CN104658463A - Setting method and setting system for display panel - Google Patents
Setting method and setting system for display panel Download PDFInfo
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- CN104658463A CN104658463A CN201510103158.6A CN201510103158A CN104658463A CN 104658463 A CN104658463 A CN 104658463A CN 201510103158 A CN201510103158 A CN 201510103158A CN 104658463 A CN104658463 A CN 104658463A
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Abstract
The invention provides a setting method and a setting system for a display panel. The setting method comprises the following steps: testing and obtaining the optimal turn-off voltage, suitable for any environment, of transistors in different areas; and recording the optimal turn-off voltage into a display panel, so that the transistors in different areas respectively work according to the optimal turn-off voltage. According to the setting method of the display panel, by testing and obtaining the optimal turn-off voltage, suitable for any environment, of the transistors in different areas and recording the optimal turn-off voltage into the display panel, turn-off current of the transistors in different regions working according to the optimal turn-off voltage in any environment is greatly reduced to ensure that a pixel is kept at sufficient and stable voltage, so that the reject ratio of twinkling, crosstalk or residual images and the like when the display panel displays is greatly reduced.
Description
Technical field
The present invention relates to display technique field, particularly, relate to a kind of method to set up of display panel and system is set.
Background technology
Thin film transistor (TFT) (TFT) on liquid crystal display panel of thin film transistor (TFT-LCD) works the unlatching and the shutoff that control pixel display.TFT device is divided into source electrode, drain electrode and grid, when grid input forward high pressure (as N-shaped TFT), TFT switch opens, make source electrode and drain electrode conducting, signal voltage imports on pixel electrode by signal wire, this makes the voltage of TFT switch opens be cut-in voltage, and electric current is now ON state current (i.e. working current); When grid input negative voltage, TFT switch cuts out, and source electrode is intercepted with drain electrode, and signal voltage cannot import on pixel electrode by signal wire, and the voltage that TFT switch cuts out is shutoff voltage, and electric current is now cut-off current (i.e. leakage current).On liquid crystal panel, opening and shutting off of pixel needs to set according to the output characteristics of TFT, so the working current of liquid crystal panel and cut-off current also depend on the output characteristics of TFT.
Usually, liquid crystal panel is divided into multiple region, and TFT is evenly distributed in regional.In zones of different, the output characteristics of TFT is different, liquid crystal panel is selected a voltage as the cut-in voltage of all TFT near the cut-in voltage of TFT and the current maxima of the setting of shutoff voltage normally on the output characteristic curve of zones of different TFT, and select a voltage as the shutoff voltage of all TFT near current minimum on the output characteristic curve of zones of different TFT.After product development completes, the TFT parameter of all volume production liquid crystal panels is all consistent, and namely on liquid crystal panel, the cut-in voltage of all TFT is all identical, and on liquid crystal panel, the shutoff voltage of all TFT is also all identical.
When the array processes making liquid crystal panel has certain undulatory property time, on liquid crystal panel, the output characteristics of zones of different TFT can change, as shown in Figure 1, the TFT output characteristic curve 6 in the TFT output characteristic curve 4 in region one, the TFT output characteristic curve 5 in region two and region three does not overlap mutually, and therefore on liquid crystal panel, the cut-off current corresponding to shutoff voltage of zones of different TFT is also just different.If the cut-off current of TFT is excessive, pixel can be caused to keep undertension, easily glimmer when liquid crystal panel is shown (Flicker), crosstalk (Crosstalk) or image retention etc. are bad.
In addition, in transmissive type liquid crystal panel, the output characteristics of the same area TFT is subject to the impact of illumination and temperature, output characteristic curve also can offset, as shown in Figure 2, room temperature and illuminance are the TFT output characteristic curve 7 of the same area in the dark surrounds (environment one) of zero, room temperature and illuminance are the TFT output characteristic curve 8 of the same area in the photoenvironment (environment two) of 7000nit and temperature 60-80 DEG C and the TFT output characteristic curve 9 that illuminance is the same area in the photoenvironment (environment three) of 7000nit does not overlap mutually, namely the change of environment can directly cause the cut-off current corresponding to shutoff voltage of the same area TFT to increase, if the cut-off current of TFT is excessive, pixel can be caused equally to keep undertension, glimmer when liquid crystal panel is shown (Flicker), crosstalk (Crosstalk) or image retention etc. are bad.
Summary of the invention
The present invention is directed to the above-mentioned technical matters existed in prior art, a kind of method to set up of display panel is provided and system is set.The method to set up of this display panel is applicable to the best shutoff voltage of any environment by the transistor of test acquisition zones of different, and by best shutoff voltage typing display panel, the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work can be made greatly to reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
The invention provides a kind of method to set up of display panel, described display panel comprises the transistor being positioned at multiple zones of different, and described method to set up comprises: the described transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment; By in display panel described in described best shutoff voltage typing, to make the described transistor of zones of different respectively according to its best shutoff voltage work.
Preferably, the best shutoff voltage that the described transistor that described test obtains zones of different is applicable to any environment comprises:
The output characteristics of described transistor in environment one, environment two and environment three of test zones of different;
In the test of described environment one, described environment two and described environment three, judge whether the output characteristics of described transistor satisfies condition one respectively, condition two and condition three;
When output characteristics all meets described condition one, described condition two and described condition three to described transistor in the test of described environment one, described environment two and described environment three, calculate and obtain the best shutoff voltage that described transistor is applicable to any environment; Otherwise, described transistor fault;
Described environment one is for room temperature and illuminance is zero; Described environment two is for room temperature and illuminance is 7000nit; Described environment three is for temperature 60-80 DEG C and illuminance is 7000nit;
Described condition one is when the grid voltage of described transistor is 15V, and the firing current of described transistor is more than or equal to 0.01 μ A; Described condition two is when the grid voltage of described transistor is-8V, and the cut-off current of described transistor is less than or equal to 2000pA; Described condition three is that the threshold voltage of described transistor is more than or equal to-5V and is less than or equal to 5V.
Preferably, the best shutoff voltage of described transistor equals the mean value of the grid voltage in the output characteristic curve of described transistor in described environment two and described environment three are tested corresponding to drain current minimum value.
Preferably, be burned onto in the driving circuit of described display panel by described best shutoff voltage, the described transistor of zones of different is corresponding respectively tests the respective described best shutoff voltage obtained.
Preferably, after the described transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment, and also comprising before in display panel described in described best shutoff voltage typing: the best shutoff voltage storing the described transistor of zones of different.
Preferably, be provided with multiple described transistor in zones of different described in each, the best shutoff voltage of the described transistor in the same area is identical.
What the present invention also provided a kind of display panel arranges system, described display panel comprises the transistor being positioned at multiple zones of different, the described system that arranges comprises test module and typing module, described test module is applicable to the best shutoff voltage of any environment for testing the described transistor obtaining zones of different, described typing module is used in display panel described in described best shutoff voltage typing, to make the described transistor of zones of different respectively according to its best shutoff voltage work.
Preferably, described test module comprises environmental testing submodule, judges submodule and calculating sub module;
Described environmental testing submodule is for testing the output characteristics of described transistor in environment one, environment two and environment three of zones of different;
Describedly judge that submodule is used for judging respectively in the test of described environment one, described environment two and described environment three whether the output characteristics of described transistor satisfies condition one, condition two and condition three;
Described calculating sub module is used for when in the test of described environment one, described environment two and described environment three, output characteristics all meets described condition one, described condition two and described condition three to described transistor, calculates and obtains the best shutoff voltage that described transistor is applicable to any environment;
Described environment one is for room temperature and illuminance is zero; Described environment two is for room temperature and illuminance is 7000nit; Described environment three is for temperature 60-80 DEG C and illuminance is 7000nit;
Described condition one is when the grid voltage of described transistor is 15V, and the firing current of described transistor is more than or equal to 0.01 μ A; Described condition two is when the grid voltage of described transistor is-8V, and the cut-off current of described transistor is less than or equal to 2000pA; Described condition three is that the threshold voltage of described transistor is more than or equal to-5V and is less than or equal to 5V.
Preferably, described typing module adopts cd-rom recorder, and described best shutoff voltage can be burned onto in the driving circuit of described display panel by described cd-rom recorder.
Preferably, also comprise memory module, described memory module is applicable to the best shutoff voltage of any environment, so that described typing module is by display panel described in described best shutoff voltage typing for the described transistor of zones of different storing the test of described test module and obtain.
Beneficial effect of the present invention: the method to set up of display panel provided by the present invention, the best shutoff voltage of any environment is applicable to by the transistor of test acquisition zones of different, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
Display panel provided by the present invention system is set, by arranging test module and typing module, the best shutoff voltage that the transistor obtaining zones of different is applicable to any environment can be tested, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
Accompanying drawing explanation
Fig. 1 is the output characteristic curve schematic diagram of the TFT of zones of different on liquid crystal panel in prior art;
Fig. 2 is the output characteristic curve schematic diagram of TFT under three kinds of varying environments of the same area on liquid crystal panel in prior art;
Fig. 3 is the process flow diagram of the method to set up of display panel in the embodiment of the present invention 1;
Fig. 4 is the concrete setting procedure figure of step S1 in Fig. 3;
Fig. 5 is the theory diagram of the system that arranges of display panel in the embodiment of the present invention 2.
Description of reference numerals wherein:
1. test module; 11. environmental testing submodules; 12. judge submodule; 13. calculating sub module; 2. typing module; 3. memory module; 4. the TFT output characteristic curve in region one; 5. the TFT output characteristic curve in region two; 6. the TFT output characteristic curve in region three; 7. the output characteristic curve of TFT in environment one of the same area; 8. the output characteristic curve of TFT in environment two of the same area; 9. the output characteristic curve of TFT in environment three of the same area.
Embodiment
For making those skilled in the art understand technical scheme of the present invention better, below in conjunction with the drawings and specific embodiments to the method to set up of a kind of display panel provided by the present invention with arrange system and be described in further detail.
Embodiment 1:
The present embodiment provides a kind of method to set up of display panel, and display panel comprises the transistor being positioned at multiple zones of different, and as shown in Figure 3, this method to set up comprises:
Step S1: the transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment.
This step specifically comprises: as shown in Figure 4,
Step S11: the output characteristics of transistor in environment one, environment two and environment three of test zones of different.
Wherein, environment one is for room temperature and illuminance is zero; Environment two is for room temperature and illuminance is 7000nit; Environment three is for temperature 60-80 DEG C and illuminance is 7000nit.
Step S12: judge in the test of environment one, environment two and environment three whether the output characteristics of transistor satisfies condition one respectively, condition two and condition three.
Step S13: when transistor output characteristics in the test of environment one, environment two and environment three all satisfy condition one, condition two and condition three time, calculate and obtain the best shutoff voltage that transistor is applicable to any environment; Otherwise, transistor fault.
Wherein, condition one is when the grid voltage of transistor is 15V, and the firing current of transistor is more than or equal to 0.01 μ A; Condition two is when the grid voltage of transistor is-8V, and the cut-off current of transistor is less than or equal to 2000pA; Condition three is that the threshold voltage of transistor is more than or equal to-5V and is less than or equal to 5V.
Step S2: by best shutoff voltage typing display panel, to make the transistor of zones of different respectively according to its best shutoff voltage work.
In this step, be burned onto in the driving circuit of display panel by best shutoff voltage, the transistor of zones of different is corresponding respectively tests the respective best shutoff voltage obtained.After best shutoff voltage is burned onto in the driving circuit of display panel, the transistor of zones of different can respectively according to its best shutoff voltage work.
