. The other is to add dura mater. For lenses, the thickness of the coating is an important parameter, and the uniformity of the coating determines whether the lens can be used. Therefore, the measurement of the thickness of the film coated on the lens has become an indispensable link in the production.
发明内容Contents of the invention
本发明的目的是提供一种多点同时测量单面镀膜透镜的镀膜厚度装置及其方法,通过激光器输出的光经过分光装置分成多束光,可实现同时多点测量单面镀膜透镜的镀膜厚度,通过对比镀膜厚度分析镀膜的均匀性。The purpose of the present invention is to provide a device and method for simultaneously measuring the coating thickness of a single-sided coated lens at multiple points. The light output by the laser is divided into multiple beams through a spectroscopic device, so that simultaneous multi-point measurement of the coating thickness of a single-sided coated lens can be realized. , and analyze the uniformity of the coating by comparing the coating thickness.
本发明的技术方案是:一种多点同时测量单面镀膜透镜的镀膜厚度装置,包括光源、分光装置、透镜、光电位移传感器、信号放大器、光信号处理器和计算机;The technical solution of the present invention is: a device for multi-point simultaneous measurement of the coating thickness of a single-sided coated lens, including a light source, a light splitting device, a lens, a photoelectric displacement sensor, a signal amplifier, an optical signal processor and a computer;
所述分光装置包括至少1个半透半反镜和1个全反镜;所述全反镜位于所述半透半反镜的反射光路上,所述半透半反镜的入射光路和所述半透半反镜的反射光路的夹角为90度角,所述半透半反镜的反射光路为所述全反镜的入射光路,所述全反镜的入射光路和所述全反镜的反射光路夹角为90度角,所述半透半反镜的透射光路与所述全反镜的反射光路相平行;The light splitting device includes at least one half mirror and one total mirror; the total mirror is located on the reflected light path of the half mirror, and the incident light path of the half mirror is The included angle of the reflected light path of the half-transparent mirror is 90 degrees, the reflected light path of the half-mirror is the incident light path of the total mirror, the incident light path of the total mirror and the total reflection The included angle of the reflected optical path of the mirror is 90 degrees, and the transmitted optical path of the half mirror is parallel to the reflected optical path of the total mirror;
所述光源、分光装置、透镜和所述光电位移传感器的光接收面的中心位于同一光路上、且依次排列;所述光电位移传感器、信号放大器、光信号处理器和计算机依次电连接;The center of the light source, the light splitter, the lens and the light receiving surface of the photoelectric displacement sensor are located on the same optical path and arranged in sequence; the photoelectric displacement sensor, signal amplifier, optical signal processor and computer are electrically connected in sequence;
所述光电位移传感器用于接收光信号,并将光信号传送到所述信号放大器;所述信号放大器用于将光信号转换为电信号后输入到所述计算机;所述计算机用于计算透镜的镀膜厚度。The photoelectric displacement sensor is used to receive the light signal and transmit the light signal to the signal amplifier; the signal amplifier is used to convert the light signal into an electrical signal and input it to the computer; the computer is used to calculate the Coating thickness.
上述方案中,所述分光装置包括6个半透半反镜和3个全反镜;6个所述半透半反镜分别为第一半透半反镜、第二半透半反镜、第三半透半反镜、第四半透半反镜、第五半透半反镜和第六半透半反镜;3个所述全反镜分别为第一全反镜、第二全反镜和第三全反镜;In the above scheme, the light-splitting device includes 6 half-mirrors and 3 total mirrors; the 6 half-mirrors are respectively the first half-mirror, the second half-mirror, the second half-mirror, The third half-mirror, the fourth half-mirror, the fifth half-mirror and the sixth half-mirror; the three total mirrors are respectively the first full-mirror and the second full-mirror Mirror and third full mirror;
所述第一半透半反镜、第二半透半反镜和第三半透半反镜依次位于同一光路上;The first half mirror, the second half mirror and the third half mirror are sequentially located on the same optical path;
所述第五半透半反镜、第六半透半反镜和第三全反镜依次位于所述第一半透半反镜的反射光路上;The fifth half-mirror, the sixth half-mirror and the third full-mirror are sequentially located on the reflected light path of the first half-mirror;
所述第四半透半反镜和第二全反镜依次位于所述第二半透半反镜的反射光路上;The fourth half mirror and the second total mirror are sequentially located on the reflected light path of the second half mirror;
所述第一全反镜位于所述第三半透半反镜的反射光路上。The first total reflection mirror is located on the reflection light path of the third half mirror.
上述方案中,所述半透半反镜和全反镜处于同一水平面上。In the above solution, the half mirror and the total mirror are on the same level.
上述方案中,所述光源为激光器提供的高能量光源。In the above solution, the light source is a high-energy light source provided by a laser.
一种根据所述多点同时测量单面镀膜透镜的镀膜厚度装置的检测方法,包括以下步骤:A detection method of a device for simultaneously measuring the coating thickness of a single-sided coated lens according to the multi-point, comprising the following steps:
所述光源经过所述分光装置分成若干路相互平行的光束,以其中一路光束为例,光束在距离光轴h的高度投射到待测未镀膜透镜上,光束先经过未镀膜透镜折射再经过空气折射,最后光束投射到所述光电位移传感器上的H位置,所述透镜到所述光电位移传感器的距离为g;The light source is divided into several parallel beams by the beam splitting device. Taking one of the beams as an example, the beam is projected onto the uncoated lens to be tested at a height of h from the optical axis, and the beam is first refracted by the uncoated lens and then passed through the air. Refraction, finally the light beam is projected onto the H position on the photoelectric displacement sensor, and the distance from the lens to the photoelectric displacement sensor is g;
将未镀膜透镜换成单面镀膜透镜,光经过单面镀膜透镜折射再经过空气折射,最后光束投射到所述光电位移传感器上的H'位置,所述光电位移传感器将H和H'的信号经过所述信号放大装置放大后传送到所述光信号处理器,所述光信号处理器将光信号转换为电信号后输入到所述计算机,所述计算机进行镀膜厚度的计算;所述薄膜厚度的计算公式为:Replace the uncoated lens with a single-sided coated lens, the light is refracted by the single-sided coated lens and then refracted by the air, and finally the beam is projected to the H' position on the photoelectric displacement sensor, and the photoelectric displacement sensor converts the signals of H and H' After being amplified by the signal amplification device, it is sent to the optical signal processor, and the optical signal processor converts the optical signal into an electrical signal and then inputs it to the computer, and the computer calculates the coating thickness; the film thickness The calculation formula is:
其中,d为透镜的镀膜厚度,Δs为光束的位移Δs=OH-OH',r为透镜的单面半径、h为光束距离光轴的高度、g为待测透镜到光电位移传感器光接收面的距离、n0为薄膜折射率,空气折射率为1。Among them, d is the coating thickness of the lens, Δs is the displacement of the beam Δs=OH-OH', r is the single-sided radius of the lens, h is the height of the beam from the optical axis, and g is the light-receiving surface from the lens to be measured to the photoelectric displacement sensor The distance, n 0 is the refractive index of the film, and the refractive index of air is 1.
本发明的有益效果是:本发明通过激光器输出的光经过所述分光装置分成多束光,经过透镜投射到所述光电位移传感器上,所述光电位移传感器将光信号经过所述信号放大装置放大后传送到所述光信号处理器,所述光信号处理器将光信号转换为电信号后输入到所述计算机,所述计算机进行薄膜厚度的计算,可实现同时多点测量单面镀膜透镜的镀膜厚度,通过对比镀膜厚度分析镀膜的均匀性。相比于传统的需借助特殊仪器对样本透镜造成一定破坏的测试方法,本发明无须直接接触样本,不会对样本造成损害,测量完毕可以直接使用;相比于现在其他非接触测量方法,本发明的方法更加简单,方便操作,节省时间人力,具有较高的经济效益高;本发明主要针对于批量生产的透镜的检测,可以测量各种单面镀膜的凸透镜和凹透镜,使用同一套设备即可。The beneficial effects of the present invention are: the light outputted by the laser in the present invention is divided into multiple beams by the light splitting device, and projected onto the photoelectric displacement sensor through the lens, and the photoelectric displacement sensor amplifies the optical signal through the signal amplification device After that, it is transmitted to the optical signal processor, and the optical signal processor converts the optical signal into an electrical signal and then inputs it to the computer, and the computer calculates the thickness of the film, which can realize simultaneous multi-point measurement of the single-sided coated lens. Coating thickness, the uniformity of the coating is analyzed by comparing the coating thickness. Compared with the traditional test method that needs to use special instruments to cause certain damage to the sample lens, the present invention does not need to directly contact the sample, will not cause damage to the sample, and can be used directly after the measurement; compared with other current non-contact measurement methods, the present invention The invented method is simpler, convenient to operate, saves time and manpower, and has high economic benefits; the present invention is mainly aimed at the detection of mass-produced lenses, and can measure various single-sided coated convex lenses and concave lenses, using the same set of equipment that is Can.
附图说明Description of drawings
图1是本发明一实施例的具体实施结构示意图;Fig. 1 is the specific implementation structure schematic diagram of an embodiment of the present invention;
图2是本发明一实施例的分光装置细节示意图;Fig. 2 is a detailed schematic diagram of a spectroscopic device according to an embodiment of the present invention;
图3是发明一实施例的凸透镜镀膜后折射光线发生偏移示意图;Fig. 3 is a schematic diagram of deviation of refracted light rays after the coating of the convex lens according to an embodiment of the invention;
图4是发明一实施例的凹透镜镀膜后折射光线发生偏移示意图。Fig. 4 is a schematic diagram of the divergence of refracted light rays after the coating of the concave lens according to an embodiment of the invention.
图中:1、光源;2、分光装置;3、透镜;4、光电位移传感器;5、信号放大器;6、光信号处理器;7、和计算机;8、光轴。In the figure: 1, light source; 2, spectroscopic device; 3, lens; 4, photoelectric displacement sensor; 5, signal amplifier; 6, optical signal processor; 7, and computer; 8, optical axis.
具体实施方式detailed description
下面结合附图具体实施方式对本发明作进一步详细说明,但本发明的保护范围并不限于此。The present invention will be described in further detail below in conjunction with the specific embodiments of the accompanying drawings, but the protection scope of the present invention is not limited thereto.
图1所示为本发明所述多点同时测量单面镀膜透镜的镀膜厚度装置的一种实施方式,所述多点同时测量单面镀膜透镜的镀膜厚度装置包括光源1、分光装置2、透镜3、光电位移传感器4、信号放大器5、光信号处理器6和计算机7。Fig. 1 is shown as a kind of embodiment of the coating thickness device of multi-point simultaneously measuring single-sided coated lens of the present invention, described multi-point simultaneously measuring the coating thickness device of single-sided coated lens comprises light source 1, spectroscopic device 2, lens 3. Photoelectric displacement sensor 4, signal amplifier 5, optical signal processor 6 and computer 7.
所述光源1、分光装置2、透镜3和所述光电位移传感器4的光接收面的中心位于同一光路上、且依次排列;所述光电位移传感器4、信号放大器5、光信号处理器6和计算机7依次电连接;The center of the light receiving surface of the light source 1, the spectroscopic device 2, the lens 3 and the photoelectric displacement sensor 4 is located on the same optical path and arranged in sequence; the photoelectric displacement sensor 4, signal amplifier 5, optical signal processor 6 and The computer 7 is electrically connected in turn;
所述光电位移传感器4用于接收光信号,并将光信号传送到所述信号放大器5;所述信号放大器5用于将光信号转换为电信号后输入到所述计算机7;所述计算机7用于计算透镜的镀膜厚度。Described photoelectric displacement sensor 4 is used for receiving light signal, and light signal is sent to described signal amplifier 5; Said signal amplifier 5 is used for inputting into described computer 7 after light signal is converted into electric signal; Said computer 7 Used to calculate the coating thickness of the lens.
所述透镜3包括单面镀膜透镜和未镀膜透镜,所述单面镀膜的透镜和未镀膜的透镜规格相同。The lens 3 includes a single-sided coated lens and an uncoated lens, and the specifications of the single-sided coated lens and the uncoated lens are the same.
所述分光装置2包括至少个半透半反镜和全反镜,所述半透半反镜和个全反镜处于同一水平面,所述全反镜位于所述半透半反镜的反射光路上,所述半透半反镜的入射光路和所述半透半反镜的反射光路的夹角为90度角,所述半透半反镜的反射光路为所述全反镜的入射光路,所述全反镜的入射光路和所述全反镜的反射光路夹角为90度角,所述半透半反镜的透射光路与所述全反镜的反射光路相平行。优选的,所述分光装置2包括6个半透半反镜和3个全反镜,如图2所示,6个所述半透半反镜分别为第一半透半反镜201、第二半透半反镜202、第三半透半反镜203、第四半透半反镜204、第五半透半反镜205和第六半透半反镜206;3个所述全反镜分别为第一全反镜207、第二全反镜208和第三全反镜209。所述第一半透半反镜201、第二半透半反镜202和第三半透半反镜203依次位于同一光路上;所述第五半透半反镜205、第六半透半反镜206和第三全反镜209依次位于所述第一半透半反镜201的反射光路上;所述第四半透半反镜204和第二全反镜208依次位于所述第二半透半反镜202的反射光路上;所述第一全反镜207位于所述第三半透半反镜203的反射光路上。Described spectroscopic device 2 comprises at least a half-mirror and a total reflection mirror, and the half-mirror and a total reflection mirror are at the same level, and the total reflection mirror is positioned at the reflected light of the half-mirror. On the road, the angle between the incident light path of the half mirror and the reflected light path of the half mirror is 90 degrees, and the reflected light path of the half mirror is the incident light path of the total mirror , the angle between the incident light path of the total reflection mirror and the reflection light path of the total reflection mirror is 90 degrees, and the transmission light path of the half mirror is parallel to the reflection light path of the total reflection mirror. Preferably, the light splitting device 2 includes 6 half mirrors and 3 total mirrors, as shown in Figure 2, the 6 half mirrors are respectively the first half mirror 201, the second half mirror Two half mirrors 202, the third half mirror 203, the fourth half mirror 204, the fifth half mirror 205 and the sixth half mirror 206; 3 said total reflections The mirrors are respectively a first total reflection mirror 207, a second total reflection mirror 208 and a third total reflection mirror 209. The first half mirror 201, the second half mirror 202 and the third half mirror 203 are located on the same optical path in turn; the fifth half mirror 205, the sixth half mirror Anti-mirror 206 and the 3rd total reflection mirror 209 are positioned at the reflected optical path of described first half-mirror 201 successively; Described 4th half-mirror 204 and the second total reflection mirror 208 are positioned at described second The reflection optical path of the half mirror 202 ; the first total reflection mirror 207 is located on the reflection optical path of the third half mirror 203 .
优选的,所述光源1为激光器提供的高能量光源。Preferably, the light source 1 is a high-energy light source provided by a laser.
