CN104406988A

CN104406988A - Method for detecting defects inside glass

Info

Publication number: CN104406988A
Application number: CN201410659995.2A
Authority: CN
Inventors: 周滨; 汪凯巍; 王晨; 白剑; 何帆; 张赛
Original assignee: Zhejiang University ZJU
Current assignee: Zhejiang University ZJU
Priority date: 2014-11-18
Filing date: 2014-11-18
Publication date: 2015-03-11

Abstract

本发明公开了一种玻璃内部缺陷的检测方法，在暗场环境下，利用线结构光源对被测玻璃侧面进行照射，玻璃内部的缺陷如杂质、裂痕等会散射一部分光，利用高分辨率的CCD相机从被测玻璃的正面进行拍摄，记录一系列带有缺陷信息的图像，然后移动玻璃到下一个位置，再进行拍摄，最后得到被测玻璃侧面所有照射位置的缺陷图像。由于高分辨率的CCD相机的视场有限，先将某一片层处得到的图像进行二维拼接，得到该片层的缺陷图像，记录缺陷的二维坐标和所属片层序号，再对所有片层处的缺陷图像进行三维重建，得到整个玻璃内部缺陷的三维图像。本发明检测方法简单，测量精度高，可以对玻璃内部的杂质、裂痕等缺陷的位置进行精确检测。The invention discloses a method for detecting internal defects of glass. In a dark field environment, a line structure light source is used to irradiate the side of the glass to be tested, and defects such as impurities and cracks inside the glass will scatter part of the light. The CCD camera shoots from the front of the glass under test, records a series of images with defect information, then moves the glass to the next position, takes another shot, and finally obtains defect images of all illuminated positions on the side of the glass under test. Due to the limited field of view of the high-resolution CCD camera, the images obtained at a certain layer are firstly stitched two-dimensionally to obtain the defect image of the layer, and the two-dimensional coordinates of the defect and the serial number of the layer to which it belongs are recorded, and then all the layers are Three-dimensional reconstruction is performed on the defect image at the first layer to obtain a three-dimensional image of the defect inside the entire glass. The detection method of the invention is simple, the measurement precision is high, and the positions of defects such as impurities and cracks inside the glass can be accurately detected.

Description

A method for detecting internal defects of glass

技术领域technical field

本发明涉及一种玻璃内部缺陷的检测方法，适用于玻璃、光学元件毛坯、其他透明材料如塑料、晶体等内部缺陷的检测。The invention relates to a method for detecting internal defects of glass, which is suitable for detecting internal defects of glass, optical element blanks, and other transparent materials such as plastics and crystals.

背景技术Background technique

玻璃在生产过程中，由于材料纯度、生产工艺等原因，会在玻璃的内部引入杂质、气泡，甚至是裂痕等缺陷，这些缺陷会增加玻璃的脆性，以及降低其机械性能。当带有缺陷的玻璃用来生产光学透镜等光学仪器时，由于产生杂散光以及能量吸收不均匀，会降低成像质量，甚至造成光学系统的损坏。因此，在玻璃生产过程和产品质量检查中，如何检验识别玻璃内部的缺陷成为了亟待解决的问题。目前，许多玻璃生产厂家还在使用目视法这种传统的检验方法，即在规定的检验条件下，利用裸眼对玻璃进行缺陷检查，这种方法不仅费时费力，而且精度很低，效率不高，完全凭检验人员的主观判断。有些厂家利用显微镜来检查缺陷，这种方法精度虽然比目视法高，但是视场很小，不利于中大口径玻璃的检测，而且工作量很大。During the production process of glass, due to material purity, production process and other reasons, impurities, bubbles, and even cracks and other defects will be introduced into the glass. These defects will increase the brittleness of the glass and reduce its mechanical properties. When glass with defects is used to produce optical instruments such as optical lenses, due to the generation of stray light and uneven energy absorption, the imaging quality will be reduced, and even the optical system will be damaged. Therefore, in the glass production process and product quality inspection, how to inspect and identify the defects inside the glass has become an urgent problem to be solved. At present, many glass manufacturers are still using the traditional inspection method of visual method, that is, under the specified inspection conditions, use the naked eye to inspect the glass for defects. This method is not only time-consuming and laborious, but also has low precision and low efficiency. , depends entirely on the subjective judgment of the inspector. Some manufacturers use a microscope to inspect defects. Although this method has higher precision than the visual method, the field of view is small, which is not conducive to the inspection of medium and large diameter glasses, and the workload is heavy.

