CN104898040B - The automated testing method and system of printed circuit board (PCB) - Google Patents

Abstract

The present invention provides an automated testing method and system for a printed circuit board. The automated testing method for a printed circuit board includes: extracting a plurality of test objects from the obtained related design information of the printed circuit board to be tested and each test object is printed on the printed circuit board. The position information in the circuit board is displayed on the test option interface; according to the test information about each selected test object obtained from the test option interface, a test sequence for testing the corresponding test object is generated; the printed circuit board is tested according to each test sequence The corresponding test object in the test is tested, and the results of the completed test sequence are saved. The present invention only needs to import the relevant design information of the printed circuit board into the test option interface, and then can screen the test items of the test objects in the printed circuit board, generate corresponding test sequences, and provide a test report in a preset format. This realizes the full automation of printed circuit board testing and effectively improves the work efficiency of testers.

Description

Automated testing method and system for printed circuit board

technical field

The invention relates to a testing field, in particular to an automatic testing method and system for a printed circuit board.

Background technique

The first article inspection in the production process is mainly to prevent batches of products from being out of tolerance, repaired and scrapped. It is a means of pre-controlling the production process of products, an important method of product process quality control, and an enterprise to ensure product quality. An effective and indispensable method to improve economic efficiency. Through the first article inspection, it can be found that there are systematic reasons such as severe wear of fixtures or installation and positioning errors, poor accuracy of measuring instruments, misreading drawings, wrong feeding or formulas, etc., so that corrective or improvement measures can be taken to prevent batch failure. Goods happen. After the first piece of inspection is qualified, it can enter formal production.

The traditional first article inspection method is usually carried out by two people, one for testing and one for recording, which is inefficient. When the number of components in the PCB (printed circuit board) is as many as thousands, the first article inspection may take more than 2 hours. How to improve the efficiency of first article inspection while reducing staffing has become an urgent problem for enterprises to solve, and the demand for using computer software to assist testing arises.

Contents of the invention

In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide an automated testing method and system for printed circuit boards, which are used to solve the problem of low efficiency of first article testing of printed circuit boards in the prior art.

In order to achieve the above and other related purposes, the present invention provides a method for automated testing of printed circuit boards, including: extracting a plurality of test objects from the obtained relevant design information of the printed circuit board to be tested and where each test object is located. The position information in the printed circuit board is displayed on the test option interface; according to the test information about each selected test object obtained from the test option interface, a test sequence for testing the corresponding test object is generated; according to each described The test sequence tests the corresponding test objects in the printed circuit board, and saves the completed test sequence results.

Preferably, the test option interface includes a test object selection list, and at least one of the following: configure the test mode of each of the test objects, configure the data interface information of the external device, configure the module matrix, configure the model information, configure the test Project, configuration test report format.

Preferably, after the step of generating the test sequence for testing the corresponding test object, the test method further includes: correspondingly saving the generated test sequence and the test object; In the process of testing, record the test object currently completed the test in real time; when the relevant design information of the same printed circuit board to be tested is obtained again, the tester will be prompted whether to continue the test, and if so, the saved untested test items will be saved. The sequence continues, if not, re-execute the step of extracting multiple test objects and the position information of each test object in the printed circuit board from the obtained relevant design information of the printed circuit board to be tested.

Preferably, the test method further includes: querying the test results of the tested test objects according to the query options obtained from the query interface, providing the queried test results to the testers, and The location information locates and marks the location of the queried test object in the design drawing in the related design information.

Preferably, after saving the results of all the test sequences, it also includes: according to the format of the configuration test report provided by the test option interface, merging all the saved results corresponding to the printed circuit board into the test report, and provided to testers.

In the second aspect, there is also provided an automated testing system for printed circuit boards, including: a loading module, which is used to extract a plurality of test objects and each test object in the described The position information in the printed circuit board is displayed on the test option interface; the test sequence generation module is used to generate a test for testing the corresponding test object according to the test information about each selected test object obtained from the test option interface Sequence; a test module, used to test the corresponding test objects in the printed circuit board according to each of the test sequences, and save the results of the completed test sequences.

Preferably, the test option interface includes a test object selection list, and at least one of the following: configure the test mode of each of the test objects, configure the data interface information of the external device, configure the module matrix, configure the model information, configure the test Project, configuration test report format.

Preferably, the test sequence generation module is also used to store the generated test sequence and the test object correspondingly; correspondingly, the test module is also used to test the corresponding test object according to each test sequence, Real-time recording of the test object currently completing the test; when obtaining the relevant design information of the same printed circuit board to be tested again, the loading module is also used to prompt the tester whether to continue the test, and if so, the stored untested Continue to execute the test sequence, if not, re-execute extracting a plurality of test objects and the position information of each test object in the printed circuit board from the obtained related design information of the printed circuit board to be tested.

Preferably, the test system further includes: a query module, configured to query the test results of the tested test objects according to the query options obtained from the query interface, provide the queried test results to the testers, and The position information of the queried test object locates and marks the position of the queried test object in the design diagram in the relevant design information.

Preferably, the test module is further configured to combine all the saved results corresponding to the printed circuit board into a test report according to the format of the configuration test report provided by the test option interface, and provide it to testers.

As mentioned above, the automatic testing method and system for printed circuit boards of the present invention have the following beneficial effects: only need to import the relevant design information of printed circuit boards into the test option interface, and then the test items in the printed circuit boards can be tested. Screening and generating the corresponding test sequence, after the test is completed, a test report in a preset format is also provided, thus realizing the full automation of the printed circuit board test and effectively improving the work efficiency of the tester; in addition, when inquiring, provide The position information of the queried test object in the printed circuit board design diagram can provide the tester with an accurate test object, avoiding the occurrence of wrong checking and misreporting due to the similar model of the test object; in addition, in the test After being interrupted, the test can be resumed again, effectively preventing the problem that the test cannot be resumed due to forgetting the test interruption point after the manual test is interrupted.

Description of drawings

FIG. 1 is a flow chart of the automated testing method for printed circuit boards of the present invention.

FIG. 2 is a schematic structural diagram of the automated testing system for printed circuit boards of the present invention.

detailed description

Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

As shown in Fig. 1, the present invention provides an automatic testing method for printed circuit boards. The automated testing method is mainly executed by a testing system. The test system includes hardware and software installed in computer equipment. Wherein, the computer equipment can be connected with the testing equipment (such as LCR instrument) for testing through the data interface line.

The test system is used to test the function and performance of each single component or combined component in the printed circuit board, and can also test the function and system performance of the entire printed circuit board. The printed circuit board is usually an SMT (Surface Mounted Circuit) first article, and may also be other printed circuit boards to be tested. After completing the hardware connection, the test system performs the following operations.

In step S1, the test system extracts a plurality of test objects and the position information of each test object in the printed circuit board from the obtained relevant design information of the printed circuit board to be tested, and displays them on the test option interface superior.

Here, the relevant design information includes, but is not limited to: the bill of materials of the printed circuit board, the CAD coordinates of the printed circuit board, and the silk screen information of the printed circuit board.

Using the operation of the tester, the test system obtains the relevant design information of the printed circuit board to be tested, and extracts all components, chips, etc. arranged in the printed circuit board according to the format of each relevant design information, as Test objects, and location information of each test object. Then according to the preset test option interface, put the extracted name and model of each test object in the corresponding option list for configuring the test object. The test system correspondingly generates at least one piece of test information corresponding to each test object according to the extracted test objects.

The test information includes but is not limited to at least one of the following: configure the test mode of each of the test objects, configure the data interface information of the external device, configure the module matrix, configure the model information, configure the test items, configure the format of the test report .

