CN105242197A - AOI (Automatic Optic Inspection) scanning defect inspection processing method - Google Patents
AOI (Automatic Optic Inspection) scanning defect inspection processing method Download PDFInfo
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- CN105242197A CN105242197A CN201510570937.7A CN201510570937A CN105242197A CN 105242197 A CN105242197 A CN 105242197A CN 201510570937 A CN201510570937 A CN 201510570937A CN 105242197 A CN105242197 A CN 105242197A
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- 230000007547 defect Effects 0.000 title claims abstract description 20
- 238000003672 processing method Methods 0.000 title claims abstract 6
- 238000007689 inspection Methods 0.000 title abstract description 10
- 238000001514 detection method Methods 0.000 claims description 12
- 238000006243 chemical reaction Methods 0.000 claims description 3
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- 238000005516 engineering process Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 2
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- 238000012360 testing method Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
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- 230000003287 optical effect Effects 0.000 description 1
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- 229910000679 solder Inorganic materials 0.000 description 1
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Abstract
The invention relates to an AOI (Automatic Optic Inspection) scanning defect inspection processing method. the method comprises the following steps: 1, AOI equipment is provided with a CCD camera, and an inspected circuit board is scanned via the CCD camera; 2, the CCD converts an actual scanned image into digital signals; 3, the digital signals are compared with data in the system to build a restored image; 4, a multi-grayscale threshold is adopted to convert the restored image into multiple black-white images with different grayscales; and 5, binarization processing is carried out on the black-white images. The multi-grayscale threshold is adopted to convert the image into multiple corresponding black-white images under different grayscale thresholds, the method can be applied to inspection of multiple defects, miss defect inspection is reduced, and the defect inspection ability is improved.
Description
Technical field
The present invention relates to a kind of printed-wiring board (PWB) AOI detection technique field, particularly relate to a kind of wiring board defect inspection method.
Background technology
The full name of AOI (AutomaticOpticInspection) is automatic optics inspection, is the equipment detected the common deficiency run in welding production based on optical principle.AOI is new one of rising
novelmeasuring technology, but development is rapidly, and a lot of producer is all proposed AOI testing apparatus.Upon automatic detection, machine, by camera autoscan PCB, gathers image, test solder joint and database in qualified parameter compare, through image procossing, check out defect on PCB, and by display or Automatic Logos Flaw display/mark, repair for maintenance personal.
At present, the figure that AOI equipment photographs can change into black white image according to grey scale critical value and carry out defect comparison.Although grey scale critical value sets according to design parameter, but dissimilar defect and its brightness of short circuit embodiment are different, thus cause it in black and white
figureon embodiment be different, the latter occur without embody situation, unavoidable appearance does not detect the situation of short circuit or defect.
Because above-mentioned defect, the design people, actively in addition research and innovation, to founding one
aOI scans defects detection disposal routeto improve fault detection ability, it is made to have more value in industry.
Summary of the invention
For solving the problems of the technologies described above, the object of this invention is to provide one
aOI scans defects detection disposal routeto improve fault detection ability.
Of the present invention
aOI scans defects detection disposal route, carry out according to following step:
One, AOI equipment has CCD camera, is scanned detected wiring board by CCD camera;
Two, the real image scanned is converted into digital signal by CCD;
Three, set up according to comparing in digital signal and system and go back original image;
Four, multiple grey scale critical value is adopted to go back original image and be converted into the black and white of multiple different GTGs
figure;
Five, to black and white
figurecarry out binary conversion treatment.
Further, described multiple grey scale critical value can be traversal 0-255, transforms the black and white obtaining 256 different brightness degrees
figure.
Further, described multiple grey scale critical value is preferably triple grey scale critical value, is that grey scale critical value equals 35,45 and 60 respectively, transforms the black and white obtaining three different brightness degrees
figure.
Further, a kind of scan mode in spot scan mode, line sweep mode and Surface scan mode is adopted when described CCD camera scans detected wiring board.
Further, the light source of AOI equipment adopts power to be 250W and voltage is Halogen lamp LED for 24V.
Further, described CCD camera is black-white CCD camera or colored CCD camera.
By such scheme, the present invention at least has the following advantages: the present invention adopts multiple grey scale critical value, is the multiple black and white under corresponding multiple different grey scale critical value by graphics
figure, to adapt to the inspection of number of drawbacks, thus reduce the undetected of defect, improve Flaw detectability.
Above-mentioned explanation is only this
inventionthe general introduction of technical scheme, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, be described in detail below with preferred embodiment of the present invention.
Embodiment
Below in conjunction with embodiment, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.
A kind of
aOI scans defects detection disposal route, carry out according to following step:
One, AOI equipment has CCD camera, is scanned detected wiring board by CCD camera;
Two, the real image scanned is converted into digital signal by CCD;
Three, set up according to comparing in digital signal and system and go back original image;
Four, multiple grey scale critical value is adopted to go back original image and be converted into the black and white of multiple different GTGs
figure;
Five, to black and white
figurecarry out binary conversion treatment.
Described multiple grey scale critical value is triple grey scale critical value, is that grey scale critical value equals 35,45 and 60 respectively, transforms the black and white obtaining three different brightness degrees
figure.
