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CN104680979B - Oled显示装置和用于矫正oled显示装置的残像的方法 - Google Patents

Oled显示装置和用于矫正oled显示装置的残像的方法 Download PDF

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CN104680979B
CN104680979B CN201510126192.5A CN201510126192A CN104680979B CN 104680979 B CN104680979 B CN 104680979B CN 201510126192 A CN201510126192 A CN 201510126192A CN 104680979 B CN104680979 B CN 104680979B
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CN104680979A (zh
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解红军
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BOE Technology Group Co Ltd
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Priority to EP15831213.2A priority patent/EP3276600A4/en
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    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
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    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
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    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
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    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
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    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
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    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
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    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/045—Compensation of drifts in the characteristics of light emitting or modulating elements
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    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/046—Dealing with screen burn-in prevention or compensation of the effects thereof
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    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
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    • G09G2320/0626—Adjustment of display parameters for control of overall brightness

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Abstract

根据本发明实施例提供的OLED显示装置和用于矫正OLED显示装置的残像的方法，可以使用多种方式来检测OLED像素阵列中各个OLED像素的老化程度，从而能够通过调整各个OLED像素的老化程度来矫正OLED显示装置的残像。

Description

OLED显示装置和用于矫正OLED显示装置的残像的方法
技术领域
本发明涉及显示技术领域，尤其涉及一种OLED显示装置和用于矫正OLED显示装置的残像的方法。
背景技术
OLED(Organic Light-Emitting Diode)显示器是一种全固态、主动发光型显示器。OLED显示器具有高亮度、高对比度、超薄超轻、低功耗、无视角限制、工作温度范围广等特性，因此被认为是新兴的下一代显示器。
有源矩阵OLED（AMOLED）显示面板与薄膜晶体管液晶显示器（TFT-LCD）产品特性具有很大的差异。AMOLED显示技术发展到现在，尤为突出的问题就是显示残像。残像与显示图像的轮廓有关。不同的显示灰阶会造成驱动薄膜晶体管漏极电流的巨大差异；同时，各个薄膜晶体管（TFT）的栅源极电压（Vgs）之间的的不同对各个薄膜晶体管也产生了不同的电压耐受性（stress）影响；因此，在屏幕上，有可能以显示图像为轮廓，对显示器上的OLED像素产生不同的TFT阈值电压（Vth）漂移。
另外，长期使用之后，OLED显示屏的电致发光材料会有老化，发光效率就会降低。这也会造成OLED显示屏的残像。
发明内容
有鉴于此，本发明实施例提供了一种能够矫正残像的OLED显示装置和用于矫正OLED显示装置的残像的方法。
因此，本发明实施例提供了一种OLED显示装置，所述OLED显示装置包括OLED像素阵列；所述OLED显示装置还包括：像素检测电路，用于检测所述OLED像素阵列中各个OLED像素的老化程度；其中，通过将老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同；所述老化图像中每个像素的亮度与该像素的老化程度成反比。
本发明实施例提供的上述OLED显示装置利用像素检测电路检测OLED像素阵列中各个OLED像素的老化程度，从而能够通过调整各个OLED像素的老化程度来矫正OLED显示装置的残像。
较佳地，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示，所述像素检测电路适于获取各个OLED像素中驱动薄膜晶体管的阈值电压。
具体地，所述像素检测电路通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
较佳地，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示，所述像素检测电路适于检测各个OLED像素中跨越OLED的电压。
较佳地，所述OLED显示装置还包括：计时电路，用于以预定的时间间隔启动所述像素检测电路。
本发明实施例还提供了一种用于矫正OLED显示装置的残像的方法，所述OLED显示装置包括OLED像素阵列；所述方法包括：检测所述OLED像素阵列中各个OLED像素的老化程度；以及对OLED像素阵列中的各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同。
较佳地，对OLED像素阵列中的各个OLED像素分别地进行老化包括：通过将老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化；所述老化图像中每个像素的亮度与该像素的老化程度成反比。
较佳地，检测所述OLED像素阵列中各个OLED像素的老化程度包括：利用像素检测电路检测所述OLED像素阵列中各个OLED像素的老化程度。
较佳地，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示。
较佳地，通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
较佳地，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示。
较佳地，检测所述OLED像素阵列中各个OLED像素的老化程度包括：利用对所述OLED像素阵列的光学成像来检测所述OLED像素阵列中各个OLED像素的老化程度。
较佳地，所述各个OLED像素的老化程度由各个OLED像素的亮度来指示。
较佳地，所述方法还包括：在所述老化步骤之后，增加各个OLED像素对应于非零灰阶的数据线电压和/或驱动电压。
较佳地，所述方法还包括：以预定的时间间隔执行所述检测步骤和老化步骤。
附图说明
图1a示出了根据本发明实施例的OLED显示装置中的OLED像素电路的示意图；
图1b示出了利用图1a所示的OLED像素电路来检测流经驱动薄膜晶体管的电流；
图1c示出了利用图1a所示的OLED像素电路来检测OLED像素中跨越OLED的电压；
图2示出了根据本发明实施例的用于矫正OLED显示装置残像的方法的流程图；以及
图3示出了根据本发明另一实施例的用于矫正OLED显示装置残像的方法的流程图。
具体实施方式
下面结合附图，对本发明实施例提供的OLED显示装置以及用于矫正OLED显示装置残像的方法的具体实施方式进行详细地说明。
本发明实施例提供的一种OLED显示装置包括OLED像素阵列；所述OLED显示装置还包括：像素检测电路，用于检测所述OLED像素阵列中各个OLED像素的老化程度；其中，通过将老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同；所述老化图像中每个像素的亮度与该像素的老化程度成反比。
本发明实施例提供的上述OLED显示装置利用像素检测电路检测OLED像素阵列中各个OLED像素的老化程度，从而能够通过调整各个OLED像素的老化程度来矫正OLED显示装置的残像。
例如，可以利用某个像素的诸如驱动薄膜晶体管的阈值电压和跨越OLED的电压中的至少一项参数来形成该像素的残像数据，进而获得整个显示屏上各个像素的的残像数据。将每个像素的残像数据取反（reverse）（并且可选地，按比例放大），就获得了老化图像。以预定的时间长度将老化图像显示在OLED显示装置上，从而实现了老化。
在本发明的上下文中，可以使用与OLED像素的老化相关联的参数（例如但不限于：驱动薄膜晶体管的阈值电压、跨越OLED的电压）来表征OLED像素的“老化程度”；同样，也可以使用归一化的值或换算后的其他数值来表示OLED像素的“老化程度”。
以下将以图1a-1c中所示的非限制性的实例来说明所述像素检测电路。如图1a所示，在OLED显示装置的OLED像素电路中：漏极电压VDD连接至驱动薄膜晶体管T1的漏极；驱动薄膜晶体管T1的源极连接至OLED的一端；OLED的另一端与VSS相连；扫描线G1控制选址薄膜晶体管 T2；切换薄膜晶体管T3的源极与驱动薄膜晶体管 T1的源极相连，T3的漏极连接至感测线Sense；并且，扫描线G2控制切换薄膜晶体管T3。
在现有技术中，感测线Sense通常仅用于以外部补偿的方式来补偿各个OLED像素的亮度，使得在相同的灰阶下，各个OLED像素的亮度趋于一致。发明人意识到，利用包括例如感测线Sense的检测电路，能够精确、直接地获得各个OLED像素的电气状态，因此非常适于检测各个OLED像素的老化程度。
如图1b所示，利用扫描线G2开启切换薄膜晶体管T3，使得驱动薄膜晶体管 T1的电流经过切换薄膜晶体管T3流入感测线Sense（如图1b中的箭头所示）。因此，通过检测流经驱动薄膜晶体管的电流可以获得各个OLED像素中驱动薄膜晶体管的阈值电压。
因此，较佳地，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示，所述像素检测电路适于获取各个OLED像素中驱动薄膜晶体管的阈值电压。
具体地，所述像素检测电路通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
如图1c所示，利用扫描线G1关闭驱动薄膜晶体管T1；利用扫描线G2打开切换薄膜晶体管；同时，利用感测线Sense传送固定电流（如图1c中的箭头所示）。以这种方式，可以检测感测线Sense的电压，从而获得跨越OLED的电压。
因此，较佳地，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示，所述像素检测电路适于检测各个OLED像素中跨越OLED的电压。
尽管以图1a-1c所示的方式图示了本发明实施例的像素检测电路，本领域技术人员能够理解，能够检测例如驱动薄膜晶体管的阈值电压和/或跨越OLED的电压的其他形式的电路同样可以适用于本发明。例如，还可以使用同一条扫描线来控制图1a-1c中的选址薄膜晶体管 T2和切换薄膜晶体管T3。
较佳地，所述OLED显示装置还包括：计时电路，用于以预定的时间间隔启动所述像素检测电路。通过以预定的时间间隔启动所述像素检测电路，能够自动、灵活地实现残像的矫正。
本发明实施例还提供了一种用于矫正OLED显示装置的残像的方法，所述OLED显示装置包括OLED像素阵列；所述方法包括：检测所述OLED像素阵列中各个OLED像素的老化程度；以及对OLED像素阵列中的各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同。
本发明实施例提供的上述方法检测OLED像素阵列中各个OLED像素的老化程度，从而能够通过调整各个OLED像素的老化程度来矫正OLED显示装置的残像。
较佳地，对OLED像素阵列中的各个OLED像素分别地进行老化包括：通过将老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化；所述老化图像中每个像素的亮度与该像素的老化程度成反比。
例如，可以利用某个像素的诸如驱动薄膜晶体管的阈值电压和跨越OLED的电压中的至少一项参数来形成该像素的残像数据，进而获得整个显示屏上各个像素的残像数据。将每个像素的残像数据取反（并且可选地，按比例放大），就获得了老化图像。以预定的时间长度将老化图像显示在OLED显示装置上，从而实现了老化。
较佳地，检测所述OLED像素阵列中各个OLED像素的老化程度包括：利用像素检测电路检测所述OLED像素阵列中各个OLED像素的老化程度。图2示出了根据本发明实施例的用于矫正OLED显示装置残像的方法的流程图。在该实施例中，用于矫正OLED显示装置残像的方法可以包括：
步骤S11：利用像素检测电路检测OLED像素阵列中各个OLED像素的老化程度（例如：驱动薄膜晶体管的阈值电压和/或跨越OLED的电压）；
步骤S12：利用各个OLED像素的老化程度生成老化图像；
步骤S13：利用老化图像对OLED像素阵列中的各个OLED像素分别地进行老化；以及
可选的步骤S14：利用像素检测电路判断OLED像素阵列中各个OLED像素的老化程度是否一致；如果各个OLED像素的老化程度不一致，则重新执行步骤S12。例如，OLED像素阵列中各个OLED像素的老化程度的最大差值大于平均老化程度的4%时，可以认为各个OLED像素的老化程度不一致。
因此，较佳地，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示。
较佳地，通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
较佳地，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示。
较佳地，检测所述OLED像素阵列中各个OLED像素的老化程度包括：利用对所述OLED像素阵列的光学成像来检测所述OLED像素阵列中各个OLED像素的老化程度。图3示出了根据本发明另一实施例的用于矫正OLED显示装置残像的方法的流程图。
在该实施例中，用于矫正OLED显示装置残像的方法可以包括：
步骤S21：利用对所述OLED像素阵列的光学成像来检测OLED像素阵列中各个OLED像素的老化程度（例如：某一灰阶下各个OLED像素的亮度）；
步骤S22：利用各个OLED像素的老化程度生成老化图像；
步骤S23：利用老化图像对OLED像素阵列中的各个OLED像素分别地进行老化；以及
可选的步骤S24：利用对所述OLED像素阵列的光学成像来判断OLED像素阵列中各个OLED像素的老化程度是否一致；如果各个OLED像素的老化程度不一致，则重新执行步骤S22。例如，OLED像素阵列中各个OLED像素的老化程度的最大差值大于平均老化程度的4%时，可以认为各个OLED像素的老化程度不一致。
因此，较佳地，所述各个OLED像素的老化程度由各个OLED像素的亮度来指示。
例如，如果用户在使用AMOLED产品的过程中发现残像，可以利用光学设备对AMOLED显示屏进行拍照，从而获得OLED像素阵列中各个OLED像素的老化程度。
较佳地，所述方法还包括：在所述老化步骤（例如，图2中的步骤13和图3中的步骤S23）之后，增加各个OLED像素对应于非零灰阶的数据线电压和/或驱动电压，从而恢复所述OLED显示装置的整体亮度。
较佳地，所述方法还包括：以预定的时间间隔执行所述检测步骤（例如，图2中的步骤S11和图3中的步骤S21）和老化步骤（例如，图2中的步骤S13和图3中的步骤S23）。通过以预定的时间间隔执行检测步骤和老化步骤，能够自动、灵活地实现残像的矫正。
根据本发明实施例提供的OLED显示装置和用于矫正OLED显示装置的残像的方法，可以使用多种方式来检测OLED像素阵列中各个OLED像素的老化程度，从而能够通过调整各个OLED像素的老化程度来矫正OLED显示装置的残像。
显然，本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样，倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内，则本发明也意图包含这些改动和变型。

Claims (14)

1.一种OLED显示装置，所述OLED显示装置包括OLED像素阵列；其特征在于，所述OLED显示装置还包括：
像素检测电路，用于检测所述OLED像素阵列中各个OLED像素的老化程度；
其中，通过将每个像素的亮度与该像素的老化程度成反比的老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同。
2.如权利要求1所述的OLED显示装置，其特征在于，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示，所述像素检测电路适于获取各个OLED像素中驱动薄膜晶体管的阈值电压。
3.如权利要求2所述的OLED显示装置，其特征在于，所述像素检测电路通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
4.如权利要求1所述的OLED显示装置，其特征在于，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示，所述像素检测电路适于检测各个OLED像素中跨越OLED的电压。
5.如权利要求1所述的OLED显示装置，其特征在于，所述OLED显示装置还包括：
计时电路，用于以预定的时间间隔启动所述像素检测电路。
6.一种用于矫正OLED显示装置的残像的方法，所述OLED显示装置包括OLED像素阵列；其特征在于，所述方法包括：
检测所述OLED像素阵列中各个OLED像素的老化程度；以及
通过将每个像素的亮度与该像素的老化程度成反比的老化图像显示在所述OLED像素阵列上来对所述各个OLED像素分别地进行老化，使得所述各个OLED像素的老化程度相同。
7.如权利要求6所述的方法，其特征在于，检测所述OLED像素阵列中各个OLED像素的老化程度包括：
利用像素检测电路检测所述OLED像素阵列中各个OLED像素的老化程度。
8.如权利要求7所述的方法，其特征在于，所述各个OLED像素的老化程度由各个OLED像素中驱动薄膜晶体管的阈值电压来指示。
9.如权利要求8所述的方法，其特征在于，通过检测流经驱动薄膜晶体管的电流来获得各个OLED像素中驱动薄膜晶体管的阈值电压。
10.如权利要求7所述的方法，其特征在于，所述各个OLED像素的老化程度由各个OLED像素中跨越OLED的电压来指示。
11.如权利要求6所述的方法，其特征在于，检测所述OLED像素阵列中各个OLED像素的老化程度包括：
利用对所述OLED像素阵列的光学成像来检测所述OLED像素阵列中各个OLED像素的老化程度。
12.如权利要求11所述的方法，其特征在于，所述各个OLED像素的老化程度由各个OLED像素的亮度来指示。
13.如权利要求11所述的方法，其特征在于，所述方法还包括：
在所述老化步骤之后，增加各个OLED像素对应于非零灰阶的数据线电压和/或驱动电压。
14.如权利要求6-13之一所述的方法，其特征在于，所述方法还包括：
以预定的时间间隔执行所述检测步骤和老化步骤。
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