CN104122292A - Contact thermal resistance detection device under low-contact-stress condition - Google Patents
Contact thermal resistance detection device under low-contact-stress condition Download PDFInfo
- Publication number
- CN104122292A CN104122292A CN201410390738.3A CN201410390738A CN104122292A CN 104122292 A CN104122292 A CN 104122292A CN 201410390738 A CN201410390738 A CN 201410390738A CN 104122292 A CN104122292 A CN 104122292A
- Authority
- CN
- China
- Prior art keywords
- plate
- thermal resistance
- temperature
- fixed
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 27
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 37
- 238000010438 heat treatment Methods 0.000 claims description 26
- 238000001816 cooling Methods 0.000 claims description 19
- 238000009413 insulation Methods 0.000 claims description 16
- 238000012360 testing method Methods 0.000 claims description 13
- 238000005057 refrigeration Methods 0.000 claims description 6
- 230000003028 elevating effect Effects 0.000 claims 1
- 239000000463 material Substances 0.000 abstract description 5
- 238000012546 transfer Methods 0.000 abstract description 4
- 230000005484 gravity Effects 0.000 abstract description 3
- 230000000694 effects Effects 0.000 abstract description 2
- 230000007613 environmental effect Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 230000036316 preload Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
一种低接触应力条件下接触热阻检测装置，涉及接触热阻检测技术领域。解决了传统的接触热阻检测装置只能检测被测件在较大应力下的传热情况，无法实现低应力以致无应力状态下的接触热阻状况，同时存在材料本身自重产生的接触应力作用不能消除的问题。本发明通过螺杆和螺母的配合使左固定板和右固定板将被测件夹紧，从而实现被测件的低压力加载，同时通过升降台对被测件进行支撑，当加载压力较大时，则不需要升降台对被测件进行支撑，从而消除了因被测件自身重力所产生的接触应力的影响；多个温度传感器等间距的放置在被测件上，用于检测被测件多个位置的温度，并通过一系列的公式运算获得接触热阻的结果。本发明适用于对接触热阻进行检测。
The invention relates to a contact thermal resistance detection device under the condition of low contact stress, which relates to the technical field of contact thermal resistance detection. It solves the problem that the traditional contact thermal resistance detection device can only detect the heat transfer of the tested part under relatively large stress, and cannot realize the contact thermal resistance under low stress or no stress state, and at the same time, there is a contact stress effect generated by the material's own weight problems that cannot be eliminated. In the present invention, the left fixing plate and the right fixing plate clamp the measured piece through the cooperation of the screw and the nut, so as to realize low-pressure loading of the tested piece, and at the same time support the tested piece through the lifting table, when the loading pressure is high , there is no need for a lifting table to support the DUT, thereby eliminating the influence of the contact stress caused by the DUT’s own gravity; multiple temperature sensors are placed on the DUT at equal intervals to detect the DUT The temperature of multiple locations, and obtain the result of contact thermal resistance through a series of formula operations. The invention is suitable for detecting contact thermal resistance.
Description
技术领域technical field
本发明涉及接触热阻检测技术领域。The invention relates to the technical field of contact thermal resistance detection.
背景技术Background technique
结合面接触热阻作为结合面重要特性参数之一，其准确程度将直接影响到结合面参数特性模型，而在激光器等高精度光学系统中，由于高接触应力会使材料产生变形，影响光学精度，因此在此类光学系统中，广泛存在着低应力接触界面，而在不同的预紧力作用下，会大大影响材料之间的传热，因此在低应力条件下，准确测量不同材料间的接触热阻对光学元件的设计计算起着至关重要作用。传统的测量方法只能检测被测件在较大应力下的传热情况，无法实现低应力以致无应力状态下的接触热阻状况，尤其是材料本身自重产生的接触应力作用不能消除。The contact thermal resistance of the joint surface is one of the important characteristic parameters of the joint surface, and its accuracy will directly affect the characteristic model of the joint surface parameters. In high-precision optical systems such as lasers, the material will be deformed due to high contact stress, which will affect the optical accuracy. , so in this type of optical system, there are widely low-stress contact interfaces, and under different preloads, it will greatly affect the heat transfer between materials. Therefore, under low-stress conditions, it is possible to accurately measure the Contact thermal resistance plays a crucial role in the design calculations of optical components. The traditional measurement method can only detect the heat transfer of the tested part under relatively large stress, and cannot realize the contact thermal resistance under low stress or no stress state, especially the contact stress effect caused by the self-weight of the material itself cannot be eliminated.
发明内容Contents of the invention
本发明为了解决传统的接触热阻检测装置只能检测被测件在较大应力下的传热情况，无法实现低应力以致无应力状态下的接触热阻状况，同时存在材料本身自重产生的接触应力作用不能消除的问题，提出了一种低接触应力条件下接触热阻检测装置。In order to solve the problem that the traditional contact thermal resistance detection device can only detect the heat transfer of the tested part under relatively large stress, it cannot realize the contact thermal resistance under low stress or no stress state, and at the same time, there is a contact resistance caused by the self-weight of the material itself. To solve the problem that stress cannot be eliminated, a contact thermal resistance detection device under low contact stress conditions is proposed.
一种低接触应力条件下接触热阻检测装置包括真空罩、冷却板、隔热环、右固定板、左固定板、支撑架、升降台、加热板和螺杆，所述真空罩的内部为真空腔、冷却板、隔热环、右固定板、左固定板、支撑架、升降台、加热板和螺杆均位于所述真空腔的内部，所述升降台固定在真空罩的底部，隔热环固定在升降台的顶部，所述隔热环内部分为两部分，所述两部分均用于放置被测件，冷却板的一侧固定在隔热环的右侧，且所述冷却板上开有通孔，右固定板的侧面开有凹槽，冷却板固定在所述右固定板的凹槽内，所述右固定板垂直固定在真空罩的底部，加热板的一侧固定在隔热环的左侧，且所述加热板上开有通孔，左固定板的侧面开有凹槽，加热板固定在所述左固定板的凹槽内，所述左固定板与右固定板平行，且所述左固定板与右固定板通过螺杆固定连接，左固定板的底部固定有支撑架，所述支撑架固定在真空罩的底部。A contact thermal resistance detection device under low contact stress conditions includes a vacuum cover, a cooling plate, a heat insulation ring, a right fixed plate, a left fixed plate, a support frame, a lifting platform, a heating plate and a screw rod, and the inside of the vacuum cover is a vacuum Chamber, cooling plate, heat insulation ring, right fixed plate, left fixed plate, support frame, lifting platform, heating plate and screw rod are all located in the inside of described vacuum chamber, and described lifting platform is fixed on the bottom of vacuum cover, and heat insulating ring Fixed on the top of the lifting platform, the inside of the heat insulation ring is divided into two parts, both of which are used to place the test piece, one side of the cooling plate is fixed on the right side of the heat insulation ring, and the cooling plate There is a through hole, the side of the right fixing plate has a groove, the cooling plate is fixed in the groove of the right fixing plate, the right fixing plate is vertically fixed on the bottom of the vacuum cover, and one side of the heating plate is fixed on the partition The left side of the heat ring, and the heating plate has a through hole, the side of the left fixing plate has a groove, the heating plate is fixed in the groove of the left fixing plate, the left fixing plate and the right fixing plate Parallel, and the left fixed plate and the right fixed plate are fixedly connected by screws, the bottom of the left fixed plate is fixed with a support frame, and the support frame is fixed at the bottom of the vacuum cover.
所述检测装置还包括恒温水箱、冷水管和热水管，所述恒温水箱内部分为冷水存储区和热水存储区，所述冷水管的两端均与恒温水箱的冷水存储区连通，且该冷水管穿过冷却板的通孔，热水管的两端均与恒温水箱的热水存储区连通，且该热水管穿过加热板的通孔。The detection device also includes a constant temperature water tank, a cold water pipe and a hot water pipe. The interior of the constant temperature water tank is divided into a cold water storage area and a hot water storage area. Both ends of the cold water pipe are connected with the cold water storage area of the constant temperature water tank, and The cold water pipe passes through the through hole of the cooling plate, both ends of the hot water pipe communicate with the hot water storage area of the constant temperature water tank, and the hot water pipe passes through the through hole of the heating plate.
