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CN105140297A - Thin film transistor and preparation method thereof, array substrate, and display apparatus - Google Patents

Thin film transistor and preparation method thereof, array substrate, and display apparatus Download PDF

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Publication number
CN105140297A
CN105140297A CN201510593922.2A CN201510593922A CN105140297A CN 105140297 A CN105140297 A CN 105140297A CN 201510593922 A CN201510593922 A CN 201510593922A CN 105140297 A CN105140297 A CN 105140297A
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drain electrode
straightway
film transistor
curved section
source electrode
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胡伟
刘信
杨妮
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6729Thin-film transistors [TFT] characterised by the electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/23Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • H10D64/251Source or drain electrodes for field-effect devices
    • H10D64/257Source or drain electrodes for field-effect devices for lateral devices wherein the source or drain electrodes are characterised by top-view geometrical layouts, e.g. interdigitated, semi-circular, annular or L-shaped electrodes

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  • Thin Film Transistor (AREA)

Abstract

本发明涉及显示技术领域,具体涉及一种薄膜晶体管及其制备方法、阵列基板和显示装置。一种薄膜晶体管,包括栅电极、源电极、漏电极以及漏电极引线,所述源电极由N个第一弯曲结构连接形成,所述漏电极由N-1个第二弯曲结构连接形成,所述源电极与所述漏电极对合设置,所述漏电极引线连接在所述漏电极上,所述漏电极引线的数量为(1~N-1)条。该薄膜晶体管采用N个弯曲结构连接成一整体作为漏电极,因此可以只采用(1~N-1)条漏电极引线与漏电极相连,减少了漏电极引线和引线凹槽的数量、减小了引线凹槽总宽度,既保证了较大的充电电流,又达到了减少TFT的光漏电的效果。

The invention relates to the field of display technology, in particular to a thin film transistor, a preparation method thereof, an array substrate and a display device. A thin film transistor, comprising a gate electrode, a source electrode, a drain electrode and a drain electrode lead, the source electrode is formed by connecting N first curved structures, and the drain electrode is formed by connecting N-1 second curved structures, the The source electrode and the drain electrode are arranged opposite each other, the drain electrode leads are connected to the drain electrode, and the number of the drain electrode leads is (1˜N−1). The thin film transistor adopts N curved structures connected as a whole as the drain electrode, so only (1 to N-1) drain electrode leads can be used to connect the drain electrode, reducing the number of drain electrode leads and lead grooves, reducing the The total width of the lead groove not only ensures a larger charging current, but also achieves the effect of reducing the light leakage of the TFT.

Description

薄膜晶体管及其制备方法、阵列基板和显示装置Thin film transistor and its preparation method, array substrate and display device

技术领域 technical field

本发明涉及显示技术领域,具体涉及一种薄膜晶体管及其制备方法、阵列基板和显示装置。 The invention relates to the field of display technology, in particular to a thin film transistor, a preparation method thereof, an array substrate and a display device.

背景技术 Background technique

现有的一种广视角显示装置为高级超维场转换技术(ADvancedSuperDimensionSwitch,简称:ADSDS)显示装置,其结构为,在阵列基板上依次沉积公共电极、栅电极、栅绝缘层、有源层、源漏电极、第二绝缘层、像素电极,并通过在控制像素电极与公共电极之间形成电势差,实现水平电场驱动,从而实现显示。 An existing wide viewing angle display device is an Advanced Super Dimension Switching Technology (ADvanced SuperDimensionSwitch, referred to as: ADSDS) display device, the structure of which is to sequentially deposit a common electrode, a gate electrode, a gate insulating layer, an active layer, The source and drain electrodes, the second insulating layer, and the pixel electrode form a potential difference between the control pixel electrode and the common electrode to realize horizontal electric field driving, thereby realizing display.

在现有的阵列基板结构中,源漏电极与栅极之间设置有有源层,当像素尺寸要求比较大时,为了满足充电电流的需求,需要对薄膜晶体管(ThinFilmTransistor,简称:TFT)的结构进行改进,于是,一种新的TFT应运而生,如图1所示,薄膜晶体管中的源电极3设计为由两个类似“U”型的弯曲结构连接组合而成,漏电极4由两条相互平行的直线段组成,每一直线段位于一个“U”型弯曲结构的开口区域。漏电极4的每一直线段连接一条漏电极引线5,漏电极引线5为一条与漏电极4的直线段同轴设置、且宽度大于漏电极4的直线段的另一直线段。所以两条漏电极引线5的一端分别连接在漏电极4的一条直线段上,其另一端从栅电极2的区域引出。 In the existing array substrate structure, an active layer is provided between the source-drain electrodes and the gate. When the pixel size is relatively large, in order to meet the charging current requirements, it is necessary to use thin-film transistors (ThinFilmTransistor, TFT for short). The structure was improved, so a new TFT came into being. As shown in Figure 1, the source electrode 3 in the thin film transistor is designed to be composed of two curved structures similar to "U", and the drain electrode 4 is composed of It is composed of two parallel straight segments, and each straight segment is located in the opening area of a "U"-shaped curved structure. Each straight line segment of the drain electrode 4 is connected to a drain electrode lead 5 , and the drain electrode lead 5 is another straight line segment arranged coaxially with the straight line segment of the drain electrode 4 and wider than the straight line segment of the drain electrode 4 . Therefore, one ends of the two drain electrode leads 5 are respectively connected to a straight line segment of the drain electrode 4 , and the other ends are led out from the region of the gate electrode 2 .

上述TFT结构在实际应用中不可避免地存在以下问题: The above TFT structure inevitably has the following problems in practical applications:

漏电极4的结构为两条直线段,每一直线段都必须各自连接一条漏电极引线5从而连接为一体,漏电极引线5的数量与直线段的数量相等;相应的,为了引出全部漏电极引线5,在栅电极2上也就需要开设相应数量的引线凹槽。然而,引线凹槽在某种程度上会造成光漏电,由于产生光漏电的大小与栅电极2上开设的引线凹槽的总宽度呈正相关,因此,随着引线凹槽数量的增加,不可避免地会加剧光漏电现象,影响显示效果。 The structure of the drain electrode 4 is two straight line segments, and each straight line segment must be connected to a drain electrode lead 5 to be connected as a whole. The number of the drain electrode lead 5 is equal to the number of the straight line segments; correspondingly, in order to lead out all the drain electrode lead wires 5. A corresponding number of lead grooves need to be opened on the gate electrode 2 . However, the lead grooves will cause light leakage to some extent, because the size of the light leakage is positively correlated with the total width of the lead grooves opened on the gate electrode 2, therefore, with the increase of the number of lead grooves, it is inevitable Grounding will aggravate the light leakage phenomenon and affect the display effect.

可见,设计一种漏电极引线和引线凹槽数量少,从而引线凹槽的总宽度较小,光漏电较少的薄膜晶体管成为目前亟待解决的技术问题。 It can be seen that it is an urgent technical problem to design a thin-film transistor with fewer drain electrode leads and lead grooves, so that the total width of the lead grooves is smaller and the light leakage is less.

发明内容 Contents of the invention

本发明的目的在于针对上述现有技术的不足,提供一种薄膜晶体管及其制备方法、阵列基板和显示装置,有效地减少了TFT的光漏电。 The purpose of the present invention is to address the shortcomings of the above-mentioned prior art, and provide a thin film transistor and its preparation method, an array substrate and a display device, which can effectively reduce the light leakage of TFT.

解决本发明技术问题所采用的技术方案是该薄膜晶体管,包括栅电极、源电极、漏电极以及漏电极引线,其中,所述源电极由N个第一弯曲结构连接形成,所述第一弯曲结构包括第一曲线段以及分别连接于所述第一曲线段两端的第一直线段和第二直线段, The technical solution adopted to solve the technical problem of the present invention is that the thin film transistor includes a gate electrode, a source electrode, a drain electrode and a drain electrode lead, wherein the source electrode is formed by connecting N first curved structures, and the first curved The structure includes a first curved section and a first straight section and a second straight section respectively connected to two ends of the first curved section,

所述第一弯曲结构的所述第一直线段/所述第二直线段与相邻所述第一弯曲结构的所述第二直线段/所述第一直线段以重合的方式连接,形成所述源电极, The first straight line segment/the second straight line segment of the first curved structure is connected to the second straight line segment/the first straight line segment of the adjacent first curved structure in an overlapping manner, forming the source electrode,

所述漏电极由N-1个第二弯曲结构连接形成,所述第二弯曲结构包括第二曲线段以及分别连接于所述第二曲线段两端的第三直线段和第四直线段,所述漏电极引线与所述第二曲线段连接, The drain electrode is formed by connecting N-1 second curved structures, and the second curved structure includes a second curved segment and a third straight segment and a fourth straight segment respectively connected to both ends of the second curved segment, so The drain electrode lead is connected to the second curve segment,

所述第二直线段与所述第一直线段以重合的方式连接的部分对应着所述第二曲线段,所述第三直线段和所述第四直线段对应着所述第一曲线段。 The part where the second straight line segment and the first straight line segment are connected in a coincident manner corresponds to the second curved line segment, and the third straight line segment and the fourth straight line segment correspond to the first curved line segment .

优选的是,第一个所述第一弯曲结构的所述第一直线段的长度大于所述第二直线段的长度,第N个所述第一弯曲结构的所述第二直线段的长度大于所述第一直线段的长度,其它所述第一直线段与所述第二直线段的长度相等。 Preferably, the length of the first straight segment of the first first curved structure is greater than the length of the second straight segment, and the length of the second straight segment of the Nth first curved structure is is greater than the length of the first straight line segment, and the length of the other first straight line segment is equal to the length of the second straight line segment.

优选的是,所述第三直线段的长度等于所述第四直线段的长度。 Preferably, the length of the third straight line segment is equal to the length of the fourth straight line segment.

