CN105088191B - The fluid control features structure of CVD chambers - Google Patents
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- 239000012530 fluid Substances 0.000 title claims abstract description 70
- 238000000034 method Methods 0.000 claims abstract description 130
- 238000009826 distribution Methods 0.000 claims abstract description 41
- 230000008569 process Effects 0.000 claims description 126
- 238000004891 communication Methods 0.000 claims description 8
- 238000000429 assembly Methods 0.000 abstract description 2
- 230000000712 assembly Effects 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 153
- 210000002381 plasma Anatomy 0.000 description 59
- 239000000758 substrate Substances 0.000 description 41
- 239000002243 precursor Substances 0.000 description 35
- 238000000151 deposition Methods 0.000 description 16
- 238000012545 processing Methods 0.000 description 14
- 230000008021 deposition Effects 0.000 description 13
- 238000006243 chemical reaction Methods 0.000 description 11
- 230000009969 flowable effect Effects 0.000 description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 239000003989 dielectric material Substances 0.000 description 9
- 230000002093 peripheral effect Effects 0.000 description 9
- 229910052710 silicon Inorganic materials 0.000 description 9
- 239000010703 silicon Substances 0.000 description 9
- 229910052581 Si3N4 Inorganic materials 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 239000000203 mixture Substances 0.000 description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 8
- 238000002156 mixing Methods 0.000 description 7
- 230000009977 dual effect Effects 0.000 description 6
- 238000001816 cooling Methods 0.000 description 5
- 230000007704 transition Effects 0.000 description 5
- 235000014443 Pyrus communis Nutrition 0.000 description 4
- 238000000137 annealing Methods 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 238000005086 pumping Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- WZJUBBHODHNQPW-UHFFFAOYSA-N 2,4,6,8-tetramethyl-1,3,5,7,2$l^{3},4$l^{3},6$l^{3},8$l^{3}-tetraoxatetrasilocane Chemical compound C[Si]1O[Si](C)O[Si](C)O[Si](C)O1 WZJUBBHODHNQPW-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000001723 curing Methods 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- HMMGMWAXVFQUOA-UHFFFAOYSA-N octamethylcyclotetrasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 HMMGMWAXVFQUOA-UHFFFAOYSA-N 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- -1 tetramethyldiethoxydisiloxane alkane Chemical class 0.000 description 2
- UHUUYVZLXJHWDV-UHFFFAOYSA-N trimethyl(methylsilyloxy)silane Chemical compound C[SiH2]O[Si](C)(C)C UHUUYVZLXJHWDV-UHFFFAOYSA-N 0.000 description 2
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 235000011114 ammonium hydroxide Nutrition 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 239000012809 cooling fluid Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- UBHZUDXTHNMNLD-UHFFFAOYSA-N dimethylsilane Chemical compound C[SiH2]C UBHZUDXTHNMNLD-UHFFFAOYSA-N 0.000 description 1
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- UIUXUFNYAYAMOE-UHFFFAOYSA-N methylsilane Chemical compound [SiH3]C UIUXUFNYAYAMOE-UHFFFAOYSA-N 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 1
- PQDJYEQOELDLCP-UHFFFAOYSA-N trimethylsilane Chemical compound C[SiH](C)C PQDJYEQOELDLCP-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8593—Systems
- Y10T137/85938—Non-valved flow dividers
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Abstract
本发明涉及一种CVD腔室的流体控制特征结构。本发明提供用于气体散布组件的设备与方法。在一方面中,提供一种气体散布组件,其包含:环形本体,其包含:环形圈,其具有内环形壁、外壁、上表面与底表面;上凹部,其形成到该上表面内;及座部,其形成到该内环形壁内;上板,其设置在该上凹部中且包含:盘形本体,其具有多个形成为从其中通过的第一穿孔;及底板,其设置在该座部上且包含:盘形本体,其具有多个形成为从其中通过的第二穿孔,这些第二穿孔和这些第一穿孔对准;及多个第三穿孔,其形成在这些第二穿孔之间且通过该底板,该底板密封地连接到该上板以将该多个第一、第二穿孔与该多个第三穿孔流体地隔离。
The present invention relates to a fluid control feature for a CVD chamber. The present invention provides apparatus and methods for gas distribution assemblies. In one aspect, there is provided a gas distribution assembly comprising: an annular body comprising: an annular ring having an inner annular wall, an outer wall, an upper surface and a bottom surface; an upper recess formed into the upper surface; and a seat formed into the inner annular wall; an upper plate disposed in the upper recess and comprising: a disc-shaped body having a plurality of first perforations formed therethrough; and a bottom plate disposed in the upper recess on the seat and comprising: a disc-shaped body having a plurality of second through-holes formed therethrough, the second through-holes being aligned with the first through-holes; and a plurality of third through-holes formed in the second through-holes Between and through the bottom plate, the bottom plate is sealingly connected to the upper plate to fluidly isolate the plurality of first and second through-holes from the plurality of third through-holes.
Description
技术领域technical field
本发明是关于用以处理基材(诸如半导体基材)的设备,并且特别是关于用以于基材上方散布过程流体的设备。The present invention relates to apparatus for processing substrates, such as semiconductor substrates, and more particularly to apparatus for distributing process fluids over substrates.
背景技术Background technique
半导体过程系统大致上包括过程腔室,过程腔室具有载座用以支撑腔室内邻近过程区域的基材(诸如半导体基材)。腔室形成了真空容室,其部分地界定了过程区域。气体散布组件或喷头提供一或多种过程气体到过程区域。接着,这些气体被加热与(或)能量化以形成等离子体,等离子体在基材上执行特定过程。这些过程可包括沉积过程(诸如化学气相沉积(CVD))以于基材上沉积材料,或蚀刻反应以从基材移除材料,或其它过程。Semiconductor process systems generally include a process chamber having a susceptor for supporting a substrate, such as a semiconductor substrate, adjacent a process area within the chamber. The chamber forms a vacuum volume that partially defines the process area. A gas distribution assembly or showerhead provides one or more process gases to the process area. These gases are then heated and/or energized to form a plasma, which performs a specific process on the substrate. These processes may include deposition processes such as chemical vapor deposition (CVD) to deposit material on the substrate, or etching reactions to remove material from the substrate, or other processes.
在需要多种气体的过程中,这些气体可在混合腔室内结合,该混合腔室进而经由导管连接到气体散布组件。举例而言,在传统的热CVD过程中,两种过程气体并同两种相应的载气被供应到混合腔室,其在该混合腔室处被结合以形成气体混合物。气体混合物可直接地被引进到腔室,或行经腔室的上部内的导管到散布组件。散布组件大致上包括具有多个孔的板,以致气体混合物均匀地被散布到基材上方的过程区域内。在另一示例中,两种气体分别地通过散布组件,并被容许在抵达过程区域与(或)基材之前结合。随着气体混合物进入过程区域且被注入热能,在这些过程气体之间会发生化学反应,致使了在基材上的化学气相沉积反应。In processes requiring multiple gases, these gases may be combined in a mixing chamber which in turn is connected to the gas distribution assembly via conduits. For example, in a conventional thermal CVD process, two process gases, together with two corresponding carrier gases, are supplied to a mixing chamber where they are combined to form a gas mixture. The gas mixture can be introduced directly into the chamber, or run through a conduit in the upper part of the chamber to the dispersion assembly. The distribution assembly generally includes a plate with a plurality of holes so that the gas mixture is evenly distributed into the process area above the substrate. In another example, the two gases pass through the distribution assembly separately and are allowed to combine before reaching the process area and/or substrate. As the gas mixture enters the process area and is injected with thermal energy, a chemical reaction occurs between these process gases resulting in a chemical vapor deposition reaction on the substrate.
尽管在释放到过程区域内之前混合多种气体以例如确保这些组成气体均匀地被散布到过程区域内是大致上有益的,这些气体倾向于在混合腔室或散布板内开始还原或反应。所以,在气体混合物抵达过程区域之前,会造成蚀刻腔室、导管、散布板与其它腔室部件上的沉积或其蚀刻。此外,反应副产物会在腔室气体输送部件中或在散布板的内表面上累积,因此产生与(或)增加了不希望的微粒的存在。Although it is generally beneficial to mix the gases prior to release into the process area, eg, to ensure that the constituent gases are evenly dispersed into the process area, these gases tend to start reducing or reacting within the mixing chamber or distribution plate. Therefore, before the gas mixture reaches the process area, deposition or etching on etch chambers, conduits, diffuser plates and other chamber components can result. In addition, reaction by-products can build up in the chamber gas delivery components or on the interior surfaces of the distribution plate, thereby creating and/or increasing the presence of undesirable particulates.
当气体被释放到过程区域内时,气体的温度控制是有益的,以用来控制气体的活性。举例而言,冷却这些气体有助于在释放到过程区域内之前控制不希望的反应。可避免这些气体反应,直到其接触了经加热的基材。在其它情况中,这些气体的加热是有必要的。举例而言,热气体净化或清洁有助于从过程腔室移除污染物。因此,将温度控制方面结合到气体散布板是有用的。Temperature control of the gas is beneficial to control the reactivity of the gas as it is released into the process area. For example, cooling these gases helps control undesired reactions before they are released into the process area. These gases are prevented from reacting until they contact the heated substrate. In other cases, heating of these gases is necessary. For example, hot gas purge or cleaning helps remove contaminants from process chambers. Therefore, it is useful to incorporate a temperature control aspect into the gas distribution plate.
所以,持续存在对气体散布装置的需求,其中该气体散布装置输送至少两种气体到过程区域内而不会在这些气体抵达过程区域之前发生混合。Therefore, there continues to be a need for a gas distribution device that delivers at least two gases into a process area without mixing before the gases reach the process area.
发明内容Contents of the invention
本文描述的方面是关于一种用以输送过程流体(诸如气体)到过程腔室以为了在基材上沉积膜或以为了其它过程的设备。在一方面中,提供一种气体散布组件,其包含:第一歧管,其具有形成为通过其间的多个第一穿孔以用于供第一流体通过,并且该第一歧管界定用于第二流体的流动路径;及第二歧管,其顶侧连接到该第一歧管且将该流动路径和该第一流体隔离,并且该第二歧管具有多个第二穿孔与多个第三穿孔,各个第二穿孔连接到这些第一穿孔的一个,该多个第三穿孔流体连接到该流动路径。Aspects described herein relate to an apparatus for delivering a process fluid, such as a gas, to a process chamber for depositing a film on a substrate or for other processes. In one aspect, there is provided a gas distribution assembly comprising: a first manifold having a plurality of first perforations formed therethrough for passage of a first fluid, and the first manifold defines a A flow path for a second fluid; and a second manifold, the top side of which is connected to the first manifold and isolates the flow path from the first fluid, and the second manifold has a plurality of second perforations and a plurality of A third perforation, each second perforation connected to one of the first perforations, the plurality of third perforations fluidly connected to the flow path.
在另一方面中,提供气体散布组件,其包含:上歧管,包含:多个第一穿孔,其形成为同心地绕着该上歧管的中心部而设置的多个第一径向列,及多个第二穿孔,其同心地绕着该多个第一穿孔而设置且形成为多个第二径向列;中心歧管,其连接到该上歧管且包含:第一开口组,其同心地绕着该中心歧管的中心部而设置,及第二开口组,其同心地绕着该第一开口组而设置;及底歧管,其连接到该中心歧管且包含:第三开口组,其同心地绕着该底歧管的中心部而设置,第四开口组,其同心地绕着该第三开口组而设置,多个第一气体信道,其设置在该底歧管的上侧的第四开口的每个之间,及信道网络,其同心地绕着该第四开口组而设置且流体连接到第一气体信道的一或多个。In another aspect, a gas distribution assembly is provided comprising: an upper manifold comprising: a plurality of first perforations formed as a plurality of first radial rows concentrically disposed about a central portion of the upper manifold , and a plurality of second perforations disposed concentrically around the first plurality of perforations and formed in a plurality of second radial rows; a central manifold connected to the upper manifold and comprising: a first set of openings , which is concentrically disposed about the central portion of the central manifold, and a second set of openings, which is concentrically disposed about the first set of openings; and a bottom manifold, which is connected to the central manifold and comprises: A third group of openings is concentrically disposed around the central portion of the bottom manifold, a fourth group of openings is concentrically disposed around the third group of openings, a plurality of first gas channels are disposed on the bottom Between each of the fourth openings on the upper side of the manifold, and a network of channels disposed concentrically around the set of fourth openings and fluidly connected to one or more of the first gas channels.
附图说明Description of drawings
然而要指出的是,附图仅说明本发明的典型实施例,因此不应被视为其范围的限制,本发明也适用于其它具有同等功效的实施例。即使如此,可通过考虑以下详细说明和附图而轻易地了解本发明的启示,其中:It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments. Even so, the teachings of the present invention can be readily appreciated by considering the following detailed description and accompanying drawings, in which:
图1为过程工具的一个实施例的俯视图;Figure 1 is a top view of one embodiment of a process tool;
图2A-2C为过程腔室的一个实施例的示意剖视图;2A-2C are schematic cross-sectional views of one embodiment of a process chamber;
图3A-3M为本文描述的气体散布组件的一个实施例的示意图;3A-3M are schematic diagrams of one embodiment of a gas distribution assembly described herein;
图4A-4I为本文描述的气体散布组件的一个实施例的示意图;4A-4I are schematic illustrations of one embodiment of a gas distribution assembly described herein;
图5A-5F为本文描述的气体散布组件的一个实施例的示意图。5A-5F are schematic illustrations of one embodiment of a gas distribution assembly described herein.
为了便于理解,已经在可能的情况下,使用相同的组件符号指示各图中相同的组件。意即,在个实施例中所揭示的组件也可有利地用于其它实施例而无需特别指明。For ease of understanding, the same reference numerals have been used, where possible, to designate the same components in the various figures. That is, components disclosed in one embodiment can also be beneficially used in other embodiments without specific specification.
具体实施方式Detailed ways
本文描述的方面是关于一种用以输送过程流体到过程腔室以为了在基材上沉积膜或以为了其它过程的设备。Aspects described herein relate to an apparatus for delivering a process fluid to a process chamber for depositing a film on a substrate or for other processes.
图1为根据所揭示实施例的具有沉积、烘烤与硬化腔室的过程工具100的实施例的俯视图。在图中,一对FOUP(前开式结合舱(front opening unified pods))102供应基材(例如300mm直径基材),这些基材在被放置到串联过程腔室109a-c的基材处理部108a-f中的一个之前被机械臂104接收且被放置在下腔室固持区域106内。可使用第二机械臂110来从固持区域106传送基材到过程腔室108a-f并返回。FIG. 1 is a top view of an embodiment of a process tool 100 having deposition, baking and curing chambers in accordance with disclosed embodiments. In the figure, a pair of FOUPs (front opening unified pods) 102 supply substrates (e.g. 300mm diameter substrates) which are processed in substrates placed into series process chambers 109a-c One of the sections 108a - f was previously received by the robotic arm 104 and placed within the lower chamber holding area 106 . The second robotic arm 110 may be used to transfer the substrate from the holding area 106 to the process chambers 108a-f and back.
串联过程腔室109a-c的基材处理部108a-f可包括用以沉积、退火、硬化与(或)蚀刻基材上的可流动电介膜的一或多个系统部件。在一种结构中,可使用过程腔室的两对串联处理部(例如108c-d与108e-f)来在基材上沉积可流动电介材料,并且可使用第三对串联处理部(例如108a-b)来退火经沉积的电介质。在另一结构中,该过程腔室的两对串联处理部(例如108c-d与108e-f)可设以沉积且退火基材上的可流动电介膜,而该第三对串联处理部(例如108a-b)可用于经沉积的膜的UV或电子束硬化。在又另一结构中,所有的三对串联处理部(例如108a-f)可设以沉积且硬化基材上的可流动电介膜。The substrate processing sections 108a-f of the series process chambers 109a-c may include one or more system components for depositing, annealing, curing, and/or etching flowable dielectric films on substrates. In one configuration, two pairs of in-line processing sections of a process chamber (eg, 108c-d and 108e-f) may be used to deposit flowable dielectric material on a substrate, and a third pair of in-line processing sections (eg, 108a-b) to anneal the deposited dielectric. In another configuration, two pairs of in-line processing sections of the process chamber (eg, 108c-d and 108e-f) may be configured to deposit and anneal flowable dielectric films on substrates, while the third pair of in-line processing sections (eg 108a-b) can be used for UV or e-beam hardening of the deposited film. In yet another configuration, all three pairs of serial processing sections (eg, 108a-f) may be configured to deposit and harden a flowable dielectric film on a substrate.
在又另一结构中,两对串联处理部(例如108c-d与108e-f)可用于可流动电介质的沉积与UV或电子束硬化,而第三对串联处理部(例如108a-b)可用于退火电介膜。可了解,系统100包括用于可流动界面膜的沉积、退火与硬化腔室的额外结构。In yet another configuration, two pairs of serial processing sections (eg, 108c-d and 108e-f) can be used for deposition and UV or electron beam hardening of flowable dielectrics, while a third pair of serial processing sections (eg, 108a-b) can be used for annealing the dielectric film. It will be appreciated that system 100 includes additional structures for deposition, annealing and hardening chambers for flowable interfacial films.
此外,一或多个串联处理部108a-f可设以作为湿式处理腔室。这些过程腔室包括在包括湿气的氛围中加热可流动电介膜。因此,系统100的实施例可包括湿式处理串联处理部108a-b与退火串联处理部108c-d,以在经沉积的电介膜上执行湿式与干式退火。Additionally, one or more in-line processing sections 108a-f may be configured as wet processing chambers. These process chambers include heating the flowable dielectric film in an atmosphere that includes moisture. Accordingly, embodiments of the system 100 may include wet processing tandem processing sections 108a-b and annealing tandem processing sections 108c-d to perform wet and dry anneals on the deposited dielectric film.
图2A是串联过程腔室内的具有多个分隔的等离子体产生区域的过程腔室部200的实施例的剖视图。在膜沉积(氧化硅、氮化硅、氮氧化硅或碳氧化硅)的期间,过程气体可经由气体入口组件205流动到第一等离子体区域215内。过程气体在进入第一等离子体区域215之前可在远程等离子体系统(remote plasma system,RPS)201内被激发。根据所揭示实施例,示出盖212、喷头225与基材支撑件265,基材255设置在基材支撑件265上。盖212可以是金字塔形、圆锥形、或其具有窄的顶部扩张到宽的底部的他类似结构。盖212被示出成具有施加的AC电压源,且喷头接地,和第一等离子体区域215中的等离子体产生一致。绝缘环220定位在盖212与喷头225之间,使得电容式耦合等离子体(capacitively coupledplasma,CCP)形成在第一等离子体区域中。2A is a cross-sectional view of an embodiment of a process chamber portion 200 having multiple separate plasma generation regions within a tandem process chamber. During film deposition (silicon oxide, silicon nitride, silicon oxynitride, or silicon oxycarbide), process gases may flow through the gas inlet assembly 205 into the first plasma region 215 . The process gas may be excited within a remote plasma system (RPS) 201 before entering the first plasma region 215 . Cap 212, showerhead 225, and substrate support 265 on which substrate 255 is disposed are shown, according to the disclosed embodiment. Cap 212 may be pyramidal, conical, or other similar structure having a narrow top flared to a wide base. Cover 212 is shown with an AC voltage source applied, and showerhead grounded, consistent with plasma generation in first plasma region 215 . The insulating ring 220 is positioned between the cap 212 and the showerhead 225 such that a capacitively coupled plasma (CCP) is formed in the first plasma region.
根据所揭示实施例,盖212可以是用于过程腔室的双源盖。流体入口组件205将流体(诸如气体)引进到第一等离子体区域215内。在流体入口组件205内可见到两个不同的流体供应信道。第一信道202携载通过远程等离子体系统RPS 201的流体(诸如气体),而第二信道204具有绕过RPS201的流体(诸如气体)。在所揭示实施例中,第一信道202可用于过程气体,并且第二信道204可用于处理气体。这些气体可流动到等离子体区域215内,并且被挡件206分散。图上显示在盖212与喷头225之间有绝缘环220,其容许AC电位相对于喷头225被施加到盖212。According to disclosed embodiments, cover 212 may be a dual source cover for a process chamber. Fluid inlet assembly 205 introduces a fluid, such as a gas, into first plasma region 215 . Two distinct fluid supply channels can be seen within fluid inlet assembly 205 . A first channel 202 carries a fluid (such as a gas) through the remote plasma system RPS 201 , while a second channel 204 has a fluid (such as a gas) that bypasses the RPS 201 . In the disclosed embodiment, the first channel 202 may be used for process gas and the second channel 204 may be used for process gas. These gases may flow into the plasma region 215 and be dispersed by the baffle 206 . It is shown that there is an insulating ring 220 between the cap 212 and the showerhead 225 which allows an AC potential to be applied to the cap 212 relative to the showerhead 225 .
流体(诸如前驱物,例如含硅前驱物)可通过本文描述的喷头的实施例流动到第二等离子体区域内。从等离子体区域215中的过程气体获得的激发物种行经喷头225中的穿孔,并且和从喷头流动到第二等离子体区域233内的前驱物反应。第二等离子体区域233中几乎不存在或不存在有等离子体。过程气体与前驱物的激发衍生物在基材上方的区域中且有时候在基材上结合,以在基材上形成可流动膜。随着膜生长,更近来添加的材料具有比下方材料更高的移动性(mobility)。因有机含量通过蒸发而减少,移动性降低。间隙可通过此技术被可流动膜填充,而不会在完成了沉积之后在膜内留下传统的有机含量密度。仍可使用硬化步骤来从经沉积的膜进一步减少或移除有机含量。Fluids, such as precursors, eg, silicon-containing precursors, may flow through embodiments of the showerhead described herein into the second plasma region. The excited species obtained from the process gas in the plasma region 215 travels through the perforations in the showerhead 225 and reacts with the precursors flowing from the showerhead into the second plasma region 233 . Little or no plasma exists in the second plasma region 233 . The process gas and the excited derivatives of the precursors combine in the region above and sometimes on the substrate to form a flowable film on the substrate. As the film grows, more recently added material has higher mobility than underlying material. Reduced mobility due to reduction of organic content by evaporation. Gaps can be filled by this technique with flowable films without leaving conventional organic content densities in the film after deposition is complete. A hardening step can still be used to further reduce or remove the organic content from the deposited film.
直接地在第一等离子体区域215中激发过程气体、在远程等离子体系统(RPS)中激发过程气体、或上述两者可提供一些优点。由于第一等离子体区域215中的等离子体,从过程气体引致的激发物种的浓度可在第二等离子体区域233内被增加。此增加可能因为第一等离子体区域215中的等离子体的位置。第二等离子体区域233比远程等离子体系统(RPS)201更靠近第一等离子体区域215,通过与其它气体分子、腔室壁与喷头表面的碰撞,使得激发物种远离激发状态的时间更少。Exciting the process gas directly in the first plasma region 215, in a remote plasma system (RPS), or both may provide some advantages. The concentration of excited species induced from the process gas may be increased in the second plasma region 233 due to the plasma in the first plasma region 215 . This increase may be due to the location of the plasma in the first plasma region 215 . The second plasma region 233 is closer to the first plasma region 215 than the remote plasma system (RPS) 201 , so that excited species spend less time away from the excited state through collisions with other gas molecules, chamber walls, and showerhead surfaces.
从过程气体引致的激发物种的浓度的均匀性也可在第二等离子体区域233内被增加。这可能因为第一等离子体区域215的形状(其更类似于第二等离子体区域233的形状)。远程等离子体系统(RPS)201中产生的激发物种行进更远的距离,用于相对于从靠近喷头225的中心处的穿孔通过的物种,而从靠近喷头225的边缘处的穿孔通过。更远的距离造成了减少的激发物种的激发,并且例如可造成在靠近基材的边缘处的更慢的生长速率。在第一等离子体区域215中激发过程气体会减轻此变化。The uniformity of the concentration of excited species induced from the process gas may also be increased within the second plasma region 233 . This may be due to the shape of the first plasma region 215 (which is more similar to the shape of the second plasma region 233). Excited species generated in remote plasma system (RPS) 201 travel a greater distance for passing through perforations near the edge of showerhead 225 relative to species passing through perforations near the center of showerhead 225 . Greater distances result in reduced excitation of excited species and, for example, may result in slower growth rates near the edges of the substrate. Exciting the process gas in the first plasma region 215 mitigates this variation.
较佳地,过程气体在RPS 201中被激发且在激发状态通过喷头225到第二等离子体区域233。或者,可施加功率到第一过程区域以激发等离子体气体或增强来自RPS的已激发的过程气体。尽管可在第二等离子体区域233中产生等离子体,在过程的较佳实施例中,在第二等离子体区域中没有产生等离子体。在过程的较佳实施例中,过程气体或前驱物的激发仅来自于在RPS 201中激发过程气体以在第二等离子体区域233中和前驱物反应。Preferably, the process gas is energized in the RPS 201 and passed through the showerhead 225 to the second plasma region 233 in an energized state. Alternatively, power may be applied to the first process region to energize the plasma gas or enhance the energized process gas from the RPS. Although plasma may be generated in the second plasma region 233, in a preferred embodiment of the process, no plasma is generated in the second plasma region. In a preferred embodiment of the process, the excitation of the process gas or precursor comes only from energizing the process gas in the RPS 201 to react with the precursor in the second plasma region 233 .
过程腔室与工具更详细地被描述在2008年9月15日申请的美国专利申请案号12/210,940与2008年9月15日申请的美国专利申请案号12/210,982中,以引用方式并入本文到不会与本文的请求方面和叙述不一致的程度作为参考。Process chambers and tools are described in more detail in U.S. Patent Application Serial No. 12/210,940, filed September 15, 2008, and U.S. Patent Application Serial No. 12/210,982, filed September 15, 2008, which are incorporated by reference and This document is incorporated by reference to the extent that it is not inconsistent with the claimed aspects and narratives of this document.
图2B-2C为本文描述的过程腔室与气体散布组件中前驱物流动过程的实施例的侧视图。用于过程腔室部200的气体散布组件称为双区域喷头(dual zone showerhead,DZSH),并且在图3A-3K、图4A-4I与图5A-5F所叙述的实施例中更详细地示出。以下的气体流动叙述涉及宽广的双区域喷头叙述,并且不应被解释或解读为对本文描述的喷头方面构成限制。尽管以下叙述以电介材料的沉积描述,发明人欲说明的是此设备与方法可用以沉积其它材料。2B-2C are side views of embodiments of precursor flow processes in process chambers and gas distribution assemblies described herein. The gas distribution assembly for process chamber section 200 is referred to as a dual zone showerhead (DZSH), and is shown in more detail in the embodiments described in FIGS. 3A-3K , 4A-4I , and 5A-5F. out. The gas flow description below relates broadly to the dual zone showerhead description and should not be construed or read as limiting on the showerhead aspects described herein. Although the following description refers to the deposition of dielectric materials, the inventors intend to demonstrate that the apparatus and method can be used to deposit other materials.
在沉积过程的一个实施例中,双区域喷头容许电介材料的可流动沉积。可在过程腔室中被沉积的电介材料的示例包括氧化硅、氮化硅、碳氧化硅、或氮氧化硅。氮化硅材料包括氮化硅(SixNy)、含氢氮化硅(SixNyHz)、氮氧化硅(包括含氢氮氧化硅,SixNyHzOzz)、与含卤素氮化硅(包括氯化氮化硅,SixNyHzClzz)。经沉积的电介材料可接着被转换成类似氧化硅材料。In one embodiment of the deposition process, a dual zone showerhead allows flowable deposition of dielectric material. Examples of dielectric materials that may be deposited in the process chamber include silicon oxide, silicon nitride, silicon oxycarbide, or silicon oxynitride. Silicon nitride materials include silicon nitride ( Six N y ), hydrogen-containing silicon nitride ( Six N y H z ), silicon oxynitride (including hydrogen-containing silicon oxynitride, Six N y H z Ozz ), With halogen-containing silicon nitride (including silicon nitride chloride, Six N y H z Cl zz ). The deposited dielectric material can then be converted to a silicon oxide-like material.
电介层可通过引进电介材料前驱物且在第二等离子体区域233或反应空间中使前驱物和过程气体反应来沉积。前驱物的示例为含硅前驱物,包括硅烷、二硅烷、甲基硅烷、二甲基硅烷、三甲基硅烷、四甲基硅烷、四乙氧基硅烷(TEOS)、三乙氧基硅烷(TES)、八甲基环状四硅氧烷(OMCTS)、四甲基二硅氧烷(TMDSO)、四甲基环状四硅氧烷(TMCTS)、四甲基二乙氧基二硅氧烷(TMDDSO)、二甲基二甲氧基硅烷(DMDMS)、或上述的组合。用于氮化硅的沉积的额外前驱物包括含SixNyHz-的前驱物(诸如硅胺及其衍生物,包括三硅胺(TSA)与二硅胺(DSA))、含SixNyHzOzz-的前驱物、含SixNyHzClzz-的前驱物、或上述的组合。The dielectric layer may be deposited by introducing a dielectric material precursor and reacting the precursor with a process gas in the second plasma region 233 or reaction space. Examples of precursors are silicon-containing precursors including silane, disilane, methylsilane, dimethylsilane, trimethylsilane, tetramethylsilane, tetraethoxysilane (TEOS), triethoxysilane ( TES), octamethylcyclotetrasiloxane (OMCTS), tetramethyldisiloxane (TMDSO), tetramethylcyclotetrasiloxane (TMCTS), tetramethyldiethoxydisiloxane alkane (TMDDSO), dimethyldimethoxysilane (DMDMS), or a combination of the above. Additional precursors for the deposition of silicon nitride include SixNyHz -containing precursors such as silamine and its derivatives, including trisiliconamine (TSA) and disilamine (DSA)), Si-containing A precursor of x N y H z O zz -, a precursor containing Six N y H z Cl zz -, or a combination thereof.
过程气体包括含氢化合物、含氧化合物、含氮化合物、或上述的组合。适当气体的示例包括选自以下组中的一或多种化合物:H2、H2/N2混合物、NH3、NH4OH、O3、O2、H2O2、N2、NxHy化合物(包括N2H4)蒸气、NO、N2O、NO2、水蒸气、或上述的组合。过程气体可被等离子体激发(诸如在RPS单元中),以包括含N*与(或)H*与(或)O*的基团或等离子体,例如NH3、NH2 *、NH*、N*、H*、O*、N*O*、或上述的组合。或者,过程气体可包括本文描述的一或多种前驱物。The process gas includes hydrogen-containing compounds, oxygen-containing compounds, nitrogen-containing compounds, or combinations thereof. Examples of suitable gases include one or more compounds selected from the group consisting of: H2 , H2 / N2 mixture, NH3 , NH4OH , O3 , O2 , H2O2 , N2 , Nx H y compound (including N 2 H 4 ) vapor, NO, N 2 O, NO 2 , water vapor, or a combination of the above. The process gas can be excited by a plasma (such as in an RPS unit) to include radicals or plasmas containing N * and/or H * and/or O * , such as NH3 , NH2 * , NH * , N * , H * , O * , N * O * , or a combination of the above. Alternatively, the process gas may include one or more precursors described herein.
前驱物先由第一歧管226(或上板)与第二歧管227(或底板)被引进到界定在喷头225中的内部喷头空间294内,而被引进到反应区域内。内部喷头空间294中的前驱物经由形成在第二歧管中的穿孔296(开口)流动295到过程区域233内。此流动路径是和腔室中的其余过程气体隔离的,并且提供了前驱物处于未反应或大体上未反应状态直到其进入了界定在基材217与第二歧管227的底部之间的过程区域233。一旦前驱物位于过程区域233中,前驱物可和过程气体反应。前驱物可经由形成在喷头中的侧信道(诸如本文的喷头实施例所显示的信道490、518与(或539))而先被引进到界定在喷头225中的内部喷头空间294内。过程气体可以处于等离子体状态,包括来自RPS的基团或来自第一等离子体区域中所产生的等离子体。此外,可在第二等离子体区域中产生等离子体。The precursors are introduced into the reaction area by first introducing the first manifold 226 (or upper plate) and the second manifold 227 (or bottom plate) into the inner showerhead space 294 defined in the showerhead 225 . Precursors in the interior showerhead volume 294 flow 295 into the process region 233 via perforations 296 (openings) formed in the second manifold. This flow path is isolated from the rest of the process gas in the chamber and provides for the precursor to be in an unreacted or substantially unreacted state until it enters the process defined between the substrate 217 and the bottom of the second manifold 227 Area 233. Once the precursors are in the process region 233, the precursors may react with the process gas. The precursors may first be introduced into the interior showerhead volume 294 defined in the showerhead 225 via side channels formed in the showerhead, such as channels 490, 518, and (or 539) shown for the showerhead embodiments herein. The process gas may be in a plasma state, including radicals from the RPS or from a plasma generated in the first plasma region. In addition, plasma may be generated in the second plasma region.
过程气体可被提供到第一等离子体区域215或上方空间(其通过盖212与喷头225的顶部来界定)内。过程气体的散布可通过使用挡件206来达成,如图2A所示。过程气体可在第一等离子体区域215中被等离子体激发以制造过程气体等离子体与基团,包括含N*与(或)H*与(或)O*的基团或等离子体,例如NH3、NH2 *、NH*、N*、H*、O*、N*O*、或上述的组合。或者,过程气体可在通过远程等离子体系统的后且在被引进到第一等离子体过程区域215之前已经处于等离子体状态。The process gas may be provided into the first plasma region 215 or into the upper space bounded by the cap 212 and the top of the showerhead 225 . Dispersion of the process gas can be achieved through the use of a baffle 206, as shown in Figure 2A. The process gas may be plasma excited in the first plasma region 215 to create process gas plasmas and radicals, including radicals or plasmas containing N * and/or H * and/or O * , such as NH 3. NH2 * , NH * , N * , H * , O * , N * O * , or a combination of the above. Alternatively, the process gas may already be in a plasma state after passing through the remote plasma system and before being introduced into the first plasma process region 215 .
包括等离子体与基团的过程气体290接着经由穿孔290(诸如信道290)被输送到过程区域233用于与前驱物反应。当过程气体与前驱物皆通过喷头255时,通过信道的过程气体和内部喷头空间294物理上隔离且不会和通过内部喷头空间294的前驱物反应。一旦过程气体与前驱物位于过程空间,过程气体与前驱物可混合并反应以沉积电介材料。Process gas 290 comprising plasma and radicals is then delivered to process region 233 via perforations 290, such as channels 290, for reaction with the precursors. When both the process gas and the precursor pass through the showerhead 255 , the process gas passing through the channel is physically isolated from the inner showerhead space 294 and will not react with the precursor passing through the inner showerhead space 294 . Once the process gas and precursor are in the process volume, the process gas and precursor may mix and react to deposit the dielectric material.
除了过程气体与电介材料前驱物,可为了各种目的在各种时间点引进其它气体。可引进处理气体,例如氢、碳与氟,以从腔室壁、基材、经沉积的膜、与(或)沉积期间的膜移除不希望的物种。过程气体与(或)处理气体可包含以下组合的气体的至少一者:H2、H2/N2混合物、NH3、NH4OH、O3、O2、H2O2、N2、N2H4蒸气、NO、N2O、NO2、水蒸气、或上述的组合。处理气体可在等离子体中被激发且接着用来从经沉积的膜减少或移除残余的有机含量。在其它所揭示实施例中,可在不存在等离子体下使用处理气体。当处理气体包括水蒸气时,可使用质流计(mass flow meter,MFM)、注射阀或通过商业上可获得的水蒸气产生器来达到输送。可经由RPS单元或绕过RPS单元来引进处理气体到第一过程区域内,并且处理气体可在第一等离子体区域中进一步被激发。In addition to process gases and dielectric material precursors, other gases may be introduced at various points in time for various purposes. Process gases, such as hydrogen, carbon, and fluorine, may be introduced to remove undesired species from the chamber walls, the substrate, the deposited film, and/or the film during deposition. The process gas and/or process gas may comprise at least one of the following combinations of gases: H 2 , H 2 /N 2 mixture, NH 3 , NH 4 OH, O 3 , O 2 , H 2 O 2 , N 2 , N 2 H 4 vapor, NO, N 2 O, NO 2 , water vapor, or a combination of the above. Process gases can be excited in the plasma and then used to reduce or remove residual organic content from the deposited film. In other disclosed embodiments, process gases may be used in the absence of a plasma. When the process gas includes water vapor, delivery can be achieved using a mass flow meter (MFM), an injection valve, or through a commercially available water vapor generator. The process gas may be introduced into the first process region via the RPS unit or bypass the RPS unit, and the process gas may be further energized in the first plasma region.
穿孔291的开口的轴292与穿孔296的开口的轴297可彼此平行或大体上平行。或者,轴292与轴297可彼此呈夹角,诸如1°至80°,例如1°至30°。或者,各个相应的轴292可彼此呈夹角,诸如1°至80°,例如1°至30°,并且各个相应的轴297可彼此呈夹角,诸如1°至80°,例如1°至30°。The axis 292 of the opening of the through hole 291 and the axis 297 of the opening of the through hole 296 may be parallel or substantially parallel to each other. Alternatively, the axis 292 and the axis 297 may form an included angle with each other, such as 1° to 80°, eg 1° to 30°. Alternatively, each respective axis 292 may be at an angle to each other, such as 1° to 80°, for example 1° to 30°, and each respective axis 297 may be at an angle to each other, such as 1° to 80°, for example 1° to 30°. 30°.
相应的开口可呈角度(诸如图2B显示的穿孔291),开口具有1°至80°(诸如1°至30°)的角度。穿孔291的开口的轴292与穿孔296的开口的轴297可垂直于或大体上垂直于基材217的表面。或者,轴292与轴297可与基材表面呈夹角,诸如小于5°。The corresponding openings may be angled (such as the perforations 291 shown in FIG. 2B ), with the openings having an angle of 1° to 80°, such as 1° to 30°. The axis 292 of the opening of the through hole 291 and the axis 297 of the opening of the through hole 296 may be perpendicular or substantially perpendicular to the surface of the substrate 217 . Alternatively, axis 292 and axis 297 may form an included angle with the substrate surface, such as less than 5°.
图2C示出了过程腔室200与喷头225的部分剖视图,其中前驱物从内部空间294经由穿孔296流动295到过程区域233内。图上亦示出替代性实施例,显示有两个穿孔296的轴297与297’彼此呈夹角。2C shows a partial cross-sectional view of process chamber 200 and showerhead 225 with precursor flow 295 from interior space 294 through perforations 296 into process region 233 . An alternative embodiment is also shown, showing two through holes 296 with axes 297 and 297' at an angle to each other.
图3A示出气体散布组件300的俯视立体图。在使用时,气体散布组件300具有大体上水平的方位,以致其间形成的气体穿孔的轴垂直于或大体上垂直于基材支撑件的平面(参见图2A中的基材支撑件265)。图3B示出气体散布组件300的仰视立体图。图3C为气体散布组件300的仰视图。图3D为沿着图3C的线3D-3D的气体散布组件300的剖视图。图3E为沿着图3C的线3E-3E的气体散布组件300的底板325的剖视图。图3F和3G为底板325的特征结构的放大图。图3H为气体散布组件300的上板320的仰视图。图3H’为沿着图3H的线3H’-3H’的上板320的剖视图。图3H”为上板320的仰视立体图。图3I和3I’为上板320的特征结构的放大图。图3J为气体散布组件300的环形本体340的俯视图。图3K示出环形本体340的底部的立体图,其中该环形本体340具有设置在其中的加热构件327。图3L为图3D的气体散布组件300的部分放大图。图3M为沿着图3J的线3M-3M的环形本体340的剖视图。FIG. 3A shows a top perspective view of gas distribution assembly 300 . In use, the gas distribution assembly 300 has a generally horizontal orientation such that the axes of the gas perforations formed therebetween are perpendicular or generally perpendicular to the plane of the substrate support (see substrate support 265 in FIG. 2A ). FIG. 3B shows a bottom perspective view of gas distribution assembly 300 . FIG. 3C is a bottom view of gas distribution assembly 300 . 3D is a cross-sectional view of the gas distribution assembly 300 taken along line 3D-3D of FIG. 3C. 3E is a cross-sectional view of the bottom plate 325 of the gas distribution assembly 300 along line 3E-3E of FIG. 3C. 3F and 3G are enlarged views of the features of the bottom plate 325 . FIG. 3H is a bottom view of upper plate 320 of gas distribution assembly 300 . FIG. 3H' is a cross-sectional view of the upper plate 320 along line 3H'-3H' of FIG. 3H. Figure 3H" is a bottom perspective view of upper plate 320. Figures 3I and 3I' are enlarged views of features of upper plate 320. Figure 3J is a top view of annular body 340 of gas distribution assembly 300. Figure 3K shows the bottom of annular body 340 , wherein the annular body 340 has a heating member 327 disposed therein. FIG. 3L is a partially enlarged view of the gas distribution assembly 300 of FIG. 3D. FIG. 3M is a cross-sectional view of the annular body 340 along the line 3M-3M of FIG. 3J .
参照图3A-M,气体散布组件300大致上包括环形本体340、上板320与底板325。环形本体340是环形圈,其具有内环形壁301、内唇部302(其从内环形壁301向外径向地延伸)、上凹部303、座部304与外壁305,尤其如图3L所示。环形本体340具有顶表面315与底表面310,其界定了环形本体340的厚度。导管350可形成在顶表面315中且流体地连接冷却信道356(其亦可形成在顶表面315中),如图3A所示。导管355可形成在底表面310中且流体地连接冷却信道357(其亦可形成在底表面310中),如图3B所示。冷却信道356、357可适于容许冷却流体流经其中。加热器凹部342可形成在底表面310中且适于固持加热构件327,如图3K所示。Referring to FIGS. 3A-M , the gas distribution assembly 300 generally includes an annular body 340 , an upper plate 320 and a bottom plate 325 . The annular body 340 is an annular ring having an inner annular wall 301, an inner lip 302 (which extends radially outward from the inner annular wall 301), an upper recess 303, a seat 304 and an outer wall 305, as shown in particular in FIG. 3L . The annular body 340 has a top surface 315 and a bottom surface 310 defining a thickness of the annular body 340 . Conduits 350 may be formed in top surface 315 and fluidly connect cooling channels 356 (which may also be formed in top surface 315 ), as shown in FIG. 3A . Conduit 355 may be formed in bottom surface 310 and fluidly connect cooling channel 357 (which may also be formed in bottom surface 310 ), as shown in FIG. 3B . The cooling channels 356, 357 may be adapted to allow cooling fluid to flow therethrough. A heater recess 342 may be formed in the bottom surface 310 and adapted to hold the heating member 327, as shown in FIG. 3K.
上板320是具有多个第一穿孔360形成于其间的盘形本体,盘形本体具有经选择的直径以匹配于上凹部303的直径,尤其如图3D和3H-I’所示。第一穿孔360可延伸超过上板320的底表面306,从而形成多个凸起的圆柱状本体307。在各个凸起的圆柱状本体307之间是间隙395。如图3H和3H”所示,第一穿孔360在上板320上被安排成多边形图案,从而通过最外边第一穿孔360的中心的虚构线界定了十二边形。此图案的特征亦可在于第一穿孔360的5-60列的交错列排列(诸如15-25列,例如21列)。各个列沿着y-轴具有5-20个第一穿孔360(诸如6-18个穿孔),且各个列相隔0.4-0.7英寸(例如约0.54英寸)。在列中的各个第一穿孔360可沿着x-轴从先前第一穿孔由每个相应的直径平移0.4-0.8英寸(诸如约0.63英寸)。第一穿孔360沿着x-轴从另一列中的穿孔由每个相应的直径交错0.2-0.4英寸(诸如约0.32英寸)。在各个列中,第一穿孔360可彼此均等地分隔。在显示的配置中,存在有总数为312个的第一穿孔360。可了解,可使用其它孔洞图案。The upper plate 320 is a disc-shaped body having a plurality of first perforations 360 formed therebetween, the disc-shaped body having a diameter selected to match the diameter of the upper recess 303, as shown in particular in Figures 3D and 3H-I'. The first perforations 360 may extend beyond the bottom surface 306 of the upper plate 320 to form a plurality of raised cylindrical bodies 307 . Between each raised cylindrical body 307 is a gap 395 . As shown in Figures 3H and 3H", the first perforations 360 are arranged in a polygonal pattern on the upper plate 320 such that imaginary lines passing through the centers of the outermost first perforations 360 define a dodecagon. The characteristics of this pattern can also be In a staggered column arrangement (such as 15-25 columns, eg 21 columns) of 5-60 columns of first perforations 360. Each column has 5-20 first perforations 360 (such as 6-18 perforations) along the y-axis , and each column is separated by 0.4-0.7 inches (such as about 0.54 inches). Each first perforation 360 in a column can be translated along the x-axis from the previous first perforation by each corresponding diameter of 0.4-0.8 inches (such as about 0.63 inches). The first perforations 360 are staggered along the x-axis from the perforations in another row by each corresponding diameter by 0.2-0.4 inches (such as about 0.32 inches). In each row, the first perforations 360 may be equally spaced from each other Separation. In the configuration shown, there are a total of 312 first perforations 360. It will be appreciated that other hole patterns may be used.
在上板360的中心处,存在有突部308,而不是第一穿孔360,如图3I’所示。突部308延伸到和凸起的圆柱状本体307相同的高度。At the center of the upper plate 360, instead of the first perforation 360, there is a protrusion 308, as shown in Figure 3I'. The protrusion 308 extends to the same height as the raised cylindrical body 307 .
底板325是具有多个第二穿孔365与第三穿孔375形成其间的盘形本体,盘形本体具有经选择的直径以匹配于上凹部303的直径,尤其如图3C和3E-G所示。底板325具有约0.1-0.2英寸的均匀厚度(诸如约0.15英寸),以及具有匹配于环形本体340的内环形壁301的直径的直径。第二穿孔365被安排成的图案对准第一穿孔360的图案,如前所述。在实施例中,当上板320与底板325设置成一者在另一者上,第一穿孔360与第二穿孔365的轴对准。该多个第一穿孔360与该多个第二穿孔365可使得其相应的轴彼此平行或大体上平行,例如这些穿孔360、365可以是同心的。或者,该多个第一穿孔360与该多个第二穿孔365可使得相应的轴设置成彼此呈1°至30°的夹角。在底板325的中心处,没有存在第二穿孔365,如图3F所示。Bottom plate 325 is a disc-shaped body having a plurality of second and third perforations 365, 375 formed therebetween, the disc-shaped body having a diameter selected to match the diameter of upper recess 303, as shown in particular in FIGS. 3C and 3E-G. Base plate 325 has a uniform thickness of about 0.1-0.2 inches, such as about 0.15 inches, and has a diameter that matches the diameter of inner annular wall 301 of annular body 340 . The second perforations 365 are arranged in a pattern that aligns with the pattern of the first perforations 360, as previously described. In an embodiment, when the upper plate 320 and the bottom plate 325 are disposed one on top of the other, the axes of the first through hole 360 and the second through hole 365 are aligned. The plurality of first through holes 360 and the plurality of second through holes 365 may have their respective axes parallel or substantially parallel to each other, for example the through holes 360, 365 may be concentric. Alternatively, the plurality of first through holes 360 and the plurality of second through holes 365 may make the corresponding axes be arranged at an angle of 1° to 30° with each other. At the center of the bottom plate 325, there is no second perforation 365, as shown in FIG. 3F.
该多个第二穿孔365与该多个第三穿孔375形成交替的交错列。这些第三穿孔375被安排在底板325的至少两个第二穿孔365之间。在各个第二穿孔365之间存在有一个第三穿孔375,该第三穿孔375均等地间隔在该两个第二穿孔365之间。亦存在以六边形图案绕着底板325的中心来设置的六个第三穿孔375。没有第三穿孔375设置在底板325的中心。亦没有第三穿孔375设置在形成这些第二穿孔的多边形图案的顶点的外缘第二穿孔365之间。共有876个第三穿孔375形成通过底板325。The plurality of second through holes 365 and the plurality of third through holes 375 form alternate staggered columns. These third perforations 375 are arranged between at least two second perforations 365 of the bottom plate 325 . Between each of the second through holes 365 there is a third through hole 375 equally spaced between the two second through holes 365 . There are also six third perforations 375 disposed around the center of the bottom plate 325 in a hexagonal pattern. No third through hole 375 is provided at the center of the bottom plate 325 . There are also no third perforations 375 disposed between the peripheral second perforations 365 that form vertices of the polygonal pattern of these second perforations. A total of 876 third through holes 375 are formed through the bottom plate 325 .
第一、第二与第三穿孔360、365、375皆适于容许流体通过其中。第一与第二穿孔360、365可具有圆柱形状,并且或者可具有变化的截面形状(包括圆锥形、圆柱形或多种形状的组合)。在示例中,第一与第二穿孔360、365可具有约0.125英寸至约0.5英寸的直径,诸如约0.25英寸。或者,第二穿孔365可具有等于或大于第一穿孔360的直径。The first, second and third apertures 360, 365, 375 are all adapted to allow fluid to pass therethrough. The first and second perforations 360, 365 may have cylindrical shapes, and alternatively may have varying cross-sectional shapes including conical, cylindrical, or combinations of shapes. In an example, the first and second perforations 360, 365 may have a diameter of about 0.125 inches to about 0.5 inches, such as about 0.25 inches. Alternatively, the second through hole 365 may have a diameter equal to or greater than that of the first through hole 360 .
第三穿孔可具有沙漏形状,如图3G所示。第三穿孔可具有轮廓或界定第一圆柱状区段376(喷嘴)的形状,第一圆柱状区段376具有0.2-0.3英寸的第一直径(诸如约0.25英寸)。第一圆柱状区段376在端处具有入口。第一圆柱状区段376可具有约0.1-0.12英寸的高度(诸如约0.11英寸)。第二圆柱状区段378(喉)具有小于第一直径的第二直径且通过过渡区段377连接到第一圆柱状区段376。第二直径可以是0.01-0.03英寸,诸如0.016英寸,或者约为30:1至6:1的第一直径对第二直径的比值(诸如约16:1)。第二圆柱状区段378可具有约0.01-0.02英寸的高度,诸如约0.017英寸。过渡区段377从第一区段376和第一直径以约120°的角度渐渐变细到第二区段378和第二直径。过渡区段377可具有约0.1-0.12英寸的高度,诸如约0.11英寸。第三区段374(扩散器)连接到第二圆柱状区段378。第三区段374可具有圆锥形状,其从第二圆柱状区段378扩张到出口,而具有0.2-0.3英寸的高度(诸如0.25英寸),并且可具有大于第二直径的且小于第一直径的出口直径。第三直径可以为0.05-0.08英寸(诸如0.06英寸)。或者,该多个第三穿孔的各者可具有圆锥形状,并且具有等于或大于该多个第一穿孔360的直径。The third perforation may have an hourglass shape, as shown in Figure 3G. The third perforation may have a contour or shape that defines a first cylindrical section 376 (nozzle) having a first diameter of 0.2-0.3 inches, such as about 0.25 inches. The first cylindrical section 376 has an inlet at the end. The first cylindrical section 376 may have a height of about 0.1-0.12 inches, such as about 0.11 inches. The second cylindrical section 378 (throat) has a second diameter smaller than the first diameter and is connected to the first cylindrical section 376 by a transition section 377 . The second diameter may be 0.01-0.03 inches, such as 0.016 inches, or a ratio of the first diameter to the second diameter of about 30:1 to 6:1 (such as about 16:1). The second cylindrical section 378 may have a height of about 0.01-0.02 inches, such as about 0.017 inches. The transition section 377 tapers from the first section 376 and the first diameter at an angle of about 120° to the second section 378 and the second diameter. Transition section 377 may have a height of about 0.1-0.12 inches, such as about 0.11 inches. The third section 374 (diffuser) is connected to the second cylindrical section 378 . The third section 374 can have a conical shape that diverges from the second cylindrical section 378 to the outlet with a height of 0.2-0.3 inches, such as 0.25 inches, and can have a diameter that is larger than the second diameter and smaller than the first diameter. the outlet diameter. The third diameter may be 0.05-0.08 inches, such as 0.06 inches. Alternatively, each of the plurality of third through holes may have a conical shape and have a diameter equal to or greater than that of the plurality of first through holes 360 .
参照图3J和3M,环形本体340可具有多个流体输送信道380,这些流体输送信道380相对于冷却信道356、357径向地向内形成到上凹部303内。这些流体输送信道380可流体地连接到导管372。这些流体输送信道380亦可和多个流体管道381流体地连接,这些流体管道381相对于流体输送信道380径向地向内形成到上凹部303内。Referring to FIGS. 3J and 3M , the annular body 340 may have a plurality of fluid delivery channels 380 formed radially inwardly into the upper recess 303 relative to the cooling channels 356 , 357 . These fluid delivery channels 380 may be fluidly connected to conduit 372 . The fluid delivery channels 380 may also be fluidly connected to a plurality of fluid conduits 381 formed radially inwardly relative to the fluid delivery channels 380 into the upper recess 303 .
如前所述,气体散布组件300大致上由环形本体340、上板320与底板325构成。上板320设置在上凹部303内,而凸起的圆柱状本体307面向环形本体340的底板310,如图3L所示。接着,底板325设置在座部304上且可旋转地被定向,以致第一和第二穿孔360、365的轴对准,如图3L所示。上板320密封地连接到底板325,以将第一和第二穿孔360、365和第三穿孔375流体地隔离。举例而言,上板320可被铜焊到底板325,以致在凸起的圆柱状本体307的表面与底板325的表面之间建立密封。接着,上板320与底板325被电子束焊接到环形本体340。上板320被电子束焊接成使得在环形本体的外缘311与上凹部303的内缘312之间建立密封。底板325被电子束焊接成使得在环形本体的外缘313与内环形壁301之间建立密封。流体可沿着流动路径F1流动通过第一和第二穿孔360、365。流体亦可沿着流动路径F2分别地流动通过导管372、进入流体输送信道380、通过流体管道381、通过间隙395、与通过第三穿孔375。使流体沿着两个分离的流动路径F1、F2流动可确保流体在离开气体散布组件300的后的反应,其有助于避免材料在气体散布组件300内的累积。As mentioned above, the gas distribution assembly 300 is generally composed of the annular body 340 , the upper plate 320 and the bottom plate 325 . The upper plate 320 is disposed in the upper recess 303, while the raised cylindrical body 307 faces the bottom plate 310 of the annular body 340, as shown in FIG. 3L. Next, the bottom plate 325 is disposed on the seat 304 and is rotatably oriented such that the axes of the first and second through-holes 360, 365 are aligned, as shown in FIG. 3L. The upper plate 320 is sealingly connected to the bottom plate 325 to fluidly isolate the first and second apertures 360 , 365 and the third aperture 375 . For example, upper plate 320 may be brazed to bottom plate 325 such that a seal is established between the surface of raised cylindrical body 307 and the surface of bottom plate 325 . Next, the upper plate 320 and the bottom plate 325 are electron beam welded to the annular body 340 . The upper plate 320 is electron beam welded such that a seal is established between the outer edge 311 of the annular body and the inner edge 312 of the upper recess 303 . The bottom plate 325 is electron beam welded such that a seal is established between the outer edge 313 of the annular body and the inner annular wall 301 . Fluid can flow through the first and second apertures 360 , 365 along the flow path F 1 . Fluid can also flow through the conduit 372 , into the fluid delivery channel 380 , through the fluid conduit 381 , through the gap 395 , and through the third through hole 375 along the flow path F 2 , respectively. Flowing the fluid along two separate flow paths F 1 , F 2 ensures the reaction of the fluid after exiting the gas distribution assembly 300 which helps avoid accumulation of material within the gas distribution assembly 300 .
参照图4A-4H,提供气体散布组件400或喷头的实施例,气体散布组件400包括第一或上歧管410与第二或底歧管415,并且第二歧管415的顶部适于连接到第一歧管410的底部。在使用时,喷头400相对于基材的方位使得任何形成在喷头中的穿孔的轴垂直于或大体上垂直于基材平面。4A-4H, an embodiment of a gas distribution assembly 400 or showerhead is provided, the gas distribution assembly 400 includes a first or upper manifold 410 and a second or bottom manifold 415, and the top of the second manifold 415 is adapted to be connected to The bottom of the first manifold 410 . In use, the showerhead 400 is oriented relative to the substrate such that the axes of any perforations formed in the showerhead are perpendicular or substantially perpendicular to the plane of the substrate.
图4A示出包括有第一歧管410的喷头的顶部的立体图,并且图4B示出包括有第二歧管415的喷头的底部的立体图。图4C示出第二歧管的仰视图。图4D示出沿着图4C的线4D的喷头的侧视图。图4D’为第一穿孔的实施例的侧视图。图4E为第二歧管的圆形板的侧视图。图4F为图4E的第三穿孔的实施例的侧视图。图4G为图4E的第二和第三穿孔的实施例的侧视图。图4H为第一歧管的俯视图且未示出具有穿孔的圆形板。图4I为底歧管(其具有本文描述的含穿孔图案的圆形板)的俯视图且未示出圆形板。FIG. 4A shows a perspective view of the top of a showerhead including a first manifold 410 , and FIG. 4B shows a perspective view of the bottom of a showerhead including a second manifold 415 . Figure 4C shows a bottom view of the second manifold. Figure 4D shows a side view of the showerhead along line 4D of Figure 4C. Figure 4D' is a side view of an embodiment of a first perforation. Figure 4E is a side view of the circular plate of the second manifold. FIG. 4F is a side view of an embodiment of the third perforation of FIG. 4E. 4G is a side view of an embodiment of the second and third perforations of FIG. 4E. Figure 4H is a top view of the first manifold and does not show the circular plate with perforations. Figure 4I is a top view of a bottom manifold with a circular plate with a perforation pattern as described herein and without the circular plate.
第一歧管410包括内圆形板420,内圆形板420设置在外框440中。横向导管450形成在外框440中。The first manifold 410 includes an inner circular plate 420 disposed in an outer frame 440 . A transverse duct 450 is formed in the outer frame 440 .
参照图4A和4B,内圆形板420具有多个形成在图案部分470中的第一穿孔460,并且这些穿孔适于流体通过其间。图案部分470可包含15-25列的交错列(例如19列)排列。各个列沿着y-轴具有2-20个穿孔360(诸如4-17个穿孔),且各个列相隔0.4-0.7英寸(例如约0.54英寸)。在列中的各个穿孔可沿着x-轴从先前穿孔由各个相应的直径平移0.4-0.8英寸(诸如约0.63英寸)。穿孔沿着x-轴从另一列中的穿孔由各个相应的直径交错0.2-0.4英寸(诸如约0.31英寸)。在各个列中,这些穿孔可彼此均等地分隔。4A and 4B, the inner circular plate 420 has a plurality of first perforations 460 formed in the pattern portion 470, and these perforations are adapted to pass fluid therethrough. The pattern portion 470 may comprise an arrangement of 15-25 columns in staggered columns (eg, 19 columns). Each column has 2-20 perforations 360 (such as 4-17 perforations) along the y-axis, and each column is 0.4-0.7 inches apart (eg, about 0.54 inches). Each perforation in a column may be translated 0.4-0.8 inches (such as about 0.63 inches) from the previous perforation along the x-axis by each respective diameter. The perforations are staggered along the x-axis by 0.2-0.4 inches (such as about 0.31 inches) from the perforations in another column by each respective diameter. In each column, the perforations may be equally spaced from each other.
各个第一穿孔460可具有圆锥形入口部,渐渐变细到第一圆柱状部分。在示例中,穿孔460可具有约0.2英寸至约0.5英寸的入口直径(诸如约0.35英寸),其以约90°而渐渐变细到0.125-0.4英寸的第一圆柱状部分(例如约0.25英寸)。穿孔460延伸通过圆形板以提供用于供流体通过的通道。第一穿孔的组合高度为0.05-0.15英寸,并且渐渐变细到第一圆柱状部分的圆锥形入口部可具有均等高度。圆形板的图案化部分可根据圆形板的尺寸而改变,并且可以在直径为约14英寸的圆形板的约0.5英寸至约6英寸的直径处。Each first through hole 460 may have a conical entrance portion that tapers to a first cylindrical portion. In an example, perforation 460 may have an inlet diameter of about 0.2 inches to about 0.5 inches (such as about 0.35 inches), which tapers at about 90° to a first cylindrical portion of 0.125-0.4 inches (eg, about 0.25 inches ). Perforations 460 extend through the circular plate to provide passages for fluid to pass through. The combined height of the first perforations is 0.05-0.15 inches, and the conical entrance portion tapering to the first cylindrical portion may be of equal height. The patterned portion of the circular plate may vary depending on the size of the circular plate and may be at a diameter of about 0.5 inches to about 6 inches for a circular plate having a diameter of about 14 inches.
参照图4B、4E、4F、4G、4H和4I,内圆形板425具有多个形成在图案部分485中的第二穿孔465,并且这些第二穿孔适于流体通过其间。内圆形板亦具有多个形成在图案部分485中的第三穿孔475,并且这些第三穿孔适于通过流体管道使气体被引进到喷头内而进入到设置有喷头的过程腔室内。圆形板具有约0.1-0.2英寸的厚度,诸如约0.15英寸。4B, 4E, 4F, 4G, 4H, and 4I, the inner circular plate 425 has a plurality of second perforations 465 formed in the pattern portion 485, and these second perforations are adapted to pass fluid therethrough. The inner circular plate also has a plurality of third perforations 475 formed in the patterned portion 485, and these third perforations are adapted to allow gas to be introduced into the showerhead through fluid conduits into the process chamber in which the showerhead is disposed. The circular plate has a thickness of about 0.1-0.2 inches, such as about 0.15 inches.
参照图4H,第一歧管415被多个形成在框440中的流体输送信道480围绕,流体输送信道480流体连通于第三穿孔475且流体连通于第二流体源入口490,其中该第二流体源入口490适于容许流体从外部源进入喷头内。第二歧管415包括内圆形板425,内圆形板425设置在外框445内。4H, the first manifold 415 is surrounded by a plurality of fluid delivery channels 480 formed in the frame 440, the fluid delivery channels 480 are in fluid communication with the third perforation 475 and are in fluid communication with the second fluid source inlet 490, wherein the second The fluid source inlet 490 is adapted to allow fluid to enter the showerhead from an external source. The second manifold 415 includes an inner circular plate 425 disposed within an outer frame 445 .
第二歧管的多个第二穿孔465可和多个第一穿孔对准。该多个第一穿孔460与该多个第二穿孔465可具有各自的轴,且该各自的轴是彼此平行或彼此大体上平行。或者,该多个第一穿孔460与该多个第二穿孔465可具有各自的轴,且该各自的轴设置成彼此呈1°至30°的角度。The plurality of second through-holes 465 of the second manifold may be aligned with the plurality of first through-holes. The plurality of first through holes 460 and the plurality of second through holes 465 may have respective axes, and the respective axes are parallel or substantially parallel to each other. Alternatively, the plurality of first through holes 460 and the plurality of second through holes 465 may have respective axes, and the respective axes are arranged at an angle of 1° to 30° to each other.
图案部分485可包含15-25列的交错列(例如19列)排列。各个列沿着y-轴具有2-20个穿孔(诸如4-17个穿孔),且各个列相隔0.4-0.7英寸(例如约0.54英寸)。在列中的各个穿孔可沿着x-轴从先前穿孔由各个相应的直径平移0.4-0.8英寸(诸如约0.63英寸)。这些穿孔沿着x-轴从另一列中的穿孔由各个相应的直径交错0.2-0.4英寸(诸如约0.31英寸)。在各个列中,这些穿孔可彼此均等地分隔。The pattern portion 485 may comprise an arrangement of 15-25 columns in staggered columns (eg, 19 columns). Each column has 2-20 perforations (such as 4-17 perforations) along the y-axis, and each column is 0.4-0.7 inches apart (eg, about 0.54 inches). Each perforation in a column may be translated 0.4-0.8 inches (such as about 0.63 inches) from the previous perforation along the x-axis by each respective diameter. The perforations are staggered along the x-axis by 0.2-0.4 inches (such as about 0.31 inches) from the perforations in another column by each respective diameter. In each column, the perforations may be equally spaced from each other.
各个第二穿孔465可具有第二圆柱状部分,第二圆柱状部分连接到扩张到开端的圆锥形出口部。在示例中,穿孔465可具有0.125英寸至0.4英寸的第二圆柱状部分直径(诸如约0.25英寸)以及约0.2英寸至约0.5英寸的出口直径(诸如约0.40英寸),其以约40°从第二圆柱状部分渐渐变细。穿孔465可具有等于或大于穿孔460的直径。穿孔465延伸通过圆形板以供流体通过其间。第一穿孔的组合高度为0.05-0.15英寸,例如约0.35英寸。圆形板的图案化部分可根据圆形板的尺寸而改变,并且可以在直径为约14英寸的圆形板的约0.5英寸至约6英寸的直径处。Each second perforation 465 may have a second cylindrical portion connected to a conical outlet portion that expands to an open end. In an example, the perforation 465 may have a second cylindrical portion diameter of 0.125 inches to 0.4 inches, such as about 0.25 inches, and an exit diameter of about 0.2 inches to about 0.5 inches, such as about 0.40 inches, at about 40° from The second cylindrical portion tapers. Perforation 465 may have a diameter equal to or greater than perforation 460 . Perforations 465 extend through the circular plate for fluid to pass therethrough. The combined height of the first perforations is 0.05-0.15 inches, such as about 0.35 inches. The patterned portion of the circular plate may vary depending on the size of the circular plate and may be at a diameter of about 0.5 inches to about 6 inches for a circular plate having a diameter of about 14 inches.
图案部分485可具有30-45列(例如37列)的交错列排列的多个第三穿孔。各个列沿着y-轴具有2-30个第三穿孔(诸如3-17个穿孔),且各个列相隔0.2-0.35英寸(例如约0.31英寸)。每一隔列可沿着和这些第二穿孔相同的x-轴设置,并且这些第三穿孔可沿着x-轴处于与这些第二穿孔交替的顺序。对于仅具有第三穿孔的列,在列中的各个第三穿孔可沿着x-轴从先前第三穿孔由各个相应的直径平移0.4-0.8英寸(诸如约0.31英寸)。对于仅具有第三穿孔的列,在列中的各个第三穿孔可沿着x-轴从先前第二穿孔由各个相应的直径平移0.4-0.8英寸(诸如约0.31英寸)。第三穿孔沿着x-轴从另一列中的第三穿孔由各个相应的直径交错0.1-0.2英寸(诸如约0.16英寸)。在各个列中,这些穿孔可彼此均等地分隔。The pattern part 485 may have a plurality of third through holes arranged in staggered columns of 30-45 columns (for example, 37 columns). Each column has 2-30 third perforations (such as 3-17 perforations) along the y-axis, and each column is 0.2-0.35 inches apart (eg, about 0.31 inches). Every other column may be disposed along the same x-axis as the second perforations, and the third perforations may be in an alternating order with the second perforations along the x-axis. For columns with only tertiary perforations, each third perforation in the column may be translated along the x-axis from the previous third perforation by each respective diameter of 0.4-0.8 inches (such as about 0.31 inches). For columns with only tertiary perforations, each tertiary perforation in the column may be translated along the x-axis from the previous second perforation by 0.4-0.8 inches (such as about 0.31 inches) by each respective diameter. The third perforations are staggered along the x-axis from third perforations in another column by 0.1-0.2 inches (such as about 0.16 inches) from each respective diameter. In each column, the perforations may be equally spaced from each other.
参照图4G,第三穿孔可具有轮廓,或定义具有0.2-0.3英寸第一直径(诸如约0.25英寸)的第一圆柱状部分476(喷嘴)的形状。第一圆柱状部分在一端具有入口。第一圆柱状部分可具有约0.1-0.16英寸的高度(诸如约0.14英寸)。第二圆柱状部分478通过过渡区段477连接到第一圆柱状部分476,第二圆柱状部分478具有小于第一直径的第二直径。第二直径可以为0.04-0.07英寸(诸如0.06英寸)或者约为7.5:1至3:1的第一直径对第二直径的比值(诸如约4:1)。第二圆柱状部分可具有约0.01-0.1英寸的高度(诸如约0.05英寸)。过渡区段477从第一区段和第一直径以约40°的角度渐渐变细到第二区段和大于0.07-0.1英寸的第一主要直径(例如约0.08英寸)。第一主要直径大于第二直径。Referring to Figure 4G, the third perforation may have a contour, or define the shape of a first cylindrical portion 476 (nozzle) having a first diameter of 0.2-0.3 inches, such as about 0.25 inches. The first cylindrical portion has an inlet at one end. The first cylindrical portion may have a height of about 0.1-0.16 inches, such as about 0.14 inches. The second cylindrical portion 478 is connected to the first cylindrical portion 476 by a transition section 477, the second cylindrical portion 478 having a second diameter smaller than the first diameter. The second diameter may be 0.04-0.07 inches, such as 0.06 inches, or a ratio of the first diameter to the second diameter of about 7.5:1 to 3:1, such as about 4:1. The second cylindrical portion may have a height of about 0.01-0.1 inches, such as about 0.05 inches. The transition section 477 tapers from a first section and first diameter at an angle of about 40° to a second section and a first major diameter greater than 0.07-0.1 inches (eg, about 0.08 inches). The first major diameter is larger than the second diameter.
第三圆柱状部分444(喉)连接到第二圆柱状部分478,并且可具有0.01-0.03英寸的第三直径(诸如0.016英寸)或者约为30:1至6:1的第一直径对第三直径的比值(诸如约16:1)。第三圆柱状部分可具有约0.01-0.03英寸的高度,诸如约0.025英寸。第四圆柱状部分479(扩散器)连接到第三圆柱状部分444。第四圆柱状部分可具有类似于第二圆柱状部分478的直径,而具有小于第一直径的第四直径。第四直径可以为0.04-0.07英寸(诸如0.06英寸)或者约为7.5:1至3:1的第一直径对第二直径的比值(诸如约4:1)。第四直径可具有约0.01-0.5英寸的高度,诸如约0.025英寸。The third cylindrical portion 444 (throat) is connected to the second cylindrical portion 478 and may have a third diameter of 0.01-0.03 inches (such as 0.016 inches) or a first diameter to second diameter of about 30:1 to 6:1. A ratio of three diameters (such as about 16:1). The third cylindrical portion may have a height of about 0.01-0.03 inches, such as about 0.025 inches. A fourth cylindrical portion 479 (diffuser) is connected to the third cylindrical portion 444 . The fourth cylindrical portion may have a diameter similar to the second cylindrical portion 478, but have a fourth diameter smaller than the first diameter. The fourth diameter may be 0.04-0.07 inches, such as 0.06 inches, or a ratio of the first diameter to the second diameter of about 7.5:1 to 3:1, such as about 4:1. The fourth diameter may have a height of about 0.01-0.5 inches, such as about 0.025 inches.
参照图4E-4H,第一流体(诸如过程气体)在进入过程区域之前经由上歧管中的第一穿孔460与下歧管中的第二穿孔465流动F1通过喷头。第二流体(诸如前驱物)流经信道490到气体散布信道480到达上歧管与下歧管之间的内部区域495而流动F2到过程区域(其为环绕第一与第二穿孔的隔离的流动路径)且经由第三穿孔475离开。第一流体与第二流体在喷头中均彼此隔离,直到输送到过程区域内。4E-4H, a first fluid, such as a process gas, flows F1 through the showerhead via a first perforation 460 in the upper manifold and a second perforation 465 in the lower manifold before entering the process area. A second fluid (such as a precursor) flows through channel 490 to gas distribution channel 480 to the interior region 495 between the upper and lower manifolds and flows F2 to the process area (which is the isolation surrounding the first and second perforations). flow path) and exit through the third perforation 475. Both the first fluid and the second fluid are isolated from each other in the spray head until delivered into the process area.
参照图5A-5F,提供气体散布组件500或喷头的实施例,气体散布组件500包括第一或上歧管510、连接到第一歧管510的底部的第二或中心歧管520、和连接到第二歧管520的底部的第三或底歧管530。在使用时,喷头500相对于基材的方位使得任何形成在喷头中的穿孔的轴垂直于或大体上垂直于基材平面。5A-5F, an embodiment of a gas distribution assembly 500 or showerhead is provided, the gas distribution assembly 500 includes a first or upper manifold 510, a second or central manifold 520 connected to the bottom of the first manifold 510, and a connecting A third or bottom manifold 530 to the bottom of the second manifold 520 . In use, the showerhead 500 is oriented relative to the substrate such that the axes of any perforations formed in the showerhead are perpendicular or substantially perpendicular to the plane of the substrate.
图5A示出第一歧管510、第二歧管515与第三歧管520的立体图。图5B示出上歧管的俯视图。图5C示出中心歧管的俯视图。图5D示出底歧管的顶部的立体图。图5E示出第一歧管510、第二歧管515与第三歧管520的切割立体图。图5F示出图5E的切割立体图的放大部分。FIG. 5A shows a perspective view of the first manifold 510 , the second manifold 515 and the third manifold 520 . Figure 5B shows a top view of the upper manifold. Figure 5C shows a top view of the central manifold. Figure 5D shows a perspective view of the top of the bottom manifold. FIG. 5E shows a cut perspective view of the first manifold 510 , the second manifold 515 and the third manifold 520 . Figure 5F shows an enlarged portion of the cut perspective view of Figure 5E.
参照图5A和5B,上歧管510可具有图案化部分516,图案化部分516具有多个第一穿孔511以及多个第二穿孔514,这些第一穿孔511形成为同心地绕着上歧管的中心部513而设置的多个第一径向列512,这些第二穿孔514同心地绕着该多个第一穿孔511而设置且这些第二穿孔514形成为多个第二径向列515。5A and 5B, the upper manifold 510 may have a patterned portion 516 with a plurality of first through holes 511 and a plurality of second through holes 514 formed concentrically around the upper manifold. A plurality of first radial rows 512 arranged in the central portion 513 of the center portion 513, the second through holes 514 are concentrically arranged around the plurality of first through holes 511 and these second through holes 514 are formed into a plurality of second radial rows 515 .
该多个第一穿孔511可包含两个或更多个穿孔(诸如各个径向列中具有2-10个穿孔,例如约4个穿孔)的多个第一径向列512(诸如2-24列,例如16列)。这些同心径向列可以均等的角度彼此均等地分隔。在各个径向列中,这些穿孔可彼此均等地分隔。各个穿孔可在圆形板中具有圆柱形状。在示例中,第一穿孔511可具有约0.1英寸至约0.5英寸的直径(诸如约0.2英寸),并且延伸通过圆形板以提供用于供流体通过其间。The plurality of first perforations 511 may comprise a plurality of first radial rows 512 (such as 2-24 perforations) of two or more perforations (such as 2-10 perforations, for example about 4 perforations in each radial row). columns, such as 16 columns). The concentric radial rows may be equally spaced from each other at equal angles. In each radial row, the perforations may be equally spaced from each other. Each perforation may have a cylindrical shape in a circular plate. In an example, the first perforation 511 may have a diameter of about 0.1 inches to about 0.5 inches, such as about 0.2 inches, and extend through the circular plate to provide for passage of fluid therethrough.
同心地绕着该多个第一穿孔511而设置的该多个第二穿孔514可包含两个或更多个穿孔(诸如各个径向列中具有2-10个穿孔,例如约5个穿孔)的多个第二径向列515(诸如3-40列,例如32列)。这些同心径向列可以均等的角度彼此均等地分隔。在各个径向列中,这些第二穿孔可彼此均等地分隔。各个第二穿孔可在圆形板中具有圆柱形状。在示例中,第二穿孔514可具有约0.1英寸至约0.5英寸的直径(诸如约0.2英寸),并且延伸通过圆形板以提供用于供流体通过其间。The plurality of second perforations 514 disposed concentrically about the plurality of first perforations 511 may comprise two or more perforations (such as 2-10 perforations in each radial row, for example about 5 perforations) A plurality of second radial rows 515 (such as 3-40 rows, eg 32 rows). The concentric radial rows may be equally spaced from each other at equal angles. In each radial row, the second perforations may be equally spaced from each other. Each second perforation may have a cylindrical shape in the circular plate. In an example, the second perforation 514 may have a diameter of about 0.1 inches to about 0.5 inches, such as about 0.2 inches, and extend through the circular plate to provide for passage of fluid therethrough.
背信道518(在图5B的显示为虚线)可形成在上歧管510的背侧以用于输送气体到中心间隙519(亦显示为虚线)。背侧信道从外部源提供第二流体到中心间隙,第二流体经由中心歧管的中心穿孔被传送到底歧管的中心,多个内气体信道流体连通到底歧管的中心且经由设置在这些气体信道中的穿孔而流体连通至过程区域。A back channel 518 (shown in phantom in FIG. 5B ) may be formed on the backside of the upper manifold 510 for delivering gas to the central gap 519 (also shown in phantom). The backside channel provides a second fluid from an external source to the center gap, the second fluid is delivered to the center of the bottom manifold via a central perforation of the center manifold, a plurality of inner gas channels are fluidly connected to the center of the bottom manifold and are provided via the gas perforations in the channel for fluid communication to the process area.
参照图5A和5C,中心歧管520可具有图案化部分526,图案化部分526具有多个第一开口521以及多个第二开口524,这些第一开口521形成为绕着中心歧管的中心部523而设置的同心圆列,这些第二开口524形成为同心地绕着该多个第一开口521而设置的同心圆列。5A and 5C, the central manifold 520 may have a patterned portion 526 with a plurality of first openings 521 and a plurality of second openings 524 formed around the center of the central manifold. The second openings 524 are formed as concentric circles arranged around the plurality of first openings 521 concentrically.
这些第一开口521可形成为三角形或梨形。该形状可包含初始侧,该初始侧位于邻近歧管的中心处且以5°至45°的角度(例如22.5°)扩张到周边部分。周边部分的形状可以是圆滑的或平坦的。这些第一开口521可包含2-24个开口,例如16个。各个第一开口521可设置成和这些第一径向列512的一个相应。各个开口521可适于具有足够的尺寸,以提供围绕各个相应的第一径向列的所有穿孔的开口。这些第一开口521可以均等的角度彼此均等地分隔。These first openings 521 may be formed in a triangular or pear shape. The shape may comprise an initial side located adjacent the center of the manifold and diverging to a peripheral portion at an angle of 5° to 45°, eg 22.5°. The shape of the peripheral portion may be rounded or flat. The first openings 521 may include 2-24 openings, such as 16 openings. Each first opening 521 may be arranged to correspond to one of the first radial rows 512 . Each opening 521 may be adapted to be of sufficient size to provide an opening around all of the perforations of each respective first radial row. The first openings 521 may be equally spaced from each other at equal angles.
这些第二开口524可形成为三角形或梨形。该形状可包含初始侧,该初始侧位在邻近该多个第一开口521处且以5°至45°的角度(例如11.25°)扩张到周边部分。在第二开口的实施例中,第二开口可具有这些第一开口的扩张角度的约一半。周边部分的形状可以是圆滑的或平坦的。这些第二开口524可包含4-48个开口,例如32个。各个第二开口524可设置成和这些第二径向列515的一个相应。各个第二开口524可适于具有足够的尺寸,以提供围绕各个相应的第二径向列的所有穿孔的开口。这些第二开口524可以均等的角度彼此均等地分隔。这些第二开口可被提供成这些第一开口对这些第二开口的比值为1:1至1:3,例如1:2。在示例中,中心歧管包含16个以22.5°的角度扩张的第一开口以及32个以11.25°的角度扩张的第二开口。These second openings 524 may be formed in a triangular or pear shape. The shape may include an initial side adjacent to the plurality of first openings 521 and diverging to a peripheral portion at an angle of 5° to 45° (eg, 11.25°). In embodiments of the second openings, the second openings may have about half the divergence angle of the first openings. The shape of the peripheral portion may be rounded or flat. The second openings 524 may include 4-48 openings, such as 32 openings. Each second opening 524 may be arranged to correspond to one of the second radial rows 515 . Each second opening 524 may be adapted to be of sufficient size to provide an opening around all of the perforations of each respective second radial row. The second openings 524 may be equally spaced from each other at equal angles. The second openings may be provided in a ratio of the first openings to the second openings of 1:1 to 1:3, eg 1:2. In an example, the central manifold contains 16 first openings that diverge at an angle of 22.5° and 32 second openings that diverge at an angle of 11.25°.
中心歧管的中心部523可包含穿孔,其容许流体从上歧管的背中心到底歧管的中心533的流体连通。The center portion 523 of the center manifold may contain perforations that allow fluid communication from the back center of the upper manifold to the center 533 of the bottom manifold.
参照图5A和5D,底歧管530可具有图案化部分536,图案化部分536具有多个第一开口531、多个第一气体信道537、多个第二开口534、多个第二气体信道538与信道网络539,这些第一开口531形成为绕着底歧管的中心部533而设置的同心圆列,这些第一气体信道537设置在该多个第一开口531之间,这些第二开口534形成为同心地绕着该多个第一开口531而设置的同心圆列,这些第二气体信道538设置在该多个第二开口534之间,该信道网络539同心地绕着该多个第二气体信道538与该多个第二开口534而设置。5A and 5D, the bottom manifold 530 can have a patterned portion 536 with a plurality of first openings 531, a plurality of first gas channels 537, a plurality of second openings 534, a plurality of second gas channels 538 and channel network 539, the first openings 531 are formed as concentric circles arranged around the central portion 533 of the bottom manifold, the first gas channels 537 are arranged between the first openings 531, the second The openings 534 are formed as concentric circles arranged concentrically around the plurality of first openings 531, the second gas passages 538 are disposed between the plurality of second openings 534, and the channel network 539 concentrically surrounds the plurality of openings 531. A second gas channel 538 and the plurality of second openings 534 are provided.
气体信道网络539流体地连接到该多个第二气体信道538且可和这些第二开口534流体地隔离。该多个第一气体信道537可流体地连接到中心部533且可和这些第一开口531流体地隔离。这些第一流体信道537可和这些第二流体信道538隔离。这些第一流体信道包括穿孔542以用于输送流体到过程区域。A gas channel network 539 is fluidly connected to the plurality of second gas channels 538 and may be fluidly isolated from the second openings 534 . The plurality of first gas channels 537 may be fluidly connected to the central portion 533 and may be fluidly isolated from the first openings 531 . The first fluid channels 537 may be isolated from the second fluid channels 538 . These first fluid channels include perforations 542 for delivering fluid to the process area.
这些第一开口531可形成为三角形或梨形。该形状可包含初始侧,该初始侧位于邻近歧管的中心处且以5°至45°的角度(例如22.5°)扩张到周边部分。周边部分的形状可以是圆滑的或平坦的。这些第一开口531可包含2-24个开口,例如16个。各个第一开口531可设置成和中心歧管的这些第一开口521的一个相应。各个开口531亦可适于具有足够的尺寸,以提供围绕上歧管的各个相应的第一径向列的所有穿孔的开口。这些第一开口531可以均等的角度彼此均等地分隔。These first openings 531 may be formed in a triangular or pear shape. The shape may comprise an initial side located adjacent the center of the manifold and diverging to a peripheral portion at an angle of 5° to 45°, eg 22.5°. The shape of the peripheral portion may be rounded or flat. The first openings 531 may include 2-24 openings, such as 16 openings. Each first opening 531 may be provided to correspond to one of the first openings 521 of the central manifold. Each opening 531 may also be adapted to be of sufficient size to provide an opening around all of the perforations of each respective first radial row of the upper manifold. The first openings 531 may be equally spaced from each other at equal angles.
这些第二开口534可形成为三角形或梨形。该形状可包含初始侧,该初始侧位于邻近该多个第一开口531处且以5°至45°的角度(例如11.25°)扩张到周边部分。在第二开口531的实施例中,第二开口可具有这些第一开口的扩张角度的约一半。周边部分的形状可以是圆滑的或平坦的。这些第二开口534可包含4-48个开口,例如32个。各个第二开口534可设置成和中心歧管的这些第二开口524的一个相应。各个第二开口534可适于具有足够的尺寸,以提供围绕上歧管的各个相应的第二径向列的所有穿孔的开口。这些第二开口534可以均等的角度彼此均等地分隔。这些第二开口534可被提供成这些第一开口531对这些第二开口534的比值为1:1至1:3,例如1:2。在示例中,中心歧管包含16个以22.5°的角度扩张的第一开口以及32个以11.25°的角度扩张的第二开口。These second openings 534 may be formed in a triangular or pear shape. The shape may include an initial side located adjacent to the plurality of first openings 531 and diverging to a peripheral portion at an angle of 5° to 45° (eg, 11.25°). In an embodiment of the second opening 531, the second opening may have about half the divergence angle of the first openings. The shape of the peripheral portion may be rounded or flat. The second openings 534 may include 4-48 openings, such as 32 openings. Each second opening 534 may be positioned to correspond to one of the second openings 524 of the central manifold. Each second opening 534 may be adapted to be of sufficient size to provide an opening around all of the perforations of each respective second radial column of the upper manifold. The second openings 534 may be equally spaced from each other at equal angles. The second openings 534 may be provided such that the ratio of the first openings 531 to the second openings 534 is 1:1 to 1:3, eg 1:2. In an example, the central manifold contains 16 first openings that diverge at an angle of 22.5° and 32 second openings that diverge at an angle of 11.25°.
该多个第一气体信道537设置在该多个第一开口531之间,并且可具有与这些第一开口531的数量相同的第一气体信道537数量。这些气体信道具有可连接到歧管的中心部533的内部、可和这些第一开口531一起扩张的外部,并且具有大致上矩形或方形的截面。各个第一气体信道具有一或多个穿孔、出口,出口在第一气体信道的底部形成为一或多个列以提供到与程腔室的流体连通。举例而言,各个第一气体信道具有2列的10个穿孔,各个列具有5个穿孔。该多个第一气体信道537适于接触中心歧管的底表面,形成了密封的信道,并且与中心歧管的开口521、524隔离。The plurality of first gas channels 537 are disposed between the plurality of first openings 531 , and may have the same number of first gas channels 537 as the number of the first openings 531 . The gas channels have an inner portion connectable to the central portion 533 of the manifold, an outer portion expandable with the first openings 531 , and have a substantially rectangular or square cross-section. Each first gas channel has one or more perforations, outlets formed in one or more rows at the bottom of the first gas channel to provide fluid communication to the process chamber. For example, each first gas channel has 2 rows of 10 perforations, each row has 5 perforations. The plurality of first gas channels 537 are adapted to contact the bottom surface of the central manifold, forming sealed channels, and isolated from the openings 521 , 524 of the central manifold.
该多个第二气体信道538设置在该多个第二开口534之间,并且可具有和这些第二开口534的数量相同的第二气体信道538数量。这些气体信道具有可和这些第二开口的内部一起扩张的内部、连接到信道网络539的外部,并且具有大致上矩形或方形的截面。各个第二气体信道具有一或多个穿孔、出口,出口在第二气体信道的底部形成为一或多个列以提供与过程腔室的流体连通。举例而言,各个第二气体信道具有2列的10个穿孔,各个列具有5个穿孔。该多个第二气体信道538适于接触中心歧管的底表面,形成了密封的信道,并且与中心歧管的开口521、524隔离。该多个第一气体信道537与该多个第二气体信道538可彼此流体地隔离。The plurality of second gas passages 538 are disposed between the plurality of second openings 534 , and may have the same number of second gas passages 538 as the number of the second openings 534 . The gas channels have interiors expandable with the interiors of the second openings, exteriors connected to the channel network 539, and have a generally rectangular or square cross-section. Each second gas channel has one or more perforations, outlets, formed in one or more columns at the bottom of the second gas channel to provide fluid communication with the process chamber. By way of example, each second gas channel has 2 rows of 10 perforations, each row having 5 perforations. The plurality of second gas channels 538 are adapted to contact the bottom surface of the central manifold, forming sealed channels, and isolated from the openings 521 , 524 of the central manifold. The plurality of first gas channels 537 and the plurality of second gas channels 538 may be fluidly isolated from each other.
信道网络539同心地绕着该多个第二气体信道538与该多个第二开口534而设置,并且流体地连接到这些第二气体信道538。在底歧管的实施例中,各个第二气体信道538连接到信道网络539。信道提供第二流体到喷头以输送到过程腔室的过程区域。流动到信道网络的第二流体可以与经由信道518被提供到该多个第一气体信道537的第二流体相同或不同。A channel network 539 is disposed concentrically around the plurality of second gas channels 538 and the plurality of second openings 534 and is fluidly connected to the second gas channels 538 . In the bottom manifold embodiment, each second gas channel 538 is connected to a channel network 539 . The channel provides the second fluid to the showerhead for delivery to the process area of the process chamber. The second fluid flowing to the channel network may be the same as or different from the second fluid provided to the plurality of first gas channels 537 via channels 518 .
参照图5E和5F,第一流体(诸如过程气体)在进入过程区域550之前经由上歧管中的第二穿孔514、中心歧管中的第二开口524与底歧管中的第二开口534流动F3通过喷头。第二流体(诸如前驱物)流动F4通过信道518到中心519、通过中心歧管的中心523到底歧管的中心533、通过一或多个第一气体信道537与穿孔542,并且(或)第二流体(或第三流体)流动通过信道网络539到一或多个第二气体信道538且经由穿孔542输送到过程区域。第一流体与第二流体在喷头中均彼此隔离,直到输送到过程区域内。Referring to Figures 5E and 5F, a first fluid (such as a process gas) passes through a second perforation 514 in the upper manifold, a second opening 524 in the center manifold, and a second opening 534 in the bottom manifold before entering the process area 550. Flow F3 is passed through the spray head. A second fluid (such as a precursor) flows F through channel 518 to center 519, through center 523 of the center manifold to center 533 of the bottom manifold, through one or more first gas channels 537 and perforations 542, and/or The second fluid (or third fluid) flows through channel network 539 to one or more second gas channels 538 and is delivered to the process area via perforations 542 . Both the first fluid and the second fluid are isolated from each other in the spray head until delivered into the process area.
本文描述的实施例可使两种不同的流体(诸如气体)输送到过程区域而不混合,直到直接位于基材的表面上方。本文提供的热控制方面亦使各种被提供到过程区域的气体的温度受到控制。这提升了腔室内过程(诸如沉积、蚀刻过程、及诸如此类)的控制。举例而言,气体混合可控制成使得可增加过程区域中的反应。可将腔室部件上的不希望的沉积和微粒产生减到最少。通过减少微粒且将用于腔室清洁的停机时间减到最少,这增加了产出。Embodiments described herein allow two different fluids, such as gases, to be delivered to a process area without mixing until directly above the surface of the substrate. The thermal control aspects provided herein also allow the temperature of the various gases provided to the process area to be controlled. This improves control of processes within the chamber, such as deposition, etch processes, and the like. For example, gas mixing can be controlled such that reactions in the process area can be increased. Undesirable deposition and particle generation on chamber components can be minimized. This increases throughput by reducing particulates and minimizing downtime for chamber cleaning.
相信如本文描述的双区域气体喷头容许分离的过程气体被引进到过程腔室内,以在进入过程腔室之前可避免任何不希望的气体反应与混合。通过在喷头的中心处与边缘处的独立的气体引进和控制,双区域喷头提供了更佳的均匀气体散布。It is believed that a dual zone gas showerhead as described herein allows separate process gases to be introduced into the process chamber to avoid any undesired gas reaction and mixing prior to entering the process chamber. Dual zone showerheads provide better uniform gas distribution with independent gas introduction and control at the center and edges of the showerhead.
在替代性实施例中,前驱物可通过超过一个气体独立信道被引进到内部空间。调节来从第一过程区域(诸如215)到第二过程区域(诸如233)的第一流体流的多个穿孔以及调节前驱物流的多个穿孔可适于提供任何必要的结构,以提供中心到边缘的多个区域流动控制。在这样的设计中,均从中心与边缘(甚至多个区域)引进前驱物流与顶部流,其可分别地被控制以控制最终的沉积轮廓。举例而言,限制基材的外部上方的区域中的穿孔的数量,以引导在基材的中心部上方的流动。在双区域喷头结构下,前驱物注入可在径向被分隔成两个或多个区域,并且各个区域具有独立的流动控制。In alternative embodiments, the precursors may be introduced into the interior space through more than one gas independent channel. The plurality of perforations to regulate the flow of the first fluid from the first process region (such as 215) to the second process region (such as 233) and the plurality of perforations to regulate the flow of the precursor may be adapted to provide any structure necessary to provide a central to Multiple zone flow control at the edge. In such designs, precursor and top flows are introduced from both the center and the edge (or even multiple regions), which can be controlled separately to control the final deposition profile. For example, limiting the number of perforations in the region over the exterior of the substrate to direct flow over the center portion of the substrate. Under the dual-zone showerhead structure, the precursor injection can be divided into two or more zones in the radial direction, and each zone has independent flow control.
此外,本发明可包含对称的泵送衬垫,其具有从腔室到前线的对称的分隔(第一阶信道具有一个端口且连接到具有两埠的第二阶;各个第二阶埠连接到第三阶上的两埠,等等,到连接到腔室的最终泵送孔)。最终信道可被分隔成多个不同的区块或可以是连接的信道。其变化可省略一或多阶,例如从4至32等,但仍通过将泵送孔尺寸(孔径与沟槽长度)予以最佳化而维持来自腔室的均匀的泵送。衬垫亦去除了衬垫与C-沟槽之间的间隙,减少了狭缝开口的效应。In addition, the present invention may include symmetrical pumping pads with symmetrical separation from chamber to frontline (first stage channel has one port and connects to second stage with two ports; each second stage port connects to Two ports on the third stage, and so on, to the final pumping hole connected to the chamber). The final channel can be separated into multiple different blocks or can be concatenated channels. It can be varied by omitting one or more stages, eg from 4 to 32 etc., but still maintaining uniform pumping from the chamber by optimizing the pumping hole size (bore diameter and channel length). The liner also removes the gap between the liner and the C-groove, reducing the effect of the slot opening.
虽然前文针对本发明的实施例,但是在不脱离本发明的基本范围的情况下,可设计本发明的其它及另外实施例,且本发明的范围由以下权利要求确定。While the foregoing is directed to embodiments of the invention, other and further embodiments of the invention may be devised without departing from the essential scope of the invention, which is defined by the following claims.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US22589009P | 2009-07-15 | 2009-07-15 | |
| US61/225,890 | 2009-07-15 | ||
| US23370609P | 2009-08-13 | 2009-08-13 | |
| US61/233,706 | 2009-08-13 | ||
| US23412009P | 2009-08-14 | 2009-08-14 | |
| US61/234,120 | 2009-08-14 | ||
| CN201080031919.7A CN102754190B (en) | 2009-07-15 | 2010-07-15 | Fluid Control Features for CVD Chambers |
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| CN201080031919.7A Division CN102754190B (en) | 2009-07-15 | 2010-07-15 | Fluid Control Features for CVD Chambers |
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Families Citing this family (199)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101046520B1 (en) * | 2007-09-07 | 2011-07-04 | 어플라이드 머티어리얼스, 인코포레이티드 | Source gas flow path control in pecvd system to control a by-product film deposition on inside chamber |
| US8673080B2 (en) | 2007-10-16 | 2014-03-18 | Novellus Systems, Inc. | Temperature controlled showerhead |
| US8910590B2 (en) * | 2009-02-13 | 2014-12-16 | Gallium Enterprises Pty Ltd. | Plasma deposition |
| TWI430714B (en) * | 2009-10-15 | 2014-03-11 | Orbotech Lt Solar Llc | Showerhead assembly for plasma processing chamber and method for fabricating gas ionization plate thereof |
| TWI485799B (en) | 2009-12-10 | 2015-05-21 | 沃博提克Lt太陽公司 | Automatic sorting linear processing device |
| US9034142B2 (en) * | 2009-12-18 | 2015-05-19 | Novellus Systems, Inc. | Temperature controlled showerhead for high temperature operations |
| US9324576B2 (en) | 2010-05-27 | 2016-04-26 | Applied Materials, Inc. | Selective etch for silicon films |
| US10658161B2 (en) * | 2010-10-15 | 2020-05-19 | Applied Materials, Inc. | Method and apparatus for reducing particle defects in plasma etch chambers |
| US10283321B2 (en) | 2011-01-18 | 2019-05-07 | Applied Materials, Inc. | Semiconductor processing system and methods using capacitively coupled plasma |
| CN103403843B (en) | 2011-03-04 | 2016-12-14 | 诺发系统公司 | Hybrid Ceramic Sprinklers |
| US8999856B2 (en) | 2011-03-14 | 2015-04-07 | Applied Materials, Inc. | Methods for etch of sin films |
| US9064815B2 (en) | 2011-03-14 | 2015-06-23 | Applied Materials, Inc. | Methods for etch of metal and metal-oxide films |
| US8459276B2 (en) | 2011-05-24 | 2013-06-11 | Orbotech LT Solar, LLC. | Broken wafer recovery system |
| KR101295794B1 (en) * | 2011-05-31 | 2013-08-09 | 세메스 주식회사 | Apparatus for treating substrate |
| US8562785B2 (en) * | 2011-05-31 | 2013-10-22 | Lam Research Corporation | Gas distribution showerhead for inductively coupled plasma etch reactor |
| US8771536B2 (en) | 2011-08-01 | 2014-07-08 | Applied Materials, Inc. | Dry-etch for silicon-and-carbon-containing films |
| TWI505400B (en) * | 2011-08-26 | 2015-10-21 | Lg Siltron Inc | Susceptor |
| US8808563B2 (en) | 2011-10-07 | 2014-08-19 | Applied Materials, Inc. | Selective etch of silicon by way of metastable hydrogen termination |
| US8955547B2 (en) * | 2011-10-19 | 2015-02-17 | Applied Materials, Inc. | Apparatus and method for providing uniform flow of gas |
| US9109754B2 (en) * | 2011-10-19 | 2015-08-18 | Applied Materials, Inc. | Apparatus and method for providing uniform flow of gas |
| KR20140092892A (en) * | 2011-11-08 | 2014-07-24 | 어플라이드 머티어리얼스, 인코포레이티드 | Precursor distribution features for improved deposition uniformity |
| US9267739B2 (en) | 2012-07-18 | 2016-02-23 | Applied Materials, Inc. | Pedestal with multi-zone temperature control and multiple purge capabilities |
| US9373517B2 (en) | 2012-08-02 | 2016-06-21 | Applied Materials, Inc. | Semiconductor processing with DC assisted RF power for improved control |
| US9034770B2 (en) | 2012-09-17 | 2015-05-19 | Applied Materials, Inc. | Differential silicon oxide etch |
| US9023734B2 (en) | 2012-09-18 | 2015-05-05 | Applied Materials, Inc. | Radical-component oxide etch |
| US9390937B2 (en) | 2012-09-20 | 2016-07-12 | Applied Materials, Inc. | Silicon-carbon-nitride selective etch |
| US9132436B2 (en) * | 2012-09-21 | 2015-09-15 | Applied Materials, Inc. | Chemical control features in wafer process equipment |
| US20140099794A1 (en) * | 2012-09-21 | 2014-04-10 | Applied Materials, Inc. | Radical chemistry modulation and control using multiple flow pathways |
| US8944003B2 (en) | 2012-11-16 | 2015-02-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Remote plasma system and method |
| US8969212B2 (en) | 2012-11-20 | 2015-03-03 | Applied Materials, Inc. | Dry-etch selectivity |
| US8980763B2 (en) | 2012-11-30 | 2015-03-17 | Applied Materials, Inc. | Dry-etch for selective tungsten removal |
| US9111877B2 (en) | 2012-12-18 | 2015-08-18 | Applied Materials, Inc. | Non-local plasma oxide etch |
| US8921234B2 (en) | 2012-12-21 | 2014-12-30 | Applied Materials, Inc. | Selective titanium nitride etching |
| US10316409B2 (en) | 2012-12-21 | 2019-06-11 | Novellus Systems, Inc. | Radical source design for remote plasma atomic layer deposition |
| US20140216498A1 (en) | 2013-02-06 | 2014-08-07 | Kwangduk Douglas Lee | Methods of dry stripping boron-carbon films |
| US10256079B2 (en) | 2013-02-08 | 2019-04-09 | Applied Materials, Inc. | Semiconductor processing systems having multiple plasma configurations |
| US9362130B2 (en) | 2013-03-01 | 2016-06-07 | Applied Materials, Inc. | Enhanced etching processes using remote plasma sources |
| US9040422B2 (en) | 2013-03-05 | 2015-05-26 | Applied Materials, Inc. | Selective titanium nitride removal |
| US10170282B2 (en) | 2013-03-08 | 2019-01-01 | Applied Materials, Inc. | Insulated semiconductor faceplate designs |
| US20140271097A1 (en) | 2013-03-15 | 2014-09-18 | Applied Materials, Inc. | Processing systems and methods for halide scavenging |
| US9677176B2 (en) * | 2013-07-03 | 2017-06-13 | Novellus Systems, Inc. | Multi-plenum, dual-temperature showerhead |
| US9493879B2 (en) | 2013-07-12 | 2016-11-15 | Applied Materials, Inc. | Selective sputtering for pattern transfer |
| US9773648B2 (en) | 2013-08-30 | 2017-09-26 | Applied Materials, Inc. | Dual discharge modes operation for remote plasma |
| US8956980B1 (en) | 2013-09-16 | 2015-02-17 | Applied Materials, Inc. | Selective etch of silicon nitride |
| US20150111394A1 (en) * | 2013-10-23 | 2015-04-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Mechanisms for forming uniform film on semiconductor substrate |
| US9236265B2 (en) | 2013-11-04 | 2016-01-12 | Applied Materials, Inc. | Silicon germanium processing |
| US9576809B2 (en) | 2013-11-04 | 2017-02-21 | Applied Materials, Inc. | Etch suppression with germanium |
| US9520303B2 (en) | 2013-11-12 | 2016-12-13 | Applied Materials, Inc. | Aluminum selective etch |
| US9245762B2 (en) | 2013-12-02 | 2016-01-26 | Applied Materials, Inc. | Procedure for etch rate consistency |
| US9117855B2 (en) | 2013-12-04 | 2015-08-25 | Applied Materials, Inc. | Polarity control for remote plasma |
| US20150167160A1 (en) * | 2013-12-16 | 2015-06-18 | Applied Materials, Inc. | Enabling radical-based deposition of dielectric films |
| US9263278B2 (en) | 2013-12-17 | 2016-02-16 | Applied Materials, Inc. | Dopant etch selectivity control |
| US9190293B2 (en) | 2013-12-18 | 2015-11-17 | Applied Materials, Inc. | Even tungsten etch for high aspect ratio trenches |
| US9353440B2 (en) | 2013-12-20 | 2016-05-31 | Applied Materials, Inc. | Dual-direction chemical delivery system for ALD/CVD chambers |
| US9287134B2 (en) | 2014-01-17 | 2016-03-15 | Applied Materials, Inc. | Titanium oxide etch |
| US9293568B2 (en) | 2014-01-27 | 2016-03-22 | Applied Materials, Inc. | Method of fin patterning |
| US9396989B2 (en) | 2014-01-27 | 2016-07-19 | Applied Materials, Inc. | Air gaps between copper lines |
| US9385028B2 (en) | 2014-02-03 | 2016-07-05 | Applied Materials, Inc. | Air gap process |
| US9499898B2 (en) | 2014-03-03 | 2016-11-22 | Applied Materials, Inc. | Layered thin film heater and method of fabrication |
| US9299575B2 (en) | 2014-03-17 | 2016-03-29 | Applied Materials, Inc. | Gas-phase tungsten etch |
| US9299537B2 (en) | 2014-03-20 | 2016-03-29 | Applied Materials, Inc. | Radial waveguide systems and methods for post-match control of microwaves |
| US9299538B2 (en) | 2014-03-20 | 2016-03-29 | Applied Materials, Inc. | Radial waveguide systems and methods for post-match control of microwaves |
| US9136273B1 (en) | 2014-03-21 | 2015-09-15 | Applied Materials, Inc. | Flash gate air gap |
| US9903020B2 (en) | 2014-03-31 | 2018-02-27 | Applied Materials, Inc. | Generation of compact alumina passivation layers on aluminum plasma equipment components |
| US9269590B2 (en) | 2014-04-07 | 2016-02-23 | Applied Materials, Inc. | Spacer formation |
| US10741365B2 (en) | 2014-05-05 | 2020-08-11 | Lam Research Corporation | Low volume showerhead with porous baffle |
| US9309598B2 (en) | 2014-05-28 | 2016-04-12 | Applied Materials, Inc. | Oxide and metal removal |
| US9847289B2 (en) | 2014-05-30 | 2017-12-19 | Applied Materials, Inc. | Protective via cap for improved interconnect performance |
| CN105441904B (en) * | 2014-06-18 | 2018-06-26 | 中微半导体设备(上海)有限公司 | Gas shower device, chemical vapor deposition unit and method |
| US9406523B2 (en) | 2014-06-19 | 2016-08-02 | Applied Materials, Inc. | Highly selective doped oxide removal method |
| US9378969B2 (en) | 2014-06-19 | 2016-06-28 | Applied Materials, Inc. | Low temperature gas-phase carbon removal |
| US9840777B2 (en) * | 2014-06-27 | 2017-12-12 | Applied Materials, Inc. | Apparatus for radical-based deposition of dielectric films |
| US9425058B2 (en) | 2014-07-24 | 2016-08-23 | Applied Materials, Inc. | Simplified litho-etch-litho-etch process |
| US9378978B2 (en) | 2014-07-31 | 2016-06-28 | Applied Materials, Inc. | Integrated oxide recess and floating gate fin trimming |
| US9496167B2 (en) | 2014-07-31 | 2016-11-15 | Applied Materials, Inc. | Integrated bit-line airgap formation and gate stack post clean |
| US9159606B1 (en) | 2014-07-31 | 2015-10-13 | Applied Materials, Inc. | Metal air gap |
| US9165786B1 (en) | 2014-08-05 | 2015-10-20 | Applied Materials, Inc. | Integrated oxide and nitride recess for better channel contact in 3D architectures |
| US9659753B2 (en) | 2014-08-07 | 2017-05-23 | Applied Materials, Inc. | Grooved insulator to reduce leakage current |
| US9553102B2 (en) | 2014-08-19 | 2017-01-24 | Applied Materials, Inc. | Tungsten separation |
| US9355856B2 (en) | 2014-09-12 | 2016-05-31 | Applied Materials, Inc. | V trench dry etch |
| US9478434B2 (en) | 2014-09-24 | 2016-10-25 | Applied Materials, Inc. | Chlorine-based hardmask removal |
| US9368364B2 (en) | 2014-09-24 | 2016-06-14 | Applied Materials, Inc. | Silicon etch process with tunable selectivity to SiO2 and other materials |
| US9613822B2 (en) | 2014-09-25 | 2017-04-04 | Applied Materials, Inc. | Oxide etch selectivity enhancement |
| US9355922B2 (en) | 2014-10-14 | 2016-05-31 | Applied Materials, Inc. | Systems and methods for internal surface conditioning in plasma processing equipment |
| US9966240B2 (en) | 2014-10-14 | 2018-05-08 | Applied Materials, Inc. | Systems and methods for internal surface conditioning assessment in plasma processing equipment |
| US11637002B2 (en) | 2014-11-26 | 2023-04-25 | Applied Materials, Inc. | Methods and systems to enhance process uniformity |
| US9299583B1 (en) | 2014-12-05 | 2016-03-29 | Applied Materials, Inc. | Aluminum oxide selective etch |
| US10224210B2 (en) | 2014-12-09 | 2019-03-05 | Applied Materials, Inc. | Plasma processing system with direct outlet toroidal plasma source |
| US10573496B2 (en) | 2014-12-09 | 2020-02-25 | Applied Materials, Inc. | Direct outlet toroidal plasma source |
| TWI670756B (en) | 2014-12-22 | 2019-09-01 | 美商應用材料股份有限公司 | Fcvd line bending resolution by deposition modulation |
| US9502258B2 (en) | 2014-12-23 | 2016-11-22 | Applied Materials, Inc. | Anisotropic gap etch |
| US9343272B1 (en) | 2015-01-08 | 2016-05-17 | Applied Materials, Inc. | Self-aligned process |
| US11257693B2 (en) | 2015-01-09 | 2022-02-22 | Applied Materials, Inc. | Methods and systems to improve pedestal temperature control |
| US9373522B1 (en) | 2015-01-22 | 2016-06-21 | Applied Mateials, Inc. | Titanium nitride removal |
| US9449846B2 (en) | 2015-01-28 | 2016-09-20 | Applied Materials, Inc. | Vertical gate separation |
| US9728437B2 (en) | 2015-02-03 | 2017-08-08 | Applied Materials, Inc. | High temperature chuck for plasma processing systems |
| US20160225652A1 (en) | 2015-02-03 | 2016-08-04 | Applied Materials, Inc. | Low temperature chuck for plasma processing systems |
| US10041167B2 (en) * | 2015-02-23 | 2018-08-07 | Applied Materials, Inc. | Cyclic sequential processes for forming high quality thin films |
| US9881805B2 (en) | 2015-03-02 | 2018-01-30 | Applied Materials, Inc. | Silicon selective removal |
| US10378107B2 (en) | 2015-05-22 | 2019-08-13 | Lam Research Corporation | Low volume showerhead with faceplate holes for improved flow uniformity |
| US10023959B2 (en) | 2015-05-26 | 2018-07-17 | Lam Research Corporation | Anti-transient showerhead |
| US9691645B2 (en) | 2015-08-06 | 2017-06-27 | Applied Materials, Inc. | Bolted wafer chuck thermal management systems and methods for wafer processing systems |
| US9741593B2 (en) | 2015-08-06 | 2017-08-22 | Applied Materials, Inc. | Thermal management systems and methods for wafer processing systems |
| US9349605B1 (en) | 2015-08-07 | 2016-05-24 | Applied Materials, Inc. | Oxide etch selectivity systems and methods |
| US10504700B2 (en) | 2015-08-27 | 2019-12-10 | Applied Materials, Inc. | Plasma etching systems and methods with secondary plasma injection |
| US10157787B2 (en) | 2015-12-17 | 2018-12-18 | Applied Materials, Inc. | Method and apparatus for depositing cobalt in a feature |
| US10504754B2 (en) | 2016-05-19 | 2019-12-10 | Applied Materials, Inc. | Systems and methods for improved semiconductor etching and component protection |
| US10522371B2 (en) | 2016-05-19 | 2019-12-31 | Applied Materials, Inc. | Systems and methods for improved semiconductor etching and component protection |
| US10304668B2 (en) * | 2016-05-24 | 2019-05-28 | Tokyo Electron Limited | Localized process control using a plasma system |
| US9865484B1 (en) | 2016-06-29 | 2018-01-09 | Applied Materials, Inc. | Selective etch using material modification and RF pulsing |
| US10062575B2 (en) | 2016-09-09 | 2018-08-28 | Applied Materials, Inc. | Poly directional etch by oxidation |
| US10629473B2 (en) | 2016-09-09 | 2020-04-21 | Applied Materials, Inc. | Footing removal for nitride spacer |
| US10546729B2 (en) * | 2016-10-04 | 2020-01-28 | Applied Materials, Inc. | Dual-channel showerhead with improved profile |
| US9934942B1 (en) | 2016-10-04 | 2018-04-03 | Applied Materials, Inc. | Chamber with flow-through source |
| US10062585B2 (en) | 2016-10-04 | 2018-08-28 | Applied Materials, Inc. | Oxygen compatible plasma source |
| US9721789B1 (en) | 2016-10-04 | 2017-08-01 | Applied Materials, Inc. | Saving ion-damaged spacers |
| US10062579B2 (en) | 2016-10-07 | 2018-08-28 | Applied Materials, Inc. | Selective SiN lateral recess |
| US9947549B1 (en) | 2016-10-10 | 2018-04-17 | Applied Materials, Inc. | Cobalt-containing material removal |
| US10163696B2 (en) | 2016-11-11 | 2018-12-25 | Applied Materials, Inc. | Selective cobalt removal for bottom up gapfill |
| US9768034B1 (en) | 2016-11-11 | 2017-09-19 | Applied Materials, Inc. | Removal methods for high aspect ratio structures |
| US10026621B2 (en) | 2016-11-14 | 2018-07-17 | Applied Materials, Inc. | SiN spacer profile patterning |
| US10242908B2 (en) | 2016-11-14 | 2019-03-26 | Applied Materials, Inc. | Airgap formation with damage-free copper |
| US10604841B2 (en) | 2016-12-14 | 2020-03-31 | Lam Research Corporation | Integrated showerhead with thermal control for delivering radical and precursor gas to a downstream chamber to enable remote plasma film deposition |
| US11694911B2 (en) * | 2016-12-20 | 2023-07-04 | Lam Research Corporation | Systems and methods for metastable activated radical selective strip and etch using dual plenum showerhead |
| US10566206B2 (en) | 2016-12-27 | 2020-02-18 | Applied Materials, Inc. | Systems and methods for anisotropic material breakthrough |
| US10403507B2 (en) | 2017-02-03 | 2019-09-03 | Applied Materials, Inc. | Shaped etch profile with oxidation |
| US10431429B2 (en) | 2017-02-03 | 2019-10-01 | Applied Materials, Inc. | Systems and methods for radial and azimuthal control of plasma uniformity |
| US10043684B1 (en) | 2017-02-06 | 2018-08-07 | Applied Materials, Inc. | Self-limiting atomic thermal etching systems and methods |
| US10319739B2 (en) | 2017-02-08 | 2019-06-11 | Applied Materials, Inc. | Accommodating imperfectly aligned memory holes |
| US10559451B2 (en) * | 2017-02-15 | 2020-02-11 | Applied Materials, Inc. | Apparatus with concentric pumping for multiple pressure regimes |
| US10943834B2 (en) | 2017-03-13 | 2021-03-09 | Applied Materials, Inc. | Replacement contact process |
| US10319649B2 (en) | 2017-04-11 | 2019-06-11 | Applied Materials, Inc. | Optical emission spectroscopy (OES) for remote plasma monitoring |
| US11276590B2 (en) | 2017-05-17 | 2022-03-15 | Applied Materials, Inc. | Multi-zone semiconductor substrate supports |
| JP7176860B6 (en) | 2017-05-17 | 2022-12-16 | アプライド マテリアルズ インコーポレイテッド | Semiconductor processing chamber to improve precursor flow |
| US11276559B2 (en) | 2017-05-17 | 2022-03-15 | Applied Materials, Inc. | Semiconductor processing chamber for multiple precursor flow |
| US10049891B1 (en) | 2017-05-31 | 2018-08-14 | Applied Materials, Inc. | Selective in situ cobalt residue removal |
| US10497579B2 (en) | 2017-05-31 | 2019-12-03 | Applied Materials, Inc. | Water-free etching methods |
| US10920320B2 (en) | 2017-06-16 | 2021-02-16 | Applied Materials, Inc. | Plasma health determination in semiconductor substrate processing reactors |
| US10541246B2 (en) | 2017-06-26 | 2020-01-21 | Applied Materials, Inc. | 3D flash memory cells which discourage cross-cell electrical tunneling |
| US10727080B2 (en) | 2017-07-07 | 2020-07-28 | Applied Materials, Inc. | Tantalum-containing material removal |
| US10541184B2 (en) | 2017-07-11 | 2020-01-21 | Applied Materials, Inc. | Optical emission spectroscopic techniques for monitoring etching |
| US10354889B2 (en) | 2017-07-17 | 2019-07-16 | Applied Materials, Inc. | Non-halogen etching of silicon-containing materials |
| US10170336B1 (en) | 2017-08-04 | 2019-01-01 | Applied Materials, Inc. | Methods for anisotropic control of selective silicon removal |
| US10043674B1 (en) | 2017-08-04 | 2018-08-07 | Applied Materials, Inc. | Germanium etching systems and methods |
| US10297458B2 (en) | 2017-08-07 | 2019-05-21 | Applied Materials, Inc. | Process window widening using coated parts in plasma etch processes |
| US10128086B1 (en) | 2017-10-24 | 2018-11-13 | Applied Materials, Inc. | Silicon pretreatment for nitride removal |
| US10283324B1 (en) | 2017-10-24 | 2019-05-07 | Applied Materials, Inc. | Oxygen treatment for nitride etching |
| US10424487B2 (en) | 2017-10-24 | 2019-09-24 | Applied Materials, Inc. | Atomic layer etching processes |
| KR102834461B1 (en) | 2017-12-08 | 2025-07-14 | 램 리써치 코포레이션 | Integrated showerhead with improved hole pattern to deliver radical and precursor gases to downstream chamber to enable remote plasma film deposition |
| US10256112B1 (en) | 2017-12-08 | 2019-04-09 | Applied Materials, Inc. | Selective tungsten removal |
| US10903054B2 (en) | 2017-12-19 | 2021-01-26 | Applied Materials, Inc. | Multi-zone gas distribution systems and methods |
| US11328909B2 (en) | 2017-12-22 | 2022-05-10 | Applied Materials, Inc. | Chamber conditioning and removal processes |
| US10854426B2 (en) | 2018-01-08 | 2020-12-01 | Applied Materials, Inc. | Metal recess for semiconductor structures |
| US10847337B2 (en) * | 2018-01-24 | 2020-11-24 | Applied Materials, Inc. | Side inject designs for improved radical concentrations |
| KR102515110B1 (en) * | 2018-01-29 | 2023-03-28 | 주성엔지니어링(주) | Apparatus for Processing Substrate |
| US11222771B2 (en) * | 2018-02-05 | 2022-01-11 | Applied Materials, Inc. | Chemical control features in wafer process equipment |
| US10679870B2 (en) | 2018-02-15 | 2020-06-09 | Applied Materials, Inc. | Semiconductor processing chamber multistage mixing apparatus |
| US10964512B2 (en) | 2018-02-15 | 2021-03-30 | Applied Materials, Inc. | Semiconductor processing chamber multistage mixing apparatus and methods |
| TWI766433B (en) | 2018-02-28 | 2022-06-01 | 美商應用材料股份有限公司 | Systems and methods to form airgaps |
| US10593560B2 (en) | 2018-03-01 | 2020-03-17 | Applied Materials, Inc. | Magnetic induction plasma source for semiconductor processes and equipment |
| US10319600B1 (en) | 2018-03-12 | 2019-06-11 | Applied Materials, Inc. | Thermal silicon etch |
| US10497573B2 (en) | 2018-03-13 | 2019-12-03 | Applied Materials, Inc. | Selective atomic layer etching of semiconductor materials |
| US10573527B2 (en) | 2018-04-06 | 2020-02-25 | Applied Materials, Inc. | Gas-phase selective etching systems and methods |
| US10490406B2 (en) | 2018-04-10 | 2019-11-26 | Appled Materials, Inc. | Systems and methods for material breakthrough |
| US10699879B2 (en) | 2018-04-17 | 2020-06-30 | Applied Materials, Inc. | Two piece electrode assembly with gap for plasma control |
| US10886137B2 (en) | 2018-04-30 | 2021-01-05 | Applied Materials, Inc. | Selective nitride removal |
| US10872778B2 (en) | 2018-07-06 | 2020-12-22 | Applied Materials, Inc. | Systems and methods utilizing solid-phase etchants |
| US10755941B2 (en) | 2018-07-06 | 2020-08-25 | Applied Materials, Inc. | Self-limiting selective etching systems and methods |
| US10672642B2 (en) | 2018-07-24 | 2020-06-02 | Applied Materials, Inc. | Systems and methods for pedestal configuration |
| KR20200015264A (en) | 2018-08-03 | 2020-02-12 | 삼성전자주식회사 | Wafer to wafer bonding method and wafer to wafer bonding system |
| CN110896050A (en) * | 2018-09-12 | 2020-03-20 | 长鑫存储技术有限公司 | Method of forming a dielectric film |
| US11049755B2 (en) | 2018-09-14 | 2021-06-29 | Applied Materials, Inc. | Semiconductor substrate supports with embedded RF shield |
| TWI848974B (en) | 2018-09-14 | 2024-07-21 | 美商應用材料股份有限公司 | Apparatus for multi-flow precursor dosage |
| US10892198B2 (en) | 2018-09-14 | 2021-01-12 | Applied Materials, Inc. | Systems and methods for improved performance in semiconductor processing |
| US11062887B2 (en) | 2018-09-17 | 2021-07-13 | Applied Materials, Inc. | High temperature RF heater pedestals |
| US11417534B2 (en) | 2018-09-21 | 2022-08-16 | Applied Materials, Inc. | Selective material removal |
| US11682560B2 (en) | 2018-10-11 | 2023-06-20 | Applied Materials, Inc. | Systems and methods for hafnium-containing film removal |
| US11121002B2 (en) | 2018-10-24 | 2021-09-14 | Applied Materials, Inc. | Systems and methods for etching metals and metal derivatives |
| US11437242B2 (en) | 2018-11-27 | 2022-09-06 | Applied Materials, Inc. | Selective removal of silicon-containing materials |
| CN112368807B (en) * | 2018-12-21 | 2024-08-20 | 玛特森技术公司 | Surface smoothing of workpieces |
| US11721527B2 (en) | 2019-01-07 | 2023-08-08 | Applied Materials, Inc. | Processing chamber mixing systems |
| US10920319B2 (en) | 2019-01-11 | 2021-02-16 | Applied Materials, Inc. | Ceramic showerheads with conductive electrodes |
| KR102853172B1 (en) * | 2019-03-11 | 2025-08-29 | 어플라이드 머티어리얼스, 인코포레이티드 | Cover assembly devices and methods for substrate processing chambers |
| DE102019119019A1 (en) * | 2019-07-12 | 2021-01-14 | Aixtron Se | Gas inlet element for a CVD reactor |
| KR20220032608A (en) * | 2019-07-15 | 2022-03-15 | 어플라이드 머티어리얼스, 인코포레이티드 | Large Area High Density Plasma Processing Chamber for Flat Panel Displays |
| WO2021042116A1 (en) | 2019-08-23 | 2021-03-04 | Lam Research Corporation | Thermally controlled chandelier showerhead |
| JP2022546404A (en) | 2019-08-28 | 2022-11-04 | ラム リサーチ コーポレーション | deposition of metal |
| US11479859B2 (en) * | 2020-04-09 | 2022-10-25 | Applied Materials, Inc. | High temperature vacuum seal |
| US20230167552A1 (en) * | 2020-04-28 | 2023-06-01 | Lam Research Corporation | Showerhead designs for controlling deposition on wafer bevel/edge |
| CN115516132B (en) * | 2020-05-06 | 2025-06-20 | 应用材料公司 | Gas distribution components |
| US12152302B2 (en) | 2020-07-08 | 2024-11-26 | Applied Materials, Inc. | Multiple-channel showerhead design and methods in manufacturing |
| US20220028710A1 (en) * | 2020-07-21 | 2022-01-27 | Applied Materials, Inc. | Distribution components for semiconductor processing systems |
| EP4200901A1 (en) * | 2020-08-18 | 2023-06-28 | Mattson Technology, Inc. | Rapid thermal processing system with cooling system |
| US12179223B2 (en) * | 2020-10-30 | 2024-12-31 | Kabushiki Kaisha Toshiba | Rectifying plate, fluid-introducing apparatus, and film-forming apparatus |
| US20230005765A1 (en) * | 2021-07-02 | 2023-01-05 | Applied Materials, Inc. | Semiconductor processing chamber adapter |
| KR102589286B1 (en) * | 2021-08-17 | 2023-10-12 | 에스케이엔펄스 주식회사 | Gas sprayer and plasma treatment apparatus including the same |
| US20230097346A1 (en) * | 2021-09-30 | 2023-03-30 | Applied Materials, Inc. | Flow guide apparatuses for flow uniformity control in process chambers |
| TWI809706B (en) * | 2022-02-10 | 2023-07-21 | 緊固電子束科技有限公司 | Gas distribution structure and maintenance method thereof |
| USD1037778S1 (en) * | 2022-07-19 | 2024-08-06 | Applied Materials, Inc. | Gas distribution plate |
Family Cites Families (61)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5074456A (en) * | 1990-09-18 | 1991-12-24 | Lam Research Corporation | Composite electrode for plasma processes |
| US5453124A (en) * | 1992-12-30 | 1995-09-26 | Texas Instruments Incorporated | Programmable multizone gas injector for single-wafer semiconductor processing equipment |
| US5976261A (en) * | 1996-07-11 | 1999-11-02 | Cvc Products, Inc. | Multi-zone gas injection apparatus and method for microelectronics manufacturing equipment |
| JP3310171B2 (en) * | 1996-07-17 | 2002-07-29 | 松下電器産業株式会社 | Plasma processing equipment |
| KR100492258B1 (en) * | 1996-10-11 | 2005-09-02 | 가부시키가이샤 에바라 세이사꾸쇼 | Reaction gas ejection head |
| US6024799A (en) * | 1997-07-11 | 2000-02-15 | Applied Materials, Inc. | Chemical vapor deposition manifold |
| US6161500A (en) * | 1997-09-30 | 2000-12-19 | Tokyo Electron Limited | Apparatus and method for preventing the premature mixture of reactant gases in CVD and PECVD reactions |
| US6126753A (en) * | 1998-05-13 | 2000-10-03 | Tokyo Electron Limited | Single-substrate-processing CVD apparatus and method |
| US6302964B1 (en) * | 1998-06-16 | 2001-10-16 | Applied Materials, Inc. | One-piece dual gas faceplate for a showerhead in a semiconductor wafer processing system |
| US6190732B1 (en) * | 1998-09-03 | 2001-02-20 | Cvc Products, Inc. | Method and system for dispensing process gas for fabricating a device on a substrate |
| US6245192B1 (en) * | 1999-06-30 | 2001-06-12 | Lam Research Corporation | Gas distribution apparatus for semiconductor processing |
| KR100458779B1 (en) * | 2000-03-27 | 2004-12-03 | 미츠비시 쥬고교 가부시키가이샤 | Method for forming metallic film and apparatus for forming the same |
| AU2001247685A1 (en) | 2000-03-30 | 2001-10-15 | Tokyo Electron Limited | Method of and apparatus for tunable gas injection in a plasma processing system |
| JP4567148B2 (en) * | 2000-06-23 | 2010-10-20 | 東京エレクトロン株式会社 | Thin film forming equipment |
| US6886491B2 (en) * | 2001-03-19 | 2005-05-03 | Apex Co. Ltd. | Plasma chemical vapor deposition apparatus |
| US6818096B2 (en) * | 2001-04-12 | 2004-11-16 | Michael Barnes | Plasma reactor electrode |
| US20030019428A1 (en) * | 2001-04-28 | 2003-01-30 | Applied Materials, Inc. | Chemical vapor deposition chamber |
| KR100400044B1 (en) * | 2001-07-16 | 2003-09-29 | 삼성전자주식회사 | Shower head of wafer treatment apparatus having gap controller |
| US6793733B2 (en) * | 2002-01-25 | 2004-09-21 | Applied Materials Inc. | Gas distribution showerhead |
| US6998014B2 (en) * | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
| US7479304B2 (en) * | 2002-02-14 | 2009-01-20 | Applied Materials, Inc. | Gas distribution plate fabricated from a solid yttrium oxide-comprising substrate |
| US6946033B2 (en) * | 2002-09-16 | 2005-09-20 | Applied Materials Inc. | Heated gas distribution plate for a processing chamber |
| US7270713B2 (en) * | 2003-01-07 | 2007-09-18 | Applied Materials, Inc. | Tunable gas distribution plate assembly |
| WO2004088729A1 (en) * | 2003-03-26 | 2004-10-14 | Tokyo Electron Limited | Chemical processing system and method |
| US6942753B2 (en) * | 2003-04-16 | 2005-09-13 | Applied Materials, Inc. | Gas distribution plate assembly for large area plasma enhanced chemical vapor deposition |
| JP2005019606A (en) | 2003-06-25 | 2005-01-20 | Anelva Corp | Apparatus for fixing a gas shower head or target plate to an electrode in a plasma processing apparatus |
| US20050011447A1 (en) * | 2003-07-14 | 2005-01-20 | Tokyo Electron Limited | Method and apparatus for delivering process gas to a process chamber |
| CN100466162C (en) * | 2003-12-15 | 2009-03-04 | 应用材料有限公司 | Edge Flow Panels for Improved CVD Film Performance |
| US6983892B2 (en) * | 2004-02-05 | 2006-01-10 | Applied Materials, Inc. | Gas distribution showerhead for semiconductor processing |
| US20050223986A1 (en) * | 2004-04-12 | 2005-10-13 | Choi Soo Y | Gas diffusion shower head design for large area plasma enhanced chemical vapor deposition |
| US20050241579A1 (en) * | 2004-04-30 | 2005-11-03 | Russell Kidd | Face shield to improve uniformity of blanket CVD processes |
| KR100614648B1 (en) * | 2004-07-15 | 2006-08-23 | 삼성전자주식회사 | Substrate Processing Apparatus Used for Manufacturing Semiconductor Devices |
| KR100629358B1 (en) * | 2005-05-24 | 2006-10-02 | 삼성전자주식회사 | Shower head |
| JP2007191792A (en) * | 2006-01-19 | 2007-08-02 | Atto Co Ltd | Gas separation type showerhead |
| CN101454482A (en) * | 2006-05-30 | 2009-06-10 | 应用材料股份有限公司 | Process chamber for dielectric gapfill |
| JP2007324154A (en) * | 2006-05-30 | 2007-12-13 | Matsushita Electric Ind Co Ltd | Plasma processing equipment |
| US20070277734A1 (en) * | 2006-05-30 | 2007-12-06 | Applied Materials, Inc. | Process chamber for dielectric gapfill |
| US20080081114A1 (en) * | 2006-10-03 | 2008-04-03 | Novellus Systems, Inc. | Apparatus and method for delivering uniform fluid flow in a chemical deposition system |
| CN100451163C (en) * | 2006-10-18 | 2009-01-14 | 中微半导体设备(上海)有限公司 | Gas distribution device for treating reactor by semiconductor technological element and reactor thereof |
| US20080099147A1 (en) * | 2006-10-26 | 2008-05-01 | Nyi Oo Myo | Temperature controlled multi-gas distribution assembly |
| US20080178805A1 (en) * | 2006-12-05 | 2008-07-31 | Applied Materials, Inc. | Mid-chamber gas distribution plate, tuned plasma flow control grid and electrode |
| US7674394B2 (en) * | 2007-02-26 | 2010-03-09 | Applied Materials, Inc. | Plasma process for inductively coupling power through a gas distribution plate while adjusting plasma distribution |
| US8069817B2 (en) * | 2007-03-30 | 2011-12-06 | Lam Research Corporation | Showerhead electrodes and showerhead electrode assemblies having low-particle performance for semiconductor material processing apparatuses |
| US7976631B2 (en) * | 2007-10-16 | 2011-07-12 | Applied Materials, Inc. | Multi-gas straight channel showerhead |
| JP5172617B2 (en) * | 2007-11-12 | 2013-03-27 | シャープ株式会社 | Vapor growth apparatus and vapor growth method |
| US20090162262A1 (en) * | 2007-12-19 | 2009-06-25 | Applied Material, Inc. | Plasma reactor gas distribution plate having path splitting manifold side-by-side with showerhead |
| US8512509B2 (en) * | 2007-12-19 | 2013-08-20 | Applied Materials, Inc. | Plasma reactor gas distribution plate with radially distributed path splitting manifold |
| CN101488446B (en) * | 2008-01-14 | 2010-09-01 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Plasma processing equipment and its gas distribution device |
| US20090277587A1 (en) * | 2008-05-09 | 2009-11-12 | Applied Materials, Inc. | Flowable dielectric equipment and processes |
| US8357435B2 (en) | 2008-05-09 | 2013-01-22 | Applied Materials, Inc. | Flowable dielectric equipment and processes |
| US8147648B2 (en) * | 2008-08-15 | 2012-04-03 | Lam Research Corporation | Composite showerhead electrode assembly for a plasma processing apparatus |
| TWI430714B (en) * | 2009-10-15 | 2014-03-11 | Orbotech Lt Solar Llc | Showerhead assembly for plasma processing chamber and method for fabricating gas ionization plate thereof |
| US20120097330A1 (en) * | 2010-10-20 | 2012-04-26 | Applied Materials, Inc. | Dual delivery chamber design |
| CN103403843B (en) * | 2011-03-04 | 2016-12-14 | 诺发系统公司 | Hybrid Ceramic Sprinklers |
| CN103493185A (en) * | 2011-04-08 | 2014-01-01 | 应用材料公司 | Apparatus and methods for UV treatment, chemical treatment and deposition |
| US20130269612A1 (en) * | 2012-04-16 | 2013-10-17 | Hermes-Epitek Corporation | Gas Treatment Apparatus with Surrounding Spray Curtains |
| US9132436B2 (en) * | 2012-09-21 | 2015-09-15 | Applied Materials, Inc. | Chemical control features in wafer process equipment |
| US10714315B2 (en) * | 2012-10-12 | 2020-07-14 | Asm Ip Holdings B.V. | Semiconductor reaction chamber showerhead |
| US9416450B2 (en) * | 2012-10-24 | 2016-08-16 | Applied Materials, Inc. | Showerhead designs of a hot wire chemical vapor deposition (HWCVD) chamber |
| JP6007143B2 (en) * | 2013-03-26 | 2016-10-12 | 東京エレクトロン株式会社 | Shower head, plasma processing apparatus, and plasma processing method |
| US10829855B2 (en) * | 2016-05-20 | 2020-11-10 | Applied Materials, Inc. | Gas distribution showerhead for semiconductor processing |
-
2010
- 2010-07-15 JP JP2012520801A patent/JP5777615B2/en active Active
- 2010-07-15 KR KR1020127003136A patent/KR101598332B1/en active Active
- 2010-07-15 KR KR1020167004522A patent/KR101659303B1/en active Active
- 2010-07-15 CN CN201080031919.7A patent/CN102754190B/en not_active Expired - Fee Related
- 2010-07-15 WO PCT/US2010/042194 patent/WO2011009002A2/en not_active Ceased
- 2010-07-15 TW TW099123311A patent/TWI490366B/en active
- 2010-07-15 CN CN201510491086.7A patent/CN105088191B/en active Active
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-
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Also Published As
| Publication number | Publication date |
|---|---|
| US20200149166A1 (en) | 2020-05-14 |
| CN102754190A (en) | 2012-10-24 |
| US20110011338A1 (en) | 2011-01-20 |
| TW201111548A (en) | 2011-04-01 |
| KR101659303B1 (en) | 2016-09-23 |
| CN102754190B (en) | 2015-09-02 |
| US8894767B2 (en) | 2014-11-25 |
| CN105088191A (en) | 2015-11-25 |
| WO2011009002A3 (en) | 2011-04-14 |
| JP2012533890A (en) | 2012-12-27 |
| KR20120062698A (en) | 2012-06-14 |
| US20150013793A1 (en) | 2015-01-15 |
| JP5777615B2 (en) | 2015-09-09 |
| KR20160027239A (en) | 2016-03-09 |
| WO2011009002A2 (en) | 2011-01-20 |
| KR101598332B1 (en) | 2016-03-14 |
| US12146219B2 (en) | 2024-11-19 |
| US10550472B2 (en) | 2020-02-04 |
| TWI490366B (en) | 2015-07-01 |
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