CN104237255A - Detection method of glass substrate - Google Patents
Detection method of glass substrate Download PDFInfo
- Publication number
- CN104237255A CN104237255A CN201410487052.6A CN201410487052A CN104237255A CN 104237255 A CN104237255 A CN 104237255A CN 201410487052 A CN201410487052 A CN 201410487052A CN 104237255 A CN104237255 A CN 104237255A
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- glass substrate
- flaw detection
- detection method
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- 239000011521 glass Substances 0.000 title claims abstract description 127
- 239000000758 substrate Substances 0.000 title claims abstract description 125
- 238000001514 detection method Methods 0.000 title claims abstract description 62
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 52
- 238000011282 treatment Methods 0.000 claims abstract description 22
- 238000005507 spraying Methods 0.000 claims abstract description 19
- 238000004140 cleaning Methods 0.000 claims abstract description 14
- 230000007547 defect Effects 0.000 claims description 22
- 238000007689 inspection Methods 0.000 claims description 20
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 15
- 238000004043 dyeing Methods 0.000 abstract 1
- 230000035515 penetration Effects 0.000 abstract 1
- 230000000717 retained effect Effects 0.000 abstract 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000008595 infiltration Effects 0.000 description 3
- 238000001764 infiltration Methods 0.000 description 3
- 239000012634 fragment Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention provides a detection method of a glass substrate. The detection method comprises the following steps: spraying a penetrant flaw detection agent to the surface of the glass substrate; cleaning the surface of the glass substrate for the first time; performing color development treatment on the surface of the glass substrate so as to obtain the flaw position of the glass substrate according to a color development position on the glass substrate. According to the detection method, by spraying the penetrant flaw detection agent to the surface of the glass substrate, when the flaws of the glass substrate exist, the flaw parts of the glass substrate can be subjected to penetration and dyeing by the penetrant flaw detection agent; after the surface of the glass substrate is subjected to color development treatment to develop the color of the retained penetrant flaw detection agent, the flaw position of the glass substrate can be obtained according to the color development position. Compared with the prior art, the flaw detection type can be added, the flaw detection range can be expanded, and a detection process is hardly influenced by the outside, so that the reliability of a detection result is greatly improved.
Description
Technical field
The present invention relates to display field, particularly relate to a kind of detection method of glass substrate.
Background technology
Glass substrate is LCD industry main former material used, but in complicated technology flow process, often due to a variety of causes cause glass substrate to crack, damaged.
At traditional TFT-LCD (Thin Film Transistor-Liquid Crystal Display, thin-film transistor LCD device) industry, in order to detect on glass substrate whether there is breakage, usually on cleaning glass substrate machine, use Chipping Sensor (fragment detects meter) to carry out breakage to glass substrate detect, as shown in Figure 1, the principle that fragment detects meter 1 is that the light intensity of reflected light by detecting the light exposed on glass substrate 2 judges that whether glass substrate is damaged, but, this kind of mode is vulnerable to the interference of ambient light and frequently produces false alarm, and its to detect region limited, the position that Chipping Seneor detects is only limitted to the straight line on glass substrate moving direction 3, in addition, this kind of recognition cannot detect having the glass substrate of crackle, and the easiest glass substrate having crackle just producing sliver in process equipment, thus cause the problem that its testing result reliability is not high.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention is to provide a kind of detection method of glass substrate, can improve the reliability of testing result.
(2) technical scheme
For solving the problems of the technologies described above, technical scheme of the present invention provides a kind of detection method of glass substrate, comprising:
At the surface spraying penetrant flaw detection agent of glass substrate;
First cleaning is carried out to the surface of described glass substrate;
Color development treatment is carried out to the surface of described glass substrate, so as according to the position acquisition that described glass substrate develops the color the position of glass substrate defect.
Further, the described surface to described glass substrate is carried out color development treatment and is comprised:
At the surface spraying developer of described glass substrate, described developer develops the color by reacting with described penetrant flaw detection agent.
Further, described penetrant flaw detection agent is fluorescent penetrant inspection agent, and the described surface to described glass substrate is carried out color development treatment and comprised:
Photo-irradiation treatment is carried out to the surface of described glass substrate.
Further, the described surface to described glass substrate is carried out photo-irradiation treatment and is comprised:
The white light being more than or equal to 1000lx is adopted to carry out photo-irradiation treatment to the surface of described glass substrate.
Further, described fluorescent penetrant inspection agent is blue-fluorescence penetrant flaw detection agent.
Further, also comprising before the surface spraying penetrant flaw detection agent of glass substrate:
Second cleaning is carried out to the surface of described glass substrate.
Further, also comprise after the position of glass substrate defect according to the position acquisition that described glass substrate develops the color;
Grade judgement is carried out to described glass substrate defect.
Further, described glass substrate comprises front and the back side with described vis-a-vis, and described front is for the formation of the Rotating fields of display panel, and the described surface spraying penetrant flaw detection agent at glass substrate comprises:
At the back side of glass substrate spraying penetrant flaw detection agent.
(3) beneficial effect
The present invention is by the surface spraying penetrant flaw detection agent at glass substrate, when glass substrate existing defects, such as, when there is crackle, it is painted that penetrant flaw detection agent can carry out infiltration to the rejected region of glass substrate, even if after carrying out the first cleaning to the surface of glass substrate, also only the penetrant flaw detection agent on the surface of glass substrate is washed, penetrant flaw detection agent in rejected region still retains wherein, the surface of glass substrate is being carried out after penetrant flaw detection agent that color development treatment makes to retain develops the color, just can according to the position of the position acquisition glass substrate defect of colour developing, compared to existing technology, the kind and scope that detect defect can not only be increased, and testing process is not subject to ectocine, thus greatly improve the reliability of its testing result.
Accompanying drawing explanation
Fig. 1 is the detection schematic diagram of glass substrate in prior art;
Fig. 2 is the process flow diagram of the detection method of a kind of glass substrate that embodiment of the present invention provides.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.
Fig. 2 is the process flow diagram of the detection method of a kind of glass substrate that embodiment of the present invention provides, and comprising:
S1: at the surface spraying penetrant flaw detection agent of glass substrate;
S2: the first cleaning is carried out to the surface of described glass substrate;
S3: color development treatment is carried out to the surface of described glass substrate, so as according to the position acquisition that described glass substrate develops the color the position of glass substrate defect.
The detection method of the glass substrate that embodiment of the present invention provides, by the surface spraying penetrant flaw detection agent at glass substrate, when glass substrate existing defects, such as, when there is crackle, it is painted that penetrant flaw detection agent can carry out infiltration to the rejected region of glass substrate, even if after carrying out the first cleaning to the surface of glass substrate, also only the penetrant flaw detection agent on the surface of glass substrate is washed, penetrant flaw detection agent in rejected region still retains wherein, the surface of glass substrate is being carried out after penetrant flaw detection agent that color development treatment makes to retain develops the color, just can according to the position of the position acquisition glass substrate defect of colour developing, compared to existing technology, the kind and scope that detect defect can not only be increased, and testing process is not subject to ectocine, thus greatly improve the reliability of its testing result.
Wherein, above-mentioned color development treatment can adopt chemical treatments, such as, can at the surface spraying developer of glass substrate, developer develops the color by reacting with penetrant flaw detection agent.
Preferably, above-mentioned penetrant flaw detection agent can adopt fluorescent penetrant inspection agent, and particularly, the method adopting fluorescent penetrant inspection agent to carry out detecting comprises:
S21: first fluorescent penetrant inspection agent spraying is carried out to the surface of glass substrate, fluorescent penetrant inspection agent is made to be covered with the surface of glass substrate, for liquid crystal display manufacturing, because the front of usual glass substrate is for the formation of the Rotating fields of display panel, in order to avoid this testing process as far as possible, the display panel formed is impacted, fluorescent penetrant inspection agent can be sprayed on the back side with vis-a-vis in glass substrate, wherein, the fluorescent penetrant inspection agent of employing can be blue-fluorescence penetrant flaw detection agent.When glass substrate existing defects, it is painted that the fluorescent penetrant inspection agent of spraying can carry out infiltration to the rejected region on glass substrate, and such as glass substrate has crackle, and fluorescent penetrant inspection agent will infiltrate through in crackle.
S22: the first cleaning is carried out to the surface of glass substrate, to wash the fluorescent penetrant inspection agent of glass baseplate surface, and the fluorescent penetrant inspection agent in rejected region still retains wherein, particularly, the back side of mode to glass substrate that this first cleaning can adopt solvent washing to add hairbrush cleaning is cleaned, to remove the fluorescent penetrant inspection agent on surface.
S23: because the method adopts fluorescent penetrant inspection agent, therefore, its color development treatment process can adopt the mode of the surface of glass substrate being carried out to photo-irradiation treatment, such as, the white light being more than or equal to 1000lx can be adopted to carry out photo-irradiation treatment to the surface of glass substrate, make to infiltrate through the fluorescent penetrant inspection agent wherein of glass substrate defect and obtain luminous energy, carry out autoluminescence, then fluorescent scanning is carried out to glass substrate, the glass substrate of existing defects then can be detected because infiltrating through fluorescent penetrant inspection agent falls vacant sunken, and is locked defective locations by CCD.
The defect of glass substrate then can be clear that after S24:CCD locking, grade judgement can be carried out according to defect situation, such as can carry out defect rank judgement according to the area size of defect, position, and according to the result judged, different process is carried out to this glass substrate, do not affect normal produce can direct dirty or judging section NG (bad), impact is normal produce then NG judgement is carried out to whole glass substrate, enter NG Buffer (bad deposit).
There is dust or other foreign matters in order to avoid glass substrate and detection is impacted, preferably, before the surface spraying penetrant flaw detection agent of glass substrate, also can carry out the second cleaning to the surface of glass substrate, to ensure glass substrate cleanliness factor before detection.
Wherein, above step can specifically set in the controls, and opertaing device completes each step action successively automatically.
The detection method cost of the glass substrate that embodiment of the present invention provides is low, simple to operate, accuracy is high, it not only can detect glass substrate damage, glass substrate outside surface can also be detected scratch, to detecting, glass substrate defect is more directly perceived, specifically can isolate separately a permeation flaw detection equipment, not only can carry out full inspection to glass substrate can also inspect by random samples having the glass substrate of damage reliability problem, compared to existing technology, the various defects of glass baseplate surface not only can be detected, and for the higher glass substrate of surface flatness, the accuracy rate of its testing result is higher, in addition, adopt the mode of fluorescent penetrant inspection agent can not impact the institutional framework of glass substrate and chemical composition, and easy cleaning, by detection method of the present invention, not only be convenient to carry out grade judgement to starting material in advance, subsequent technique is avoided to process, reduce material waste, the Down machine accident produced because of sliver can also be effectively avoided to occur, and the method all can use in each factory of TFT-LCD industry, automatically carry out, operate without the need to personnel, security is higher.
Above embodiment is only for illustration of the present invention; and be not limitation of the present invention; the those of ordinary skill of relevant technical field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all equivalent technical schemes also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (8)
1. a detection method for glass substrate, is characterized in that, comprising:
At the surface spraying penetrant flaw detection agent of glass substrate;
First cleaning is carried out to the surface of described glass substrate;
Color development treatment is carried out to the surface of described glass substrate, so as according to the position acquisition that described glass substrate develops the color the position of glass substrate defect.
2. the detection method of glass substrate according to claim 1, is characterized in that, the described surface to described glass substrate is carried out color development treatment and comprised:
At the surface spraying developer of described glass substrate, described developer develops the color by reacting with described penetrant flaw detection agent.
3. the detection method of glass substrate according to claim 1, is characterized in that, described penetrant flaw detection agent is fluorescent penetrant inspection agent, and the described surface to described glass substrate is carried out color development treatment and comprised:
Photo-irradiation treatment is carried out to the surface of described glass substrate.
4. the detection method of glass substrate according to claim 3, is characterized in that, the described surface to described glass substrate is carried out photo-irradiation treatment and comprised:
The white light being more than or equal to 1000lx is adopted to carry out photo-irradiation treatment to the surface of described glass substrate.
5. the detection method of glass substrate according to claim 3, is characterized in that, described fluorescent penetrant inspection agent is blue-fluorescence penetrant flaw detection agent.
6. the detection method of glass substrate according to claim 1, is characterized in that, is also comprising before the surface spraying penetrant flaw detection agent of glass substrate:
Second cleaning is carried out to the surface of described glass substrate.
7. the detection method of glass substrate according to claim 1, is characterized in that, also comprises after the position of glass substrate defect according to the position acquisition that described glass substrate develops the color;
Grade judgement is carried out to described glass substrate defect.
8. according to the detection method of the arbitrary described glass substrate of claim 1 to 7, it is characterized in that, described glass substrate comprises front and the back side with described vis-a-vis, and described front is for the formation of the Rotating fields of display panel, and the described surface spraying penetrant flaw detection agent at glass substrate comprises:
At the back side of glass substrate spraying penetrant flaw detection agent.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410487052.6A CN104237255A (en) | 2014-09-22 | 2014-09-22 | Detection method of glass substrate |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410487052.6A CN104237255A (en) | 2014-09-22 | 2014-09-22 | Detection method of glass substrate |
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| CN104237255A true CN104237255A (en) | 2014-12-24 |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105973906A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | Shooting type glass crack detection device |
| CN105973905A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | Glass crack detection device |
| CN105973907A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | High-permeability glass crack detection device |
| CN108828071A (en) * | 2018-07-05 | 2018-11-16 | 江苏德意高航空智能装备股份有限公司 | Coloring and the dual-purpose flaw detection imaging paper handkerchief of fluorescence and paper handkerchief imaging application |
| CN109030324A (en) * | 2018-06-08 | 2018-12-18 | 中冶建筑研究总院有限公司 | A kind of detection method of fibre reinforced composites extent of corrosion |
| CN109211929A (en) * | 2018-08-31 | 2019-01-15 | 胜科纳米（苏州）有限公司 | The detection method of electronic apparatus encapsulation defect |
| CN109211930A (en) * | 2018-08-31 | 2019-01-15 | 胜科纳米（苏州）有限公司 | The defect inspection method of electronic display encapsulating material |
| WO2020103038A1 (en) * | 2018-11-21 | 2020-05-28 | 深圳市柔宇科技有限公司 | Method for detecting defect of thin film transistor array substrate |
| CN111812110A (en) * | 2020-08-06 | 2020-10-23 | 东方蓝天钛金科技有限公司 | Fluorescent penetrant inspection visual identification system |
| CN116626058A (en) * | 2023-07-25 | 2023-08-22 | 天津正道机械制造有限公司 | Metal workpiece surface flatness detection device |
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| US3554020A (en) * | 1968-12-31 | 1971-01-12 | Magnaflux Corp | Method for the removal of excess penetrant and simultaneous development of color indications |
| US3762216A (en) * | 1971-02-23 | 1973-10-02 | E Mendoza | Automated liquid penetrant inspection system |
| CN1096366A (en) * | 1993-06-09 | 1994-12-14 | 吴波云 | Permeating crack-detection coated film strippable developer and using method thereof |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105973906A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | Shooting type glass crack detection device |
| CN105973905A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | Glass crack detection device |
| CN105973907A (en) * | 2016-06-17 | 2016-09-28 | 苏州市灵通玻璃制品有限公司 | High-permeability glass crack detection device |
| CN109030324A (en) * | 2018-06-08 | 2018-12-18 | 中冶建筑研究总院有限公司 | A kind of detection method of fibre reinforced composites extent of corrosion |
| CN108828071A (en) * | 2018-07-05 | 2018-11-16 | 江苏德意高航空智能装备股份有限公司 | Coloring and the dual-purpose flaw detection imaging paper handkerchief of fluorescence and paper handkerchief imaging application |
| CN109211929A (en) * | 2018-08-31 | 2019-01-15 | 胜科纳米（苏州）有限公司 | The detection method of electronic apparatus encapsulation defect |
| CN109211930A (en) * | 2018-08-31 | 2019-01-15 | 胜科纳米（苏州）有限公司 | The defect inspection method of electronic display encapsulating material |
| WO2020103038A1 (en) * | 2018-11-21 | 2020-05-28 | 深圳市柔宇科技有限公司 | Method for detecting defect of thin film transistor array substrate |
| CN112912996A (en) * | 2018-11-21 | 2021-06-04 | 深圳市柔宇科技股份有限公司 | Defect detection method of thin film transistor array substrate |
| CN111812110A (en) * | 2020-08-06 | 2020-10-23 | 东方蓝天钛金科技有限公司 | Fluorescent penetrant inspection visual identification system |
| CN116626058A (en) * | 2023-07-25 | 2023-08-22 | 天津正道机械制造有限公司 | Metal workpiece surface flatness detection device |
| CN116626058B (en) * | 2023-07-25 | 2023-10-13 | 天津正道机械制造有限公司 | Metal workpiece surface flatness detection device |
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Application publication date: 20141224 |