CN104505343B - A kind of method of making ZnO nanometer fence - Google Patents
A kind of method of making ZnO nanometer fence Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 claims abstract description 43
- 238000000034 method Methods 0.000 claims abstract description 29
- 239000002070 nanowire Substances 0.000 claims abstract description 24
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052737 gold Inorganic materials 0.000 claims abstract description 18
- 239000010931 gold Substances 0.000 claims abstract description 18
- 238000000206 photolithography Methods 0.000 claims abstract description 18
- 239000003054 catalyst Substances 0.000 claims abstract description 17
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 16
- 238000006243 chemical reaction Methods 0.000 claims abstract description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 68
- 239000011787 zinc oxide Substances 0.000 claims description 28
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 18
- 238000005229 chemical vapour deposition Methods 0.000 claims description 17
- 229920002120 photoresistant polymer Polymers 0.000 claims description 15
- 239000000243 solution Substances 0.000 claims description 13
- 239000000126 substance Substances 0.000 claims description 11
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 10
- 239000000376 reactant Substances 0.000 claims description 10
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 239000003638 chemical reducing agent Substances 0.000 claims description 8
- 239000001301 oxygen Substances 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 8
- 239000002904 solvent Substances 0.000 claims description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 6
- 239000012159 carrier gas Substances 0.000 claims description 6
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 claims description 6
- 229910052786 argon Inorganic materials 0.000 claims description 5
- IKHGUXGNUITLKF-UHFFFAOYSA-N Acetaldehyde Chemical compound CC=O IKHGUXGNUITLKF-UHFFFAOYSA-N 0.000 claims description 4
- 230000004888 barrier function Effects 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 4
- 238000000576 coating method Methods 0.000 claims description 4
- 239000007789 gas Substances 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- 239000007864 aqueous solution Substances 0.000 claims description 2
- 229910052734 helium Inorganic materials 0.000 claims description 2
- 239000001307 helium Substances 0.000 claims description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 2
- 229910052698 phosphorus Inorganic materials 0.000 claims description 2
- 229910052717 sulfur Inorganic materials 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- 229910052787 antimony Inorganic materials 0.000 claims 1
- 229910052785 arsenic Inorganic materials 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 229910052733 gallium Inorganic materials 0.000 claims 1
- 239000000203 mixture Substances 0.000 claims 1
- 238000009826 distribution Methods 0.000 abstract description 3
- 230000001939 inductive effect Effects 0.000 abstract description 3
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- 238000002360 preparation method Methods 0.000 description 3
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- 239000002086 nanomaterial Substances 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- IKHGUXGNUITLKF-XPULMUKRSA-N acetaldehyde Chemical compound [14CH]([14CH3])=O IKHGUXGNUITLKF-XPULMUKRSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 239000002127 nanobelt Substances 0.000 description 1
- 239000002073 nanorod Substances 0.000 description 1
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- 229910052759 nickel Inorganic materials 0.000 description 1
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- 238000001878 scanning electron micrograph Methods 0.000 description 1
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
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Abstract
本发明公开了一种制备ZnO纳米栅栏的方法,其特征在于,包括如下步骤:(1)GaN衬底光刻;(2)衬底涂覆金催化剂反应溶液;(3)加热衬底,溶液收缩;(4)金从溶液中被还原出来,呈闭合环形分布;(5)用CVD法由催化剂诱导生长ZnO纳米线栅栏。本发明利用光刻后衬底表面的亲疏水性差别来控制纳米金颗粒分布,以此诱导生长纳米线栅栏,不同于传统的控制方法,具有明显的创新意义和期望更广的应用范围。
The invention discloses a method for preparing a ZnO nano-fence, which is characterized in that it comprises the following steps: (1) GaN substrate photolithography; (2) the substrate is coated with a gold catalyst reaction solution; (3) the substrate is heated, the solution Shrinkage; (4) Gold was reduced from the solution and distributed in a closed ring; (5) ZnO nanowire fences were induced by catalysts by CVD. The invention utilizes the difference in hydrophilicity and hydrophobicity of the substrate surface after photolithography to control the distribution of nano-gold particles, thereby inducing the growth of nanowire fences, which is different from the traditional control method and has obvious innovative significance and expects a wider application range.
Description
技术领域technical field
本发明涉及一种制备ZnO纳米半导体材料的方法,尤其涉及一种制备ZnO纳米栅栏的方法。The invention relates to a method for preparing ZnO nano semiconductor material, in particular to a method for preparing ZnO nano barriers.
背景技术Background technique
氧化锌(ZnO)作为一种具有优良压电、光电特性的半导体材料,它拥有优良的电学、光学和化学稳定性,相对于Si、GaN等半导体材料来说它又具有大的禁带宽度(Eg=3.37eV)以及高的激子束缚能(60meV),一维ZnO纳米结构具有独特的形貌和优异性能,已经被制成多种一维纳米结构,比如纳米棒、纳米线、纳米管、纳米带、纳米梳、纳米弹簧、纳米弓和纳米推进器等广泛的应用在纳米发电机、纳米激光器、LED、传感器、太阳能电池等新型纳米器件和系统。由第三代半导体材料ZnO和GaN组成的异质结半导体器件表现出极大的应用价值,高质量的p、i、n型的GaN外延层已实现批量生产。由于ZnO纳米线的制备方法不同导致结构具有多样性,而ZnO纳米线的形貌对ZnO纳米器件的性能有很大影响,因此对ZnO一维纳米线生长和排布的控制对其应用研究显得非常重要。As a semiconductor material with excellent piezoelectric and photoelectric properties, zinc oxide (ZnO) has excellent electrical, optical and chemical stability. Compared with semiconductor materials such as Si and GaN, it has a large band gap ( Eg=3.37eV) and high exciton binding energy (60meV), the one-dimensional ZnO nanostructure has a unique shape and excellent performance, and has been made into a variety of one-dimensional nanostructures, such as nanorods, nanowires, nanotubes , nanobelts, nanocombs, nanosprings, nanobows and nanothrusters are widely used in new nanodevices and systems such as nanogenerators, nanolasers, LEDs, sensors, and solar cells. Heterojunction semiconductor devices composed of third-generation semiconductor materials ZnO and GaN have shown great application value, and high-quality p, i, and n-type GaN epitaxial layers have been mass-produced. Due to the different preparation methods of ZnO nanowires, the structure has diversity, and the morphology of ZnO nanowires has a great influence on the performance of ZnO nanodevices. Therefore, the control of the growth and arrangement of ZnO one-dimensional nanowires is of great importance Very important.
现有技术对ZnO纳米线栅栏的制备通常首先采用光刻方法在衬底刻出相应的图案,然后镀上金催化剂膜,去除光刻胶后,衬底上留下栅栏形催化剂图案,然后再以高温CVD法生长ZnO纳米线,由此可生成的ZnO纳米线栅栏。其缺点是光刻胶被金膜覆盖,去膜困难,受光刻技术限制栅栏尺寸难以做得更小。Wang,X.D等报道采用催化剂制备纳米线栅栏的方法,该法以单层密排聚苯乙烯微球(PS)作掩膜,蒸镀金到衬底,形成蜂巢状金催化剂,然后再以高温CVD法生长ZnO纳米线,可生成六角形的纳米线栅栏。该法六角形图案尺寸由PS球大小控制,边长典型值约0.5μm(Large-scalehexagonal-patternedgrowthofalignedZnOnanorodsfornano-optoelectronicsandnanosensorarrays.NanoLetters,2004.4(3):p.423-426)。该文献采用单层密排聚苯乙烯微球(PS)取代光刻胶作掩膜,技术相对复杂。In the prior art, the preparation of ZnO nanowire fences usually first adopts photolithography to carve corresponding patterns on the substrate, and then coats a gold catalyst film. After removing the photoresist, a fence-shaped catalyst pattern is left on the substrate, and then ZnO nanowires are grown by high-temperature CVD method, thereby forming ZnO nanowire fences. The disadvantage is that the photoresist is covered by a gold film, which is difficult to remove, and the size of the fence is difficult to make smaller due to the limitation of photolithography technology. Wang, X.D et al. reported a method for preparing nanowire fences using catalysts. In this method, a single-layer close-packed polystyrene microsphere (PS) was used as a mask, and gold was evaporated onto the substrate to form a honeycomb-shaped gold catalyst, which was then processed by high-temperature CVD. ZnO nanowires grown by this method can produce hexagonal nanowire fences. The size of the hexagonal pattern in this method is controlled by the size of the PS ball, and the side length is typically about 0.5 μm (Large-scale hexagonal-patterned growth of aligned ZnOnanorods for nano-optoelectronics and nanosensor arrays. Nano Letters, 2004.4 (3): p.423-426). This document uses single-layer close-packed polystyrene microspheres (PS) instead of photoresist as a mask, and the technology is relatively complicated.
发明内容Contents of the invention
为了克服上述技术问题,本发明的目的在于提供一种制备ZnO纳米栅栏的方法,包括如下步骤:(1)GaN衬底光刻;(2)衬底涂覆金催化剂反应溶液;(3)加热衬底,溶液收缩;(4)金从溶液中被还原出来,呈闭合环形分布;(5)用CVD法由催化剂诱导生长ZnO纳米线栅栏。In order to overcome the problems of the technologies described above, the object of the present invention is to provide a method for preparing ZnO nano barriers, comprising the steps of: (1) GaN substrate photolithography; (2) substrate coating gold catalyst reaction solution; (3) heating substrate, the solution shrinks; (4) the gold is reduced from the solution and is distributed in a closed ring; (5) the ZnO nanowire fence is induced and grown by the catalyst by the CVD method.
本发明更进一步的方法包括:首先在GaN衬底上光刻出一定样式,然后涂覆HAuCl4与还原剂混合水溶液,加热衬底,待溶剂完全挥发,洗去光刻胶;将处理过的衬底放入真空管式炉中,采用用高温化学气相沉积方法(CVD),在高温管式真空炉中间放置盛有化学反应物的舟,化学反应物包括氧化锌粉和石墨粉,其气流下游位置放置衬底,然后用机械泵把真空管式炉抽真空,把真空管加热到800-1200℃,然后通入载气,控制压强到30-400毫巴,生长时间根据所需纳米线长度设定,然后让真空管式炉自然降温,在GaN衬底上即可制备出氧化锌纳米线栅栏。The further method of the present invention includes: first photoetching a certain pattern on the GaN substrate, then coating a mixed aqueous solution of HAuCl 4 and a reducing agent, heating the substrate, and washing away the photoresist after the solvent is completely volatilized; The substrate is placed in a vacuum tube furnace, and a high-temperature chemical vapor deposition method (CVD) is used. A boat containing chemical reactants is placed in the middle of the high-temperature tube vacuum furnace. The chemical reactants include zinc oxide powder and graphite powder. Place the substrate in place, then use a mechanical pump to evacuate the vacuum tube furnace, heat the vacuum tube to 800-1200°C, then feed the carrier gas, control the pressure to 30-400 mbar, and set the growth time according to the required nanowire length , and then let the vacuum tube furnace cool down naturally, and the zinc oxide nanowire fence can be prepared on the GaN substrate.
上述技术方案中,还原剂选自EG(乙二醇)、乙醇、乙醛或柠檬酸等还原性有机小分子中的一种或多种。不同还原剂在反应中价态变化不一样,因此配比不是固定的,得根据化学反应方程式确定。HAuCl4与还原剂比例当小于化学配比,即保持还原剂过量状态。In the above technical scheme, the reducing agent is selected from one or more of reducing organic small molecules such as EG (ethylene glycol), ethanol, acetaldehyde or citric acid. Different reducing agents have different valence changes in the reaction, so the ratio is not fixed and must be determined according to the chemical reaction equation. When the ratio of HAuCl 4 to the reducing agent is less than the stoichiometric ratio, the reducing agent is kept in excess.
上述任意技术方案中,加热衬底的温度为80-100℃;衬底放置于盛有化学反应物的舟的气流下游0-10cm范围。In any of the above technical solutions, the substrate is heated at a temperature of 80-100°C; the substrate is placed in the range of 0-10cm downstream of the airflow of the boat containing the chemical reactants.
上述任意技术方案中,氧化锌粉和石墨粉的质量比为1∶1-9∶4;还可引入S、Co、Ni、P等掺杂元素。In any of the above technical solutions, the mass ratio of zinc oxide powder to graphite powder is 1:1-9:4; S, Co, Ni, P and other doping elements can also be introduced.
上述任意技术方案中,载气包括工作气体和氧气;工作气体选自氮气,氩气或氦气。载气中氧气分压为1-2%。In any of the above technical solutions, the carrier gas includes working gas and oxygen; the working gas is selected from nitrogen, argon or helium. The partial pressure of oxygen in the carrier gas is 1-2%.
在GaN衬底上光刻出一定样式可采用通常光刻步骤:1,衬底清洗;2,旋涂光刻胶;4,前烘;5,曝光(掩膜板提供光刻图案);6,显影;7,后烘。The usual photolithography steps can be used to lithographically produce a certain pattern on the GaN substrate: 1, substrate cleaning; 2, spin-coating photoresist; 4, pre-baking; 5, exposure (the mask plate provides photolithographic patterns); 6 , development; 7, post-baking.
