CN104461565A - Optical module testing parameter configuration method and system - Google Patents
Optical module testing parameter configuration method and system Download PDFInfo
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- CN104461565A CN104461565A CN201410819549.3A CN201410819549A CN104461565A CN 104461565 A CN104461565 A CN 104461565A CN 201410819549 A CN201410819549 A CN 201410819549A CN 104461565 A CN104461565 A CN 104461565A
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- 238000012360 testing method Methods 0.000 title claims abstract description 169
- 230000003287 optical effect Effects 0.000 title claims abstract description 56
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- 238000010998 test method Methods 0.000 claims description 51
- 230000006870 function Effects 0.000 claims description 14
- 239000000284 extract Substances 0.000 claims description 11
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Abstract
The invention discloses an optical module testing parameter configuration method and system. The method comprises the steps of extracting testing parameters in an optical module testing program, configuring the testing parameters according to a preset testing condition, and storing the configured testing parameters in a database. By the adoption of the method and system, the efficiency of configuration of the testing parameters during optical module testing is improved, configuration of the testing parameters can be achieved automatically and quickly, and follow-up testing is facilitated.
Description
Technical field
The present invention relates to optical module field tests, particularly a kind of optical module test parameter collocation method and system.
Background technology
In existing optical module test process, the parameter configuration of test procedure need manually by the parameter name used required for test procedure and parameter value manual configuration corresponding to title in database, then testing results program, from database, these configurations are obtained in test procedure operational process, because test procedure and parameter configuration are not closed procedures, so the possibility that the parameter configured in database and the correspondence of the parameter required for test procedure do not go up is high, and manual operation easily makes mistakes, also the correctness of configuration parameter cannot be verified when parameter configuration, so can only testing results program be passed through, see whether test procedure reports an error to check that whether the parameter of configuration is correct, this inspection is very wasted time and energy, affect optical module testing efficiency.
Summary of the invention
The object of the invention is to overcome above-mentioned deficiency existing in prior art, a kind of configuration testing parameter, the optical module test parameter collocation method that testing efficiency is high and system are automatically provided.
In order to realize foregoing invention object, the technical solution used in the present invention is: a kind of optical module test parameter collocation method, comprising:
Extract the step of the test parameter in optical module test procedure;
The step of described test parameter is configured according to presumptive test condition;
Described test parameter after described configuration is stored into the step of database.
Preferably, the step of the test parameter in described extraction optical module test procedure is specially: all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject are reflected by .NET reflection technology, then finds corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
Preferably, described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted; The described step configuring described test parameter according to presumptive test condition is specially: according at least one parameter name described and the corresponding described test parameter of value configuration thereof.
Preferably, the step of the described test parameter after the described test parameter of display and/or described configuration is also comprised.
Preferably, whether the described test parameter also comprised after the described configuration of verification meets the step of described presumptive test condition; If so, then the described test parameter after described configuration is stored into database.
The present invention also provides a kind of optical module test parameter configuration-system, comprising:
Parameter extraction module, for extracting the test parameter in optical module test procedure;
Parameter configuration module, for configuring described test parameter according to presumptive test condition;
Memory module, for being stored into database by the described test parameter after described configuration.
Preferably, described parameter extraction module specifically for all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject being reflected by .NET reflection technology, then finds corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
Preferably, described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted; Described parameter configuration module is specifically for configuring corresponding described test parameter according at least one parameter name described and value thereof.
Preferably, also comprise display module, for showing the described test parameter after described test parameter and/or described configuration.
Preferably, also comprise correction verification module, for receive described parameter configuration module export configuration after described test parameter, verify the described test parameter after described configuration and whether meet described presumptive test condition; If so, the described test parameter after described configuration is then exported to memory module.
compared with prior art, beneficial effect of the present invention:
The present invention automatically extracts the test parameter in optical module test procedure before test procedure runs, configuring described test parameter according to presumptive test condition makes it meet test request, again the described test parameter after described configuration is stored into database, when test procedure runs, automatically extracts from database the test that the test parameter after configuring carries out optical module.The present invention can realize the configuration of test parameter automatically fast, facilitates the optical module test process of later testing sequence, and optical module testing efficiency is improved greatly.
accompanying drawing illustrates:
Fig. 1 is the optical module test parameter collocation method process flow diagram of the embodiment of the present invention;
Fig. 2 is the optical module test parameter configuration-system block diagram of the embodiment of the present invention.
Embodiment
Below in conjunction with embodiment, the present invention is described in further detail.But this should be interpreted as that the scope of the above-mentioned theme of the present invention is only limitted to following embodiment, all technology realized based on content of the present invention all belong to scope of the present invention.
The present invention automatically extracts the test parameter in optical module test procedure before test procedure runs, configuring described test parameter according to presumptive test condition makes it meet test request, again the described test parameter after described configuration is stored into database, when test procedure runs, automatically extracts from database the test that the test parameter after configuring carries out optical module.The present invention can realize the configuration of test parameter automatically fast, facilitates the optical module test process of later testing sequence, and optical module testing efficiency is improved greatly.Illustrate below in conjunction with accompanying drawing.
