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CN104516997A - Timing analysis method and machine-readable medium - Google Patents

Timing analysis method and machine-readable medium Download PDF

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Publication number
CN104516997A
CN104516997A CN201310462507.4A CN201310462507A CN104516997A CN 104516997 A CN104516997 A CN 104516997A CN 201310462507 A CN201310462507 A CN 201310462507A CN 104516997 A CN104516997 A CN 104516997A
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buffer
path
time
clock pulse
postpone
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陈英杰
余美俪
王鼎雄
罗幼岚
高淑怡
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Realtek Semiconductor Corp
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Realtek Semiconductor Corp
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Abstract

A timing analysis method applied to a circuit of a non-standard component, comprising: finding out at least one first buffer and one second buffer in the circuit; calculating at least one path time delay required for passing through at least one path between the first buffer and the second buffer; calculating a first buffer clock pulse time delay from a first clock pulse source to a first buffer clock pulse input end of the first buffer, and calculating a second clock pulse source to a second buffer clock pulse input end of the second buffer and a second buffer clock pulse time delay; determining whether the second buffer has a timing error according to the at least one path time delay, the first buffer clock time delay, the second buffer clock time delay, and a first buffer time delay of the first buffer.

Description

时序分析方法以及机器可读媒体Timing analysis method and machine-readable medium

技术领域technical field

本发明所揭露的实施例系有关于电路设计的验证,尤指一种应用在使用非标准组件(non-standard cell)的一电路中的时序分析方法以及机器可读媒体。The disclosed embodiments of the present invention are related to verification of circuit design, especially to a timing analysis method and machine-readable medium applied in a circuit using non-standard cells.

背景技术Background technique

实务上,对于使用非标准组件的模拟电路来说,在验证阶段的时候,一般针对模拟电路的整体来进行功能性的仿真验证,并尽可能地利用有限的测试模式(test pattern)来验证模拟电路的主要功能是否正确。然而,有限的测试模式不仅模拟时间旷日废时,同时又很难做到滴水不漏的时序分析,设计者往往为了追求效率而放弃完整的时序验证。因此,本领域亟需一种能够兼顾效率以及测试覆盖度的时序分析方法。In practice, for analog circuits using non-standard components, in the verification stage, functional simulation verification is generally carried out for the entire analog circuit, and the limited test pattern (test pattern) is used to verify the simulation as much as possible. Whether the main function of the circuit is correct. However, the limited test mode not only takes a long time to simulate, but also makes it difficult to achieve leak-free timing analysis. Designers often give up complete timing verification in pursuit of efficiency. Therefore, there is an urgent need in the art for a timing analysis method that can take both efficiency and test coverage into consideration.

发明内容Contents of the invention

本发明的目的之一在于提供一种应用在使用非标准组件(non-standard cell)的电路中的时序分析方法以及机器可读媒体,以解决上述的问题。One of the objectives of the present invention is to provide a timing analysis method and a machine-readable medium applied to circuits using non-standard cells, so as to solve the above-mentioned problems.

本发明的一实施例揭露一种应用在使用非标准组件的一电路中的时序分析方法,包含有:找出该电路中的至少一第一缓存器(register)以及一第二缓存器,其中该第一缓存器和该第二缓存器彼此之间具有至少一路径,从该第一缓存器的一第一缓存器数据输出端到该第二缓存器的一第二缓存器数据输入端;计算经过该至少一路径所需的至少一路径时间延迟;计算一第一时钟脉冲源至该第一缓存器的一第一缓存器时钟脉冲输入端的一第一缓存器时钟脉冲时间延迟,以及计算一第二时钟脉冲源至该第二缓存器的一第二缓存器时钟脉冲输入端的以及一第二缓存器时钟脉冲时间延迟;以及依据该至少一路径时间延迟、该第一缓存器时钟脉冲时间延迟、该第二缓存器时钟脉冲时间延迟、以及该第一缓存器的一第一缓存器时间延迟来判断该第二缓存器是否存在时序错误。An embodiment of the present invention discloses a timing analysis method applied in a circuit using non-standard components, including: finding at least a first register and a second register in the circuit, wherein The first register and the second register have at least one path between each other, from a first register data output end of the first register to a second register data input end of the second register; calculating at least one path time delay required to traverse the at least one path; calculating a first buffer clock time delay from a first clock source to a first buffer clock input of the first buffer, and calculating a second clock source to a second buffer clock input of the second buffer and a second buffer clock time delay; and according to the at least one path time delay, the first buffer clock time delay, the clock pulse time delay of the second register, and a first register time delay of the first register to determine whether there is a timing error in the second register.

本发明的另一实施例揭露一种机器可读媒体,储存一程序代码,当该程序代码被一处理器所执行时,该程序代码会致使该处理器执行以下的步骤来对应用在使用非标准组件的一电路进行时序分析:找出该电路中的至少一第一缓存器以及一第二缓存器,其中该第一缓存器和该第二缓存器彼此之间具有至少一路径,从该第一缓存器的一第一缓存器数据输出端到该第二缓存器的一第二缓存器数据输入端;计算经过该至少一路径所需的至少一路径时间延迟;计算一第一时钟脉冲源至该第一缓存器的一第一缓存器时钟脉冲输入端的一第一缓存器时钟脉冲时间延迟,以及计算一第二时钟脉冲源至该第二缓存器的一第二缓存器时钟脉冲输入端的以及一第二缓存器时钟脉冲时间延迟;以及依据该至少一路径时间延迟、该第一缓存器时钟脉冲时间延迟、该第二缓存器时钟脉冲时间延迟、以及该第一缓存器的一第一缓存器时间延迟来判断该第二缓存器是否存在时序错误。Another embodiment of the present invention discloses a machine-readable medium storing a program code. When the program code is executed by a processor, the program code will cause the processor to perform the following steps to control the application using non- Timing analysis of a circuit of a standard component: finding at least one first register and a second register in the circuit, wherein the first register and the second register have at least one path between each other, from the A first buffer data output end of the first buffer to a second buffer data input end of the second buffer; calculating at least one path time delay required by the at least one path; calculating a first clock pulse time delaying a first register clock sourced to a first register clock input of the first register, and calculating a second clock sourced to a second register clock input of the second register end and a second buffer clock pulse time delay; and according to the at least one path time delay, the first buffer clock pulse time delay, the second buffer clock pulse time delay, and a first buffer clock delay of the first buffer A buffer time delay is used to determine whether the second register has a timing error.

本发明可提升非标准组件电路的时序分析的覆盖度,同时又兼顾时间上的效率。The invention can improve the coverage of timing analysis of non-standard component circuits, while taking into account the time efficiency.

附图说明Description of drawings

图1为使用非标准组件的电路的示意图。Figure 1 is a schematic diagram of a circuit using non-standard components.

图2为本发明应用在使用非标准组件的一电路中的时序分析方法的一示范性实施例的流程图。FIG. 2 is a flow chart of an exemplary embodiment of the timing analysis method applied in a circuit using non-standard components according to the present invention.

图3为本发明针对使用非标准组件的电路来执行时序分析方法的一计算机系统的一实施例的示意图。FIG. 3 is a schematic diagram of an embodiment of the present invention directed to a computer system implementing a timing analysis method using circuits with non-standard components.

其中,附图标记说明如下:Wherein, the reference signs are explained as follows:

100      电路100 circuits

102、104 缓存器102, 104 buffer

103      路径103 path

106~110 组合电路106~110 combination circuit

200      流程200 process

202~208 步骤202~208 steps

300      计算机系统300 computer systems

302      处理器302 processor

304      机器可读媒体304 Machine-readable media

具体实施方式Detailed ways

请参考图1,图1为使用非标准组件的电路100的示意图。请注意,为了便于说明本发明的技术特征,图1仅绘示一部份的电路组件,包含有多个缓存器102、104以及多个组合电路(combinational circuit)106、108、110。请注意,电路100可能包含模拟电路或是其他任何无法仅使用标准组件数据库(standard cell library)中的标准组件的电路,亦即电路100包含非标准组件;且组合电路106、108、110中可能包含有任何的晶体管、基本逻辑门(logical gate)(例如与门、或门等)或是由基本逻辑门所组成的逻辑电路,又组合电路106、108、110可能不相同;缓存器102、104可以为任何种类的缓存器,例如D型闩锁器(D-latch)或是D型正反器(D-flip flop),只要是基于时钟脉冲的且具有数据暂存功能的组件,都属于本发明的范畴。Please refer to FIG. 1 , which is a schematic diagram of a circuit 100 using non-standard components. Please note that in order to illustrate the technical features of the present invention, FIG. 1 only shows a part of circuit components, including a plurality of registers 102 , 104 and a plurality of combinational circuits 106 , 108 , 110 . Please note that the circuit 100 may contain analog circuits or any other circuits that cannot only use standard components in the standard cell library (standard cell library), that is, the circuit 100 contains non-standard components; and the combined circuits 106, 108, and 110 may Contains any transistors, basic logic gates (logical gates) (such as AND gates, OR gates, etc.) or logic circuits composed of basic logic gates, and the combination circuits 106, 108, 110 may be different; the registers 102, 104 can be any kind of register, such as a D-latch or a D-flip flop, as long as it is based on a clock pulse and has a data temporary storage function. Belong to the category of the present invention.