本发明利用光刻后衬底表面的亲疏水性差别来控制纳米金颗粒分布,以此诱导生长纳米线栅栏,不同于传统的控制方法,具有明显的创新意义和期望更广的应用范围。光刻后的GaN衬底,由于GaN表面的疏水性,光刻胶与衬底接触处是镀金溶液收缩后停留的地方,最后生成的金催化剂颗粒也会存在于该地方。因此当光刻出闭合孔时,金催化剂会沿孔边缘闭合分布,由此诱导生长出纳米线栅栏。本发明利用衬底表面亲疏水性的差异可用来控制催化剂分布,从而进一步控制纳米材料的生长,同样可运用于其他纳米线栅栏的制备。例如:可用同样的方法制备金催化剂,以实现对InP纳米线生长位置的控制。还可以用于制备Fe催化剂,以实现对碳纳米管生长位置的控制。The invention utilizes the difference in hydrophilicity and hydrophobicity of the substrate surface after photolithography to control the distribution of nano-gold particles, thereby inducing the growth of nanowire fences, which is different from traditional control methods and has obvious innovative significance and expects a wider application range. For the GaN substrate after photolithography, due to the hydrophobicity of the GaN surface, the contact between the photoresist and the substrate is the place where the gold plating solution shrinks and stays, and the final gold catalyst particles will also exist in this place. Therefore, when a closed hole is photolithographically formed, the gold catalyst will be closed and distributed along the edge of the hole, thereby inducing the growth of a nanowire fence. The invention can control the distribution of catalyst by using the difference of hydrophilicity and hydrophobicity on the surface of the substrate, so as to further control the growth of nanometer material, and can also be applied to the preparation of other nanowire fences. For example: gold catalysts can be prepared in the same way to control the growth position of InP nanowires. It can also be used to prepare Fe catalysts to control the growth position of carbon nanotubes.
附图说明Description of drawings
附图1为GaN衬底光刻步骤示意图;Accompanying drawing 1 is the schematic diagram of GaN substrate photolithography step;
附图2为衬底涂覆金催化剂反应溶液步骤示意图;Accompanying drawing 2 is the schematic diagram of substrate coating gold catalyst reaction solution step;
附图3为加热衬底,溶液收缩至台阶边缘示意图;Accompanying drawing 3 is a schematic diagram of heating the substrate and shrinking the solution to the edge of the step;
附图4为金从溶液中被还原出来,沿台阶分布成闭合环形示意图;Accompanying drawing 4 is that gold is reduced from the solution, and is distributed into a closed ring schematic diagram along the steps;
附图5为用CVD法由催化剂诱导生长纳米栅栏示意图;Accompanying drawing 5 is the schematic diagram that uses CVD method to induce the growth of nano barriers by catalyst;
附图6为ZnO纳米线栅栏扫描电镜照片。Accompanying drawing 6 is the scanning electron micrograph of ZnO nanowire fence.
具体实施方式detailed description
为了进一步理解本发明,下面结合实施例对本发明优选实施方案进行描述,但是应当理解,这些描述只是为进一步说明本发明的特征和优点,而不是对本发明权利要求的限制。In order to further understand the present invention, the preferred embodiments of the present invention are described below in conjunction with examples, but it should be understood that these descriptions are only to further illustrate the features and advantages of the present invention, rather than limiting the claims of the present invention.
实施例1Example 1
在GaN衬底上光刻出一定样式,光刻步骤:首先在洗净的GaN衬底上用旋涂方法涂上光刻胶(Su82000)膜,然后在120℃下烘烤20min,在5μm透光方孔掩膜板掩盖下采用紫外曝光(3mw,30s),显影液中洗去曝光部分,120℃下烘烤20min以上即可得到光刻后的衬底。然后涂覆5mMHAuCl4与0.2v/v%EG混合溶液,加热衬底至90℃,待溶剂完全挥发,用丙酮洗去光刻胶;将处理过的衬底放入真空管式炉中,采用用高温化学气相沉积方法(CVD),在高温管式真空炉中间放置盛有化学反应物(氧化锌粉和石墨粉)的舟,其气流下游位置5cm内放置衬底,然后用机械泵把真空管式炉抽真空,把真空管加热到960度,然后通入100sccm氮气和1.5sccm的氧气,控制压强到300毫巴,生长20分钟,然后让真空管式炉自然降温,在GaN衬底上即可制备出氧化锌纳米线栅栏(见附图6)。A certain pattern is photolithographically etched on the GaN substrate. The photolithography steps: firstly coat the photoresist (Su82000) film on the cleaned GaN substrate by spin coating method, then bake at 120°C for 20min, UV exposure (3mw, 30s) is used under the cover of the hole mask, the exposed part is washed away in the developer, and the substrate after photolithography is obtained by baking at 120°C for more than 20min. Then coat a mixed solution of 5mM HAuCl 4 and 0.2v/v% EG, heat the substrate to 90°C, and wash off the photoresist with acetone after the solvent is completely volatilized; put the treated substrate into a vacuum tube furnace, and use High-temperature chemical vapor deposition method (CVD), place a boat filled with chemical reactants (zinc oxide powder and graphite powder) in the middle of a high-temperature tube-type vacuum furnace, place a substrate within 5cm of the downstream position of the airflow, and then use a mechanical pump to vacuum tube-type The furnace is evacuated, the vacuum tube is heated to 960 degrees, and then 100sccm nitrogen and 1.5sccm oxygen are introduced, the pressure is controlled to 300 mbar, and the growth is 20 minutes, then the vacuum tube furnace is allowed to cool down naturally, and the GaN substrate can be prepared. Zinc oxide nanowire fence (see accompanying drawing 6).
实施例2Example 2
在GaN衬底上光刻出一定样式,光刻步骤:首先在洗净的GaN衬底上用旋涂方法涂上光刻胶(Su82000)膜,然后在120℃下烘烤20min,在5μm透光方孔掩膜板掩盖下采用紫外曝光(3mw,30s),显影液中洗去曝光部分,120℃下烘烤20min以上即可得到光刻后的衬底。然后涂覆5mMHAuCl4与0.2v/v%乙醇混合溶液,加热衬底至100℃,待溶剂完全挥发,用丙酮洗去光刻胶;将处理过的衬底放入真空管式炉中,采用用高温化学气相沉积方法(CVD),在高温管式真空炉中间放置盛有化学反应物(氧化锌粉和石墨粉)的舟,其气流下游位置8cm内放置衬底,然后用机械泵把真空管式炉抽真空,把真空管加热到1200度,然后通入100sccm氩气和1.5sccm的氧气,控制压强到100毫巴,生长2小时,然后让真空管式炉自然降温,在GaN衬底上即可制备出氧化锌纳米线栅栏。A certain pattern is photolithographically etched on the GaN substrate. The photolithography steps: firstly coat the photoresist (Su82000) film on the cleaned GaN substrate by spin coating method, then bake at 120°C for 20min, UV exposure (3mw, 30s) is used under the cover of the hole mask, the exposed part is washed away in the developer, and the substrate after photolithography is obtained by baking at 120°C for more than 20min. Then coat a mixed solution of 5mM HAuCl 4 and 0.2v/v% ethanol, heat the substrate to 100°C, and wash off the photoresist with acetone after the solvent is completely volatilized; put the treated substrate into a vacuum tube furnace, and use High-temperature chemical vapor deposition method (CVD), place a boat filled with chemical reactants (zinc oxide powder and graphite powder) in the middle of the high-temperature tube-type vacuum furnace, place the substrate within 8cm of the downstream position of the airflow, and then use a mechanical pump to vacuum the tube-type The furnace is evacuated, the vacuum tube is heated to 1200 degrees, and then 100sccm argon and 1.5sccm oxygen are introduced, the pressure is controlled to 100 mbar, and the growth is 2 hours, and then the vacuum tube furnace is naturally cooled, and it can be prepared on the GaN substrate. out ZnO nanowire fence.
实施例3Example 3
在GaN衬底上光刻出一定样式,光刻步骤:首先在洗净的GaN衬底上用旋涂方法涂上光刻胶(Su82000)膜,然后在120℃下烘烤20min,在5μm透光方孔掩膜板掩盖下采用紫外曝光(3mw,30s),显影液中洗去曝光部分,120℃下烘烤20min以上即可得到光刻后的衬底。然后涂覆5mMHAuCl4与0.2v/v%乙醛混合溶液,加热衬底至100℃,待溶剂完全挥发,用丙酮洗去光刻胶;将处理过的衬底放入真空管式炉中,采用用高温化学气相沉积方法(CVD),在高温管式真空炉中间放置盛有化学反应物(氧化锌粉和石墨粉)的舟,其气流下游位置8cm内放置衬底,然后用机械泵把真空管式炉抽真空,把真空管加热到1200度,然后通入100sccm氩气和1.5sccm的氧气,控制压强到100毫巴,生长2小时,然后让真空管式炉自然降温,在GaN衬底上即可制备出氧化锌纳米线栅栏。A certain pattern is photolithographically etched on the GaN substrate. The photolithography steps: firstly coat the photoresist (Su82000) film on the cleaned GaN substrate by spin coating method, then bake at 120°C for 20min, UV exposure (3mw, 30s) is used under the cover of the hole mask, the exposed part is washed away in the developer, and the substrate after photolithography is obtained by baking at 120°C for more than 20min. Then coat a mixed solution of 5mM HAuCl 4 and 0.2v/v% acetaldehyde, heat the substrate to 100°C, and wash off the photoresist with acetone after the solvent is completely volatilized; put the treated substrate into a vacuum tube furnace, and use Using high-temperature chemical vapor deposition (CVD), place a boat filled with chemical reactants (zinc oxide powder and graphite powder) in the middle of a high-temperature tube-type vacuum furnace, place the substrate within 8cm of the downstream position of the airflow, and then use a mechanical pump to pump the vacuum tube Vacuum the vacuum tube, heat the vacuum tube to 1200 degrees, then feed 100sccm argon and 1.5sccm oxygen, control the pressure to 100 mbar, grow for 2 hours, then let the vacuum tube furnace cool down naturally, and then put it on the GaN substrate. ZnO nanowire fences were prepared.
实施例4Example 4
在GaN衬底上光刻出一定样式,光刻步骤:首先在洗净的GaN衬底上用旋涂方法涂上光刻胶(Su82000)膜,然后在120℃下烘烤20min,在5μm透光方孔掩膜板掩盖下采用紫外曝光(3mw,30s),显影液中洗去曝光部分,120℃下烘烤20min以上即可得到光刻后的衬底。然后涂覆5mMHAuCl4与0.2v/v%EG混合溶液,加热衬底至100℃,待溶剂完全挥发,用丙酮洗去光刻胶;将处理过的衬底放入真空管式炉中,采用用高温化学气相沉积方法(CVD),在高温管式真空炉中间放置盛有化学反应物(氧化锌粉,石墨粉和Al2O3粉混合)的舟,其气流下游位置8cm内放置衬底,然后用机械泵把真空管式炉抽真空,把真空管加热到1100度,然后通入100sccm氩气和1.5sccm的氧气,控制压强到100毫巴,生长2小时,然后让真空管式炉自然降温,在GaN衬底上即可制备出Al掺杂氧化锌纳米线栅栏。A certain pattern is photolithographically etched on the GaN substrate. The photolithography steps: firstly coat the photoresist (Su82000) film on the cleaned GaN substrate by spin coating method, then bake at 120°C for 20min, UV exposure (3mw, 30s) is used under the cover of the hole mask, the exposed part is washed away in the developer, and the substrate after photolithography is obtained by baking at 120°C for more than 20min. Then coat a mixed solution of 5mM HAuCl 4 and 0.2v/v% EG, heat the substrate to 100°C, and wash off the photoresist with acetone after the solvent is completely volatilized; put the treated substrate into a vacuum tube furnace, and use High-temperature chemical vapor deposition method (CVD), a boat filled with chemical reactants (zinc oxide powder, graphite powder and Al 2 O 3 powder mixed) is placed in the middle of a high-temperature tube vacuum furnace, and the substrate is placed within 8cm downstream of the air flow. Then use a mechanical pump to evacuate the vacuum tube furnace, heat the vacuum tube to 1100 degrees, then feed 100 sccm argon and 1.5 sccm oxygen, control the pressure to 100 mbar, grow for 2 hours, then let the vacuum tube furnace cool down naturally. Al-doped ZnO nanowire fences can be fabricated on GaN substrates.
上述实施例仅例示性说明本发明的原理及其功效,而非用于限制本发明。任何熟悉此技术的人士皆可在不违背本发明的精神及范畴下,对上述实施例进行修饰或改变。因此,举凡所属技术领域中具有通常知识者在未脱离本发明所揭示的精神与技术思想下所完成的一切等效修饰或改变,仍应由本发明的权利要求所涵盖。The above-mentioned embodiments only illustrate the principles and effects of the present invention, but are not intended to limit the present invention. Anyone skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and technical ideas disclosed in the present invention shall still be covered by the claims of the present invention.
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