CN105264391A - System and method for testing radio frequency wireless signal transceivers using wireless test signals - Google Patents
System and method for testing radio frequency wireless signal transceivers using wireless test signals Download PDFInfo
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- CN105264391A CN105264391A CN201480032203.7A CN201480032203A CN105264391A CN 105264391 A CN105264391 A CN 105264391A CN 201480032203 A CN201480032203 A CN 201480032203A CN 105264391 A CN105264391 A CN 105264391A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/318—Received signal strength
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/318—Received signal strength
- H04B17/327—Received signal code power [RSCP]
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Abstract
The invention provides a system and method for facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT). Using multiple antennas within a shielded enclosure containing the DUT, multiple wireless RF test signals resulting from a RF test signal radiated from the DUT can be captured and have their respective signal phases controlled in accordance with one or more signal characteristics, including their respective signal power levels, their respective signal phases as received, and a signal power level of a combination of the received signals. Such phase control of the captured wireless RF test signals can be performed individually for any DUT tested within the shielded enclosure, thereby providing compensation for the multipath signal environment within the shielded enclosure irrespective of the placement of the DUT, and thereby simulating a wired test signal path during wireless testing of the DUT.
Description
Technical field
Present patent application is that on March 15th, 2013 submits to and name is called the U.S. Patent application 13/839 of " system and method (SystemandMethodforTestingRadioFrequencyWirelessSignalTra nsceiversUsingWirelessTestSignals) using wireless test signal testing radio frequency wireless signal transceiver ", the cip application of 162, and on March 15th, 2013 submit to and name is called the U.S. Patent application 13/839 of " system and method (SystemandMethodforTestingRadioFrequencyWirelessSignalTra nsceiversUsingWirelessTestSignals) using wireless test signal testing radio frequency wireless signal transceiver ", the cip application of 583, the content of this two application is incorporated herein by reference.
Background technology
The present invention relates to testing radio frequency (RF) wireless signal transceiver, and in particular to test such device without the need to using the RF signal cable of transmission RF test signal.
Many electronic installations now use wireless technology to be used for connecting and these two kinds of objects that communicate.Because wireless device sends and receives electromagnetic energy, and because two or more wireless device may disturb running each other because of its signal frequency and power spectrum density, these devices and wireless technology thereof must follow various wireless technology standard specification.
When designing such device, slip-stick artist additionally must notice to guarantee that such device meets or is better than it wireless technology comprised and specifies each in the measured specification observed.In addition, when these devices will manufacture future in a large number, its can acceptance test to guarantee that manufacturing defect can not cause unsuitable running, comprise it and whether follow the measured specification of this wireless technology comprised.
In order to test it after these device manufactures and assembling, current wireless device test macro (" tester ") utilizes subsystem to analyze the signal being received from each device.This type of subsystem at least comprises Vector Signal Generator (VSG) usually, and it is for providing the source signal to this device to be transmitted, and vector signal analyzer (VSA), and it is for analyzing the signal produced by this device.The signal produced by VSG and the analysis performed by VSA normally capable of program design, each signal of different frequency scope, bandwidth and modulating signal characteristic so can be used whether to follow various wireless technology standard to test various device.
The calibration of device under test (DUT) and performance detecting test use conductive signal path (such as cable) to carry out usually, and the wireless signal path that non-usage DUT communicates with tester thus via electromagnetic radiation.Therefore, between tester and DUT, signal transmits via this conductive signal path, but not through arround space to external radiation.The repeatability using this type of conductive signal path to contribute to guaranteeing to measure and consistance, and get rid of the position and orientation needing to consider DUT in Signal transmissions (transmission and reception).
For multiple-input and multiple-output (MIMO) DUT, each I/O of this device under test (DUT) must provide the signal path of certain pattern.Such as, for the MIMO device being intended to use three antenna operations, three conductive signal path of testing must be provided for, such as, cable and connection.
But, owing to needing physically to connect and disconnect the cable between this device under test (DUT) and tester, so use conductive signal path affects the test duration needed for each DUT significantly.And, for MIMODUT, all need when starting test and stopping test to carry out connection repeatedly and disconnection action.And, due to the signal be transmitted at test period be not via arround space radiation (mode that this signal adopts usually), and the antenna assembly of this device under test (DUT) is not used at this type of test period, so the operation of the non-simulate real world of this class testing, and this test result does not reflect any Performance Characteristics belonging to antenna.
As an alternative, can use via electromagnetic radiation but not test via the test signal that cable transmits.Which has the advantage not needing to connect and disconnect test cable, thus shortens the test duration being relevant to and connecting and disconnect.But, owing to stemming from other electromagnetic signals that is local and space arround interspersing among, (that is, thus radiation and receive space arround test signal) is just vulnerable to signal disturbing and mistake originally so " channel " that have radiation signal and receiver antenna to exist.The multi-path signal that this device under test (DUT) antenna can receive this type of signal and may comprise because of signal reflex from each interference signal source.Therefore, compare to using corresponding conductive signal path (such as, the cable for each antenna connects), " condition " of being somebody's turn to do " channel " is usually not good.
A kind of prevent or reduce at least significantly from the method for the interference of this type of extraneous signal be use screening can to isolate the radiation signal interface of this device under test (DUT) and tester.But this type of shell cannot produce commeasurable accuracy of measurement and repeatability usually.This can occur in especially and be less than the minimum shell without echo room.In addition, this type of shell tends to the position and orientation of this device under test (DUT) responsive, and also to constructive interference and the destructive interference sensitivity of the multi-path signal produced in this type of shell.
Therefore, wish the system and method had for testing wireless signal transceiver (being in particular radio MIMO signal transceiver), wherein can use electromagnetic radiation test signal, simulating realistic world system operation and avoid connecting and disconnecting the test duration of test needed for cable thus, maintains test repeatability and accuracy by avoiding the undesired signal caused by the signal that produces owing to outside and multi-path signal effect simultaneously.
Summary of the invention
According to the present application, it provides a kind of for promoting that radio frequency (RF) signal transceiver device under test (DUT) carries out the system and method for wireless test.Use is positioned at many antennas of the screening can comprising this device under test (DUT), multiple less radio-frequencies (RF) test signal that radio frequency (RF) test signal given off from this device under test (DUT) produces can through catching, and their corresponding signal phase place is controlled according to one or more signal characteristics, these one or more signal characteristics comprise they corresponding signal power level, they received time corresponding signal phase place and the signal power level of combination of received signal.This phase control through less radio-frequency (RF) test signal of seizure individually can be carried out for any device under test (DUT) being after tested positioned at this screening can, the multi-path signal ambient compensation had nothing to do in the placement of this device under test (DUT) is provided in this screening can thus, and in the wireless test of this device under test (DUT), emulates wired test signal path thus.
According to an embodiment of the present application, a kind of system promoting that radio frequency (RF) signal transceiver device under test (DUT) carries out wireless test comprises:
Structure, this structure qualification interior zone and perimeter and being configured to allows to place device under test (DUT) in this interior zone and isolates with the electromagnetic radiation being derived from this perimeter in fact;
Many antennas, these many antennas are arranged in this interior zone at least in part to receive at least one multiple less radio-frequency (RF) test signal relevant to common radio-frequency (RF) test signal that this device under test (DUT) gives off; And
Radio frequency (RF) signal control circuit, it is couple to these many antennas and to this, at least one multiple less radio-frequency (RF) test signal responds by following manner:
According to one or more phase control signal, control the respective phase at least partially of this at least one multiple less radio-frequency (RF) test signal, to provide at least one multiple phase controlled radio frequency (RF) test signal, and
To measure and in conjunction with this at least one multiple phase controlled radio frequency (RF) test signal, with radio frequency (RF) output signal providing this one or more phase control signal and the combination of at least one multiple phase controlled radio frequency (RF) test signal is relevant to this.
According to another embodiment of the present application, a kind of method promoting that radio frequency (RF) signal transceiver device under test (DUT) carries out wireless test comprises:
There is provided structure, this structure qualification interior zone and perimeter and being configured to allows to place device under test (DUT) in this interior zone and isolates with the electromagnetic radiation being derived from this perimeter in fact;
There is provided many antennas, these many antennas are arranged in this interior zone at least in part to receive at least one multiple less radio-frequency (RF) test signal relevant to common radio-frequency (RF) test signal that this device under test (DUT) gives off; And
By following manner, to this, at least one multiple less radio-frequency (RF) test signal responds:
According to one or more phase control signal, control the respective phase at least partially of this at least one multiple less radio-frequency (RF) test signal, to provide at least one multiple phase controlled radio frequency (RF) test signal, and
To measure and in conjunction with this at least one multiple phase controlled radio frequency (RF) test signal, with radio frequency (RF) output signal providing this one or more phase control signal and the combination of at least one multiple phase controlled radio frequency (RF) test signal is relevant to this.
Accompanying drawing explanation
Fig. 1 describes the typical operation of wireless signal transceiver and possible test environment.
Fig. 2 describes the wireless signal transceiver test environment using conductive test signal path.
Fig. 3 describes to use the MIMO wireless signal transceiver test environment of conductive signal path and the channel model of this type of test environment.
Fig. 4 describes to use the MIMO wireless signal transceiver test environment of electromagnetic radiation signal and the channel model of this type of test environment.
Fig. 5 describes the test environment according to exemplary embodiment, can use electromagnetic radiation test signal test MIMODUT in this test environment.
Fig. 6 describes test environment, uses electromagnetic radiation test signal test DUT in this in screening can.
Fig. 7 and Fig. 8 describes the exemplary embodiment of test environment, uses the wireless DUT of electromagnetic radiation test signal test in this in the screening can reducing multi-path signal effect.
Fig. 9 is depicted in the physical representation of the screening can according to exemplary embodiment used in the test environment of Fig. 7 and Fig. 8.
Figure 10 describes the test environment according to exemplary embodiment, wherein can use electromagnetic radiation test signal test device under test (DUT).
Figure 11 describes another test environment according to exemplary embodiment, wherein can use electromagnetic radiation test signal test device under test (DUT).
Figure 12 describes this test environment using Figure 11, for testing the exemplary algorithm of device under test (DUT).
Figure 13 describes another test environment according to exemplary embodiment, wherein can use electromagnetic radiation test signal test device under test (DUT).
Figure 14 describes this test environment using Figure 13, for testing the exemplary algorithm of device under test (DUT).
Figure 15 describes another test environment according to exemplary embodiment, wherein can use electromagnetic radiation test signal test device under test (DUT).
Figure 16 describes this test environment using Figure 15, for testing the exemplary algorithm of device under test (DUT).
Figure 17 describe according to exemplary embodiment by device under test (DUT) transmit before compensating in the test signal through defining in frequency range.
Figure 18 describe according to exemplary embodiment before compensating with compensate in rear Figure 17 this scan test signal, and the example phase shift value of this test environment in Figure 10,11,13 and 15.
Figure 19 describes the exemplary algorithm of the compensation carried out described in Figure 18.
Figure 20 describes according to exemplary embodiment for testing another test environment of the wireless device under test (DUT) using multiple test signal phase-shifted to compensate.
Figure 21 describes this test environment according to the additional testing signal gain adjustment had in additional exemplary embodiment Figure 20 for compensating.
Embodiment
Following is the detailed description of exemplary embodiment of the present invention under reference accompanying drawing.These explanations mean illustrative but not limit the scope of the invention.This type of embodiment is illustrated with enough details and makes those of ordinary skill in the art be implemented the present invention, but should be understood that and when not departing from the spirit and scope of the invention, some change can implement other embodiments.
In the disclosure everywhere, as without in contrast to clearly instruction herein, described related circuit assembly can be understood and can be single or plural number on number.Such as, " circuit " and " Circuits System " one word can comprise single component or multiple assembly, it can be active and/or passive, and connect or be coupled in the function that (such as, as one or more integrated circuit (IC) chip) together provide a description.In addition, " signal " can refer to one or more electric current, one or more voltage or data-signal.In Figure of description, similar or relevant assembly has similar or relevant letter, numeral or civilian digit-marker.In addition, although discussed when using discrete electronic circuitry system (preferably in the form of one or more integrated circuit chips) and implemented the present invention, only depend on the signal frequency for process or data transfer rate, the function of any portion of this type of Circuits System implemented by the processor that can additionally use one or more warp suitably to programme.In addition, in the situation of the function block diagram of the various embodiment of graphical illustration, this mac function not necessarily indicates the block between ware circuit.
With reference to figure 1, the exemplary operating environment of wireless signal transceiver and hypothesis testing environment (at least with regard to real world operation) have tester 100 and the device under test (DUT) 200 of radio communication.Usually, also the test controller 10 (such as, personal computer) of certain form will be used, to come and tester 100 and device under test (DUT) 200 conversation test order and data via wire signal interface 11a, 11b.Tester 100 and device under test (DUT) 200 respectively have one (for MIMO device, have multiple) respective antenna 102,202, by electrically conductive signal connector 104,204 (such as, coaxial cable connects, and its many type is in well known in the art) connecting test device 100 and device under test (DUT) 200.Test signal (source and response) is wirelessly transmitted via antenna 102,202 between tester 100 and device under test (DUT) 200.Such as, in transmission (TX) test period of device under test (DUT) 200, DUT antenna 202 can electromagnetic radiation signal 203.Depend on the directivity of antenna transmission field pattern, this signal 203 can, towards many direction radiation, cause tester antenna 102 to receive incident signal component 203i and reflected signal component 203r.As described above, these reflected signal component 203r, be generally multi-path signal effect and be derived from the product of electromagnetic signal (not shown) in other places, cause constructive interference and destructive signal disturbing, thus hinder reliably and repeatably Signal reception and test result.
With reference to figure 2, for avoiding this type of unreliable test result, use conductive signal path (such as RF coaxial cable 106) to carry out the antenna connector 104,204 of connecting test device 100 and device under test (DUT) 200, to provide consistent between tester 100 with device under test (DUT) 200, reliably and repeatably conductive signal path carry out transmitted test signal.As described above, but, before test with to be connected afterwards and the time disconnected needed for cable 106 can extend the overall test duration.
With reference to figure 3, in time testing MIMO device under test (DUT) 200a, even become longer for connecting and disconnecting the additional test time testing cable.In this type of situation, need multiple test cable 106 to connect corresponding tester 104 and device under test (DUT) 204 connector, make it possible to transmit from tester 100a RF signal source 110 (such as, VSG) RF test signal, to be received by the RF signal receiver 210 in device under test (DUT) 200a.Such as, in typical test environment, tester for testing MIMO device will have one or more VSG110a, 110b ..., 110n, for provide corresponding one or more RF test signal 111a, 111b ..., 111n (such as, there is the bag data-signal of variable signal power, bag content and data rate).Via corresponding tester connector 104a, 104b ..., 104n and DUT connector 204a, 204b ..., 204n connect this type of corresponding test cable 106a, 106b ..., 106n transmits these signals so that by receive RF test signal 211a, 211b ..., 211n be supplied to corresponding RF signal receiver 210a in device under test (DUT) 200a, 210b ..., 210n.Therefore, connecting and disconnect the additional test time of these tests needed for cable 106 can increase n doubly, and this n doubly corresponds to the number of test cable 106.
As described above, use connecting test device 100a and the test cable of device under test (DUT) 200a really to have to provide consistent, reliably with can the advantage that is connected of repeated test.As being familiar with known by this those skilled in the art, these test connections 107 can emulate as signal channel H, it is characterized in that diagonal matrix 20, wherein this diagonal matrix element 22 correspond to for this corresponding signal channel characteristics (such as, the signal path conduction of this corresponding test cable 106 or loss) direct-coupling coefficient h
11, h
22..., h
nn(h
ij, wherein i=j).
With reference to figure 4, according to one or more exemplary embodiment, replace conduct electricity (or wired) channel 107 (Fig. 3) by corresponding to the wireless channel 107a of wireless signal interface 106a between tester 100a and device under test (DUT) 200a.As described above, tester 100a and device under test (DUT) 200a passes on test signal 111,211 via respective antenna 102,202 array.In this type test environment, do not use diagonal matrix 20 to represent this signal channel 107a, and use have one or more non-zero crossing-coupling coefficient 24a, 24b (h
ij, wherein i ≠ j) and remove the matrix 20a at this diagonal angle 22 to represent this signal channel 107a.Those skilled in the art will be easy to clear, and this is owing to there being multiple available wireless signal path in channel 107a.Such as, be different from cable signals environment, in this ideally each DUT connector 204 only receive the signal from its corresponding tester connector 104.In this wireless channel 107a, the one DUT antenna 202a receive by all tester antenna 102a, 102b ..., 102n radiation test signal, such as, corresponding to channel matrix H coefficient h
11, h
12..., and h
1n.
According to the principle known, the coefficient h of channel matrix H corresponds to the characteristic of channel 107a, the transmission of this properties influence RF test signal and reception.These coefficient h jointly limit channel condition number k (H), and it is the product of the norm of the inverse matrix of H norm of matrix and H, represented by following equation:
k(H)＝||H||*||H
-1||
The factor affecting these coefficients can change channel condition number, thus also can affect the error of measurement.Such as, in the channel that condition is not good, little error can cause big error in test result.When channel number is low, the little error in this channel can produce little measuring error at reception (RX) antenna.But when channel number is high, the little error in this channel can produce large measuring error at receiving antenna.This channel condition number k (H) is also to the position and orientation of physics DUT in its test environment (such as, screening can) and the orientation sensitivity of various antenna 204 thereof.Therefore, even without being derived from, other are local or via reflecting the external undesired signal re-shooting receiving antenna 204, the possibility that can repeat accurate test results is still very low.
With reference to figure 5, according to one or more exemplary embodiment, the test signal interface between tester 100a and device under test (DUT) 200a can be wireless.Device under test (DUT) 200a is arranged in the inside 301 of screening can 300.This type of screening can 300 can implementation be metal shell, and such as, its structure or at least effect aspect are similar to faraday cup.This makes device under test (DUT) 200a isolate with the radiation signal of the perimeter 302 stemming from shell 300.According to exemplary embodiment, the geometric configuration of shell 300 makes it act as closed waveguide.
Elsewhere, such as, arrange in the interior surface 302 of shell 300 or on its opposite multiple (n) aerial array 102a, 102b ..., 102n, each radiation in this aerial array stem from testing source 110a in tester 100a, 110b ..., 110n multiple phase controlled RF test signal 103a, 103b ..., 103n (below more in detail discuss).Each aerial array comprises multiple (M) antenna element.Such as, first day linear array 102a comprise m root antenna element 102aa, 102ab ..., 102am.The corresponding controlled RF test signal 131aa provided by corresponding RF signal control circuit 130a, 131ab ..., 131am drive these antenna element 102aa, 102ab ..., each in 102am.
Described in the example of a RF signal control circuit 130a, increase (such as by signal magnitude (signalmagnitude) control circuit 132, amplify) or reduce (such as, decaying) size from the RF test signal 111a of a RF testing source 110a.The test signal 133 controlled through size is copied by signal replication circuit 134 (such as, signal dividers).By respective phase control circuit 136a, 136b ..., 136m phase control (such as, displacement) through size control with copy RF test signal 135a, 135b ..., 135m corresponding signal, with produce size and phase controlled signal 131aa, 131ab ..., 131am come driven antenna array 102a antenna element 102aa, 102ab ..., 102am.
By corresponding RF signal control circuit 130b ..., 130m drive in a similar manner all the other aerial arrays 102b ..., 102n and respective antenna elements thereof.This produce corresponding number recombination radiation signal 103a, 103b ..., 103n, according to channel matrix H, by the antenna 202a of device under test (DUT) 200a, 202b ..., 202n is transmitted and receives, as described above.Its corresponding reception test signal 211a of device under test (DUT) 200a process, 211b ..., 211m and provide instruction these characteristics through Received signal strength (such as, size, relative phase etc.) one or more feedback signals 201.These feedback signal 201a are provided to the control circuit 138 in RF signal control circuit 130.This control circuit 138 be provided for the control signal 137 of size control circuit 132 and phase-control circuit 136,139a, 139b ..., 139m.Therefore, provide closed circuit controllability path, thus gain and phase control are from the radiation signal of tester 100a, make device under test (DUT) 200a can receive this signal.(parts of this control circuit 130 as tester 100a alternatively, can be comprised).
According to the channel optimisation technique known, control circuit 138 uses the feedback data 201a from device under test (DUT) 200a, to be similar to size and the phase place that the mode minimizing channel condition number k (H) changes radiation signal, reach optimum channel condition and produce as each DUT antenna 202 place record have about equal sizes through Received signal strength.This will set up communication channel, and through this communication channel, the test result that radiation signal produces is equal in fact and uses conductive signal path (such as, the RF signal cable) test result that produces.
After transmission in succession and channel condition feedback event, by this operation of the control circuit 138 of RF signal control circuit 130 will change each aerial array 102a, 102b ..., the signal magnitude of 102n and phase place, repeatedly to reach the channel condition number k (H) of optimization.Once reach this type of channel condition number k (H) optimized, corresponding size and phase settings can be retained, and the cycle tests after tester 100a and device under test (DUT) 200a can proceed, as carried out at cable test environment.
In practice, be arranged on the test fixture in screening can 300 with reference to DUT, for using in through the channel condition of program optimization repeatedly mentioned above.Afterwards, in succession can test the further DUT of same design, and not need to perform channel optimization in all routine items, this is because the path loss run in the channel environment of the control of shell 300 should properly in proper testing tolerance limit.
Still with reference to figure 5, such as, modelling original transmission, to produce channel condition number 13.8db, and h
11and h
22the size of coefficient is respectively-28db and-28.5db.The large minor matrix of channel H will be expressed as:
After repeatedly reseting size and phase place, as described above, channel condition number k (H) is decreased to 2.27db, and h
11and h
22the size of coefficient is respectively-0.12db and-0.18db, and produces the large minor matrix of following channel:
These results can be equal in the result using cable test environment, thus indicate this wireless test environment can provide the accuracy that can be equal to mutually.Reject the time connecting and disconnect cable signals path, and list the shortening time of size and phase place adjustment in factor, the overall Received signal strength test duration shortens significantly.
With reference to figure 6, the impact of multi-path signal effect on channel condition more preferably can be understood.As described above, once be arranged in the inside 301 of shell 300 by device under test (DUT) 200a, device under test (DUT) 200a can from each antenna 202a electromagnetic radiation signal 203a during test transmission.This signal 203a comprises extroversion and component 203b, the 203c of antenna 102a radiation away from tester 100a.But, the interior surface 304,306 of shell 300 is left in these component of signal 203b, 203c reflection, and incident as reflected signal component 203br, 203cr, and come to carry out constructive or destructive combination with main incident signal component 203ai according to multi-path signal condition.As described above, depend on the constructive of interference and destructiveness essence, unreliable and inaccurate by usually tending to for being used in suitably calibration and performance detecting test result.
With reference to figure 7, according to an exemplary embodiment, RF absorber material 320a, 320b are arranged on reflecting surface 304,306 place.As a result, reflected signal component 203br, 203cr significantly decay, thus produce less constructive or destructive interference to main incident signal component 203ai.
Additional RF signals control circuit 150 can be comprised to use between aerial array 102a and tester 100a, in the inside 301 that this aerial array 102a is arranged on shell 300a or on interior surface 302.(parts of this additional control circuit 150 as tester 100a alternatively, can be comprised).Be incident to antenna element 102aa, 102ab ..., 102am radiation signal produce through receive signal 103aa, 103ab ..., 103am, wherein control (such as by phase-control circuit 152, displacement) corresponding signal phase place, one or more phase control signal 157a that this phase-control circuit 152 provides according to control system 156,157b ..., 157m control phase Control Component 152a, 152b ..., 152m.In signal combiner 154, gained phase controlled signal 153 is combined, the signal 155a of reception is supplied to tester 100a and feedback signal 155b is supplied to control system 156.Control system 156, it is a part for closed circuit net control, process this feedback signal 155b, so as optionally to adjust composite received signal 103aa, 103ab ..., 103am respective phase minimize the apparent signal path loss being relevant to shell 300a interior zone 301.Change in the position and orientation situation of device under test (DUT) 200a in shell 300a, this closed circuit net control also allows the system phase type array enabled by these antenna 102a and phase-control circuit 152 of configuration again.As a result, after using this backfeed loop to minimize path loss, can reach and in shell 300a, to use radiation signal environment accurately and repeatedly can transmit DUT signal 203a to tester 100a.
With reference to figure 8, can reach for the test of DUT Received signal strength and to produce accurately and can the similar control of repeated test result and improvement.In this case, the test signal 111a provided by tester 100a is provided by signal combiner/separation vessel 154, and if need, by antenna element 102aa, 102ab ..., before 102am radiation, the respective phase of the test signal 153 copied by phase-control circuit 152 adjustment.As in afore-mentioned, reflected signal component 103br, 103cr significantly decay, thus manufacture less constructive or destructive interference to main incident signal component 103ai.The information needed for phase place of the test signal 153 controlling to copy is provided for control system 156 from one or more feedback signal 203a of device under test (DUT) 200a, to minimize the apparent signal path loss being relevant to shell 300a inside 301, thus set up consistent and can the condition of repeating signal path loss.
With reference to figure 9, according to one or more exemplary embodiment, can implementation screening can 300b in fact as shown.As described above, DUT can be positioned on the inside 301 of shell 300b an end face 301d, it is the opposite of interior zone 301b, this interior zone 301b comprise or in the face of tester aerial array 102a, 102b ..., 102n place interior surface 302 (Fig. 5).That therebetween is interior zone 301a, its formed by RF absorber material 320 around waveguide cavity.
As mentioned above with following details, the exemplary embodiment of system according to the invention and method can realize testing without cable of wireless device under test (DUT) and carries out multipath effects compensate simultaneously and optimize signal path loss control.Many antennas, and aerial array, control system is coordinated to can be used for adjusting this phase place of this test signal being supplied to this antenna element, it is stable with repeatably signal path loss environment which imitates general this with conductive signal pathways environmental correclation, the radiation signal environment simultaneously in use screening can.This required time being used for adjusting this phase shifter belongs to the part of this overall all test duration simultaneously, this regulation time is significantly less than tests cable required time for connecting with dismounting, and can provide the additional benefit of the real world test comprising this antenna element.
Further, as mentioned above with following further details, exemplary embodiment of the present provides to use has testing without cable of the wireless device under test (DUT) of the signal (160 megahertzes (MHz) bandwidth signals such as described in motor electronic engineering science (IEEE) standard 802.11ac) of wide frequency bandwidth, can reach simultaneously and use conductive signal pathways (such as testing cable) to test test accuracy and the measurement reproducibility of equivalent.Be supplied to the phase place of this test signal of this antenna element by adjustment, this broadband signal received in this shielding test shell can produce the signal response of substantial planar.Once drive the corresponding test signal phase place of this respective antenna elements to be adjusted to produce this flat signal response environment, this test of this broadband signal is used can directly to carry out without the need to through adjustment further, as carried out in the test environment being same as cable.Although the position of this device under test (DUT) in this screening can affect the flatness of this channel response, this position sensing is within this measurement permissible error described in signal standards (such as, IEEE802.11ac).
Even further, according to exemplary embodiment, the multiple device under tests (DUT) in this same screening can carry out this simultaneously to be tested without cable.By suitably controlling the phase place and the size that drive the test signal of these many antenna elements with adjustment, the radiation test signal environment in screening can be used to imitate the low cross-talk signal environment of conductive signal pathways.Once after driving the phase place of this test signal of this antenna element and gain (or decay) to be adjusted according to this exemplary embodiment, the signal that the antenna of the plurality of device under test (DUT) receives by with the signal equivalent using cable signals path to receive.Such as, this by maximize this channel matrix direct-coupling coefficient minimize simultaneously this channel matrix intersection-coupling coefficient (such as, produce this directly-with intersect-coupling coefficient between the difference of at least 10 decibels) reach.
With reference to Figure 10, according to exemplary embodiment, device under test (DUT) 200a is positioned at this screening can 300 to be tested for transmission signal.The test signal 203a transmitted via the antenna 202a of this device under test (DUT) by many antenna element 102a, 102b ..., 102n receives.The Received signal strength 105a produced, 105b ..., 105n corresponding signal phase place by respective phase control circuit 236a, 236b ..., 236n controls and adjustment.
According to some exemplary embodiments, the phase controlled test signal 237a produced, 237b ..., 237n is delivered to control system 242 (being described in further detail in following) and signal combining circuit 234.This control system 242 provide phase control signal 243a, 243b ..., 243n to phase-control circuit 236a, 236b ..., 236n.The phase controlled test signal 237a of this combination (such as, add up), 237b ..., 237n produces the composite test signal 235 being used for downstream analysis (such as by VSA (not shown)).
According to other embodiments, phase controlled test signal 237a, 237b ..., 237n combines to produce composite test signal 235 in signal combiner 234.This composite test signal 235 is delivered to alternative control system 244 (being described in further detail in following), its provide subsequently phase control signal 245a, 245b ..., 245n to phase-control circuit 236a, 236b ..., 236n.
With reference to Figure 11, according to an exemplary embodiment, on-line control system 242 comprise for measure phase controlled test signal 237a, 237b ..., 237n corresponding power level power-measuring circuit 242aa, 242ab ..., 242an.The power measurement signal 243aa of the corresponding test signal power level of the instruction produced, 243ab ..., 243an is supplied to control circuit 242b (such as digital signal processor (DSP) form), its provide subsequently suitable phase control signal 243ba, 243bb ..., 243bn to phase-control circuit 236a, 236b ..., 236n.
With reference to Figure 12, according to an exemplary embodiment, in Figure 11, the mode of operation 410 of this test environment can be carried out as display.The first, in step 411 this phase shifter of initialization 236a, 236b ..., 236n, such as setting all phase shift values is a same reference phase value or individual reference phase value.Then, measure in step 412 phase controlled signal 237a, 237b ..., 237n power level.Then, in step 413, add up this measurement performance number, in step 414, compare this accumulative measured signal power and previously added up measured signal power.In step 415, if this current accumulative measurement power had previously added up to measure power higher than this, then stored this current phase shift values and measured power with accumulative, then, these storage values and this expectation criterion (such as, one maximize accumulative measure power) is compared in step 416.In step 417, if meet this criterion, then stop this test signal phase place of adjustment.If not, then this test signal phase place of adjustment is continued.
Similarly, in step 414, if this current accumulative measurement power had not previously added up to measure power higher than this, then this test signal of adjustment had been continued.Therefore, in step 418, phase shifter 236a, 236b ..., 236n according to such as genetic algorithm (GA) or particle cluster algorithm (PSA) adjustment, with give receive test signal 105a, 105b ..., the combination of another phase shift values of 105n or arrangement.After this step, repeat the measurement 412 of power, totalling 413 and compare 414, until meet this expectation criterion.
With reference to Figure 13, according to another exemplary embodiment, this alternative downstream control system 244 (Figure 10) comprises power-measuring circuit 244a (such as, VSA) and control circuit 244b (such as, digital signal processor (DSP)).The power level of composite signal 235 is measured by power-measuring circuit 244a, to provide power measurements 245a to control circuit 244b.Subsequently, control circuit 244b provide suitable phase control signal 245ba, 245bb ..., 245bn to phase shifter 236a, 236b ..., 236n.
With reference to Figure 14, the mode of operation 420 as this test environment in Figure 13 can be carried out as display.The first, in step 421, by preset one or more respective phase shift value with initialization phase shifter 236a, 236b ..., 236n.Then, in step 422, measure the power level of composite signal 235, then in step 423, compare this current measured power and first pre-test power level.In step 424, if deserve pre-test power level higher than this first pre-test power level, then store this current phase shift values and measure power, and for determining whether met this expectation criterion (such as, one maximizing measurement power level) in step 425.In step 426, if meet this expectation criterion, then stop adjustment phase place.If do not meet this expectation criterion, then continue adjustment phase place.
Similarly, if this current measured power is not higher than this first pre-test power, then continue adjustment phase place.Therefore, phase shifter 236a, 236b ..., 236n according to optimized algorithm (such as, GA or PSA) adjustment, with give receive test signal 105a, 105b ..., 105n another group phase shift values.
With reference to Figure 15, according to another exemplary embodiment, this online (in-line) system 242 (Figure 10) comprise phase detecting circuit 242ca, 242cb ..., 242cn and control circuit 242d (such as, a DSP).Phase detectors 242ca, 242cb ..., 242cn can detected phase controlled signal 237a, 237b ..., 237n corresponding signal phase place, and provide corresponding phase data 243ca, 243cb ..., 243cn is to control circuit 242d.According to these data, control circuit 242d provide suitable phase control signal 243da, 243db ..., 243dn to phase shifter 236a, 236b ..., 236n.
With reference to Figure 16, the mode of operation 430 as this test environment in Figure 15 can be carried out as display.The first, in step 431, by giving one or more respective phase shift value initialization phase shifter 236a, 236b ..., 236n.Then, in step 432, measure phase controlled signal 237a, 237b ... the respective phase (such as, relative to identical or reference signal phase place) of 237n.
Then, according to the test signal phase place of this measurement, according to optimization phase shift values in step 433, configuration phase shifter 236a, 236b ..., 236n phase place adjustment.After this step, in step 434, measure the power level of composite signal 235, to confirm to reach this expectation composite signal power level, in step 435, then stop phase place adjusting.
With reference to Figure 17, from the exemplary reception signal 203 that the broad-band antenna 202a radiation of device under test (DUT) 200a of firm power sends, in screening can 300 (such as, Fig. 6) have the good response arriving 6000MHz frequency range between 700, its essence is as shown in the drawing.Can know and understand to be rich in multi-path signal environment based in screening can 300, its power profile is also uneven.For the bag data-signal carrying out communicating according to ieee standard 802.11ac, special emphasis is the broadband rate frequency band of the 160MHz between 5000 to 5160MHz.As shown in the figure, in this frequency band 511 (as shown in the enlarged 510 of signal 203 distribution plan), this Received signal strength demonstrates the power variation of about 25 decibels (dB).According to exemplary embodiment, use test environment as above, and use the test signal phase place of multiple phase shifter control for driving these many antenna elements, this distribution plan can via compensation to make this emphasis frequency band 511 present substantial planar.
With reference to Figure 18, according to an exemplary embodiment, this target is reached with corresponding phase shifter 236 by using multiple (such as, 16) antenna element 102.Such as, by using optimized algorithm (being described in further detail in following), and only using the quadrature phase of 0,90,180 and 270 degree to adjust, so then may reach and optimizing flat response condition 523.As shown, before compensation, response distribution plan 522 has the variation higher than 5 decibels between the 160MHz frequency span 511 of this exemplary test signal.Further, even if this aerial array has reached the optimization of power level at frequency mid point 5080MHz, as shown in this upper part Butut 521, the variation of Received signal strength is still about 5 decibels.But when multiple phase regulator 236a, 236b ..., 236p through suitable when adjusted, even if restriction only uses quadrature phase adjustment, or may can reach variation not higher than the response distribution plan 523 of 0.5 decibel.
With reference to Figure 19, reached in this compensation shown in Figure 18 by using shown flow process 440.The first, in step 441, define the multiple frequency values in this wanted signal frequency span, then in step 442, definition is used for one group of initial phase shift value of phase shifter.In step 443, use this this phase shifter of definition phase value, and in step 444, measure the power of each frequency.Then, in step 445, the difference of the measurement power of the multipair definition frequency of computing, and in step 446, add up for assessment of function F, it equals to define peak power difference and computational calculation power and adds up difference between difference.
If this current operating function F
currentbe greater than previous operation function F
in the past, then in step 448, retain this phase shifter values, and in step 449, determine the condition that whether meets the expectation (such as, reaching maximization operation function F).If met, then phase place is stopped to adjust in step 450.If do not meet this expectation criterion, then continue adjustment phase place.Similarly, if this current operating function F
currentbe not more than previous operation function F
in the past, then adjustment phase place is continued.In step 451, continue these phase places of adjustment by another class value defining phase shifter values, the step 443 of the whole phase place of polyphony of laying equal stress on, measure power step 444, computational calculation power difference step 445 and this operating function of assessment F step 446.Repeat this flow process until meet this condition in step 449.
With reference to Figure 20, according to exemplary embodiment, when carrying out the testing without cable of multiple wireless device under test (DUT), in screening can 300 when use intersection-coupled signal, similar compensation can be reached.(in order to the object of this example, two aerial arrays 235a, 235b are used to carry out the test of two device under tests (DUT) 200a, 200b.But, device under test and the aerial array that also can use other quantity at this can be had a clear understanding of.Further, described herein point of other " device under test (DUT) " 200a, 200b should be had a clear understanding of and can be corresponding receptacle in single MIMO device under test (DUT) 200.) as mentioned above, signal source (such as, VSG) 110 can provide test signal 111, and carry out the duplicate that copies to provide test signal 235 with signal distributor 234, it is for carrying out phase-shifted to drive this antenna element 102 of this aerial array 235 by multiple phase shifter 231.These antenna array 235a, 235b provide radiation signal component 103aa, 103ab, 103ba, 103bb, its correspond to this channel matrix H (such as, described above) direct-coupling and intersect-coupling coefficient.These component of signal 103aa, 103ab, 103ba, 103bb are received by antenna 202a, 202b of device under test (DUT) 200a, 200b.Received signal strength data 201a, 201b are supplied to control system 206 (such as by device under test (DUT) 200a, 200b, one DSP), its provide subsequently suitable phase control signal 207ap, 207bp to phase shifter 236aa ..., 236am, 236ba,, 236bm, for control by aerial array 235a, 235b antenna element 102aa ..., 102am, 102ba ... the phase place of the signal that 102bm radiation sends.
By repeatedly adjusting the phase place of this radiation signal, as mentioned above, this directly-coupling channel matrix H coefficient 103aa, 103ba of maximizing also minimizes this intersection-coupling coefficient 103ab, 103bb (such as, by making this final intersection-coupling coefficient become ideally lower than this directly-coupling coefficient at least 10 decibels).
With reference to Figure 21, according to another exemplary embodiment, control system 206 can be configured to provide gain control signal 207ag, 207bg further, to control the size of this test signal 111a through copying, 111b, for being sent to this device under test (DUT) 200a, 200b.Control signal gain stage (such as, make a variation gain expansion device or signal attenuator) 232a, 232b can control these signal magnitude.It can be beneficial to optimize further this channel matrix H direct-coupling coefficient 103aa, 103ba with intersect-this relative size of coupling coefficient 103ab, 103bb.Such as, can standardization directly-this size of coupling coefficient 103aa, 103ba, still can retain enough intersections-coupling coefficient 103ab, 103bb decays (such as, 10 decibels or higher) simultaneously.
Various other of structure of the present invention and method of operating are revised or are changed, and when not departing from the spirit and scope of the invention, are apparent for those of ordinary skill in the art.Although the present invention is described by certain preferred embodiment, should understand the present invention as apply for should not be limited to the preferred embodiment undeservedly.We are intended to limit the structure and method in scope of the present invention and this claims with following claims thus contain the equivalent of this type of structure and method.
Claims (18)
1. an equipment, comprise for promoting that radio frequency (RF) signal transceiver device under test (DUT) carries out the system of wireless test, described equipment comprises:
Structure, it limits interior zone and perimeter and is configured to allow to place DUT in described interior zone isolates with the electromagnetic radiation being derived from described perimeter in fact;
Many antennas, it is arranged in described interior zone at least in part to receive at least one multiple wireless RF test signal relevant to the common radio-frequency that described DUT gives off (RF) test signal; With
RF signal control circuit, it is couple to described many antennas and is responded at least one multiple wireless RF test signal described by following manner:
According to one or more phase control signal, control the respective phase at least partially of at least one multiple wireless RF test signal described, to provide at least one multiple phase controlled RF test signal, and
Measure and combine at least one multiple phase controlled RF test signal described, outputing signal to provide described one or more phase control signal and the RF relevant to the combination of at least one multiple phase controlled RF test signal described.
2. equipment according to claim 1, wherein said RF signal control circuit comprises:
Phase-control circuit, it is couple to described many antennas, and by providing at least one multiple phase controlled RF test signal described to respond at least one multiple wireless RF test signal described and described one or more phase control signal;
Control signal circuit, it is couple to described phase-control circuit, and by providing described one or more phase control signal to respond at least one multiple phase controlled RF test signal described; With
Combined circuit, it is couple at least one in described phase-control circuit and described control signal circuit, and responds at least one multiple phase controlled RF test signal described by providing described RF to output signal.
3. equipment according to claim 2, wherein said control signal circuit comprises power-sensing circuit.
4. equipment according to claim 2, wherein said control signal circuit comprises:
Power-measuring circuit, it responds at least one multiple phase controlled RF test signal described by providing multiple power signal, the corresponding power level of each in described multiple power signal instructions at least one multiple phase controlled RF test signal described; With
Treatment circuit, it is couple to described power-measuring circuit, and by providing described one or more phase control signal to respond to described multiple power signal.
5. equipment according to claim 2, wherein said control signal circuit comprises phase detecting circuit.
6. equipment according to claim 2, wherein said control signal circuit comprises:
Phase measuring circuit, it responds at least one multiple phase controlled RF test signal described by providing multiple phase signal, the corresponding signal phase place of each in described multiple phase signal instructions at least one multiple phase controlled RF test signal described; With
Treatment circuit, it is couple to described phase measuring circuit, and by providing described one or more phase control signal to respond to described multiple phase signal.
7. equipment according to claim 1, wherein said RF signal control circuit comprises:
Phase-control circuit, it is couple to described many antennas, and by providing at least one multiple phase controlled RF test signal described to respond at least one multiple wireless RF test signal described and described one or more phase control signal;
Combined circuit, it is couple to described phase-control circuit, and responds at least one multiple phase controlled RF test signal described by providing described RF to output signal; With
Control signal circuit, it is couple to described combined circuit and described phase-control circuit, and by providing described one or more phase control signal to respond to described RF output signal.
8. equipment according to claim 7, wherein said control signal circuit comprises power-sensing circuit.
9. equipment according to claim 7, wherein said control signal circuit comprises:
Power-measuring circuit, it responds to described RF output signal by providing power signal, the power level that described power signal indicates described RF to output signal; With
Treatment circuit, it is couple to described power-measuring circuit and by providing described one or more phase control signal to respond to described power signal.
10. promote that radio frequency (RF) signal transceiver device under test (DUT) carries out a method for wireless test, comprising:
There is provided structure, described structure qualification interior zone and perimeter and being configured to allows to place DUT in described interior zone and isolates with the electromagnetic radiation being derived from described perimeter in fact;
There is provided many antennas, described many antennas are arranged in described interior zone at least in part to receive at least one multiple wireless RF test signal relevant to the public RF test signal that described DUT gives off; And
By following manner, at least one multiple wireless RF test signal described is responded:
According to one or more phase control signal, control the respective phase at least partially of at least one multiple wireless RF test signal described, to provide at least one multiple phase controlled RF test signal, and
Measure and combine at least one multiple phase controlled RF test signal described, outputing signal to provide described one or more phase control signal and the RF relevant to the combination of at least one multiple phase controlled RF test signal described.
11. equipment according to claim 10, wherein:
Described control comprises by providing at least one multiple phase controlled RF test signal described to respond at least one multiple wireless RF test signal described and described one or more phase control signal; And
Described measurement and combine comprise
Measure at least one multiple phase controlled RF test signal described to provide described one or more phase control signal, and
Output signal to provide described RF in conjunction with at least one multiple phase controlled RF test signal described.
12. equipment according to claim 11, at least one multiple phase controlled RF test signal described in wherein said measurement comprises at least one power detecting at least one multiple phase controlled RF test signal described.
13. equipment according to claim 11, described in wherein said measurement, at least one multiple phase controlled RF test signal comprises:
Detect at least one power of at least one multiple phase controlled RF test signal described to provide multiple power signal, the corresponding power level of each in described multiple power signal instructions at least one multiple phase controlled RF test signal described; And
Process described multiple power signal to provide described one or more phase control signal.
14. equipment according to claim 11, at least one multiple phase controlled RF test signal described in wherein said measurement comprises at least one phase place detecting at least one multiple phase controlled RF test signal described.
15. equipment according to claim 11, described in wherein said measurement, at least one multiple phase controlled RF test signal comprises:
Detect at least one phase place of at least one multiple phase controlled RF test signal described to provide multiple phase signal, the corresponding signal phase place of each in described multiple phase signal instructions at least one multiple phase controlled RF test signal described; And
Process described multiple phase signal to provide described one or more phase control signal.
16. equipment according to claim 10, wherein:
Described control comprises by providing at least one multiple phase controlled RF test signal described to respond at least one multiple wireless RF test signal described and described one or more phase control signal; And
Described measurement and combine comprise
Output signal to provide described RF in conjunction with at least one multiple phase controlled RF test signal described, and
Measure described RF to output signal to provide described one or more phase control signal.
17. equipment according to claim 16, the described RF of wherein said measurement outputs signal to provide described one or more phase control signal to comprise the power detecting described RF output signal.
18. equipment according to claim 16, the described RF of wherein said measurement outputs signal to provide described one or more phase control signal to comprise:
Detect the power of described RF output signal to provide power signal, the power level that described power signal indicates described RF to output signal; And
Process described power signal to provide described one or more phase control signal.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/912,423 US9774406B2 (en) | 2013-03-15 | 2013-06-07 | System and method for testing radio frequency wireless signal transceivers using wireless test signals |
| US13/912,423 | 2013-06-07 | ||
| PCT/US2014/038372 WO2014197187A1 (en) | 2013-06-07 | 2014-05-16 | System and method for testing radio frequency wireless signal transceivers using wireless test signals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105264391A true CN105264391A (en) | 2016-01-20 |
| CN105264391B CN105264391B (en) | 2019-01-18 |
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|---|---|---|---|
| CN201480032203.7A Expired - Fee Related CN105264391B (en) | 2013-06-07 | 2014-05-16 | Use the system and method for wireless test signal test rf wireless signal transceiver |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP6446441B2 (en) |
| KR (1) | KR20160018573A (en) |
| CN (1) | CN105264391B (en) |
| TW (1) | TWI632782B (en) |
| WO (1) | WO2014197187A1 (en) |
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| US10374730B2 (en) | 2016-03-07 | 2019-08-06 | Satixfy Uk Limited | Calibration techniques for an antenna array |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP6446441B2 (en) | 2018-12-26 |
| TWI632782B (en) | 2018-08-11 |
| TW201448489A (en) | 2014-12-16 |
| JP2016527752A (en) | 2016-09-08 |
| KR20160018573A (en) | 2016-02-17 |
| WO2014197187A1 (en) | 2014-12-11 |
| CN105264391B (en) | 2019-01-18 |
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