[go: up one dir, main page]

CN105116534A - Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave - Google Patents

Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave Download PDF

Info

Publication number
CN105116534A
CN105116534A CN201510429872.4A CN201510429872A CN105116534A CN 105116534 A CN105116534 A CN 105116534A CN 201510429872 A CN201510429872 A CN 201510429872A CN 105116534 A CN105116534 A CN 105116534A
Authority
CN
China
Prior art keywords
topological insulator
insulator substrate
particulate
particles
nanometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510429872.4A
Other languages
Chinese (zh)
Other versions
CN105116534B (en
Inventor
曹暾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dalian University of Technology
Original Assignee
Dalian University of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dalian University of Technology filed Critical Dalian University of Technology
Priority to CN201510429872.4A priority Critical patent/CN105116534B/en
Publication of CN105116534A publication Critical patent/CN105116534A/en
Application granted granted Critical
Publication of CN105116534B publication Critical patent/CN105116534B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

本发明提供一种线偏振平面光波对处于拓扑绝缘体衬底上方微粒的可调谐捕获和筛选的方法,破坏微粒周围的玻印亭矢量的对称分布,使微粒上的总玻印亭矢量不为零,产生非梯度光学力;然后,通过改变拓扑绝缘体衬底平板的量子态,改变微粒上的总玻印亭矢量的方向和大小,进而改变总玻印亭矢量作用在微粒上的非梯度光学力的方向和大小,来调控微粒在入射光场中的运动轨迹,从而对附着在微粒表面的纳米尺寸分子进行可调谐捕获和筛选的技术方案。其中,通过光照、通电、加热、加压、和外加磁场等方式实现拓扑绝缘体衬底平板从拓扑非平庸到拓扑平庸的可逆量子相变。

The invention provides a method for tunable trapping and screening of particles above a topological insulator substrate by linearly polarized plane light waves, which destroys the symmetrical distribution of the Poynting vectors around the particles, so that the total Poynting vectors on the particles are not zero , produce non-gradient optical force; then, by changing the quantum state of the topological insulator substrate plate, change the direction and magnitude of the total Poynting vector on the particle, and then change the non-gradient optical force of the total Poynting vector on the particle The direction and size of the particles are used to control the trajectory of the particles in the incident light field, so as to perform tunable capture and screening of nanometer-sized molecules attached to the surface of the particles. Among them, the reversible quantum phase transition of the topological insulator substrate plate from topological non-trivial to topological mediocre is realized by means of illumination, electrification, heating, pressurization, and external magnetic field.

Description

线偏振平面光波对处于拓扑绝缘体衬底上方微粒的可调谐捕获和筛选的方法Tunable Trapping and Screening of Particles Over Topological Insulator Substrates by Linearly Polarized Plane Lightwaves

技术领域technical field

本发明涉及一种线偏振平面光波对处于拓扑绝缘体衬底上方微粒的可调谐捕获和筛选的方法,可应用于生物、医学及纳米操控等领域。The invention relates to a method for tunable trapping and screening of particles above a topological insulator substrate by linearly polarized plane light waves, which can be applied to the fields of biology, medicine, nanometer manipulation and the like.