优选的是,所述漏电极引线的数量为M,其中:1≤M≤N-1。 Preferably, the number of drain electrode leads is M, where: 1≤M≤N-1.

优选的是,当M=N-1时,所述漏电极引线与所述第二曲线段一一对应连接;当1<M<N-1时,所述漏电极引线与所述第二曲线段间隔连接;当M=1时,所述漏电极引线连接在一个所述第二曲线段上。 Preferably, when M=N-1, the drain electrode lead is connected to the second curve segment in one-to-one correspondence; when 1<M<N-1, the drain electrode lead is connected to the second curve segment Segments are connected at intervals; when M=1, the drain electrode lead is connected to one of the second curve segments.

优选的是,N≥2,当N>2时,所述第二弯曲结构的所述第三直线段/所述第四直线段与相邻所述第二弯曲结构的所述第四直线段/所述第三直线段以重合的方式连接,形成所述漏电极。 Preferably, N≥2, when N>2, the third straight segment/the fourth straight segment of the second curved structure and the fourth straight segment adjacent to the second curved structure /The third straight line segments are connected in an overlapping manner to form the drain electrode.

优选的是,还包括基板,所述栅电极位于所述基板上,所述源电极和所述漏电极相对于所述栅电极远离所述基板设置,且所述源电极与所述漏电极同层设置。 Preferably, it also includes a substrate, the gate electrode is located on the substrate, the source electrode and the drain electrode are arranged away from the substrate relative to the gate electrode, and the source electrode and the drain electrode are the same layer settings.

优选的是还包括基板,所述源电极和所述漏电极位于所述基板上,所述源电极与所述漏电极同层设置,所述栅电极相对于所述源电极和所述漏电极远离所述基板设置。 Preferably, a substrate is also included, the source electrode and the drain electrode are located on the substrate, the source electrode and the drain electrode are arranged on the same layer, and the gate electrode is opposite to the source electrode and the drain electrode away from the substrate.

一种阵列基板,包括上述薄膜晶体管。 An array substrate, including the above-mentioned thin film transistor.

一种显示装置,包括上述阵列基板。 A display device includes the above-mentioned array substrate.

一种薄膜晶体管的制备方法,薄膜晶体管包括栅电极、源电极、漏电极以及漏电极引线,所述源电极由N个第一弯曲结构连接形成,所述第一弯曲结构包括第一曲线段以及分别连接于所述第一曲线段两端的第一直线段和第二直线段, A method for preparing a thin film transistor. The thin film transistor includes a gate electrode, a source electrode, a drain electrode, and a drain electrode lead, and the source electrode is formed by connecting N first curved structures, and the first curved structure includes a first curve segment and a first straight line segment and a second straight line segment respectively connected to both ends of the first curved line segment,

所述第一弯曲结构的所述第一直线段/所述第二直线段与相邻所述第一弯曲结构的所述第二直线段/所述第一直线段以重合的方式连接,形成所述源电极, The first straight line segment/the second straight line segment of the first curved structure is connected to the second straight line segment/the first straight line segment of the adjacent first curved structure in an overlapping manner, forming the source electrode,

所述漏电极由N-1个第二弯曲结构连接形成,所述第二弯曲结构包括第二曲线段以及分别连接于所述第二曲线段两端的第三直线段和第四直线段,所述漏电极引线与所述第二曲线段连接, The drain electrode is formed by connecting N-1 second curved structures, and the second curved structure includes a second curved segment and a third straight segment and a fourth straight segment respectively connected to both ends of the second curved segment, so The drain electrode lead is connected to the second curve segment,

所述第二直线段与所述第一直线段以重合的方式连接的部分对应着所述第二曲线段,所述第三直线段和所述第四直线段对应着所述第一曲线段; The part where the second straight line segment and the first straight line segment are connected in a coincident manner corresponds to the second curved line segment, and the third straight line segment and the fourth straight line segment correspond to the first curved line segment ;

所述源电极和所述漏电极采用同一张半色调掩膜板或灰色调掩膜板形成。 The source electrode and the drain electrode are formed by using the same half-tone mask or gray-tone mask.

本发明的技术效果为:该薄膜晶体管采用N个弯曲结构连接成一整体作为漏电极,因此可以只采用(1~N-1)条漏电极引线与漏电极相连,减少了漏电极引线和引线凹槽的数量、减小了引线凹槽总宽度,既保证了较大的充电电流,又达到了减少TFT的光漏电的效果。 The technical effect of the present invention is: the thin film transistor adopts N curved structures connected into a whole as the drain electrode, so only (1-N-1) drain electrode leads can be used to connect the drain electrode, reducing the number of drain electrode leads and lead wires. The number of grooves reduces the total width of lead grooves, which not only ensures a larger charging current, but also achieves the effect of reducing light leakage of TFT.

附图说明 Description of drawings

图1为现有的薄膜晶体管的结构示意图; FIG. 1 is a schematic structural diagram of an existing thin film transistor;

图2为本发明实施例1中薄膜晶体管中漏电极引线数量为3时的结构示意图; 2 is a schematic structural diagram when the number of drain electrode leads in the thin film transistor in Embodiment 1 of the present invention is 3;

图3为图2中包含第一弯曲结构和第二弯曲结构的局部放大图; Fig. 3 is a partially enlarged view including a first curved structure and a second curved structure in Fig. 2;

图4为本发明实施例1中薄膜晶体管中漏电极引线数量为2时的结构示意图; 4 is a schematic structural diagram when the number of drain electrode leads in the thin film transistor in Embodiment 1 of the present invention is 2;

图5为本发明实施例2中薄膜晶体管的结构示意图; 5 is a schematic structural diagram of a thin film transistor in Embodiment 2 of the present invention;

其中,附图标记为: Wherein, reference sign is:

1-有源层;2-栅电极; 1-active layer; 2-gate electrode;

3-源电极;31-第一弯曲结构;311-第一直线段;312-第一曲线段;313-第二直线段; 3-source electrode; 31-first curved structure; 311-first straight line segment; 312-first curved line segment; 313-second straight line segment;

4-漏电极;41-第二弯曲结构;411-第三直线段;412-第二曲线段;413-第四直线段; 4-drain electrode; 41-second curved structure; 411-third straight section; 412-second curved section; 413-fourth straight section;

5-漏电极引线。 5- Drain electrode lead.

具体实施方式 Detailed ways

为使本领域技术人员更好地理解本发明的技术方案,下面结合附图和具体实施方式对本发明作进一步详细描述。 In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

实施例1: Example 1:

本实施例提供一种薄膜晶体管,其采用N(N>2)个弯曲结构连接成一整体作为漏电极,再采用(1~N-1)条漏电极引线与漏电极相连,能够有效减少漏电极引线和引线凹槽的数量、减小引线凹槽总宽度,从而减少TFT的光漏电的影响。 This embodiment provides a thin film transistor, which adopts N (N>2) curved structures connected as a whole as the drain electrode, and then uses (1-N-1) drain electrode leads to connect with the drain electrode, which can effectively reduce the number of drain electrodes. The number of leads and lead grooves reduces the total width of the lead grooves, thereby reducing the influence of light leakage of the TFT.

该薄膜晶体管的具体结构如图2、图3所示,包括栅电极2、源电极3、漏电极4以及漏电极引线5,其中源电极3由N个第一弯曲结构31连接形成,第一弯曲结构31包括第一曲线段312以及分别连接于第一曲线段312两端的第一直线段311和第二直线段313。 The specific structure of the thin film transistor is shown in Fig. 2 and Fig. 3, including a gate electrode 2, a source electrode 3, a drain electrode 4 and a drain electrode lead 5, wherein the source electrode 3 is formed by connecting N first curved structures 31, and the first The curved structure 31 includes a first curved section 312 and a first straight section 311 and a second straight section 313 respectively connected to two ends of the first curved section 312 .

位于最左侧的第一个第一弯曲结构31的第二直线段313与相邻的第二个第一弯曲结构31的第一直线段311以重合的方式连接,第二个第一弯曲结构31的第二直线段313与相邻的第三个第一弯曲结构31的第一直线段311以重合的方式连接,如此循环连接,直到第N-1(N>2)个第一弯曲结构31的第二直线段313与位于最右侧的第N个第一弯曲结构31的第一直线段311以重合的方式连接,从而形成源电极3。 The second straight segment 313 of the first first curved structure 31 located on the leftmost side is connected to the first straight segment 311 of the adjacent second first curved structure 31 in a coincident manner, and the second first curved structure The second straight line segment 313 of 31 is connected with the first straight line segment 311 of the adjacent third first curved structure 31 in a coincident manner, and is connected in a loop until the N-1 (N>2) first curved structure The second straight line segment 313 of 31 is connected to the first straight line segment 311 of the Nth first curved structure 31 located on the far right in a coincident manner, thereby forming the source electrode 3 .

与源电极3的结构相似,漏电极4由N-1个第二弯曲结构41连接形成,第二弯曲结构41包括第二曲线段412以及分别连接于第二曲线段412两端的第三直线段411和第四直线段413。 Similar to the structure of the source electrode 3, the drain electrode 4 is formed by connecting N-1 second curved structures 41. The second curved structure 41 includes a second curved segment 412 and a third straight segment connected to both ends of the second curved segment 412. 411 and the fourth straight line segment 413 .

位于最左侧的第一个第二弯曲结构41的第四直线段413与相邻的第二个第二弯曲结构41的第三直线段411以重合的方式连接,第二个第二弯曲结构41的第四直线段413与相邻的第三个第二弯曲结构41的第三直线段411以重合的方式连接,如此循环连接,直到第N-2个第二弯曲结构41的第四直线段413与位于最右侧的第N-1个第二弯曲结构41的第三直线段411以重合的方式连接,从而形成漏电极4。 The fourth straight segment 413 of the first second curved structure 41 on the leftmost side is connected to the third straight segment 411 of the second adjacent second curved structure 41 in a coincident manner, and the second second curved structure The fourth straight line segment 413 of 41 is connected with the third straight line segment 411 of the third adjacent second curved structure 41 in a coincident manner, and thus circularly connected until the fourth straight line segment 413 of the N-2 second curved structure 41 The segment 413 is connected to the third straight segment 411 of the N−1 th second curved structure 41 on the rightmost side in a coincident manner, so as to form the drain electrode 4 .

源电极3与漏电极4对合设置,源电极3中的第二直线段313与第一直线段311以重合的方式连接的部分对应着漏电极4中的第二曲线段412;漏电极4中的第三直线段411和第四直线段413对应着源电极3中的第一曲线段312。 The source electrode 3 and the drain electrode 4 are arranged in pairs, and the part where the second straight line segment 313 and the first straight line segment 311 in the source electrode 3 are connected in an overlapping manner corresponds to the second curved line segment 412 in the drain electrode 4; the drain electrode 4 The third straight line segment 411 and the fourth straight line segment 413 in correspond to the first curved line segment 312 in the source electrode 3 .

为了使源电极3与漏电极4对合设置的效果更好,优选的是,将源电极3中最左侧的第一个第一弯曲结构31的第一直线段311的长度大于其第二直线段313的长度;最右侧的第N个第一弯曲结构31的第二直线段313的长度大于其第一直线段311的长度,其它第一弯曲结构31包括的第一直线段311与第二直线段313的长度相等。这样,源电极3中最左侧的第一个第一弯曲结构31和最右侧的第N个第一弯曲结构31的形状类似于“J”型形状,其它第一弯曲结构31的形状类似于“U”型形状,相比于将所有第一弯曲结构31均设置成相同的“U”型形状,可以使源电极3与漏电极4对合设置的效果更好。 In order to make the effect of matching the source electrode 3 and the drain electrode 4 better, preferably, the length of the first straight line segment 311 of the first leftmost first curved structure 31 in the source electrode 3 is longer than the length of the second The length of the straight line segment 313; the length of the second straight line segment 313 of the rightmost Nth first curved structure 31 is greater than the length of the first straight line segment 311, and the first straight line segment 311 and the other first curved structure 31 include The lengths of the second straight line segments 313 are equal. In this way, the shapes of the leftmost first curved structure 31 and the rightmost Nth first curved structure 31 in the source electrode 3 are similar to a "J" shape, and the shapes of other first curved structures 31 are similar to In the "U" shape, compared with arranging all the first curved structures 31 in the same "U" shape, the effect of arranging the source electrode 3 and the drain electrode 4 in opposition is better.

相应的,为了使漏电极4的结构简单,优选的是,漏电极4中的所有第三直线段411的长度等于第四直线段413的长度。 Correspondingly, in order to simplify the structure of the drain electrode 4 , preferably, the length of all the third straight line segments 411 in the drain electrode 4 is equal to the length of the fourth straight line segment 413 .

源电极3和漏电极4的正投影均落在有源层1所在的区域内。在具体结构上,漏电极引线5的结构为一直线段,且连接在漏电极4的第二曲线段412上背离第二弯曲结构41开口方向的一侧,充当漏电极引线5的直线段宽度较大、与相邻两个第一弯曲结构31重合的直线段基本位于同一直线上。同时,漏电极引线5经过栅电极2上的引线凹槽引出。因为形成漏电极4的所有第二弯曲结构41依次相连组合成了一整体,因此,漏电极引线5的数量M的取值范围可以是1≤M≤N-1,相应的引线凹槽的数量等于漏电极引线5的数量。 The orthographic projections of the source electrode 3 and the drain electrode 4 both fall within the area where the active layer 1 is located. In terms of specific structure, the structure of the drain electrode lead 5 is a straight line segment, and it is connected to the side of the second curve segment 412 of the drain electrode 4 that is away from the opening direction of the second curved structure 41, and the straight line segment serving as the drain electrode lead 5 has a smaller width. The straight line segments that are large and coincide with two adjacent first curved structures 31 are basically located on the same straight line. At the same time, the drain electrode lead 5 is led out through the lead groove on the gate electrode 2 . Because all the second curved structures 41 forming the drain electrode 4 are connected sequentially to form a whole, therefore, the value range of the number M of the drain electrode leads 5 can be 1≤M≤N-1, and the corresponding number of lead grooves equal to the number of drain electrode leads 5 .

当漏电极引线5的数量M=N-1时,漏电极引线5与漏电极4的所有第二弯曲结构41一一对应连接;例如图2所示,取N=4,则M=3,即第一弯曲结构31的数量是4,第二弯曲结构41的数量是3,漏电极引线5的数量和引线凹槽的数量都是3。这样,相比现有技术中的方案,此种薄膜晶体管的结构中减少了1个引线凹槽,引线凹槽的总宽度也相应减小,从而TFT的光漏电也将减少。 When the number of drain electrode leads 5 is M=N-1, the drain electrode leads 5 are connected to all the second curved structures 41 of the drain electrode 4 in one-to-one correspondence; for example, as shown in FIG. 2, if N=4, then M=3, That is, the number of first curved structures 31 is four, the number of second curved structures 41 is three, and the number of drain electrode leads 5 and the number of lead grooves are both three. In this way, compared with the solution in the prior art, one lead groove is reduced in the structure of this thin film transistor, and the total width of the lead groove is correspondingly reduced, so that the light leakage of the TFT will also be reduced.

当漏电极引线5的数量M的取值是1<M<N-1时,漏电极引线5与漏电极4中的第二曲线段412间隔连接;例如图4所示,取N=4,则M=3,即第一弯曲结构31的数量是4,第二弯曲结构41的数量是3,漏电极引线5的数量和引线凹槽的数量都取2,将两条漏电极引线5分别连接在最左侧和最右侧的第二弯曲结构41上,使中间间隔一个第二弯曲结构41。这样,相比现有技术中的方案,此种薄膜晶体管的结构中减少了2个引线凹槽,引线凹槽的总宽度也相应减小,从而TFT的光漏电也将减少。 When the value of the number M of the drain electrode leads 5 is 1<M<N-1, the drain electrode leads 5 are connected to the second curve segment 412 in the drain electrode 4 at intervals; for example, as shown in FIG. 4, N=4, Then M=3, that is, the number of first curved structures 31 is 4, the number of second curved structures 41 is 3, the number of drain electrode leads 5 and the number of lead grooves are both 2, and the two drain electrode leads 5 are respectively It is connected to the leftmost and rightmost second curved structures 41 with a second curved structure 41 in between. In this way, compared with the solution in the prior art, two lead grooves are reduced in the structure of this thin film transistor, and the total width of the lead groove is correspondingly reduced, so that the light leakage of the TFT will also be reduced.

当漏电极引线5的数量为1时,漏电极引线5连接在任何一个第二弯曲结构41上均可,优选的是,将漏电极引线5连接在位于中间位置的那一个第二弯曲结构41上。第一弯曲结构31和第二弯曲结构41的数量可以有多种选择,在此不作限定。相应的,只需要设置1个引线凹槽。这样,相比现有技术中的方案,此种薄膜晶体管的结构中减少了N-2个引线凹槽,引线凹槽的总宽度也相应大大减小,不仅保证了较大的充电电流,而且TFT的光漏电也将大大减少。 When the number of the drain electrode lead 5 is 1, the drain electrode lead 5 can be connected to any second bending structure 41, preferably, the drain electrode lead 5 is connected to the second bending structure 41 at the middle position. superior. The number of the first bending structure 31 and the number of the second bending structure 41 can be selected in various ways, which is not limited here. Correspondingly, only one lead wire groove needs to be provided. In this way, compared with the solutions in the prior art, N-2 lead grooves are reduced in the structure of this kind of thin film transistor, and the total width of the lead grooves is also greatly reduced accordingly, which not only ensures a larger charging current, but also The light leakage of TFT will also be greatly reduced.

相应的,本实施例中的薄膜晶体管的制备方法,针对由N个第一弯曲结构连接形成的源电极以及由N-1个第二弯曲结构连接形成的漏电极,可以通过一张半色调掩膜板(HalfToneMask,简称HTM)或灰色调掩膜板(GrayToneMask,简称GTM)形成有源层及源漏电极图形。这样,源电极3和漏电极4的正投影均落在有源层1所在的区域内。 Correspondingly, in the manufacturing method of the thin film transistor in this embodiment, for the source electrode formed by connecting N first curved structures and the drain electrode formed by connecting N-1 second curved structures, a half-tone mask can be used. A half tone mask (HTM for short) or a gray tone mask (GTM for short) forms the active layer and the source and drain electrode patterns. In this way, the orthographic projections of the source electrode 3 and the drain electrode 4 both fall within the area where the active layer 1 is located.

本实施例还提供一种采用上述任一一种薄膜晶体管的阵列基板,该阵列基板具有更佳的性能。 This embodiment also provides an array substrate using any one of the above thin film transistors, and the array substrate has better performance.

实施例2: Example 2:

本实施例提供一种薄膜晶体管,该薄膜晶体管的设计思路与实施例1中的薄膜晶体管相同,两者不同之处仅在于:如图5所示,本实施例中的薄膜晶体管的源电极3只包括2个第一弯曲结构31,漏电极4只包括1个第二弯曲结构41,相应的,漏电极引线5和引线凹槽的数量均为1。 This embodiment provides a thin film transistor. The design concept of the thin film transistor is the same as that of the thin film transistor in embodiment 1. The only difference between the two is: as shown in FIG. 5 , the source electrode 3 of the thin film transistor Only two first curved structures 31 are included, and the drain electrode 4 only includes one second curved structure 41 . Correspondingly, the number of drain electrode leads 5 and lead grooves is one.

本实施例中薄膜晶体管的其他结构与实施例1相同,这里不再赘述。 Other structures of the thin film transistor in this embodiment are the same as those in Embodiment 1, and will not be repeated here.

这样,相比现有技术中的方案,本实施例中薄膜晶体管的结构中减少了1个引线凹槽,引线凹槽的总宽度也相应减小,从而TFT的光漏电也将减少。 In this way, compared with the solution in the prior art, one lead groove is reduced in the structure of the thin film transistor in this embodiment, and the total width of the lead groove is correspondingly reduced, so that the light leakage of the TFT will also be reduced.

本实施例还提供一种采用上述薄膜晶体管的阵列基板,该阵列基板具有更佳的性能。 This embodiment also provides an array substrate using the thin film transistor described above, and the array substrate has better performance.

实施例1和实施例2中的薄膜晶体管通过改进了源电极、漏电极以及栅电极的形状结构,实现了减少漏电极引线和引线凹槽的数量的效果。 The thin film transistors in Embodiment 1 and Embodiment 2 achieve the effect of reducing the number of drain electrode leads and lead grooves by improving the shape and structure of the source electrode, drain electrode and gate electrode.

容易理解的是,上述改进方案可以运用在底栅型薄膜晶体管的结构中。在底栅型薄膜晶体管的结构中,将栅电极、公共电极均设置在基板上,且公共电极与栅电极分离;栅绝缘层形成在栅电极上并覆盖整个基板;将源电极和漏电极相对于栅电极远离基板设置,且源电极与漏电极设置在同一层;有源层及源漏电极依次形成在栅绝缘层上。源电极和漏电极的结构可以采用实施例1和实施例2中任一一种源电极和漏电极的结构,相应可以减少漏电极引线和引线凹槽的数量;此外,在源漏电极上方形成绝缘层,并通过绝缘层掩膜板在绝缘层上形成过孔;像素电极以梳妆结构形成在该绝缘层上,并通过过孔与源漏电极中的漏电极相连。 It is easy to understand that the above improvement scheme can be applied to the structure of the bottom-gate thin film transistor. In the structure of the bottom-gate thin film transistor, the gate electrode and the common electrode are arranged on the substrate, and the common electrode is separated from the gate electrode; the gate insulating layer is formed on the gate electrode and covers the entire substrate; the source electrode and the drain electrode are opposite to each other. The gate electrode is arranged away from the substrate, and the source electrode and the drain electrode are arranged on the same layer; the active layer and the source and drain electrodes are sequentially formed on the gate insulating layer. The structure of the source electrode and the drain electrode can adopt any one of the structure of the source electrode and the drain electrode in Embodiment 1 and Embodiment 2, which can reduce the number of drain electrode leads and lead grooves accordingly; The insulating layer is formed on the insulating layer through the mask plate of the insulating layer; the pixel electrode is formed on the insulating layer in a comb structure, and is connected to the drain electrode of the source and drain electrodes through the via hole.

上述改进方案也可以运用在顶栅型薄膜晶体管的结构中,在顶栅型薄膜晶体管的结构中,将源电极和漏电极同层地设置在基板上,将栅电极相对于源电极和漏电极远离基板设置;对应调整其它层结构的次序,在此不再赘述。 The above improvement scheme can also be applied to the structure of the top-gate thin film transistor. In the structure of the top-gate thin film transistor, the source electrode and the drain electrode are arranged on the same layer on the substrate, and the gate electrode is arranged opposite to the source electrode and the drain electrode. It is arranged away from the substrate; correspondingly, the order of other layer structures is adjusted, which will not be repeated here.

实施例3: Example 3:

本实施例提供了一种显示装置,其包括实施例1或实施例2中任意一种阵列基板。 This embodiment provides a display device, which includes any one of the array substrates in Embodiment 1 or Embodiment 2.

所述显示装置可以为:液晶显示面板、电子纸、OLED面板、手机、平板电脑、电视机、显示器、笔记本电脑、数码相框、导航仪等任何具有显示功能的产品或部件。 The display device may be any product or component with a display function such as a liquid crystal display panel, electronic paper, OLED panel, mobile phone, tablet computer, television, monitor, notebook computer, digital photo frame, navigator, etc.

本发明的薄膜晶体管中,通过采用N(N≥2)个弯曲结构连接成一整体作为漏电极,再采用(1~N-1)条漏电极引线与漏电极相连,从而达到减少漏电极引线和引线凹槽的数量、减小引线凹槽总宽度,既保证了较大的充电电流,又达到了减少TFT的光漏电的效果;同时,也为制备光漏电较少的阵列基板和显示装置提供了保证。 In the thin film transistor of the present invention, N (N ≥ 2) curved structures are used as a whole to be connected as a drain electrode, and (1 to N-1) drain electrode leads are connected to the drain electrode, thereby reducing the drain electrode lead and The number of lead grooves and the reduction of the total width of the lead grooves not only ensure a large charging current, but also achieve the effect of reducing the light leakage of TFT; at the same time, it also provides support for the preparation of array substrates and display devices with less light leakage. guaranteed.

可以理解的是,以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式,然而本发明并不局限于此。对于本领域内的普通技术人员而言,在不脱离本发明的精神和实质的情况下,可以做出各种变型和改进,这些变型和改进也视为本发明的保护范围。 It can be understood that, the above embodiments are only exemplary embodiments adopted for illustrating the principle of the present invention, but the present invention is not limited thereto. For those skilled in the art, various modifications and improvements can be made without departing from the spirit and essence of the present invention, and these modifications and improvements are also regarded as the protection scope of the present invention.

Claims (11)

1. a thin-film transistor, comprise gate electrode, source electrode, drain electrode and drain electrode lead-in wire, it is characterized in that, described source electrode is connected to form by N number of first warp architecture, described first warp architecture comprises the first curved section and is connected to the first straightway and second straightway at described first curved section two ends
Described first straightway/described second straightway of described first warp architecture is connected in the mode overlapped with described second straightway/described first straightway of adjacent described first warp architecture, forms described source electrode,
Described drain electrode is connected to form by N-1 the second warp architecture, described second warp architecture comprises the second curved section and is connected to the 3rd straightway and the 4th straightway at described second curved section two ends, described drain electrode lead-in wire is connected with described second curved section
Described second straightway correspond to described second curved section with described first straightway with the part that the mode overlapped is connected, and described 3rd straightway and described 4th straightway correspond to described first curved section.
2. thin-film transistor according to claim 1, it is characterized in that, the length of described first straightway of first described first warp architecture is greater than the length of described second straightway, the length of described second straightway of N number of described first warp architecture is greater than the length of described first straightway, and the first straightway described in other is equal with the length of described second straightway.
3. thin-film transistor according to claim 1, it is characterized in that, the length of described 3rd straightway equals the length of described 4th straightway.
4. thin-film transistor according to claim 1, is characterized in that, the quantity of described drain electrode lead-in wire is M, wherein: 1≤M≤N-1.
5. thin-film transistor according to claim 4, is characterized in that, as M=N-1, described drain electrode lead-in wire connects one to one with described second curved section; As 1 < M < N-1, described drain electrode lead-in wire and described second curved section interval are connected; As M=1, described drain electrode lead-in wire is connected on described second curved section.
6. according to the arbitrary described thin-film transistor of claim 1-5, it is characterized in that, N >=2, as N>2, described 3rd straightway/described 4th straightway of described second warp architecture is connected in the mode overlapped with described 4th straightway/described 3rd straightway of adjacent described second warp architecture, forms described drain electrode.
7. thin-film transistor according to claim 1, it is characterized in that, also comprise substrate, described gate electrode is positioned on described substrate, described source electrode and described drain electrode are arranged away from described substrate relative to described gate electrode, and described source electrode and described drain electrode are arranged with layer.
8. thin-film transistor according to claim 1, it is characterized in that, also comprise substrate, described source electrode and described drain electrode are positioned on described substrate, described source electrode and described drain electrode are arranged with layer, and described gate electrode is arranged away from described substrate relative to described source electrode and described drain electrode.
9. an array base palte, is characterized in that, comprises the arbitrary described thin-film transistor of claim 1 to 8.
10. a display unit, is characterized in that, comprises array base palte described in claim 9.
The preparation method of 11. 1 kinds of thin-film transistors, thin-film transistor comprises gate electrode, source electrode, drain electrode and drain electrode lead-in wire, it is characterized in that, described source electrode is connected to form by N number of first warp architecture, described first warp architecture comprises the first curved section and is connected to the first straightway and second straightway at described first curved section two ends
Described first straightway/described second straightway of described first warp architecture is connected in the mode overlapped with described second straightway/described first straightway of adjacent described first warp architecture, forms described source electrode,
Described drain electrode is connected to form by N-1 the second warp architecture, described second warp architecture comprises the second curved section and is connected to the 3rd straightway and the 4th straightway at described second curved section two ends, described drain electrode lead-in wire is connected with described second curved section
Described second straightway correspond to described second curved section with described first straightway with the part that the mode overlapped is connected, and described 3rd straightway and described 4th straightway correspond to described first curved section;
Described source electrode and described drain electrode adopt same intermediate tone mask plate or gray tone mask plate to be formed.
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CN107121865A (en) * 2017-06-07 2017-09-01 深圳市华星光电技术有限公司 A kind of thin film transistor (TFT), TFT substrate and display panel
US10509279B2 (en) 2017-06-07 2019-12-17 Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd Thin film transistor, TFT substrate, and display panel having source eletrodes and gate electrodes comprising U-shape structures
CN110797411A (en) * 2019-10-09 2020-02-14 南京中电熊猫平板显示科技有限公司 A kind of thin film transistor and its manufacturing method, array substrate
WO2021068481A1 (en) * 2019-10-09 2021-04-15 南京中电熊猫液晶显示科技有限公司 Thin film transistor, manufacturing method therefor and array substrate

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Application publication date: 20151209