请一并参考图1与图2。图2为本发明应用在使用非标准组件的一电路中的时序分析方法的一示范性实施例的流程图。倘若大体上可达到相同的结果,并不需要一定遵照图2所示的流程200中的步骤顺序来进行,且图2所示的步骤不一定要连续进行,亦即其他步骤亦可插入其中,此外,图2中的某些步骤亦可根据不同实施例或设计需求省略之。该方法主要包含有以下步骤:Please refer to Figure 1 and Figure 2 together. FIG. 2 is a flow chart of an exemplary embodiment of the timing analysis method applied in a circuit using non-standard components according to the present invention. If substantially the same result can be achieved, it is not necessary to follow the sequence of steps in the process 200 shown in FIG. 2 , and the steps shown in FIG. 2 do not have to be performed continuously, that is, other steps can also be inserted, In addition, some steps in FIG. 2 can also be omitted according to different embodiments or design requirements. The method mainly includes the following steps:

步骤202:找出使用非标准组件的一电路中的至少一第一缓存器以及一第二缓存器,其中该第一缓存器和该第二缓存器彼此之间具有至少一路径,从该第一缓存器的一第一缓存器数据输出端到该第二缓存器的一第二缓存器数据输入端;Step 202: Find at least a first register and a second register in a circuit using non-standard components, wherein the first register and the second register have at least one path between each other, from the first register a first register data output terminal of a buffer to a second register data input terminal of the second register;

步骤204:计算经过该至少一路径所需的至少一路径时间延迟;Step 204: Calculate at least one path time delay required to pass through the at least one path;

步骤206:计算一第一时钟脉冲源至该第一缓存器的一第一缓存器时钟脉冲输入端的一第一缓存器时钟脉冲时间延迟,以及计算一第二时钟脉冲源至该第二缓存器的一第二缓存器时钟脉冲输入端的以及一第二缓存器时钟脉冲时间延迟;以及,Step 206: Calculate a first register clock time delay from a first clock source to a first register clock input of the first register, and calculate a second clock source to the second register of a second buffer clock input and a second buffer clock time delay; and,

步骤208:依据该至少一路径时间延迟、该第一缓存器时钟脉冲时间延迟、该第二缓存器时钟脉冲时间延迟以及该第一缓存器的一第一缓存器时间延迟来判断该第二缓存器是否存在时序错误(timing violation)。Step 208: Determine the second buffer according to the at least one path time delay, the clock time delay of the first register, the clock time delay of the second register, and a first register time delay of the first register Whether there is a timing violation in the device.

对于流程200的步骤202来说,应注意的是,可以根据所需的测试覆盖度或是所欲分析的范围来找出使用非标准组件的电路中的所有缓存器或是部分缓存器,且不限定于使用何种方法找出所有缓存器或是部分缓存器,举例来说,本发明较佳地可以使用一特定缓存器辨识方法,其根据默认的缓存器晶体管连接或组成方式来辨识出电路100中的缓存器。因此,对于图1来说,假设此处所需要分析的范围为电路100的部分缓存器,即缓存器102以及缓存器104。首先可在电路100其晶体管层级电路表(transistor level netlist)上根据其晶体管连接或组成方式辨识出缓存器102以及缓存器104,便可需要针对缓存器102以及缓存器104来分析。接下来需要确认缓存器102以及缓存器104之间是否具有至少一路径,也就是找出从缓存器102的一数据输出端Q经过组合电路110到缓存器102的一数据输入端D的路径(例如本实施例中的路径103)。For step 202 of the process 200, it should be noted that all or part of the registers in the circuit using non-standard components can be found according to the required test coverage or the scope of analysis, and It is not limited to the method used to find all registers or some registers. For example, the present invention preferably can use a specific register identification method, which can be identified according to the default register transistor connection or composition Registers in circuit 100. Therefore, for FIG. 1 , it is assumed that the scope to be analyzed here is part of the registers of the circuit 100 , namely, the register 102 and the register 104 . First, the register 102 and the register 104 can be identified on the transistor level netlist of the circuit 100 according to the connection or composition of the transistors, and then the register 102 and the register 104 need to be analyzed. Next, it is necessary to confirm whether there is at least one path between the buffer 102 and the buffer 104, that is, to find out a path from a data output terminal Q of the buffer 102 to a data input D of the buffer 102 through the combinational circuit 110 ( For example, path 103 in this embodiment).

步骤204则针对缓存器102以及缓存器102之间的至少一路径的一路径时间延迟来作计算,也就是找出图1中,一讯号从缓存器102的数据输出端Q经过组合电路110到缓存器102的数据输入端D的路径103的路径时间延迟。举例来说,可以使用一般的模拟电路仿真软件来仅针对路径103进行仿真并计算出相对应的路径时间延迟,如此便可大为减少模拟所需的时间。Step 204 calculates a path time delay of at least one path between the register 102 and the register 102, that is, finds out that in FIG. 1, a signal passes through the combinational circuit 110 to the The path time delay of the path 103 of the data input D of the buffer 102 . For example, general analog circuit simulation software can be used to simulate only the path 103 and calculate the corresponding path time delay, which can greatly reduce the time required for simulation.

接下来,在步骤206中,会分别计算图1中从一时钟脉冲源P到缓存器102的一时钟脉冲输入端ck_in的一第一时钟脉冲时间延迟以及从时钟脉冲源P到缓存器104的一时钟脉冲输入端ck_in的一第二时钟脉冲时间延迟。请注意,于另一实施例中,步骤206中所述的时钟脉冲源P也可以是指不同的时钟脉冲源。Next, in step 206, a first clock pulse time delay from a clock pulse source P to a clock pulse input terminal ck_in of the buffer 102 in FIG. 1 and a time delay from the clock pulse source P to the buffer 104 are calculated respectively. A second clock pulse time delay of a clock pulse input terminal ck_in. Please note that in another embodiment, the clock source P mentioned in step 206 may also refer to a different clock source.

最后,依据缓存器104的数据设置时间(data setup time)规格以及数据保持时间(data hold time)规格、从缓存器102的数据输出端Q经过组合电路110到缓存器102的数据输入端D的该路径时间延迟、该第一时钟脉冲时间延迟、该第二时钟脉冲时间延迟以及缓存器102的一缓存器时间延迟来判断缓存器104是否存在设置时间错误或是保持时间错误(步骤208)。由于本领域技术人员应能轻易理解设置时间错误或是保持时间错误的判断方式,故更进一步的细节在此便不多作赘述。Finally, according to the data setup time (data setup time) specification and the data hold time (data hold time) specification of the buffer 104, from the data output terminal Q of the buffer 102 to the data input terminal D of the buffer 102 through the combination circuit 110 The path time delay, the first clock time delay, the second clock time delay and a buffer time delay of the register 102 are used to determine whether the register 104 has a set time error or a hold time error (step 208 ). Since those skilled in the art should easily understand the way of determining whether the setting time is wrong or the keeping time is wrong, further details will not be repeated here.

请参阅图3,图3为本发明针对使用非标准组件的电路中来执行时序分析方法的一计算机系统的一实施例的示意图。计算机系统300包含有一处理器302以及一机器可读媒体304,举例来说,计算机系统300可以是一个人计算机,而机器可读媒体304可以是个人计算机中任何具有数据储存功能的储存装置,例如挥发性内存、非挥发性内存、硬盘、光盘等等。本实施例中,机器可读媒体304中储存一程序代码PROG,因此,当程序代码PROG被处理器302所加载并执行时,程序代码PROG会致使处理器302针对集成电路的电路设计档案File_IN执行本发明所揭示的时序分析方法(亦即图2所示的步骤202~208)。由于本领域技术人员于阅读过上述针对时序分析方法的内容之后应可轻易了解处理器302执行程序代码PROG所进行的时序分析操作,故在此省略更进一步的说明以求简洁。Please refer to FIG. 3 . FIG. 3 is a schematic diagram of an embodiment of the present invention directed to a computer system for implementing a timing analysis method in a circuit using non-standard components. The computer system 300 includes a processor 302 and a machine-readable medium 304. For example, the computer system 300 can be a personal computer, and the machine-readable medium 304 can be any storage device with a data storage function in the personal computer, such as Volatile memory, non-volatile memory, hard disk, CD, etc. In this embodiment, a program code PROG is stored in the machine-readable medium 304. Therefore, when the program code PROG is loaded and executed by the processor 302, the program code PROG will cause the processor 302 to execute the circuit design file File_IN of the integrated circuit. The timing analysis method disclosed in the present invention (that is, steps 202-208 shown in FIG. 2). Since those skilled in the art can easily understand the timing analysis operation performed by the processor 302 executing the program code PROG after reading the above content on the timing analysis method, further description is omitted here for brevity.

综上所述,藉由本发明所提出的应用在使用非标准组件电路中的时序分析方法,便得以仅根据其所辩识出的缓存器及缓存器之间的路径进行时序分析,如此一来将可显著地减少模拟所需的时间并且兼顾测试覆盖度。To sum up, with the timing analysis method applied in circuits using non-standard components proposed by the present invention, timing analysis can be performed only based on the identified registers and the paths between the registers, so that It will significantly reduce the time required for simulation and take into account the test coverage.

Claims (8)

1. be applied in the Time Series Analysis Method in the circuit using non-standard features, it is characterized in that, include:
Find out at least one first buffer in this circuit and one second buffer, wherein this first buffer and this second buffer have at least one path, the one second buffer data input end from one first buffer data output terminal of this first buffer to this second buffer each other;
Calculate and postpone through at least one path time needed for this at least one path;
Calculate the one first buffer clock pulse time delay of one first clock source to one first buffer clock pulse input terminal of this first buffer, and calculate the one second buffer clock pulse time delay of a second clock impulse source to one second buffer clock pulse input terminal of this second buffer; And,
Postpone according to this at least one path time, this first buffer clock pulse time postpones, this second buffer clock pulse time postpones and one first buffer time delay of this first buffer judges whether this second buffer exists timing error.
2. method according to claim 1, wherein, calculates the step postponed through this at least one path time needed for this at least one path and includes:
The component hour obtaining the assembly in this at least one path postpones; And,
Postpone according to this component hour this at least one path time calculated through needed for this at least one path to postpone.
3. method according to claim 1, wherein, postpone according to this at least one path time, this first buffer clock pulse time postpone, this second buffer clock pulse time postpones and this first buffer time delay of this first buffer judges that the step whether this second buffer exists timing error includes:
According to the data setup times specification of this second buffer and data hold time specification, this at least one path time postpones, this first buffer clock pulse time postpones, this second buffer clock pulse time postpones and this first buffer time delay of this first buffer judges whether this second buffer exists setup times mistake or retention time mistake.
4. method according to claim 1, wherein, the step finding out at least one first buffer in this circuit and one second buffer includes:
Transistor connected mode according to this circuit picks out this first buffer and this second buffer.
5. a machine-readable medium, it is characterized in that, store a program code, when this program code is performed by a processor, this program code can cause this processor to perform following step to use a circuit of non-standard features to carry out time series analysis to being applied in:
Find out at least one first buffer in this circuit and one second buffer, wherein this first buffer and this second buffer have at least one path, the one second buffer data input end from one first buffer data output terminal of this first buffer to this second buffer each other;
Calculate and postpone through at least one path time needed for this at least one path;
Calculate one first clock source to this first buffer one first buffer clock pulse input terminal one first buffer clock pulse time postpone, and calculate a second clock impulse source to this second buffer one second buffer clock pulse input terminal and one second buffer clock pulse time postpone; And,
Postpone according to this at least one path time, this first buffer clock pulse time postpones, this second buffer clock pulse time postpones and one first buffer time delay of this first buffer judges whether this second buffer exists timing error.
6. machine-readable medium according to claim 5, wherein, calculates the step postponed through this at least one path time needed for this at least one path and includes:
The component hour obtaining the assembly in this at least one path postpones; And
Postpone according to this component hour this at least one path time calculated through needed for this at least one path to postpone.
7. machine-readable medium according to claim 5, wherein, postpone according to this at least one path time, this first buffer clock pulse time postpone, this second buffer clock pulse time postpones and this first buffer time delay of this first buffer judges that the step whether this second buffer exists timing error includes:
According to the data setup times specification of this second buffer and data hold time specification, this at least one path time postpones, this first buffer clock pulse time postpones, this second buffer clock pulse time postpones and this first buffer time delay of this first buffer judges whether this second buffer exists setup times mistake or retention time mistake.
8. machine-readable medium according to claim 5, wherein, the step finding out at least one first buffer in this circuit and one second buffer includes:
Transistor connected mode according to this circuit picks out this first buffer and this second buffer.
CN201310462507.4A 2013-09-30 2013-09-30 Timing analysis method and machine-readable medium Pending CN104516997A (en)

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