CN104296688A - Smooth free-form surface sample measuring device and method based on differential two-photon method - Google Patents
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- 238000000034 method Methods 0.000 title claims abstract description 29
- 239000011248 coating agent Substances 0.000 claims abstract description 18
- 238000000576 coating method Methods 0.000 claims abstract description 18
- 238000006073 displacement reaction Methods 0.000 claims abstract description 12
- 239000000835 fiber Substances 0.000 claims abstract description 12
- 230000003287 optical effect Effects 0.000 claims abstract description 12
- 239000010408 film Substances 0.000 claims description 39
- 230000005284 excitation Effects 0.000 claims description 16
- 238000003384 imaging method Methods 0.000 claims description 14
- 238000004364 calculation method Methods 0.000 claims description 13
- 238000005316 response function Methods 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 8
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- 238000005286 illumination Methods 0.000 claims description 3
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- 238000009924 canning Methods 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
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Abstract
基于差动双光子方法测量光滑自由曲面样品装置和方法属于光学显微测量领域;该装置包括飞秒激光器、传导光纤、准直物镜、二向色镜、聚焦物镜、镀膜样品、三维微位移载物台、滤光片、收集物镜、分光棱镜、第一针孔、第一光电探测器、第二针孔和第二光电探测器。本发明利用飞秒激光器经传导光纤和准直物镜得到平行光,再经二向色镜和聚焦物镜将光束聚焦到放置在三维微位移载物台上的镀膜样品上,聚焦光斑非线性激发荧光膜发出荧光,经第一光电探测器和第二光电探测器收集后,两路信号进行差分运算得到差动响应曲线,通过差动响应曲线零点确定镀膜样品表面位置。采用发明装置与方法测量光滑自由曲面,可以测量法线与光轴方向夹角大的样品表面形貌。
The device and method for measuring smooth free-form surface samples based on the differential two-photon method belong to the field of optical microscopic measurement; the device includes a femtosecond laser, a conductive fiber, a collimating objective lens, a dichroic mirror, a focusing objective lens, a coated sample, and a three-dimensional micro-displacement load. Object stage, optical filter, collecting objective lens, beam splitting prism, first pinhole, first photodetector, second pinhole and second photodetector. The invention uses a femtosecond laser to obtain parallel light through a conductive fiber and a collimating objective lens, and then focuses the light beam on a coated sample placed on a three-dimensional micro-displacement stage through a dichroic mirror and a focusing objective lens, and the focused spot nonlinearly excites fluorescence The film emits fluorescence, and after being collected by the first photodetector and the second photodetector, the two signals are differentially calculated to obtain a differential response curve, and the surface position of the coating sample is determined by the zero point of the differential response curve. The device and method of the invention are used to measure smooth free-form surfaces, and the surface topography of samples with large angles between the normal line and the direction of the optical axis can be measured.
Description
技术领域technical field
基于差动双光子方法测量光滑自由曲面样品装置和方法属于光学显微测量领域。The device and method for measuring a smooth free-form surface sample based on a differential two-photon method belong to the field of optical microscopic measurement.
背景技术Background technique
对于光滑自由曲面表面样品,在法线与光轴方向夹角大的区域,由于照明到样品表面的光因镜面反射而无法被完全收集,或几乎无法被收集,所以其表面形貌无法高精度测量,甚至无法测量。因而如何高精度测量具有较大斜率的光滑自由曲面的样品成了光学测量领域的一个难题。For samples with a smooth free-form surface, in the area where the angle between the normal line and the optical axis direction is large, the light illuminating the sample surface cannot be completely collected due to specular reflection, or can hardly be collected, so the surface topography cannot be highly accurate. Measure, not even measure. Therefore, how to measure a sample with a smooth free-form surface with a large slope with high precision has become a difficult problem in the field of optical measurement.
