CN104459311A - Automatic-temperature-control system for testing frequency characteristics of crystals in batches - Google Patents
Automatic-temperature-control system for testing frequency characteristics of crystals in batches Download PDFInfo
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- CN104459311A CN104459311A CN201410653751.3A CN201410653751A CN104459311A CN 104459311 A CN104459311 A CN 104459311A CN 201410653751 A CN201410653751 A CN 201410653751A CN 104459311 A CN104459311 A CN 104459311A
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Abstract
The invention discloses a system for testing the frequency characteristics of crystals in batches in the automatic temperature control environment. The system comprises a circuit module, a channel control module, a daughter board, a circuit system control mother board, control software, a temperature box, a crystal adapter and a frequency meter. The circuit module provides driving for the crystals, the channel control module carries out crystal driving and output selection, the daughter board manages and drives the circuit module and the channel control module for controlling and being responsible for communication, the control software runs on a central controller, and the temperature of the temperature box can be controlled in a programmed mode. According to the system, the frequency characteristics of the crystals can be automatically tested in batches at different temperatures, the system structure is flexible, the testing speed is high, the crystal testing efficiency is greatly improved, and the cost is reduced.
Description
Technical field
The present invention relates to crystal field tests, particularly relate to and carry out production that temperature frequency characteristic tests automatically, experimentation at crystal.
Background technology
The crystal that in wide temperature range, high-frequency is stable is the important and basic ingredient of contemporary electronic systems as communication, radar etc.The frequency temperature degree of stability of crystal directly determines the frequency stability of whole system.Therefore have the occasion of the special applications of high request at some to time, frequency, the frequency stability of crystal is very important investigation parameter.In the factors affecting frequency stabilization, temperature is very important parameter.Different crystal can have the form of secondary, three times or even repeatedly curve distribution according to the difference of white tiles cut direction.In order to reduce the impact of temperature on the frequency of crystal, needing the temperature of Measurement accuracy crystal and frequency relation thus carrying out the correction of various mode.The frequency-temperature characteristic relation of current crystal mainly contains following several metering system:
Inferior crystal is only at room temperature tested, and stricti jurise is said, this method of testing can not reflect the temperature frequency characteristic of crystal.
Manual testing: be put in by crystal in incubator, after powering up, tests the frequency of multiple crystal respectively at different temperatures by artificial mode.The method not only speed is slow, and efficiency is low, and error rate is high.
The testing apparatuss such as the 250B of Saunders company of the U.S. are adopted to carry out temperature frequency test.This testing apparatus can test crystal parameter, but can not carry out temperature control.Need Non-follow control incubator and carry out crystal switching, efficiency is low.Meanwhile, this equipment cost is very high.Only board just needs 50,000 yuan, and the test adapter of each crystal is 10,000 yuan.For price usually less than the crystal of 1 yuan, cost is too high.
The testing apparatuss such as the W2200 of Saunders company of the U.S. are adopted to carry out temperature frequency test.This equipment can carry out the temperature frequency test of polycrystal wide temperature range.But it is not special crystal temperature frequency characterisitic parameter equipment that this equipment can test multiple parameter, and therefore cost is very high.Equipment price with an incubator is about 300,000 yuan.Meanwhile, this equipment single can load the crystal Limited Number of incubator, only has 256.Because incubator heats up slowly, this system obviously can cause the significantly rising of crystal testing cost, significantly improves the cost of crystal production enterprise.
Summary of the invention
In order to solve above-mentioned technical matters, the invention provides the frequency parameter special test system based on frequency meter.Automatic temperature-adjusting controls batch crystal frequency characteristic test system, its object and advantage are, the temperature frequency characterisitic parameter test macro of special crystal is provided, this system single test crystal number does not have the upper limit, automatic temperature-adjusting can be realized control and frequency measurement low cost and low error rate, realize the automatic analysis of crystal temperature frequency characteristic; System architecture is simple, significantly can reduce testing cost; System architecture is flexible, can need the adjustment carrying out incubator and board according to test amount of crystals, and the needing of follow-up measuring accuracy selects different frequency meters, makes testing cost minimum.
The invention provides the crystal temperature frequency parameter special test system based on frequency meter, comprising: 1, for crystal provides the circuit module of driving.2, carry out crystal-driven and export the channel control module selected.3, manage drive circuit module control with channel control module and be responsible for the daughter board that communicates.4, Circuits System controls motherboard.5, the control software design on central controller is run on.6, temperature can programme controlled incubator.7, crystal adapter.8, frequency meter.