背景技术Background technique

对微小物体的光学捕获和筛选一直是光学领域的研究热点。光学梯度力在各种光学捕获技术中扮演着重要的角色,例如通过光学梯度力实现的光镊和光学捆绑等。然而,光学梯度力具有产生设备复杂、不可调谐和难以捕获和筛选纳米尺寸分子等缺点。2008年,Ward,T.J.等提出通过圆偏振光产生的光学梯度力可以捕获和分离具有纳米尺寸的手性分子。但是,圆偏振入射光仍然需要使用复杂的设备来产生,不利于系统的实际应用;且其捕获和分离的纳米尺寸分子必需具有手性结构,因此限制了其作用对象的范围。所以,本发明提出在位于拓扑绝缘体衬底平板上方的微粒表面覆盖纳米尺寸分子,使其在线偏振平面光波照射下在微粒周围产生非梯度光学力;然后,利用拓扑绝缘体量子态随外加光场、电场、温度场、压力场、和磁场改变而变化的特性,调谐拓扑绝缘体衬底平板上方微粒受到的非梯度光学力大小和方向,从而实现对附着在微粒表面的纳米尺寸分子的捕获和筛选,其中纳米尺寸分子可以为非手性结构。Optical trapping and screening of tiny objects has always been a research hotspot in the field of optics. Optical gradient force plays an important role in various optical trapping technologies, such as optical tweezers and optical bundling through optical gradient force. However, optical gradient forces have the disadvantages of complex devices, non-tunable devices, and difficulty in trapping and screening nanometer-sized molecules. In 2008, Ward, T.J. et al proposed that the optical gradient force generated by circularly polarized light can capture and separate chiral molecules with nanometer size. However, the circularly polarized incident light still needs to be generated by complex equipment, which is not conducive to the practical application of the system; and the nano-sized molecules captured and separated must have a chiral structure, thus limiting the scope of its target. Therefore, the present invention proposes to cover the surface of the particle above the topological insulator substrate plate with nano-sized molecules, so that it can generate non-gradient optical force around the particle under the irradiation of linearly polarized plane light waves; The characteristics of electric field, temperature field, pressure field, and magnetic field change, tune the size and direction of the non-gradient optical force on the particles above the topological insulator substrate plate, so as to realize the capture and screening of nanometer-sized molecules attached to the surface of the particles, Wherein the nano-sized molecule can be an achiral structure.

发明内容Contents of the invention

本发明的目的在于克服了利用梯度光学力捕获和筛选纳米尺寸分子这一传统方法中所具有的入射光源复杂(即入射光必需为圆偏振或椭圆偏振)、筛选对象局限(即纳米尺寸分子必需具有手性结构)、由圆偏振或椭圆偏振光产生的梯度光学力不可调谐、以及难以捕获纳米尺寸非手性分子等不足,而提供一种具有系统简单、操作方便、超灵敏、超快速、主动调谐等优点的由线偏振平面光波产生的非梯度光学力捕获和筛选位于拓扑绝缘体衬底平板上方的非手性纳米尺寸分子的方法,可用于生物,医学以及纳米操控等领域。The purpose of the present invention is to overcome the complexity of the incident light source (that is, the incident light must be circularly polarized or elliptically polarized) and the limitation of the screening object (that is, the nanoscale molecule must have chiral structure), the gradient optical force generated by circularly polarized or elliptically polarized light is not tunable, and it is difficult to capture nano-sized achiral molecules, etc., and provide a system with simple system, convenient operation, ultra-sensitive, ultra-fast, The non-gradient optical force generated by linearly polarized plane light waves, which has the advantages of active tuning, traps and screens achiral nanometer-sized molecules above the topological insulator substrate plate, which can be used in the fields of biology, medicine, and nanomanipulation.

一种线偏振平面光波对处于拓扑绝缘体衬底上方微粒的可调谐捕获和筛选的方法,将微粒置于拓扑绝缘体衬底平板上方,该拓扑绝缘体衬底平板破坏了微粒周围的玻印亭矢量对称分布,使微粒上的总玻印亭矢量不为零,产生非梯度光学力;通过改变拓扑绝缘体衬底平板的量子态,改变微粒上的总玻印亭矢量分布,进而改变总玻印亭矢量作用在微粒上的非梯度光学力的方向和大小,来调控微粒在入射光场中的运动轨迹,从而对附着在微粒表面的纳米尺寸分子进行可调谐捕获和筛选,其中,微粒置于拓扑绝缘体衬底平板上方,微粒材料可以是介质或金属,拓扑绝缘体衬底的长、宽、高在10纳米到10米,微粒与拓扑绝缘体衬底平板表面的距离为l(l>0);微粒的外形可以是球体、圆柱体、圆锥体等曲面几何体或棱柱体、正方体、长方体等多面体,体积在1立方纳米至1000立方微米。A method for tunable trapping and screening of particles above a topological insulator substrate by a linearly polarized plane light wave, placing the particle above a topological insulator substrate slab that breaks the Poynting vector symmetry around the particle distribution, so that the total Poynting vector on the particle is not zero, resulting in non-gradient optical force; by changing the quantum state of the topological insulator substrate plate, changing the distribution of the total Poynting vector on the particle, and then changing the total Poynting vector The direction and magnitude of the non-gradient optical force acting on the particle can be used to control the trajectory of the particle in the incident light field, so as to perform tunable trapping and screening of nanometer-sized molecules attached to the surface of the particle, where the particle is placed in a topological insulator Above the substrate plate, the particle material can be medium or metal, the length, width and height of the topological insulator substrate are from 10 nanometers to 10 meters, and the distance between the particles and the surface of the topological insulator substrate plate is l (l>0); The shape can be a curved surface geometry such as a sphere, a cylinder, a cone, or a polyhedron such as a prism, a cube, and a cuboid, and the volume is between 1 cubic nanometer and 1000 cubic micrometers.