Wherein, the data interface information of the configuration external device refers to: the test system needs to be connected to the LCR instrument and the computer during the test. After the serial port appears in the test option interface, click the serial port drop-down list, and the port will be seen. Select the correct matching port and baud rate, and set the waiting time. After the setting of this project is completed, the test system will connect the LCR instrument according to the set serial port and baud rate, and judge whether the test fails over time according to the waiting time.

The configuration module matrix refers to: fill in the number in the 'module matrix' option, generally set to 300 or 500, this setting item will take effect during the system test, and the test sequence will be divided by the configured matrix length.

The configuration model information means that the tester needs to specify the name of the project to be tested, select the test model, and select the layer to be tested.

The format of the configuration test report refers to: the radio button selects the report format as 'PDF' or 'Excel', and selects a suitable report format according to the individual needs of the user.

The selection of test items refers to: due to the large number of components in the bill of materials, some testers do not need to test all of them. They can configure this item, select the required test components, exclude unnecessary components, reduce test time, and improve test efficiency.

For example, the test system extracts the power management chip and its position information A1 in the silk screen drawing from the bill of materials, and adds the power management chip to the test object list in the test option interface, when the tester When the power management chip option is selected, the test system adds the test mode information of the power management chip to the test mode option in the test option interface according to the preset test mode information corresponding to each component and chip . When the tester selects a plurality of test objects and their test information by operating the test option interface, and clicks the submit button, the test system executes step S2.

In step S2, the test system generates a test sequence for testing the corresponding test object according to the test information about each selected test object acquired from the test option interface.

Specifically, the test system generates a test sequence for each test object acquired by the test according to the preset correspondence between each test object, test information and test sequence. Wherein, the test sequence is one or more test programs for testing the test object. After each test program is executed, test results will be generated. Among them, some test programs may control the external equipment connected to the computer equipment to complete the corresponding test, and obtain test intermediate data or test results from the external equipment.

Preferably, the test system stores the generated test sequences and test objects correspondingly.

In step S3, the test system tests the corresponding test objects in the printed circuit board according to each of the test sequences, and saves the results of the completed test sequences.

Specifically, after all test sequences are generated, the test system sequentially tests the test objects in the printed circuit board, and saves the results of the completed test sequences.

If the tester selects the format of the configuration test report, the test system also merges all the saved results corresponding to the printed circuit board into the test report according to the format of the configuration test report provided by the test option interface , and make it available to testers. Wherein, the format of the test report includes but not limited to: pdf format, excel format, etc.

Preferably, during the process of testing the corresponding test objects according to each test sequence, the test system records the currently tested test objects in real time.

For example, the tester selects four test objects and the corresponding test information, and instructs the test system to execute the corresponding test sequence, and saves the The test result of the completed test object, marks the saved test object as completed the test.

When the tester interrupts the test and obtains the relevant design information of the same printed circuit board to be tested again, the test system prompts the tester whether to continue the test, if so, continues the execution of the untested test sequences saved, if If not, re-execute step S1.

For example, the tester selects four test objects and the corresponding test information, and instructs the test system to execute the corresponding test sequence. When the test system completes the tests of all test sequences of the two test objects, the tester passes Clicking the Interrupt button interrupts the test for the remaining two test subjects. When the tester enters the test option interface corresponding to the same printed circuit board again, the test system pops up a prompt box whether to continue the test, if the tester clicks yes, then the test system will continue to perform the remaining tests that are not marked with a completed test The test sequence for the object. On the contrary, if the tester clicks No, the test system executes step S1.

As yet another preferred solution, the testing method further includes step S4 (not shown).

In step S4, the test system queries the test results of the tested test objects according to the query options obtained from the query interface, provides the queried test results to the testers, and according to the location of the queried test objects The information positioning marks the position of the queried test object in the design drawing in the relevant design information.

Specifically, the test system also provides querying of test results of test objects that have completed the test. In the query interface, the tester can select a variety of conditions to query, such as name search, result search, and query of all measured results. The test system displays various query results by color on the corresponding page according to the query conditions of the testers.

When the tester selects the test object to inquire, the test system will not only display the test results of the selected test object on the interface, but also locate the test object in the silk screen diagram according to the CAD coordinates in the relevant design information The exact location and marked with a "+". The test system also supports the zoom function of the silk screen diagram, so that testers can check the wiring conditions around the queried test object and other details.

As shown in Fig. 2, the present invention provides an automatic testing system for printed circuit boards. The test system includes hardware and software installed in computer equipment. Wherein, the computer equipment can be connected with the testing equipment (such as LCR instrument) for testing through the data interface line.

The test system is used to test the function and performance of each single component or combined component in the printed circuit board, and can also test the function and system performance of the entire printed circuit board. The printed circuit board is usually an SMT (Surface Mounted Circuit) first article, and may also be other printed circuit boards to be tested. After completing the hardware connection, the following modules in the test system start to execute.

The testing system 1 includes: a loading module 11 , a testing sequence generating module 12 and a testing module 13 .

The loading module 11 is used to extract a plurality of test objects and the position information of each test object in the printed circuit board from the obtained relevant design information of the printed circuit board to be tested, and display them on the test option interface.

Here, the relevant design information includes, but is not limited to: the bill of materials of the printed circuit board, the CAD coordinates of the printed circuit board, and the silk screen information of the printed circuit board.

Using the operation of the tester, the loading module 11 obtains the relevant design information of the printed circuit board to be tested, and extracts all components, chips, etc. arranged in the printed circuit board according to the format of each relevant design information, to As test objects, and the location information of each test object. Then according to the preset test option interface, put the extracted name and model of each test object in the corresponding option list for configuring the test object. The loading module 11 correspondingly generates at least one piece of test information corresponding to each test object according to the extracted test objects.

The test information includes but is not limited to at least one of the following: configure the test mode of each of the test objects, configure the data interface information of the external device, configure the module matrix, configure the model information, configure the test items, configure the format of the test report .

Wherein, the data interface information of the configuration external device refers to: the loading module 11 needs to be connected to the LCR instrument and the computer during the test, after the serial port appears in the test option interface, click the serial port drop-down list, you will see the port, test Personnel selects the correct port and baud rate to match, and sets the waiting time. After the setting of this project is completed, the loading module 11 will connect the LCR instrument according to the set serial port and baud rate, and judge whether the test fails over time according to the waiting time.

The configuration module matrix refers to: fill in the number in the 'module matrix' option, generally set to 300 or 500, this setting item will take effect during the system test, and the test sequence will be divided by the configured matrix length.

The configuration model information means that the tester needs to specify the name of the project to be tested, select the test model, and select the layer to be tested.

The format of the configuration test report refers to: the radio button selects the report format as 'PDF' or 'Excel', and selects a suitable report format according to the individual needs of the user.

The selection of test items refers to: due to the large number of components in the bill of materials, some testers do not need to test all of them. They can configure this item, select the required test components, exclude unnecessary components, reduce test time, and improve test efficiency.

For example, the loading module 11 extracts the power management chip and its position information A1 in the silk screen drawing from the bill of materials, and adds the power management chip to the test object list in the test option interface. When the personnel selects the option of the power management chip, the loading module 11 adds the test of the power management chip to the test mode option in the test option interface according to the preset test mode information corresponding to each component and chip. mode information. When the tester operates the test option interface to select multiple test objects and their test information, and clicks the submit button, the loading module 11 starts the test sequence generation module 12 .

The test sequence generation module 12 is configured to generate a test sequence for testing the corresponding test object according to the test information about each selected test object acquired from the test option interface.

Specifically, the test sequence generation module 12 generates the test sequences of the test objects acquired by the test according to the preset correspondence between each test object, test information and test sequence. Wherein, the test sequence is one or more test programs for testing the test object. After each test program is executed, test results will be generated. Among them, some test programs may control the external equipment connected to the computer equipment to complete the corresponding test, and obtain test intermediate data or test results from the external equipment.

Preferably, the test sequence generating module 12 stores the generated test sequence and the test object correspondingly.

The test module 13 is used to test the corresponding test objects in the printed circuit board according to the test sequences, and save the results of the completed test sequences.

Specifically, after all test sequences are generated, the test module 13 sequentially tests the test objects in the printed circuit board, and saves the results of the completed test sequences.

If the tester selects the format of the configuration test report, then the test module 13 will also merge all the saved results corresponding to the printed circuit board into the test report according to the format of the configuration test report provided by the test option interface. , and make it available to testers. Wherein, the format of the test report includes but not limited to: pdf format, excel format, etc.

Preferably, the testing module 13 records the currently tested test objects in real time during the process of testing the corresponding test objects according to each test sequence.

For example, the tester selects four test objects and the corresponding test information, and instructs the test module 13 to execute the corresponding test sequence. Whenever the test module 13 completes the tests for all test sequences of a test object, The test result of the completed test object is saved, and the saved test object is marked to complete the test.

When the tester interrupts the test and obtains the relevant design information of the same printed circuit board to be tested again, the test module 13 prompts the tester whether to continue the test, if so, continues the execution of the untested test sequences saved, If not, re-execute the loading module 11 .

For example, the tester selects four test objects and the corresponding test information, and instructs the test module 13 to execute the corresponding test sequence. When the test module 13 completes the tests of all the test sequences of the two test objects, the test Personnel interrupted the test for the remaining two test subjects by clicking the interrupt button. When the tester enters the test option interface corresponding to the same printed circuit board again, the test module 13 pops up a prompt box whether to continue the test. The test sequence for the remaining test objects. On the contrary, if the tester clicks No, the testing module 13 executes the loading module 11 .

As yet another preferred solution, the test system 1 further includes a query module.

The query module is used to query the test results of the tested test objects according to the query options obtained from the query interface, provide the queried test results to the testers, and locate and mark according to the location information of the queried test objects The position of the inquired test object in the design drawing in the relevant design information.

Specifically, the query module also provides querying of test results of test objects that have been tested. In the query interface, the tester can select a variety of conditions to query, such as name search, result search, and query of all measured results. The query module displays various query results by color on the corresponding page according to the query conditions of the testers.

When the tester selects the test object to inquire, the query module will not only display the test results of the selected test object on the interface, but also locate the test object in the silk screen diagram according to the CAD coordinates in the relevant design information The exact location and marked with a "+". The query module also supports the zoom function of the silk screen image, so that testers can check the wiring conditions around the queried test object and other details.

To sum up, the automatic test method and system for printed circuit boards of the present invention only need to import the relevant design information of printed circuit boards into the test option interface, and then the test items in the printed circuit boards can be screened, and Generate the corresponding test sequence, and provide a test report in a preset format after the test is completed, thereby realizing the full automation of the printed circuit board test and effectively improving the work efficiency of the tester; in addition, the queried test is provided when querying The position information of the object in the printed circuit board design drawing can provide the tester with an accurate test object, avoiding the occurrence of mischecking and misreporting due to similar models of the test object; in addition, after the test is interrupted, The test can be resumed again, effectively preventing the problem that the test cannot be continued due to forgetting the test interruption point after the manual test is interrupted. Therefore, the present invention effectively overcomes various shortcomings in the prior art and has high industrial application value.

The above-mentioned embodiments only illustrate the principles and effects of the present invention, but are not intended to limit the present invention. Anyone skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and technical ideas disclosed in the present invention shall still be covered by the claims of the present invention.

Claims (8)

1. A kind of 1. automated testing method of printed circuit board (PCB), it is characterised in that including：

   Multiple test objects and each test object are extracted from the relevant design information of acquired printed circuit board (PCB) to be tested Positional information in the printed circuit board (PCB), and be shown in test options interface；

   It is corresponding according to the test information on selected each test object for being obtained from the test options interface, generation test The cycle tests of test object；

   Corresponding test object in the printed circuit board (PCB) is tested according to each cycle tests, and by completed survey The result of examination sequence is preserved；

   After the step of cycle tests of corresponding test object is tested in generation, in addition to：By the cycle tests generated and survey Try the corresponding preservation of object；

   It is corresponding, it is described corresponding test object is tested according to each cycle tests during, record is current in real time Complete the test object of test；

   When obtaining the relevant design information of same printed circuit board (PCB) to be tested again, prompt whether tester continues to survey Examination, if so, then continue executing with each cycle tests do not tested preserved, if it is not, then re-executing from acquired to be measured Multiple test objects and each test object are extracted in the relevant design information of the printed circuit board (PCB) of examination in the printed circuit board (PCB) Positional information the step of.
2. 2. the automated testing method of printed circuit board (PCB) according to claim 1, it is characterised in that test option circle Test object selective listing is included in face, and it is following at least one：Test mode, the configuration for configuring each test object are outer Connect the data-interface information of equipment, configuration module matrix, configuration model information, configuration testing project, the lattice of configuration testing report Formula.
3. 3. the automated testing method of printed circuit board (PCB) according to claim 1, it is characterised in that also include：

   Test result according to test object of the query option of query interface to having tested is obtained from is inquired about, and will be inquired about The test result gone out is supplied to tester, and marks inquired about survey according to the positioning of the positional information for the test object inquired about Try the position in design drawing of the object in the relevant design information.
4. 4. the automated testing method of printed circuit board (PCB) according to claim 1, it is characterised in that saving all surveys After the result for trying sequence, in addition to：The form that the configuration testing provided according to the test options interface is reported, will be protected The result for all correspondences printed circuit board (PCB) deposited merges in test report, and is supplied to tester.
5. A kind of 5. automatization test system of printed circuit board (PCB), it is characterised in that including：

   Load-on module, for extracting multiple test objects from the relevant design information of acquired printed circuit board (PCB) to be tested And positional information of each test object in the printed circuit board (PCB), and be shown in test options interface；

   Cycle tests generation module, for according to be obtained from the test options interface on selected each test object Information is tested, the cycle tests of corresponding test object is tested in generation；

   The cycle tests generation module is additionally operable to the cycle tests that will be generated and the corresponding preservation of test object；

   Corresponding, the test module is additionally operable in the process tested according to each cycle tests corresponding test object In, the test object of the current completion test of record in real time；

   When obtaining the relevant design information of same printed circuit board (PCB) to be tested again, the load-on module is additionally operable to prompting and surveyed Whether examination personnel, which continue, is tested, if so, then continuing executing with each cycle tests do not tested preserved, if it is not, then holding again Multiple test objects are extracted from the relevant design information of acquired printed circuit board (PCB) to be tested for row and each test object exists Positional information in the printed circuit board (PCB)；

   Test module, for being tested according to each cycle tests corresponding test object in the printed circuit board (PCB), And the result of completed cycle tests is preserved.
6. 6. the automatization test system of printed circuit board (PCB) according to claim 5, it is characterised in that test option circle Test object selective listing is included in face, and it is following at least one：Test mode, the configuration for configuring each test object are outer Connect the data-interface information of equipment, configuration module matrix, configuration model information, configuration testing project, the lattice of configuration testing report Formula.
7. 7. the automatization test system of printed circuit board (PCB) according to claim 5, it is characterised in that also include：

   Enquiry module, for being carried out according to the test result for being obtained from test object of the query option of query interface to having tested Inquiry, the test result inquired is supplied to tester, and positioned according to the positional information for the test object inquired about Position in design drawing of the inquired about test object of mark in the relevant design information.
8. 8. the automatization test system of printed circuit board (PCB) according to claim 5, it is characterised in that the test module is also The form reported for the configuration testing provided according to the test options interface, all correspondences printing that will be preserved The result of circuit board merges in test report, and is supplied to tester.