1, for crystal provides the circuit module of driving.This module provides power supply for crystal oscillation.This module is simultaneously for multiple crystal provides driving.
2, carry out crystal-driven and export the channel control module selected.This module carries out passage control, thus selects different crystal to power up, and the output of selected crystal is outputted to port by selecting corresponding output channel simultaneously.
3, manage drive circuit module control with channel control module and be responsible for the daughter board that communicates.One piece of daughter board there are drive circuit module, channel selecting module and communication module.Communication module is responsible for different daughter board and daughter board directly communicates with motherboard, carries out the mutual of control command, the transmission of crystal output signal.
4, Circuits System controls motherboard.Circuits System controls motherboard and is responsible for the job order coordinating different daughter board, with the communication of daughter board and the communication with central controller.
5, the control software design on central controller is run on.Software carries out the selection of tested crystal, controls incubator, simultaneously driving frequency meter test result is read meeting from frequency meter.Central controller software is also to test result and data analysis.
6, temperature can programme controlled incubator.Adjustment temperature, for crystal test provides different temperature environments.
7, crystal adapter.Effectively reliable connection crystal pins and drive circuit module, channel selecting module.
8, frequency meter.Carry out frequency counting accurately, measure crystal and export.
The invention provides automatic temperature-adjusting and control batch crystal frequency characteristic test system, its course of work is as follows:
Step 1, central controller software initialization relevant device;
Step 2, central controller software adjustment Temperature of Warm Case, the backward lower operation of temperature stabilization.
Step 3, central controller software is determined to test crystal, and sends the corresponding command.
Step 4, motherboard receives centralized controller commands, and sends a command to daughter board.
Step 5, after daughter board controller receives order, control channel select module, drive circuit module for select tested crystal power supply is provided, channel selecting module opens respective channel, make crystal export be connected to bus.
Step 6, frequency meter test crystal exports, and by the central controller of test result transmission.
Step 7, central controller receives test result, and result is stored and analyze.
Step 8, tests next crystal until be completed at this temperature.
Step 9, adjusts next temperature spot, until be completed.
Accompanying drawing explanation
Fig. 1 is crystal temperature frequency parameter special test system structural drawing (system construction drawing) based on frequency meter;
Fig. 2 daughter board structural drawing;
Fig. 3 motherboard structure figure;
Embodiment
The invention provides a kind of crystal temperature frequency parameter special test system based on frequency meter, for making object of the present invention, concrete scheme and advantage more clear, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in more detail.
Tested object is the column crystal of 32.768K.
The high temperature test socket of the 1.77mm of 28 pins selected by crystal adapter
The E53220 of Agilent company selected by frequency meter, and incubator selects central controller in Espec SU-221 Fig. 1 of ESPEC to select common desktop computer.The software based on VB is devised in computer.This software is responsible for controlling incubator, and reads temperature real time temperature; Driving frequency meter, carries out initialization to frequency meter, and reads measurement result from frequency meter.Communicated by RS232 with motherboard, issuing control order, receives motherboard feedback information.
Use the EPM1270 of Altera as processor in Fig. 2 in motherboard, be responsible for communicating with computer, the control command of computer be transmitted on the daughter board be inserted on motherboard simultaneously.Motherboard structure figure as shown in Figure 2.Motherboard daughter board is connected with daughter board by slot.
In Fig. 3, the EPM1270 of daughter board Altera is as processor, the order that motherboard forwards makes an explanation by processor, and send to channel selecting module, channel selecting module control power module give corresponding crystal power up, and open channel selecting module by crystal export be connected on Measurement channel.Comprise crystal-driven circuit in power module, can MK3200 be selected.Channel selecting module can AD1608.
Power module is connected to crystal adapter by connecting line, for corresponding crystal powers up.Channel selecting module is connected to adapter by line, is exported by crystal and is connected to Measurement channel.
The foregoing is only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (12)
1. automatic temperature-adjusting controls batch crystal frequency characteristic test system and controls Temperature of Warm Case according to test request, the frequency characteristic of a large amount of crystal of concurrent testing.
2. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: the frequency measuring equipment needed for crystal test is minimum is 1 single channel, according to testing requirement, multiple stage frequency test equipment can be installed, also can be multichannel frequency testing apparatus.
3. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: the number gear shaper without theoretical upper limit of tested crystal, is only limited to selected incubator cavity size.
4. the number gear shaper without theoretical upper limit of tested crystal as claimed in claim 3, is only limited to selected incubator cavity size, it is characterized in that, selects according to the number of crystal to be measured the number controlling daughter board, motherboard and crystal adapter accordingly.
5. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: central controller controls testing process, Temperature of Warm Case, and stores test result process, processes and analyze.The hardware of central memory can adopt the plurality of devices such as computer, single-chip microcomputer, Arm.Its software also can adopt multilingual design, as matlab, C++, VB .net, labview, windows CVI etc.
6. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: motherboard is responsible for communicating with central controller, and the signal sent by central controller makes an explanation and is transmitted to daughter board.
7. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: motherboard can install one or a few daughter board as required.
8. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: the order of daughter board receiving end motherboard provides power supply or other start signal for tested crystal, and is exported by crystal and be connected to output channel.
9. the motherboard as described in claim 6,8 is responsible for communicating with central controller, and the signal sent by central controller makes an explanation and is transmitted to daughter board, the order of daughter board receiving end motherboard provides power supply or other start signal for tested crystal, and crystal output is connected to output channel, it is characterized in that: mother matrix can be connected by slot or other connected mode for pcb board separately with daughter board, also can be same pcb board card.
10. automatic temperature-adjusting as claimed in claim 1 controls batch crystal frequency characteristic test system, it is characterized in that: crystal obtains reliable electrical equipment by crystal adapter and connects thus obtain driving power, and output signal is exported.
11. automatic temperature-adjustings as claimed in claim 1 control batch crystal frequency characteristic test system, it is characterized in that: crystal and crystal adapter are placed in incubator, daughter board, mother matrix can be placed in incubator, also can be placed in outside incubator, are connected by cable with crystal adapter.
12. automatic temperature-adjustings as claimed in claim 1 control batch crystal frequency characteristic test system, it is characterized in that: the part being placed in incubator, as crystal adapter, daughter board, mother matrix, can the induction installation such as mounting temperature sensor, humidity sensor, pressure transducer above it again, improve accuracy of measurement, or provide supplementary for measuring.
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| CN201410653751.3A CN104459311A (en) | 2014-11-18 | 2014-11-18 | Automatic-temperature-control system for testing frequency characteristics of crystals in batches |
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| CN201410653751.3A CN104459311A (en) | 2014-11-18 | 2014-11-18 | Automatic-temperature-control system for testing frequency characteristics of crystals in batches |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104807562A (en) * | 2015-05-08 | 2015-07-29 | 福州大学 | Labview-based temperature sensor chip testing system |
| CN104833446A (en) * | 2015-05-08 | 2015-08-12 | 福州大学 | CMOS temperature sensing chip test system |
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| US20100295623A1 (en) * | 2009-05-22 | 2010-11-25 | Sirf Technology, Inc. | Systems and methods for calibrating real time clock |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
| CN102621381A (en) * | 2012-01-13 | 2012-08-01 | 平湖市电子有限公司 | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators |
| CN202649402U (en) * | 2012-04-18 | 2013-01-02 | 广州市三才通讯科技有限公司 | Test system capable of automatically measuring temperature feature of batch crystal oscillators |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100295623A1 (en) * | 2009-05-22 | 2010-11-25 | Sirf Technology, Inc. | Systems and methods for calibrating real time clock |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
| CN102621381A (en) * | 2012-01-13 | 2012-08-01 | 平湖市电子有限公司 | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators |
| CN202649402U (en) * | 2012-04-18 | 2013-01-02 | 广州市三才通讯科技有限公司 | Test system capable of automatically measuring temperature feature of batch crystal oscillators |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104807562A (en) * | 2015-05-08 | 2015-07-29 | 福州大学 | Labview-based temperature sensor chip testing system |
| CN104833446A (en) * | 2015-05-08 | 2015-08-12 | 福州大学 | CMOS temperature sensing chip test system |
| CN104833446B (en) * | 2015-05-08 | 2017-07-04 | 福州大学 | A kind of CMOS TEMPs chip test system |
| CN104807562B (en) * | 2015-05-08 | 2017-10-20 | 福州大学 | TEMP chip test system based on labview |
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Addressee: Beijing 7Q Technology Co., Ltd. Document name: Notification of Publication and of Entering the Substantive Examination Stage of the Application for Invention |
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Address after: Room 5, building 98, No. 102300 West Lake Road, Mentougou District, Beijing, China Applicant after: Beijing 7Q Technology Co., Ltd. Address before: 100029, A, block 69, mount, No. 202, Beichen West Road, Beijing, Chaoyang District Applicant before: Beijing 7Q Technology Co., Ltd. |
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Application publication date: 20150325 |