所述检测装置还包括多个温度传感器和温度显示屏，所述多个温度传感器用于检测被测件的温度，每个温度传感器的温度信号输出端分别与温度显示屏的一个温度信号输入端连接，所述温度显示屏用于显示温度传感器检测的被测件的温度。The detection device also includes a plurality of temperature sensors and a temperature display screen, the plurality of temperature sensors are used to detect the temperature of the tested piece, and the temperature signal output end of each temperature sensor is connected with a temperature signal input end of the temperature display screen respectively. connected, the temperature display screen is used to display the temperature of the tested object detected by the temperature sensor.
有益效果：本发明通过螺杆和螺母的配合使左固定板和右固定板将被测件夹紧，从而实现被测件的低压力加载，同时通过升降台对被测件进行支撑，当加载压力较大时，则不需要升降台对被测件进行支撑，从而消除了因被测件自身重力所产生的接触应力的影响；Beneficial effects: the present invention clamps the test piece by the left fixing plate and the right fixing plate through the cooperation of the screw rod and the nut, thereby realizing the low-pressure loading of the test piece, and at the same time supporting the test piece through the lifting table, when the loading pressure When it is larger, there is no need for a lifting platform to support the tested part, thereby eliminating the influence of the contact stress caused by the measured part's own gravity;
根据测量接触热阻的环境要求对真空罩内的环境进行调整，从而满足不同环境条件下的接触热阻检测的需求；Adjust the environment in the vacuum cover according to the environmental requirements for measuring contact thermal resistance, so as to meet the requirements of contact thermal resistance detection under different environmental conditions;
通过恒温水箱分别输出固定温度的热水和冷水，并对冷却板进行制冷，对加热板进行加热，不仅能够提供检测所需的温度差，同时也保证在稳定状态下热流量的稳定；The constant temperature water tank outputs fixed temperature hot water and cold water respectively, and cools the cooling plate and heats the heating plate, which can not only provide the temperature difference required for detection, but also ensure the stability of the heat flow in a stable state;
多个温度传感器等间距的放置在被测件上，用于检测被测件多个位置的温度，通过温度显示屏对被测件的温度进行显示，记录各个温度传感器的温度值，并通过一系列的公式运算获得接触热阻的结果。A plurality of temperature sensors are placed on the test piece at equal intervals to detect the temperature of multiple positions of the test piece, and the temperature of the test piece is displayed through the temperature display screen, and the temperature value of each temperature sensor is recorded, and passed a A series of formula operations to obtain the result of contact thermal resistance.
附图说明Description of drawings
图1为本发明的结构示意图；Fig. 1 is a structural representation of the present invention;
图2为具体实施方式一所述的左固定板17的结构示意图；Fig. 2 is a schematic structural view of the left fixing plate 17 described in Embodiment 1;
图3为具体实施方式一所述的右固定板9的结构示意图；Fig. 3 is a schematic structural view of the right fixing plate 9 described in Embodiment 1;
图4为图3的俯视图。FIG. 4 is a top view of FIG. 3 .
具体实施方式Detailed ways
具体实施方式一、结合图1-图4说明本具体实施方式，本具体实施方式所述的一种低接触应力条件下接触热阻检测装置包括真空罩3、冷却板6、隔热环7、右固定板9、左固定板17、支撑架14、升降台10、加热板18和螺杆19，所述真空罩3的内部为真空腔，冷却板6、隔热环7、右固定板9、左固定板17、支撑架14、升降台10、加热板18和螺杆19均位于所述真空腔的内部，所述升降台10固定在真空罩3的底部，隔热环7固定在升降台10的顶部，所述隔热环7内部分为两部分，所述两部分均用于放置被测件，冷却板6的一侧固定在隔热环7的右侧，且所述冷却板6上开有通孔，右固定板9的侧面开有凹槽，冷却板6固定在所述右固定板9的凹槽内，所述右固定板9垂直固定在真空罩3的底部，加热板18的一侧固定在隔热环7的左侧，且所述加热板18上开有通孔，左固定板17的侧面开有凹槽，加热板18固定在所述左固定板17的凹槽内，所述左固定板17与右固定板9平行，且所述左固定板17与右固定板9通过螺杆19和螺母8固定连接，左固定板17的底部固定有支撑架14，所述支撑架14固定在真空罩3的底部。Specific embodiments 1. This specific embodiment is described in conjunction with FIGS. 1-4 . A contact thermal resistance detection device under low contact stress conditions described in this specific embodiment includes a vacuum cover 3 , a cooling plate 6 , a thermal insulation ring 7 , Right fixed plate 9, left fixed plate 17, support frame 14, lifting platform 10, heating plate 18 and screw rod 19, the inside of described vacuum cover 3 is vacuum chamber, cooling plate 6, heat insulation ring 7, right fixed plate 9, Left fixed plate 17, support frame 14, lifting table 10, heating plate 18 and screw rod 19 are all positioned at the inside of described vacuum chamber, and described lifting table 10 is fixed on the bottom of vacuum cover 3, and heat insulation ring 7 is fixed on lifting table 10 The top of the heat insulation ring 7 is divided into two parts, the two parts are used to place the test piece, one side of the cooling plate 6 is fixed on the right side of the heat insulation ring 7, and the cooling plate 6 Have through hole, the side of right fixed plate 9 has groove, and cooling plate 6 is fixed in the groove of described right fixed plate 9, and described right fixed plate 9 is vertically fixed on the bottom of vacuum cover 3, and heating plate 18 One side is fixed on the left side of the insulation ring 7, and the heating plate 18 has a through hole, the side of the left fixing plate 17 has a groove, and the heating plate 18 is fixed in the groove of the left fixing plate 17 Inside, the left fixed plate 17 is parallel to the right fixed plate 9, and the left fixed plate 17 and the right fixed plate 9 are fixedly connected by a screw 19 and a nut 8, and the bottom of the left fixed plate 17 is fixed with a support frame 14, the The support frame 14 is fixed on the bottom of the vacuum cover 3 .
本实施方式中，通过螺杆19和螺母8的配合使左固定板17和右固定板9将被测件夹紧，从而实现被测件的低压力加载，同时通过升降台10对被测件进行支撑，当加载压力较大时，则不需要升降台10对被测件进行支撑，从而消除了因被测件自身重力所产生的接触应力的影响。In this embodiment, through the cooperation of the screw rod 19 and the nut 8, the left fixing plate 17 and the right fixing plate 9 clamp the tested piece, thereby realizing the low pressure loading of the tested piece, and at the same time, the tested piece is carried out by the lifting table 10. Support, when the loading pressure is high, the lifting platform 10 is not needed to support the tested piece, thereby eliminating the influence of the contact stress caused by the measured piece's own gravity.
根据测量接触热阻的环境要求对真空罩3内的环境进行调整，从而满足不同环境条件下的接触热阻检测的需求。The environment in the vacuum cover 3 is adjusted according to the environmental requirements for measuring the thermal contact resistance, so as to meet the requirements of thermal contact resistance detection under different environmental conditions.
具体实施方式二、结合图1说明本具体实施方式，本具体实施方式与具体实施方式一所述的一种低接触应力条件下接触热阻检测装置的区别在于，它还包括隔热元件15，所述隔热元件15固定在左固定板17和支撑架14之间。Specific embodiment 2. This specific embodiment is described in conjunction with FIG. 1. The difference between this specific embodiment and the contact thermal resistance detection device under low contact stress conditions described in specific embodiment 1 is that it also includes a heat insulating element 15, The heat insulating element 15 is fixed between the left fixing plate 17 and the supporting frame 14 .
本实施方式中，通过隔热元件15将左固定板17和支撑架14隔开，使得加热板18中的热量不会通过支撑架14传递至真空罩3，从而使热量能够集中，提高了检测精度。In this embodiment, the left fixed plate 17 and the support frame 14 are separated by the heat insulating element 15, so that the heat in the heating plate 18 will not be transferred to the vacuum cover 3 through the support frame 14, so that the heat can be concentrated and the detection is improved. precision.
具体实施方式三、结合图1说明本具体实施方式，本具体实施方式与具体实施方式一所述的一种低接触应力条件下接触热阻检测装置的区别在于，它还包括恒温水箱12、冷水管11和热水管13，所述恒温水箱12包括制冷系统和加热系统，所述冷水管11与制冷系统构成制冷循环系统，且所述冷水管11用于对冷却板6进行制冷，所述热水管13和加热系统构成加热循环系统，且所述热水管13用于对加热板18进行加热。Specific Embodiment 3. This specific embodiment is described in conjunction with FIG. 1. The difference between this specific embodiment and the contact thermal resistance detection device under low contact stress conditions described in Embodiment 1 is that it also includes a constant temperature water tank 12, a cold water Pipe 11 and hot water pipe 13, the constant temperature water tank 12 includes a refrigeration system and a heating system, the cold water pipe 11 and the refrigeration system constitute a refrigeration cycle system, and the cold water pipe 11 is used to cool the cooling plate 6, the The hot water pipe 13 and the heating system constitute a heating cycle system, and the hot water pipe 13 is used to heat the heating plate 18 .