A kind of scan mode in spot scan mode, line sweep mode and Surface scan mode is adopted when described CCD camera scans detected wiring board.
The light source of AOI equipment adopts power to be 250W and voltage is Halogen lamp LED for 24V.
Described CCD camera is black-white CCD camera or colored CCD camera.
The above is only the preferred embodiment of the present invention; be not limited to the present invention; should be understood that; for those skilled in the art; under the prerequisite not departing from the technology of the present invention principle; can also make some improvement and modification, these improve and modification also should be considered as protection scope of the present invention.
Claims (7)
1. AOI scans a defects detection disposal route, it is characterized in that: carry out according to following step:
One, AOI equipment has CCD camera, is scanned detected wiring board by CCD camera;
Two, the real image scanned is converted into digital signal by CCD;
Three, set up according to comparing in digital signal and system and go back original image;
Four, multiple grey scale critical value is adopted to go back original image and be converted into the artwork master of multiple different GTGs;
Five, binary conversion treatment is carried out to artwork master.
2. AOI according to claim 1 scans defects detection disposal route, it is characterized in that: described multiple grey scale critical value traversal 0-255, transforms the artwork master obtaining 256 different brightness degrees.
3. AOI according to claim 1 scans defects detection disposal route, and it is characterized in that: described multiple grey scale critical value is triple grey scale critical value, is that grey scale critical value equals 35,45 and 60 respectively, transforms the artwork master obtaining three different brightness degrees.
4. AOI image scan check processing method according to claim 1, is characterized in that: adopt a kind of scan mode in spot scan mode, line sweep mode and Surface scan mode when described CCD camera scans detected wiring board.
5. AOI image scan check processing method according to claim 1, is characterized in that: the light source of AOI equipment adopts power to be 250W and voltage is Halogen lamp LED for 24V.
6. AOI image scan check processing method according to claim 1, is characterized in that: described CCD camera is black-white CCD camera.
7. AOI image scan check processing method according to claim 1, is characterized in that: described CCD camera is colored CCD camera.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510570937.7A CN105242197A (en) | 2015-09-09 | 2015-09-09 | AOI (Automatic Optic Inspection) scanning defect inspection processing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510570937.7A CN105242197A (en) | 2015-09-09 | 2015-09-09 | AOI (Automatic Optic Inspection) scanning defect inspection processing method |
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| Publication Number | Publication Date |
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| CN105242197A true CN105242197A (en) | 2016-01-13 |
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| CN201510570937.7A Pending CN105242197A (en) | 2015-09-09 | 2015-09-09 | AOI (Automatic Optic Inspection) scanning defect inspection processing method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109870467A (en) * | 2019-02-01 | 2019-06-11 | 奥士康精密电路（惠州）有限公司 | A kind of horizontal preceding binding dust optimization method of AOI scanning |
| CN112579540A (en) * | 2020-11-03 | 2021-03-30 | 珠海越亚半导体股份有限公司 | Component mounting position identification method, mounting control method, device and medium |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000048012A1 (en) * | 1999-02-11 | 2000-08-17 | Original Solutions Inc. | Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| CN1504742A (en) * | 2002-11-28 | 2004-06-16 | 威光机械工程股份有限公司 | Automatic optical detection system for defective components on printed circuit board |
| CN101477063A (en) * | 2009-01-22 | 2009-07-08 | 北京星河泰视特科技有限公司 | Detection method and optical detection instrument for printed circuit board |
| CN201662537U (en) * | 2009-12-21 | 2010-12-01 | 天津市华核科技有限公司 | Open visual detection device |
| CN102495064A (en) * | 2011-11-17 | 2012-06-13 | 深圳市锦亿宝森科技有限公司 | Touch screen screen-printed circuit automatic optic inspection system |
| CN104655643A (en) * | 2015-02-12 | 2015-05-27 | 天津理工大学 | Quality detection system for surface welding process of electronic devices |
-
2015
- 2015-09-09 CN CN201510570937.7A patent/CN105242197A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000048012A1 (en) * | 1999-02-11 | 2000-08-17 | Original Solutions Inc. | Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| CN1504742A (en) * | 2002-11-28 | 2004-06-16 | 威光机械工程股份有限公司 | Automatic optical detection system for defective components on printed circuit board |
| CN101477063A (en) * | 2009-01-22 | 2009-07-08 | 北京星河泰视特科技有限公司 | Detection method and optical detection instrument for printed circuit board |
| CN201662537U (en) * | 2009-12-21 | 2010-12-01 | 天津市华核科技有限公司 | Open visual detection device |
| CN102495064A (en) * | 2011-11-17 | 2012-06-13 | 深圳市锦亿宝森科技有限公司 | Touch screen screen-printed circuit automatic optic inspection system |
| CN104655643A (en) * | 2015-02-12 | 2015-05-27 | 天津理工大学 | Quality detection system for surface welding process of electronic devices |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109870467A (en) * | 2019-02-01 | 2019-06-11 | 奥士康精密电路（惠州）有限公司 | A kind of horizontal preceding binding dust optimization method of AOI scanning |
| CN112579540A (en) * | 2020-11-03 | 2021-03-30 | 珠海越亚半导体股份有限公司 | Component mounting position identification method, mounting control method, device and medium |
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Application publication date: 20160113 |