双光子显微成像装置由W.Denk,J.H.Strickler和W.W.Webb提出(W.Denk,J.H.Strickler and W.W.Webb(1989),‘Two-photon lasers canning fluorescence microscopy’,Science,248(4951):73~76),其基本思想是使用脉冲激光照射生物细胞中的荧光物质,荧光物质被脉冲激光光斑非线性激发,处于焦平面上的荧光物质发出荧光信号,处于焦平面外的荧光物质不发出荧光信号,从而实现对生物细胞的层析成像。由于工业测量领域的测量对象无法发出荧光,所以双光子显微成像装置主要应用在生物显微成像领域,目前尚未有应用在工业样品形貌测量的先例。即使将双光子显微镜简单地移植到工业样品形貌测量领域,也无法克服光束在具有光滑自由曲面的样品表面产生镜面反射导致的收集信号光强极弱的问题。The two-photon microscopic imaging device was proposed by W.Denk, J.H.Strickler and W.W.Webb (W.Denk, J.H.Strickler and W.W.Webb (1989), 'Two-photon lasers canning fluorescence microscopy', Science, 248(4951): 73~ 76), the basic idea is to use a pulsed laser to irradiate fluorescent substances in biological cells, the fluorescent substances are excited nonlinearly by the pulsed laser spot, the fluorescent substances on the focal plane emit fluorescent signals, and the fluorescent substances outside the focal plane do not emit fluorescent signals , so as to realize the tomographic imaging of biological cells. Since the measurement object in the field of industrial measurement cannot emit fluorescence, the two-photon microscopic imaging device is mainly used in the field of biological microscopic imaging, and there is no precedent for its application in the shape measurement of industrial samples. Even if the two-photon microscope is simply transplanted to the field of industrial sample shape measurement, it cannot overcome the problem of extremely weak light intensity of the collected signal caused by the specular reflection of the beam on the sample surface with a smooth free-form surface.
差动共焦扫描测量是典型的改进型共焦测量方法之一。差动共焦扫描测量包括具有高空间分辨成像能力的共焦干涉显微镜(公开号CN1614457A)、具有高空间分辨力的整形环形光束式差动共焦传感器(公开号CN1529123A)、三差动共焦显微成像方法与装置(公开号CN1587898A)、三差动共焦显微三维超分辨成像方法(公开号CN1609590A)、三维超分辨共焦阵列扫描显微探测方法及装置(公开号CN1632448A)、整形环形光三差动共焦显微镜(公开号CN1588157A)、具有高空间分辨力的差动共焦扫描检测方法(公开号CN1527026A)等,差动共焦测量系统将两个共焦点探测器分别置于像方等距离的远离焦和近离焦平面,通过强度响应的差动计算获得双极性响应特性,产生跟踪零点,克服了传统共焦只能进行相对位置测量的不足。该技术相对传统共焦显微技术显著提高了信噪比,并且轴向分辨率与测量范围均为传统共焦显微技术的二倍,尤其在零点位置测量更加准确。但传统差动共焦测量技术仍然难以通过充分收集光滑自由曲率表面样品的反射信号来提高信噪比,从而实现高精度测量光滑自由曲率表面样品形貌的目的。Differential confocal scanning measurement is one of the typical improved confocal measurement methods. The differential confocal scanning measurement includes a confocal interference microscope with high spatial resolution imaging capability (public number CN1614457A), a shaped ring beam differential confocal sensor with high spatial resolution (public number CN1529123A), three differential confocal microscopes Imaging method and device (public number CN1587898A), three-dimensional super-resolution imaging method of three-differential confocal microscope (public number CN1609590A), three-dimensional super-resolution confocal array scanning microscopic detection method and device (public number CN1632448A), three-difference shaping ring light Dynamic confocal microscope (publication number CN1588157A), differential confocal scanning detection method with high spatial resolution (publication number CN1527026A), etc. The differential confocal measurement system places two confocal detectors at the same distance from the image side The far-focus and near-focus planes, the bipolar response characteristics are obtained through the differential calculation of the intensity response, and the tracking zero point is generated, which overcomes the shortcomings of traditional confocals that can only measure relative positions. Compared with the traditional confocal microscopy technology, this technology significantly improves the signal-to-noise ratio, and the axial resolution and measurement range are twice that of the traditional confocal microscopy technology, especially the measurement at the zero point is more accurate. However, the traditional differential confocal measurement technology is still difficult to improve the signal-to-noise ratio by fully collecting the reflection signals of smooth free-curvature surface samples, so as to achieve the purpose of measuring the topography of smooth free-curvature surface samples with high precision.