本实施方式中，通过恒温水箱12分别输出固定温度的热水和冷水，并对冷却板6进行制冷，对加热板18进行加热，不仅能够提供检测所需的温度差，同时也保证在稳定状态下热流量的稳定。In this embodiment, the constant temperature water tank 12 outputs hot water and cold water of fixed temperature respectively, and cools the cooling plate 6 and heats the heating plate 18, which can not only provide the temperature difference required for detection, but also ensure a stable state The stability of the lower heat flow.
具体实施方式四、本具体实施方式与具体实施方式一所述的一种低接触应力条件下接触热阻检测装置的区别在于，它还包括多个温度传感器和温度显示屏1，所述多个温度传感器1用于检测被测件的温度，每个温度传感器1的温度信号输出端分别与温度显示屏的一个温度信号输入端连接，所述温度显示屏1用于显示温度传感器检测的被测件的温度。Embodiment 4. The difference between this embodiment and the contact thermal resistance detection device under the condition of low contact stress described in Embodiment 1 is that it also includes a plurality of temperature sensors and a temperature display screen 1, and the plurality of The temperature sensor 1 is used to detect the temperature of the object under test, and the temperature signal output end of each temperature sensor 1 is respectively connected to a temperature signal input end of the temperature display screen, and the temperature display screen 1 is used to display the measured temperature detected by the temperature sensor. the temperature of the piece.
本实施方式中，多个温度传感器等间距的放置在被测件上，用于检测被测件多个位置的温度，通过温度显示屏1对被测件的温度进行显示，记录各个温度传感器的温度值，并通过一系列的公式运算获得接触热阻的结果。In this embodiment, a plurality of temperature sensors are placed on the test piece at equal intervals to detect the temperature of multiple positions of the test piece, and the temperature of the test piece is displayed through the temperature display screen 1, and the temperature of each temperature sensor is recorded. temperature value, and obtain the result of contact thermal resistance through a series of formula operations.
具体实施方式五、本具体实施方式与具体实施方式一所述的一种低接触应力条件下接触热阻检测装置的区别在于，它包括真空接口16和真空泵，所述真空罩3上开有真空接口16，真空泵的泵气口通过真空接口16与真空罩3内部连通。Embodiment 5. The difference between this embodiment and the device for detecting contact thermal resistance under low contact stress described in Embodiment 1 is that it includes a vacuum interface 16 and a vacuum pump, and the vacuum cover 3 is provided with a vacuum Interface 16, the pump air port of the vacuum pump communicates with the inside of the vacuum cover 3 through the vacuum interface 16.
本实施方式中，当接触热阻检测环境为真空条件时，通过真空泵将真空罩3内抽成真空，当接触热阻检测环境为常温常压下，则不需要将真空罩3内抽成真空。In this embodiment, when the contact thermal resistance detection environment is a vacuum condition, the inside of the vacuum cover 3 is evacuated by a vacuum pump; when the contact thermal resistance detection environment is under normal temperature and pressure, it is not necessary to evacuate the inside of the vacuum cover 3 .
本发明提出的接触热阻检测装置对接触热阻检测的原理为：The contact thermal resistance detecting device proposed in the present invention is to the principle of contact thermal resistance detection:
设两个被测件长度均为1，并对两个被测件进行标号，左侧被测件记为1号，右侧被测件记为2号，在两个被测件上均等间距的放置四个的温度传感器，从左至右依次标号为1,2,…,8，每个被测件上的每两个相邻温度传感器之间的间距为m，4号温度传感器和5号温度传感器距离两被测件的接触面的距离为n，测点温度分别记为Tii＝1,2,…,8，为了保证温度测量的准确性，温度传感器侧头均布置在被测件的中轴线上；Assume that the length of the two tested pieces is 1, and label the two tested pieces. The left tested piece is marked as No. 1, and the right tested piece is marked as No. 2, and the two tested pieces are evenly spaced Place four temperature sensors, numbered 1, 2,..., 8 from left to right, and the distance between every two adjacent temperature sensors on each tested piece is m, the No. 4 temperature sensor and the No. 5 The distance between the No. temperature sensor and the contact surface of the two tested parts is n, and the temperatures of the measuring points are respectively recorded as Tii=1, 2,...,8. In order to ensure the accuracy of temperature measurement, the side heads of the temperature sensors are arranged on the tested part on the central axis;
通过恒温水箱12对本装置进行加热和制冷，当温度显示屏1上的温度变化范围在0.2℃范围内，即可认为系统稳定，此时记录八个温度传感器的温度值，则：The device is heated and refrigerated through the constant temperature water tank 12. When the temperature range on the temperature display 1 is within 0.2°C, the system can be considered stable. At this time, record the temperature values of the eight temperature sensors, then:
1号被测件在接触面的温度值为： The temperature value of the contact surface of No. 1 DUT is:
2号被测件在接触面的温度值为： The temperature value of the contact surface of No. 2 DUT is:
在两被测件接触面处存在的温度降为：△T＝T1′-T2′，The temperature drop at the contact surface of the two tested parts is: △T=T 1 ′-T 2 ′,
即：
周向热流q为：The circumferential heat flow q is:
其中，λT为1号被测件的热导率； Among them, λ T is the thermal conductivity of No. 1 DUT;
则接触热导hc为：
接触热阻Rc为： The contact thermal resistance R c is:
Claims (5)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410390738.3A CN104122292B (en) | 2014-08-08 | 2014-08-08 | Thermal contact resistance pick-up unit under a kind of LCS condition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410390738.3A CN104122292B (en) | 2014-08-08 | 2014-08-08 | Thermal contact resistance pick-up unit under a kind of LCS condition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104122292A true CN104122292A (en) | 2014-10-29 |
| CN104122292B CN104122292B (en) | 2016-04-20 |
Family
ID=51767788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410390738.3A Active CN104122292B (en) | 2014-08-08 | 2014-08-08 | Thermal contact resistance pick-up unit under a kind of LCS condition |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104122292B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104359942A (en) * | 2014-12-01 | 2015-02-18 | 哈尔滨工业大学 | Interface thermal resistance measuring method in dissimilar metal compound molding process |
| CN108195878A (en) * | 2017-12-15 | 2018-06-22 | 北京长城华冠汽车科技股份有限公司 | The test device and method of a kind of thermal contact resistance |
| CN110927210A (en) * | 2019-12-11 | 2020-03-27 | 南京工业大学 | A high-precision contact thermal resistance measuring device under vacuum conditions |
| CN111900101A (en) * | 2019-05-06 | 2020-11-06 | 沈阳芯源微电子设备股份有限公司 | A substrate heating assembly |
| CN109580707B (en) * | 2018-12-21 | 2021-06-01 | 中国航空工业集团公司西安航空计算技术研究所 | Device and method for measuring contact thermal resistance |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006042914A1 (en) * | 2004-10-21 | 2006-04-27 | Compagnie Pour L'etude Et La Realisation De Combustibles Atomiques | Method of controlling an element comprising at least two layers including a fissionable layer and corresponding device |
| CN201319053Y (en) * | 2008-11-14 | 2009-09-30 | 中国西电电气股份有限公司 | Clamping device for thermal resistance measurement of thyristors and radiators |
| CN101929969A (en) * | 2010-07-13 | 2010-12-29 | 北京航空航天大学 | Contact thermal resistance test equipment with cooling device |
| CN102798645A (en) * | 2012-08-07 | 2012-11-28 | 南京理工大学 | Heat conduction coefficient and contact thermal resistance testing device |
| CN103020330A (en) * | 2011-09-27 | 2013-04-03 | 上海空间推进研究所 | Pressure distribution method of pressure welding |
-
2014
- 2014-08-08 CN CN201410390738.3A patent/CN104122292B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006042914A1 (en) * | 2004-10-21 | 2006-04-27 | Compagnie Pour L'etude Et La Realisation De Combustibles Atomiques | Method of controlling an element comprising at least two layers including a fissionable layer and corresponding device |