所述的入射光为线偏振平面波;入射光入射方向平行于拓扑绝缘体衬底平板,频率范围为0.3微米~20微米,功率范围为0.1mW/μm2~10mW/μm2The incident light is a linearly polarized plane wave; the incident direction of the incident light is parallel to the topological insulator substrate plate, the frequency range is 0.3 microns to 20 microns, and the power range is 0.1 mW/μm 2 to 10 mW/μm 2 .

所述的入射光的光源采用波长可调谐激光器、半导体连续或准连续激光、或者发光二极管。The light source of the incident light adopts a wavelength-tunable laser, a semiconductor continuous or quasi-continuous laser, or a light emitting diode.

所述的表面附有纳米尺寸分子的微粒,微粒材料可以是金属或介质,其中,金属可以是Al、Ag、Au、Cu、Ni、Pt等,介质可以是半导体材料如Si、SiO2、GaAs、InP、Al2O3等或聚合物。The surface is attached with particles of nanometer size molecules, the particle material can be metal or medium, wherein the metal can be Al, Ag, Au, Cu, Ni, Pt, etc., and the medium can be semiconductor materials such as Si, SiO 2 , GaAs , InP, Al 2 O 3 , etc. or polymers.

所述的拓扑绝缘体衬底平板,拓扑绝缘体可以是BixSb1-x、HgTe、Bi2Te3、Bi2Se3或Sb2Te3As for the topological insulator substrate flat plate, the topological insulator may be Bi x Sb 1-x , HgTe, Bi 2 Te 3 , Bi 2 Se 3 or Sb 2 Te 3 .

所述的表面附有纳米尺寸分子的微粒,纳米尺寸分子可以具有非手性结构或手性结构,如抗原,抗体,酶,激素,胺类,肽类,氨基酸,维生素等。Said particles with nano-sized molecules attached to the surface, the nano-sized molecules may have achiral structure or chiral structure, such as antigens, antibodies, enzymes, hormones, amines, peptides, amino acids, vitamins and the like.

所述的拓扑绝缘体衬底平板,拓扑绝缘体通过材料生长工艺实现,包括磁控溅射、电子束蒸发、金属有机化合物化学气相沉淀、气相外延生长、分子束外延等。In the topological insulator substrate flat plate, the topological insulator is realized through material growth processes, including magnetron sputtering, electron beam evaporation, chemical vapor deposition of metal organic compounds, vapor phase epitaxy growth, molecular beam epitaxy, and the like.

所述的拓扑绝缘体衬底平板,可以通过光照、通电、加热、加压、和外加磁场等方式实现拓扑绝缘体从拓扑非平庸到拓扑平庸的可逆量子相变。The topological insulator substrate flat plate can realize the reversible quantum phase transition of the topological insulator from topological non-trivial to topological mediocre by means of illumination, electrification, heating, pressurization, and external magnetic field.

本发明系统由光源、显微镜和光学力显示器构成。测试前先将拓扑绝缘体衬底平板置于装有水或油的样品池底部,然后将表面附有纳米尺寸分子的微粒置于装有水或油的样品池中,同时置于拓扑绝缘体衬底平板上方,线偏振平面波光源从样品池的侧壁进入,照射微粒,由于拓扑绝缘体衬底平板破坏了微粒周围的玻印亭矢量对称分布,使微粒上的总玻印亭矢量不为零,产生非梯度光学力;然后,通过改变拓扑绝缘体衬底平板中拓扑绝缘体的量子态,改变拓扑绝缘体衬底平板上方微粒表面的总玻印亭矢量分布,进而改变总玻印亭矢量作用在微粒上的非梯度光学力的方向和大小,来调控微粒在入射光场中的运动轨迹,从而对附着在微粒表面的纳米尺寸分子进行可调谐捕获和筛选。显微镜可以用来观测表面附有纳米尺寸分子的微粒在入射光作用下所产生的运动轨迹。所述显微镜可以采用普通荧光垂直或正置显微镜。The system of the invention consists of a light source, a microscope and an optical force display. Before the test, the topological insulator substrate plate is placed at the bottom of the sample pool filled with water or oil, and then the particles with nanometer-sized molecules on the surface are placed in the sample pool filled with water or oil, and placed on the topological insulator substrate at the same time. Above the plate, a linearly polarized plane wave light source enters from the side wall of the sample cell to irradiate the particles. Since the topological insulator substrate plate destroys the symmetrical distribution of the Poynting vectors around the particles, the total Poynting vector on the particles is not zero, resulting in Non-gradient optical force; then, by changing the quantum state of the topological insulator in the topological insulator substrate slab, changing the distribution of the total Poynting vector on the particle surface above the topological insulator substrate slab, and then changing the total Poynting vector acting on the particle The direction and magnitude of the non-gradient optical force are used to control the movement trajectory of the particle in the incident light field, so that the nanometer-sized molecules attached to the surface of the particle can be tunably captured and screened. Microscopes can be used to observe the trajectory of particles with nanometer-sized molecules attached to their surfaces under the action of incident light. The microscope can be an ordinary fluorescence vertical or upright microscope.

所述系统可以通过简单的线偏振平面光波实现对具有纳米尺寸非手性结构物体的可调谐捕获和筛选。克服了利用梯度光学力捕获和筛选纳米尺寸分子这一传统方法中所具有的入射光源复杂(即入射光必须为圆偏振或椭圆偏振)、筛选对象局限(即纳米尺寸分子必须具有手性)、由圆偏振或椭圆偏振光产生的梯度光学力不可调谐、以及难以捕获纳米尺寸分子等问题,具有系统简单、操作方便、超灵敏、超快速、主动调谐等优点,可用于生物,医学以及纳米操控等领域。The system can realize tunable trapping and screening of objects with nanometer-sized achiral structures through simple linearly polarized plane light waves. It overcomes the complexity of the incident light source (that is, the incident light must be circularly polarized or elliptically polarized), the limitation of the screening object (that is, the nanoscale molecule must have chirality), The gradient optical force generated by circularly polarized or elliptically polarized light is not tunable, and it is difficult to capture nanometer-sized molecules. It has the advantages of simple system, convenient operation, ultra-sensitivity, ultra-fast, active tuning, etc. It can be used in biology, medicine and nanomanipulation and other fields.

附图说明Description of drawings

图1为表面附有纳米尺寸分子的微粒示意图。Figure 1 is a schematic diagram of particles with nanometer-sized molecules attached to their surfaces.

图2为由线偏振光产生的非梯度光学力捕获和筛选处于拓扑绝缘体衬底平板上方的表面附有纳米尺寸分子的微粒的过程示意图。Fig. 2 is a schematic diagram of the process of trapping and screening particles with nanometer-sized molecules on the surface above the topological insulator substrate plate by non-gradient optical force generated by linearly polarized light.

图3为由线偏振光产生的非梯度光学力捕获和筛选处于拓扑绝缘体衬底平板上方的表面附有纳米尺寸分子的微粒的测试系统示意图。Fig. 3 is a schematic diagram of a test system for trapping and screening particles with nanometer-sized molecules on the surface above a topological insulator substrate plate by non-gradient optical force generated by linearly polarized light.

图中:1微粒,2纳米尺寸分子,3拓扑绝缘体衬底平板,4光源,5显微镜,6光学力显示器,7样品池,8控温器,9CCD摄像机,10监视器,11计算机,12录像机。In the figure: 1 microparticle, 2 nanometer size molecule, 3 topological insulator substrate plate, 4 light source, 5 microscope, 6 optical force display, 7 sample cell, 8 temperature controller, 9CCD camera, 10 monitor, 11 computer, 12 video recorder .

具体实施方式Detailed ways

为使得本发明的技术方案的内容更加清晰,以下结合技术方案和附图详细叙述本发明的具体实施方式。其中的材料生长技术包括:磁控溅射,电子束蒸发,金属有机化合物化学气相沉淀,气相外延生长,和分子束外延技术等常用技术。In order to make the content of the technical solution of the present invention clearer, the specific implementation manners of the present invention will be described in detail below in combination with the technical solution and the accompanying drawings. The material growth techniques include: magnetron sputtering, electron beam evaporation, chemical vapor deposition of metal-organic compounds, vapor phase epitaxy, and molecular beam epitaxy.

实施例1Example 1

首先,通过材料生长工艺产生微粒1,如附图1(a)所示。其中微粒的几何形状和尺寸可以采用有限时域差分法、有限元法等算法确定。First, particles 1 are produced through a material growth process, as shown in Fig. 1(a). The geometric shape and size of particles can be determined by finite time domain difference method, finite element method and other algorithms.

其次,在微粒1外表面附着纳米尺寸分子2,如附图1(b)所示。Secondly, nanometer-sized molecules 2 are attached to the outer surface of the particle 1, as shown in FIG. 1(b).

然后,将表面附着纳米尺寸分子2的微粒1置于拓扑绝缘体衬底平板3表面上方,距离为l(l>0),当入射光为线偏振平面波且拓扑绝缘体衬底平板3为拓扑非平庸体时,处于拓扑绝缘体衬底平板3上方的微粒1周围的玻印亭矢量为非对称分布,即微粒1上的总玻印亭矢量不为零,产生沿入射光方向指向右前方的非梯度光学力,使微粒1沿入射光方向的右前方运动,进而带动附着在微粒1表面的纳米尺寸分子2沿入射光方向的右前方运动,如附图2(a)所示。Then, the particles 1 with nanometer-sized molecules 2 attached to the surface are placed above the surface of the topological insulator substrate 3 at a distance of l (l>0). When the incident light is a linearly polarized plane wave and the topological insulator substrate 3 is topologically nontrivial When solid, the Poynting vector around the particle 1 above the topological insulator substrate plate 3 is asymmetrically distributed, that is, the total Poynting vector on the particle 1 is not zero, resulting in a non-gradient pointing to the right front along the incident light direction The optical force makes the particle 1 move along the right front of the incident light direction, and then drives the nano-sized molecules 2 attached to the surface of the particle 1 to move along the right front of the incident light direction, as shown in Figure 2(a).

之后,通过光照、通电、加热、加压和外加磁场等方式将拓扑绝缘体衬底平板3的拓扑非平庸体转化为拓扑平庸体(即拓扑绝缘体产生从拓扑非平庸到拓扑平庸的量子态变化),使微粒1表面的总玻印亭矢量方向和大小发生改变,产生沿入射光方向指向左前方的非梯度光学力,使微粒1带动附着在其表面的纳米尺寸分子2沿入射光方向的左前方运动,如附图2(b)所示。Afterwards, the topologically non-banal body of the topological insulator substrate plate 3 is converted into a topologically mediocre body by means of light, electricity, heating, pressurization, and an external magnetic field (that is, the topological insulator produces a quantum state change from topologically non-banal to topologically mediocre) , so that the direction and size of the total Poynting vector on the surface of particle 1 are changed, producing a non-gradient optical force pointing to the front left along the direction of incident light, so that particle 1 drives the nanometer-sized molecules 2 attached to its surface to the left along the direction of incident light Front movement, as shown in accompanying drawing 2 (b).

最后,通过降温、光照等方式使拓扑绝缘体衬底平板3由拓扑平庸体变回拓扑非平庸体(即拓扑绝缘体产生从拓扑平庸到拓扑非平庸的量子态变化),此时微粒1受到的非梯度光学力又变回了沿入射光方向指向右前方的非梯度光学力,微粒1带动纳米尺寸分子2沿入射光方向的右前方运动,如附图2(c)所示。Finally, the topological insulator substrate plate 3 is changed from a topologically mediocre body to a topologically non-meaningful body by means of cooling, lighting, etc. The gradient optical force changes back to the non-gradient optical force pointing to the right front along the incident light direction, and the particle 1 drives the nanometer-sized molecule 2 to move along the right front direction of the incident light direction, as shown in Figure 2(c).

这样我们通过改变拓扑绝缘体衬底平板3中拓扑绝缘体的量子态,控制微粒1在入射光场中的运动轨迹,最终实现了对附着在微粒1表面的纳米尺寸分子2的可调谐捕获和筛选。In this way, by changing the quantum state of the topological insulator in the topological insulator substrate plate 3, we control the trajectory of the particle 1 in the incident light field, and finally realize the tunable capture and screening of the nanometer-sized molecules 2 attached to the surface of the particle 1.

本发明系统主要由光源4、显微镜5和光学力显示器6构成。测试前先将拓扑绝缘体衬底平板3置于装有水或油的样品池7的底部,然后将表面附着纳米尺寸分子2的微粒1置于样品池7内,且置于拓扑绝缘体衬底平板3上方。光源4产生线偏振平面波从样品池7的侧壁进入,水平照射微粒1,实现对表面附着纳米尺寸分子2的微粒1的抓获和操纵。显微镜5可以用来观测微表面附着纳米尺寸分子2的微粒1在入射光作用下所产生的运动轨迹。线偏振平面波在表面附着纳米尺寸分子2的微粒1产生的非梯度光学力由光学力显示器6测得。本发明系统同时还包括控温器8、CCD摄像机9、监视器10、计算机11、和录像机12等(附图3所示)。利用CCD摄像机9对线偏振平面波照射下的表面附着纳米尺寸分子2的微粒1进行实时监测,并将所得的视频信号在显示器显示。录像机12可以用来记录图像。样品池7与控温器8相连,拓扑绝缘体衬底平板3中的拓扑绝缘体的量子态随样品池7的温度变化而改变。计算机11可以存储显微镜5所采集的视场信息。The system of the present invention is mainly composed of a light source 4 , a microscope 5 and an optical force display 6 . Before the test, the topological insulator substrate plate 3 is placed at the bottom of the sample pool 7 filled with water or oil, and then the particles 1 with nanometer-sized molecules 2 attached to the surface are placed in the sample pool 7 and placed on the topological insulator substrate plate 3 above. The light source 4 generates a linearly polarized plane wave that enters from the side wall of the sample cell 7 and irradiates the particle 1 horizontally, so as to capture and manipulate the particle 1 attached to the surface of the nanometer-sized molecule 2 . The microscope 5 can be used to observe the trajectory of the microparticles 1 attached to the nanometer-sized molecules 2 on the microsurface under the action of incident light. The non-gradient optical force produced by the linearly polarized plane wave attached to the surface of the particle 1 with nanometer-sized molecules 2 is measured by the optical force display 6 . The system of the present invention also includes temperature controller 8, CCD camera 9, monitor 10, computer 11, and video recorder 12 etc. (shown in accompanying drawing 3) simultaneously. The CCD camera 9 is used for real-time monitoring of the particles 1 with nanometer-sized molecules 2 attached to the surface irradiated by the linearly polarized plane wave, and the obtained video signal is displayed on the monitor. Video recorder 12 may be used to record images. The sample pool 7 is connected to the temperature controller 8 , and the quantum state of the topological insulator in the topological insulator substrate plate 3 changes with the temperature of the sample pool 7 . The computer 11 can store the field of view information collected by the microscope 5 .

以上所述是本发明应用的技术原理和具体实例,依据本发明的构想所做的等效变换,只要其所运用的方案仍未超出说明书和附图所涵盖的精神时,均应在本发明的范围内,特此说明。The above are the technical principles and specific examples of the application of the present invention. The equivalent transformation done according to the concept of the present invention, as long as the scheme used does not exceed the spirit covered by the description and drawings, shall be included in the present invention. Within the scope, it is hereby explained.

Claims (8)

1. a plane of linear polarization light wave is to the tunable method of catching and screening being in topological insulator types of flexure particulate, it is characterized in that, particulate is placed in above topological insulator substrate flat board, the Poynting vector that this topological insulator substrate flat board destroys around particulate is symmetrical, make the total Poynting vector on particulate non-vanishing, produce non-gradient optical force, by changing the quantum state of topological insulator substrate flat board, change the total Poynting vector distribution on particulate, and then change direction and the size that total Poynting vector acts on the non-gradient optical force on particulate, regulate and control the movement locus of particulate in incident field, thus carry out tunablely catching and screening to the nanometer-size molecular being attached to microparticle surfaces, wherein, particulate is placed in above topological insulator substrate flat board, microparticle material can be medium or metal, the length of topological insulator substrate, wide, high in 10 nanometers to 10 meters, the distance of particulate and topological insulator substrate planar surface is l, l>0, the profile of particulate is surface geometry body or polyhedron, and volume is at 1 cubic nanometer to 1000 cu μ m.
2. method according to claim 1, is characterized in that, incident light is plane of linear polarization ripple; It is dull and stereotyped that incident light beam strikes direction is parallel to topological insulator substrate, and frequency range is 0.3 micron ~ 20 microns, and power bracket is 0.1mW/ μm 2~ 10mW/ μm 2.
3. method according to claim 1 and 2, is characterized in that, the light source of incident light adopts Wavelength tunable laser, semiconductor continuously or quasi-continuous lasing or light emitting diode.
4. method according to claim 3, is characterized in that, microparticle material is metal or medium, and wherein, metal is Al, Ag, Au, Cu, Ni, Pt, and medium is Si, SiO 2, GaAs, InP, Al 2o 3in one or polymkeric substance.
5. method according to claim 4, is characterized in that, topological insulator is Bi xsb 1-x, HgTe, Bi 2te 3, Bi 2se 3or Sb 2te 3.
6. the method according to claim 1 or 2 or 4 or 5, it is characterized in that, nanometer-size molecular has achirality structure or chiral structure.
7. the method according to claim 1 or 2 or 4 or 5, it is characterized in that, topological insulator is realized by Material growth technique, comprises magnetron sputtering, electron beam evaporation, metal organic compound chemical gaseous phase deposition, vapor phase epitaxial growth, molecular beam epitaxy.
8. the method according to claim 1 or 2 or 4 or 5, is characterized in that, realizes topological insulator from the non-mediocrity of topology to the reversible quantum phase transitions of topology mediocrity by modes such as illumination, energising, heating, pressurization and externally-applied magnetic fields.
CN201510429872.4A 2015-07-21 2015-07-21 Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave Active CN105116534B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510429872.4A CN105116534B (en) 2015-07-21 2015-07-21 Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510429872.4A CN105116534B (en) 2015-07-21 2015-07-21 Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave

Publications (2)

Publication Number Publication Date
CN105116534A true CN105116534A (en) 2015-12-02
CN105116534B CN105116534B (en) 2017-05-03

Family

ID=54664560

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510429872.4A Active CN105116534B (en) 2015-07-21 2015-07-21 Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave

Country Status (1)

Country Link
CN (1) CN105116534B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519565A (en) * 2018-04-09 2018-09-11 四川大学 Weak magnetic field strength measurement analyzer and method based on quantum weak measurement
CN110707179A (en) * 2019-10-18 2020-01-17 福州大学 Method for regulating and controlling circularly polarized light induced current of tellurium antimonide film

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050147373A1 (en) * 2003-12-24 2005-07-07 Yuegang Zhang Controlling carbon nanotubes using optical traps
WO2009085772A2 (en) * 2007-12-20 2009-07-09 The Regents Of The University Of California Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatus
CN102745643A (en) * 2011-04-19 2012-10-24 金石琦 Laser tweezers device
CN103676126A (en) * 2013-12-20 2014-03-26 同济大学 Operation instrument for optical tweezers
CN103885119A (en) * 2014-03-20 2014-06-25 河海大学常州校区 Method for manufacturing tunable photonic crystal and tunable photonic crystal
CN203773151U (en) * 2014-04-21 2014-08-13 黑龙江大学 S wave plate-based femtosecond laser optical tweezers manipulation device
RU2550990C1 (en) * 2013-12-09 2015-05-20 Государственное Научное Учреждение "Институт Физики Имени Б.И. Степанова Национальной Академии Наук Беларуси" Method for optical capturing of particle in soft biological tissue

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050147373A1 (en) * 2003-12-24 2005-07-07 Yuegang Zhang Controlling carbon nanotubes using optical traps
WO2009085772A2 (en) * 2007-12-20 2009-07-09 The Regents Of The University Of California Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatus
CN102745643A (en) * 2011-04-19 2012-10-24 金石琦 Laser tweezers device
RU2550990C1 (en) * 2013-12-09 2015-05-20 Государственное Научное Учреждение "Институт Физики Имени Б.И. Степанова Национальной Академии Наук Беларуси" Method for optical capturing of particle in soft biological tissue
CN103676126A (en) * 2013-12-20 2014-03-26 同济大学 Operation instrument for optical tweezers
CN103885119A (en) * 2014-03-20 2014-06-25 河海大学常州校区 Method for manufacturing tunable photonic crystal and tunable photonic crystal
CN203773151U (en) * 2014-04-21 2014-08-13 黑龙江大学 S wave plate-based femtosecond laser optical tweezers manipulation device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
LI XUE-CONG ET AL.: "Improvement of the axial trapping effect using azimuthally polarised trapping beam", 《CHINESE PHYSICS B》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519565A (en) * 2018-04-09 2018-09-11 四川大学 Weak magnetic field strength measurement analyzer and method based on quantum weak measurement
CN108519565B (en) * 2018-04-09 2021-01-22 四川大学 Weak magnetic field strength measurement analyzer and method based on quantum weak measurement
CN110707179A (en) * 2019-10-18 2020-01-17 福州大学 Method for regulating and controlling circularly polarized light induced current of tellurium antimonide film
CN110707179B (en) * 2019-10-18 2022-03-22 福州大学 Method for regulating and controlling circularly polarized light induced current of antimony telluride film

Also Published As

Publication number Publication date
CN105116534B (en) 2017-05-03

Similar Documents

Publication Publication Date Title
Duan et al. Nanoplasmonics: classical down to the nanometer scale
He et al. Electrically driven optical antennas based on template dielectrophoretic trapping
Marino et al. Simultaneous photonic and excitonic coupling in spherical quantum dot supercrystals
Masuhara et al. Optical force-induced chemistry at solution surfaces
CN105137586B (en) Tunable Trapping and Screening of Particles Over Graphene Substrates by Linearly Polarized Plane Lightwaves
CN105116534B (en) Method for capturing and screening particle above topological insulator substrate in tunable manner through linearly-polarized planar optical wave
Pin et al. Seven at one blow: Particle cluster stability in a single plasmonic trap on a silicon waveguide
WO2007079411A2 (en) Alignment, transportation and integration of nanowires using optical trapping
Li et al. Routing the Exciton Emissions of WS2 Monolayer with the High-Order Plasmon Modes of Ag Nanorods
CN105116535B (en) Method for tunable capture and screening of graphene coated particles above substrate by linear polarization plane light waves
CN105137587B (en) Method for Generating Tunable Nongradient Optical Forces on Graphene-Wrapped Microparticles with Linearly Polarized Nonplanar Light Waves
CN105182521A (en) Method for tunably capturing and screening topological insulator particles above substrate through utilizing linearly polarized planar light waves
Hossain et al. Anisotropic gold nanoassembly: a study on polarization-dependent and polarization-selective surface-enhanced Raman scattering
CN105118541B (en) Tunable capturing and screening method of linear polarization planar optical waves for particle located above chalcogenide substrate
CN105182517B (en) Tunable Trapping and Screening of Chalcogenide Particles Above Substrates by Linearly Polarized Plane Lightwaves
CN105182518B (en) Method for tunable capture and screening of particles above vanadium dioxide substrate by linear polarization plane light waves
CN105116538B (en) Method for generating tunable non-gradient optical force on surface of graphene thin-layer coated particle by oblique incident light
CN105068237B (en) Method for generating tunable non-gradient optical force on chalcogenide metal multilayer core-shell surface by oblique incident light
CN105182516B (en) Method for tunable capture and screening of particles above liquid crystal material substrate by linearly polarized planar light waves
CN105116531B (en) Generating tunable non-gradient optical forces on topologically insulating metallic multilayer core-shell surfaces with linearly polarized non-planar light waves
Meuret et al. Photon-Induced Near-Field Electron Microscopy of Nanostructured Metallic Films and Membranes
CN105182520B (en) Method for generating tunable non-gradient optical force on surface of topological insulator metal multilayer core-shell by oblique incident light
CN105137585B (en) Method for Generating Tunable Nongradient Optical Forces on Chalcogenide Metal Multilayer Core-Shell Surfaces with Linearly Polarized Nonplanar Lightwaves
CN105182519A (en) Method for tunably capturing and screening vanadium dioxide particles above substrate through utilizing linearly polarized planar light waves
Zeng et al. Optical patterning fullerene nanostructures with high purity and high surface quality

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant