CN104101754A - Micro-electric potential measurement instrument - Google Patents
Micro-electric potential measurement instrument Download PDFInfo
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- CN104101754A CN104101754A CN201410363559.0A CN201410363559A CN104101754A CN 104101754 A CN104101754 A CN 104101754A CN 201410363559 A CN201410363559 A CN 201410363559A CN 104101754 A CN104101754 A CN 104101754A
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- Prior art keywords
- dish
- resistance
- contact
- measurement
- step disc
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- 238000005259 measurement Methods 0.000 title claims abstract description 89
- 239000002184 metal Substances 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000000203 mixture Substances 0.000 claims description 8
- 238000013461 design Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- RRKGBEPNZRCDAP-UHFFFAOYSA-N [C].[Ag] Chemical compound [C].[Ag] RRKGBEPNZRCDAP-UHFFFAOYSA-N 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a micro-electric potential measurement instrument provided with four stepping plates and used for DC (Direct Current) voltage measurement. The micro-electric potential measurement instrument has two measuring ranges; each stepping plate is composed of a measuring plate and a replacing plate having the same structure as the measuring plate; a resistor is welded between contacts of both the measuring plate and the replacing plate on the first stepping plate, and no resistor exists on the rest stepping plates. According to the micro-electric potential measurement instrument, resistance of leads inside the micro-electric potential measurement instrument, contact resistance and variation of a switch, and an influence from thermoelectric potential to the instrument can be ignored.
Description
Technical field
The instrument that the present invention relates to DC voltage to measure.
Background technology
Current micro-potential measurement instrument for there being four step discs, in the connection between four step discs, telophragma generally adopts switching over, so just produces the variation of contact resistance, brings restriction to resolution.In order to overcome this problem, generally adopt large brush with enlarge active surface, and adopt silver-carbon/carbon-copper composite material; Application number 200810120441.X discloses the new method that has micro-potential measurement instrument of four step discs to solve switch contact resistance variation, its four step discs are all coiled by measurement and replacement dish forms, not containing bracket panel, on each measurement dish and replacement dish, there is resistance, measurement dish and replacement dish on its four step discs have formed bridge circuit in circuit, the defect of its maximum is that error is not independent, once it is overproof that certain some indicating value is coiled in measurement, just cannot determine which resistance is overproof causes, this makes troubles to qualification and maintenance.
Summary of the invention
The object of the invention is to design a kind of micro-potential measurement instrument that has four step discs, it does not adopt bridge circuit, and error can be independent like this, and there is no resistance between rear three step disc contacts, and this can reduce costs, and reduces instrument volume.
Technical scheme of the present invention is taked like this: from range of adjustment, the anodal terminal of the external working power E between 3～4V passes through by 21 adjustable resistance R that 21 Ω resistance are in series micro-potential measurement instrument
p1, by 22 adjustable resistance R that 1 Ω resistance is in series
p2, and the adjustable resistance R of range of adjustment between 0～1.1 Ω
p3, again through four step discs and double-point double-throw switch K
1set up resistance R to 458 Ω
n, then through the adjustable resistance R of 0～1 Ω lockable sliding contact
p4get back to the external working power E negative pole terminal of range of adjustment between 3～4V and form micro-potential measurement instrument work loop, from unsaturated standard cell E
nanodal through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2set up resistance R to 458 Ω
nand the adjustable resistance R of range of adjustment lockable sliding contact between 0～1 Ω
p4, then pass through 200K Ω resistance R
5to unsaturated standard cell E
nnegative pole forms micro-potential measurement instrument standard loop, micro-potential measurement instrument is used for connecting measured " U
x" two terminals, anodal terminal is after four measurement disks, then through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2form micro-potential measurement instrument equalizing network to negative pole terminal, it is characterized in that the first step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish I with have 0, 1, 2, the 10 replacement dish I ' compositions of totally 11 gears, between each grade of contact of measurement dish I and replacement dish I ', be connected resistance and be one of the resistance of 0.05 Ω, " 0 " contact of measurement dish I is circuit node A, and " 10 " contact of replacement dish I ' is circuit node B, and the second step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish II with have 0, 1, 2, the 10 replacement dish II ' compositions of totally 11 gears, the 3rd step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish III with have 0, 1, 2, the 10 replacement dish III ' compositions of totally 11 gears, the 4th step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish IV with have 0, 1, 2, the 10 replacement dish IV ' compositions of totally 11 gears, each contact in the second step disc on measurement dish II and replacement dish II ', each contact in the 3rd step disc on measurement dish III and replacement dish III ', each contact in the 4th step disc on measurement dish IV and replacement dish IV ', be connected the resistance R of 999.5 Ω for the first Metal Contact ring of step disc measurement dish I and the Metal Contact interannular of replacement dish I ' with the corresponding contact of replacement dish I ' with measurement dish I in the first step disc
1connect the resistance R of 9999.5 Ω for the second Metal Contact ring of step disc measurement dish II and the Metal Contact interannular of replacement dish II '
2connect the resistance R of 100K Ω for the 3rd Metal Contact ring of step disc measurement dish III and the Metal Contact interannular of replacement dish III '
3connect the resistance R of 1000K Ω for the 4th Metal Contact ring of step disc measurement dish IV and the Metal Contact interannular of replacement dish IV '
4connect, when the brush on each step disc measurement dish rotates with the brush on replacement dish, synchronize, " 0 " contact of measurement dish I is that node A connects adjustable resistance R through node C
p3cold end, another road of node C is through 100.01 Ω resistance r
1connect double-point double-throw switch K
1middle K
1-1layer × 0.1 range contact, double-point double-throw switch K
1middle K
1-1layer and K
1-2the normally closed contact of layer connects with wire, and " 10 " contact of replacement dish I ' is that Node B connects double-point double-throw switch K
1middle K
1-1layer × 1 range contact and K
1-2layer × 0.1 range contact, double-point double-throw switch K
1middle K
1-2layer × 0.1 range contact is through 810.081 Ω resistance r
2with K
1-2layer × resistance R is set up through 458 Ω after connecting in 1 range contact
nand adjustable resistance R
p4, connecting the external working power E negative pole of micro-potential measurement instrument terminal, micro-potential measurement instrument is used for connecting measured " U
x" two measure terminals, anodal terminal is connected with node A, negative pole terminal is through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2be connected with the 10th contact of measurement dish I afterwards.
By above technical scheme, second, third, all there is no resistance between the 4th step disc contact, four step disc errors are independent, and four step disc errors are consistent, this brings convenience to debugging and maintenance, also makes micro-potential measurement instrument simple in structure, volume-diminished, thus production cost reduced; In the time of micro-potential measurement instrument four measurement disks reset, the internal wiring combined potential of micro-potential measurement instrument is A point current potential, some current potentials are " 0 ", so the zero potential of this micro-potential measurement instrument is very little, it is that in the voltage drop of unit, therefore thermoelectrical potential is to " U that the thermoelectrical potential of four several μ V of each branch road of step disc is all connected on to lie prostrate
x" two measure terminals impacts and can ignore.
Brief description of the drawings
Fig. 1 is a kind of schematic circuit of the present invention.
In Fig. 1, the adjustable resistance R of 21 × 21 Ω
p1, represent adjustable resistance R
p1on have the series connection of resistance that 21 resistances are 21 Ω, in like manner, the adjustable resistance R of 22 × 1 Ω
p2, represent adjustable resistance R
p2on have the series connection of resistance that 22 resistances are 1 Ω, 10 × 0.05 Ω on the first step disc measurement dish I and replacement dish I ', expression measurement dish I has the resistance that 10 resistances are 0.05 Ω to connect with on replacement dish I ',
In Fig. 1, on step disc, thick black line represents Metal Contact ring, and hollow small circle represents hard contact, and four-headed arrow represents metallic brush.
Embodiment
Embodiment 1, in Fig. 1, when between node A, Node B, in four step discs, any one step disc rotates, the resistance that electric current flows through measurement dish to be increased equals electric current and flows through the resistance that replacement dish reduces, vice versa, so, what indicating value four step discs no matter put, and this step disc resistance value between node A and Node B is constant, and this can ensure four step discs no matter put what indicating value, each step disc resistance ratio is substantially constant, also ensures that the electric current of each step disc is substantially constant.
At × 1 range, 2.222mA working current is divided into two-way at node C, and a road is through 100.01 Ω resistance r
1to double-point double-throw switch K
1middle K
1-1layer × 0.1 range contact, another road is divided into four tunnels after A: a road is through the first step disc, and a road is through the second step disc, and a road is through the 3rd step disc, and a road is through the 4th step disc, and four road electric currents meet at Node B.
Each step disc resistance ratio: the first step disc: the second step disc: the 3rd step disc: the 4th step disc=1: 10: 10
2: 10
3so,, flow through each step disc current ratio: the first step disc: the second step disc: the 3rd step disc: the 4th step disc=10
3: 10
2: 10: 1.Micro-potential measurement instrument standard operation current design becomes 2.222mA, standard operation electric current flows through the first step disc 2mA, flows through the second step disc 0.2mA, flows through the 3rd step disc 0.02mA, flowing through the 4th step disc is 0.002mA, and the at this moment each stepping of the first step disc is 1 × 10
-1mV, the each stepping of the second step disc is 1 × 10
-2mV, the each stepping of the 3rd step disc is 1 × 10
-3mV, the each stepping of the 4th step disc is 1 × 10
-4mV, the resistance of the first step disc between node A, B is 1000 Ω, the switch contact resistance variation of measurement dish and replacement dish is generally less than 2 × 10
-4Ω, variation causes that error can ignore, the second step disc three step discs backward, measurement dish Metal Contact ring is larger with the resistance that the Metal Contact interannular of replacement dish is connected, and the impact of switch contact resistance variation more can be ignored.
When after working current standardization, I measurement dish is thrown n
1, II measurement dish is thrown n
2, III measurement dish is thrown n
3, IV measurement dish is thrown n
4, K switch is thrown to the left side, is at this moment positioned at voltage between two terminals of measurement to be:
U
X＝2×0.05n
1+0.2×0.05n
2+0.02×0.05n
3+0.002×0.05n
4(mv)
U
X＝0.1n
1+0.01n
2+0.001n
3+0.0001n
4(mv)
In the time of × 0.1 range, be 1000K Ω/1111 approximately 900.09 Ω from node C through the resistance of node A, Node B, with 100.01 Ω resistance r
1parallel connection, resistance r
1resistance is the resistance 1/9 of node A, Node B, resistance r
19/10 of shunting total working electric current, the electric current that therefore flows through node A, Node B is × 1/10 is 0.2222mA when 1 range,
Parallel resistance r
1after the resistance that reduces by series connection 810.081 Ω resistance r
2carry out holding circuit resistance constant.At this moment the first step disc is put n
1, the second step disc puts n
2, the 3rd step disc puts n
3, the 4th step disc puts n
4, the 5th step disc puts n
5, " U
x" two measure voltage between terminal and be:
U
X＝0.2×0.05n
1+0.02×0.05n
2+0.002×0.05n
3+0.0002×0.05n
4(mv)
U
X＝0.01n
1+0.001n
2+0.0001n
3+0.00001n
4(mv)
Micro-potential measurement instrument working power can adopt YJ49 type high stability adjustable stabilized voltage supply, and this micro-potential measurement instrument measurement dish adopts this smaller resistance of 0.05 Ω, is when measuring small voltage, reduces the requirement to galvanometer sensitivity.
In standard loop, for avoiding loop current excessive, adopt 200K Ω resistance R
5carry out current limliting, because the electromotive force of unsaturated standard cell is discrete, between 1.0188V～1.0196V, standardized working current is 2.222mA, therefore sets up resistance R
nget 458 Ω, the lockable adjustable resistance R of additional 0～1 Ω
p4, variation range that can coverage criteria cell emf.
The standard operation electric current of micro-potential measurement instrument is such acquisition: 1mV standard signal voltage by polarity and micro-potential measurement instrument " U
x" two measure terminal and connect, the total indicating value of the each step disc of micro-potential measurement instrument is identical with standard signal magnitude of voltage, double-point double-throw switch K
2throw to the left side, regulate adjustable resistance R
p1, adjustable resistance R
p2and adjustable resistance R
p3, make galvanometer G nulling; Again by double-point double-throw switch K
2throw to the right, regulate adjustable resistance R
p4, make galvanometer G nulling, then after repeating once, adjustable resistance R
p4locking, at this moment the working current of micro-potential measurement instrument is with regard to standardization, when instrument uses, first proofreads standard, carry out reading to reading dial time, reading again after check and correction standard.
Claims (1)
1. have a micro-potential measurement instrument for four measurement disks, from range of adjustment, the anodal terminal of the external working power E between 3～4V passes through by 21 adjustable resistance R that 21 Ω resistance are in series micro-potential measurement instrument
p1, by 22 adjustable resistance R that 1 Ω resistance is in series
p2, and the adjustable resistance R of range of adjustment between 0～1.1 Ω
p3, again through four step discs and double-point double-throw switch K
1set up resistance R to 458 Ω
n, then through the adjustable resistance R of 0～1 Ω lockable sliding contact
p4get back to the external working power E negative pole terminal of range of adjustment between 3～4V and form micro-potential measurement instrument work loop, from unsaturated standard cell E
nanodal through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2set up resistance R to 458 Ω
nand the adjustable resistance R of range of adjustment lockable sliding contact between 0～1 Ω
p4, then pass through 200K Ω resistance R
5to unsaturated standard cell E
nnegative pole forms micro-potential measurement instrument standard loop, micro-potential measurement instrument is used for connecting measured " U
x" two terminals, anodal terminal is after four measurement disks, then through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2form micro-potential measurement instrument equalizing network to negative pole terminal, it is characterized in that the first step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish I with have 0, 1, 2, the 10 replacement dish I ' compositions of totally 11 gears, between each grade of contact of measurement dish I and replacement dish I ', be connected resistance and be one of the resistance of 0.05 Ω, " 0 " contact of measurement dish I is circuit node A, and " 10 " contact of replacement dish I ' is circuit node B, and the second step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish II with have 0, 1, 2, the 10 replacement dish II ' compositions of totally 11 gears, the 3rd step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish III with have 0, 1, 2, the 10 replacement dish III ' compositions of totally 11 gears, the 4th step disc is by having 0, 1, 2, 10 totally 11 gears measurement dish IV with have 0, 1, 2, the 10 replacement dish IV ' compositions of totally 11 gears, each contact in the second step disc on measurement dish II and replacement dish II ', each contact in the 3rd step disc on measurement dish III and replacement dish III ', each contact in the 4th step disc on measurement dish IV and replacement dish IV ', be connected the resistance R of 999.5 Ω for the first Metal Contact ring of step disc measurement dish I and the Metal Contact interannular of replacement dish I ' with the corresponding contact of replacement dish I ' with measurement dish I in the first step disc
1connect the resistance R of 9999.5 Ω for the second Metal Contact ring of step disc measurement dish II and the Metal Contact interannular of replacement dish II '
2connect the resistance R of 100K Ω for the 3rd Metal Contact ring of step disc measurement dish III and the Metal Contact interannular of replacement dish III '
3connect the resistance R of 1000K Ω for the 4th Metal Contact ring of step disc measurement dish IV and the Metal Contact interannular of replacement dish IV '
4connect, when the brush on each step disc measurement dish rotates with the brush on replacement dish, synchronize, " 0 " contact of measurement dish I is that node A connects adjustable resistance R through node C
p3cold end, another road of node C is through 100.01 Ω resistance r
1connect double-point double-throw switch K
1middle K
1-1layer × 0.1 range contact, double-point double-throw switch K
1middle K
1-1layer and K
1-2the normally closed contact of layer connects with wire, and " 10 " contact of replacement dish I ' is that Node B connects double-point double-throw switch K
1middle K
1-1layer × 1 range contact and K
1-2layer × 0.1 range contact, double-point double-throw switch K
1middle K
1-2layer × 0.1 range contact is through 810.081 Ω resistance r
2with K
1-2layer × resistance R is set up through 458 Ω after connecting in 1 range contact
nand adjustable resistance R
p4, connecting the external working power E negative pole of micro-potential measurement instrument terminal, micro-potential measurement instrument is used for connecting measured " U
x" two measure terminals, anodal terminal is connected with node A, negative pole terminal is through being connected to the double-point double-throw switch K of galvanometer G between two normally closed contacts
2be connected with the 10th contact of measurement dish I afterwards.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410363559.0A CN104101754A (en) | 2014-07-24 | 2014-07-24 | Micro-electric potential measurement instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410363559.0A CN104101754A (en) | 2014-07-24 | 2014-07-24 | Micro-electric potential measurement instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104101754A true CN104101754A (en) | 2014-10-15 |
Family
ID=51670070
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410363559.0A Pending CN104101754A (en) | 2014-07-24 | 2014-07-24 | Micro-electric potential measurement instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104101754A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291042A (en) * | 2016-08-17 | 2017-01-04 | 杭州戎密科技有限公司 | Use the potential difference meter of five step discs |
| CN106353560A (en) * | 2016-08-26 | 2017-01-25 | 杭州戎密科技有限公司 | Voltage measurement instrument provided with five stepping discs |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1991386A (en) * | 2005-12-30 | 2007-07-04 | 骆乃光 | Four-range direct current potentiometer |
| CN201053992Y (en) * | 2007-05-29 | 2008-04-30 | 方李 | Two-range portable potentiometer |
| CN201247274Y (en) * | 2008-08-28 | 2009-05-27 | 程军 | Potential difference meter employing slide wire disk |
| CN1991379B (en) * | 2005-12-30 | 2010-09-15 | 骆乃光 | Four-range potentiometer utilizing branch line having four measuring plates |
| CN103760397A (en) * | 2011-12-30 | 2014-04-30 | 孙笑声 | Two-measuring range voltage measuring instrument |
| CN204008796U (en) * | 2014-07-24 | 2014-12-10 | 袁乐香 | Micro-potential measurement instrument |
-
2014
- 2014-07-24 CN CN201410363559.0A patent/CN104101754A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1991386A (en) * | 2005-12-30 | 2007-07-04 | 骆乃光 | Four-range direct current potentiometer |
| CN1991379B (en) * | 2005-12-30 | 2010-09-15 | 骆乃光 | Four-range potentiometer utilizing branch line having four measuring plates |
| CN201053992Y (en) * | 2007-05-29 | 2008-04-30 | 方李 | Two-range portable potentiometer |
| CN201247274Y (en) * | 2008-08-28 | 2009-05-27 | 程军 | Potential difference meter employing slide wire disk |
| CN103760397A (en) * | 2011-12-30 | 2014-04-30 | 孙笑声 | Two-measuring range voltage measuring instrument |
| CN204008796U (en) * | 2014-07-24 | 2014-12-10 | 袁乐香 | Micro-potential measurement instrument |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291042A (en) * | 2016-08-17 | 2017-01-04 | 杭州戎密科技有限公司 | Use the potential difference meter of five step discs |
| CN106353560A (en) * | 2016-08-26 | 2017-01-25 | 杭州戎密科技有限公司 | Voltage measurement instrument provided with five stepping discs |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20141015 |
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