发明内容Contents of the invention
本发明的目的就是针对上述传统方法难以测量具有较大斜率的光滑自由曲面样品形貌的问题,提出了一种基于差动双光子方法测量光滑自由曲面样品装置和方法,在光滑自由曲面样品表面镀上一层荧光膜,利用荧光膜在激光照射下向各个方向辐射出荧光的特性,避免了光束在光滑自由曲面发生镜面反射导致信号光难以收集的问题;同时,采用双光子激发原理,使用飞秒脉冲激光非线性激发荧光物质,提高层析成像效果;采用差动探测结构,将收集到的两路信号进行差分运算得到差动响应曲线,通过差动响应曲线零点来确定样品表面位置,最终解决测量具有较大斜率的光滑自由曲面样品形貌的问题。The purpose of the present invention is to solve the problem that the above-mentioned traditional method is difficult to measure the shape of a smooth free-form surface sample with a large slope, and proposes a device and method for measuring a smooth free-form surface sample based on a differential two-photon method. Coating a layer of fluorescent film, using the characteristics of the fluorescent film to radiate fluorescence in all directions under laser irradiation, avoids the problem that the light beam is reflected on the smooth free-form surface and the signal light is difficult to collect; at the same time, the two-photon excitation principle is used. The femtosecond pulse laser nonlinearly excites fluorescent substances to improve the tomographic imaging effect; the differential detection structure is used to perform differential operations on the collected two signals to obtain a differential response curve, and the zero point of the differential response curve is used to determine the position of the sample surface. Finally, the problem of measuring the shape of smooth free-form surface samples with large slopes is solved.
本发明的目的是这样实现的:The purpose of the present invention is achieved like this:
基于差动双光子方法测量光滑自由曲面样品装置,包括:激发模块、差动成像模块和镀膜样品;Measurement of smooth free-form surface sample device based on differential two-photon method, including: excitation module, differential imaging module and coated sample;
所述的激发模块包括:飞秒激光器、传导光纤、准直物镜;在飞秒激光器之后依次配置传导光纤和准直物镜;The excitation module includes: a femtosecond laser, a conducting fiber, and a collimating objective lens; the conducting optical fiber and the collimating objective lens are sequentially arranged after the femtosecond laser;
所述的差动成像模块包括:二向色镜、聚焦物镜、三维微位移载物台、滤光片、收集物镜、分光棱镜、第一针孔、第一光电探测器、第二针孔和第二光电探测器;在二向色镜的反射光路上依次配置聚焦物镜和三维微位移载物台,在二向色镜透射光路上配置滤光片、收集物镜、分光棱镜、第一针孔、第一光电探测器、第二针孔和第二光电探测器;所述的第一针孔位于收集物镜焦面之后△z处,第二针孔位于收集物镜焦面之前△z处;The differential imaging module includes: a dichroic mirror, a focusing objective lens, a three-dimensional micro-displacement stage, a filter, a collecting objective lens, a beam splitting prism, a first pinhole, a first photodetector, a second pinhole and The second photodetector: a focusing objective lens and a three-dimensional micro-displacement stage are sequentially arranged on the reflected light path of the dichroic mirror, and a filter, a collecting objective lens, a beam splitting prism, and a first pinhole are arranged on the transmitted light path of the dichroic mirror , the first photodetector, the second pinhole and the second photodetector; the first pinhole is located at Δz behind the focal plane of the collection objective lens, and the second pinhole is located at Δz before the focal plane of the collection objective lens;
所述的镀膜样品为表面镀了荧光物质薄膜的待测样品;The coating sample is a sample to be tested whose surface is coated with a thin film of fluorescent substance;
所述的激发模块中的飞秒激光器发出激发光,经过传导光纤和准直物镜之后形成平行光,平行光束经过二向色镜反射和聚焦物镜透射后在镀膜样品上形成聚焦光斑,所述的聚焦光斑激发镀膜样品表面的荧光膜发出荧光;处于焦平面的荧光膜非线性激发出荧光,处于焦平面以上或以下的荧光膜不发出荧光;The femtosecond laser in the excitation module emits excitation light, which forms parallel light after passing through the conducting fiber and the collimating objective lens, and the parallel light beam forms a focused spot on the coated sample after being reflected by the dichroic mirror and transmitted by the focusing objective lens. The focused light spot excites the fluorescent film on the surface of the coated sample to emit fluorescence; the fluorescent film at the focal plane nonlinearly excites fluorescence, and the fluorescent film above or below the focal plane does not emit fluorescence;
所述的镀膜样品表面激发出的荧光经过聚焦物镜、二向色镜、滤光片、收集物镜透射后被分光棱镜分为两束光,透射光经过第一针孔被第一光电探测器收集,反射光经过第二针孔被第二光电探测器收集。The fluorescence excited on the surface of the coating sample is transmitted through the focusing objective lens, dichroic mirror, filter, and collecting objective lens, and then is divided into two beams of light by the beam splitting prism, and the transmitted light is collected by the first photodetector through the first pinhole , the reflected light is collected by the second photodetector through the second pinhole.
上述基于差动双光子方法测量光滑自由曲面样品装置,所述的镀膜样品表面通过蒸镀的方法镀上一层荧光膜,所述的荧光膜易溶于水或有机溶剂,厚度不超过1μm。The above-mentioned device for measuring smooth free-form surface samples based on the differential two-photon method, the surface of the coated sample is coated with a layer of fluorescent film by evaporation, the fluorescent film is easily soluble in water or organic solvents, and the thickness is not more than 1 μm.
在上述基于差动双光子方法测量光滑自由曲面样品装置上实现的基于差动双光子方法测量光滑自由曲面样品方法,包括以下步骤:The method for measuring a smooth free-form surface sample based on a differential two-photon method implemented on the above-mentioned device for measuring a smooth free-form surface sample based on a differential two-photon method includes the following steps:
(a)通过蒸镀的方法在样品表面形成一层厚度不超过1μm的荧光膜,所述的荧光膜与样品轮廓紧密贴合,形成镀膜样品;(a) forming a fluorescent film with a thickness of no more than 1 μm on the surface of the sample by evaporation, and the fluorescent film closely fits the contour of the sample to form a coated sample;
(b)飞秒激光器发出激发光,经过传导光纤和准直物镜之后形成平行光,平行光束经过二向色镜反射和聚焦物镜透射后在镀膜样品上形成聚焦光斑,所述的聚焦光斑激发镀膜样品表面的荧光膜发出荧光;处于焦平面的荧光膜非线性激发出荧光,处于焦平面以上或以下的荧光膜不发出荧光;(b) The femtosecond laser emits excitation light, which forms parallel light after passing through the conductive fiber and the collimating objective lens. The parallel beam forms a focused spot on the coated sample after being reflected by the dichroic mirror and transmitted by the focusing objective lens. The focused spot excites the coating The fluorescent film on the surface of the sample emits fluorescence; the fluorescent film at the focal plane nonlinearly excites fluorescence, and the fluorescent film above or below the focal plane does not emit fluorescence;
(c)荧光膜激发出的荧光经过第一光电探测器和第二光电探测器收集后,两路信号进行差分运算得到差动响应曲线,通过差动响应曲线零点来确定镀膜样品表面位置;(c) After the fluorescence excited by the fluorescent film is collected by the first photodetector and the second photodetector, the two signals are differentially calculated to obtain a differential response curve, and the surface position of the coating sample is determined by the zero point of the differential response curve;
对于所获得的两路差动信号可以进行两种计算处理:Two calculations can be performed on the obtained two differential signals:
①对两路信号进行差动计算:① Perform differential calculation on the two signals:
ID1(xs,zs)=(|UD(xs,zs,△z)|2+c0)-(|UD(xs,zs,-△z)|2+c0)I D1 (x s ,z s )=(|U D (x s ,z s ,△z)| 2 +c 0 )-(|U D (x s ,z s ,-△z)| 2 +c 0 )
=|UD(xs,zs,△z)|2-|UD(xs,zs,-△z)|2 =|U D (x s ,z s ,△z)| 2 -|U D (x s ,z s ,-△z)| 2
其中ID1表示差动计算时系统的强度响应函数,UD表示双通照明下系统的振幅响应函数,xs和zs表示位置坐标,△z表示探测器离焦量,c0表示信号中的共模噪声;Among them, ID1 represents the intensity response function of the system during differential calculation, U D represents the amplitude response function of the system under double-pass illumination, x s and z s represent the position coordinates, △ z represents the defocus amount of the detector, c 0 represents the signal center common mode noise;
②对两路信号进行抗串扰计算:②Calculation of anti-crosstalk for two signals:
其中ID2表示抗串扰计算时系统的强度响应函数;Among them, I D2 represents the strength response function of the system during anti-crosstalk calculation;
(d)三维微位移载物台带动镀膜样品三维移动,形成三维扫描成像;(d) The three-dimensional micro-displacement stage drives the three-dimensional movement of the coating sample to form a three-dimensional scanning image;
(e)使用水或有机溶剂清洗掉样品表面的荧光膜。(e) Use water or an organic solvent to wash off the fluorescent film on the surface of the sample.
本发明的良好效果在于:Good effect of the present invention is:
1)通过对待测样品镀上荧光膜的方式,克服了传统共焦方法等非接触光学测量技术受光束在光滑自由曲面样品表面发生镜面反射的限制,基于差动双光子方法测量光滑自由曲面样品装置和方法可以实现对具有较大斜率的光滑自由曲面样品的形貌测量,实现对样品侧面反射的信号光的收集。1) By coating the sample with fluorescent film, it overcomes the limitations of the traditional confocal method and other non-contact optical measurement techniques due to the specular reflection of the light beam on the surface of the smooth free-form surface sample, and measures the smooth free-form surface sample based on the differential two-photon method The device and method can realize the shape measurement of a smooth free-form surface sample with a large slope, and realize the collection of signal light reflected from the side of the sample.
2)将双光子显微技术应用到工业测量领域,有利于提高对样品轮廓的层析能力。2) The application of two-photon microscopy to the field of industrial measurement is conducive to improving the chromatography ability of the sample profile.
3)采用像方等距离焦探测,测量结果处理后能有效抑制共模噪声或串模噪声。3) Equivalent focal detection on the image side is adopted, and the common mode noise or series mode noise can be effectively suppressed after the measurement results are processed.
附图说明Description of drawings
图1是基于差动双光子方法测量光滑自由曲面样品装置结构示意图。Fig. 1 is a schematic diagram of the device for measuring smooth free-form surface samples based on the differential two-photon method.
图中件号说明:1、飞秒激光器、2、传导光纤、3、准直物镜、4、二向色镜、5、聚焦物镜、6、镀膜样品、7、三维微位移载物台、8、滤光片、9、收集物镜、10、分光棱镜、11、第一针孔、12、第一光电探测器、13、第二针孔、14、第二光电探测器。Part number description in the figure: 1. Femtosecond laser, 2. Conductive fiber, 3. Collimating objective lens, 4. Dichroic mirror, 5. Focusing objective lens, 6. Coated sample, 7. Three-dimensional micro-displacement stage, 8 , filter, 9, collecting objective lens, 10, beam splitting prism, 11, first pinhole, 12, first photodetector, 13, second pinhole, 14, second photodetector.
具体实施方式Detailed ways
下面结合附图对本发明实施例进行详细说明。Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
具体实施例一Specific embodiment one
本实施例为装置实施例。This embodiment is a device embodiment.
本实施例的基于差动双光子方法测量光滑自由曲面样品装置,结构示意图如图1所示。该装置包括:激发模块、差动成像模块和镀膜样品6;The structure diagram of the device for measuring a smooth free-form surface sample based on the differential two-photon method in this embodiment is shown in FIG. 1 . The device includes: an excitation module, a differential imaging module and a coating sample 6;
所述的激发模块包括:飞秒激光器1、传导光纤2、准直物镜3;在飞秒激光器1之后依次配置传导光纤2和准直物镜3;The excitation module includes: a femtosecond laser 1, a conducting fiber 2, and a collimating objective lens 3; the conducting optical fiber 2 and the collimating objective lens 3 are sequentially arranged after the femtosecond laser 1;
所述的差动成像模块包括:二向色镜4、聚焦物镜5、三维微位移载物台7、滤光片8、收集物镜9、分光棱镜10、第一针孔11、第一光电探测器12、第二针孔13和第二光电探测器14;在二向色镜4的反射光路上依次配置聚焦物镜5和三维微位移载物台7,在二向色镜4透射光路上配置滤光片8、收集物镜9、分光棱镜10、第一针孔11、第一光电探测器12、第二针孔13和第二光电探测器14;所述的第一针孔11位于收集物镜9焦面之后△z处,第二针孔13位于收集物镜9焦面之前△z处;The differential imaging module includes: a dichroic mirror 4, a focusing objective lens 5, a three-dimensional micro-displacement stage 7, an optical filter 8, a collecting objective lens 9, a dichroic prism 10, a first pinhole 11, a first photodetector device 12, the second pinhole 13 and the second photodetector 14; the focusing objective lens 5 and the three-dimensional micro-displacement stage 7 are sequentially arranged on the reflected light path of the dichroic mirror 4, and arranged on the transmitted light path of the dichroic mirror 4 Optical filter 8, collecting objective lens 9, dichroic prism 10, first pinhole 11, first photodetector 12, second pinhole 13 and second photodetector 14; Described first pinhole 11 is positioned at collecting objective lens 9 behind the focal plane at △z, the second pinhole 13 is located at △z before the focal plane of the collecting objective lens 9;
所述的镀膜样品6为表面镀了荧光物质薄膜的待测样品;The coating sample 6 is a sample to be tested whose surface is coated with a thin film of fluorescent substance;
上述基于差动双光子方法测量光滑自由曲面样品装置,所述的镀膜样品6通过蒸镀的方法镀上一层荧光膜,所述的荧光膜易溶于水或有机溶剂,厚度不超过1μm;In the above-mentioned device for measuring smooth free-form surface samples based on the differential two-photon method, the coating sample 6 is coated with a layer of fluorescent film by evaporation, and the fluorescent film is easily soluble in water or organic solvents, and the thickness is not more than 1 μm;
测量使用时:When measuring using:
激发模块中的飞秒激光器1发出激发光,经过传导光纤2和准直物镜3之后形成平行光,平行光束经过二向色镜4反射和聚焦物镜5透射后在镀膜样品6上形成聚焦光斑,所述的聚焦光斑激发镀膜样品6表面的荧光膜发出荧光;处于焦平面的荧光膜非线性激发出荧光,处于焦平面以上或以下的荧光膜不发出荧光;The femtosecond laser 1 in the excitation module emits excitation light, which forms parallel light after passing through the conductive fiber 2 and the collimating objective lens 3, and the parallel beam forms a focused spot on the coated sample 6 after being reflected by the dichroic mirror 4 and transmitted by the focusing objective lens 5. The focused spot excites the fluorescent film on the surface of the coated sample 6 to emit fluorescence; the fluorescent film at the focal plane nonlinearly excites fluorescence, and the fluorescent film above or below the focal plane does not emit fluorescence;
镀膜样品6表面激发出的荧光经过聚焦物镜5、二向色镜4、滤光片8、收集物镜9透射后被分光棱镜10分为两束光,透射光经过第一针孔11被第一光电探测器12收集,反射光经过第二针孔13被第二光电探测器14收集。The fluorescence excited on the surface of the coating sample 6 passes through the focusing objective lens 5, the dichroic mirror 4, the optical filter 8, and the collecting objective lens 9, and then is divided into two beams of light by the beam splitter 10, and the transmitted light passes through the first pinhole 11 and is transmitted by the first pinhole 11. The photodetector 12 collects, and the reflected light passes through the second pinhole 13 and is collected by the second photodetector 14 .
具体实施例二Specific embodiment two
本实施例为在具体实施例一所述装置上实现的方法实施例。This embodiment is an embodiment of the method implemented on the device described in the first specific embodiment.
本实施例的基于差动双光子方法测量光滑自由曲面样品方法,包括以下步骤:The method for measuring a smooth free-form surface sample based on the differential two-photon method of this embodiment includes the following steps:
(a)通过蒸镀的方法将易溶于水的荧光材料罗丹明B镀到样品表面,形成一层厚度不超过1μm的荧光膜,所述的荧光膜与样品轮廓紧密贴合,形成镀膜样品6;(a) The fluorescent material rhodamine B, which is easily soluble in water, is plated on the surface of the sample by evaporation to form a fluorescent film with a thickness of no more than 1 μm. The fluorescent film closely fits the contour of the sample to form a coated sample 6;
(b)飞秒激光器1发出激发光,经过传导光纤2和准直物镜3之后形成平行光,平行光束经过二向色镜4反射和聚焦物镜5透射后在镀膜样品6上形成聚焦光斑,所述的聚焦光斑激发镀膜样品6表面的荧光膜发出荧光;处于焦平面的荧光膜非线性激发出荧光,处于焦平面以上或以下的荧光膜不发出荧光;(b) The femtosecond laser 1 emits excitation light, which forms parallel light after passing through the conducting fiber 2 and the collimating objective lens 3, and the parallel light beam is reflected by the dichroic mirror 4 and transmitted by the focusing objective lens 5 to form a focused spot on the coated sample 6, so The above focused spot excites the fluorescent film on the surface of the coating sample 6 to emit fluorescence; the fluorescent film at the focal plane nonlinearly excites fluorescence, and the fluorescent film above or below the focal plane does not emit fluorescence;
(c)荧光膜激发出的荧光经过第一光电探测器12和第二光电探测器14收集后,两路信号进行差分运算得到差动响应曲线,通过差动响应曲线零点来确定镀膜样品表面位置;(c) After the fluorescence excited by the fluorescent film is collected by the first photodetector 12 and the second photodetector 14, the two signals are differentially calculated to obtain a differential response curve, and the surface position of the coated sample is determined by the zero point of the differential response curve ;
对于所获得的两路差动信号可以进行两种计算处理:Two calculations can be performed on the obtained two differential signals:
①对两路信号进行差动计算:① Perform differential calculation on the two signals:
ID1(xs,zs)=(|UD(xs,zs,△z)|2+c0)-(|UD(xs,zs,-△z)|2+c0)I D1 (x s ,z s )=(|U D (x s ,z s ,△z)| 2 +c 0 )-(|U D (x s ,z s ,-△z)| 2 +c 0 )
=|UD(xs,zs,△z)|2-|UD(xs,zs,-△z)|2 =|U D (x s ,z s ,△z)| 2 -|U D (x s ,z s ,-△z)| 2
其中ID1表示差动计算时系统的强度响应函数,UD表示双通照明下系统的振幅响应函数,xs和zs表示位置坐标,△z表示探测器离焦量,c0表示信号中的共模噪声;Among them, ID1 represents the intensity response function of the system during differential calculation, U D represents the amplitude response function of the system under double-pass illumination, x s and z s represent the position coordinates, △ z represents the defocus amount of the detector, c 0 represents the signal center common mode noise;
②对两路信号进行抗串扰计算:②Calculation of anti-crosstalk for two signals:
其中ID2表示抗串扰计算时系统的强度响应函数;Among them, I D2 represents the strength response function of the system during anti-crosstalk calculation;
(d)三维微位移载物台7带动镀膜样品6三维移动,形成三维扫描成像;(d) The three-dimensional micro-displacement stage 7 drives the coating sample 6 to move three-dimensionally, forming a three-dimensional scanning image;
(e)使用水或有机溶剂清洗掉样品表面的罗丹明B荧光膜。(e) Use water or an organic solvent to wash off the rhodamine B fluorescent film on the surface of the sample.
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