因此，需要开发一种能够自动检测玻璃内部缺陷的检测方法，能够检测缺陷的类型、位置信息，并且要有很高的效率和精度，从而很好的控制玻璃的质量。Therefore, it is necessary to develop a detection method that can automatically detect the internal defects of glass, which can detect the type and location information of defects, and must have high efficiency and precision, so as to control the quality of glass well.

发明内容Contents of the invention

本发明针对现有技术测量精度不高、效率较低且不能自动检测等不足，提供了一种玻璃内部缺陷的检测方法，通过线结构光源从侧面对玻璃进行照明，得到每一片层的缺陷信息，最后进行三维重建，得到整个玻璃内部缺陷的三维坐标。Aiming at the shortcomings of the prior art, such as low measurement accuracy, low efficiency, and incapability of automatic detection, the present invention provides a detection method for glass internal defects. The glass is illuminated from the side by a line-structured light source, and the defect information of each layer is obtained. , and finally carry out 3D reconstruction to obtain the 3D coordinates of the defects inside the whole glass.

本发明的目的是通过以下技术方案来实现的：一种玻璃内部缺陷的检测方法，包括以下步骤：The purpose of the present invention is achieved by the following technical solutions: a detection method for glass internal defects, comprising the following steps:

(1)扫描拍摄玻璃内部缺陷图像，具体包括以下子步骤：(1) Scanning and taking images of defects inside the glass, specifically including the following sub-steps:

(1.1)在暗场环境下，利用线结构光源1对准被测玻璃3侧面的最左端，将CCD相机4的视场对准被测玻璃3正面的最左上方；利用CCD相机4从被测玻璃3的正面进行拍摄，移动被测玻璃3使得CCD相机4按照蛇形扫描方式对被测玻璃3进行拍摄，得到第一片层的一系列带有缺陷信息且具有重叠区域的子孔径图像；(1.1) Under the dark field environment, utilize the line structure light source 1 to aim at the leftmost end of the side of the measured glass 3, align the field of view of the CCD camera 4 to the upper leftmost of the front of the measured glass 3; The front side of the test glass 3 is photographed, and the test glass 3 is moved so that the CCD camera 4 photographs the test glass 3 in a serpentine scanning manner, and a series of sub-aperture images with defect information and overlapping areas of the first layer are obtained ;

(1.2)将被测玻璃3移动一个步长，使得线结构光源1对准被测玻璃3侧面的第二片层；所述步长等于线结构光源1的线宽，CCD相机4向相同方向移动相同步长，重复步骤1.1的蛇形扫描过程，得到被测玻璃3第二片层的缺陷图像；(1.2) The measured glass 3 is moved by a step, so that the line structured light source 1 is aligned with the second sheet on the side of the measured glass 3; the step is equal to the line width of the line structured light source 1, and the CCD camera 4 faces the same direction Move the same step length, repeat the serpentine scanning process of step 1.1, and obtain the defect image of the second sheet of the glass 3 to be tested;

(1.3)重复步骤1.2直至完成被测玻璃3整个侧面的扫描；(1.3) Step 1.2 is repeated until the scanning of the entire side of the measured glass 3 is completed;

(2)玻璃内部缺陷的三维重建，具体包括以下子步骤：(2) Three-dimensional reconstruction of glass internal defects, specifically including the following sub-steps:

(2.1)将某一片层的子孔径图像根据相邻子孔径图像重叠区域的特征信息，通过最小二乘法进行二维拼接，得到该片层的玻璃缺陷图像，记录缺陷的二维坐标和所属片层序号；(2.1) The sub-aperture image of a certain layer is spliced two-dimensionally by the least square method according to the characteristic information of the overlapping area of adjacent sub-aperture images to obtain the glass defect image of the layer, and record the two-dimensional coordinates of the defect and the sheet to which it belongs layer serial number;

(2.2)对所有片层的玻璃缺陷图像进行三维重建，得到被测玻璃3的内部缺陷三维图像，从而完成对被测玻璃3内部缺陷的检测。(2.2) Three-dimensional reconstruction is performed on the glass defect images of all layers to obtain a three-dimensional image of the internal defects of the tested glass 3 , thereby completing the detection of the internal defects of the tested glass 3 .

进一步地，所述线结构光源1的线宽小于50μm。Further, the line width of the line structured light source 1 is less than 50 μm.

进一步地，所述CCD相机4镜头的景深大于线结构光源1的线宽。Further, the depth of field of the lens of the CCD camera 4 is greater than the line width of the line-structured light source 1 .

进一步地，所述得到被测玻璃3的内部缺陷三维图像具体为：对于独立的缺陷点，给出位置坐标信息，对于裂痕，给出裂痕的位置和长度信息。Further, the obtaining of the three-dimensional image of the internal defect of the tested glass 3 specifically includes: for an independent defect point, position coordinate information is given, and for a crack, position and length information of the crack is given.

本发明的有益效果如下：The beneficial effects of the present invention are as follows:

1、自动检测：本发明在检测过程中只需设定三维位移平台的移动步长，利用CCD相机拍摄图像，即可完成对整个玻璃的自动检测，能为生产过程节省大量宝贵时间。1. Automatic detection: In the detection process, the invention only needs to set the moving step of the three-dimensional displacement platform, and use the CCD camera to capture images, and then the automatic detection of the entire glass can be completed, which can save a lot of precious time for the production process.

2、精度高：本发明可以检测几十微米大小的缺陷，基本满足一般生产过程中的玻璃内部缺陷检测精度要求。2. High precision: the present invention can detect defects with a size of tens of microns, which basically meets the detection accuracy requirements of glass internal defects in the general production process.

3、应用范围广：适用于玻璃、光学元件毛坯、其他透明材料如塑料、晶体等内部缺陷的检测，且可以应用于大口径玻璃内部缺陷的检测。3. Wide range of applications: It is suitable for the detection of internal defects of glass, optical element blanks, and other transparent materials such as plastics and crystals, and can be applied to the detection of internal defects of large-diameter glass.

附图说明Description of drawings

图1为本发明提供的一种玻璃内部缺陷的检测方法所用的装置的示意图；Fig. 1 is the schematic diagram of the device used in the detection method of a kind of glass internal defect provided by the present invention;

图2为CCD相机扫描拍摄路径；Figure 2 is the scanning and shooting path of the CCD camera;

图中：1为线结构光源，2为载放玻璃的三维位移平台，3为被测玻璃，4为CCD相机，5为载放CCD相机的一维位移平台，6为计算机。In the figure: 1 is a line structure light source, 2 is a three-dimensional displacement platform for placing glass, 3 is the glass to be tested, 4 is a CCD camera, 5 is a one-dimensional displacement platform for placing a CCD camera, and 6 is a computer.

具体实施方式Detailed ways

为了更好地说明本发明的技术方案，以下结合附图作进一步详细地描述。In order to better illustrate the technical solution of the present invention, a further detailed description will be made below in conjunction with the accompanying drawings.

图1是本发明提供的一种玻璃内部缺陷的检测方法所用的装置的示意图，检测装置包括线结构光源1、载放玻璃的三维位移平台2、高分辨率的CCD相机4、载放CCD相机的一维位移平台5和计算机6，被测玻璃3放置在三维位移平台2上，可沿xyz三个方向移动，CCD相机4放置在一维位移平台5上，可沿x方向移动，从被测玻璃3的正面垂直拍摄，线结构光源1位置固定，从被测玻璃3侧面垂直入射进行照明。Fig. 1 is a schematic diagram of a device used in a method for detecting internal defects of glass provided by the present invention. The detection device includes a line-structured light source 1, a three-dimensional displacement platform 2 for placing glass, a high-resolution CCD camera 4, and a carrying CCD camera. The one-dimensional displacement platform 5 and the computer 6, the measured glass 3 is placed on the three-dimensional displacement platform 2, which can move along the three directions of xyz, and the CCD camera 4 is placed on the one-dimensional displacement platform 5, which can move along the x direction. The front of the glass 3 to be tested is photographed vertically, the position of the line structured light source 1 is fixed, and the light is illuminated vertically from the side of the glass 3 to be tested.

本发明一种玻璃内部缺陷的检测方法，包括以下步骤：A method for detecting internal defects of glass of the present invention comprises the following steps:

步骤1：扫描拍摄玻璃内部缺陷图像，具体为：在暗场环境下，沿x方向调整三维位移平台2，使得线结构光源1对准被测玻璃3侧面的最左端，即被测玻璃3的第一片层，沿y、z方向调整三维位移平台2，使得CCD相机4的视场对准被测玻璃3正面的最左上方，调整CCD相机4的焦面，使其对焦到被测玻璃3的正面，利用计算机6控制CCD相机4拍摄图像，在y、z方向设定三维位移平台2的移动步长，所述移动步长小于CCD相机4的视场，然后驱动三维位移平台2按图2的方式进行蛇形扫描，拍摄得到第一片层的一系列带有缺陷信息的子孔径图像；接着在x方向设定三维位移平台2的移动步长等于线结构光源1的线宽，即50μm，同时设定一维位移平台5的移动步长等于线结构光源1的线宽，同时驱动两个位移平台沿x方向移动一个步长，再重复上述的蛇形扫描过程，得到被测玻璃3第二片层的缺陷图像。重复上述过程，直至整个被测玻璃3的侧面全部被照明。Step 1: Scanning and shooting images of internal defects in the glass, specifically: in a dark field environment, adjust the three-dimensional displacement platform 2 along the x direction so that the line structure light source 1 is aligned with the leftmost end of the side of the glass 3 to be tested, that is, the edge of the glass 3 to be tested For the first layer, adjust the three-dimensional displacement platform 2 along the y and z directions so that the field of view of the CCD camera 4 is aligned with the top left of the front of the glass 3 to be tested, and adjust the focal plane of the CCD camera 4 to focus on the glass to be tested 3, utilize the computer 6 to control the CCD camera 4 to take images, set the moving step size of the three-dimensional displacement platform 2 in the y and z directions, the moving step length is smaller than the field of view of the CCD camera 4, and then drive the three-dimensional displacement platform 2 to press Carry out serpentine scanning in the manner shown in Figure 2, and obtain a series of sub-aperture images with defect information on the first layer; then set the moving step of the three-dimensional displacement platform 2 in the x direction to be equal to the line width of the line-structured light source 1, That is, 50 μm. At the same time, set the moving step of the one-dimensional displacement platform 5 to be equal to the line width of the line structure light source 1, drive the two displacement platforms to move a step along the x direction at the same time, and then repeat the above-mentioned serpentine scanning process to obtain the measured Defect image of the second ply of glass 3. The above process is repeated until the entire side of the glass 3 to be tested is illuminated.

步骤2：玻璃内部缺陷的三维重建，具体为：在暗场环境下，当被测玻璃3内部存在杂质点、裂痕等缺陷时，这些散射体会散射从侧面入射的光，通过玻璃正面的高分辨率CCD相机4拍摄可以得到清晰的缺陷图像；当被测玻璃内部没有缺陷时，因为没有光从玻璃的正面射出，因此CCD相机4拍摄得到的图像为暗场。由于使用线结构光源1进行照明，所以拍摄得到的图像所包含的缺陷均为点缺陷，即缺陷图像可以分为包含点缺陷的图像和无缺陷图像。Step 2: Three-dimensional reconstruction of internal defects of the glass, specifically: in the dark field environment, when there are defects such as impurity points and cracks inside the measured glass 3, these scatterers will scatter the light incident from the side, and pass the high-resolution image of the front of the glass. High-rate CCD camera 4 can get clear defect images; when there is no defect inside the glass to be tested, because there is no light emitted from the front of the glass, the image captured by CCD camera 4 is a dark field. Since the line-structured light source 1 is used for illumination, the defects contained in the photographed image are all point defects, that is, the defect images can be divided into images containing point defects and images without defects.

在对某一片层的图像进行二维子孔径拼接时，先提取每张子孔径图像的右侧(除去最右边一列)和下侧(除去最下边一行)的重叠区域，重叠区域的大小一般取子孔径图像面积的四分之一，对重叠区域进行二值化处理，对处理后的图像进行连通区域的标记，每个连通区域即代表一个特征点，如果没有连通区域，则该图像没有特征点。然后将含有特征点的重叠区域和不含特征点的重叠区域进行分类，并记录下含有特征点的重叠区域所属图像的编号、在图像中的位置(右侧或者下侧)，以及一个特征点的位置。接着以重叠区域的特征点为模板首先对包含缺陷的图像进行拼接，即在特征点位置处选取一块大小合适的模板，利用最小二乘法进行相关度匹配拼接。When performing two-dimensional sub-aperture splicing on images of a certain slice, the overlapping areas on the right side (excluding the rightmost column) and the bottom side (excluding the bottom row) of each sub-aperture image are extracted first, and the size of the overlapping area is generally taken as One quarter of the area of the sub-aperture image, binary processing is performed on the overlapping area, and the connected area is marked on the processed image. Each connected area represents a feature point. If there is no connected area, the image has no features. point. Then classify the overlapping areas containing feature points and the overlapping areas without feature points, and record the number of the image to which the overlapping area containing feature points belongs, the position in the image (right side or lower side), and a feature point s position. Then use the feature points in the overlapping area as a template to first stitch the images containing defects, that is, select a template with an appropriate size at the position of the feature points, and use the least square method to perform correlation matching and stitching.

设A₁(m₀+i,n₀+j)为模板A₁位于(m₀+i,n₀+j)处像素的灰度值；B₁(m₁+i,n₁+j)为重叠区域B₁位于(m₁+i,n₁+j)处像素的灰度值，通常取它们灰度差的平方和作为评判标准：Let A ₁ (m ₀ +i,n ₀ +j) be the gray value of the pixel of template A ₁ located at (m ₀ +i,n ₀ +j); B ₁ (m ₁ +i,n ₁ +j) is the gray value of the pixel in the overlapping area B ₁ located at (m ₁ +i,n ₁ +j), and the sum of the squares of their gray difference is usually taken as the criterion:

$D D. (({m m}_{11},, {n no}_{11})) = = {Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {[[{A A}_{11} (({m m}_{00} + + i i,, {n no}_{00} + + j j)) - - {B B}_{11} (({m m}_{11} + + i i,, {n no}_{11} + + j j))]]}^{22} - - - - - - ((11))$

展开，可得：Expand to get:

$\begin{matrix} D D. (({m m}_{11},, {n no}_{11})) = = {Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {[[{A A}_{11} (({m m}_{00} + + i i,, {n no}_{00} + + j j))]]}^{22} - - 22 {Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {B B}_{11} (({m m}_{11} + + i i,, {n no}_{11} + + j j)) \times \times {A A}_{11} (({m m}_{00} + + i i,, {n no}_{00} + + j j)) \\ + + {Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {[[{B B}_{11} (({m m}_{11} + + i i,, {n no}_{11} + + j j))]]}^{22} \end{matrix} - - - - - - ((22))$

将式(2)归一化后可得模板匹配的相关系数After normalizing formula (2), the correlation coefficient of template matching can be obtained

$ϵ ϵ (({m m}_{11},, {n no}_{11})) = = \frac{{Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {B B}_{11} (({m m}_{11} + + i i,, {n no}_{11} + + j j)) \times \times {A A}_{11} (({M m}_{00} + + i i,, {N N}_{00} + + j j))}{\sqrt{{Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {[[{A A}_{11} (({m m}_{00} + + i i,, {n no}_{00} + + j j))]]}^{22}} \sqrt{{Σ Σ}_{i i = = 11}^{M m - - 11} {Σ Σ}_{j j = = 11}^{N N - - 11} {[[{B B}_{11} (({m m}_{11} + + i i,, {n no}_{11} + + j j))]]}^{22}}} - - - - - - ((33))$

上式中，M、N分别为模板A₁的长度和宽度，(m₀,n₀)、(m₁,n₁)分别为模板A₁、重叠区域B₁左上角像素点的坐标，ε(m₁,n₁)是m₁和n₁的函数。In the above formula, M and N are the length and width of the template A ₁ respectively, (m ₀ ,n ₀ ), (m ₁ ,n ₁ ) are the coordinates of the upper left corner pixel of the template A ₁ and the overlapping area B ₁ respectively, ε (m ₁ ,n ₁ ) is a function of m ₁ and n ₁ .

通常ε(m₁,n₁)的值越大，模块匹配程度越高，当A₁和B₁灰度值完全相等时，ε(m₁,n₁)的值为1。在实际拼接过程中，在待拼接图中移动模板的位置(m₁,n₁)来确定最佳匹配点。Usually, the larger the value of ε(m ₁ , n ₁ ), the higher the degree of module matching. When the gray values of A ₁ and B ₁ are completely equal, the value of ε(m ₁ ,n ₁ ) is 1. In the actual splicing process, the position (m ₁ , n ₁ ) of the template is moved in the image to be spliced to determine the best matching point.

为了减少拼接的误差，以两幅图像距离较近的先拼接，距离较远的后拼接为原则。第一轮拼接完成后，剩下的图像重叠区域不含特征点，只能通过三维位移平台2的移动距离来确定两幅图像的相对位置，将它们拼接在一起。经过两轮拼接后，就可以得到某一片层玻璃正面的全景图。然后通过图像处理，记录下全景图上所有缺陷点的二维坐标及所属片层的序号。In order to reduce stitching errors, the principle is to splice the two images that are closer together first, and splice those that are farther apart. After the first round of splicing is completed, the rest of the image overlap area does not contain feature points, and the relative positions of the two images can only be determined by the moving distance of the three-dimensional displacement platform 2, and they are spliced together. After two rounds of splicing, a panoramic view of the front of a certain layer of glass can be obtained. Then through image processing, record the two-dimensional coordinates of all defect points on the panorama and the serial numbers of the slices they belong to.

对得到的所有片层图像进行三维重建，即利用MATLAB软件自带的工具箱对得到的切片进行三维体重建，得到整个玻璃内部缺陷的三维图像。对于独立的缺陷点，给出位置坐标信息，对于裂痕，由于线结构光源1的特点，在二维图像上显示为一个点，通过三维重建，深度方向的信息被还原，得到裂痕的轮廓，给出裂痕的位置和长度信息，从而完成对整个玻璃内部缺陷的检测。Perform three-dimensional reconstruction on all slice images obtained, that is, use the toolbox that comes with MATLAB software to perform three-dimensional volume reconstruction on the obtained slices to obtain a three-dimensional image of the internal defects of the entire glass. For an independent defect point, the position coordinate information is given. For a crack, due to the characteristics of the line-structured light source 1, it is displayed as a point on the two-dimensional image. Through three-dimensional reconstruction, the information in the depth direction is restored, and the outline of the crack is obtained. The position and length information of the crack can be obtained, so as to complete the detection of the internal defects of the entire glass.

Claims

1. a detection method for inside glass defect, is characterized in that, comprises the following steps:

(1) scanning shoot inside glass defect image, specifically comprises following sub-step:

(1.1) under details in a play not acted out on stage, but told through dialogues environment, utilize line structure light source 1 to aim at the high order end of tested glass 3 side, the visual field of CCD camera 4 is aimed at the most upper left side in tested glass 3 front; Utilize CCD camera 4 to take from the front of tested glass 3, mobile tested glass 3 makes CCD camera 4 take tested glass 3 according to snake scan mode, and what obtain the first lamella a series ofly has a sub-aperture image of overlapping region with defect information;

(1.2) tested glass 3 is moved a step-length, make line structure light source 1 aim at the second lamella of tested glass 3 side; Described step-length equals the live width of line structure light source 1, and CCD camera 4 moves identical step-length to equidirectional, repeats the snake scan process of step 1.1, obtains the defect image of tested glass 3 second lamella;

(1.3) step 1.2 is repeated until complete the scanning of the tested whole side of glass 3;

(2) three-dimensional reconstruction of inside glass defect, specifically comprises following sub-step:

(2.1) by the sub-aperture image of a certain lamella according to the characteristic information of adjacent sub-aperture image overlapping region, by least square method carry out two dimension splicing, obtain the glass defect image of this lamella, the two-dimensional coordinate of recording defect and affiliated lamella sequence number;

(2.2) three-dimensional reconstruction is carried out to the glass defect image of all lamellas, obtain the inherent vice 3-D view of tested glass 3, thus complete the detection to tested glass 3 inherent vice.

2. the detection method of a kind of inside glass defect according to claim 1, it is characterized in that, the live width of described line structure light source 1 is less than 50 μm.

3. the detection method of a kind of inside glass defect according to claim 1, it is characterized in that, the depth of field of described CCD camera 4 camera lens is greater than the live width of line structure light source 1.

4. the detection method of a kind of inside glass defect according to claim 1, it is characterized in that, in described step 2.2, the described inherent vice 3-D view obtaining tested glass 3 is specially: for independently defect point, provide location coordinate information, for slight crack, provide position and the length information of slight crack.