[go: up one dir, main page]

CN104122446A - Circuit board test system - Google Patents

Circuit board test system Download PDF

Info

Publication number
CN104122446A
CN104122446A CN201310149301.6A CN201310149301A CN104122446A CN 104122446 A CN104122446 A CN 104122446A CN 201310149301 A CN201310149301 A CN 201310149301A CN 104122446 A CN104122446 A CN 104122446A
Authority
CN
China
Prior art keywords
circuit board
testing system
circuit
platform
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201310149301.6A
Other languages
Chinese (zh)
Other versions
CN104122446B (en
Inventor
尤宗睦
郭恒君
吕景豫
黄顺治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Giga Byte Technology Co Ltd
Original Assignee
Giga Byte Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Giga Byte Technology Co Ltd filed Critical Giga Byte Technology Co Ltd
Priority to CN201310149301.6A priority Critical patent/CN104122446B/en
Publication of CN104122446A publication Critical patent/CN104122446A/en
Application granted granted Critical
Publication of CN104122446B publication Critical patent/CN104122446B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The invention relates to a circuit board test system which is used for testing the yield of a circuit board. The heating box is provided with a box body and a heater, and the heater is used for heating the circuit board in the box body. The detection host comprises a processing unit, a display unit and a temperature control device, wherein the processing unit stores a standard impedance value, the temperature control device is used for controlling the temperature of hot air provided by the heater, the circuit detection module detects an impedance change value when the impedance of at least one electric through hole of the circuit board changes along with the temperature, and the processing unit compares the impedance change value with the standard impedance value to judge whether the electric through hole is abnormal or not and presents a comparison result on the display unit. Therefore, the invention not only can simplify the test procedure of the circuit board, but also can improve the accuracy of the test result.

Description

Circuit board testing system
[technical field]
The present invention relates to a kind of test macro, particularly a kind of whether abnormal circuit board testing system of electrical perforation that detects.
[background technology]
Printed circuit board (PCB) (PRINTING CIRCUIT BOARD, PCB) be common at present electronic components, its characteristic is not by external entity electric wire, the electronic package that is inserted in circuit board can be electrically connected at other electronic packages by the circuit (layout) designing on circuit board, except the setting that reduces entity circuit is to save space, printed circuit board (PCB) and can be before making according to electronic installation in the kind of each electronic package and the function of electronic installation institute wish enforcement, carry out Design of Logic Circuit and circuit layout, make printed circuit board (PCB) according to design result again, therefore the surface area of printed circuit board (PCB) can be tapered to minimum under the functional requirement of meeting customer need, to meet the increasingly microminiaturized trend of current electronic product volume.
In addition, can make a large amount of production of printed circuit board (PCB) by printing process, thereby reduce cost of manufacture, more meet the economic benefit of electronic industry.Owing to possessing above-mentioned advantage, printed circuit board (PCB) is in current electronic correlation industry, become indispensable necessary electronic components, its application also extends to the mainboard of computer installation and running gear and the various computer fittings such as expansion board, adapter, based on These characteristics, and then make the industry demand amount of printed circuit board (PCB) very big.
But, the electrical perforation of part printed circuit board (PCB) occurs often cannot normally or have a phenomenon of loose contact, and then cause overall printing board failure or part assembly thereby situation that cannot normal operation, its possible reason comprises metal layer thickness that electrical perforation plates not or metal level breaks, comes off, or be other factors, no matter which kind of reason, all may make the circuit board cannot normal operation, cause consumer's puzzlement, also indirectly make the after sale service of manufacturer and maintenance cost hurriedly increase.
For the problem of effectively avoiding circuit board to break down, general printed circuit board (PCB) in process of production, manufacture commercial city and must carry out a series of testing procedure for the above-mentioned defect that may exist, to guarantee that product does not have flaw, so that shipment in the situation that ensureing product quality, safeguard the prestige of consumers' rights and interests and company, also can effectively reduce product and send the chance of repairing, significantly reduce after sale service and the maintenance cost of manufacturer simultaneously.In addition, even if circuit board because of various reasons cannot normal operation after peddling and send while repairing, testing staff also must carry out a series of trace routine, to look for out of order reason so as to keep in repair, the follow-up processing such as replacing, fault eliminating.
But described in brought forward, the circuit board testing mode that industry adopts at present all must be carried out many testing procedures, cause to differentiate the reason that circuit board cannot normal operation, wherein particularly complicated with the method for testing of electrical perforation again.Carry out for the general mode detecting manually that all adopts of method of testing of electrical perforation at present, first its step lies in circuit board on static table, whether testing staff is normal with two electrical contacts that electrically perforation is electrically connected on measurement circuit plate one by one with avometer, to judge whether each electrical perforation electrically conducts.Because the step of above-mentioned test is various, cause this method of testing not only spacious day time-consuming, its accuracy is also obviously not enough, cause testing staff directly to judge according to testing result, keeping in repair, the subsequent processing steps such as replacing, fault eliminating, just can complete and must carry out extra detecting step, this measure causes maintenance cost high again.
Meanwhile, also feedback testing result effectively and reason, to production division, to improve processing procedure, increase product yield, therefore help still very limited.
Therefore, how effectively whether the electrical perforation on testing circuit plate normally electrically conducts, and improves the accuracy of testing result, and real is the problem that the very urgent wish of manufacturer solves.
[summary of the invention]
In view of above problem, the invention reside in the change in impedance value of a kind of electrical perforation by circuit for detecting plate under different temperatures is provided, whether there is the circuit board testing system of defect to detect electrical perforation, thereby solve the mode with the electrical perforation of the manual testing circuit plate of manual type commonly used, the problem such as not only spacious day time-consuming and accuracy is not enough.
Therefore, the invention provides a kind of circuit board testing system, for testing the yield of a circuit board, wherein circuit board has multiple electrical perforations.Circuit board testing system includes a platform, an electric circuit inspection module, a warming box and a detecting host, wherein electric circuit inspection module is arranged on platform, electric circuit inspection module has multiple probes, and is arranged in electric circuit inspection module when circuit board, and electrically perforation correspondence is contacted with probe.Warming box has a casing and a well heater, casing is arranged on platform, and covers electric circuit inspection module, and well heater is connected in casing, in order to supply a thermal current, this thermal current is the initial detected temperatures of heater circuit plate to one and a final detected temperatures in casing.Detecting host comprises a processing unit, a display unit and an attemperating unit, processing unit is electrically connected at electric circuit inspection module and display unit, and store a normal impedance value of electrical perforation, attemperating unit is electrically connected at well heater, in order to control the temperature of thermal current, wherein, electric circuit inspection module is detected the impedance variation value of electrical perforation in initial detected temperatures to final detected temperatures, processing unit comparison impedance variation value and normal impedance value, whether abnormal to judge electrical perforation, and present a comparison result on display unit.
In a preferred embodiment, the well heater of aforementioned circuit board test system has an air outlet, and casing has an air intake opening and a gas outlet, and air outlet is communicated in air intake opening, and thermal current enters in casing by air intake opening, and is expelled to outside casing by gas outlet.
In a preferred embodiment, aforesaid circuit board testing system also comprises at least one fan, be arranged on casing, and corresponding to air intake opening or gas outlet, fan drives thermal current to flow in casing.
In a preferred embodiment, be provided with a pair of fixture on the platform of aforesaid circuit board testing system, be arranged at intervals at platform surface, and be positioned on platform when circuit board, two fixture clippings are in the relative dual side-edge of circuit board.
In a preferred embodiment, aforesaid circuit board testing system also includes a fixation kit, there is a power source and a supporting member, power source is connected with supporting member, power source is driven and drives supporting member with respect to platform shift reciprocately, and supporting member compresses circuit board under test and contacts with electric circuit inspection module.
In a preferred embodiment, the supporting member of aforementioned circuit board test system also has multiple reference columns, and circuit board has multiple pilot holes, and when circuit board is arranged at electric circuit inspection module, reference column wears respectively pilot hole.
In a preferred embodiment, the power source of aforementioned circuit board test system is air pump, motor or motor.
Effect of the present invention is, covering of the thermal current producing by the well heater of circuit board testing system of the present invention and warming box, can effectively promote the temperature of circuit board, and multiple probes by electric circuit inspection module respectively the electrical perforation of circuit for detecting plate be heated to the impedance variation value of final detected temperatures in initial detected temperatures, in order to the normal impedance value comparison built-in with the processing unit of detecting host, so that judge whether each electrical perforation can electrically conduct normally, so whether testing staff can by there is flaw with the each electrical perforation of succinct mode decision circuitry plate intuitively, effectively reduce the step of test, and then the cost of reduction test, also can promote the accuracy of test simultaneously.
In addition, be heated to the impedance variation of final detected temperatures in initial detected temperatures according to the each electrical perforation of circuit for detecting plate by the processing unit of detecting host of the present invention, allow testing staff no matter in production phase or after-sales service stage, all can be directly according to judged result keep in repair, the subsequent processing steps such as replacing, fault eliminating, need not carry out extra detecting step, so can effectively reduce the cost of test and maintenance.
What is more, by the judgment mechanism of aforementioned processing unit, manufacturer's feedback testing result effectively and reason are to production division, so that production division improves processing procedure, to increase the product yield of circuit board, contribute to quality and the goodwill of improving product, relatively reduce the following chance that may break down, significantly reduce potential after sale service and maintenance cost.
[brief description of the drawings]
Fig. 1 is the schematic perspective view of circuit board testing system the 1st figure of the first embodiment of the invention circuit board testing system that is first embodiment of the invention.
Fig. 2 is the schematic perspective view of the first enforcement aspect of the platform of first embodiment of the invention.
Fig. 3 is the schematic perspective view of the second enforcement aspect of the platform of first embodiment of the invention.
Fig. 4 is the assembly calcspar of the circuit board testing system of first embodiment of the invention.
Fig. 5 is the schematic perspective view of the circuit board testing system of first embodiment of the invention.
Fig. 6 is the schematic side view of the circuit board testing system of first embodiment of the invention.
Fig. 7 is the schematic perspective view of the circuit board testing system of second embodiment of the invention.
Fig. 8 is the schematic side view of the first enforcement aspect of the circuit board testing system of second embodiment of the invention.
Fig. 9 is the schematic side view of the second enforcement aspect of the circuit board testing system of second embodiment of the invention.
Figure 10 is the schematic perspective view of the circuit board testing system of third embodiment of the invention.
Figure 11 is the schematic side view of the circuit board testing system of third embodiment of the invention.
Figure 12 is the use view of the circuit board testing system of third embodiment of the invention.
Figure 13 is the schematic perspective view of the circuit board testing system of fourth embodiment of the invention.
Primary clustering symbol description:
10 circuit board testing system 100 platforms
1001 fixture 200 warming box
201 casing 2011 air intake openings
2012 gas outlet 2013 fans
202 well heater 2021 air outlets
300 electric circuit inspection module 301 probes
400 detecting host 401 processing units
402 display unit 403 attemperating units
The electrical perforation of 50 circuit board 501
502 pilot hole 900 fixation kits
901 power source 902 supporting members
903 reference column W1 thermal currents
[embodiment]
About feature of the present invention, implementation and effect, hereby coordinate accompanying drawing to be described in detail as follows as most preferred embodiment.
Circuit board testing system provided by the present invention includes three kinds of different embodiment, below describes respectively.
As shown in Figures 1 to 4, first embodiment of the invention provides a kind of circuit board testing system 10, for testing the yield of a circuit board 50, circuit board 50 described herein includes but not limited to the dissimilar circuit boards such as mainboard, display adapter, network card, adapter, circuit board 50 has at least one or more electrical perforation 501, its quantity and position according to the kind of circuit board 50 and line configuring demand and there is difference, are not limited with each kenel provided by the present invention.
Described in brought forward, the circuit board testing system 10 of the present embodiment includes a platform 100, a warming box 200, an electric circuit inspection module 300 and a detecting host 400.Platform 100 is in order to bearer circuit plate 50, electric circuit inspection module 300 can be to be arranged on platform 100 or with detecting host 400 to be integrated into an entirety, electric circuit inspection module 300 has multiple probes 301, in the present embodiment, the quantity of probe 301 and position are quantity and the positions of the electrical perforation 501 of corresponding circuits plate 50 respectively, therefore, when circuit board 50 is arranged in electric circuit inspection module 300, each electrical perforation 501 is that correspondence is contacted with probe 301, to detect the resistance value of each electrical perforation 501.
It should be noted that, the platform 100 of the present embodiment includes two kinds of different enforcement aspects, wherein, as shown in Figure 2, the first platform 100 of implementing aspect is flat, in the time that circuit board 50 is positioned over platform 100, be to contact by the probe 301 of electric circuit inspection module 300 and the each electrical perforation 501 of circuit board 50 as previously mentioned, with fixing circuit board 50; In addition, as shown in Figure 3, the second platform 100 of implementing aspect has a pair of fixture 1001, is arranged at platform 100 surfaces, in order to the relative dual side-edge of fixing circuit board 50, to avoid circuit board 50 in platform 100 top offsets or landing from platform 100.Therefore, in the time that circuit board 50 is positioned over platform 100, except the each electrical perforation 501 by circuit board 50 contacts with the probe 301 of electric circuit inspection module 300, more pass through the clamping of fixture 1001, to reach the effect of fixing circuit board 50, the setting position of fixture 1001 and fixed form be not with being limited that Fig. 3 was provided, and this area person can adopt the platform 100 of arbitrary enforcement aspect and select different fixed forms and the setting position of fixture 1001 according to user demand, not as limit.
Described in brought forward, the warming box 200 of the present embodiment has a casing 201 and a well heater 202, and casing 201 is arranged on platform 100, and casing 201 can cover whole platform 100, or at least covers electric circuit inspection module 300.Well heater 202 is connected in casing 201, and it can be but be not limited to calorifier, and as shown in Figure 6, well heater 202 has an air outlet 2021, and casing 201 has an air intake opening 2011 and a gas outlet 2012, and air outlet 2021 is communicated in air intake opening 2011.Therefore, well heater 202 adds a thermogenetic thermal current W1 and can enter in casing 201 by air intake opening 2011, and by thermal convection mode heater circuit plate 50, and then be expelled to outside casing 201 by gas outlet 2012, to reach good convection effects.What deserves to be explained is, the well heater 202 of the present embodiment, by above-mentioned thermal convection mode, is heated to an initial detected temperatures and a final detected temperatures by circuit board 50.
It should be noted that, because being to guide thermal current, the effect of aforementioned air intake opening 2011 contacts with the circuit board 50 being positioned on platform 100, and then the efficiency of lifting heater circuit plate 50, therefore under the prerequisite of avoiding circuit board 50 to drop, size, quantity and the kenel of air intake opening 2011 be not with being limited shown in Fig. 6, this area person can change voluntarily, does not repeat at this.
Described in brought forward, detecting host 400 comprises a processing unit 401, one display unit 402 and an attemperating unit 403, processing unit 401 is electrically connected at electric circuit inspection module 300 and display unit, and store a normal impedance value and the impedance variation value of the each electrical perforation 501 of circuit board 50 in initial detecting temperature to final detected temperatures, processing unit 401 is to note down each electrical perforation 501 that electric circuit inspection module 300 the returns impedance variation value in initial detected temperatures to final detected temperatures, and comparison impedance variation value and normal impedance value, whether abnormal to judge electrical perforation 501.Display unit 402 is by the control of processing unit 401, in order to show the relevant information such as impedance variation value and comparison result of the temperature of well heater 202, the temperature of circuit board 50, each electrical perforation 501.Attemperating unit 403 is electrically connected at well heater 202, produces the temperature of thermal current in order to control heater 202.
Therefore, in the time that testing staff wants the trace routine with aforesaid circuit board testing system 10 executive circuit plates 50, first testing staff arranges circuit board 50 on the platform 100 of circuit board testing system 10, the step of its setting as in the previous paragraph, the electrical perforation 501 of circuit board 50 is contacted with the probe 301 of electric circuit inspection module 300, and its detailed content does not repeat at this.
Secondly, the optionally electrical perforation 501 of circuit for detecting plate 50 resistance value of (taking 25 DEG C as example) under room temperature in advance of electric circuit inspection module 300, so that as the contrast of follow-up measurement, then, temperature control module 403 control heaters 202 of detecting host 400 produce thermal current circuit board 50 are heated, and progressively heighten the temperature of thermal current, and based on cross-ventilated principle, thermal current W1 can rise gradually, and contact with circuit board 50 by air intake opening 2011, with heater circuit plate 50, make the temperature of circuit board 50 from the final detected temperatures of initial detecting temperature rise to.Then, thermal current W1 flows and is discharged outside to environment towards air outlet 2021 again.
Wherein, initial detecting temperature is the corresponding adjustment of demand and the change according to the different of circuit board 50 materials and test from final detected temperatures, illustrate, in an enforcement aspect, the temperature of thermal current is by the adjusting of the supply of well heater 202 and attemperating unit 403, heighten to 260 DEG C by 120 DEG C, therefore, initial detecting temperature is the temperature of the temperature of thermal current circuit board 50 while being 120 DEG C, the temperature of circuit board 50 when the temperature that final detected temperatures is thermal current is 260 DEG C, but because the heat of part thermal current can be dispersed in conductive process, cannot be entirely circuit board 50 absorbs, therefore be no matter that initial detecting temperature or final detected temperatures all can be a little less than the temperature values of thermal current at that time.In addition, in order to allow circuit board 50 detect, in temperature-rise period, can stop a schedule time at each specified temp under the state being heated evenly, and then progressively heighten temperature, for example carry out the adjusting of temperature in the mode of heightening 10 DEG C or 20 DEG C for every 10 seconds, 20 seconds or 60 seconds.
Simultaneously, in above-mentioned heating process, the resistance value of the electrical perforation 501 of the probe 301 difference circuit for detecting plates 50 of electric circuit inspection module 300 under different temperatures, and and then obtain the impedance variation value of electrical perforation 501 along with temperature variation, and transmit the processing unit 401 of above-mentioned impedance variation value to detecting host 400.
Below further with actual detecting data as an example, please refer to table 1 and table 2:
The resistance value of normal electrically perforation under different temperatures of table 1 circuit board
The resistance value of the abnormal electrical perforation of table 2 circuit board under different temperatures
Table 1 and table 2 are to carry out the measured resistance value of heating schedule in every mode of heightening 20 DEG C for 10 seconds.As shown in Table 1, carry out the detecting of impedance for the electrical perforation FBA_D25 of circuit board N670OC-2GD, in the time of normal temperature, electrically the resistance value of perforation FBA_D25 is 15 Ω.When the temperature increase to 120 DEG C of well heater 103 starts to measure, now about 96 DEG C of the temperature of circuit board 50, that is to say that initial detecting temperature is 96 DEG C, through measuring, electrically the resistance value of perforation FBA_D25 is 15 Ω, and when temperature is constantly promoted to 260 DEG C, that is when 238 DEG C of final detected temperatures, through measuring, electrically the resistance value of perforation FBA_D25 is also maintained approximately 15 Ω, namely the impedance factor of normal electrically perforation can significantly not change with temperature increase, and normal electrically perforation is maintained at the state of electrically conducting normally.
On the contrary, in table 2, carry out the detecting of impedance for the electrical perforation FBB_D09 of circuit board N670OC-2GD, in the time of normal temperature, electrically the resistance value of perforation FBB_D09 is 15 Ω, when the temperature increase to 120 DEG C of well heater 202 starts to measure, about 98 DEG C of the temperature of circuit board 50 at that time, that is to say that initial detecting temperature is 98 DEG C, through measuring, electrically the resistance value of perforation FBB_D09 increases to 89 Ω, so when temperature constantly promotes, electrically also corresponding lifting of the resistance value of perforation FBB_D09, until work as the temperature increase to 260 DEG C of well heater 202, that is when 258 DEG C of final detected temperatures, through measuring, electrically the resistance value of perforation FBB_D09 increases to 434 Ω, level off to the state opening circuit.
After resistance value at the electrical perforation 501 of obtaining circuit board 50 by above-mentioned steps under different temperatures, the impedance variation value that the processing unit 401 corresponding record electric circuit inspection modules 300 of detecting host 400 detect, in addition, processing unit 401 is also compared impedance variation value and normal impedance value, to judge whether impedance variation value is greater than standards change value, if wherein impedance variation value is greater than standards change value, represent that electrical perforation 501 is abnormal, that is to say, if electrically the resistance value of perforation 501 significantly increases along with temperature rise significantly, processing unit 401 is corresponding judges that electrical perforation 501 exists defect, this defect is because the metal level in electrical perforation 501 breaks, cause the volume of metal level to expand along with temperature rise, and then slight crack is strengthened, deepen, nature will make resistance value suddenly increase thereupon, on the contrary, if impedance variation value is not greater than or levels off to standards change value or significantly not along with temperature raises and significantly increase, processing unit 401 is corresponding judges that electrical perforation 21 is normal.
Therefore, by the circuit board testing system 10 of the present embodiment, testing staff only must place circuit board 50 on platform 100, and circuit board testing system 10 can be according to the control of the attemperating unit of detecting host 400 403, corresponding heater circuit plate 50, the line correlation impedance of going forward side by side measures and record step.In addition, the circuit board testing system 10 of the present embodiment also can be by detecting host 400 processing unit 401 automatic comparison impedance variation values not and standards change value, correspondence judges whether electrical perforation 501 exists defect, and show comparison result by display unit 402, therefore need not be dependent on testing staff manually tests and relies on human brain and judge and calculate, the comparison result that only must present according to display unit 402 does simply and judgement intuitively, therefore significantly promotes efficiency and the accuracy of test.
In addition, the impedance variation value of the electrical perforation 501 that processing unit 401 measures by electric circuit inspection module 300 under different temperatures, compare with standards change value, in the time judging that electrical perforation 501 may exist defect, processing unit 401 further judges the abnormal reason of electrical perforation 501 according to electrical perforation 501 in the resistance value of different temperatures section, illustrate, because the expansion coefficient of the metal level that is plated on electrical perforation 501 is generally definite value, if therefore find, impedance variation value and standards change value are to some extent when difference, representing to be plated on the metal level of electrical perforation 501 may be due to uneven thickness, or be to have to come off, the phenomenon of fracture, cause the impedance variation value under different temperatures to coincide with standards change value, so processing unit 401 can automatic sorting and decision circuitry plate 50 cannot normal operation reason.
Therefore, the circuit board detection system 10 of the present embodiment, not only allow testing staff rapidly testing circuit board 50 whether because of electrical perforation 501 exist defect cause quality bad outside, also can be in the time judging that electrical perforation 501 exists defect, by comparing of impedance variation value and standards change value, automatic alignment goes out to occur the reason of defect, in order to taking follow-up processing.
As shown in Figure 7 to 9, provided circuit board testing system is provided in the present invention second and the first embodiment is roughly similar, its difference is, the circuit board testing system 10 that second embodiment of the invention provides also comprises at least one fan 2013, be arranged on casing 201, and be optionally arranged at a side of corresponding air intake opening 2011 or gas outlet 2012, the gas outlet 2012 that is covered in casing 201 with fan 2013 correspondences in the present embodiment as an example, but not as limit.Fan 2013 is mainly to drive thermal current in the flow rate of the interior Uniform Flow of casing 201 and control thermal current, and then promotes the convection effects of thermal current, to reach the effect of homogeneous heating circuit board 50.
It should be noted that, the quantity of the present embodiment fan 2013 and setting position are as previously mentioned corresponding to air intake opening 2011 or gas outlet 2012, therefore this area person without departing from the spirit of the present invention, can select to change quantity, setting position and the specification of fan 2013, to reach the effect that promotes thermal convection, following inventor only describes with two kinds of different enforcement aspects, but not as limit.
As shown in Figure 8, implement in the circuit board testing system 10 of aspect at the present embodiment first, fan 2013 is to be arranged at respectively gas outlet 2012, and be electrically connected at detecting host 400, therefore in the time that well heater 202 produces thermal current W1, by the rotation of detecting host 400 drive fan 2013, can promote thermal current W1 to rise, to reach the effect of Fast Heating circuit board 50; In addition, as shown in Figure 9, implement in the circuit board testing system 10 of aspect at the present embodiment second, fan 2013 is the relative both sides that are arranged at respectively casing 201 contiguous air intake openings 2011, therefore in the time that well heater 202 produces thermal current W1, by brushing of fan 2013, can promote thermal current W1 concentrate and circulate in around circuit board 50 to circuit board 50, can reach equally the effect that accelerating circuit plate 50 heats up.
Therefore, by the setting of different circuit board testing system 10 fans 2013 of implementing aspect of the present embodiment, can effectively promote the effect of well heater 202 heater circuit plates 50, so that shorten the time of circuit board 50 by the extremely final detected temperatures of initial detecting temperature increase, further improve the detection efficiency of circuit board testing system 10.
As shown in Figure 10 to Figure 12, circuit board testing system 10 and the first embodiment that third embodiment of the invention provides are similar, precisely because difference is, the circuit board testing system 10 of the present embodiment also includes a fixation kit 900, there is a power source 901 and a supporting member 902, power source 901 includes but not limited to air pump, motor or motor etc. are with converting electrical energy, heat energy is the Power Component of kinetic energy, power source 901 is connected with supporting member 902, therefore in the time that power source 901 is activated, power source 901 is driven and drives supporting member 902 with respect to platform 100 shift reciprocatelies, simultaneously, supporting member 902 also has multiple reference columns 903, because circuit board 50 has multiple pilot holes 502, and the reference column 903 of supporting member 902 is corresponding to aforesaid pilot hole 502.
Brought forward, therefore in the time that circuit board 50 is arranged at electric circuit inspection module 300, the reference column 903 of supporting member 902 is to be pressed against on circuit board 50, circuit board 50 is contacted with electric circuit inspection module 300, and reference column 903 wears respectively pilot hole 502, on platform 100, and make the electrical perforation 501 of circuit board 50 and probe 301 close contacts of electric circuit inspection module 300 with fixing circuit board 50, to avoid probe 301 cannot normally carry out aforementioned trace routine with electrical perforation 501 loose contacts.
As shown in figure 13, the circuit board testing system 10 that fourth embodiment of the invention provides is the technical characterictics in conjunction with first three embodiment, that is the circuit board testing system 10 of fourth embodiment of the invention is except platform 100, warming box 200, electric circuit inspection module 300 and the detecting host 400 of the first embodiment, is also equipped with the fan 2013 of the second embodiment and the fixation kit 900 of the 3rd embodiment.Therefore, the circuit board testing system 10 of the present embodiment is in the time carrying out aforementioned detection, by the pushing and pressing of fixation kit 900, can make the electrical perforation of circuit board and probe 301 close contacts of electric circuit inspection module 300, in order to detecting, force to drive, guide brushing or dispatch direction and flow velocity of thermal current by fan 2013 simultaneously, contribute to promote heating and the even temperature effect of circuit board 50, contribute to shorten the detection time of circuit board, the effect that it is detailed and content description please refer to first three embodiment, do not repeat at this.
The circuit board testing system of the invention described above, covers circuit board by the casing of warming box, and well heater provides thermal current in casing, can effectively promote the temperature of circuit board; And, multiple probes by the electric circuit inspection module respectively electrical perforation of circuit for detecting plate are heated to the change in impedance value value of final detected temperatures in initial detected temperatures, compare with built-in normal impedance value by the processing unit of detecting host again, and judge that whether the state that electrically conducts of each electrical perforation is normal; And then present comparison result by display unit correspondence, so, testing staff does not carry out complicated testing process in order to manual mode, detecting host can be compared and determining program automatically, allow testing staff only need the comparison result presenting according to display unit, just can be simply and intuitively mode learn whether the each electrical perforation of circuit board exists flaw, effectively reduce step and the time of test, and then the cost of reduction test, the while also can promote the accuracy of test result.
Simultaneously, no matter in production phase or after-sales service stage, the subsequent processing steps such as testing staff all can keep in repair according to judged result, replacing, fault eliminating, need not carry out extra detecting step in addition, so can effectively reduce the cost of test and maintenance.What is more, by record and the judgment mechanism of aforementioned processing unit, manufacturer's feedback testing result effectively and reason are to production division, so that production division improves processing procedure, to increase the product yield of circuit board, contribute to quality and the goodwill of improving product, relatively reduce the following chance that may break down, significantly reduce potential after sale service and maintenance cost.
In addition, in different embodiments of the invention, by fan and or the collocation of fixation kit, circuit board testing system of the present invention can reach and promotes detection efficiency and avoid affecting because of loose contact the different characteristics such as testing result, this area has common skill person can be according to actual demand, select collocation to use, do not repeat at this.
Although it is described above that embodiments of the invention provide, so not in order to limit the present invention, anyly have the knack of person skilled, without departing from the spirit and scope of the present invention, such as work as and can do a little change according to the shape described in the claims in the present invention, structure, feature and quantity, therefore claim scope of the present invention must be as the criterion depending on this instructions appending claims person of defining.

Claims (7)

1.一种电路板测试系统,用于测试一电路板的良率,所述电路板具有多个电性贯孔,其特征在于,所述电路板测试系统包括有:1. A circuit board testing system, for testing the yield rate of a circuit board, the circuit board has a plurality of electrical through holes, it is characterized in that, the circuit board testing system includes: 一平台;a platform; 一电路检测模块,设置于所述平台上,所述电路检测模块具有多个探针,当所述电路板设置于所述电路检测模块上,所述电性贯孔对应接触于所述探针;A circuit detection module, set on the platform, the circuit detection module has a plurality of probes, when the circuit board is set on the circuit detection module, the electrical through holes correspond to the probes ; 一升温箱,具有一箱体以及一加热器,所述箱体设置于所述平台上,并且罩覆所述电路检测模块,所述加热器连接于所述箱体,用以供应一热气流,所述热气流于所述箱体内加热所述电路板至一起始检测温度以及一最终检测温度;以及A heating box has a box body and a heater, the box body is arranged on the platform and covers the circuit detection module, the heater is connected to the box body for supplying a hot air flow , the hot gas flow heats the circuit board in the box to an initial detection temperature and a final detection temperature; and 一侦测主机,包含一处理单元、一显示单元以及一温控装置,所述处理单元电性连接于所述电路检测模块与所述显示单元,并且储存有所述电性贯孔的一标准阻抗值,所述温控装置电性连接于所述加热器,用以控制所述热气流的温度;A detection host includes a processing unit, a display unit and a temperature control device, the processing unit is electrically connected to the circuit detection module and the display unit, and stores a standard of the electrical through hole Impedance value, the temperature control device is electrically connected to the heater to control the temperature of the hot air flow; 其中,所述电路检测模块侦测所述电性贯孔于所述起始检测温度至所述最终检测温度的一阻抗变化值,所述处理单元比对所述阻抗变化值与所述标准阻抗值,以判断所述电性贯孔是否异常,并且呈现一比对结果于所述显示单元上。Wherein, the circuit detection module detects an impedance change value of the electrical through hole from the initial detection temperature to the final detection temperature, and the processing unit compares the impedance change value with the standard impedance value to determine whether the electrical through hole is abnormal, and present a comparison result on the display unit. 2.如权利要求1所述的电路板测试系统,其特征在于,其中所述加热器具有一出风口,所述箱体具有一进气口及一出气口,所述出风口连通于所述进气口,所述热气流通过所述进气口进入所述箱体内,并通过所述出气口排出至所述箱体外。2. The circuit board testing system according to claim 1, wherein the heater has an air outlet, the box has an air inlet and an air outlet, and the air outlet is connected to the air inlet. The hot air enters the box through the air inlet, and is discharged out of the box through the air outlet. 3.如权利要求2所述的电路板测试系统,其特征在于,所述电路板测试系统还包括至少一风扇,所述风扇设置于所述箱体上,并且对应于所述进气口或所述出气口,所述风扇带动所述热气流于所述箱体内流动。3. The circuit board testing system according to claim 2, wherein the circuit board testing system also includes at least one fan, and the fan is arranged on the casing and corresponds to the air inlet or The air outlet and the fan drive the hot air to flow in the box. 4.如权利要求1所述的电路板测试系统,其特征在于,所述平台上设置有一对夹具,间隔设置于所述平台表面,并且当所述电路板放置于所述平台上,所述对夹具夹制于所述电路板的相对二侧边。4. The circuit board testing system according to claim 1, wherein a pair of clamps are arranged on the platform, and are arranged at intervals on the surface of the platform, and when the circuit board is placed on the platform, the The pair of fixtures are clamped on two opposite sides of the circuit board. 5.如权利要求1所述的电路板测试系统,其特征在于,所述电路板测试系统还包括有一固定组件,具有一动力源及一抵顶件,所述动力源与所述抵顶件相连接,所述动力源被驱动而带动所述抵顶件相对于所述平台往复位移,所述抵顶件压抵所述电路板与所述电路检测模块相接触。5. The circuit board testing system according to claim 1, characterized in that, the circuit board testing system also includes a fixed assembly having a power source and an abutting member, the power source and the abutting member connected, the power source is driven to drive the abutting member to move reciprocally relative to the platform, and the abutting member presses against the circuit board to be in contact with the circuit detection module. 6.如权利要求5所述的电路板测试系统,其特征在于,其中所述抵顶件还具有多个定位柱,所述电路板具有多个定位孔,当所述电路板设置于所述电路检测模块,所述定位柱分别穿设所述定位孔。6. The circuit board testing system according to claim 5, wherein the abutting member also has a plurality of positioning columns, and the circuit board has a plurality of positioning holes, when the circuit board is arranged on the In the circuit detection module, the positioning posts respectively pass through the positioning holes. 7.如权利要求5所述的电路板测试系统,其特征在于,其中所述动力源为气泵、马达或电动机。7. The circuit board testing system according to claim 5, wherein the power source is an air pump, a motor or an electric motor.
CN201310149301.6A 2013-04-26 2013-04-26 Circuit board test system Active CN104122446B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310149301.6A CN104122446B (en) 2013-04-26 2013-04-26 Circuit board test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310149301.6A CN104122446B (en) 2013-04-26 2013-04-26 Circuit board test system

Publications (2)

Publication Number Publication Date
CN104122446A true CN104122446A (en) 2014-10-29
CN104122446B CN104122446B (en) 2017-04-12

Family

ID=51767936

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310149301.6A Active CN104122446B (en) 2013-04-26 2013-04-26 Circuit board test system

Country Status (1)

Country Link
CN (1) CN104122446B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106707138A (en) * 2016-12-29 2017-05-24 广东长虹电子有限公司 Test fixtures for circuit board testing
CN107132470A (en) * 2017-05-31 2017-09-05 格科微电子(上海)有限公司 Suitable for the tool of wafer-level test
CN109887454A (en) * 2019-04-09 2019-06-14 苏州精濑光电有限公司 A kind of impedance detection equipment

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997007407A1 (en) * 1995-08-17 1997-02-27 Jae Woo Nam Probe card having vertical type needles and the method thereof
JP2004309441A (en) * 2003-02-18 2004-11-04 Yamaha Corp Probe head, its assembling method, and probe card
JP2005274303A (en) * 2004-03-24 2005-10-06 Taiko Denki Co Ltd Characteristic impedance measuring tool
US20080054910A1 (en) * 2006-09-05 2008-03-06 Inventec Appliances Corp. Test apparatus for testing operation of a printed circuit board
CN201436588U (en) * 2009-02-06 2010-04-07 深圳市博敏电子有限公司 PCB distribution parameter impedance testing cable and matched impedance testing stripe
CN202018494U (en) * 2011-03-18 2011-10-26 东莞市连威电子有限公司 Four-wire type PCB test fixture

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997007407A1 (en) * 1995-08-17 1997-02-27 Jae Woo Nam Probe card having vertical type needles and the method thereof
JP2004309441A (en) * 2003-02-18 2004-11-04 Yamaha Corp Probe head, its assembling method, and probe card
JP2005274303A (en) * 2004-03-24 2005-10-06 Taiko Denki Co Ltd Characteristic impedance measuring tool
US20080054910A1 (en) * 2006-09-05 2008-03-06 Inventec Appliances Corp. Test apparatus for testing operation of a printed circuit board
CN201436588U (en) * 2009-02-06 2010-04-07 深圳市博敏电子有限公司 PCB distribution parameter impedance testing cable and matched impedance testing stripe
CN202018494U (en) * 2011-03-18 2011-10-26 东莞市连威电子有限公司 Four-wire type PCB test fixture

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106707138A (en) * 2016-12-29 2017-05-24 广东长虹电子有限公司 Test fixtures for circuit board testing
CN107132470A (en) * 2017-05-31 2017-09-05 格科微电子(上海)有限公司 Suitable for the tool of wafer-level test
CN109887454A (en) * 2019-04-09 2019-06-14 苏州精濑光电有限公司 A kind of impedance detection equipment

Also Published As

Publication number Publication date
CN104122446B (en) 2017-04-12

Similar Documents

Publication Publication Date Title
CN209707544U (en) It is a kind of can independent control temperature chip high temperature ageing test bench
CN101334370B (en) Method for simulating thermal resistance value of thermal test chip
CN104122446A (en) Circuit board test system
CN104569530A (en) Rapid three-phase electronic type electric energy meter calibration crimp connection device and calibration method thereof
CN105334935B (en) Computer temperature control system and method
US7338818B2 (en) Systems and arrangements to assess thermal performance
CN109209962A (en) Fan detection chip, fan detection method and fan detection system
US20090006048A1 (en) Method for simulating thermal resistance value of thermal test die
US20070050173A1 (en) Computer-controlled fan unit reliability testing system
TWI481886B (en) Testing system for eletrical circuit board
CN112798109B (en) Detection and evaluation device for mainboard quality
CN104101793A (en) Circuit board test system and test method thereof
CN211928091U (en) PCB interconnection reliability testing device
CN101930029A (en) A Measuring Device for Automatically Detecting Resistance in Air-Conditioning Circuit
CN103837755A (en) Refrigerator component fault detection method and system
CN219676482U (en) Intelligent kitchen electric circuit control board detection system
CN109655490B (en) A test method for evaluating thermal performance of air-conditioning electronic control components
Cooper Introduction to HALT-making your product robust
TWI481882B (en) Eletrical circuit board testing system and testing method thereof
CN117110735A (en) A high-temperature reverse bias aging test method and system
CN111640684B (en) System and method for multipoint thermal path assessment
KR20180020662A (en) Method testing defect of printed circuit board pannel where the coupon is had
JP2007139797A5 (en)
CN206920957U (en) A kind of constant disconnection device of temperature controller contact temperature
US6560556B1 (en) Non-invasive process for circuit defect isolation using thermal expansion property of thermodynamics

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant