CN104655998A - Characteristic curve tracking instrument of discrete semiconductor device - Google Patents
Characteristic curve tracking instrument of discrete semiconductor device Download PDFInfo
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- CN104655998A CN104655998A CN201310585083.0A CN201310585083A CN104655998A CN 104655998 A CN104655998 A CN 104655998A CN 201310585083 A CN201310585083 A CN 201310585083A CN 104655998 A CN104655998 A CN 104655998A
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- power amplifier
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- characteristic curve
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 13
- 238000012360 testing method Methods 0.000 claims abstract description 27
- 238000006243 chemical reaction Methods 0.000 claims abstract description 15
- 238000005516 engineering process Methods 0.000 claims abstract description 10
- 238000007689 inspection Methods 0.000 claims abstract description 8
- 239000000523 sample Substances 0.000 claims abstract description 7
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000013461 design Methods 0.000 abstract description 2
- 230000003278 mimic effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000700 radioactive tracer Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a characteristic curve tracking instrument of a discrete semiconductor device. The characteristic curve tracking instrument of the discrete semiconductor device comprises an upper computer, a testing host, an expansion table and a jig, wherein the testing host comprises a lower computer, a manipulator/probe station driving module, a bus conversion module, a data bus module, an AD/DA conversion module, a power amplifier, and a relay array; a self-inspection self-calibration program is installed in the lower computer; the expansion table expands the power amplifier; the design of the 16-bit parallel AD/DA conversion module is adopted, so that the testing speed is high, and the precision is also high; the lower computer is used for controlling so as to realize offline operation; the multi-level Kelvin technology is adopted, so that the system is high in stability and accurate in testing result; the characteristic curve tracking instrument has the complete self-inspection/self-calibration performance; the upper computer is used for displaying, so that the characteristic curve tracking instrument is visually observed, and simple to operate; the characteristic curve tracking instrument can be connected with the manipulator or the probe station, so that the efficiency is high; the data stored in the PC computer are convenient to read and write.
Description
Technical field
The present invention relates to a kind of characterisitic parameter testing tool, especially relate to a kind of by semi-conductor discrete device family curve tracked instrument.
Background technology
Transistor curve tracer it be a kind of instrument can tested the characterisitic parameter of transistor.
" voltage (v)/degree " rotary switch, this rotary switch is one and has 4 kinds of deflecting actions totally 17 rotary switches kept off, and is used for selecting the variable representated by graphic instrument x-axis and multiplying power thereof.When testing the output characteristic curve of low-power transistor, the relevant gear of VCE put by this knob.When measuring input characteristic curve, the relevant gear of VBE put by this knob.
" electric current/degree " rotary switch, this rotary switch is one and has 4 kinds of deflecting actions totally 22 rotary switches kept off, and is used for selecting the variable representated by graphic instrument Y-axis and multiplying power thereof.When testing the output characteristic curve of low-power transistor, the relevant gear of Ic put by this knob.When measuring input characteristics, this knob is put " base current or gate-source voltages " keeps off (instrument panel being decorated with a gear of staircase waveform).
" peak voltage ranges " switch and " crest voltage % " knob: " peak voltage ranges ' ' be the keyswitch of 5 gears." crest voltage % " is continuously adjustable knob.Their acting in conjunction is used to the size controlling " collector scanning voltage ".No matter which gear " peak voltage ranges " is placed in, and all when starting, " crest voltage % " must be placed in 0, then increase to certain value carefully gradually.Otherwise easily damage measured tube.After a pipe is completed, " crest voltage % " knob should pull back to zero.
Produce with mimic channel the control pole that staircase waveform is added in three terminal device, and then produce main pole sweep waveform with mimic channel, main pole sweep waveform rotary switch controls.Mimic channel gathers the signal intensity of main pole, the signal collected is transported on kinescope and shows, the numerical value on artificial reading kinescope or figure.
But this instrumental resolution is not high, measure out of true; Control power supply with rotary switch, can not control the added numerical value required for signal arrival accurately, when also having each rotary switch to rotate to maximum required signal, circle round immediately, if not measured device may be burned; It is an older technology that kinescope shows, at present all with liquid crystal display or LED screen display; Store data floppy disk to store, current read-write is all inconvenient; Can not control mechanical arm or probe station, production efficiency is low.
Summary of the invention
In order to solve the problems of the technologies described above, the invention provides a kind of semi-conductor discrete device family curve tracked instrument.
Technical scheme of the present invention is: semi-conductor discrete device family curve tracking means, by host computer, Test Host, expanding table, tool four part forms, slave computer is comprised in described Test Host, mechanical arm/probe station driver module, bus conversion module, data bus module, AD/DA modular converter, power amplifier, relay array, in described slave computer, self-inspection is housed, self-calibration routines, described expanding table expands described power amplifier, described bus conversion module is after the data that described slave computer is sent here being converted to data compatible on data bus by data conversion chip, be delivered to again in described data bus module.
Described AD/DA modular converter is, by 16 bit parallel D/A chips, the digital signal of data bus module transmission is converted to simulating signal, follow through operational amplifier, amplify, then be just delivered to described data bus module, the simulating signal collected is amplified through operational amplifier, follow 16 bit parallel A/D chips and change into digital signal and send back to described data bus module.
Described Test Host shape is desk-top casing.
Described tool connects described Test Host, described expanding table and measured device, and connected mode adopts Kelvin's technology.
Contain 5 pieces of power amplifier boards inside described expanding table, every block power amplifier board provides 250A electric current, described 5 pieces of power amplifier board parallel connections.
The invention has the beneficial effects as follows that employing 16 bit parallel D/A, A/D design, test speed is fast, and precision is high; Adopt slave computer (embedded computer) to control, realize offline operation; Adopt multistage Kelvin's technology, system stability is high, and test result is accurate; Complete self-inspection/self-calibrating capabilities; Adopt host computer (PC) display, intuitively, good operation; Can connect mechanical arm or probe station, efficiency is high; Data are stored in PC, and read-write is convenient.
Accompanying drawing explanation
Fig. 1: composition structural representation of the present invention;
Fig. 2: bus conversion module structure;
Fig. 3: AD/DA modular converter;
Fig. 4: principle of work and process.
Embodiment
Below in conjunction with accompanying drawing, the present invention is illustrated.
Whole product is made up of, as Fig. 1 computing machine, Test Host, expanding table, tool four part.Test Host shape is desk-top casing, size 450mm (length) × 280mm (height) × 570mm (deeply).
1. host computer is with the PC of windows operating system, and the upper computer software of discrete semiconductor testing system is housed, be mainly used to the editor to test parameter, discrete device parametric results display and to the operation of slave computer Test Host and control.Use host computer programmed control, improve and signal source is accurately provided, easily control, be unlikely to damage measured device.The mode of traditional kinescope display is solved, intuitively with host computer (PC) display.
2. in Test Host, comprise slave computer, mechanical arm/probe station driver module, bus conversion module, data bus module, AD/DA modular converter, power amplifier, relay array.
Self-inspection, self-calibration routines are housed in slave computer, and Test Host connects upper self-inspection tool can carry out self-inspection and self calibration to self.
Bus conversion module is after the data that the PC104 interface of slave computer is sent here being converted to data compatible on data bus by data conversion chip, then is delivered in data bus module, as Fig. 2 by STD bus.
AD/DA modular converter is, by 16 bit parallel D/A chips, the digital signal of data bus module transmission is converted to simulating signal, follow through operational amplifier, amplify, then be just delivered to data bus module, the simulating signal collected is amplified through operational amplifier, follow 16 bit parallel A/D chips and change into digital signal and send back to data bus module.AD/DA modular converter adopts the conversion chip of 16, improves resolution and precision, as Fig. 3.
What the connected mode of Test Host and expanding table, tool adopted is Kelvin's technology.
3. contain 5 pieces of power amplifier boards inside expanding table, every block power amplifier board provides 250A electric current, and 5 pieces of power amplifier board parallel connections, provide 1250A electric current altogether, is the expansion to the power amplifier in Test Host.What the connected mode of expanding table and tool adopted is Kelvin's technology.
4. tool is a kind of coupling arrangement of connecting test main frame, expanding table and measured device, and the connected mode in tool adopts the connected mode of Kelvin's technology, makes measurement accurate.
Principle of work and process are programmed by the interface software in host computer to be sent to slave computer by industrial RS232 serial communication, to be sent instructions by data bus after bus conversion module transforms or data to D/A modular converter, change into simulating signal, through data bus to power amplifier amplifying signal, through data bus relay array selector channel, be added on the pin of measured device finally by tool.Collection signal turns back to relay array through tool and selects loop, by A/D modular converter, changes into digital signal, turn back to host computer interface software to show by RS232 serial ports through slave computer data processing, and be stored in PC hard disk, so that the later stage calls, as Fig. 4.
Claims (5)
1. semi-conductor discrete device family curve tracked instrument, it is characterized in that, by host computer, Test Host, expanding table, tool four part forms, slave computer is comprised in described Test Host, mechanical arm/probe station driver module, bus conversion module, data bus module, AD/DA modular converter, power amplifier, relay array, in described slave computer, self-inspection is housed, self-calibration routines, described expanding table expands described power amplifier, described bus conversion module is after the data that described slave computer is sent here being converted to data compatible on data bus by data conversion chip, be delivered to again in described data bus module.
2. semi-conductor discrete device family curve tracked instrument according to claim 1, it is characterized in that, described AD/DA modular converter is, by 16 bit parallel D/A chips, the digital signal of data bus module transmission is converted to simulating signal, follow through operational amplifier, amplify, then be just delivered to described data bus module, the simulating signal collected is amplified through operational amplifier, follow 16 bit parallel A/D chips and change into digital signal and send back to described data bus module.
3. semi-conductor discrete device family curve tracked instrument according to claim 1, is characterized in that, described Test Host shape is desk-top casing.
4. semi-conductor discrete device family curve tracked instrument according to claim 1, is characterized in that, described tool connects described Test Host, described expanding table and measured device, and connected mode adopts Kelvin's technology.
5. semi-conductor discrete device family curve according to claim 1 is with instrument, and it is characterized in that, contain 5 pieces of power amplifier boards inside described expanding table, every block power amplifier board provides 250A electric current, described 5 pieces of power amplifier board parallel connections.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310585083.0A CN104655998A (en) | 2013-11-20 | 2013-11-20 | Characteristic curve tracking instrument of discrete semiconductor device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310585083.0A CN104655998A (en) | 2013-11-20 | 2013-11-20 | Characteristic curve tracking instrument of discrete semiconductor device |
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| CN104655998A true CN104655998A (en) | 2015-05-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201310585083.0A Pending CN104655998A (en) | 2013-11-20 | 2013-11-20 | Characteristic curve tracking instrument of discrete semiconductor device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597249A (en) * | 2016-10-10 | 2017-04-26 | 中国电子科技集团公司第五十五研究所 | On-chip test system and method of W-waveband low-noise power amplification chip |
| CN110441668A (en) * | 2019-08-19 | 2019-11-12 | 西安易恩电气科技有限公司 | A kind of high-power IGBT test macro |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2514341Y (en) * | 2001-12-18 | 2002-10-02 | 中国石化集团齐鲁石油化工公司 | Automatic corrosion tester |
| CN201004171Y (en) * | 2007-01-22 | 2008-01-09 | 深圳市南方电子系统工程有限公司 | An intelligent integrated monitoring device |
| CN201984137U (en) * | 2010-12-01 | 2011-09-21 | 西安谊邦电子科技有限公司 | Signal generation and sampling treatment device for semi-conductor discrete device testing system |
| CN102278941A (en) * | 2010-06-09 | 2011-12-14 | 思达科技股份有限公司 | test device |
| US8253431B2 (en) * | 2010-05-20 | 2012-08-28 | Advanced Semiconductor Engineering, Inc. | Apparatus and method for testing non-contact pads of a semiconductor device to be tested |
| CN103248542A (en) * | 2013-03-28 | 2013-08-14 | 燕山大学 | Gateway device base on multi-antenna data information fusion |
| CN103267940A (en) * | 2013-05-06 | 2013-08-28 | 上海华岭集成电路技术股份有限公司 | Multi-module parallel test system and multi-module parallel test method |
-
2013
- 2013-11-20 CN CN201310585083.0A patent/CN104655998A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2514341Y (en) * | 2001-12-18 | 2002-10-02 | 中国石化集团齐鲁石油化工公司 | Automatic corrosion tester |
| CN201004171Y (en) * | 2007-01-22 | 2008-01-09 | 深圳市南方电子系统工程有限公司 | An intelligent integrated monitoring device |
| US8253431B2 (en) * | 2010-05-20 | 2012-08-28 | Advanced Semiconductor Engineering, Inc. | Apparatus and method for testing non-contact pads of a semiconductor device to be tested |
| CN102278941A (en) * | 2010-06-09 | 2011-12-14 | 思达科技股份有限公司 | test device |
| CN201984137U (en) * | 2010-12-01 | 2011-09-21 | 西安谊邦电子科技有限公司 | Signal generation and sampling treatment device for semi-conductor discrete device testing system |
| CN103248542A (en) * | 2013-03-28 | 2013-08-14 | 燕山大学 | Gateway device base on multi-antenna data information fusion |
| CN103267940A (en) * | 2013-05-06 | 2013-08-28 | 上海华岭集成电路技术股份有限公司 | Multi-module parallel test system and multi-module parallel test method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597249A (en) * | 2016-10-10 | 2017-04-26 | 中国电子科技集团公司第五十五研究所 | On-chip test system and method of W-waveband low-noise power amplification chip |
| CN110441668A (en) * | 2019-08-19 | 2019-11-12 | 西安易恩电气科技有限公司 | A kind of high-power IGBT test macro |
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Application publication date: 20150527 |