CN104777415A - Manufacturing process of automatic train identification system host - Google Patents
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- CN104777415A CN104777415A CN201510184184.6A CN201510184184A CN104777415A CN 104777415 A CN104777415 A CN 104777415A CN 201510184184 A CN201510184184 A CN 201510184184A CN 104777415 A CN104777415 A CN 104777415A
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 27
- 238000012360 testing method Methods 0.000 claims abstract description 78
- 230000032683 aging Effects 0.000 claims abstract description 31
- 230000010354 integration Effects 0.000 claims abstract description 14
- 238000007689 inspection Methods 0.000 claims abstract description 9
- 238000005070 sampling Methods 0.000 claims abstract description 9
- 238000004806 packaging method and process Methods 0.000 claims abstract description 6
- 238000003860 storage Methods 0.000 claims abstract description 3
- 238000003466 welding Methods 0.000 claims description 12
- 238000011179 visual inspection Methods 0.000 claims description 3
- 229910000831 Steel Inorganic materials 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
- 239000010959 steel Substances 0.000 claims description 2
- 230000003245 working effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 18
- 230000002950 deficient Effects 0.000 abstract description 9
- 238000012216 screening Methods 0.000 abstract description 8
- 238000007599 discharging Methods 0.000 abstract 1
- 239000000047 product Substances 0.000 description 58
- 230000007547 defect Effects 0.000 description 18
- 238000013461 design Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000035882 stress Effects 0.000 description 4
- 230000005526 G1 to G0 transition Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000008646 thermal stress Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 239000013066 combination product Substances 0.000 description 2
- 229940127555 combination product Drugs 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- 208000025599 Heat Stress disease Diseases 0.000 description 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006355 external stress Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000013557 residual solvent Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention discloses a manufacturing process of an automatic train identification system host. The manufacturing process comprises the following steps: single-board production, single-board no-power temperature cycle test at -35 DEG C to 70 DEG C, single-board programming, single-board test, whole assembly, integration test for the first time, high-temperature aging test of the powered-on whole machine at 60 DEG C to 70 DEG C, integration test for the second time, high/low-temperature sampling inspection and quality inspection, as well as packaging and storage. According to the manufacturing process, early failure products are screened out through the high-temperature aging test of the powered-on whole machine and the aging test at a high temperature, so that the products can proceed into the index stable period; the process maximally enables defective products to be exposed in the processes, is high in screening test efficiency, and eliminates early failures of the products before discharging the products from the factory.
Description
Technical field
The present invention relates to automatic train identification system technical field, particularly a kind of manufacturing process of automatic train identification system main frame.
Background technology
Automatic train identification system is primarily of car number automatic identification main frame, terrestrial microwave antenna, RF cable and the part such as protective equipment, wheel detector composition; The vehicle of its round-the-clock automatic collection monitoring point of energy passes through information.The data message that readout equipment collects: train number, license number, vehicle, a sequence, total number, vehicle time of arrival, vehicle need load information by time and other.Wherein car number automatic identification main frame to grade composition primarily of main control unit, microwave unit (RF unit), interface section, power supply unit, will carry out temperature cycling test and burn-in test etc. in its production run to veneer and complete machine.
As shown in Figure 1, traditional manufacturing process is: SMT paster, connector welding; Monoboard programme burning; Single-board testing; Final assembly; Integration testing; Normal temperature adds voltage ageing; Electrical testing on complete machine Wen Xun; Integration testing; Quality inspection; Packaging and other steps.But electronic product is when manufacturing, because the reason designing unreasonable, starting material or technological measure aspect causes the defect of product, this kind of defect can not find with general means of testing, and need in use little by little to be exposed, as silicon chip surface pollutes, organizes instability, welding cavity, chip and case thermal resistance coupling bad etc.General this defect needs under components and parts work in rated power and normal working temperature, run 1,000 hours and could all be activated or expose.Normal temperature in traditional handicraft powers up aging process, usual employing be the stability that test products is energized work 72H hour continuously, reach the object of screening defect, and do not reach 72 hours in the operating process of reality, so be difficult to filter out defective components and parts at all.The defect of electrical testing on another aspect complete machine Wen Xun: 1. the time is short: temperature is followed the time and only had 7.5H, amounts to the temperature variation in 5 cycles, can not reach the object of screening existing defects device.2. the time interval of temperature variation is too short, and complete machine inside does not reach design temperature and external environment condition just starts change, causes complete machine aging effect not good.
Summary of the invention
The deficiencies in the prior art in view of the above, the object of invention is the manufacturing process providing a kind of automatic train identification system main frame, defective product can be made to come out in process for making, filter out the defective product of tool efficiently, reduce the probability that faulty goods comes into the market.
For achieving the above object and other relevant objects, the invention provides a kind of manufacturing process of automatic train identification system main frame, at least comprise the following steps, sheet making, veneer do not power on, and temperature follows test, monoboard programme burning, single-board testing, complete machine is assembled, integration testing, the test of complete machine powering high temperature ageing, second time integration testing, high/low temperature sampling observation and quality inspection and packaging are put in storage for the first time.
Adopt above-mentioned technique, not powered on by the veneer set up, temperature follows test, complete machine powering high temperature ageing is tested and high/low temperature sampling observation test, reaches the object that product temperature follows test; The veneer temperature that do not power on follows test, namely being executed by change of temperature test is stressed on device, with decision device whether correctly design or manufacture, thus reach screening device inferior, check the welding quality of SMT veneer, the reliability of determining device welding, as bad in SMT, frangible and non-refractory device etc.; Directly just detect after veneer assembles, relative to traditional technique, can screen product timely, can prevent faulty goods from flowing into downstream, affect the quality of follow-up completed knocked down products and interference is caused to subsequent detection result; And tested by complete machine powering high temperature ageing, by the aging test under hot conditions, sift out initial failure product; Product is made to enter index stationary phase in advance; Burn-in test is powered up relative to traditional normal temperature, the work of product high temperature ageing works 40 hours under within one hour, being equivalent to normal temperature, shorten test duration testing efficiency to be improved, calculated according to 1000 hours electron device initial failure time, as long as product is at high temperature ageing work 25 hours, the initial failure time can be screened lower than the electron device of 1000 hours; And traditional normal temperature adds electrical ageing test is usually no more than 72 hours, the defective product of tool can not be made to come out completely.Therefore this technique can make the defective product of tool come out in technological process to greatest extent, and filler test efficiency is high, as far as possible the initial failure of product is eliminated before product export.
As preferably: described sheet making comprises SMT paster and plug connector welding, and after completing, visual inspection is qualified, carry out the veneer temperature that do not power on and follow test.
As preferably: the described veneer temperature that do not power on is followed probe temperature test specification and is-35 DEG C to 70 DEG C.
As preferably: described complete machine powering high temperature ageing test is for making complete machine continuous working at least 25 hours in 60 DEG C to 70 DEG C temperature ranges, and checking product is energized the stability of work continuously, filters out underproof product.
As preferably: described complete machine assembling is included in provided with fan in cabinet, power supply, switch, LED board, motherboard, meter shaft plate and read write line and line.
As preferably: the step being also provided with parameter configuration after described complete machine assembling, described parameter configuration comprises the configuration of meter shaft board parameter and read write line parameter configuration.
As preferably: described first time integration testing comprise test serial ports and whether to upgrade underlying programs and detect serial ports license number, magnet steel data.
As mentioned above, the beneficial effect of the invention is: the welding quality that can check SMT veneer after sheet making completes in time, the reliability of determining device welding, effectively prevents faulty goods from flowing into downstream; Functional parameter measurement is carried out after complete machine powering high temperature ageing, the components and parts of inefficacy or variate are rejected in screening, the defective product of tool can be made to greatest extent to come out in technological process, filler test efficiency is high, as far as possible the initial failure of product was eliminated before product export, and by the aging test under hot conditions, sift out initial failure product; Product is made to enter index stationary phase in advance; Power up burn-in test relative to traditional normal temperature, the work of product high temperature ageing works 40 hours under within one hour, being equivalent to normal temperature, and shorten test duration testing efficiency and be improved, test result is more reliable relative to traditional handicraft.