The method to set up of this display panel, the best shutoff voltage of any environment is applicable to by the transistor of test acquisition zones of different, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
In the present embodiment, the best shutoff voltage of transistor equals the mean value of the grid voltage in the output characteristic curve of transistor in environment two and environment three are tested corresponding to drain current minimum value.So determine that the reason of the best shutoff voltage of transistor is: as shown in Figure 2, during the duty of transmissive type liquid crystal panel, transistor makes the highest meeting of environment temperature residing for it reach 60 DEG C-80 DEG C by the backlight illumination of 7000nit illuminance, the output characteristic curve 8 of the output characteristic curve 9 of transistor under the state of temperature (environment three) of this scope comparatively under room temperature state (environment two) can offset to negative pressure direction, simultaneously, the output characteristic curve 9 of transistor under the state of temperature (environment three) of 60 DEG C-80 DEG C offsets relative to the augment direction of the output characteristic curve 8 under room temperature state (environment two) to its drain current.If with grid voltage corresponding to the minimum value of drain current under room temperature (environment two) for shutoff voltage, then the cut-off current of liquid crystal panel when 60 DEG C of-80 DEG C of high temperature (environment three) can be bigger than normal, occurs that flicker, crosstalk or image retention etc. are bad when easily causing liquid crystal panel to show; If with grid voltage corresponding to the minimum value of drain current under 60 DEG C of-80 DEG C of high temperature (environment three) for shutoff voltage, shutoff voltage reduces, simultaneously, the difference of cut-in voltage and shutoff voltage increases, the difference of cut-in voltage and shutoff voltage increases meeting direct pull pixel voltage, pixel voltage is also increased thereupon, and this makes liquid crystal panel equally easily occur that flicker, crosstalk or image retention etc. are bad when display; So consider, get the best shutoff voltage of mean value as transistor of the grid voltage corresponding to minimum value of drain current in the output characteristic curve of transistor under room temperature (environment two) and 60 DEG C of-80 DEG C of high temperature (environment three) photoenvironments.Because environment three is worst a kind of ambient conditions that the transistor on liquid crystal panel can run into, so this best shutoff voltage can make the cut-off current of the transistor of zones of different under any environment greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
In the present embodiment, after the transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment, and also comprising before in best shutoff voltage typing display panel: step S1 ': the best shutoff voltage storing the transistor of zones of different.The setting of this step, the best shutoff voltage of the transistor that test is obtained is repeated quickly and easily as many times as required utilization, in the transistor shutoff voltage setting up procedure of batch display panel, as long as in the display panel of the best shutoff voltage typing batch repeatedly test obtained.
In the present embodiment, be provided with multiple transistor in each zones of different, the best shutoff voltage of the transistor in the same area is identical.Namely it has been generally acknowledged that the output characteristics of transistor display panel being positioned at the same area is identical, after test obtains the best shutoff voltage of certain transistor in a certain region, the shutoff voltage of other transistors in this region is all set to this best shutoff voltage.Setting like this, makes all crystals pipe on display panel test one by one, as long as a transistor in test zones of different, because this reducing the test job amount of the best shutoff voltage of transistor.
The beneficial effect of embodiment 1: the method to set up of the display panel provided in embodiment 1, the best shutoff voltage of any environment is applicable to by the transistor of test acquisition zones of different, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
Embodiment 2:
What the present embodiment provided a kind of display panel arranges system, display panel comprises the transistor being positioned at multiple zones of different, as shown in Figure 5, the system of setting comprises test module 1 and typing module 2, test module 1 is applicable to the best shutoff voltage of any environment for testing the transistor obtaining zones of different, typing module 2 for by best shutoff voltage typing display panel, to make the transistor of zones of different respectively according to its best shutoff voltage work.
This arranges system by arranging test module 1 and typing module 2, the best shutoff voltage that the transistor obtaining zones of different is applicable to any environment can be tested, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce that display panel glimmers when showing, the fraction defective of crosstalk or image retention etc.
In the present embodiment, test module 1 comprises environmental testing submodule 11, judges submodule 12 and calculating sub module 13.Environmental testing submodule 11 is for testing the output characteristics of transistor in environment one, environment two and environment three of zones of different; Judge submodule 12 for judging in the test of environment one, environment two and environment three whether the output characteristics of transistor satisfies condition one respectively, condition two and condition three; Calculating sub module 13 for all satisfying condition one when transistor output characteristics in the test of environment one, environment two and environment three, condition two and condition three time, calculate and obtain the best shutoff voltage that transistor is applicable to any environment.
Wherein, environment one is for room temperature and illuminance is zero; Environment two is for room temperature and illuminance is 7000nit; Environment three is for temperature 60-80 DEG C and illuminance is 7000nit.Condition one is when the grid voltage of transistor is 15V, and the firing current of transistor is more than or equal to 0.01 μ A; Condition two is when the grid voltage of transistor is-8V, and the cut-off current of transistor is less than or equal to 2000pA; Condition three is that the threshold voltage of transistor is more than or equal to-5V and is less than or equal to 5V.
In the present embodiment, the calculated value of best shutoff voltage is in the same manner as in Example 1, repeats no more herein.
In the present embodiment, typing module 2 adopts cd-rom recorder, and best shutoff voltage can be burned onto in the driving circuit of display panel by cd-rom recorder.After best shutoff voltage is burned onto in the driving circuit of display panel, the transistor of zones of different can respectively according to its best shutoff voltage work under any environment.
In the present embodiment, the system that arranges also comprises memory module 3, and the transistor of the zones of different that memory module 3 obtains for On-board test module 1 test is applicable to the best shutoff voltage of any environment, so that typing module 2 is by best shutoff voltage typing display panel.The setting of memory module 3, the best shutoff voltage of the transistor that test is obtained is repeated quickly and easily as many times as required utilization, in the transistor shutoff voltage setting up procedure of batch display panel, as long as in the display panel of the best shutoff voltage typing batch repeatedly test obtained.
The beneficial effect of embodiment 2: the display panel provided in embodiment 2 system is set, by arranging test module and typing module, the best shutoff voltage that the transistor obtaining zones of different is applicable to any environment can be tested, and by best shutoff voltage typing display panel, this can make the cut-off current of transistor under any environment of the zones of different according to its best shutoff voltage work greatly reduce, thus can guarantee that pixel keeps voltage sufficient and stable, and then greatly reduce display panel show time glimmer, the fraction defective of crosstalk or image retention etc.
Be understandable that, the illustrative embodiments that above embodiment is only used to principle of the present invention is described and adopts, but the present invention is not limited thereto.For those skilled in the art, without departing from the spirit and substance in the present invention, can make various modification and improvement, these modification and improvement are also considered as protection scope of the present invention.
Claims (10)
1. a method to set up for display panel, described display panel comprises the transistor being positioned at multiple zones of different, it is characterized in that, described method to set up comprises: the described transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment; By in display panel described in described best shutoff voltage typing, to make the described transistor of zones of different respectively according to its best shutoff voltage work.
2. method to set up according to claim 1, is characterized in that, the best shutoff voltage that the described transistor that described test obtains zones of different is applicable to any environment comprises:
The output characteristics of described transistor in environment one, environment two and environment three of test zones of different;
In the test of described environment one, described environment two and described environment three, judge whether the output characteristics of described transistor satisfies condition one respectively, condition two and condition three;
When output characteristics all meets described condition one, described condition two and described condition three to described transistor in the test of described environment one, described environment two and described environment three, calculate and obtain the best shutoff voltage that described transistor is applicable to any environment; Otherwise, described transistor fault;
Described environment one is for room temperature and illuminance is zero; Described environment two is for room temperature and illuminance is 7000nit; Described environment three is for temperature 60-80 DEG C and illuminance is 7000nit;
Described condition one is when the grid voltage of described transistor is 15V, and the firing current of described transistor is more than or equal to 0.01 μ A; Described condition two is when the grid voltage of described transistor is-8V, and the cut-off current of described transistor is less than or equal to 2000pA; Described condition three is that the threshold voltage of described transistor is more than or equal to-5V and is less than or equal to 5V.
3. method to set up according to claim 2, it is characterized in that, the best shutoff voltage of described transistor equals the mean value of the grid voltage in the output characteristic curve of described transistor in described environment two and described environment three are tested corresponding to drain current minimum value.
4. method to set up according to claim 1, is characterized in that, is burned onto in the driving circuit of described display panel by described best shutoff voltage, and the described transistor of zones of different is corresponding respectively tests the respective described best shutoff voltage obtained.
5. method to set up according to claim 1, it is characterized in that, after the described transistor of test acquisition zones of different is applicable to the best shutoff voltage of any environment, and also comprising before in display panel described in described best shutoff voltage typing: the best shutoff voltage storing the described transistor of zones of different.
6. method to set up according to claim 1, is characterized in that, is provided with multiple described transistor in zones of different described in each, and the best shutoff voltage of the described transistor in the same area is identical.
7. a display panel system is set, described display panel comprises the transistor being positioned at multiple zones of different, it is characterized in that, the described system that arranges comprises test module and typing module, described test module is applicable to the best shutoff voltage of any environment for testing the described transistor obtaining zones of different, described typing module is used in display panel described in described best shutoff voltage typing, to make the described transistor of zones of different respectively according to its best shutoff voltage work.
8. according to claim 7ly arrange system, it is characterized in that, described test module comprises environmental testing submodule, judges submodule and calculating sub module;
Described environmental testing submodule is for testing the output characteristics of described transistor in environment one, environment two and environment three of zones of different;
Describedly judge that submodule is used for judging respectively in the test of described environment one, described environment two and described environment three whether the output characteristics of described transistor satisfies condition one, condition two and condition three;
Described calculating sub module is used for when in the test of described environment one, described environment two and described environment three, output characteristics all meets described condition one, described condition two and described condition three to described transistor, calculates and obtains the best shutoff voltage that described transistor is applicable to any environment;
Described environment one is for room temperature and illuminance is zero; Described environment two is for room temperature and illuminance is 7000nit; Described environment three is for temperature 60-80 DEG C and illuminance is 7000nit;
Described condition one is when the grid voltage of described transistor is 15V, and the firing current of described transistor is more than or equal to 0.01 μ A; Described condition two is when the grid voltage of described transistor is-8V, and the cut-off current of described transistor is less than or equal to 2000pA; Described condition three is that the threshold voltage of described transistor is more than or equal to-5V and is less than or equal to 5V.
9. according to claim 7ly arrange system, it is characterized in that, described typing module adopts cd-rom recorder, and described best shutoff voltage can be burned onto in the driving circuit of described display panel by described cd-rom recorder.
10. according to claim 7 system is set, it is characterized in that, also comprise memory module, described memory module is applicable to the best shutoff voltage of any environment, so that described typing module is by display panel described in described best shutoff voltage typing for the described transistor of zones of different storing the test of described test module and obtain.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106205524A (en) * | 2016-07-13 | 2016-12-07 | 昆山龙腾光电有限公司 | The grid drive method of a kind of display panels, system and device |
| CN115083367A (en) * | 2022-07-20 | 2022-09-20 | Tcl华星光电技术有限公司 | Driving voltage compensation device, display terminal and driving voltage compensation method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101174037A (en) * | 2006-11-01 | 2008-05-07 | 群康科技(深圳)有限公司 | LCD panel driving circuit and LCD |
| CN101604500A (en) * | 2008-06-11 | 2009-12-16 | 旭曜科技股份有限公司 | Burning method of display driver, display driver using same and display |
| CN102237050A (en) * | 2010-04-27 | 2011-11-09 | 北京京东方光电科技有限公司 | Grid driving circuit, grid voltage regulating method and liquid crystal display |
| CN102290438A (en) * | 2010-04-19 | 2011-12-21 | 韩国电子通信研究院 | Variable gate field-effect transistor(FET) and, electrical and electronic apparatus comprising the same fet |
| CN102668062A (en) * | 2009-10-21 | 2012-09-12 | 株式会社半导体能源研究所 | Semiconductor device |
| US20130037815A1 (en) * | 2010-04-16 | 2013-02-14 | Nami Okajima | Semiconductor device |
-
2015
- 2015-03-09 CN CN201510103158.6A patent/CN104658463A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101174037A (en) * | 2006-11-01 | 2008-05-07 | 群康科技(深圳)有限公司 | LCD panel driving circuit and LCD |
| CN101604500A (en) * | 2008-06-11 | 2009-12-16 | 旭曜科技股份有限公司 | Burning method of display driver, display driver using same and display |
| CN102668062A (en) * | 2009-10-21 | 2012-09-12 | 株式会社半导体能源研究所 | Semiconductor device |
| US20130037815A1 (en) * | 2010-04-16 | 2013-02-14 | Nami Okajima | Semiconductor device |
| CN102290438A (en) * | 2010-04-19 | 2011-12-21 | 韩国电子通信研究院 | Variable gate field-effect transistor(FET) and, electrical and electronic apparatus comprising the same fet |
| CN102237050A (en) * | 2010-04-27 | 2011-11-09 | 北京京东方光电科技有限公司 | Grid driving circuit, grid voltage regulating method and liquid crystal display |
Non-Patent Citations (1)
| Title |
|---|
| 肖文俊: "薄膜晶体管液晶显示器的串扰研究", 《中国优秀硕士学位论文全文数据库》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106205524A (en) * | 2016-07-13 | 2016-12-07 | 昆山龙腾光电有限公司 | The grid drive method of a kind of display panels, system and device |
| CN115083367A (en) * | 2022-07-20 | 2022-09-20 | Tcl华星光电技术有限公司 | Driving voltage compensation device, display terminal and driving voltage compensation method |
| CN115083367B (en) * | 2022-07-20 | 2023-06-27 | Tcl华星光电技术有限公司 | Driving voltage compensation device, display terminal and driving voltage compensation method |
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