A kind of light module test method as shown in Figure 1, comprises the steps:
The step of the test parameter in S1, extraction optical module test procedure.
Concrete, the step of the test parameter in described extraction optical module test procedure is specially: all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject are reflected by .NET reflection technology, then finds corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
While development and testing program, in code, use predetermined identification of object to identify the parameter name in code, functional object, subfunction object.Such as: [AttributeFieldProperties (" CPDac experienced value at T0 which makes cp in the tuning range at T0 ",
true, EnumDataType.Numeric, DefaultValue = "64", IsLimit = true,
LowerLimit = 48,
UpperLimit = 128)]
private const string CONST_CPDAC_INIT_T0 = "CPDAC_INIT_T0";
This identification of object identifies the parameter that a parameter name is " CPDAC_INIT_T0 ", and the Value Types of this parameter, default value 64 and value scope 48-128.
By the reflection function of .NET by all defined parameters in compiled test procedure, object reflection out, and then find corresponding parameter name, functional object, subfunction object etc. by predetermined identification of object.
S2, configure the step of described test parameter according to presumptive test condition.
Described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted; The described step configuring described test parameter according to presumptive test condition is specially: according at least one parameter name described and the corresponding described test parameter of value configuration thereof.For the parameter that above-mentioned parameter name is " CPDAC_INIT_T0 ", the range of parameter values 48-128 extracted, then arrange this parameter value according to this scope.
Comprise ' Multifunctional debugging ' function (i.e. functional object) in test procedure, comprise again in ' Multifunctional debugging ' function ' extinction ratio debugging ', ' luminous power debugging ' subfunction (i.e. subfunction object).Comprise ' debug target value ' parameter, ' debugging algorithm ' parameter etc. in ' extinction ratio debugging ' subfunction, parameter can comprise again parameter and describe, type (the numeric type of parameter, character type ...), parameter choosing value scope (can be select in multiple monodrome, also can be a value scope).
Example:
[AttributeFunctionProperties(EnumFunctionTestID.ATE_V_TxMultiTuning, "Thrd1", 20, "")]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetAPD, false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetCP, true)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetER, false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetIbias, false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_MeasPwr, false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_MeasER, false)]
internal class ATE_V_TxMultiTuning : ATEFunctionBase{}
This section of code definition functional object, name is called ' ATE_V_TxMultiTuning ', 6 subfunctions ' ATE_SetAPD ' are comprised, ' ATE_SetCP ', ' ATE_SetER ' in this function, ' ATE_SetIbias ', ' ATE_MeasPwr ', ' ATE_MeasER ', wherein, subfunction ' ATE_SetCP ' is optional subfunction, and other 5 subfunctions are all essential subfunctions.
[AttributeFieldProperties("Sets the APD upper limit.", false, EnumDataType.Numeric, DefaultValue = "50")]
Private const string CONST_PARAMETER_MAXIMUM=" Maximum "; This defines a functional parameter, also defines the data type of this parameter simultaneously, and default value.
So parameter configuration can configure this test procedure, only run ' extinction ratio debugging ' subfunction in ' Multifunctional debugging ' function, and do not run ' luminous power debugging ' subfunction, all subfunctions that can certainly comprise in configuration operation ' Multifunctional debugging ' function, can also configure and not run ' Multifunctional debugging ' function.
S3, the described test parameter after described configuration is stored into the step of database.
Automatically extract from database the test that the test parameter after configuring carries out optical module when test procedure runs.The present invention can realize the configuration of test parameter automatically fast, facilitates the optical module test process of later testing sequence, and optical module testing efficiency is improved greatly.
Preferably, in one example, configure and be automatically stored into database according to predetermined key word afterwards, to be got parms from database configuration by this key word when test procedure runs, easy-to-look-up relevant parameter, test different index and can set different key words, search configuration with fast and easy.
Preferably, in one example, also comprise the step of the described test parameter after the described test parameter of display and/or described configuration, be presented in computer screen so in visual form, carry out operative configuration for configuration personnel, convenient.
Preferably, whether the described test parameter also comprised in one example after the described configuration of verification meets the step of described presumptive test condition; If so, then the described test parameter after described configuration is stored into database.Such as parameter name is the value after the parameter configuration of " CPDAC_INIT_T0 " is 30, not in value scope 48-128, then reconfigures, if the value after this parameter configuration is 50, then the described test parameter after described configuration is stored into database.The reliability of parameter configuration can be ensured like this, avoid follow-up test to make mistakes.
The present invention automatically extracts the test parameter in optical module test procedure before test procedure runs, configuring described test parameter according to presumptive test condition makes it meet test request, again the described test parameter after described configuration is stored into database, when test procedure runs, automatically extracts from database the test that the test parameter after configuring carries out optical module.The present invention can realize the configuration of test parameter automatically fast, facilitates the optical module test process of later testing sequence, and optical module testing efficiency is improved greatly.