Accompanying drawing explanation
Fig. 1 is conventional fabrication processes process flow diagram;
Fig. 2 is present invention process process flow diagram.
Embodiment
By particular specific embodiment, working of an invention mode is described below, person skilled in the art scholar the content disclosed by this instructions can understand other advantages and effect of invention easily.
Figure 1 shows that traditional manufacturing process comprises: SMT paster, connector welding; Monoboard programme burning; Single-board testing; Final assembly; Integration testing; Normal temperature adds voltage ageing; Electrical testing on complete machine Wen Xun; Integration testing; Quality inspection; Packaging and other steps.Normal temperature in traditional handicraft powers up aging process, usual employing be the stability that test products is energized work 72H hour continuously, reach the object of screening defect, and do not reach 72 hours in the operating process of reality, so be difficult to filter out defective components and parts at all.
As shown in Figure 2, the invention provides a kind of manufacturing process of automatic train identification system main frame, comprise the following steps, first make veneer by steps such as SMT paster, connector weldings; Veneer carries out the veneer temperature that do not power on and follows test after AOI automated optical inspection, visual inspection are qualified, and Range of measuring temp is-35 DEG C to 70 DEG C, i.e. the situation of testing single-board under-35 DEG C to 70 DEG C temperature conditions; Then carry out monoboard programme burning, comprise programming bootloader, programming underlying programs and programming FPGA program etc.; Then carry out single-board testing, single-board testing carries out device on board to carry out testing performance index, ensures that the performance of device reaches design and processes requirement, filter out components and parts veneer not meeting performance index; Complete machine is assembled, and is included in provided with fan in cabinet, power supply, switch, LED board, motherboard, meter shaft plate and read write line and line etc.; Complete machine installs the configuration of laggard line parameter, comprises the configuration of meter shaft board parameter and read write line parameter configuration; Carry out first time integration testing again, to the visual examination of product, product function and performance are tested, verify that whether the product after having assembled is qualified; Then carry out the test of complete machine powering high temperature ageing, make complete machine continuous working at least 25 hours in 60 DEG C to 70 DEG C temperature ranges, checking product is energized the stability of work continuously, filters out underproof product.Then carry out second time integration testing, to the visual examination of product, test product function and performance, fundamental purpose of this test is in order to whether product after verifying high temperature ageing is qualified; Finally carry out high/low temperature sampling observation; Function is rechecked; Quality inspection; On-the-spot car of crossing is tested; Specification product packaging warehouse-in, defective product returns corresponding operation and makes.
Wherein, the veneer temperature that do not power on follows acting as of test:
Its object of change of temperature test is stressed on device for executing, and to determine device whether correctly design or manufacture, thus reaches screening device inferior, as bad in SMT, frangible and non-refractory device etc.; Temperature cycles is in temperature cycles process, and high thermal stress and heat fatigue reciprocation, on product, affect the machinery of product, physical chemistry and electric property:
Machinery: because product is made up of different materials, the difference of material expansion coefficient produces mechanical stress, and when bearing the thermal stress of the two-way change of high/low temperature, STRESS VARIATION produces useful effect in joint portion, and defect is exposed
Physical chemistry: the hardening at low temperatures embrittlements of material such as the rubber in product and organic plastics, softening lax under high temperature, when exceeding serviceability temperature scope, its mechanical property and anti-damping behavior all can change, and cause product failure;
Electric property: high temperature can cause circuit temperature drift to occur, increasing circuit thermal value, accelerates the aging even thermal breakdown of insulator, affect semiconductor devices as the enlargement factor of triode with penetrate electricity, thus cause product failure;
The fault mode that temperature cycles is sent out thoroughly: parameter drift and circuit stability; The defects such as circuit board open circuit, short circuit, layering; Circuit board corrosion, crackle, surface and mistake hole defect; Component defects, loosen, assemble improper or misloading; Junction breakdown, snap, the weld defects such as cold welding, rosin joint; Line uphold or loosen and electric wire turn around, connect bad, loose contact, bonding loosely, securing member defect, brittle fracture; Electromigration, heat coupling, metallization, seal failure etc.Combination product temperature is followed condition and product BOM (Primary Component specifications) and is set temperature and follow operational temperature conditions.
Wherein complete machine powering high temperature ageing test Main Function and object are:
Electronic product is when manufacturing, and because the reason designing unreasonable, starting material or technological measure aspect causes the quality problems of product to have two classes, the first kind is that the performance parameter of product is not up to standard, and the product of production does not meet request for utilization; Equations of The Second Kind is potential defect, and this kind of defect can not find with general means of testing, and needs in use little by little to be exposed, as silicon chip surface pollutes, organizes instability, welding cavity, chip and case thermal resistance coupling bad etc.General this defect needs under components and parts work in rated power and normal working temperature, run 1,000 hours and could all be activated or expose.Obviously, within 1,000 hours, be unpractical to every component testing, so need to apply thermal stress and bias voltage to it, such as, carry out high temperature power stress test, accelerate exposing ahead of time of this kind of defect.Namely apply heat, electricity, machinery or multiple comprehensive external stress to electronic product, simulate harsh working environment, eliminate the material such as machining stress and residual solvent, latent fault is occurred in advance, make product pass through inefficacy bathtub characteristic initial stage as early as possible, enter highly reliable stationary phase.Carry out functional parameter measurement after aging, the components and parts of inefficacy or variate are rejected in screening, as far as possible the initial failure of product are eliminated before product export.
According to high temperature ageing accelerator coefficient formula, product high temperature ageing work one hour can be calculated, work under being equivalent to normal temperature 40 hours.Calculated according to 1000 hours electron device initial failure time, as long as product is at high temperature ageing work 25 hours, the electron device of initial failure time lower than 1000 hours can be screened in theory, 72 hours aging relative to traditional handicraft normal temperature, present invention process more can find product early defect.Combination product aging condition and product BOM (Primary Component specifications) set aging operational temperature conditions, are 60 DEG C in this example.
High/low temperature sampling observation object: under the environment of analog temperature cataclysm, properties of product can or can not change, or fault.(reference standard GBT2423).Sampling observation standard: according to GB2828-2003 sampling plan, general survey level, tightened inspection single sampling plan performs.Inspected by random samples by high/low temperature and determine that whether product is qualified further, improve the reliability of technique.
On-the-spot car of crossing is tested: product is testing results under actual working environment, and test data meets production test scene and crosses car criterion, ensures the quality of finished product and functional requirement.
Any person skilled in the art scholar all under the spirit and category of invention, can modify above-described embodiment or changes.Therefore, such as have in art and usually know that the knowledgeable modifies or changes not departing from all equivalences completed under the spirit and technological thought that invention discloses, must be contained by the claim of inventing.
Claims (7)
1. the manufacturing process of an automatic train identification system main frame, it is characterized in that: at least comprise the following steps, sheet making, veneer do not power on, and temperature follows test, monoboard programme burning, single-board testing, complete machine is assembled, integration testing, the test of complete machine powering high temperature ageing, second time integration testing, high/low temperature sampling observation and quality inspection and packaging are put in storage for the first time.
2. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, is characterized in that: described sheet making comprises SMT paster and plug connector welding, and after completing, visual inspection is qualified, carries out the veneer temperature that do not power on and follows test.
3. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, is characterized in that: the described veneer temperature that do not power on is followed probe temperature test specification and is-35 DEG C to 70 DEG C.
4. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, it is characterized in that: described complete machine powering high temperature ageing test is for making complete machine 60 DEG C to 70 DEG C temperature continuous workings at least 25 hours, checking product is energized the stability of work continuously, filters out underproof product.
5. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, is characterized in that: described complete machine assembling is included in provided with fan in cabinet, power supply, switch, LED board, motherboard, meter shaft plate and read write line and line.
6. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, is characterized in that: the step being also provided with parameter configuration after described complete machine assembling, described parameter configuration comprises the configuration of meter shaft board parameter and read write line parameter configuration.
7. the manufacturing process of a kind of automatic train identification system main frame according to claim 1, is characterized in that: described first time integration testing comprise test serial ports and whether to upgrade underlying programs and detect serial ports license number, magnet steel data.
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| CN201510184184.6A CN104777415A (en) | 2015-04-17 | 2015-04-17 | Manufacturing process of automatic train identification system host |
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| CN201510184184.6A CN104777415A (en) | 2015-04-17 | 2015-04-17 | Manufacturing process of automatic train identification system host |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105791725A (en) * | 2016-03-14 | 2016-07-20 | 东莞康佳电子有限公司 | Ultra-high-definition human-computer interaction TV production line technology |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0461251A (en) * | 1990-06-28 | 1992-02-27 | Nec Corp | Manufacture control system of semiconductor device |
| JP3020574B2 (en) * | 1990-09-12 | 2000-03-15 | 株式会社日立製作所 | Method for manufacturing semiconductor device |
| CN1275850A (en) * | 1999-05-29 | 2000-12-06 | 深圳市中兴通讯股份有限公司 | Aging method for user's board of programmable switch board |
| CN101071148A (en) * | 2007-06-06 | 2007-11-14 | 杭州华三通信技术有限公司 | Electronic device and method for realizing dynamic environmental stress screening |
| CN102495307A (en) * | 2011-11-28 | 2012-06-13 | 四川长虹电器股份有限公司 | Flat panel television reliability test method |
| CN103336237A (en) * | 2013-06-28 | 2013-10-02 | 上海宏力半导体制造有限公司 | Built-in endurance test system, aging test device and corresponding endurance testing method |
| CN103389319A (en) * | 2012-05-10 | 2013-11-13 | 海洋王（东莞）照明科技有限公司 | Test method and test system for quickly exposing printed circuit board soldering defects |
| CN103645394A (en) * | 2013-11-12 | 2014-03-19 | 陕西国力信息技术有限公司 | AMT-system temperature cycle test method |
-
2015
- 2015-04-17 CN CN201510184184.6A patent/CN104777415A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0461251A (en) * | 1990-06-28 | 1992-02-27 | Nec Corp | Manufacture control system of semiconductor device |
| JP3020574B2 (en) * | 1990-09-12 | 2000-03-15 | 株式会社日立製作所 | Method for manufacturing semiconductor device |
| CN1275850A (en) * | 1999-05-29 | 2000-12-06 | 深圳市中兴通讯股份有限公司 | Aging method for user's board of programmable switch board |
| CN101071148A (en) * | 2007-06-06 | 2007-11-14 | 杭州华三通信技术有限公司 | Electronic device and method for realizing dynamic environmental stress screening |
| CN102495307A (en) * | 2011-11-28 | 2012-06-13 | 四川长虹电器股份有限公司 | Flat panel television reliability test method |
| CN103389319A (en) * | 2012-05-10 | 2013-11-13 | 海洋王（东莞）照明科技有限公司 | Test method and test system for quickly exposing printed circuit board soldering defects |
| CN103336237A (en) * | 2013-06-28 | 2013-10-02 | 上海宏力半导体制造有限公司 | Built-in endurance test system, aging test device and corresponding endurance testing method |
| CN103645394A (en) * | 2013-11-12 | 2014-03-19 | 陕西国力信息技术有限公司 | AMT-system temperature cycle test method |
Non-Patent Citations (5)
| Title |
|---|
| 中国人民解放军总装备部: "《GJB 548B-2005微电子器件试验方法和程序》", 2 October 2005, 中国可靠性网 * |
| 刘忠东: "铁路车号自动识别系统", 《铁路计算机应用》 * |
| 毕胜: "铁路车号自动识别系统在天铁的应用", 《天津冶金》 * |
| 深圳市大稳科技有限公司: "《环境应力筛选（ESS）试验技术探讨》", 24 December 2010 * |
| 郭晓甫: "继电保护装置单板老化工艺及实施", 《电子工艺技术》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105791725A (en) * | 2016-03-14 | 2016-07-20 | 东莞康佳电子有限公司 | Ultra-high-definition human-computer interaction TV production line technology |
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