所述光源1经所述第一半反半透镜201的透射光投射到所述第二半反半透镜202,所述第一半透半反镜201的反射光投射到第五半透半反镜205;所述第二半透半反镜202的透射光投射到所述第三半透半反镜203,所述第二半透半反镜202的反射光投射到所述第四半透半反镜204;经所述第三半透半反镜203的透射光形成第一路入射光束,经所述第三半透半反镜203的反射光投射到所述第一全反镜207,经所述第一全反镜207的反射光形成第二路入射光束;经所述第四半透半反镜204的反射光形成第三束入射光束,经所述第四半透半反镜204的透射光投射到所述第二全反镜208,所述第二全反镜208的反射光形成第四路入射光束;经所述第五半透半反镜205的透射光投射到所述第六半透半反镜206,所述第五半透半反镜205的反射光形成第五路入射光束;经所述第六半透半反镜206的透射光投射到所述第三全反镜209,所述第六半透半反镜206的反射光形成第六路入射光束;经所述第三全反镜209的反射光形成第七路入射光束,七路入射光束互相平行,且所述半透半反镜和个全反镜处于同一水平面,使七路入射光束以距离光轴8相同的高度h投射到待测未镀膜透镜上,在所述光电位移传感器4上的H位置在同一直线上。The transmitted light of the light source 1 through the first half mirror 201 is projected to the second half mirror 202, and the reflected light of the first half mirror 201 is projected to the fifth half mirror. mirror 205; the transmitted light of the second half mirror 202 is projected to the third half mirror 203, and the reflected light of the second half mirror 202 is projected to the fourth half mirror Half mirror 204; the transmitted light through the third half mirror 203 forms the first incident light beam, and the reflected light through the third half mirror 203 is projected onto the first total mirror 207 , the reflected light of the first total mirror 207 forms a second incident beam; the reflected light of the fourth half mirror 204 forms a third incident beam, and passes through the fourth half mirror The transmitted light of the mirror 204 is projected onto the second total reflection mirror 208, and the reflected light of the second total reflection mirror 208 forms the fourth road incident light beam; the transmitted light through the fifth half mirror 205 is projected into The reflected light of the sixth half mirror 206 and the fifth half mirror 205 forms a fifth incident light beam; the transmitted light through the sixth half mirror 206 is projected onto the first half mirror 206 Three total mirrors 209, the reflected light of the sixth half-mirror 206 forms the sixth incident beam; the reflected light of the third total mirror 209 forms the seventh incident beam, and the seven incident beams mutually Parallel, and the half mirror and the first full mirror are on the same horizontal plane, so that the seven incident light beams are projected onto the uncoated lens to be measured at the same height h from the optical axis 8, on the photoelectric displacement sensor 4 The H positions are on the same straight line.
一种根据所述多点同时测量单面镀膜透镜的镀膜厚度装置的检测方法,包括以下步骤:A detection method of a device for simultaneously measuring the coating thickness of a single-sided coated lens according to the multi-point, comprising the following steps:
在已知所述透镜3的单面半径r,即前半径或后半径,薄膜材料的折射率n0的条件下,所述光源1经过所述分光装置2分成七路互相平行的入射光束,以其中第一路入射光束为例,光束在距离光轴8h的高度投射到待测未镀膜透镜上,光束先经过未镀膜透镜折射再经过空气折射,最后光束投射到所述光电位移传感器4上的H位置,所述透镜到所述光电位移传感器4的距离为g,g可根据情况自行设置;Under the condition that the single-sided radius r of the lens 3 is known, that is, the front radius or the rear radius, and the refractive index n0 of the film material, the light source 1 is divided into seven parallel incident light beams through the light splitting device 2, Taking the first incident light beam as an example, the light beam is projected onto the uncoated lens to be tested at a height of 8h from the optical axis, the light beam is firstly refracted by the uncoated lens and then refracted by air, and finally the light beam is projected onto the photoelectric displacement sensor 4 H position, the distance from the lens to the photoelectric displacement sensor 4 is g, and g can be set by itself according to the situation;
将未镀膜透镜换成单面镀膜透镜,光经过单面镀膜透镜折射再经过空气折射,最后光束投射到所述光电位移传感器4上的H'位置,七路入射光束在所述光电位移传感器4上的投射点在同一水平线上,所述光电位移传感器4将H和H'的信号经过所述信号放大装置5放大后传送到所述光信号处理器6,所述光信号处理器6将光信号转换为电信号后输入到所述计算机7,所述计算机7进行镀膜厚度的计算。Replace the uncoated lens with a single-sided coated lens, the light is refracted by the single-sided coated lens and then refracted by the air, and finally the light beam is projected to the H' position on the photoelectric displacement sensor 4, and the seven incident beams are on the photoelectric displacement sensor 4 The projection point above is on the same horizontal line, and the photoelectric displacement sensor 4 amplifies the signals of H and H' through the signal amplifying device 5 and then transmits them to the optical signal processor 6, and the optical signal processor 6 converts the light After the signal is converted into an electrical signal, it is input to the computer 7, and the computer 7 calculates the coating thickness.
所述计算机7根据上述方法同时计算七路入射光束在透镜3上投射点处的镀膜厚度,通过对比镀膜厚度分析镀膜的均匀性。The computer 7 simultaneously calculates the coating thicknesses of the seven incident light beams at the projection points on the lens 3 according to the above method, and analyzes the uniformity of the coatings by comparing the coating thicknesses.
所述薄膜厚度的计算公式为:The calculation formula of described film thickness is:
其中,d为透镜的镀膜厚度,Δs为光束的位移Δs=OH-OH',r为透镜的单面半径,h为光束距离光轴的高度,g为待测透镜到光电位移传感器光接收面的距离,n0为薄膜折射率,空气折射率为1,O光电位移传感器光接收面的中心。Among them, d is the coating thickness of the lens, Δs is the displacement of the beam Δs=OH-OH', r is the single-sided radius of the lens, h is the height of the beam from the optical axis, and g is the light-receiving surface from the lens to be measured to the photoelectric displacement sensor The distance, n 0 is the refractive index of the film, the refractive index of air is 1, and O is the center of the light-receiving surface of the photoelectric displacement sensor.
目前生产加工中最常见的是凸透镜和凹透镜,利用本发明分别对凸透镜和凹透镜进行测量,分别如图3和图4所示,测量的原理和方法相同。Convex lens and concave lens are the most common in production and processing at present. Utilize the present invention to measure convex lens and concave lens respectively, as shown in Fig. 3 and Fig. 4 respectively, the principle and method of measurement are the same.
与现有技术相比本发明通过激光器输出的光经过所述分光装置分成多束光,经过透镜投射到所述光电位移传感器上,所述光电位移传感器将光信号经过所述信号放大装置放大后传送到所述光信号处理器,所述光信号处理器将光信号转换为电信号后输入到所述计算机,所述计算机进行薄膜厚度的计算,可实现同时多点测量单面镀膜透镜的镀膜厚度,通过对比镀膜厚度分析镀膜的均匀性。Compared with the prior art, the light output by the laser in the present invention is divided into multiple beams through the spectroscopic device, and projected onto the photoelectric displacement sensor through the lens, and the photoelectric displacement sensor amplifies the optical signal through the signal amplification device It is transmitted to the optical signal processor, and the optical signal processor converts the optical signal into an electrical signal and then inputs it to the computer, and the computer calculates the thickness of the film, which can realize simultaneous multi-point measurement of the coating of a single-sided coated lens Thickness, the uniformity of the coating is analyzed by comparing the thickness of the coating.
所述实施例为本发明的优选的实施方式,但本发明并不限于上述实施方式,在不背离本发明的实质内容的情况下,本领域技术人员能够做出的任何显而易见的改进、替换或变型均属于本发明的保护范围。The described embodiment is a preferred implementation of the present invention, but the present invention is not limited to the above-mentioned implementation, without departing from the essence of the present invention, any obvious improvement, replacement or modification that those skilled in the art can make Modifications all belong to the protection scope of the present invention.
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