Based on same design, the present invention also provides a kind of optical module test parameter configuration-system, referring to the test parameter of optical module shown in Fig. 2 configuration-system, comprising: parameter extraction module 1, for extracting the test parameter in optical module test procedure; Parameter configuration module 2, for configuring described test parameter according to presumptive test condition; And memory module 3, for the described test parameter after described configuration is stored into database.
Preferably, described parameter extraction module specifically for all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject being reflected by .NET reflection technology, then finds corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
Preferably, described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted; Described parameter configuration module is specifically for configuring corresponding described test parameter according at least one parameter name described and value thereof.
Preferably, also comprise display module, for showing the described test parameter after described test parameter and/or described configuration.
Preferably, also comprise correction verification module (not shown), for receive described parameter configuration module export configuration after described test parameter, verify the described test parameter after described configuration and whether meet described presumptive test condition; If so, the described test parameter after described configuration is then exported to memory module.It should be noted that, the embodiment of optical module test parameter collocation method shown in the test parameter of optical module shown in Fig. 2 configuration-system embodiment and Fig. 1 is made based on same design, and modules function can describe referring to embodiment of the method relevant portion, no longer describes in detail herein.
The present invention automatically extracts the test parameter in optical module test procedure before test procedure runs, configuring described test parameter according to presumptive test condition makes it meet test request, again the described test parameter after described configuration is stored into database, when test procedure runs, automatically extracts from database the test that the test parameter after configuring carries out optical module.The present invention can realize the configuration of test parameter automatically fast, facilitates the optical module test process of later testing sequence, and optical module testing efficiency is improved greatly.
By reference to the accompanying drawings the specific embodiment of the present invention is described in detail above, but the present invention is not restricted to above-mentioned embodiment, in the spirit and scope situation of claim not departing from the application, those skilled in the art can make various amendment or remodeling.
Claims (10)
1. an optical module test parameter collocation method, is characterized in that, comprising:
Extract the step of the test parameter in optical module test procedure;
The step of described test parameter is configured according to presumptive test condition;
Described test parameter after described configuration is stored into the step of database.
2. optical module test parameter collocation method according to claim 1, is characterized in that, the step of the test parameter in described extraction optical module test procedure is specially:
By .NET reflection technology, all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject are reflected, then find corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
3. optical module test parameter collocation method according to claim 2, is characterized in that, described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted; The described step configuring described test parameter according to presumptive test condition is specially:
According at least one parameter name described and the corresponding described test parameter of value configuration thereof.
4. optical module test parameter collocation method according to claim 3, is characterized in that, also comprise:
Show the step of the described test parameter after described test parameter and/or described configuration.
5. the optical module test parameter collocation method according to any one of claim 1-4, is characterized in that, whether the described test parameter also comprised after the described configuration of verification meets the step of described presumptive test condition; If so, then the described test parameter after described configuration is stored into database.
6. an optical module test parameter configuration-system, is characterized in that, comprising:
Parameter extraction module, for extracting the test parameter in optical module test procedure;
Parameter configuration module, for configuring described test parameter according to presumptive test condition;
Memory module, for being stored into database by the described test parameter after described configuration.
7. optical module test parameter configuration-system according to claim 6, it is characterized in that, described parameter extraction module specifically for all predefined parameter in the code of compiled described test procedure, functional object and/or function subobject being reflected by .NET reflection technology, then finds corresponding parameter name, functional object and/or subfunction object oriented by predetermined identification of object; Wherein said predetermined identification of object sets when the code of described test procedure is write.
8. optical module test parameter configuration-system according to claim 6, is characterized in that, described presumptive test condition is at least one parameter name and value thereof of defining in the code of the described test procedure extracted;
Described parameter configuration module is specifically for configuring corresponding described test parameter according at least one parameter name described and value thereof.
9. optical module test parameter configuration-system according to claim 8, is characterized in that, also comprise:
Display module, for showing the described test parameter after described test parameter and/or described configuration.
10. the optical module test parameter configuration-system according to any one of claim 6-9, is characterized in that, also comprise:
Correction verification module, for receive described parameter configuration module export configuration after described test parameter, verify the described test parameter after described configuration and whether meet described presumptive test condition; If so, the described test parameter after described configuration is then exported to memory module.
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| CN105653416A (en) * | 2015-12-24 | 2016-06-08 | 索尔思光电（成都）有限公司 | Optical module performance parameter debugging method and system |
| WO2020150863A1 (en) * | 2019-01-21 | 2020-07-30 | 上海燎云信息科技有限公司 | Optical communication module testing method and apparatus and terminal device |
| CN114124693A (en) * | 2021-11-08 | 2022-03-01 | 中国联合网络通信集团有限公司 | Parameter configuration method, device and storage medium |
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