| CN201319053Y (en) * | 2008-11-14 | 2009-09-30 | 中国西电电气股份有限公司 | Clamping device for thermal resistance measurement of thyristors and radiators |
| CN101929969A (en) * | 2010-07-13 | 2010-12-29 | 北京航空航天大学 | Contact thermal resistance test equipment with cooling device |
| CN103020330A (en) * | 2011-09-27 | 2013-04-03 | 上海空间推进研究所 | Pressure distribution method of pressure welding |
| CN102798645A (en) * | 2012-08-07 | 2012-11-28 | 南京理工大学 | Heat conduction coefficient and contact thermal resistance testing device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104359942A (en) * | 2014-12-01 | 2015-02-18 | 哈尔滨工业大学 | Interface thermal resistance measuring method in dissimilar metal compound molding process |
| CN108195878A (en) * | 2017-12-15 | 2018-06-22 | 北京长城华冠汽车科技股份有限公司 | The test device and method of a kind of thermal contact resistance |
| CN109580707B (en) * | 2018-12-21 | 2021-06-01 | 中国航空工业集团公司西安航空计算技术研究所 | Device and method for measuring contact thermal resistance |
| CN111900101A (en) * | 2019-05-06 | 2020-11-06 | 沈阳芯源微电子设备股份有限公司 | A substrate heating assembly |
| CN110927210A (en) * | 2019-12-11 | 2020-03-27 | 南京工业大学 | A high-precision contact thermal resistance measuring device under vacuum conditions |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104122292B (en) | 2016-04-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104122292B (en) | Thermal contact resistance pick-up unit under a kind of LCS condition | |
| CN102798645B (en) | Heat conduction coefficient and contact thermal resistance testing device | |
| CN104034749B (en) | Based on the method for testing of thermal contact resistance between the layer material of 3 ω methods | |
| GB0416064D0 (en) | Method and apparatus for measuring fliud properties | |
| US5693871A (en) | Low differential pressure generator | |
| CN104569045B (en) | Faying face thermal contact resistance method of testing and device between cylindrical sleeve barrel | |
| CN108680284B (en) | Temperature calibration device and calibration method for fiber bragg grating temperature sensor in low-temperature environment | |
| JP2014143927A5 (en) | ||
| CN104132963B (en) | Thermal contact resistance detection device when a kind of microstress | |
| CN106017298A (en) | Direct contact type stretching deformation measuring system and method in high-temperature oxygen-free environment | |
| CN103983660A (en) | Indoor rock sample heat conduction coefficient testing device | |
| CN104897717A (en) | Indoor measuring device for axial and radial thermal expansion coefficients of rock sample | |
| CN106153672A (en) | Voluminous powder material thermal conductivity measurement apparatus based on one-dimensional heat conduction principle and method | |
| CN106841287A (en) | A kind of High Accuracy Flat method measuring thermal conductivity device based on saturated vapor heating | |
| CN203798759U (en) | Glass thermophysical property tester | |
| CN104749214B (en) | A kind of constant temperature hot bath device that liquid thermal conductivity factor is measured based on Adsorbent By Using Transient Plane Source Technique | |
| CN105021313B (en) | Polyethylene pressure pipe road hot-melt welding machine temperature-detecting device and method | |
| CN203849193U (en) | Indoor rock sample heat conduction coefficient testing device | |
| CN203732397U (en) | Rapid emulsion explosive density detector | |
| CN210604475U (en) | Heat conductivity coefficient testing device | |
| Zandt et al. | Capabilities for dielectric-constant gas thermometry in a special large-volume liquid-bath thermostat | |
| CN106885634A (en) | Unsteady wall heating heat flux distribution measuring method based on infrared thermal imagery thermometry | |
| CN204903430U (en) | Isothermal storage test appearance | |
| CN103983363A (en) | Optimal refrigerating plate for low-temperature infrared target source | |
| CN109991271A (en) | Sample rod, magnetocaloric effect measuring instrument with reference temperature, and measuring method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent of invention or patent application | ||
| CB03 | Change of inventor or designer information |
Inventor after: Zhang Peng Inventor after: Sun Fuzhong Inventor after: Lu Lihua Inventor after: Liang Yingchun Inventor before: Liang Yingchun Inventor before: Sun Fuzhong Inventor before: Zhang Peng Inventor before: Lu Lihua |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: INVENTOR; FROM: LIANG YINGCHUN SUN FUZHONG ZHANG PENG LU LIHUA TO: ZHANG PENG SUN FUZHONG LU LIHUA LIANG YINGCHUN |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |